JPH0412412B2 - - Google Patents

Info

Publication number
JPH0412412B2
JPH0412412B2 JP59053236A JP5323684A JPH0412412B2 JP H0412412 B2 JPH0412412 B2 JP H0412412B2 JP 59053236 A JP59053236 A JP 59053236A JP 5323684 A JP5323684 A JP 5323684A JP H0412412 B2 JPH0412412 B2 JP H0412412B2
Authority
JP
Japan
Prior art keywords
boundary
defects
computer
cracks
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59053236A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60196642A (ja
Inventor
Shiro Kubo
Kyotsugu Ooji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Osaka NUC
Original Assignee
Osaka University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osaka University NUC filed Critical Osaka University NUC
Priority to JP5323684A priority Critical patent/JPS60196642A/ja
Publication of JPS60196642A publication Critical patent/JPS60196642A/ja
Publication of JPH0412412B2 publication Critical patent/JPH0412412B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP5323684A 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法 Granted JPS60196642A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5323684A JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5323684A JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Publications (2)

Publication Number Publication Date
JPS60196642A JPS60196642A (ja) 1985-10-05
JPH0412412B2 true JPH0412412B2 (de) 1992-03-04

Family

ID=12937166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5323684A Granted JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Country Status (1)

Country Link
JP (1) JPS60196642A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002346715A (ja) * 2001-05-18 2002-12-04 Nippon Steel Corp 鋳型内鋳片の状態評価装置、方法、コンピュータプログラム、及びコンピュータ読み取り可能な記憶媒体

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170307360A1 (en) * 2014-09-25 2017-10-26 Nec Corporation Status determination device and status determination method
DE112020007617T5 (de) 2020-09-16 2023-07-06 Mitsubishi Electric Corporation Riss-schätzeinrichtung und riss-schätzverfahren

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56115937A (en) * 1980-02-19 1981-09-11 Tokyo Koki Seizosho:Kk Detecting method for crack of test piece
JPS5710449A (en) * 1980-06-21 1982-01-20 Teruo Kishi Temperature compensation type crack measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002346715A (ja) * 2001-05-18 2002-12-04 Nippon Steel Corp 鋳型内鋳片の状態評価装置、方法、コンピュータプログラム、及びコンピュータ読み取り可能な記憶媒体

Also Published As

Publication number Publication date
JPS60196642A (ja) 1985-10-05

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term