JPH04122809A - Shape recognition device - Google Patents
Shape recognition deviceInfo
- Publication number
- JPH04122809A JPH04122809A JP24534990A JP24534990A JPH04122809A JP H04122809 A JPH04122809 A JP H04122809A JP 24534990 A JP24534990 A JP 24534990A JP 24534990 A JP24534990 A JP 24534990A JP H04122809 A JPH04122809 A JP H04122809A
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- Prior art keywords
- light
- dimensional
- receiving element
- signal processing
- shape recognition
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- 230000003287 optical effect Effects 0.000 claims abstract description 19
- 238000006073 displacement reaction Methods 0.000 claims description 5
- 238000003491 array Methods 0.000 abstract description 3
- 238000005286 illumination Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 21
- 238000000034 method Methods 0.000 description 10
- 238000001514 detection method Methods 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
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Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、物体の3次元形状を非接触で認識する形状認
識装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a shape recognition device that recognizes the three-dimensional shape of an object in a non-contact manner.
[従来の技術]
物体の3次元形状を非接触で認識するために、従来より
多くの提案がなされており、またそのうちの幾つかの技
術は具現化され、実用に供されている。[Prior Art] Many proposals have been made in the past for non-contact recognition of the three-dimensional shape of an object, and some of these techniques have been realized and put into practical use.
そのうちで最も多く実用化されているものの1つに、い
わゆる三角測量の原理を応用したスポット光走査型の距
離センサがある。One of the most widely used sensors is a spot light scanning type distance sensor that applies the so-called triangulation principle.
この距離センサは、第16[!lに示すように、例えば
半導体レーザ等の光源1からの光を集光レンズ等の投光
光学系2°により被検査対象としての物体上に集光する
と共に、反射ミラー等からなる走査手段3により上記光
を1方向に走査し、物体からの反射光を集光レンズ等の
受光光学系4でPSD等の受光素子5′上に集光するも
のがあり、この距離センサではスポット光の走査に同期
して受光素子5上での反射光の集光位置を読み取り、ス
ポット光が照射されている点までの距離を演算により求
め、これにより走査線上の2次元形状を求める。そして
、上記距離センサA°あるいは被検査物体Xを第17図
(a)あるいは(b)に示すように一直線の走査が終了
する毎にその走査方向に直交する方向に移動させ、被検
査物体Xの表面の3次元形状を求めるようにしていた。This distance sensor is the 16th [! As shown in FIG. 1, light from a light source 1 such as a semiconductor laser is condensed onto an object to be inspected by a projection optical system 2° such as a condensing lens, and a scanning means 3 comprising a reflecting mirror or the like. There is a distance sensor that scans the above light in one direction and focuses the reflected light from the object onto a light receiving element 5' such as a PSD using a light receiving optical system 4 such as a condensing lens. The condensing position of the reflected light on the light receiving element 5 is read in synchronization with , the distance to the point where the spot light is irradiated is calculated, and the two-dimensional shape on the scanning line is thereby determined. Then, as shown in FIG. 17(a) or (b), the distance sensor A° or the object to be inspected I was trying to find the three-dimensional shape of the surface.
また、別の方法を採用したものとしては、第18図に示
すように、走査手段3を2つの走査部3a、3bで構成
し、1つの走査部3aの走査方向と直交する方向に他方
の走査部3bが走査を行うようにして、距離センサA°
及び被検査物体Xのいずれも移動させることなく、一定
範囲を2次元的に走査可能としたものがある。In addition, as shown in FIG. 18, another method is adopted in which the scanning means 3 is composed of two scanning sections 3a and 3b, and one scanning section 3a is arranged in a direction perpendicular to the scanning direction of the other scanning section 3a. As the scanning unit 3b performs scanning, the distance sensor A°
There is also one that is capable of scanning a certain range two-dimensionally without moving either the object X to be inspected or the object X to be inspected.
[発明が解決しようとする課題]
ところが、上述のいずれの形状認識装置でも次の問題が
あった。つまり、上述の形状認識装置では、被検査物体
X上を1点ずつ走査していくため、走査速度が遅くなり
、高速で形状を認識することができないという問題があ
った。しかも、物体表面上で光を2次元的に走査するた
めに、必ず2つの走査機構を必要とし、このため小形化
が難しいという問題があった。[Problems to be Solved by the Invention] However, all of the above-mentioned shape recognition devices have the following problems. That is, in the above-described shape recognition device, since the object to be inspected X is scanned point by point, the scanning speed becomes slow, and there is a problem in that the shape cannot be recognized at high speed. Moreover, in order to scan the light two-dimensionally on the object surface, two scanning mechanisms are always required, which makes it difficult to miniaturize.
本発明は上述の点に鑑みて為されたものであり、その目
的とするところは、高速で形状を認識することができ、
且つ小形な形状認識装置を提供することにある。The present invention has been made in view of the above points, and its purpose is to be able to recognize shapes at high speed,
Another object of the present invention is to provide a compact shape recognition device.
(s!題を解決するための手段]
上記目的を達成するために、本発明は平面状の光を発生
する平面光発生手段と、投光光学系により被検査物体に
直線状に集光される照射光に直交する方向に平面光を走
査させる走査手段と、受光光学系を介して直線状に集光
される被検査物体による反射光を受光する受光素子とか
らなり、上記受光素子として、夫々1次元PSDを反射
光の長手方向に直交する向きにして、反射光の長手方向
にそって複数列設した1次元PSDアレイを用いである
。(Means for solving the s! problem) In order to achieve the above object, the present invention includes a planar light generating means that generates planar light, and a light projecting optical system that condenses the light linearly onto the object to be inspected. The light-receiving element comprises a scanning means for scanning plane light in a direction perpendicular to the irradiation light, and a light-receiving element for receiving reflected light from an object to be inspected that is linearly focused through a light-receiving optical system, and the light-receiving element includes: A one-dimensional PSD array is used in which a plurality of one-dimensional PSDs are arranged in a plurality of rows along the longitudinal direction of the reflected light, with each one-dimensional PSD oriented perpendicular to the longitudinal direction of the reflected light.
なお、信号処理部の構成部品を削減するために、上記1
次元PSDアレイからなる受光素子の夫々の1次元PS
Dを複数個毎にグループ分けし、夫々のグループ毎に1
次元PSDの出力を時分割で選択的に出力するセレクタ
を設けると共に、夫々のセレクタの出力を信号処理して
各1次元PSD毎に距離データを算出する信号処1!回
路を設けるようにしてもよい。In addition, in order to reduce the number of components of the signal processing section, the above 1.
One-dimensional PS of each photodetector consisting of a dimensional PSD array
D is divided into multiple groups, and 1 for each group.
A signal processor 1 that includes a selector that selectively outputs the output of the dimensional PSD in a time-sharing manner, and also performs signal processing on the output of each selector to calculate distance data for each one-dimensional PSD! A circuit may also be provided.
また、1次元PSDの無効受光領域の存在が形状の認識
精度に影響を与える場合には、上記1次元PSDアレイ
を構成する複数個の1次元PSDを上下に2段に千鳥状
に配列すると共に、斜め上下の位置で配置される1次元
PSDの両端の無効受光領域を上下に重ねて配列して、
見かけ上の無効受光領域を小さくすることが可能である
。In addition, if the presence of an invalid light-receiving area of a one-dimensional PSD affects shape recognition accuracy, a plurality of one-dimensional PSDs constituting the one-dimensional PSD array may be arranged in a staggered manner in two vertical stages. , the invalid light-receiving areas at both ends of the one-dimensional PSD, which are arranged diagonally above and below, are arranged in a vertically overlapping manner,
It is possible to reduce the apparent ineffective light receiving area.
さらに、1次元PSDアレイからなる受光素子を集光さ
れる反射光の長手方向において微小変位で移動させ、そ
の各移動位置で信号処理回路で信号処理を行って夫々の
移動位置における2次元形状を求めるようにすると、集
光される反射光の長手方向における分解能を高めること
が可能である。Furthermore, a light-receiving element consisting of a one-dimensional PSD array is moved by a minute displacement in the longitudinal direction of the focused reflected light, and a signal processing circuit performs signal processing at each moving position to calculate the two-dimensional shape at each moving position. If determined, it is possible to improve the resolution in the longitudinal direction of the reflected light that is focused.
さらにまた、1個の1次元PSDあるいは所定間隔をお
いて列設された複数個の1次元PSDからなる受光素子
を備え、その受光素子を受光光学系の集光面内で走査し
て、走査ステップ毎に距離データを算出するようにする
と、集光される反射光の長手方向における任意の範囲の
受光出力を任意の分解能で得ることが可能となる。Furthermore, a light-receiving element made of one one-dimensional PSD or a plurality of one-dimensional PSDs arranged in a row at a predetermined interval is provided, and the light-receiving element is scanned within a condensing plane of a light-receiving optical system to perform scanning. If the distance data is calculated for each step, it becomes possible to obtain the light reception output in any range in the longitudinal direction of the condensed reflected light with any resolution.
[作用コ
本発明は、上述のように構成することにより、直線状の
反射光を1次元PSDアレイからなる受光素子で同時に
受光することができるようにし、しかも走査手段が1[
IIJ、状の照射光に直交する方向に走査するだけで済
むようにして、これにより走査に時間がかからないよう
にして、高速で形状を認識することが可能となるように
したものである。[Function] By configuring as described above, the present invention enables linear reflected light to be simultaneously received by a light receiving element consisting of a one-dimensional PSD array, and furthermore, the scanning means is one [
IIJ, it is only necessary to scan in the direction perpendicular to the irradiated light, thereby reducing the time required for scanning and making it possible to recognize the shape at high speed.
また、走査手段が1方向だけで走査を行うもので済むよ
うにすることにより、この走査手段が装置の形状に影響
を与えずに、小形化が図れるようにしたものである。Moreover, by making it sufficient for the scanning means to scan in only one direction, the scanning means can be made smaller without affecting the shape of the apparatus.
[実施例1] 第1図乃至第5図に本発明の一実施例を示す。[Example 1] An embodiment of the present invention is shown in FIGS. 1 to 5.
本実施例の形状認識装置は、第1図に示すように、例え
ば半導体レーザ等の光源1と、この光源1からの光を平
面状の光(以下、平面光と呼ぶ)に変換するシリンドリ
カルレンズのような投光光学系2と、この投光光学系2
を介する平面光を被検査物体上で走査する走査手段3と
で構成され、走査手段3を、反射ミラーと、この反射ミ
ラーの傾きを制御する回動機構とで構成することにより
、被検査物体の表面に直線状に照射される照射光を走査
手段3で図中の矢印で示すように照射光に直交する方向
に走査し、1つの走査機構からなる走査手段3により被
検査物体の表面を2次元的に走査できるようにしである
。As shown in FIG. 1, the shape recognition device of this embodiment includes a light source 1 such as a semiconductor laser, and a cylindrical lens that converts the light from the light source 1 into planar light (hereinafter referred to as planar light). A light projecting optical system 2 like this, and this light projecting optical system 2
scanning means 3 for scanning the object to be inspected with plane light transmitted through the The surface of the object to be inspected is scanned by the scanning means 3 in a direction orthogonal to the irradiated light as shown by the arrow in the figure, and the surface of the object to be inspected is scanned by the scanning means 3 consisting of one scanning mechanism. This allows for two-dimensional scanning.
そして、上記投光系から照射される照射光の被検査物体
による反射光を投光方向に対して所定角度αから受光素
子5で受光する。Then, the light receiving element 5 receives the reflected light from the object to be inspected of the irradiation light emitted from the light projection system at a predetermined angle α with respect to the light projection direction.
ここで、上述のようにして受光素子5で受光することに
より得られる像は一般に光切断像と呼ばれ、被検査物体
の3次元形状を得るためには広く知られたものであり、
この種の手法を用いて3次元形状を同定するものでは、
受光素子5として例えばCCDカメラ等を用いていた。Here, the image obtained by receiving light with the light-receiving element 5 as described above is generally called a light section image, and is widely known for obtaining the three-dimensional shape of the object to be inspected.
This type of method is used to identify three-dimensional shapes,
For example, a CCD camera or the like was used as the light receiving element 5.
しかし、CCDカメラにおいて1つの光切断画像を入力
するためには、少なくともITV走査周期(#16鳳5
ee)が必要であり、このため2次元走査を行うために
時間がかかるという問題がある。However, in order to input one light section image in a CCD camera, at least the ITV scanning period (#16
ee) is required, and therefore there is a problem in that it takes time to perform two-dimensional scanning.
そこで、本実施例では第2図に示すように受光素子5と
して、複数の1次元PSDs+−snを光切断像の方向
に配列した1次元PSDアレイを使用しである。そして
、夫々の1次元PSDsi毎に第4図に示すように信号
処理回路c1〜Cflを設けてあり、光切断像の受光と
同時に1つの光切断像における2次元形状を同定できる
ようにしである。ここで、信号処理回路crは、第3図
に示すように、1次元PSDsjの電流信号である各出
力yL 、Vi2を電圧信号に夫々変換するI/V変換
器6 + 、 62と、変換した電圧信号を夫々増幅す
る増幅器71,7!と、増幅出力を加算する加算器8と
、上記増幅出力を減算する減算器9と、加算出力及び減
算出力の除算を行う除算器10とで楕成しである。そし
て、上記構成の各信号処理回路(1〜cnの出力として
のデータdata 1〜data nはnXmのデータ
を記憶するメモリ11にと憶される。ここで、メモリの
列数mは走査ステップ数に一致させ、行数11は1次元
PSDの個数に一致させである。したがって、例えばj
回目の走査ステップにおける信号処理回路CI”−Cn
のデータdata 1〜data n 4.t j列目
に格納され、その後走査を1ステップ進めた際のdat
a1〜datanはj+1列目に格納される。このよう
にして2次元走査した結果が被対象物体の表面までの距
離に対応するデータとしてメモリ11に取り込まれるこ
とになり、このメモリ11に記憶されたデータに基づい
て3次元形状を同定することができる。Therefore, in this embodiment, as shown in FIG. 2, a one-dimensional PSD array in which a plurality of one-dimensional PSDs+-sn are arranged in the direction of the optically sectioned image is used as the light-receiving element 5. As shown in FIG. 4, signal processing circuits c1 to Cfl are provided for each one-dimensional PSDsi, so that the two-dimensional shape in one optically sectioned image can be identified at the same time as the optically sectioned image is received. . Here, as shown in FIG. 3, the signal processing circuit cr includes I/V converters 6 + and 62 that respectively convert the outputs yL and Vi2, which are current signals of the one-dimensional PSDsj, into voltage signals. Amplifiers 71, 7 that amplify the voltage signals, respectively! , an adder 8 that adds the amplified output, a subtracter 9 that subtracts the amplified output, and a divider 10 that divides the addition output and the subtraction output. Then, the data data 1 to data n as the outputs of each signal processing circuit (1 to cn) having the above configuration are stored in a memory 11 that stores nXm data. Here, the number of columns m of the memory is the number of scanning steps. , and the number of rows 11 is made to match the number of one-dimensional PSDs. Therefore, for example, j
Signal processing circuit CI"-Cn in the second scanning step
data data 1 to data n 4. t Stored in the jth column, then dat when scanning advances one step
a1 to datan are stored in the j+1st column. The results of the two-dimensional scanning in this way are taken into the memory 11 as data corresponding to the distance to the surface of the target object, and the three-dimensional shape can be identified based on the data stored in the memory 11. I can do it.
第5図が投受光系からなる検出系に制御部を付加した場
合の構成図を示し、メモリ11のデータに基づく3次元
形状はCPU12の演算処理により求め、また走査手段
3はCPU12の制御の元で動作する走査ステップコン
トローラ13により回動制御される。FIG. 5 shows a configuration diagram when a control section is added to a detection system consisting of a light emitting and receiving system.The three-dimensional shape based on the data in the memory 11 is obtained by the arithmetic processing of the CPU 12, and the scanning means 3 is controlled by the CPU 12. The rotation is controlled by a scanning step controller 13 operating at the base.
[実施例2] 第6図及び第7図に本発明の他の実施例を示す。[Example 2] Other embodiments of the present invention are shown in FIGS. 6 and 7.
上述の実施例の場合には第4図に示すようにn個の1次
元PSDs、=snの夫々に対して信号処理口N c
+〜cnを設けてあり、夫々のP S Ds+〜釘には
2つの出力(ff+++Vz+、yi+、・・・JI+
+・・・L+)(Y+zJ2t+Yコ2.・・・J12
+・・・ye2)があり、夫々の信号処理回路C1〜C
nには各出力に対してI/V変換器61.62及び増幅
器7 + 、 72を必要とし、このため信号外II!
it路C1〜cnの構成部品が多くなる。そこで、本実
施例では上記信号処理回路C2〜cnの構成部品を低減
するようにしたものである。In the case of the above-mentioned embodiment, as shown in FIG.
+~cn are provided, and each P S Ds+ ~ nail has two outputs (ff+++Vz+, yi+,...JI+
+...L+)(Y+zJ2t+Yko2...J12
+...ye2), and each signal processing circuit C1 to C
n requires an I/V converter 61, 62 and an amplifier 7 + , 72 for each output, so that the signal outside II!
The number of components of IT paths C1 to cn increases. Therefore, in this embodiment, the number of components of the signal processing circuits C2 to cn is reduced.
具体的には、第6図に示すように、1次元PSDs、−
snをn、個ずつに個のグループに分け、そのグループ
毎に信号処理回路C1=Cvを設け、例えばアナログス
イッチ等からなるセレクタ^S、〜^S5を通して1次
元P S Ds、〜sr+の出力を選択的に信号処理回
路(1〜Ckに入力するようにしである。ここで、出力
選択手段^S、〜^Skの切換制御はCPUI2で行う
。但し、このようにすると信号処理に要する時間が多少
増加するが問題となる程度のものではない。Specifically, as shown in FIG. 6, one-dimensional PSDs, -
Divide sn into groups of n pieces each, provide a signal processing circuit C1=Cv for each group, and output one-dimensional P S Ds, ~sr+ through selectors ^S, ~^S5 consisting of analog switches, etc. is selectively input to the signal processing circuits (1 to Ck. Here, the switching control of the output selection means ^S, to ^Sk is performed by the CPUI 2. However, in this case, the time required for signal processing is Although there is a slight increase in the amount, it is not large enough to cause a problem.
[実施例3]
第8図乃至第10図に本発明のさらに他の実施例を示す
、上述の各実施例の複数の1次元PSDS、〜snを光
切断像の方向に配列した1次元PSDアレイでは、夫々
の1次元PSDs、〜snの光切断像の方向における両
端部に第8図中斜線で示す無効受光領域(デッドゾーン
)(イ)が存在し、この無効受光領域(イ)の存在が3
次元形状の検出精度に与える影響を無視できなくなる場
合がある。そこで、本実施例では第911!lに示すよ
うに1次元PSDs、=snを上下2段に千鳥状に配置
すると共に、斜め上下位置で対応する夫々の1次元PS
Ds、=snの無効受光領域(イ)を上下で重ねるよう
に配置する。そして、光切断像を上下夫々の1次元PS
DS、〜snに照射するように上下の2つの光路に分岐
する分岐光学系4゛を用いる。このようにすれば、無効
受光領域(イ)の幅の影響を略半分にすることができる
。[Example 3] FIGS. 8 to 10 show still other embodiments of the present invention, a one-dimensional PSD in which a plurality of one-dimensional PSDS, ~sn of each of the above-mentioned embodiments are arranged in the direction of the optically sectioned image. In the array, there are ineffective light receiving areas (dead zones) (A) indicated by diagonal lines in FIG. existence is 3
In some cases, the influence on the detection accuracy of dimensional shapes cannot be ignored. Therefore, in this embodiment, the 911th! As shown in l, one-dimensional PSDs, = sn are arranged in a staggered manner in two stages, upper and lower, and corresponding one-dimensional PSs are arranged diagonally in upper and lower positions.
The invalid light-receiving areas (A) of Ds and =sn are arranged so as to be vertically overlapped. Then, the optically sectioned images are converted into upper and lower one-dimensional PSs.
A branching optical system 4' is used which branches into two upper and lower optical paths so as to irradiate DS, to sn. In this way, the influence of the width of the invalid light receiving area (a) can be approximately halved.
[実施例4]
第11図及び第12因は本発明のさらに別の実施例であ
り1本実施例では上記1次元PSDアレイからなる受光
素子5を光切断像の方向において微小変位で移動させな
がら、その各位置で信号処理回路c1〜C11で信号処
理を行って1つの光切断像における2次元形状を求め、
それを繰り返すことにより光切断像の方向における分解
能を増加させるようにしたものである。[Example 4] Figures 11 and 12 are still another example of the present invention, and in this example, the light receiving element 5 made of the one-dimensional PSD array is moved by a minute displacement in the direction of the light section image. Meanwhile, at each position, signal processing circuits c1 to C11 perform signal processing to obtain a two-dimensional shape in one optically sectioned image,
By repeating this process, the resolution in the direction of the optically sectioned image is increased.
具体的には、第11図に示すように例えば1次元PSD
s、=snをピッチlで配列しである場合に、1/nの
変位で0回移動させて信号サンプリングを繰り返す、こ
のようにすれば、光切断像の方向における分解能をn倍
とすることができる。Specifically, as shown in FIG. 11, for example, one-dimensional PSD
When s,=sn are arranged at pitch l, the signal sampling is repeated by moving 0 times with a displacement of 1/n.In this way, the resolution in the direction of the optically sectioned image can be increased by n times. I can do it.
これを実現する場合、第12図に示すように、例えばピ
エゾ素子のような一定周期で微小振幅で振動する振動素
子14を用いて受光素子5に振動を加えると共に、上記
振動素子14の振動の周期に同期して信号処理口Net
〜Cnで信号処理を繰り返すようにすればよい、但し、
この場合にはタイミングコントローラ15を用いて、全
体のタイミングを制御するようにしておく。In order to realize this, as shown in FIG. 12, vibrations are applied to the light receiving element 5 using a vibration element 14, such as a piezo element, which vibrates at a constant period with a minute amplitude, and the vibration of the vibration element 14 is Signal processing port Net in synchronization with the cycle
It is sufficient to repeat the signal processing at ~Cn, however,
In this case, the timing controller 15 is used to control the overall timing.
[実施例5]
第13図乃至第155ffに本発明のさらに他の実施例
を示す。本実施例では第13図に示すように受光光学系
4による集光面上で位置制御手段16によって例えば1
個の1次元PSDsを走査するようにしく走査状態を第
14図に示す)、任意の範囲の光切断像を任意の分解能
で検出できるようにしたものである。なお、この際に第
15図に示すように互いに一定間隔を置いた複数個の1
次元PSD(第15 図f) jl 合g:: ハ4
II f) P S D s + −s 4 ) ヲ受
光光学系4の集光面上で走査するようにしてもよい。[Embodiment 5] Still another embodiment of the present invention is shown in FIGS. 13 to 155ff. In this embodiment, as shown in FIG. 13, for example, one
(The scanning state is shown in FIG. 14), so that a light sectioned image in an arbitrary range can be detected with an arbitrary resolution. In addition, at this time, as shown in FIG.
Dimensional PSD (Figure 15 f) jl combination g:: Ha4
II f) P S D s + −s 4 ) The scanning may be performed on the condensing surface of the light receiving optical system 4.
[発明の効果]
本発明は上述のように、平面状の光を発生する平面光発
生手段と、投光光学系により被検査物体に直線状に集光
される照射光に直交する方向に平面光を走査させる走査
手段と、受光光学系を介して直線状に集光される被検査
物体による反射光を受光する受光素子とからなり、上記
受光素子として、夫々1次元PSDを反射光の長手方向
に直交する向きにして、反射光の長手方向にそって複数
列設した1次元PSDアレイを用いであるので、直線状
の反射光を複数個の1次元PSDアレイからなる受光素
子で同時に受光することができ、しかも走査手段は乎面
光を直線状の照射光に直交する方向に走査するだけで済
み、このため走査に時間がかからず、高速で形状を認識
することが可能となり、また走査手段が1方向だけの走
査を行うものでよいので、装置の形状に影響を与えずに
、小形化が図れる。[Effects of the Invention] As described above, the present invention includes a planar light generating means that generates planar light, and a planar light generating means that generates planar light in a direction perpendicular to the irradiation light linearly focused on the object to be inspected by the projection optical system. It consists of a scanning means for scanning light, and a light-receiving element for receiving reflected light from an object to be inspected that is focused linearly through a light-receiving optical system. Since the method uses a plurality of one-dimensional PSD arrays arranged perpendicularly to the longitudinal direction of the reflected light, the linear reflected light can be simultaneously received by a light receiving element consisting of a plurality of one-dimensional PSD arrays. In addition, the scanning means only needs to scan the surface light in a direction perpendicular to the linear irradiation light, so scanning does not take much time and it is possible to recognize the shape at high speed. Furthermore, since the scanning means only needs to scan in one direction, the device can be made smaller without affecting its shape.
また、上記1次元PSDアレイからなる受光素子の夫々
の1次元PSDを複数個毎にグループ分けし、夫々のグ
ループ毎に1次元PSDの出力を時分割で選択的に出力
するセレクタを設けると共に、夫々のセレクタの出力を
信号処理して各1次元PSD毎に距離データを算出する
信号処理回路を設けると、信号処理回路の複数の1次元
PSDで共有でき、このため信号処理部の構成部品を削
減することができる。Further, the one-dimensional PSD of each of the light-receiving elements comprising the one-dimensional PSD array is divided into groups, and a selector is provided for selectively outputting the output of the one-dimensional PSD in a time-sharing manner for each group, By providing a signal processing circuit that processes the output of each selector and calculates distance data for each one-dimensional PSD, the signal processing circuit can be shared by multiple one-dimensional PSDs, and for this reason, the components of the signal processing section can be can be reduced.
さらに、1次元PSDの無効受光領域の存在が形状の認
識精度に影響を与える場合には、上記1次元PSDアレ
イを構成する複数個の1次元PSDを上下に2段に千鳥
状に配列すると共に、斜め上下の位置で配置される1次
元PSDの両端の無効受光領域を上下に重ねて配列する
と、見かけ上の無効受光領域を小さくすることが可能で
あり、このため1次元PSDの無効受光領域の存在が形
状の認識精度に影響を与えなくなる。Furthermore, if the existence of an invalid light-receiving area of a one-dimensional PSD affects the shape recognition accuracy, the plurality of one-dimensional PSDs constituting the one-dimensional PSD array may be arranged in a staggered manner in two vertical stages. By arranging the invalid light-receiving areas at both ends of the one-dimensional PSD, which are arranged diagonally above and below, one above the other, it is possible to reduce the apparent invalid light-receiving area. The existence of the shape no longer affects shape recognition accuracy.
さらにまた、1次元PSDアレイからなる受光素子を集
光される反射光の長手方向におり)で微小変位で移動さ
せ、その各移動位置で信号処理回路で信号処理を行って
夫々の移動位置における2次元形状を求めるようにする
と、細かい範囲における形状の検出が可能となり、集光
される反射光の長手方向における分解能を高めることが
可能となる。Furthermore, a light-receiving element consisting of a one-dimensional PSD array is moved by a minute displacement in the longitudinal direction of the focused reflected light, and a signal processing circuit performs signal processing at each moving position to determine the value at each moving position. If a two-dimensional shape is determined, it becomes possible to detect the shape in a fine range, and it becomes possible to improve the resolution in the longitudinal direction of the collected reflected light.
なお、1個の1次元PSDあるいは所定間隔をおいて列
設された複数個の1次元PSDからなる受光素子を備え
、その受光素子を受光光学系の集光面内で走査して、走
査ステップ毎に距離データを算出するようにすると、集
光される反射光の長手方向における任意の範囲の受光出
力を任意の分解能で得ることが可能となる。The scanning step includes a light-receiving element consisting of one one-dimensional PSD or a plurality of one-dimensional PSDs arranged in a row at a predetermined interval, and the light-receiving element is scanned within the light-converging plane of the light-receiving optical system. By calculating the distance data for each time, it becomes possible to obtain the light reception output in any range in the longitudinal direction of the focused reflected light with any resolution.
第1図は本発明の一実施例の検出系の構成を示す説明図
、第2図は受光素子として用いられる1次元PSDアレ
イを示す説明図、第3図は各1次元PSDの出力の信号
処理を行う信号処理回路の構成を示すブロック図、第4
図は信号処理部の全体構成を示す説明図、第5図は同上
の全体構成を示す説明図、第6図は他の実施例の信号処
理部の構成を示す説明図、第7[!lは同上の全体構成
を示す説明図、第8図は1次元PSDアレイの配列状態
を示す説明図、第9f!Iはさらに他の実施例の1次元
PSDアレイの配列状態を示す説明図、第10図は同上
の検出系の構成を示す説明図、第11図はさらに別の実
施例の受光素子の動作制御方法の説明図5第12図は同
上の全体構成を示す説明図、第13t!Iはさらに他の
実施例の全体構成を示す説明図、第14図は同上の1次
元PSDの走査方法の説明図、第15区は複数個の1次
元PSDを走査した場合の説明図、第16図は従来例の
検出系の構成図、第1711!l (a) 、 (b)
は同上によって3次元形状を検出する場合の走査方法の
説明図、第18図はさらに他の従来例の検出系の構成図
である。
1は光源、2は投光光学系、3は走査手段、4は受光光
学系、5は受光素子、51〜S11は1次元PSD、c
、〜cnは信号処理回路である。
代理人 弁理士 石 1)長 七
第2図
第6図
第7図
第11図
第12図
第13図
第14図
第15図
第16図
第18図
手続補正書く自発)
平成2年11月1日
平成2年特許願第245349号
2、発明の名称
形状認識装置
3、補正をする者
事件との間係 特許出願人
住 所 大阪府門真市大字門真1048番地名称(58
3)松下電工株式会社
代表者 三好俊夫
4、代理人
郵便番号 530
住 所 大阪市北区楕円1丁目12番17号(楕円ビル
5階)−m−
8、補正の内容
添付図面中の第9図を別紙のよ
うに訂正する。Fig. 1 is an explanatory diagram showing the configuration of a detection system according to an embodiment of the present invention, Fig. 2 is an explanatory diagram showing a one-dimensional PSD array used as a light receiving element, and Fig. 3 is an explanatory diagram showing the output signals of each one-dimensional PSD. Block diagram showing the configuration of a signal processing circuit that performs processing, No. 4
5 is an explanatory diagram showing the overall configuration of the signal processing section, FIG. 5 is an explanatory diagram showing the overall configuration of the same as above, FIG. 6 is an explanatory diagram showing the configuration of the signal processing section of another embodiment, and FIG. 1 is an explanatory diagram showing the overall configuration of the same as above, FIG. 8 is an explanatory diagram showing the arrangement state of a one-dimensional PSD array, and 9th f! I is an explanatory diagram showing the arrangement state of a one-dimensional PSD array in yet another embodiment, FIG. 10 is an explanatory diagram showing the configuration of the same detection system, and FIG. 11 is an explanatory diagram showing the operation control of the light receiving element in yet another embodiment. Explanatory diagram of method 5. Figure 12 is an explanatory diagram showing the overall configuration of the same as above, and 13th t! I is an explanatory diagram showing the overall configuration of another embodiment, FIG. 14 is an explanatory diagram of the scanning method of the same one-dimensional PSD, Section 15 is an explanatory diagram of the case where a plurality of one-dimensional PSDs are scanned, and FIG. Figure 16 is a configuration diagram of a conventional detection system, No. 1711! l (a), (b)
18 is an explanatory diagram of a scanning method for detecting a three-dimensional shape according to the same method as above, and FIG. 18 is a configuration diagram of still another conventional detection system. 1 is a light source, 2 is a light projecting optical system, 3 is a scanning means, 4 is a light receiving optical system, 5 is a light receiving element, 51 to S11 are one-dimensional PSDs, c
, ~cn are signal processing circuits. Agent Patent Attorney Ishi 1) Chief 7 Figure 2 Figure 6 Figure 7 Figure 11 Figure 12 Figure 13 Figure 14 Figure 15 Figure 16 Figure 18 Self-motivated to write procedural amendments) November 1, 1990 Japan Patent Application No. 245349 of 1990 2, name of the invention shape recognition device 3, relationship with the case of the person making the amendment Patent Applicant Address 1048 Kadoma, Kadoma City, Osaka Prefecture Name (58
3) Matsushita Electric Works Co., Ltd. Representative: Toshio Miyoshi 4, Agent postal code: 530 Address: 1-12-17 Oval, Kita-ku, Osaka (Oval Building 5th floor) -m-8 Contents of amendment No. 9 in the attached drawing Correct the figure as shown in the attached sheet.
Claims (5)
学系により被検査物体に直線状に集光される照射光に直
交する方向に平面光を走査させる走査手段と、受光光学
系を介して直線状に集光される被検査物体による反射光
を受光する受光素子とからなり、上記受光素子として、
夫々1次元PSDを反射光の長手方向に直交する向きに
して、反射光の長手方向にそって複数列設した1次元P
SDアレイを用いて成ることを特徴とする形状認識装置
。(1) A planar light generating means that generates planar light, a scanning device that scans the planar light in a direction perpendicular to the irradiation light linearly focused on the object to be inspected by the projecting optical system, and a light receiving optical system. and a light receiving element that receives reflected light from the object to be inspected that is linearly focused through the system, and as the light receiving element,
A plurality of one-dimensional PSDs are arranged in a row along the longitudinal direction of the reflected light, with each one-dimensional PSD oriented perpendicular to the longitudinal direction of the reflected light.
A shape recognition device characterized by using an SD array.
の1次元PSDを複数個毎にグループ分けし、夫々のグ
ループ毎に1次元PSDの出力を時分割で選択的に出力
するセレクタを設けると共に、夫々のセレクタの出力を
信号処理して各1次元PSD毎に距離データを算出する
信号処理回路を設けて成ることを特徴とする請求項1記
載の形状認識装置。(2) The one-dimensional PSD of each of the light receiving elements comprising the one-dimensional PSD array is divided into groups, and a selector is provided for selectively outputting the output of the one-dimensional PSD in a time-sharing manner for each group. 2. The shape recognition apparatus according to claim 1, further comprising a signal processing circuit for signal processing the outputs of the respective selectors to calculate distance data for each one-dimensional PSD.
元PSDを上下に2段に千鳥状に配列すると共に、斜め
上下の位置で配置される1次元PSDの両端の無効受光
領域を上下に重ねて配列して成ることを特徴とする請求
項1記載の形状認識装置。(3) A plurality of one-dimensional PSDs constituting the one-dimensional PSD array are arranged in a staggered manner in two stages vertically, and the invalid light receiving areas at both ends of the one-dimensional PSDs arranged diagonally up and down are arranged vertically. The shape recognition device according to claim 1, characterized in that the shape recognition device is arranged in an overlapping manner.
る反射光の長手方向において微小変位で移動させ、その
各移動位置で信号処理回路で信号処理を行つて夫々の移
動位置における2次元形状を求めて成ることを特徴とす
る請求項1記載の形状認識装置。(4) A light-receiving element consisting of a one-dimensional PSD array is moved by a minute displacement in the longitudinal direction of the focused reflected light, and a signal processing circuit performs signal processing at each moving position to obtain a two-dimensional shape at each moving position. 2. The shape recognition device according to claim 1, wherein the shape recognition device calculates the following.
設された複数個の1次元PSDからなる受光素子を備え
、その受光素子を受光光学系の集光面内で走査して、走
査ステップ毎に距離データを算出して成ることを特徴と
する形状認識装置。(5) A light-receiving element consisting of one one-dimensional PSD or a plurality of one-dimensional PSDs arranged in a row at a predetermined interval is provided, and the light-receiving element is scanned within the condensing plane of the light-receiving optical system to perform scanning. A shape recognition device characterized by calculating distance data for each step.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2245349A JPH0726825B2 (en) | 1990-09-14 | 1990-09-14 | Shape recognition device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2245349A JPH0726825B2 (en) | 1990-09-14 | 1990-09-14 | Shape recognition device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04122809A true JPH04122809A (en) | 1992-04-23 |
| JPH0726825B2 JPH0726825B2 (en) | 1995-03-29 |
Family
ID=17132353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2245349A Expired - Fee Related JPH0726825B2 (en) | 1990-09-14 | 1990-09-14 | Shape recognition device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0726825B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5629704A (en) * | 1994-09-12 | 1997-05-13 | Nissan Motor Co., Ltd. | Target position detecting apparatus and method utilizing radar |
| JP2008309532A (en) * | 2007-06-13 | 2008-12-25 | Lasertec Corp | Three-dimensional measuring device and inspection device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115312A (en) * | 1981-12-29 | 1983-07-09 | Matsushita Electric Works Ltd | Detector for surface defect |
| JPS6044810A (en) * | 1983-08-22 | 1985-03-11 | Matsushita Electric Ind Co Ltd | Device for detecting position of spot light |
-
1990
- 1990-09-14 JP JP2245349A patent/JPH0726825B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115312A (en) * | 1981-12-29 | 1983-07-09 | Matsushita Electric Works Ltd | Detector for surface defect |
| JPS6044810A (en) * | 1983-08-22 | 1985-03-11 | Matsushita Electric Ind Co Ltd | Device for detecting position of spot light |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5629704A (en) * | 1994-09-12 | 1997-05-13 | Nissan Motor Co., Ltd. | Target position detecting apparatus and method utilizing radar |
| JP2008309532A (en) * | 2007-06-13 | 2008-12-25 | Lasertec Corp | Three-dimensional measuring device and inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0726825B2 (en) | 1995-03-29 |
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