JPH039331Y2 - - Google Patents
Info
- Publication number
- JPH039331Y2 JPH039331Y2 JP1985097192U JP9719285U JPH039331Y2 JP H039331 Y2 JPH039331 Y2 JP H039331Y2 JP 1985097192 U JP1985097192 U JP 1985097192U JP 9719285 U JP9719285 U JP 9719285U JP H039331 Y2 JPH039331 Y2 JP H039331Y2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- wire
- cross
- heat
- current path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Description
【考案の詳細な説明】
〈概要〉
ICやLSIの集積度向上に伴つてワイヤボンデイ
ング作業は近年ますます細いワイヤを高速でボン
デイングする要求が強い。一方要求を満たすため
には小さくすれば構造強度の問題が出て来る。本
願ではチツプ部の形状で電流密度の分配を考えて
構造強度と熱時定数の改善の両立を図つた。[Detailed explanation of the invention] <Summary> With the increase in the degree of integration of ICs and LSIs, there has been a strong demand for wire bonding work in recent years to bond thinner wires at higher speeds. On the other hand, if the size is made smaller to meet the requirements, the problem of structural strength will arise. In the present application, the distribution of current density was considered through the shape of the chip part, and both structural strength and thermal time constant were improved.
〈産業上の利用分野〉
本考案はLSIや、LSIを実装するプリント板と
の間の配線接続を行なうワイヤボンデイング装置
に係り、特に構造強度と熱応答性の改善を両立さ
せた加熱素子の構造に関する。<Industrial Application Fields> The present invention relates to wire bonding equipment that connects LSIs and printed circuit boards on which LSIs are mounted, and in particular to a heating element structure that achieves both structural strength and improved thermal response. Regarding.
〈従来技術〉
いわゆるワイヤボンダ、(ワイヤボンデイング
装置)は要は半田あるいは線材を加熱して融着さ
せることによつて所要部分に配線を行なうもので
あり、高密度プリント板や、LSI等のこまが配線
接続を行なうため発熱部分が小さくなりまた発熱
部に直接通電して加熱を行うためきわめて低い電
圧で大電流を流すものである。第3図に従来こう
した目的で製造された加熱素子を示すが、U字の
平行なたて棒部を形成する一対の導電部は通常電
気銅で出来ておりU字の底のチツプ部はモリブデ
ン、ステンレス、タングステン系超硬合金等の導
電部を構成する部材より電気抵抗が大きく、耐表
面酸化強度が高く、機械的にも高温強度の高い耐
熱性抵抗材で作られており、U字型の底の先端に
ワイヤ当接部(当接先端)を有している。<Prior art> A so-called wire bonder (wire bonding device) is a device that connects wires to required parts by heating and fusing solder or wire rods, and is used for high-density printed circuit boards, LSI frames, etc. Since the heat generating part is connected by wiring, the heat generating part is small, and since the heat generating part is directly energized and heated, a large current is passed at an extremely low voltage. Figure 3 shows a heating element conventionally manufactured for this purpose, in which the pair of conductive parts forming the parallel vertical bars of the U-shape are usually made of electrolytic copper, and the tip part at the bottom of the U-shape is made of molybdenum. It is made of a heat-resistant resistance material that has higher electrical resistance than the materials that make up the conductive part, such as stainless steel and tungsten cemented carbide, has high surface oxidation resistance, and has high mechanical strength at high temperatures, and is U-shaped. It has a wire abutting part (abutting tip) at the tip of the bottom.
そしてこの部分をワイヤに当接して通電加熱す
ることによりボンデイング(接合)を行うもので
ある。 Bonding is then performed by contacting this portion with a wire and heating it with electricity.
〈問題点〉
こうした構成の加熱素子でボンデイングを行う
場合対象となる作業がこまかくなり、ワイヤも細
くなつてくると今まで問題にしてなかつた要件が
ボンデイングの仕上り具合や、分止りに関連して
来る。<Problems> When performing bonding with a heating element of this type, the work involved becomes more complex and the wires become thinner, so requirements that have not been considered until now are related to the finish of the bonding and the problem of dead ends. come.
その一つは先端での発生熱の放射に係る隣への
影響であり、もう一つは配線パターンや、ワイヤ
からの伝熱による影響である。 One is the effect of radiation of heat generated at the tip on neighboring areas, and the other is the effect of heat transfer from the wiring pattern and wires.
これらはともに原理的には発熱部分を小さくす
れば良くなる性質のものではあるが、小さくしよ
うとすると機械的強度が弱くなる。 Both of these properties can be improved in principle by making the heat generating portion smaller, but if you try to make it smaller, the mechanical strength will become weaker.
〈解決手段〉
本願では上記のかんがみチツプ部の形状、ある
いはチツプ部が接合面を介して導電部と接合され
る接合面を含めた発熱素子の構成形状を工夫する
ことにより機械的強度を低下させることなく解決
しようとする。<Solution> In the present application, the mechanical strength is reduced by devising the shape of the above-mentioned irrigation chip or the configuration of the heating element including the joint surface where the chip is joined to the conductive part via the joint surface. I will try to solve it without any problems.
その手段として本考案においては導電部と接合
されたチツプ部の形状をチツプ内部の電流密度の
電流路方向における分布に着目して電流路と交る
ワイヤ当接部の断面積をしぼつて、導電部と接合
する部分におけるそれよりも小さくすること、ま
た好ましくはこれに加えて前記断面積内の電流密
度分布を考えて導電部から導電部へUの凹み側近
くを流れる電流に対する経路抵抗と、同じくUの
凸側近く(ワイヤ当接部側)を流れる電流に対す
る経路抵抗と不均一を極力均一化するために、チ
ツプ部の導電部と接合する接合面のりんかくを長
方形の一部あるいは円の一部となる様にして経路
長を均一化することにより解決している。 As a means of achieving this, in the present invention, the shape of the chip part connected to the conductive part is focused on the distribution of current density inside the chip in the direction of the current path, and the cross-sectional area of the wire contact part that intersects with the current path is reduced. In addition to this, the path resistance for the current flowing from the conductive part to the conductive part near the concave side of the U should be made smaller than that at the part that joins with the conductive part, and preferably in consideration of the current density distribution within the cross-sectional area. Similarly, in order to equalize as much as possible the path resistance and non-uniformity of the current flowing near the convex side of the U (wire contact side), the link of the joint surface that joins with the conductive part of the chip part is made of a part of a rectangle or This is solved by making the path length uniform so that it becomes part of a circle.
〈作用〉
こうした構成を取ると、接合部での発熱量が
おさえられる。断面積がしぼられたワイヤ当接
部の断面のあたりで最も発熱率が大きくなる。
該断面のあたりにおいてワイヤ当接部に近い側も
発熱率が大きい。と云うきわめて小さな発熱部分
よりもきわめて短い経路でワイヤ当接部に伝熱す
るため、発生させた発熱量の利用効率が上るし、
上記伝熱路が短くなることとチツプ部の構造体積
に比して必要な部分しか発熱していないため等価
的な熱容量が小さくなることによつて応答時定数
が早くなるし、併せて無理に小型にする必要がな
いので構造上の強度も確保出来る。<Function> With this configuration, the amount of heat generated at the joint can be suppressed. The heat generation rate is highest around the cross section of the wire contact portion where the cross sectional area is narrowed.
Around the cross section, the heat generation rate is also high on the side closer to the wire contact portion. Because the heat is transferred to the wire abutting part through a much shorter path than the extremely small heat generating part, the efficiency of using the generated heat is increased.
As the heat transfer path described above becomes shorter and only the necessary portion generates heat compared to the structural volume of the chip, the equivalent heat capacity becomes smaller, resulting in a faster response time constant. Since there is no need to make it compact, structural strength can also be ensured.
また接合面の温度が下げられ接合面の強度を保
ちやすくなる。 Furthermore, the temperature of the joint surface is lowered, making it easier to maintain the strength of the joint surface.
〈実施例〉
第1図は本考案の原理図を兼ねる一実施例の説
明図、第2図は別の実施例の説明図、第3図は従
来例の説明図、第4図a,b,cは従来例と実施
例を対比した通電条件とワイヤ当接部の温度応答
の説明図である。<Example> Fig. 1 is an explanatory diagram of one embodiment that also serves as a principle diagram of the present invention, Fig. 2 is an explanatory diagram of another embodiment, Fig. 3 is an explanatory diagram of a conventional example, and Fig. 4 a, b. , c are explanatory diagrams of energization conditions and temperature response of the wire contact portion comparing the conventional example and the embodiment.
図の10,20,30は抵抗体としてのチツ
プ、10a,20a,30aはワイヤ当接部、1
0b,20b,30bと10c,20c,30c
は夫々接合面を示し、11,21,31と12,
22,32は夫々導電部を示す4はワイヤ、5は
半田メツキされたプリント板パターンの一つを示
し、6はプリント基板を示す。 In the figure, 10, 20, 30 are chips as resistors, 10a, 20a, 30a are wire contact parts, 1
0b, 20b, 30b and 10c, 20c, 30c
11, 21, 31 and 12,
Reference numerals 22 and 32 designate conductive parts, 4 represents a wire, 5 represents one of the solder-plated printed circuit board patterns, and 6 represents a printed circuit board.
図より明らかな様に従来例と実施例はチツプ部
の形状が異るだけで構成としては導体部に接合さ
れたチツプ部を持ち、例えば、半田メツキされた
パターン5にワイヤ4をワイヤ当接部でおさえて
通電加熱することによりボンデイングを行うもの
であることまで共通である。 As is clear from the figure, the conventional example and the embodiment differ only in the shape of the chip part, but have a chip part joined to the conductor part. For example, the wire 4 is brought into contact with the solder-plated pattern 5. They are also common in that bonding is performed by holding the parts in place and heating them with electricity.
ただ大きく異るのはチツプ部内を流れる電流の
分布、すなわち電流路方向で見た密度分布と電流
路と交る断面で見た密度分布であり、結果として
の温度分布と、最も時間当りの発熱量の多い(発
熱率と称す)部分、(結果として最高温度に昇温
する部分と大体同じ)の分布であり、また発熱率
の高い部分からワイヤ当接部までの距離である。
そして上記の差を支配しているのがチツプ部の電
流路に沿つた断面積の分布と電流路と交わる断面
で見たチツプ部内を流れる電流路の長さの分布で
あり、上記を実現しているのがチツプ部10、又
は20の形状である。 However, the major difference is the distribution of the current flowing inside the chip, that is, the density distribution seen in the direction of the current path and the density distribution seen in the cross section that intersects the current path, and the resulting temperature distribution and the maximum amount of heat generated per hour. This is the distribution of the area with a large amount of heat generation (referred to as the heat generation rate) (which is roughly the same as the area where the temperature rises to the highest temperature as a result), and the distance from the area with the high heat generation rate to the wire abutting part.
What governs the above difference is the distribution of the cross-sectional area of the chip along the current path and the distribution of the length of the current path flowing inside the chip as seen in the cross section that intersects with the current path. What is important is the shape of the tip portion 10 or 20.
第1図のチツプ部は導体部との接合面のりんか
くが長方形の一部を成しており、発熱素子として
製造するのには例えば導体部の材料となる銅板に
チツプ部となる長方形の素材が嵌合する長方形の
孔を明け、該素子を挿入して銀ロー付けしたあと
不要部を除いて図の形に形成するのであるが、全
体でU字型をしている発熱素子の先端すなわちU
の底の部分のワイヤ当接部10b側(下側と称
す)がワイヤをとらえるため凹められているのみ
ならず反対側の曲率負の側(上側又は凹み側と称
す)においてもチツプ部10が削られているこ
と、またチツプ部10の導体部20,30との接
合面と接する接合面10bと10cは長方形のり
んかくの一部を成しており上部の端面の外に平行
に対向する一対の端面で接合されていることであ
る。 In the chip part shown in Figure 1, the joint surface link with the conductor part forms part of a rectangle, and in order to manufacture a heating element, for example, a rectangular chip part is placed on a copper plate, which is the material of the conductor part. A rectangular hole is made into which the material fits, the element is inserted and silver soldered, and the unnecessary parts are removed to form the shape shown in the figure.The tip of the heat generating element is U-shaped overall. That is, U
Not only is the wire contacting part 10b side (referred to as the lower side) at the bottom part of the tip part 10 recessed to catch the wire, but also the opposite side with negative curvature (referred to as the upper side or recessed side) Also, the bonding surfaces 10b and 10c, which are in contact with the bonding surfaces of the chip portion 10 and the conductor portions 20 and 30, form part of a rectangular link, and a pair of parallel opposing surfaces are formed outside the upper end surface. They are joined at their end faces.
これにより電流路に沿つて見た場合電流の通る
断面がワイヤ当接部近くの断面が最も小さくなる
様にくびれていることと、対向する導体の接合面
から接合面に至るチツプ部材の中の電流路の長さ
が電流路と交る断面の中で見て上側でも下側でも
(まん中当りでも)ほぼ同じ長さになる様構成さ
れている。 As a result, when viewed along the current path, the cross section through which the current passes is constricted so that the cross section near the wire contact area is the smallest, and the cross section in the chip member from the bonding surface of the opposing conductor to the bonding surface is constricted. It is constructed so that the length of the current path is approximately the same on both the upper and lower sides (even in the middle) when viewed in the cross section intersecting the current path.
第2図はチツプ部材の導体部との接合面が円弧
の一部である例であるが断面積の分布も電流路上
の分布も、したがつてそれを実現すべく上側でも
削り込むことも同じ考えのもとに行つて形状を決
めているがやや作りやすい反面断面内の電流分布
を操作することは第1図の例よりやや不自由であ
る。 Figure 2 is an example in which the joint surface of the chip member with the conductor part is a part of a circular arc, but the distribution of cross-sectional area and the distribution of the current path are the same, and therefore the cutting on the upper side to achieve this is also the same. Although the shape is decided based on the idea, it is somewhat easy to make, but it is somewhat inconvenient to manipulate the current distribution within the cross section than the example shown in Figure 1.
なお本来きわめて小さいものであるから複雑な
形状にしずらい面はあるがチツプ部の下側で電流
路を短くすればさらに下側への電流集中は良くな
る。 Note that since it is originally extremely small, it is difficult to make it into a complicated shape, but if the current path is shortened below the chip, the current concentration further below can be improved.
効果については二つの注目すべき面がありその
一つはワイヤ当接部で200℃程度の融点をもつ半
田をとかすために昇温するチツプ部の最高温度点
の温度が低くなることで、第3図の例と第1図の
例では第3図ではチツプ部30の両側のネツク部
と上側の方で600℃程度になるのに対し、第1図
の例では中央のネツク断面の中央近くで400℃と、
かなり低くなり耐熱寿命と、強度を確保しやすく
なる。 There are two aspects to note regarding the effect. One is that the temperature at the highest temperature point of the chip part, which is heated to melt the solder with a melting point of about 200°C at the wire contact part, is lowered. In the example shown in Figure 3 and the example shown in Figure 1, the temperature is about 600°C at the neck sections on both sides and the upper side of the chip part 30 in Figure 3, whereas in the example shown in Figure 1, the temperature is around 600°C near the center of the central neck cross section. and 400℃,
It becomes considerably lower, making it easier to ensure heat-resistant life and strength.
またもう一つの面は第4図のa,b,cに示す
様な応答性の面で、チツプ部そのものの大きさと
しては大して変わりがないのに時定数もタイムラ
グもともに小さくなつて通電波形を変えることに
よつて100msから数百msのボンデイングのため
の加熱時間の中でワイヤ当接部に近い部分の温度
を、急激にかつあまり高くない温度の中にかなり
きめこまかく制御することが可能となつた。 Another aspect is the responsiveness as shown in Figure 4 a, b, and c. Although the size of the chip itself is not much different, both the time constant and time lag are smaller, and the energizing waveform is smaller. By changing the temperature, it is possible to rapidly and precisely control the temperature of the area near the wire contact area within the heating time for bonding from 100 ms to several hundred ms to a temperature that is not very high. Summer.
また上記二つの結果、ワイヤやパターン上の伝
熱による熱影響、例えばワイヤのポリウレタン被
膜の損傷も、放射熱により隣接するワイヤの被膜
の損傷もかなりの程度に防止できる様になつた。 Furthermore, as a result of the above two factors, it has become possible to prevent thermal effects due to heat transfer on the wire or pattern, such as damage to the polyurethane coating of the wire, and damage to the coating of adjacent wires due to radiant heat to a considerable extent.
なお、この場合まわりに対する影響以外にはあ
まり気にしていないが、当然熱エネルギの利用率
も上つているものと思う。 In this case, I'm not really concerned about anything other than the impact on the surroundings, but I think that the utilization rate of thermal energy is also increasing.
〈効果〉
以上説明した如く本考案によれば、チツプ部の
形状を選ぶことにより主たる発熱部分を限定する
とともに該主たる発熱部分を加熱する部分のごく
近くに形成することが出来るため、チツプ部の温
度をあまり上げなくても正常なボンデイングが行
え、加熱する部分への熱伝達が早くかつスムース
になるのでボンデイング条件の管理がきわめてや
りやすく、きめこまかい作業が出来るが、構造的
には特に小さくしたわけではないので強度面も確
保出来、かつ寿命ものびると云う効果を有する。<Effects> As explained above, according to the present invention, by selecting the shape of the tip part, the main heat generating part can be limited and the main heat generating part can be formed very close to the part to be heated. Normal bonding can be performed without raising the temperature too much, and heat transfer to the heated part is quick and smooth, making it extremely easy to manage bonding conditions and allowing detailed work to be done, but the structure is particularly small. Therefore, it has the effect of ensuring strength and extending the service life.
第1図は本考案の原理図を兼ねる一実施例の説
明図、第2図は本考案の別の実施例の説明図、第
3図は従来例の説明図、第4図a,b,cは本考
案の作用の説明図を示す。
Fig. 1 is an explanatory diagram of one embodiment which also serves as a principle diagram of the present invention, Fig. 2 is an explanatory diagram of another embodiment of the present invention, Fig. 3 is an explanatory diagram of a conventional example, and Figs. 4 a, b, c shows an explanatory diagram of the operation of the present invention.
Claims (1)
保持を兼ねる一対の導電部と、U字型の底部にお
いて接合される発熱チツプ部を有する加熱素子に
おいて、 前記チツプ部のワイヤをおさえる部分の電流路
と交わる断面積を、前記導電部と接合する部分の
断面積より小さくするとともに、 チツプ部の電流線方向で見た長さを前記U字型
の底部における上側と下側であまり変えない様に
両導電部と接合される接合部のチツプ部側を構成
するチツプ部のりんかくを4辺形の一部又は円の
一部を成す様に形成して成ることを特長とするワ
イヤボンデイング用は発熱チツプ。[Claims for Utility Model Registration] In a heating element that forms a U-shaped current path as a whole and has a pair of conductive parts that serve both as conduction and retention, and a heat-generating chip part that is joined at the bottom of the U-shape. , the cross-sectional area of the portion of the tip portion that holds the wire intersecting with the current path is made smaller than the cross-sectional area of the portion that joins with the conductive portion, and the length of the tip portion as seen in the current line direction is made equal to the U-shaped length. The link of the chip part that constitutes the chip part side of the joint part that is joined to both conductive parts is formed so as to form part of a quadrilateral or part of a circle so that the upper and lower sides of the bottom part do not change much. A heat generating chip for wire bonding.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985097192U JPH039331Y2 (en) | 1985-06-26 | 1985-06-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985097192U JPH039331Y2 (en) | 1985-06-26 | 1985-06-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6221532U JPS6221532U (en) | 1987-02-09 |
| JPH039331Y2 true JPH039331Y2 (en) | 1991-03-08 |
Family
ID=30963888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985097192U Expired JPH039331Y2 (en) | 1985-06-26 | 1985-06-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH039331Y2 (en) |
-
1985
- 1985-06-26 JP JP1985097192U patent/JPH039331Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6221532U (en) | 1987-02-09 |
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