JPH0399792A - Method for soldering or solder-plating ti-containing copper alloy member - Google Patents
Method for soldering or solder-plating ti-containing copper alloy memberInfo
- Publication number
- JPH0399792A JPH0399792A JP23485489A JP23485489A JPH0399792A JP H0399792 A JPH0399792 A JP H0399792A JP 23485489 A JP23485489 A JP 23485489A JP 23485489 A JP23485489 A JP 23485489A JP H0399792 A JPH0399792 A JP H0399792A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- copper alloy
- soldering
- containing copper
- ppm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Conductive Materials (AREA)
- Coating With Molten Metal (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、高温に長時間さらされても剥離することの
ない、T i : 0.01〜5重量%含有銅合金部材
(以下、Ti含有銅合金部材という)のはんだ付けまた
ははんだめっき方法に関するものであり、特に半導体装
置用リードフレーム、コネクター、スイッチ、ソケット
などの電子・電気部品に使われるTi含有銅合金部材の
はんだ付けまたははんだめっき部分が高温環境下に長時
間継続してさらされても剥離することのないはんだ付け
またははんだめっき方法に関するものである。Detailed Description of the Invention [Industrial Application Field] The present invention provides a copper alloy member containing Ti: 0.01 to 5% by weight (hereinafter referred to as Ti) that does not peel off even when exposed to high temperatures for a long time. This relates to soldering or solder plating methods for Ti-containing copper alloy members (referred to as Ti-containing copper alloy members), particularly for soldering or solder plating of Ti-containing copper alloy members used in electronic and electrical components such as lead frames for semiconductor devices, connectors, switches, and sockets. The present invention relates to a soldering or solder plating method that does not cause peeling even when a part is continuously exposed to a high temperature environment for a long time.
一般に、リードフレーム、コネクター、スイッチ、ソケ
ットなどの電子・電気部品は、Ti含有銅合金部材で作
成されることは知られており、例えば、Ti含有銅合金
製リードフレームは、半導体装置に組ろ込まれ、上記半
導体装置に組み込まれたTI含有銅合金製リードフレー
ム(外部リード)はプリント基板への装着(実装)に際
し、はんだめっきが施され、その後、基板に接続(はん
だ付け)される。Generally, it is known that electronic and electrical parts such as lead frames, connectors, switches, and sockets are made of Ti-containing copper alloy members.For example, lead frames made of Ti-containing copper alloys can be assembled into semiconductor devices. The TI-containing copper alloy lead frame (external lead) incorporated into the semiconductor device is solder plated when mounted (mounted) on a printed circuit board, and then connected (soldered) to the circuit board.
その他、Ti含有銅合金製コネクター、スイッチ、ソケ
ットなども、実装(組立)のために、はんだめっきやは
んだ付けが施されるのが一般的である。In addition, Ti-containing copper alloy connectors, switches, sockets, and the like are generally plated with solder or soldered for mounting (assembly).
上記TI含有銅合金製リードフレーム、コネクター、ス
イッチ、ソケットなどの電子・電気部品をはんだ付けあ
るいは溶融はんだめっきするためのはんだは、一般に市
販のPb−Snはんだが用いられていた。Commercially available Pb-Sn solder has generally been used as the solder for soldering or molten solder plating of electronic and electrical components such as the TI-containing copper alloy lead frames, connectors, switches, and sockets.
近年、半導体装置も高温環境下で長時間継続使用される
ことが多く、それにともなって、TI含有銅合金製リー
ドフレーム、コネクター、スイッチ、ソケットなどの電
子・電気部品のはんだ付けまたははんだめっき部分も高
温環境下に長時間さらされることが多くなってきた。こ
れら電子・電気部品のはんだ付けまたははんだめっき部
分が高温環境下に長時間継続してさらされると、はんだ
付けまたははんだめっき部分に剥離が多発しやすくなり
、そのため電子・電気部品のはんだ付けまたははんだめ
っき部分の信頼性が著しく低下し、上記電子・電気部品
を組み込んだ電子・電気機器の信頼性も著しく低下する
という問題点が生じてきた。In recent years, semiconductor devices are often used continuously for long periods of time in high-temperature environments, and as a result, the soldering or solder-plated parts of electronic and electrical components such as lead frames, connectors, switches, and sockets made of TI-containing copper alloys are also becoming more and more difficult. It has become common for people to be exposed to high temperature environments for long periods of time. If the soldered or solder plated parts of these electronic and electrical parts are exposed to a high temperature environment for a long time, the soldered or solder plated parts are likely to peel off frequently. A problem has arisen in that the reliability of the plated portion is significantly reduced, and the reliability of electronic/electrical equipment incorporating the above-mentioned electronic/electrical components is also significantly reduced.
そこで、本発明者等は、従来のTl含有銅合金部材のは
んだ付けまたははんだめっき部分が高温環境下に長時間
さらされると剥離しゃすくなる原因を研究していたとこ
ろ、市販のPb−Snはんだに含まれる不純物元素が影
響を及ぼしており、上記不純物元素のうちでも特にAg
およびo2が悪影響を及ぼしているということがわがっ
てきたのである。すなわち、上記研究を行った結果、本
発明者等は、
(1) Pb−3nはんだに含まれる不純物元素はで
きる限り少ない方がよく、不純物元素の含有量は500
ppI11以下とし、さらに、(2)上記不純物元素の
うちでも、特にAgおよび02を、それぞれ30ppm
未満とした、不純物元素の含有量が極めて少ないPb−
Sn高純度はんだを用いてTi含有銅合金部材をはんだ
付けまたははんだめっきすると、得られたはんだ付けま
たははんだめっき部分が高温環境下に長時間継続してさ
らされても剥離が発生しないという知見を得たのである
。Therefore, the present inventors were researching the reason why the soldered or solder plated parts of conventional Tl-containing copper alloy members tend to peel off when exposed to a high temperature environment for a long time, and found that commercially available Pb-Sn solder Among the above impurity elements, especially Ag
It has become clear that o2 and o2 have a negative effect. That is, as a result of the above research, the present inventors have concluded that (1) It is better to have as few impurity elements as possible in the Pb-3n solder, and the content of impurity elements is 500.
ppI is 11 or less, and (2) among the above impurity elements, especially Ag and 02 are each 30 ppm.
Pb- with extremely low content of impurity elements, less than
We found that when Ti-containing copper alloy members are soldered or solder-plated using Sn high-purity solder, peeling does not occur even if the resulting soldered or solder-plated parts are continuously exposed to a high-temperature environment for a long time. I got it.
この発明は、かかる知見にもとづいてなされたものであ
って、
TI:0.01〜5%含有する銅合金部材をpbSnは
んだを用いてはんだ付けまたははんだめっきする方法に
おいて、
Pb +Sn >99.95重量%、
不純物元素≦500ppm、
からなるPb−Snはんだであって、上記不純物元素の
うち、特にAgおよび02が、
Ag <30ppm。This invention was made based on this knowledge, and includes a method of soldering or solder plating a copper alloy member containing TI: 0.01 to 5% using pbSn solder, in which Pb +Sn >99.95 A Pb-Sn solder consisting of impurity elements≦500ppm in weight%, in which Ag and 02 are particularly Ag<30ppm among the impurity elements.
02<30ppm。02<30ppm.
であるPb−Snはんだを用いるTl含有銅合金部材の
はんだ付けまたははんだめっき方法に特徴を有するもの
である。The present invention is characterized by a method for soldering or solder plating a Tl-containing copper alloy member using a Pb-Sn solder.
この発明において、使用するPb−Snはんだの成分組
成範囲を上記の通りに限定した理由を以下に説明する。In this invention, the reason why the composition range of the Pb-Sn solder used is limited as described above will be explained below.
リードフレーム、コネクターなどのTi含有銅合金部材
のはんだ付けまたははんだめっき部分が長時間高温環境
にさらされると、リードフレーム中のCuやはんだ中の
Snが拡散し、T1含有銅合金部材とはんだの界面にC
uとSnの拡散層(化合物相)が形成されるほか、Ti
含有銅合金部材の合金成分であるTiやはんだ中の不純
物元素も拡散する。この際、はんだ中の不純物元素が5
00ppmを越えて存在すると、拡散によりT1含有銅
合金部材のT1と金属間化合物を形成し、剥離が発生し
やすくなるためにP b十S n> 99.95重量%
とし、したがって不純物元素の含有量の合計が500p
pm以下としなければならない。上記pbSn高純度は
んだに含まれる不純物元素のうちでも特にAgはT1含
有銅合金部材とはんだ界面において脆いTi金属間化合
物を形成する傾向の強い元素であり、Agが多量に含ま
れると剥離が発生しやすくなる。したがってAgは、a
oppm未満におさえなければならない。When the soldered or solder-plated parts of Ti-containing copper alloy members such as lead frames and connectors are exposed to high-temperature environments for long periods of time, Cu in the lead frame and Sn in the solder will diffuse, causing the bond between the T1-containing copper alloy members and the solder to diffuse. C at the interface
In addition to forming a diffusion layer (compound phase) of u and Sn, Ti
Ti, which is an alloy component of the containing copper alloy member, and impurity elements in the solder also diffuse. At this time, the impurity elements in the solder are
If it exists in excess of 00 ppm, it will form an intermetallic compound with T1 in the T1-containing copper alloy member due to diffusion, and peeling will occur easily.
Therefore, the total content of impurity elements is 500p.
Must be below pm. Among the impurity elements contained in the above-mentioned pbSn high-purity solder, Ag in particular has a strong tendency to form a brittle Ti intermetallic compound at the solder interface with the T1-containing copper alloy member, and if a large amount of Ag is included, peeling will occur. It becomes easier. Therefore, Ag is a
Must be kept below oppm.
一方、上記Pb−Snはんたに酸素が含まれるとTI含
有銅合金部材とはんだとの界面において、ボイドが形成
されやすくなり、これが時間とともに連続して剥離発生
の原因となる。したがって、上記Pb−Snはんだに含
まれる酸素量は30ppm未満に定めた。On the other hand, when oxygen is contained in the Pb-Sn solder, voids are likely to be formed at the interface between the TI-containing copper alloy member and the solder, and these voids continue to cause peeling over time. Therefore, the amount of oxygen contained in the Pb-Sn solder was determined to be less than 30 ppm.
上記脆いTi金属間化合物と上記ボイドが同時に発生す
ると、はんだ付けまたははんだめっき部分の剥離の発生
は一層顕著になる。When the brittle Ti intermetallic compound and the void occur simultaneously, the occurrence of peeling of the soldered or solder-plated portion becomes more pronounced.
したがって、上記はんだ付けまたははんだめっき部分の
剥離の発生を抑えるためには、Pb−8nはんだに含ま
れる不純物元素の含有量を500ppm以下にすると同
時に、上記不純物元素のうちでも特にAg含有量を30
ppm未満、酸素含有量を30pI)ff1未満にする
ことが必要である。Therefore, in order to suppress the occurrence of peeling of the soldering or solder plating parts, the content of impurity elements contained in the Pb-8n solder should be reduced to 500 ppm or less, and at the same time, the content of Ag, especially among the above impurity elements, should be reduced to 30 ppm or less.
It is necessary to keep the oxygen content below ppm and below 30 pI)ff1.
つぎに、この発明のはんだ付けまたははんだめっき方法
を実施例により具体的に説明する。Next, the soldering or solder plating method of the present invention will be specifically explained using examples.
純度二99.99重量%のSn、 Pb、 Ag、
Bi。Purity 299.99% by weight Sn, Pb, Ag,
Bi.
Sb、Inを用意し、これら純金属を配合し、混合して
第1表に示される方法で溶解し、第1表に示される成分
組成のはんだをそれぞれ10kg溶製した。Sb and In were prepared, these pure metals were blended, mixed and melted by the method shown in Table 1, and 10 kg of each solder having the component composition shown in Table 1 was melted.
一方、第2表に示されるように、Tiを含有する各種C
u合金をAr雰囲気の高周波炉にて溶解、鋳造し、たて
:35mm、横: 120mm、長さ:200mmの鋳
塊を得た。これら各種Cu合金の鋳塊を面側し、温度:
850℃で熱間圧延して、厚さ+10mmとした後、さ
らに面側し、板厚:9m+mとし、次いで冷間圧延と温
度:400〜600℃の範囲内の所定の温度にて焼鈍を
繰り返し行い、最終的に板厚二0.25mmの条材を得
た。On the other hand, as shown in Table 2, various types of C containing Ti
The u alloy was melted and cast in a high frequency furnace in an Ar atmosphere to obtain an ingot with a vertical dimension of 35 mm, a horizontal dimension of 120 mm, and a length of 200 mm. The ingots of these various Cu alloys were placed face side, and the temperature:
After hot rolling at 850℃ to a thickness of +10mm, it was further face-sided to a plate thickness of 9m+m, and then cold rolling and annealing were repeated at a predetermined temperature within the range of 400 to 600℃. Finally, a strip with a thickness of 20.25 mm was obtained.
この条材を幅:10mm、長さ+30mmに切断し、8
00#のエメリー紙にて表面を研摩し、酸洗および脱脂
したのち、ロジン系フラックスを用い、温度:第
2
表
0
230℃で上記はんだにてはんだ付けを行った。Cut this strip into width: 10mm, length + 30mm,
After polishing the surface with #00 emery paper, pickling and degreasing, soldering was carried out using the above solder at a temperature of 230°C using rosin flux.
このようにしてはんだ付けした試料を、温度:150℃
、大気中にて250時間、500時間、750時間およ
び1000時間、それぞれ継続して保持し、それぞれの
試料断面を研摩し、はんだとCu合金条材の界面を光学
顕微鏡にて観察し、剥離の有無を調べ、剥離の見られな
いものをOl一部剥離しているものを△、完全に剥離し
ているものを×として第3表に示した。The sample soldered in this way was soldered at a temperature of 150°C.
The sample was kept in the atmosphere for 250 hours, 500 hours, 750 hours, and 1000 hours, and the cross section of each sample was polished, and the interface between the solder and the Cu alloy strip was observed with an optical microscope to determine if there was any peeling. The presence or absence of the Ol was examined, and those with no peeling were shown in Table 3 with △ indicating that some of the Ol was peeled off, and x indicating that the Ol was completely peeled off.
さらに、比較のために、市販のはんだH63A(JIS
Z 3282)を分析し、その分析結果を第1−表に
示すとともに、上記市販のはんだを用いて第2表に示さ
れる成分組成の条材をはんだ付けし、同様の処理を施し
て、市販はんだとCu合金条材の界面における剥離の有
無も調べて、その結果も第3表に示した。Furthermore, for comparison, commercially available solder H63A (JIS
Z 3282) and the analysis results are shown in Table 1. Using the commercially available solder mentioned above, strips with the component compositions shown in Table 2 were soldered and subjected to the same treatment to produce commercially available solder. The presence or absence of peeling at the interface between the solder and the Cu alloy strip was also investigated, and the results are also shown in Table 3.
第3表の結果から、市販のはんだFおよびAg:40p
pm、 O,、: 50ppm含有のPb−Snはんだ
Dを用いてはんだ付けして得られたはんだ付は部分 2
は、温度=150℃の大気中に250時間さらしただけ
で一部剥離が発生するが、この発明の限定条件を満すは
んだAを用いたはんだ付は部分は、上記温度:150℃
の大気中に1000時間さらしても剥離が発生ずること
がなく、したがって、この発明のはんだ付は方法は、耐
剥離性に対して優れた効果を有することがわかる。From the results in Table 3, commercially available solder F and Ag: 40p
pm, O,,: Part 2 of the soldered joint obtained by soldering using Pb-Sn solder D containing 50 ppm peeled off after only 250 hours of exposure to the atmosphere at a temperature of 150°C. However, the soldering part using solder A that satisfies the limiting conditions of this invention is at the above temperature: 150°C.
No peeling occurred even after being exposed to the atmosphere for 1000 hours. Therefore, it can be seen that the soldering method of the present invention has an excellent effect on peeling resistance.
さらに、Agが30ppmを越えて含有するpbSnは
んたBおよび02がsoppmを越えて含有するPb−
8nはんだCを用いたはんだ付は部分は、上記温度=1
50℃の大気中に500時間放置すると一部剥離が発生
し、またPb−t−3nの純度が99.95重量%より
悪いはんだEを用いたはんだ付は部分は、上記高温大気
中に750時間さらされると一部剥離が発生し、十分な
耐剥離性が得られないことがわかる。Furthermore, pbSn solder B containing Ag in excess of 30 ppm and Pb-Sn solder B containing Ag in excess of soppm
For the soldering part using 8n solder C, the above temperature = 1
When left in the atmosphere at 50°C for 500 hours, some peeling occurred, and parts soldered using solder E with a Pb-t-3n purity of less than 99.95% by weight were left in the high-temperature atmosphere for 750 hours. It can be seen that when exposed for a long time, some peeling occurs and sufficient peeling resistance cannot be obtained.
なお、この実施例では、各種のPb−Snはんたを用い
てはんだ付けして得られたTi含有銅合金部材のはんだ
付は部分の耐剥離性について詳述したが、さらに、上記
各種Pb−Snはんだを用3
いてTI含有銅合金部材に溶融はんだめっきを施したと
ころ、そのはんだめっき部分の耐剥離性についてもほぼ
同様の効果が得られた。In addition, in this example, the soldering resistance of Ti-containing copper alloy members obtained by soldering using various Pb-Sn solders was described in detail. When molten solder plating was applied to a TI-containing copper alloy member using -Sn solder, almost the same effect was obtained in terms of peeling resistance of the solder-plated portion.
上述のように、Ti含有銅合金部材のはんたイ」けまた
ははんだめっきにおいては、Pb+Sn>99.95重
量%、Ag<3oppm、 o2< 30ppmのは
んだを用いることにより初めてはんだ(=jけまたはは
んだめっき部分の優れた耐剥離性が得られることがわか
り、かかるT1含有銅合金部祠からなる電子・電気部品
のはんだ付けまたははんだめっき部分の信頼性が著しく
向上するので、この発明は、上記電子・電気部品を組み
込んだ電子・電気機器の信頼性向上に大いに貢献しうる
ちのである。As mentioned above, in soldering or solder plating of Ti-containing copper alloy members, solder (= Also, it has been found that excellent peeling resistance of the solder-plated part can be obtained, and the reliability of the soldering or solder-plated part of electronic/electrical parts made of such a T1-containing copper alloy part is significantly improved. This product greatly contributes to improving the reliability of electronic and electrical equipment incorporating the electronic and electrical components mentioned above.
Claims (1)
部材をPb−Snはんだを用いてはんだ付けまたははん
だめっきする方法において、 上記Pb−Snはんだは、 Pb+Sn>99.95重量%、 不純物元素≦500ppm、 からなり、上記不純物元素のうち、特にAgおよびO_
2が Ag<30ppm、 O_2<30ppm、 である成分組成を有するPb−Snはんだを用いること
を特徴とするTi含有銅合金部材のはんだ付けまたはは
んだめっき方法。(1) In a method of soldering or solder plating a Ti-containing copper alloy member containing 0.01 to 5% Ti using Pb-Sn solder, the Pb-Sn solder has Pb+Sn>99.95% by weight. , impurity elements≦500ppm, and of the above impurity elements, especially Ag and O_
A method for soldering or solder plating a Ti-containing copper alloy member, characterized in that a Pb-Sn solder having a composition in which 2 is Ag<30ppm and O_2<30ppm is used.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23485489A JP2595727B2 (en) | 1989-09-11 | 1989-09-11 | Soldering or solder plating method for Ti-containing copper alloy member |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23485489A JP2595727B2 (en) | 1989-09-11 | 1989-09-11 | Soldering or solder plating method for Ti-containing copper alloy member |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0399792A true JPH0399792A (en) | 1991-04-24 |
| JP2595727B2 JP2595727B2 (en) | 1997-04-02 |
Family
ID=16977391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23485489A Expired - Lifetime JP2595727B2 (en) | 1989-09-11 | 1989-09-11 | Soldering or solder plating method for Ti-containing copper alloy member |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2595727B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009233686A (en) * | 2008-03-26 | 2009-10-15 | Mitsubishi Materials Corp | POWDERY Pb-Sn SOLDER ALLOY FOR PASTE, AND Pb-Sn SOLDER ALLOY BALL |
-
1989
- 1989-09-11 JP JP23485489A patent/JP2595727B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009233686A (en) * | 2008-03-26 | 2009-10-15 | Mitsubishi Materials Corp | POWDERY Pb-Sn SOLDER ALLOY FOR PASTE, AND Pb-Sn SOLDER ALLOY BALL |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2595727B2 (en) | 1997-04-02 |
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