JPH04139062A - Zirconia porcelain - Google Patents
Zirconia porcelainInfo
- Publication number
- JPH04139062A JPH04139062A JP2418104A JP41810490A JPH04139062A JP H04139062 A JPH04139062 A JP H04139062A JP 2418104 A JP2418104 A JP 2418104A JP 41810490 A JP41810490 A JP 41810490A JP H04139062 A JPH04139062 A JP H04139062A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- porcelain
- outside
- tetragonal
- zirconia porcelain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 title claims abstract description 84
- 229910052573 porcelain Inorganic materials 0.000 title claims abstract description 55
- 239000013078 crystal Substances 0.000 claims abstract description 102
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 claims abstract description 36
- 230000006866 deterioration Effects 0.000 claims abstract description 13
- 239000002245 particle Substances 0.000 abstract description 14
- 238000002441 X-ray diffraction Methods 0.000 abstract description 13
- 230000001105 regulatory effect Effects 0.000 abstract 1
- 238000005452 bending Methods 0.000 description 11
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 238000001816 cooling Methods 0.000 description 5
- 230000009466 transformation Effects 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 229910002077 partially stabilized zirconia Inorganic materials 0.000 description 4
- 239000007784 solid electrolyte Substances 0.000 description 4
- 229910002078 fully stabilized zirconia Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000005245 sintering Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 239000010987 cubic zirconia Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000635 electron micrograph Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 239000003779 heat-resistant material Substances 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- -1 oxygen ion Chemical class 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Ceramic Capacitors (AREA)
Abstract
Description
[0001] [0001]
本発明は高強度でカリ特定温度領域における長時間使用
による経時劣化の極めて少すいZr02−Y2O3系の
ジルコニア磁器に関するものである。
[0002]The present invention relates to Zr02-Y2O3-based zirconia porcelain that has high strength and exhibits extremely little deterioration over time due to long-term use in a specific temperature range. [0002]
従来、ZrO2−Y2O3系のジルコニア磁器としては
、立方晶のみより成る完全安定化ジルコニア磁器と、立
方晶と単斜晶より成る部分安定化ジルコニア磁器が知ら
れており、いずれも耐熱材料、固体電解質等として利用
されている。
[0003]Conventionally, as ZrO2-Y2O3-based zirconia porcelain, fully stabilized zirconia porcelain consisting only of cubic crystals and partially stabilized zirconia porcelain consisting of cubic crystals and monoclinic crystals are known, both of which are made of heat-resistant materials and solid electrolytes. It is used as such. [0003]
完全安定化ジルコニア磁器は、常温から約1500℃迄
の温度範囲においで安定であり、長時間使用による経時
劣化もC,ヨとんどないものであるが、強度が低いので
例えば自動車排ガス中の酸素濃度を検出する酸素センサ
ー用固体電解質として利用した場合、熱衝撃によって極
めて破損しやすいという欠点があった。一方立方晶と単
斜晶よりなる部分安定化ジルコニア磁器は、完全安定化
ジル、コニア磁器に較べると強度は大きく耐熱衝撃性も
よいものであるが、200℃ないし300 ’Cという
特定温度域における強度の経時劣化が極めて大きく、該
温度で長時間使用した場合、磁器表面に微細なりラック
が多数発生して吸水性を示すようになり著しく強度が低
下し、ついには破損するという重大な欠点を有している
ものであった。
[0004]
これはZrO2−Y203系部分安定化ジルコニア磁器
では約1500’Cの焼成温度において正方晶である結
晶粒子が約1500’Cがら室温への冷却中に500
’C付近で単斜晶に相変態を起こし、その除土ずる体積
変化により磁器中に過大な応力が加わりそのため極めて
微小なりラックが結晶粒子内に多数発生し、このクラッ
クが200℃ないし300℃の特定温度領域に長時間お
かれると拡大し、やがて磁器破壊に至るものであると考
えられる。
[0005]Fully stabilized zirconia porcelain is stable in the temperature range from room temperature to approximately 1,500°C, and does not deteriorate over time due to long-term use. When used as a solid electrolyte for an oxygen sensor that detects oxygen concentration, it has the disadvantage of being extremely susceptible to damage due to thermal shock. On the other hand, partially stabilized zirconia porcelain consisting of cubic and monoclinic crystals has higher strength and better thermal shock resistance than fully stabilized zirconia and conia porcelain, but it is difficult to use in a specific temperature range of 200°C to 300'C. The deterioration of strength over time is extremely large, and when used for a long time at this temperature, many microscopic racks appear on the surface of the porcelain, which becomes water-absorbing, resulting in a significant decrease in strength and eventually breaking. It was something that I had. [0004] This means that in ZrO2-Y203-based partially stabilized zirconia porcelain, the crystal grains, which are tetragonal at a firing temperature of about 1500'C, change from about 1500'C to 500'C during cooling to room temperature.
A phase transformation to monoclinic crystal occurs near 'C, and the volume change caused by the removal of the earth causes excessive stress in the porcelain, resulting in many extremely small racks being generated within the crystal grains, and these cracks occur at temperatures of 200°C to 300°C. It is thought that if left in a specific temperature range for a long time, it will expand and eventually lead to porcelain destruction. [0005]
本発明は従来のこのような部分安定化ジルコニア磁器の
欠点を解消し、優れた強度を有するとともに200 ’
Cないし300 ’Cの特定温度領域における強度の経
時劣化を著しく改良したジルコニア磁器であ一す、主と
してZrOとYOより成す、Y2O3/ZrO2のモル
比が2798〜7/93の範囲であって結晶粒子が主と
して立方晶の結晶粒子および正方晶の結晶粒子とより成
り正方晶の(200)面、立方晶の(200)面および
単斜晶の外5面(以下の外字は、The present invention eliminates the drawbacks of the conventional partially stabilized zirconia porcelain, has excellent strength, and has 200'
It is a zirconia porcelain that has significantly improved the aging deterioration of strength in a specific temperature range of C to 300'C.It is made mainly of ZrO and YO, with a molar ratio of Y2O3/ZrO2 in the range of 2798 to 7/93, and is crystalline. The particles are mainly composed of cubic crystal grains and tetragonal crystal grains, and the (200) face of the tetragonal crystal, the (200) face of the cubic crystal, and the outer five faces of the monoclinic crystal (the following external characters are
【符号の説明]の欄の
後に示すものである。)の各々のX線回折線のピーク強
度をT(200) 、C(200)およびM外6とした
とき次式
T(200) / (T(200) +C(200)
)≧0.05M外7/T(200)≦1
M外8/ (T(200) +C(200) )≦0.
4が成立し、平均結晶粒子径が2ミクロン以下であり、
200℃ないし300 ℃の温度域に曝したときの経時
劣化が極めて少ないことを特徴としたジルコニア磁器で
ある。
[0006]
すなわち、本発明はZrO−Y O系ジルコニア磁器
においてY2O37Z r 02のモル比を特定値とし
、平均結晶粒子径を特定値以下とすることにより従来約
500℃以下では相変態を起して不安定であった正方晶
を500 ℃から室温迄の温度範囲内で単斜晶に相変態
させることなく安定に存在させたものおよび結晶粒子を
主として正方晶の結晶粒子とするがあるいは主として立
方晶と正方晶の混合相とすることにより極めて高強度で
カリ特定温度領域における経時劣化の極めて少ないジル
コニア磁器である。
[0007]
【作用】
本発明を更に詳しく説明すれば、正方晶が安定に存在す
るためには磁器の平均結晶粒子径が2μ以下好ましくは
1μ以下であることが極めて重要である。
[0008]
すなわち平均結晶粒子径と抗折強度の関係は図1に示す
とおり耐久試、験前の曲線Aにおいては平均結晶粒子径
が2μ以上であっても強度の急激な低下は認められない
が、200℃〜300℃の特定温度領域に1500時間
保持した耐久試、験後の曲線Bにおいては、平均結晶粒
子径が2μを越えると過剰の単斜晶の生成により微細な
りラックが内在されているため強度が急激に低下し経時
劣化が著しくなる。さらに後述の実施例の記載のとおり
、平均結晶粒子径が2μ以下、好ましくは1μ以下であ
ると200℃〜300℃の特定温度領域に放置しても結
晶相がほとんど変化せず、正方晶が安定のまま存在する
。このように本発明において200 ’Cないし300
℃における耐久性に優れていると祢するは200 ’C
ないし300 ℃の間の任意の温度において経時劣化が
少ないことを意味する。具体的な測定手段の一例として
は実施例で述べるように200℃ないし300℃のすべ
ての温度域を網羅するために大気中で200℃ないし3
00℃の間を10℃/分の昇降温速度で加熱冷却を繰り
返す耐久試験を行い、耐久前と耐久後の抗折強度あるい
は結晶相の変化を測定するのが良い。むろん一定の温度
域にさらして耐久試験を行ってもよい。耐久時間は長い
程劣化の程度が増大するが、1500時間程度で従来の
ジルコニア磁器と本発明のジルコニア磁器との差が明瞭
となる。このように結晶粒子径を小さくすると正方晶よ
り単斜晶への変態が起りにくい理由は、結晶粒子が微小
であると粒子の表面自由エネルギーの関係で単斜晶より
正方晶の方が安定になるものと考えられる。なお、平均
結晶粒子径の測定は、次の方法で行なう。磁器の鏡面研
磨面を弗化水素酸でエツチング処理したものの電子顕微
鏡写真で粒子を50個以上含むような一定面積S内にあ
る粒子数nを数え、粒子1個あたりの平均面積Sに等し
い面積の円の直径dを式d = (4s/π)1″によ
り計算する。そしてdを同一試料の3ケ所以上の視野に
ついて求めその平均値を平均結晶粒子径とする。粒子数
nは一定面積Sに完全に含まれる粒子の数と一定面積の
境界線で切られる粒子の数の172との和とする。
[0009]
そしてX線回折線ピーク強度比と抗折強度との関係は図
2に示すとおり、正方晶の(200)面、単斜晶の外9
面、立方晶の(200)面のX線回折線強度をそれぞれ
T (200) M外10 、 C(200)とした
とき、本発明の主として正方晶の結晶粒子よりなるジル
コニア磁器Cの強度は、従来の立方晶の結晶粒子と単斜
晶の結晶粒子よりなるジルコニア磁器の劣化前の強度り
よりも大きく、また主として立方晶の結晶粒子と正方晶
の結晶粒子とよりなるジルコニア磁器Eは立方晶の結晶
粒子と単斜晶の結晶粒子とよりなるジルコニア磁器の特
定温度域における経時劣化後の強度Fよりも犬である。
また本発明のジルコニア磁器CおよびEは立方晶のみよ
りなるジルコニア磁器Gよりも高強度であり、且つ正方
晶が多くなるに従って強度が向上する。
[0010]
本発明で主として立方晶の結晶粒子と正方晶の結晶粒子
より成るジルコニア磁器とは、正方晶の結晶粒子と立方
晶の結晶粒子のみよりなるものは勿論のことT(200
) / (T(200) +C(200))の強度比が
0.05以上で、M外11/T (200)の強度比が
1以下、M外12/ (T(200) +C(200)
)の強度比が0.4以下となるような単斜晶が存在する
ものも含まれる。上記のX線ピーク強度比の範囲は、単
斜晶の量が全体の概略20容積パーセント以下に相当す
る。
[0011]
又本発明において主としてZ r 02とY2O3より
成るジルコニア磁器というのは、ZrOの安定化剤とし
てY2O3を主体として用いたジルコニア磁器を意味し
、Y203の約30モル%以下を他の稀土類元素の酸化
物、例えばYb203Sc ONb OSm O
、CeO2等あるいはCaO,MgOで23!23・
23
置換したものでもよい。また本発明によるジルコニア磁
器はS i02 。
Al2O3,粘土等の焼結助剤を磁器全体の30重量%
以下含有するものでもよい。なお磁器を構成している結
晶相は磁器表面を研磨し、鏡面とした面を用いてX線回
折法によって同定する。
[0012]
本発明の数値限定理由は以下のとおりである。Y2O3
/ZrO2のモル比は2/98未満では正方晶のジルコ
ニア磁器は得られず、また7/93を越えると正方晶が
ほとんど含まれなくなり立方晶のジルコニア磁器となる
。
[0013]
なお、本発明のジルコニア磁器はY2O3/ZrO2モ
ル比が2/98〜7/93、結晶粒子が主として立方晶
の結晶粒子と正方晶の結晶粒子より成り、平均結晶粒子
径が2μ以下というY2O3/ZrO。モル比、結晶粒
子の結晶相および平均結晶粒子径という3要件がすべて
備わった上で200℃ないし300℃における耐久性が
優れたジルコニア磁器となる。
[0014]
なお本発明の主として立方晶の結晶粒子および正方晶の
結晶粒子より成る特定値以下の平均結晶粒子径をもつ2
00℃〜300℃における耐久性の侵れたジルコニア磁
器をつくるには組成はもとより使用する原料、原料粒度
、焼成条件、冷却条件等を選択することにより容易に実
施できるものである。
[0015]
本発明の主として立方晶の結晶粒子および正方晶の結晶
粒子とよりなるジルコニア磁器は、酸素濃淡電池を構成
した場合、いずれも理論値通りの起電力が得られたため
、本発明によるジルコニア磁器は酸素イオン導電性固体
電解質としても充分使用できるものである。
[0016]It is shown after the [Explanation of symbols] column. ), the following formula T(200) / (T(200) + C(200)
)≧0.05M outside 7/T(200)≦1M outside 8/ (T(200) +C(200) )≦0.
4 holds true, the average crystal grain size is 2 microns or less,
Zirconia porcelain is characterized by extremely little deterioration over time when exposed to a temperature range of 200°C to 300°C. [0006] That is, the present invention sets the molar ratio of Y2O37Zr02 to a specific value in ZrO-YO-based zirconia porcelain, and sets the average crystal grain size to a specific value or less, thereby preventing phase transformation from occurring at temperatures below about 500°C. The tetragonal crystal, which was unstable in the conventional process, is made to exist stably without phase transformation to monoclinic crystal within the temperature range from 500 °C to room temperature, and the crystal grains are mainly tetragonal crystal particles or mainly cubic crystal grains. This zirconia porcelain has extremely high strength due to its mixed phase of crystal and tetragonal crystal, and exhibits extremely little deterioration over time in a certain temperature range. [0007] To explain the present invention in more detail, in order for the tetragonal crystal to exist stably, it is extremely important that the average crystal grain size of the porcelain be 2 μm or less, preferably 1 μm or less. [0008] In other words, the relationship between the average crystal grain size and the bending strength is as shown in Figure 1. In curve A before the durability test, no sudden decrease in strength is observed even when the average crystal grain size is 2μ or more. However, in curve B after an endurance test held in a specific temperature range of 200°C to 300°C for 1500 hours, when the average crystal grain size exceeds 2μ, fine racks are formed due to the formation of excessive monoclinic crystals. As a result, the strength decreases rapidly and deterioration over time becomes significant. Furthermore, as described in the Examples below, if the average crystal grain size is 2 μ or less, preferably 1 μ or less, the crystal phase will hardly change even if left in a specific temperature range of 200°C to 300°C, and the tetragonal crystal will not change. It remains stable. In this way, in the present invention, 200'C to 300'C
It is said to have excellent durability at temperatures up to 200'C.
This means that there is little deterioration over time at any temperature between 300°C and 300°C. As an example of a specific measurement method, as described in the examples, in order to cover the entire temperature range of 200 to 300 degrees Celsius, measurement was performed in the atmosphere at 200 to 3
It is preferable to conduct an endurance test in which heating and cooling are repeated between 00°C and 10°C/min, and to measure changes in bending strength or crystal phase before and after the durability test. Of course, the durability test may also be conducted by exposing it to a certain temperature range. The longer the durability time, the greater the degree of deterioration, but the difference between the conventional zirconia porcelain and the zirconia porcelain of the present invention becomes clear after about 1500 hours. The reason why transformation to monoclinic crystals is less likely to occur when the crystal grain size is reduced is that when the crystal grains are small, tetragonal crystals are more stable than monoclinic crystals due to the surface free energy of the particles. This is considered to be the case. Note that the average crystal grain size is measured by the following method. Count the number n of particles within a certain area S that contains 50 or more particles in an electron micrograph of a mirror-polished porcelain surface etched with hydrofluoric acid, and calculate the area equal to the average area S per particle. Calculate the diameter d of the circle using the formula d = (4s/π)1''. Then, calculate d for three or more visual fields of the same sample and use the average value as the average crystal grain diameter. The number of particles n is a constant area. Let it be the sum of the number of particles completely included in S and the number of particles cut by the boundary line of a constant area, 172. [0009] The relationship between the X-ray diffraction line peak intensity ratio and the bending intensity is shown in Figure 2. As shown, (200) plane of tetragonal crystal, outer 9 plane of monoclinic crystal
When the X-ray diffraction line intensities of the (200) plane and cubic crystal plane are respectively T (200) M 10 and C (200), the strength of the zirconia porcelain C mainly composed of tetragonal crystal grains of the present invention is , is larger than the strength before deterioration of conventional zirconia porcelain made of cubic crystal grains and monoclinic crystal grains, and zirconia porcelain E mainly composed of cubic crystal grains and tetragonal crystal grains has a cubic The strength F after deterioration over time in a specific temperature range of zirconia porcelain made of monoclinic crystal grains and monoclinic crystal grains is much higher. Furthermore, the zirconia porcelains C and E of the present invention have higher strength than the zirconia porcelain G made of only cubic crystals, and the strength improves as the number of tetragonal crystals increases. [0010] In the present invention, zirconia porcelain mainly composed of cubic crystal grains and tetragonal crystal grains refers to zirconia porcelain mainly composed of cubic crystal grains and cubic crystal grains, as well as zirconia porcelain composed only of tetragonal crystal grains and cubic crystal grains.
) / (T(200) +C(200)) intensity ratio is 0.05 or more, M outside 11/T (200) intensity ratio is 1 or less, M outside 12/ (T(200) +C(200)
) includes monoclinic crystals with an intensity ratio of 0.4 or less. The above range of X-ray peak intensity ratio corresponds to an amount of monoclinic crystals of approximately 20% by volume or less of the total. [0011] Also, in the present invention, zirconia porcelain mainly composed of Zr 02 and Y2O3 means zirconia porcelain mainly using Y2O3 as a stabilizer of ZrO, and about 30 mol% or less of Y203 is composed of other rare earths. Oxides of similar elements, such as Yb203Sc ONb OSm O
, CeO2 etc. or CaO, MgO with 23!23・
23 It may be substituted. Moreover, the zirconia porcelain according to the present invention is Si02. Sintering aids such as Al2O3 and clay account for 30% by weight of the entire porcelain.
It may contain the following: The crystalline phase constituting the porcelain is identified by X-ray diffraction using a mirror-polished surface of the porcelain. [0012] The reasons for the numerical limitations of the present invention are as follows. Y2O3
If the molar ratio of /ZrO2 is less than 2/98, tetragonal zirconia porcelain cannot be obtained, and if it exceeds 7/93, almost no tetragonal crystals are contained, resulting in cubic zirconia porcelain. [0013] The zirconia porcelain of the present invention has a Y2O3/ZrO2 molar ratio of 2/98 to 7/93, crystal grains mainly consisting of cubic crystal grains and tetragonal crystal grains, and an average crystal grain size of 2 μ or less. Y2O3/ZrO. Zirconia porcelain has excellent durability at 200° C. to 300° C. while meeting all three requirements of molar ratio, crystal phase of crystal grains, and average crystal grain size. [0014] Note that the present invention mainly consists of cubic crystal grains and tetragonal crystal grains, and has an average crystal grain size of not more than a specific value.
The production of zirconia porcelain with improved durability at 00°C to 300°C can be easily achieved by selecting the composition, raw materials used, raw material particle size, firing conditions, cooling conditions, etc. [0015] When the zirconia porcelain of the present invention mainly consists of cubic crystal grains and tetragonal crystal grains, an electromotive force according to the theoretical value was obtained in both cases when an oxygen concentration battery was constructed. Porcelain can also be used satisfactorily as an oxygen ion conductive solid electrolyte. [0016]
次に実施例を述べる。
実施例1
表1乃至表4に示す組成となるようにZrO3,Y2O
3又はその化合物を調合しボールミル混合した。その混
合物を800℃で仮焼し、ボールミルにて湿式粉砕し、
乾燥しな後その粉末をプレス成形し、1000℃ないし
1400℃にて1時間ないし3時間焼成して本発明のジ
ルコニア磁器を得た。そしてこれらの磁器について平均
結晶粒子径、X線回折線強度、抗折強度、体積抵抗率を
比較測定した。なおX線回折線強度比は立方晶の(20
0)面、正方晶の(200)面および単斜晶の外13面
でのX線回折線ピーク高さの比とした。抗折強度は磁器
を3.5 X3.5 X50mmの棒状に仕上げ3点l
げ法にて求めた。体積抵抗率は4端子法により、大気中
400℃にて測定した。
[0017]
なお表1乃至表4中200℃〜300℃耐久とあるのは
200℃〜300℃の間を、10℃/分の昇降温速度で
加熱、冷却を繰り返した耐久試験である。各種組成によ
る測定結果を表1乃至表4に示す。表1〜表4には20
0℃〜300℃の耐久試、験体のX線回折線強度比も記
載する。さらに第1表中[B/AX100Jの欄は耐久
試験後の抗折強度を初期の抗折強度に比較した割合をパ
ーセントで示し、rC/DJの欄はX線回折線強度比に
おいて単斜晶外14面/正方晶(200)面の耐久試験
後の値に対する初期値の割合、すなわち耐久試、験によ
る正方晶から単斜晶への相変態の程度、さらに換言すれ
ば耐久試、験による正方晶の減少率を意味し、これが1
に近い程正方晶が安定であることを示す。表1乃至表4
には本発明の数値限定範囲外の例を参考例として合わせ
記載した。
[0018]Next, an example will be described. Example 1 ZrO3, Y2O were added to have the compositions shown in Tables 1 to 4.
3 or its compound was prepared and mixed in a ball mill. The mixture was calcined at 800°C, wet-pulverized in a ball mill,
After drying, the powder was press-molded and fired at 1000°C to 1400°C for 1 to 3 hours to obtain the zirconia porcelain of the present invention. The average crystal grain size, X-ray diffraction line intensity, bending strength, and volume resistivity of these porcelains were compared and measured. Note that the X-ray diffraction line intensity ratio is (20
0) plane, the (200) plane of the tetragonal crystal, and the X-ray diffraction line peak height of the outer 13 planes of the monoclinic crystal. The bending strength is determined by finishing the porcelain into a bar shape of 3.5 x 3.5 x 50 mm.Three points l
Obtained using the ge method. The volume resistivity was measured in the atmosphere at 400° C. by a four-probe method. [0017] In Tables 1 to 4, 200° C. to 300° C. durability refers to a durability test in which heating and cooling were repeated between 200° C. and 300° C. at a temperature increase/decrease rate of 10° C./min. Measurement results for various compositions are shown in Tables 1 to 4. Tables 1 to 4 show 20
Durability tests from 0°C to 300°C and X-ray diffraction line intensity ratios of test specimens are also described. Furthermore, in Table 1, the [B/AX100J column shows the ratio of the bending strength after the durability test compared to the initial bending strength as a percentage, and the rC/DJ column shows the monoclinic crystallinity in the X-ray diffraction line intensity ratio. The ratio of the initial value to the value after the durability test of the outer 14 faces/tetragonal (200) face, that is, the degree of phase transformation from tetragonal to monoclinic according to the durability test, or in other words, the ratio of the initial value to the value after the durability test. This means the reduction rate of tetragonal crystals, which is 1
The closer to , the more stable the tetragonal crystal is. Tables 1 to 4
Examples outside the numerical limitation range of the present invention are also described as reference examples. [0018]
【表1】[Table 1]
【表21
注1)焼結助剤の添加量とは磁器全体に対する焼結助剤
の重量%である注2)T、C,Mとはそれぞれ正方晶(
Tetragonal )、立方晶(Cubic)
単斜晶(Monoclinic)を示す
注3 ) C(200)、T(200)とは立方晶の(
200)面、正方晶の(200)面のX線回折線強度を
示す
注4)M外15は単斜晶の外16面のX線回折線強度を
示す注5)耐久試験は200℃ないし300℃の間を1
0℃/分の昇降温度速度で加熱、冷却を繰り返し150
0時間経過したものである[0021]
[0022]
[0023]
図3には表1乃至表4中に記載の例について平均結晶粒
子径に対するC/Dの値を図示し、図4には同様に平均
結晶粒子径に対するB/AX100の値を図示する。図
3、図4中の各点についている数字は実施例のNo、
を示す。
[0024]
表1乃至表4および図3、図4から明らかなとおり、本
発明のジルコニア磁器は高強度で、かつ200℃〜30
0℃という特定の温度領域に放置しても結晶相、抗折強
度ともほとんど変化がない。
[0025]
さらにこのように特定温度領域で安定であるなめには磁
器の平均結晶粒子径が2μ以下、好ましくは1μ以下で
あることが必要であると判明した。さらに体積抵抗率も
低いものであることが確認された。
[0026]
【発明の効果】
比において、主として正方晶の結晶粒子および立方晶の
結晶粒子とより成り、かつその結晶粒子径が特定値以下
であることにより極めて高強度でかつ200℃〜300
℃の特定温度域における経時劣化も著しく少ないもので
あり、高強度かつ耐熱特性が要求される用途例えば酸素
濃淡電池用固体電解質、自動車用酸素センサ鉄鋼用の酸
素メーター、発電用燃料電池、内燃機関関連部品、サー
ミスタ、切削バイト、玉石、包丁など広く工業材料とし
て好適であり、産業上極めて有用なものである。[Table 21 Note 1) The amount of sintering aid added is the weight% of the sintering aid to the whole porcelain.Note 2) T, C, and M are respectively tetragonal (
Tetragonal), Cubic
Note 3) C(200) and T(200) indicate monoclinic (monoclinic).
200) plane, indicates the X-ray diffraction line intensity of the (200) plane of the tetragonal crystal Note 4) M outside 15 indicates the X-ray diffraction line intensity of the outer 16 plane of the monoclinic crystal Note 5) Durability test was conducted at 200°C or 1 between 300℃
Repeated heating and cooling at a rate of temperature rise and fall of 0°C/min 150
[0021] [0022] [0023] Figure 3 shows the values of C/D versus average crystal grain size for the examples listed in Tables 1 to 4, and Figure 4 shows the values of C/D for the examples listed in Tables 1 to 4. Figure 2 shows the value of B/AX100 with respect to the average crystal grain size. The numbers attached to each point in FIGS. 3 and 4 are the No. of the example,
shows. [0024] As is clear from Tables 1 to 4 and FIGS. 3 and 4, the zirconia porcelain of the present invention has high strength and a temperature of 200°C to 30°C.
Even if it is left in a specific temperature range of 0°C, there is almost no change in crystal phase or bending strength. [0025] Furthermore, it has been found that in order to be stable in a specific temperature range, the average crystal grain size of the porcelain must be 2 μ or less, preferably 1 μ or less. Furthermore, it was confirmed that the volume resistivity was also low. [0026] [Effect of the invention] In terms of ratio, it is mainly composed of tetragonal crystal grains and cubic crystal grains, and the crystal grain size is below a specific value, so it has extremely high strength and has a temperature of 200°C to 300°C.
Deterioration over time in a specific temperature range of ℃ is extremely low, and it is suitable for applications that require high strength and heat resistance, such as solid electrolytes for oxygen concentration batteries, oxygen sensors for automobiles, oxygen meters for steel, fuel cells for power generation, and internal combustion engines. It is suitable as an industrial material for a wide range of related parts, thermistors, cutting tools, cobblestones, kitchen knives, etc., and is extremely useful industrially.
【図1】
図1はジルコニア磁器の平均結晶粒子径と抗折強度との
耐久状、験前後の関係を示す説明図である。FIG. 1 is an explanatory diagram showing the relationship between the average crystal grain size and the bending strength of zirconia porcelain before and after the durability test.
【図2】
図2は立方晶(200)面と正方晶(200)面のX線
回折線の強度比と抗折強度とのの抗折強度との関係を示
す説明図である。FIG. 2 is an explanatory diagram showing the relationship between the intensity ratio of the X-ray diffraction lines of the cubic (200) plane and the tetragonal (200) plane and the transverse intensity.
【図3】
図3は本発明のジルコニア磁器のX線回折線強度比の初
期値(C)と耐久試験後の値(D)との比(C/D)と
平均結晶粒子径との関係を示す特性図である。[Figure 3] Figure 3 shows the relationship between the ratio (C/D) between the initial value (C) and the value (D) of the X-ray diffraction line intensity ratio of the zirconia porcelain of the present invention and the value after the durability test (D) and the average crystal grain size. FIG.
【図4】
図4は同じく本発明のジルコニア磁器の抗折強度(A)
と耐久試験後の抗折強[Figure 4] Figure 4 also shows the bending strength (A) of the zirconia porcelain of the present invention.
and bending strength after durability test
【外11]、 、[外12]
、[外13L 【外14]、[外15]、[外16]
。
【外17】(すべて同一の外字である。)[Outside 11], , [Outside 12]
, [Outside 13L [Outside 14], [Outside 15], [Outside 16]
. [External 17] (All external characters are the same.)
図面 drawing
【図1】[Figure 1]
【図2】
Xメ泉圓折礫ピーグチ東崖比
’C,E:Ttzoo)/(−rtzom−Ctzoo
r)[Figure 2]
r)
【図3】[Figure 3]
【図4】 θ !、0 手片鮎品m−7−任0す[Figure 4] θ ! ,0 Ayu item m-7-nin0su
Claims (1)
2O_3/ZrO_2のモル比が2/98〜7/93の
範囲であって結晶粒子が主として立方晶の結晶粒子およ
び正方晶の結晶粒子とより成り正方晶の(200)面、
立方晶の(200)面および単斜晶の外1面の各々のX
線回折線のピーク強度をT(200)、C(200)お
よびM外2としたとき次式 T(200)/(T(200)+C(200))≧0.
05M外3/T(200)≦1 M外4/(T(200)+C(200))≦0.4が成
立し、平均結晶粒子径が2ミクロン以下であり、200
℃乃至300℃の温度域に曝したときの経時劣化が極め
て少ないことを特徴としたジルコニア磁器。 【外1】,【外2】,【外3】,【外4】(すべて同一
の外字である。)(111)1. Mainly composed of ZrO_2 and Y_2O_3, Y_
The molar ratio of 2O_3/ZrO_2 is in the range of 2/98 to 7/93, the crystal grains are mainly composed of cubic crystal grains and tetragonal crystal grains, and the (200) face of the tetragonal crystal,
X of each of the (200) plane of the cubic crystal and the outer one plane of the monoclinic crystal
When the peak intensities of the line diffraction lines are T(200), C(200) and 2 outside M, the following formula T(200)/(T(200)+C(200))≧0.
05M outside 3/T(200)≦1 M outside 4/(T(200)+C(200))≦0.4 is established, the average crystal grain size is 2 microns or less, and 200
Zirconia porcelain characterized by extremely little deterioration over time when exposed to a temperature range of 300°C to 300°C. [Example 1], [Example 2], [Example 3], [Example 4] (all the same external characters) (111)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2418104A JPH04139062A (en) | 1990-12-28 | 1990-12-28 | Zirconia porcelain |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2418104A JPH04139062A (en) | 1990-12-28 | 1990-12-28 | Zirconia porcelain |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63278551A Division JPH01157072A (en) | 1988-11-05 | 1988-11-05 | Oxygen concentration cell |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04139062A true JPH04139062A (en) | 1992-05-13 |
| JPH0463024B2 JPH0463024B2 (en) | 1992-10-08 |
Family
ID=18526045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2418104A Granted JPH04139062A (en) | 1990-12-28 | 1990-12-28 | Zirconia porcelain |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04139062A (en) |
-
1990
- 1990-12-28 JP JP2418104A patent/JPH04139062A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0463024B2 (en) | 1992-10-08 |
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