JPH04132677A - Production of thin plate-shaped single crystal by melt-pressure method - Google Patents
Production of thin plate-shaped single crystal by melt-pressure methodInfo
- Publication number
- JPH04132677A JPH04132677A JP25178790A JP25178790A JPH04132677A JP H04132677 A JPH04132677 A JP H04132677A JP 25178790 A JP25178790 A JP 25178790A JP 25178790 A JP25178790 A JP 25178790A JP H04132677 A JPH04132677 A JP H04132677A
- Authority
- JP
- Japan
- Prior art keywords
- vessel
- thin plate
- container
- crystal
- melt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 54
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 238000000034 method Methods 0.000 title claims description 16
- 239000000463 material Substances 0.000 claims abstract description 20
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 3
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 3
- 239000010439 graphite Substances 0.000 claims abstract description 3
- 238000001816 cooling Methods 0.000 claims abstract 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract 2
- 239000000919 ceramic Substances 0.000 claims abstract 2
- 229910052802 copper Inorganic materials 0.000 claims abstract 2
- 239000010949 copper Substances 0.000 claims abstract 2
- 229910001220 stainless steel Inorganic materials 0.000 claims abstract 2
- 239000010935 stainless steel Substances 0.000 claims abstract 2
- 239000000155 melt Substances 0.000 claims description 16
- 229910052751 metal Inorganic materials 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 12
- 239000004065 semiconductor Substances 0.000 claims description 11
- 239000000126 substance Substances 0.000 claims description 4
- 239000012212 insulator Substances 0.000 claims description 3
- 150000002739 metals Chemical class 0.000 claims description 3
- 229910052582 BN Inorganic materials 0.000 claims description 2
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 2
- 239000005388 borosilicate glass Substances 0.000 claims description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims 2
- -1 In addition Substances 0.000 claims 1
- 239000004020 conductor Substances 0.000 claims 1
- 239000012777 electrically insulating material Substances 0.000 claims 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims 1
- 229910052697 platinum Inorganic materials 0.000 claims 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 1
- 229910010271 silicon carbide Inorganic materials 0.000 claims 1
- 239000002994 raw material Substances 0.000 abstract description 10
- 239000007788 liquid Substances 0.000 abstract description 5
- 239000010453 quartz Substances 0.000 abstract description 4
- 125000006850 spacer group Chemical group 0.000 abstract description 3
- 238000005554 pickling Methods 0.000 abstract description 2
- 239000002253 acid Substances 0.000 abstract 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract 1
- 229910052593 corundum Inorganic materials 0.000 abstract 1
- 239000011810 insulating material Substances 0.000 abstract 1
- 229910001845 yogo sapphire Inorganic materials 0.000 abstract 1
- 229910052732 germanium Inorganic materials 0.000 description 13
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 13
- 235000012431 wafers Nutrition 0.000 description 9
- 239000000758 substrate Substances 0.000 description 7
- 239000007789 gas Substances 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 4
- 239000012611 container material Substances 0.000 description 3
- 238000002425 crystallisation Methods 0.000 description 3
- 230000008025 crystallization Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- HDDJZDZAJXHQIL-UHFFFAOYSA-N gallium;antimony Chemical compound [Ga+3].[Sb] HDDJZDZAJXHQIL-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 230000009291 secondary effect Effects 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
a、産業上の利用分野
本発明により、磁性体のI!膜、酸化物高温超伝導体の
薄膜結晶、半導体素子(チップ)のための薄板結晶(ウ
エーファ)、および、太陽電池基板などが作製され、光
産業、電子産業等の分野の基板材料として利用される。DETAILED DESCRIPTION OF THE INVENTION a. Field of Industrial Application According to the present invention, the I! Films, thin film crystals of high-temperature oxide superconductors, thin crystals (wafers) for semiconductor devices (chips), and solar cell substrates have been produced and are used as substrate materials in fields such as the optical and electronic industries. Ru.
b、従来の技術
半導体、磁性体および酸化物の薄板状単結晶は電子デバ
イスや光デバイスの作製における必要不可欠な基本的素
材である。金属のように延性、展性に富む材料の場合や
一部の絶縁体、例えば石英ガラスのように、軟化温度の
付近で加工が可能な場合にはこれらの薄板状材料を作製
することは比較的簡単である。b. Prior Art Thin single crystals of semiconductors, magnetic materials, and oxides are essential basic materials in the production of electronic devices and optical devices. In the case of materials that are highly ductile and malleable, such as metals, or in the case of certain insulators, such as quartz glass, which can be processed near their softening temperature, it is difficult to produce these thin plate-like materials. It's simple.
しかしながら、半導体や絶縁体の場合、膜厚がおよそ0
.1μmから500μmの薄Ia結晶を融液から直接作
製することは不可能であった。したがって、はとんど全
ての電子デバイスに用いられている半導体素子は、融液
がら育成した大きな結晶(バルク結晶、例えば、直径5
cm、長さ20cm)をスライスしくこれをインゴット
の加工と言う)、厚さを500μm (0,5mm)程
度の円盤状の板(ウエーファ)を基板結晶として、様々
な加工をほどこすことにより、作製されている。このイ
ンゴット結晶は引き上げ法、あるいはブリッジマン法と
呼ばれる方法で作製されるのが普通である。ウエーファ
に加工する際には、当然のことながら、結晶の半分以上
が削りカスとして消耗してしまい、実際に基板として用
いられるのは、もとの結晶のおよそ30%である。その
上、素子として用いた場合でも、有効に利用される基板
の厚さは数μmである。もし仮に、数100μmの厚さ
の半導体結晶が融液がら直接作製されれば、上記のよう
な問題は起こらず、かつ原料の最も有効な利用が可能に
なることになる。However, in the case of semiconductors and insulators, the film thickness is approximately 0.
.. It has been impossible to produce thin Ia crystals of 1 μm to 500 μm directly from the melt. Therefore, semiconductor elements used in almost all electronic devices are made of large crystals (bulk crystals, e.g.
By slicing ingots (20cm long) and wafers with a thickness of about 500μm (0.5mm) as a substrate crystal, various processes can be carried out. It has been made. This ingot crystal is usually produced by a pulling method or a method called the Bridgman method. Naturally, when processing into a wafer, more than half of the crystal is wasted as shavings, and only about 30% of the original crystal is actually used as a substrate. Moreover, even when used as a device, the thickness of the substrate that is effectively utilized is several μm. If a semiconductor crystal with a thickness of several 100 μm could be directly produced from a melt, the above-mentioned problems would not occur and raw materials could be used most effectively.
融液からtW膜結晶を作製する方法としてEFG(ed
ge−definad fil+o−fed grow
th)法がある。これにより、リボン状のものが得られ
ているが、厚さは200μm (0,2mm)程度でそ
れ以下の厚みにするのは困難である。裏作製法の適用は
まだSt等一部の材料に限られており、太陽電池の基板
としてわずかに用いられているにすぎない。EFG (ed.
ge-definad fil+o-fed grow
th) There is a law. As a result, a ribbon-like product has been obtained, but the thickness is approximately 200 μm (0.2 mm), and it is difficult to reduce the thickness to less than 200 μm (0.2 mm). Application of the back fabrication method is still limited to some materials such as St, and it is only slightly used as a substrate for solar cells.
この方法は薄板状結晶の形状を決めるためのダイ(型板
)と融液が濡れて、表面張力により液体がダイを登って
こなければならないために、適用葉材に限界がある。In this method, the die (template) used to determine the shape of the thin plate crystals must be wetted with the melt, and the liquid must climb up the die due to surface tension, so there are limits to the materials that can be used.
更に、半導体の薄膜結晶を、バルク結晶を使わずに、気
相法によって直接作製することもできるが様々の問題を
かかえている。この作製法としては真空蒸着法(分子線
エピタキシー法も含む)、CV D (Chemica
l Vapor Deposition )法があるが
、膜厚は0.01μm以下であり、基板として用いられ
るものは作製できていない、t、着法においては、μm
の厚さは厚過ぎて良質のものが作製できない、また、こ
れらの方法においては、化合物半導体の場合、化学組成
比の制御が困難であることなどにより、基板に用いられ
るようなWf−膜状結晶はえられていない。Furthermore, it is possible to directly produce semiconductor thin film crystals by a vapor phase method without using bulk crystals, but this poses various problems. This manufacturing method includes vacuum evaporation method (including molecular beam epitaxy method), CVD (Chemica
There is a Vapor Deposition method, but the film thickness is less than 0.01 μm, and it cannot be used as a substrate.
In addition, in the case of compound semiconductors, it is difficult to control the chemical composition ratio in the case of compound semiconductors. No crystals were obtained.
C1発明が解決しようとする問題点
従来より良く知られているように、ウエーファ製造技術
は単結晶インゴットを出発点にしている。C1 Problems to be Solved by the Invention As is well known in the art, wafer manufacturing technology starts from a single crystal ingot.
この技術には次のような問題が指摘される:(1)イン
ゴットを作るためには高度な技術を要し、装置も高価で
運転のための電力の消費も大きい。The following problems have been pointed out with this technology: (1) Advanced technology is required to make the ingot, the equipment is expensive, and the power consumption for operation is large.
(2)インゴットからウエーファに仕上げるまでにも高
度な熟練した作業と時間が必要である。(2) Highly skilled work and time are required to turn an ingot into a wafer.
時間的ロスも大きい。The time loss is also large.
(3)インゴットを切断し、それを研磨するために、材
料の加工ロスが避けられず、また、インゴットの位置に
よる特性を均一に保つための材料のロスも避けられない
。(3) In order to cut the ingot and polish it, processing loss of material is unavoidable, and also loss of material required to maintain uniform characteristics depending on the position of the ingot is also unavoidable.
これらの問題が半導体ウェーファのコストを決めている
ことになるが、特に原料の高価な化合物半導体の場合は
材料のロスが製造コストのアップにつながっていること
になり、また、希少*aの浪費にもなっている。しかし
ながら、これらのどの項目についても限界に近いと言わ
れるほどの改善がなされ、これ以上のコストダウンは望
めない状況である。These problems determine the cost of semiconductor wafers, but especially in the case of compound semiconductors, which are expensive raw materials, material loss increases manufacturing costs, and waste of rare *a It has also become However, improvements have been made in all of these items to the extent that they are said to be close to their limits, and further cost reductions cannot be expected.
そこで、本発明はウエーファ状の薄板結晶を米液から直
接作ることでこれらの問題を解決しようとするものであ
る。Therefore, the present invention attempts to solve these problems by directly producing wafer-shaped thin plate crystals from rice liquor.
d0問題を解決するための手段
前記問題点を解決するために次の三つの技術的手段を講
じた:
(1)薄板状結晶の成長容器はその隙間がウエーファの
厚み程度とし、かつその上下端は融液の侵入を真空吸引
又は気体加圧による圧入法により、容易にするために開
放構造とすること。Means for Solving the d0 Problem The following three technical measures were taken to solve the above problems: (1) The growth container for thin plate crystals has a gap approximately equal to the thickness of the wafer, and its upper and lower ends shall have an open structure to facilitate the intrusion of melt by vacuum suction or press-in method using gas pressure.
(2)容器材料と薄板状結晶との濡れ性を防ぎ、結晶化
後に容器から容易に取り出すために、容器材料表面の化
学洗浄、真空ベーキングによる洗浄を行なうこと。(2) In order to prevent wettability between the container material and the thin plate crystals and to facilitate removal from the container after crystallization, the surface of the container material should be cleaned by chemical cleaning or vacuum baking.
(3)成長容器を下端より融液に降下させ、容器全体が
融液中にはいった後、融液を加圧するか、成長容器上端
より真空吸引することで、融液が成長容器内を完全に満
たした後に容器を融液中から徐々に引き上げることで結
晶化を行なうこと。(3) The growth container is lowered into the melt from the bottom, and after the entire container is in the melt, the melt can be pressurized or vacuumed from the top of the growth container, so that the melt completely fills the inside of the growth container. Crystallization is carried out by gradually lifting the container out of the melt after filling it with liquid.
本発明ではこのような技術手段を取ることで厚さ10/
lから数mmの薄板状11j結晶を得ることを可能にし
た。In the present invention, by taking such technical measures, the thickness can be reduced to 10/
This made it possible to obtain thin plate-like 11j crystals of several mm from 1.
00作用
ゲルマニウム(Ge)とガリウムアンチモン(GaSb
)に適用した場合、容器と板状結晶に濡れ性がないため
、お互いの相互作用が無く、容器から容易に取り出すこ
とができた。また、結晶面は容器により外界がら保諌さ
れているために、鏡面である。このことは不純物汚染が
妨げること、及び化合物材料の場合は組成比のズレを防
止する作用があることを意味している。このことは品質
面で、面内の特性に均一性向上が図れること、および、
熱歪が少ないと言う好ましい結果にもなりている。00 action germanium (Ge) and gallium antimony (GaSb
), the container and the plate-like crystals had no wettability, so there was no interaction with each other, and the crystal could be easily removed from the container. In addition, the crystal plane is a mirror surface because it is protected from the outside world by the container. This means that impurity contamination is prevented, and in the case of compound materials, there is an effect of preventing deviations in composition ratio. In terms of quality, this means that uniformity in in-plane characteristics can be improved, and
The favorable result is that there is little thermal strain.
f、実施例
ここで、添付の図を参照しながら本発明の詳細な説明す
る。第1図は薄板状1i結晶の成長容器を示し、(a)
は石英、又はホウ珪酸ガラスなどのガラス加工で作られ
た容器構造を、(b)はグラフアイ1.窒化ホウ素等の
機械加工で作られた容器構造を図示している。(a)
、 (t)) 、においで、容器は隔板2、スペーサ
一部3、及び隙間4により薄板状の厚さが決定される構
造となっている。容器1の下端は開放されているが上端
はくびれ部5から吸引バイブロへとつながっている。f. Examples The invention will now be described in detail with reference to the accompanying figures. Figure 1 shows a growth vessel for thin plate-like 1i crystals, (a)
(b) is a container structure made of quartz or borosilicate glass, etc.; A container structure made by machining of boron nitride or the like is illustrated. (a)
, (t)), the container has a structure in which the thickness of the thin plate is determined by the partition plate 2, the spacer part 3, and the gap 4. The lower end of the container 1 is open, but the upper end is connected to a suction vibro through a constriction 5.
くびれ部5には単結晶を得るための種結晶7が保持され
ている。この際、種結晶7の上端の直径はくびれ部5の
内径よりも1〜2mm程度大きくしておくとその位置決
めが容易となる。なお、成長容器はその内面を酸洗い等
清浄にした後] 000°C1−時間以上の真空ベーキ
ング(焼きだし)をすると材料と容器との濡れ性がなく
なり、成長容器からの薄板状結晶の取り出しを可能とす
る。The constriction 5 holds a seed crystal 7 for obtaining a single crystal. At this time, if the diameter of the upper end of the seed crystal 7 is approximately 1 to 2 mm larger than the inner diameter of the constricted portion 5, its positioning will be facilitated. Note that after cleaning the inner surface of the growth container by pickling, etc.) If vacuum baking is performed at 000°C for 1 hour or more, the wettability between the material and the container will be lost, making it difficult to take out the thin plate crystals from the growth container. is possible.
第2図はこれらの成長容器を用いてゲルマニウム及びガ
リウムアンチモン薄板状単結晶を製造するための装置を
示す。ここではゲルマニウムについての実施例を示す。FIG. 2 shows an apparatus for producing germanium and gallium antimony thin plate-like single crystals using these growth vessels. Here, an example regarding germanium will be shown.
まず、石英ルツボ5にはゲルマニウム原料2をいれてヒ
ーター3により加熱を開始し、同時に金属容器]の内部
は真空ポンプ22(11)によりバルブ2+、(b)を
開にして真空排気を行なう、又、成長容器11には予め
くびれ部に種結晶23を挿入しておく、ゲルマニウムの
融点より約]、 00 ’C以下の860°Cにおいて
、金属容器1内を真空に排気し、その後バルブ(b)2
1は閉じてバルブ(a)20を開にしてガスボンベ23
より排気管(c)19を通してヘリウム又はアルゴンな
どの不活性ガスが]0OTorr前後導入される。ここ
でヒーター3によりゲルマニウム原料は加熱され融点9
59°Cより約30℃高い9900Cに保たれる。成長
容器11は吸引パイプ12の上部で真空コック(a)1
4で閉とされているためにその内部金属容器と同じく約
]00Torrの不活性ガスで満たされている0次に、
成長容器l]を上下駆動部】3により徐々にルツボ5内
のゲルマニウム融M面下になる位お゛に固定する。ここ
では成長容器1内の圧力がほぼ等しいためにゲルマニウ
ム融液は成長容器の内部には侵入していかない。First, the germanium raw material 2 is placed in the quartz crucible 5 and heating is started by the heater 3, and at the same time, the inside of the metal container is evacuated by opening the valve 2+ (b) by the vacuum pump 22 (11). In addition, a seed crystal 23 is inserted into the constriction of the growth container 11 in advance, and the inside of the metal container 1 is evacuated at 860° C., which is below the melting point of germanium. b)2
1 is closed, valve (a) is opened, and gas cylinder 23 is opened.
An inert gas such as helium or argon is introduced through the exhaust pipe (c) 19 at a pressure of about 0 O Torr. Here, the germanium raw material is heated by the heater 3 and has a melting point of 9.
It is maintained at 9900C which is about 30C higher than 59C. The growth container 11 has a vacuum cock (a) 1 at the top of the suction pipe 12.
The 0th order, which is closed at 4 and is filled with inert gas at approximately ]00 Torr as well as its internal metal container,
The growth container 1 is gradually fixed by the vertical drive unit 3 to a position below the germanium molten M surface in the crucible 5. Here, since the pressure inside the growth container 1 is almost equal, the germanium melt does not penetrate into the inside of the growth container.
そこで真空コック(a)14を徐々に開にして、真空ポ
ンプ(a)18で吸引バイブ12内及び成長容器11の
内部のガスを排気していく、こうすることで、ルツボ内
成長容器24と金属容器lの内部での圧力差によりゲル
マニウム融液は成長容器24内を満たすことになる。こ
の際、原材料の融液の粘性の小さなものは小さな圧力差
で簡単に成長容4811内に侵入するが粘性の大きなも
のはガスポンベ22により金属容器1内の圧力を高め融
液を加圧し、圧入することで成長容器24内をみたすこ
とができる。成長容器24内の融液が種結晶23と触れ
る位置まできたら真空コック(a、 )14は閉にして
、種結晶23の一部が溶けるのを待つ6種結晶の一部が
溶けたら上下Q !J1部]3により、成長容器24を
一時間当たり数mmの割合で上方向に移tIノさせるこ
とで成長容器内融液25はゲルマニウム融液の液面を離
れた部分から固化、すなわち単シ、晶化がはじまる。成
長容器内結晶26は成長容9511が融液をはなれるま
で続き、成長容器内は薄板状単結晶で満たされる。得ら
れたゲルマニウム板状単結晶は成長容器24を石英ガラ
スで作った場合にそれとの濡れ性がないために成長容器
上端部を切断することで容易に取り出すことができた。Then, the vacuum cock (a) 14 is gradually opened and the gas inside the suction vibrator 12 and the inside of the growth container 11 is exhausted with the vacuum pump (a) 18. By doing this, the growth container 24 in the crucible is Due to the pressure difference inside the metal container 1, the germanium melt will fill the growth container 24. At this time, the raw material melt with low viscosity easily enters the growth chamber 4811 with a small pressure difference, but with high viscosity, the gas pump 22 increases the pressure inside the metal container 1, pressurizes the melt, and presses it in. By doing so, the inside of the growth container 24 can be filled. When the melt in the growth container 24 reaches a position where it touches the seed crystal 23, close the vacuum cock (a, ) 14 and wait for a part of the seed crystal 23 to melt 6. When a part of the seed crystal melts, turn the upper and lower Q ! Part J1] 3, by moving the growth container 24 upward at a rate of several mm per hour, the melt 25 in the growth container solidifies from the part away from the surface of the germanium melt, that is, it solidifies into a single cylinder. , crystallization begins. The growth of the crystal 26 in the growth container continues until the growth volume 9511 runs out of the melt, and the growth container is filled with the thin plate-like single crystal. The obtained germanium plate-shaped single crystal could be easily taken out by cutting off the upper end of the growth container because it did not have wettability with the growth container 24 made of quartz glass.
他の実施例としてガリウムアンチモンを試みた。As another example, gallium antimony was tried.
作製法のほとんどはゲルマニウムと同一であるが、この
場合は種結晶を用いずに作製したために、得られた結晶
は多結晶であった。ここではゲルマニウムについての実
施例を主に述べたが、本発明の融液加圧法による薄板状
単結晶製作法は成長容器材料を種々組み合わせることで
、金属や酸化物、有機物質等の幅広い物質に適用される
ものである。Most of the manufacturing methods are the same as for germanium, but in this case, the crystals obtained were polycrystalline because they were manufactured without using seed crystals. Although we have mainly described examples of germanium here, the thin plate-shaped single crystal manufacturing method using the melt pressurization method of the present invention can be used for a wide range of materials such as metals, oxides, and organic substances by combining various growth container materials. applicable.
g1発明の効果
従来のウエーファ製造では大きな単結晶インゴットをつ
くり、切断、研磨してきたが、本発明では製品の形状に
近い形の薄板状の単結晶の作製を可能にした0本手法で
得られた単結晶は電子材料のウエーファ加工の場合のよ
うなインゴットの切断加工が不要なため原料のロスを大
幅に低減することとなる。従って本発明による手法は希
少資源の有効利用につながるばかりでなく、原料費低下
のために製造コストの全体的低下をもたらすと日う副次
的効果がある。更に、本手法は材料融液を成長容器内に
閉じ込めて周囲からの汚染を最小にできるため単結晶の
高純度化を可能とするものである。g1 Effects of the invention In conventional wafer manufacturing, large single crystal ingots were made, cut, and polished, but the present invention uses a zero-strand method that enables the production of thin plate-like single crystals with a shape close to that of the product. Single crystals do not require the cutting of ingots, as is the case with wafer processing for electronic materials, resulting in a significant reduction in raw material loss. Therefore, the method according to the present invention not only leads to the effective use of scarce resources, but also has the secondary effect of bringing about an overall reduction in manufacturing costs due to lower raw material costs. Furthermore, this method allows the material melt to be confined within the growth container to minimize contamination from the surroundings, making it possible to achieve high purity single crystals.
第1図には材料の違う二種類の成長容器が示しである。
(a)は石英ガラスの場合、(b)はグラファイトの場
合である。容器1は隔板2、スペーサ一部3により隙間
4を構成し、これはくびれ部5を通して吸引バイブロに
つながっている。
第2図は薄板状単結晶の製造装置を示す、金属容器1の
内部に原料2を融解するためのヒーター3、石英ルツボ
5が配置されている。金属容器1には7ランジ6が上部
に乗り、0リング(a)7により気密が保たれる。フラ
ンジ6はは小フランジ8が取り付けてあり、Oリング(
b)9及びOリング(c)10により金属容器lの気密
が保たれている。小フランジ8には複数の成長容器11
が吸引パイプ12により、保持されており、成長容器1
1全体は上端部にある。ト下駆動部13により各成長容
器が独立に上下できる構造となっている。吸引パイプ上
部には真空コック(a)14、真空コック(b)15−
排気管(a)16.及び排気管(b)17かついており
、各排気管は真空ポンプ(a)18へつながれている。
又、7ランジ6には排気管(c)19が取り付けてあり
、これはパルプ(a)20.バルブ(b)21を通して
おのおのガスポンベ23および真空ポンプ22へ接続さ
れている。FIG. 1 shows two types of growth containers made of different materials. (a) is the case of quartz glass, and (b) is the case of graphite. The container 1 forms a gap 4 with a partition plate 2 and a spacer portion 3, which is connected to a suction vibro through a constriction 5. FIG. 2 shows an apparatus for manufacturing a thin plate-like single crystal, in which a heater 3 for melting a raw material 2 and a quartz crucible 5 are arranged inside a metal container 1. A seven flange 6 is placed on the top of the metal container 1, and airtightness is maintained by an O ring (a) 7. A small flange 8 is attached to the flange 6, and an O-ring (
b) 9 and O-ring (c) 10 keep the metal container l airtight. A plurality of growth containers 11 are provided in the small flange 8.
is held by the suction pipe 12, and the growth container 1
1 is located at the upper end. Each growth container can be moved up and down independently by a lower drive section 13. At the top of the suction pipe are vacuum cocks (a) 14 and vacuum cocks (b) 15-
Exhaust pipe (a)16. and exhaust pipes (b) 17, each of which is connected to a vacuum pump (a) 18. Further, an exhaust pipe (c) 19 is attached to the 7-lunge 6, which is used for pulp (a) 20. Each is connected to a gas pump 23 and a vacuum pump 22 through a valve (b) 21.
Claims (1)
め設定した厚さの隙間を持った板状容器の中に容器内外
の圧力差を利用して圧入した後に、容器の一端より冷却
することで単結晶を製造する方法。当製造方法を用いた
薄板状単結晶の成長容器としてその材料に石英ガラス、
ホウ珪酸ガラス、酸化アルミ、シリコンカーバイト、窒
化ホウ素、セラミックス系の電気的絶縁性のある材料、
及びグラファイト、ステンレ鋼、銅、白金などの金属系
の電気的導電性のある材料を用い、素材融液との濡れ性
を考慮して、それらを単独で、又は二種類の組み合わせ
にして薄板状単結晶が容易に取り出すことを可能とする
構造を有するものとする。これらの成長容器と製造方法
に基づいて金属、半導体、絶縁体および有機物質の板状
単結晶をそれらの融液から製造する方法。In order to produce a thin plate-shaped single crystal from a material melt, the melt is press-fitted into a plate-shaped container with a gap of a preset thickness using the pressure difference between the inside and outside of the container, and then from one end of the container. A method of producing single crystals by cooling. Silica glass,
Borosilicate glass, aluminum oxide, silicon carbide, boron nitride, ceramic-based electrically insulating materials,
In addition, metal-based electrically conductive materials such as graphite, stainless steel, copper, and platinum are used, and these materials are used alone or in combination to form thin sheets, taking into consideration their wettability with the material melt. It shall have a structure that allows the single crystal to be easily taken out. A method for producing plate-shaped single crystals of metals, semiconductors, insulators, and organic substances from their melts based on these growth containers and production methods.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25178790A JPH04132677A (en) | 1990-09-25 | 1990-09-25 | Production of thin plate-shaped single crystal by melt-pressure method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25178790A JPH04132677A (en) | 1990-09-25 | 1990-09-25 | Production of thin plate-shaped single crystal by melt-pressure method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04132677A true JPH04132677A (en) | 1992-05-06 |
Family
ID=17227929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25178790A Pending JPH04132677A (en) | 1990-09-25 | 1990-09-25 | Production of thin plate-shaped single crystal by melt-pressure method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04132677A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10298000A (en) * | 1997-04-28 | 1998-11-10 | Dowa Mining Co Ltd | Plate single crystal and its production |
| WO2002006569A1 (en) * | 2000-07-17 | 2002-01-24 | Shikoku Instrumentation Co.,Ltd. | Crystalline product having free surface of grown crystal and method for producing the same |
| JP2009132589A (en) * | 2007-11-29 | 2009-06-18 | Korea Atomic Energy Research Inst | Czochralski crystal growth apparatus and method for refining salt waste using the same |
| US8298770B2 (en) | 1999-01-14 | 2012-10-30 | Scantibodies Laboratory, Inc. | Methods, kits, and antibodies for detecting parathyroid hormone |
| US8470543B2 (en) | 1999-01-14 | 2013-06-25 | Scantibodies Laboratory, Inc. | Methods for differentiating and monitoring parathyroid and bone status related diseases |
-
1990
- 1990-09-25 JP JP25178790A patent/JPH04132677A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10298000A (en) * | 1997-04-28 | 1998-11-10 | Dowa Mining Co Ltd | Plate single crystal and its production |
| US8298770B2 (en) | 1999-01-14 | 2012-10-30 | Scantibodies Laboratory, Inc. | Methods, kits, and antibodies for detecting parathyroid hormone |
| US8329409B2 (en) | 1999-01-14 | 2012-12-11 | Scantibodies Laboratory, Inc. | Methods, kits, and antibodies for detecting parathyroid hormone |
| US8470543B2 (en) | 1999-01-14 | 2013-06-25 | Scantibodies Laboratory, Inc. | Methods for differentiating and monitoring parathyroid and bone status related diseases |
| WO2002006569A1 (en) * | 2000-07-17 | 2002-01-24 | Shikoku Instrumentation Co.,Ltd. | Crystalline product having free surface of grown crystal and method for producing the same |
| JP2002029882A (en) * | 2000-07-17 | 2002-01-29 | Shikoku Instrumentation Co Ltd | Crystal product having crystal growth free surface and method of producing the same |
| JP2009132589A (en) * | 2007-11-29 | 2009-06-18 | Korea Atomic Energy Research Inst | Czochralski crystal growth apparatus and method for refining salt waste using the same |
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