JPH04144045A - Ｘ線管陽極およびそれを用いたｘ線管 - Google Patents

Ｘ線管陽極およびそれを用いたｘ線管

Info

Publication number
JPH04144045A
JPH04144045A JP2418519A JP41851990A JPH04144045A JP H04144045 A JPH04144045 A JP H04144045A JP 2418519 A JP2418519 A JP 2418519A JP 41851990 A JP41851990 A JP 41851990A JP H04144045 A JPH04144045 A JP H04144045A
Authority
JP
Japan
Prior art keywords
ray tube
layer
anode
ray
diamond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2418519A
Other languages
English (en)
Japanese (ja)
Inventor
Gregory Alan Mohr
グレゴリイ・アラン・モーア
Michael K Cueman
マイケル・ケント・キューマン
Jerome J Tiemann
ジェローム・ジョンソン・タイマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JPH04144045A publication Critical patent/JPH04144045A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/12—Cooling non-rotary anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/12—Cooling
    • H01J2235/122—Cooling of the window
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/18—Windows, e.g. for X-ray transmission
    • H01J2235/183—Multi-layer structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters
JP2418519A 1989-12-11 1990-12-10 Ｘ線管陽極およびそれを用いたｘ線管 Withdrawn JPH04144045A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44838489A 1989-12-11 1989-12-11
US448,384 1989-12-11

Publications (1)

Publication Number Publication Date
JPH04144045A true JPH04144045A (ja) 1992-05-18

Family

ID=23780102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2418519A Withdrawn JPH04144045A (ja) 1989-12-11 1990-12-10 Ｘ線管陽極およびそれを用いたｘ線管

Country Status (2)

Country Link
EP (1) EP0432568A3 (de)
JP (1) JPH04144045A (de)

Cited By (9)

* Cited by examiner, † Cited by third party
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US5629969A (en) * 1994-03-18 1997-05-13 Hitachi, Ltd. X-ray imaging system
JP2006510192A (ja) * 2002-12-11 2006-03-23 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 単色ｘ線生成用ｘ線源
JP2009212058A (ja) * 2008-03-06 2009-09-17 Rigaku Corp Ｘ線発生装置ならびにｘ線分析装置、ｘ線透過像計測装置及びｘ線干渉計
JP2012256444A (ja) * 2011-06-07 2012-12-27 Canon Inc Ｘ線放出ターゲットおよびｘ線放出装置
JP2012256443A (ja) * 2011-06-07 2012-12-27 Canon Inc Ｘ線放出ターゲットおよびｘ線放出装置
JP2016518689A (ja) * 2013-05-03 2016-06-23 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ Ｘ線源、およびイメージングシステム
US9589760B2 (en) 2013-10-16 2017-03-07 Shimadzu Corporation X-ray generator
US10910191B2 (en) 2017-04-28 2021-02-02 Hamamatsu Photonics K.K. X-ray tube and X-ray generation device
WO2024029474A1 (ja) * 2022-08-05 2024-02-08 株式会社島津製作所 Ｘ線撮影装置およびｘ線管

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DE4228559A1 (de) * 1992-08-27 1994-03-03 Dagang Tan Röntgenröhre mit einer Transmissionsanode
GB9318197D0 (en) * 1993-09-02 1993-10-20 Medical Res Council Improvements in or relating xo x-ray tubes
JP3612795B2 (ja) * 1994-08-20 2005-01-19 住友電気工業株式会社 Ｘ線発生装置
US5878110A (en) * 1994-08-20 1999-03-02 Sumitomo Electric Industries, Ltd. X-ray generation apparatus
DE19544203A1 (de) * 1995-11-28 1997-06-05 Philips Patentverwaltung Röntgenröhre, insbesondere Mikrofokusröntgenröhre
US5602899A (en) * 1996-01-31 1997-02-11 Physical Electronics Inc. Anode assembly for generating x-rays and instrument with such anode assembly
DE69836730T2 (de) * 1997-04-08 2007-10-04 Xrt Ltd. Hochauflösende röntgenbilderdarstellung von sehr kleinen objekten
US6289079B1 (en) * 1999-03-23 2001-09-11 Medtronic Ave, Inc. X-ray device and deposition process for manufacture
DE19934987B4 (de) 1999-07-26 2004-11-11 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgenanode und ihre Verwendung
DE10130070A1 (de) 2001-06-21 2003-01-02 Philips Corp Intellectual Pty Röntgenstrahler mit Flüssigmetall-Target
AU2003214929B2 (en) * 2002-01-31 2006-07-13 The Johns Hopkins University X-ray source and method for producing selectable x-ray wavelength
JP4322470B2 (ja) 2002-05-09 2009-09-02 浜松ホトニクス株式会社 Ｘ線発生装置
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
CN100573799C (zh) * 2002-12-11 2009-12-23 皇家飞利浦电子股份有限公司 生单色x-射线的x-射线源
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
GB0309385D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray monitoring
GB0309387D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-Ray scanning
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
GB0309371D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-Ray tubes
GB0309374D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray sources
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
GB0309383D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray tube electron sources
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
GB0309379D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray scanning
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
EP1727185A1 (de) * 2005-05-26 2006-11-29 Panalytical B.V. Röntgenanode
US9046465B2 (en) 2011-02-24 2015-06-02 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
GB2453570A (en) * 2007-10-11 2009-04-15 Kratos Analytical Ltd Electrode for x-ray apparatus
JP5203723B2 (ja) * 2008-01-17 2013-06-05 株式会社東芝 Ｘ線管
DE102008007413A1 (de) 2008-02-04 2009-08-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgentarget
GB0803644D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0803641D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
GB0816823D0 (en) 2008-09-13 2008-10-22 Cxr Ltd X-ray tubes
GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
DE102011079179A1 (de) * 2011-07-14 2013-01-17 Siemens Aktiengesellschaft Monochromatische Röntgenquelle
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
CN103293174B (zh) * 2012-03-01 2015-07-01 纳优科技（北京）有限公司 一种多探测器及多光管的x射线荧光光谱仪及针对大体积样品的x射线荧光光谱检测方法
KR102167245B1 (ko) 2013-01-31 2020-10-19 라피스캔 시스템스, 인코포레이티드 이동식 보안검사시스템
US9390881B2 (en) * 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10847336B2 (en) 2017-08-17 2020-11-24 Bruker AXS, GmbH Analytical X-ray tube with high thermal performance
US10585206B2 (en) 2017-09-06 2020-03-10 Rapiscan Systems, Inc. Method and system for a multi-view scanner
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
US12181422B2 (en) 2019-09-16 2024-12-31 Rapiscan Holdings, Inc. Probabilistic image analysis
US11551903B2 (en) 2020-06-25 2023-01-10 American Science And Engineering, Inc. Devices and methods for dissipating heat from an anode of an x-ray tube assembly
CN114501758B (zh) * 2022-01-11 2025-03-25 长春理工大学 一种高通量x射线源
CN118541772A (zh) 2022-01-13 2024-08-23 斯格瑞公司 用于生成高通量低能量x射线的微焦x射线源
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025248475A1 (en) * 2024-05-28 2025-12-04 Nova Measuring Instruments Inc. X-ray generation device with cooled diamond substrate

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5629969A (en) * 1994-03-18 1997-05-13 Hitachi, Ltd. X-ray imaging system
JP2006510192A (ja) * 2002-12-11 2006-03-23 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 単色ｘ線生成用ｘ線源
JP2009212058A (ja) * 2008-03-06 2009-09-17 Rigaku Corp Ｘ線発生装置ならびにｘ線分析装置、ｘ線透過像計測装置及びｘ線干渉計
JP2012256444A (ja) * 2011-06-07 2012-12-27 Canon Inc Ｘ線放出ターゲットおよびｘ線放出装置
JP2012256443A (ja) * 2011-06-07 2012-12-27 Canon Inc Ｘ線放出ターゲットおよびｘ線放出装置
US9281158B2 (en) 2011-06-07 2016-03-08 Canon Kabushiki Kaisha X-ray emitting target and X-ray emitting device
JP2016518689A (ja) * 2013-05-03 2016-06-23 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ Ｘ線源、およびイメージングシステム
US9589760B2 (en) 2013-10-16 2017-03-07 Shimadzu Corporation X-ray generator
US10910191B2 (en) 2017-04-28 2021-02-02 Hamamatsu Photonics K.K. X-ray tube and X-ray generation device
WO2024029474A1 (ja) * 2022-08-05 2024-02-08 株式会社島津製作所 Ｘ線撮影装置およびｘ線管

Also Published As

Publication number Publication date
EP0432568A2 (de) 1991-06-19
EP0432568A3 (en) 1991-08-28

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Legal Events

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A300 Application deemed to be withdrawn because no request for examination was validly filed

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Effective date: 19980312