JPH04152147A - Thermal head and manufacture thereof - Google Patents
Thermal head and manufacture thereofInfo
- Publication number
- JPH04152147A JPH04152147A JP27535790A JP27535790A JPH04152147A JP H04152147 A JPH04152147 A JP H04152147A JP 27535790 A JP27535790 A JP 27535790A JP 27535790 A JP27535790 A JP 27535790A JP H04152147 A JPH04152147 A JP H04152147A
- Authority
- JP
- Japan
- Prior art keywords
- heating
- temp
- thermal head
- temperature
- valence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 70
- 239000004065 semiconductor Substances 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 claims abstract description 13
- 239000000203 mixture Substances 0.000 claims abstract description 7
- 239000013212 metal-organic material Substances 0.000 claims description 6
- 238000009826 distribution Methods 0.000 abstract description 15
- 229910002113 barium titanate Inorganic materials 0.000 abstract description 7
- 238000007639 printing Methods 0.000 abstract description 7
- 230000000996 additive effect Effects 0.000 abstract description 4
- 239000000654 additive Substances 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 3
- 125000002524 organometallic group Chemical group 0.000 abstract 1
- 230000020169 heat generation Effects 0.000 description 22
- 239000010408 film Substances 0.000 description 21
- 238000010586 diagram Methods 0.000 description 14
- 239000000919 ceramic Substances 0.000 description 6
- 239000010931 gold Substances 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 239000011368 organic material Substances 0.000 description 5
- 230000001052 transient effect Effects 0.000 description 5
- 238000005338 heat storage Methods 0.000 description 4
- 229910052745 lead Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000009966 trimming Methods 0.000 description 4
- 230000006378 damage Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000010304 firing Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 238000000137 annealing Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- WUOACPNHFRMFPN-SECBINFHSA-N (S)-(-)-alpha-terpineol Chemical compound CC1=CC[C@@H](C(C)(C)O)CC1 WUOACPNHFRMFPN-SECBINFHSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- OVKDFILSBMEKLT-UHFFFAOYSA-N alpha-Terpineol Natural products CC(=C)C1(O)CCC(C)=CC1 OVKDFILSBMEKLT-UHFFFAOYSA-N 0.000 description 1
- 229940088601 alpha-terpineol Drugs 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- LVXIMLLVSSOUNN-UHFFFAOYSA-N fluorine;nitric acid Chemical compound [F].O[N+]([O-])=O LVXIMLLVSSOUNN-UHFFFAOYSA-N 0.000 description 1
- -1 metal oxide compound Chemical class 0.000 description 1
- 239000006259 organic additive Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Electronic Switches (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、ワードプロセッサ、パーソナルコンピュータ
等の出力装置としてのプリンタや、ファクシミリの記録
部等に使用されるサーマルヘッドとその製造方法に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a thermal head used in a printer as an output device of a word processor, a personal computer, etc., a recording section of a facsimile, and a method of manufacturing the same.
最近、ワードプロセッサ、パーソナルコンピュータ等の
出力装置としてのプリンタや、ファクシミリの記録部を
構成するヘッドに、サーマルヘッドが広く採用されるよ
うになった。In recent years, thermal heads have come to be widely employed in printers as output devices for word processors, personal computers, etc., and in heads constituting the recording section of facsimile machines.
サーマルヘッドは、少なくとも1対の電極と、この電極
対を橋絡する如く設けられた発熱抵抗体とで発熱部を形
成し、前記電極対に電流を印加することで発熱抵抗体を
発熱させ、感熱記録紙を発色させ、あるいはインクドナ
ーフィルムを昇華させて記録媒体に文字あるいは図形等
を形成するものである。The thermal head includes at least one pair of electrodes and a heating resistor provided to bridge the electrode pair to form a heating section, and applying a current to the electrode pair causes the heating resistor to generate heat; Characters, figures, etc. are formed on a recording medium by coloring heat-sensitive recording paper or by sublimating an ink donor film.
この種のサーマルヘッドは、製造方法の違いにより、厚
膜型と薄膜型とに大別される。This type of thermal head is broadly classified into a thick film type and a thin film type depending on the manufacturing method.
厚膜型サーマルヘッドは、大規模な成膜装置を必要とす
る薄膜型サーマルヘッドに対して、製造が簡単で量産性
に優れるが、その反面、発熱部の抵抗値のばらつきが大
きいことから薄膜型サーマルヘッドに比べて印字品質が
劣るという欠点があった。Thick-film thermal heads are easier to manufacture and easier to mass-produce than thin-film thermal heads, which require large-scale film forming equipment. The disadvantage was that the printing quality was inferior to that of the conventional thermal head.
これを解決する手段としては例えばりフトオフ法やMO
D法が知られている。Examples of ways to solve this problem include the foot-off method and MO
D method is known.
なお、この種のサーマルヘッドの発熱抵抗体とその製造
方法に関する従来技術を開示したものとしては、例えば
特開昭63−164301号公報に開示のものを挙げる
ことができる。An example of a prior art disclosure of a heating resistor of this type of thermal head and a method of manufacturing the same is disclosed in Japanese Patent Application Laid-Open No. 164301/1983.
しかしながら、厚膜型サーマルヘッドも薄膜型のサーマ
ルヘッドも、発熱抵抗体に固有の抵抗値ばらつきを持っ
ている。However, both thick-film thermal heads and thin-film thermal heads have variations in resistance values inherent in the heating resistors.
この抵抗値ばらつきは抵抗体の印字面における発熱温度
にむらをもたらし、印字濃度のむらとして現れる。This resistance value variation causes unevenness in the heat generation temperature on the printing surface of the resistor, which appears as unevenness in printing density.
従来のサーマルヘッドでは、厚膜型では隣接発熱抵抗体
間の抵抗値ばらつきをパルストリミングによって調整し
ている。In the conventional thermal head, the variation in resistance value between adjacent heating resistors is adjusted by pulse trimming in the thick film type.
一方、薄膜型では隣接発熱抵抗体間の抵抗値ばらつきは
小さいが、抵抗値の分布に大きなうねりをもっており、
厚膜型のような局所的な抵抗値の調整を行うパルストリ
ミングを適用することはできない。On the other hand, in the thin film type, the variation in resistance value between adjacent heating resistors is small, but the distribution of resistance value has large undulations.
Pulse trimming, which locally adjusts the resistance value as in the thick film type, cannot be applied.
また、発熱抵抗体の発熱温度分布は、発熱抵抗体の中央
部にピークをもつ山形の温度分布であるため、印字され
たドツトの形状が丸くなってしまう欠点がある。Furthermore, since the heating temperature distribution of the heating resistor is a mountain-shaped temperature distribution with a peak at the center of the heating resistor, there is a drawback that the shape of the printed dots becomes round.
その対策として、発熱ピーク温度を高くするように大電
流駆動して印字ドツト形状を発熱抵抗体形状の正確な再
現となるようにすることもできるが、温度を高くすると
発熱抵抗体の劣化を早め、また発熱抵抗体の破壊をもた
らすという問題がある。As a countermeasure, it is possible to make the printed dot shape accurately reproduce the shape of the heating resistor by driving with a large current to raise the heating peak temperature, but increasing the temperature will accelerate the deterioration of the heating resistor. There is also the problem that the heating resistor is destroyed.
発熱抵抗体の劣化および破壊は発熱抵抗体臼らの発熱温
度によって起こる。Deterioration and destruction of the heating resistor occur due to the heat generated by the heating resistor.
そのため、従来のサーマルヘッドは、最大定格エネルギ
ー(約0.43mJ)で10”パJl/ス(A4判で約
10万枚)を寿命の仕様として定めているのが一般的で
ある。Therefore, the life of conventional thermal heads is generally specified as 10" passes (approximately 100,000 sheets for A4 size) at the maximum rated energy (approximately 0.43 mJ).
本発明の目的は、上記従来技術の問題点を解決し、
(1)発熱抵抗体の発熱温度を自己制御して定温発熱さ
せる
(2)発熱抵抗体の発熱温度分布を均一としてドツト再
現性をよ(する
(3)発熱抵抗体の熱破壊を自己防止することを可能と
したサーマルヘッドおよびその製造方法を提供すること
にある。The purpose of the present invention is to solve the above-mentioned problems of the prior art, and (1) self-control the heating temperature of the heating resistor to generate heat at a constant temperature; and (2) uniformize the heating temperature distribution of the heating resistor to improve dot reproducibility. (3) An object of the present invention is to provide a thermal head that can self-prevent thermal destruction of a heating resistor, and a method for manufacturing the same.
上記目的を達成するために、本発明は、発熱抵抗体とし
てBaTi0:+系原子価制御半導体の多結晶を用いた
ことを特徴とする。In order to achieve the above object, the present invention is characterized in that a polycrystalline BaTi0:+-based valence-controlled semiconductor is used as a heating resistor.
また、絶縁基板上に、Ba、Tiを少なくとも含む金属
有機材料の混合物を着膜し、
前記印刷した金属有機材料の混合物を着膜した絶縁基板
を焼成し、アニール処理して粒成長させることによりB
aTi0.系原子価制御半導体の多結晶を作り、
これを発熱抵抗体とする工程を含むことを特徴とする。Further, by depositing a film of a metal-organic material mixture containing at least Ba and Ti on an insulating substrate, and baking the insulating substrate on which the printed metal-organic material mixture is deposited, and performing an annealing treatment to cause grain growth. B
aTi0. The method is characterized by including the step of making a polycrystalline valence-controlled semiconductor and using this as a heating resistor.
Ba T i O3の系原子価制御半導体磁器は一般に
PTC(Positive Temperature
Coefficient)サーミスタ(正特性サー
ミスタ)と呼ばれるもので、自己温度制御機能付きヒー
タとして広く利用され、電子あんか、電子ジャー、温風
機などの応用製品が知られている。BaTiO3-based valence control semiconductor ceramics are generally PTC (Positive Temperature
This type of thermistor is widely used as a heater with a self-temperature control function, and its application products such as electronic hot water baths, electronic jars, and hot air blowers are known.
B a T i OarのBa”の一部を、Ba”にイ
オン半径が近く、かつBa”より原子価の大きい金属(
Y3゛、La”、Ce”、Sd”、sbコ゛、Th”な
ど)で置換するか、Ti”の一部を、Ti4゛にイオン
半径が近く、かつTi”より原子価の大きい金属(Nb
”、T a ”、W &−など)の所謂不純物で置換す
ることにより原子価制御半導体を形成する。A part of Ba'' in B a Ti Oar is replaced with a metal (
Y3゛, La'', Ce'', Sd'', sbco'', Th'', etc.), or a part of Ti'' is replaced with a metal (Nb
", T a ", W &-, etc.) to form a valence-controlled semiconductor.
半導体化に必要な上記不純物の添加量は0. 1〜0.
5at%程度である。The amount of the above impurity added necessary for semiconductor formation is 0. 1~0.
It is about 5 at%.
第8図はBaの一部をPbで置換したPTCサーミスタ
の温度特性図である。FIG. 8 is a temperature characteristic diagram of a PTC thermistor in which a part of Ba is replaced with Pb.
B a T i 03は120°C付近にCurie(
キユリ−)温度(Tc)があり、このTcから抵抗率が
2.に高くなる。B a T i 03 has Curie (
From this Tc, the resistivity is 2. It becomes expensive.
同図に示されたように、このCurie温度は、Baを
Pbに置換することによって高温側にシフトすることが
できる。温度の割合は4°C/at%Pbである。As shown in the figure, this Curie temperature can be shifted to a higher temperature side by replacing Ba with Pb. The temperature rate is 4°C/at% Pb.
このBaTi0.系原子価制御半導体に電圧をかけると
、自己発熱によって温度が上昇しはじめるが、Curi
e温度に達すると抵抗値が急増し、電流が抑制されて温
度上昇がとまる。This BaTi0. When a voltage is applied to the system valence control semiconductor, the temperature begins to rise due to self-heating, but Curi
When the temperature e is reached, the resistance value increases rapidly, the current is suppressed, and the temperature rise stops.
一方、発熱抵抗体の周囲への熱流出によって発熱体の温
度が下がると抵抗値が下がり、電流が増加して再び温度
を上げようとする。On the other hand, when the temperature of the heating element decreases due to heat leakage to the surroundings of the heating resistor, the resistance value decreases, and the current increases to try to raise the temperature again.
この動作を繰り返して平衡状態に達すると、発熱体は定
温を維持し続ける。When this operation is repeated and an equilibrium state is reached, the heating element continues to maintain a constant temperature.
以下、本発明の実施例を、図面を参照して詳細に説明す
る。Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明によるサーマルヘッドの第1実施例を説
明する要部斜視図であって、1は発熱抵抗体、2は共通
電極、3はドライブ電極、4は耐摩耗層、5はアンダー
グレーズ層、6はセラミック基板等の絶縁基板である。FIG. 1 is a perspective view of essential parts for explaining the first embodiment of the thermal head according to the present invention, in which 1 is a heating resistor, 2 is a common electrode, 3 is a drive electrode, 4 is a wear-resistant layer, and 5 is an underlayer. The glaze layer 6 is an insulating substrate such as a ceramic substrate.
第2図は第1図のA−A線で切断した断面図である。FIG. 2 is a sectional view taken along line A--A in FIG. 1.
第1図、第2図において、セラミック基板6の表面にア
ンダーグレーズ層5が被着され、この上に発熱抵抗体1
が形成されている。In FIGS. 1 and 2, an underglaze layer 5 is deposited on the surface of a ceramic substrate 6, and a heat generating resistor 1 is placed on the underglaze layer 5.
is formed.
発熱抵抗体1は、主走査方向Xの方向に不連続に形成さ
れ、個別の発熱部を形成するように共通電極2とドライ
ブ電極3とが、発熱抵抗体1上で副走査方向に間隔をも
って対向配置されている。The heating resistor 1 is formed discontinuously in the main scanning direction They are placed opposite each other.
そして、共通電極2とドライブ電極3と、各電極に橋絡
する発熱抵抗体1の部分で1ドツトに対応する発熱部が
形成される。A heat generating portion corresponding to one dot is formed by the common electrode 2, the drive electrode 3, and the portion of the heat generating resistor 1 bridging each electrode.
前記各電極3.3と発熱抵抗体1の露出部分を覆って耐
摩耗層4が形成され、記録媒体との接触摺動を滑らかに
し、発熱抵抗体1と各電極を保護し、発熱抵抗体1の酸
化を防止している。A wear-resistant layer 4 is formed covering each of the electrodes 3.3 and the exposed portions of the heat generating resistor 1 to smooth the sliding contact with the recording medium, protect the heat generating resistor 1 and each electrode, and protect the heat generating resistor 1. 1 is prevented from oxidizing.
本実施例では、前記発熱抵抗体1としてBaTiO3系
原子価制御半導体磁器を用いている。In this embodiment, BaTiO3-based valence-controlled semiconductor ceramic is used as the heating resistor 1.
従来のサーマルヘッドは厚膜型なら隣接間の抵抗値ばら
つきが大きく、パルストリミングによって抵抗値をあわ
せていた。薄膜型では隣接間の抵抗値ばらつきは小さい
が抵抗値の分布に大きなうねりをもっており、厚膜型の
ようにパルストリミングはできない。If the conventional thermal head is a thick-film type, there will be large variations in resistance between adjacent heads, and the resistance values were matched by pulse trimming. In the thin film type, the variation in resistance values between adjacent ones is small, but the resistance value distribution has large undulations, and pulse trimming cannot be performed as in the thick film type.
本発明による発熱抵抗体の場合、発熱温度はBaTio
z系原子価制御半導体のもつCurie温度の定温発熱
であるので、BaTiO3の多結晶内部の添加元素の分
散状態が均一であれば、各々の抵抗体の形状や厚みによ
る抵抗値のばらつきがあっても抵抗体の発熱温度に影響
しないので印字濃度のばらつきはない。In the case of the heating resistor according to the present invention, the heating temperature is BaTio
Since the z-based valence control semiconductor generates heat at a constant temperature at the Curie temperature, if the dispersion state of the additive elements inside the BaTiO3 polycrystal is uniform, there will be variations in the resistance value depending on the shape and thickness of each resistor. Since it does not affect the heat generation temperature of the resistor, there is no variation in print density.
第3図はサーマルヘッドの発熱温度の過渡応答および蓄
熱特性の説明図であって、発熱温度の過渡応答は同図(
a)に示したように、従来の発熱抵抗体は(a−1)に
ように時間と共に温度が高くなるが、本実施例の発熱抵
抗体では(a−2)に示したようにキュリー温度(T
c )でフラットになる。Figure 3 is an explanatory diagram of the transient response of the heat generation temperature and heat storage characteristics of the thermal head, and the transient response of the heat generation temperature is shown in the same figure (
As shown in (a), the temperature of the conventional heating resistor increases with time as shown in (a-1), but in the heating resistor of this embodiment, the Curie temperature increases as shown in (a-2). (T
c) becomes flat.
そして、同図(b)に示すような方型波電圧(b−1)
をを与えると、従来の発熱抵抗体は(b−2)のように
、発熱ピーク温度が高いために、次のサイクルまでに熱
が下がりきらないで蓄熱し、Ptで示したようにピーク
温度が上昇し、これが次の発熱温度を高めることになる
。Then, a square wave voltage (b-1) as shown in the same figure (b)
As shown in (b-2), the conventional heating resistor has a high heat generation peak temperature, so the heat does not completely decrease by the next cycle and accumulates heat, and the peak temperature as shown by Pt increases, which increases the next exothermic temperature.
そのうえ、隣接ドツトの発熱もこのピーク温度を高める
作用を及ぼすので、何らかの手段により蓄熱を制御する
必要があった。Furthermore, since the heat generated by adjacent dots also has the effect of increasing this peak temperature, it is necessary to control heat accumulation by some means.
一方、本実施例による発熱抵抗体は定温発熱であるので
、キュリー温度T、cでフラットになり、連続印字によ
る蓄熱層熱の影響も隣接ビットの影響も全くなく、蓄熱
制御も不要であり、同図(b−3)に示したように、発
熱の過渡応答は印加電圧を大きくすることで、より方型
波に近い発熱特性とすることができる。On the other hand, since the heating resistor according to this embodiment generates heat at a constant temperature, it becomes flat at Curie temperatures T and c, and there is no influence of heat storage layer heat due to continuous printing or influence of adjacent bits, and no heat storage control is required. As shown in (b-3) of the same figure, the transient response of heat generation can be made to have a heat generation characteristic closer to a square wave by increasing the applied voltage.
第4図はサーマルヘッドの発熱温度分布と印字ドツトの
形状説明図で、(a)は従来のサーマルヘッドによる発
熱温度分布、(b)は本発明のす−マルヘッドによる発
熱温度分布、(C)は従来ノサーマルヘッドによる印字
ドツト形状、(d)は本発明のサーマルヘッドによる印
字ドツト形状を、それぞれ示す。FIG. 4 is an explanatory diagram of the heat generation temperature distribution of the thermal head and the shape of printed dots, where (a) is the heat generation temperature distribution by the conventional thermal head, (b) is the heat generation temperature distribution by the present invention's thermal head, and (C) is the heat generation temperature distribution by the thermal head of the present invention. (d) shows a printed dot shape by a conventional thermal head, and (d) shows a printed dot shape by a thermal head of the present invention.
前記第1図、第2図で説明した構成のサーマルヘッドの
ように、発熱抵抗体の形状が矩形となっていると、従来
の発熱抵抗体の場合は発熱温度分布が(a)に示すよう
に、発熱抵抗体の中心にピークをもつ山形の分布となっ
ている。When the shape of the heat generating resistor is rectangular as in the thermal head having the configuration explained in FIGS. 1 and 2, the heat generation temperature distribution of the conventional heat generating resistor is as shown in (a). It has a mountain-shaped distribution with a peak at the center of the heating resistor.
実際には、抵抗体中央部と周辺部とで発熱ピークに対し
25〜30%の温度差をもっている。In reality, there is a temperature difference of 25 to 30% between the central part and the peripheral part of the resistor with respect to the heat generation peak.
したがって、従来のサーマルヘッドの発熱抵抗体は印加
電力が足りないと印字ドツト形状が(C)に示したよう
に丸型になる。Therefore, if the heating resistor of the conventional thermal head does not have enough applied power, the printed dot shape becomes round as shown in (C).
そのため、従来は、十分な印字電力を与えて発熱温度を
高くして印字ドツト形状を矩形としてきたが、そのこと
は抵抗体の周辺部に比べ抵抗体の中央部に過剰の熱スト
レスをかけることになり、抵抗体中央部が劣化しやすく
なっていた。For this reason, in the past, sufficient printing power was applied to increase the heat generation temperature to make the printed dots rectangular, but this resulted in excessive thermal stress being applied to the center of the resistor compared to the periphery of the resistor. The central part of the resistor was prone to deterioration.
これに対し、本実施例のサーマルヘッドの発熱抵抗体は
、Curie温度に達すると抵抗値が2、増して温度の
上昇をおさえる働きがあるので、局所的に熱集中がおこ
りにくい。On the other hand, in the heat generating resistor of the thermal head of this embodiment, when the Curie temperature is reached, the resistance value increases by 2 to suppress the rise in temperature, so that local heat concentration is less likely to occur.
例えば、抵抗体の中央部から発熱が始まるピークに達し
たとすると、抵抗体中央部の抵抗値が大きくなり、電流
は抵抗値の低い抵抗体の両側を流れるようになる。For example, if heat generation reaches a peak at the center of the resistor, the resistance value at the center of the resistor increases, and current flows on both sides of the resistor, which has a lower resistance value.
抵抗体の両側は中央部に比べ熱量の放出が多いが、この
発熱抵抗体は熱量放出による温度の低下を補って沢山の
電流を流そうとする。そして抵抗体の両側の発熱温度が
抵抗体中央部と同じになるまで優先的に電流を流し続け
る。Although more heat is emitted from both sides of the resistor than from the center, the heating resistor tries to compensate for the drop in temperature due to the heat release by allowing a large amount of current to flow. The current continues to flow preferentially until the heat generation temperature on both sides of the resistor becomes the same as that in the center of the resistor.
このようにして過渡状態に達すると、発熱抵抗体は均一
な温度分布となる(b)。When the transient state is reached in this way, the heating resistor has a uniform temperature distribution (b).
したがって、印字ドツト形状は、同図(d)に示したよ
うに抵抗体形状である矩形を忠実に再現する。Therefore, the shape of the printed dots faithfully reproduces the rectangular shape of the resistor as shown in FIG. 2(d).
ただし、電圧は発熱温度がCurie温度に達するだけ
十分に与える必要がある。However, it is necessary to apply enough voltage so that the heat generation temperature reaches the Curie temperature.
そしてBaTi0.系原子価制御半導体はCurie温
度以上にならないので、誤って大きな電圧をかけても熱
破壊をおこさない。and BaTi0. Since the valence control semiconductor does not reach a temperature higher than the Curie temperature, it will not be thermally destroyed even if a large voltage is accidentally applied.
したがって熱破壊を自己防止する機能を持っている。Therefore, it has the function of self-preventing thermal destruction.
次に、本発明のサーマルヘッドの製造方法について説明
する。Next, a method for manufacturing a thermal head according to the present invention will be explained.
第5図は本発明によるサーマルヘッドの製造方法の説明
図で、(a)〜(f)の工程順で製造される。FIG. 5 is an explanatory diagram of a method for manufacturing a thermal head according to the present invention, in which the thermal head is manufactured in the order of steps (a) to (f).
発熱抵抗体であるBaTiOs系原子価制御半導体の作
り方は、金属有機物の混合物を印刷・焼成して金属酸化
物の薄膜を得る方法、いわゆるMOD法(Meiall
o Oreganic Deposition)を
繰り返し行うことにより所定の膜厚の金属酸化物の膜を
形成した後、アニールによりB a T i O:Iの
結晶粒を成長させて作ることができる。The BaTiOs-based valence-controlled semiconductor, which is a heat-generating resistor, is made by printing and firing a mixture of metal-organic materials to obtain a thin film of metal oxide, the so-called MOD method (Meiall).
After forming a metal oxide film of a predetermined thickness by repeatedly performing organic deposition (Original Deposition), crystal grains of B a T i O:I can be grown by annealing.
MOD法は金属有機物の混合により、任意の組成の均一
な金属酸化物の化合物の成膜が容易にでき、これを繰り
返すことで膜厚を自由に制御できるという特徴をもつ。The MOD method is characterized in that a uniform metal oxide compound film of any composition can be easily formed by mixing metal-organic substances, and that the film thickness can be freely controlled by repeating this process.
以下、本発明による発熱抵抗体の形成方法を詳細に説明
する。Hereinafter, a method for forming a heating resistor according to the present invention will be explained in detail.
本実施例では、下記のように、主材料であるBa、Ti
有機物材料と添加材料であるPb、Taの有機物材料を
用いる。In this example, as shown below, the main materials are Ba and Ti.
An organic material and additive materials such as Pb and Ta are used.
まず、発熱抵抗体の発熱温度の仕様を決め、その仕様に
より、BaとPbの混合比を決める。添加元素はTaを
用いる。First, the specifications of the heat generation temperature of the heating resistor are determined, and the mixing ratio of Ba and Pb is determined based on the specifications. Ta is used as the additive element.
例えば、発熱抵抗体の発熱温度を200℃にしたとする
と、BaとPbの混合比は0.8:0゜2で、Tiの一
部をTaで0.3at%(原子%)置換させて半導体化
させてやるとすると、化学式は(B ao、s P b
o、+t ) (T i o、qqt Tao。For example, assuming that the heating temperature of the heating resistor is 200°C, the mixing ratio of Ba and Pb is 0.8:0°2, and a portion of Ti is replaced by 0.3 at% (atomic %) of Ta. If it is made into a semiconductor, the chemical formula is (B ao, s P b
o, +t ) (T io, qqt Tao.
1103)03となる。1103)03.
MODによる発熱抵抗体のための金属有機物材料として
は、例えばN、E、ケムキャット社のメタルレジネート
(商品名)の下記の番号の各溶液を混合して使用する。As the metal-organic material for the heating resistor by MOD, for example, solutions of N, E, and Metal Resinate (trade name) manufactured by Chemcat Co., Ltd. with the following numbers are mixed and used.
#137−C(Ba有機物材料)
#207A (Pb有機物材料)
#9428 (Ti有機物材料)
#7522 (Ta有機物材料)
すなわち、上記各溶液を焼成後の原子数比が、Ba:P
b:Yi:Ta
=O,sho、2:0.997:0.003となるよう
な割合で混合し、さらに、αターピネオール、ブチルカ
ルピトールアセテート等の溶剤を使用して適当な粘度に
調整する。#137-C (Ba organic material) #207A (Pb organic material) #9428 (Ti organic material) #7522 (Ta organic material) That is, the atomic ratio after firing each of the above solutions is Ba:P.
b: Yi: Ta = O, sho, 2:0.997:0.003, and then mixed at a ratio of 2:0.997:0.003, and further adjusted to an appropriate viscosity using a solvent such as α-terpineol or butylcarpitol acetate. .
このMOD発熱抵抗体のペーストを、第5図の(a)に
示したように、表面にアンダーグレーズ層を形成したグ
レーズド・セラミック基板6にスクリーン印刷またはス
ピンコードなどによって着膜する。As shown in FIG. 5(a), this MOD heating resistor paste is deposited on a glazed ceramic substrate 6 with an underglaze layer formed on its surface by screen printing or spin cording.
MOD発熱抵抗体のペーストを着膜した基板を乾燥させ
た後、赤外線ベルト焼成炉等で10〜200“C/ m
i nの昇温速度で600℃まで温度を上げ、600
℃で1時間保持した後に冷却する。After drying the substrate coated with the MOD heating resistor paste, heat it at 10 to 200"C/m in an infrared belt firing furnace, etc.
Raise the temperature to 600℃ at a heating rate of 600℃
After holding at 1 hour at 0.degree. C., it is cooled.
この1回の着膜プロセスで約350 nmのMOD膜が
得られる。このプロセスを膜厚が4〜8μmになるまで
繰り返す。A MOD film of about 350 nm can be obtained in this one-time film deposition process. This process is repeated until the film thickness is 4 to 8 μm.
最後に5°(/minの昇温速度で1200°Cまで上
げ、1200°Cで1時間アニールして冷却すると、平
均粒径が約0.2μmのBaTiO3系原子価制御半導
体の発熱抵抗体層10が得られる。Finally, the temperature is raised to 1200°C at a heating rate of 5°/min, annealed at 1200°C for 1 hour, and cooled. 10 is obtained.
次に、(b)のように、前記発熱抵抗体10が形成され
た基板60表面に、例えばノリタケ株式会社製のD27
(商品名)等のメタロオーガニ・ツク金ペーストをベタ
印刷して焼成し、金の電極膜20′を形成する。Next, as shown in (b), the surface of the substrate 60 on which the heating resistor 10 is formed is coated with, for example, D27 manufactured by Noritake Co., Ltd.
A metal organic gold paste such as (trade name) is printed solidly and fired to form a gold electrode film 20'.
そして、(C)に示したように、上記金の電極膜2の表
面にレジスト層を塗布、乾燥し、その上に露光用のフォ
トマスクを重ねて露光、現象を行った後、ヨウ素ヨウ化
カリウム溶液を用いてエツチングを行いレジストを除去
するフォトリソエツチングを施し、Au電極膜20を得
る。Then, as shown in (C), a resist layer is coated on the surface of the gold electrode film 2, dried, a photomask for exposure is placed on top of the resist layer, exposed to light, and then exposed to light. Photolithography is performed to remove the resist by etching using a potassium solution to obtain the Au electrode film 20.
次に、(d)のように、前記Au電極膜20をマスクと
し、フッ素硝酸を用いてMOD発熱抵抗体層10のエツ
チングを行う。Next, as shown in (d), using the Au electrode film 20 as a mask, the MOD heating resistor layer 10 is etched using fluorine-nitric acid.
そして、再びAu電極膜20をフォトリソ・エツチング
により発熱抵抗体露出部分を除去すると、(e)のよう
に主走査方向に分割された発熱抵抗体1を得ることがで
きる。Then, when the exposed portion of the heating resistor is removed from the Au electrode film 20 again by photolithography and etching, it is possible to obtain the heating resistor 1 divided in the main scanning direction as shown in (e).
最後に、(f)に示したように、前記の処理を施した基
板の表面に耐摩耗層4を形成すると前記第1図に示した
ようなサーマルヘッドができ上がる。Finally, as shown in FIG. 1F, a wear-resistant layer 4 is formed on the surface of the substrate subjected to the above-described treatment, thereby completing a thermal head as shown in FIG.
このようにして製造したサーマルヘッドは、例えば副走
査方向の長さが120μmで、主走査方向の長さが10
0μmの抵抗体を形成すると、抵抗率が最少でも10Ω
・cm程度となるので、平均抵抗値は15〜30にΩと
なる。The thermal head manufactured in this way has, for example, a length of 120 μm in the sub-scanning direction and a length of 10 μm in the main scanning direction.
When forming a 0μm resistor, the resistivity is at least 10Ω.
・Since it is about cm, the average resistance value is 15 to 30 Ω.
したがって、このサーマルヘッドの駆動電圧は高くなる
。Therefore, the driving voltage for this thermal head becomes high.
第6図は本発明によるサーマルヘッドの第2実施例の構
成図であって、前記第1図と同一符号は同一部分に相当
する。FIG. 6 is a block diagram of a second embodiment of the thermal head according to the present invention, and the same reference numerals as in FIG. 1 correspond to the same parts.
同図に示すサーマルヘッドは、共通電極2とドライブ電
極3を副走査方向に噛合させ、この噛合部分を主走査方
向に横断して発熱抵抗体1を形成した交互電極配線構造
のサーマルヘッドであり、発熱抵抗体1の副走査方向の
幅を130μm、交互電極の幅を20μmとしてやると
、抵抗率が10Ω・cmのとき平均抵抗値が2〜4にΩ
となって駆動電圧を低くすることが可能である。The thermal head shown in the figure has an alternating electrode wiring structure in which a common electrode 2 and a drive electrode 3 are meshed in the sub-scanning direction, and a heating resistor 1 is formed by crossing this meshing portion in the main scanning direction. If the width of the heating resistor 1 in the sub-scanning direction is 130 μm and the width of the alternating electrodes is 20 μm, the average resistance value will be 2 to 4 Ω when the resistivity is 10 Ω・cm.
Therefore, it is possible to lower the driving voltage.
また、第7図は本発明によるサーマルヘッドの第3実施
例の構成図であって、前記第1図、第6図と同一符号は
同一部分に相当する。Further, FIG. 7 is a configuration diagram of a third embodiment of the thermal head according to the present invention, and the same reference numerals as in FIGS. 1 and 6 correspond to the same parts.
同図のサーマルヘッドは、発熱抵抗体1を上下から四角
いバッチ型の共通電極2とドライブ電極3とでサンドイ
ンチした構造であり、このような構造にすると、上部電
極(ドライブ電極3)の形状を100μmX100μm
の大きさにすることで、発熱抵抗体1の抵抗率が10Ω
・cmのとき平均抵抗値が40〜80Ω と小さくする
ことができる。The thermal head shown in the figure has a structure in which a heating resistor 1 is sandwiched between a rectangular batch-type common electrode 2 and a drive electrode 3 from above and below. 100μm×100μm
By setting the size to , the resistivity of the heating resistor 1 becomes 10Ω.
・The average resistance value can be as small as 40 to 80Ω when the resistance is cm.
この抵抗値をもっと上げたい場合は、不純物の添加量を
減らすことにより、その抵抗率を上記の10〜100倍
にすることができる。If it is desired to further increase this resistance value, the resistivity can be increased by 10 to 100 times the above value by reducing the amount of impurities added.
[発明の効果コ
以上説明したように、本発明によれば、発熱抵抗体をB
aTi0.系原子価制御半導体の多結晶とすることによ
って、そのCurie温度を高温側にシフトすることが
でき、発熱温度を自己制御して定温発熱させ、発熱部の
温度分布を均一として印字ドツトの再現性を向上させ、
かつ発熱抵抗体の自己破壊を防止したサーマルヘッドを
提供することができる。[Effects of the Invention] As explained above, according to the present invention, the heating resistor is
aTi0. By using a polycrystalline valence-controlled semiconductor, the Curie temperature can be shifted to the high temperature side, and the heat generation temperature is self-controlled to generate heat at a constant temperature, making the temperature distribution of the heat generation part uniform and improving the reproducibility of printed dots. improve the
Moreover, it is possible to provide a thermal head in which self-destruction of the heating resistor is prevented.
第1図は本発明によるサーマルヘッドの第1実施例を説
明する要部斜視図、第2図は第1図のA−A線で切断し
た断面図、第3図はサーマルヘッドの発熱温度の過渡応
答および蓄熱特性の説明図、第4図はサーマルヘッドの
発熱温度分布と印字ドツトの形状説明図、第5図は本発
明によるサーマルヘッドの製造方法の説明図、第6図は
本発明によるサーマルヘッドの第2実施例の構成図、第
7図は本発明によるサーマルヘッドの第3実施例の構成
図、第8図はBaの一部をPbで置換したPTCサーミ
スタの温度特性図である。
l・・・・発熱抵抗体、2・・・・共通電極、3・・・
・ドライブ電極、4・・・・耐摩耗層、5・・・・アン
ダーグレーズ層、6・・・・セラミック等の絶縁基板。FIG. 1 is a perspective view of a main part explaining a first embodiment of a thermal head according to the present invention, FIG. 2 is a sectional view taken along line A-A in FIG. 1, and FIG. 3 is a diagram showing the heat generation temperature of the thermal head. An explanatory diagram of transient response and heat storage characteristics, Fig. 4 is an explanatory diagram of the heat generation temperature distribution of the thermal head and the shape of printed dots, Fig. 5 is an explanatory diagram of the method of manufacturing the thermal head according to the present invention, and Fig. 6 is an explanatory diagram of the thermal head manufacturing method according to the present invention. FIG. 7 is a block diagram of a second embodiment of the thermal head, FIG. 7 is a block diagram of a third embodiment of the thermal head according to the present invention, and FIG. 8 is a temperature characteristic diagram of a PTC thermistor in which a part of Ba is replaced with Pb. . l...Heating resistor, 2...Common electrode, 3...
- Drive electrode, 4... wear-resistant layer, 5... underglaze layer, 6... insulating substrate such as ceramic.
Claims (2)
導体を用いたことを特徴とするサーマルヘッド。(1) A thermal head characterized in that a BaTiO_3-based valence control semiconductor is used as a heating resistor.
有機材料の混合物を着膜し、 前記金属有機材料の混合物を着膜した絶縁基板を焼成し
、アニール処理して粒成長させることによりBaTiO
_3系原子価制御半導体の多結晶を作り、 これを発熱抵抗体とする工程を含むことを特徴とするサ
ーマルヘッドの製造方法。(2) A mixture of metal-organic materials containing at least Ba and Ti is deposited on an insulating substrate, and the insulating substrate coated with the mixture of metal-organic materials is fired and annealed to grow grains of BaTiO.
A method for manufacturing a thermal head, comprising a step of making a polycrystal of a _3-based valence-controlled semiconductor and using this as a heating resistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27535790A JP2932661B2 (en) | 1990-10-16 | 1990-10-16 | Manufacturing method of thermal head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27535790A JP2932661B2 (en) | 1990-10-16 | 1990-10-16 | Manufacturing method of thermal head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04152147A true JPH04152147A (en) | 1992-05-26 |
| JP2932661B2 JP2932661B2 (en) | 1999-08-09 |
Family
ID=17554347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27535790A Expired - Fee Related JP2932661B2 (en) | 1990-10-16 | 1990-10-16 | Manufacturing method of thermal head |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2932661B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001017779A3 (en) * | 1999-09-03 | 2001-08-02 | Marconi Corp Plc | An ink jet print head |
| JP2012183696A (en) * | 2011-03-04 | 2012-09-27 | Toshiba Tec Corp | Both-side printer, and both-side printing method |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103963478A (en) * | 2014-05-05 | 2014-08-06 | 邱荣健 | Printing head of thermal printer |
-
1990
- 1990-10-16 JP JP27535790A patent/JP2932661B2/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001017779A3 (en) * | 1999-09-03 | 2001-08-02 | Marconi Corp Plc | An ink jet print head |
| US6802585B1 (en) | 1999-09-03 | 2004-10-12 | Videojet Systems International, Inc. | Print head ink temperature control device |
| JP2012183696A (en) * | 2011-03-04 | 2012-09-27 | Toshiba Tec Corp | Both-side printer, and both-side printing method |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2932661B2 (en) | 1999-08-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA1059208A (en) | Thin film thermal print head | |
| JPH04152147A (en) | Thermal head and manufacture thereof | |
| US4034187A (en) | Thermal printing head | |
| JP3809380B2 (en) | Thermal printer head and manufacturing method thereof | |
| JPS59207270A (en) | Thermal head | |
| JPH0725174B2 (en) | Method for manufacturing thick film type thermal head | |
| JP2934748B2 (en) | Thermal recording method | |
| JP2615633B2 (en) | Manufacturing method of thermal head | |
| JPH0539892Y2 (en) | ||
| JPS6149865A (en) | Thermal head having normal resistance temperature coefficient | |
| JPS62181162A (en) | Thermal head | |
| JP2000246935A (en) | Thermal head | |
| JPH1029335A (en) | Thermal head | |
| JP2637162B2 (en) | Heating element for thermal head and method of manufacturing the same | |
| JPS60225771A (en) | Thermal recording head | |
| JPH06208311A (en) | Heater for heating | |
| JPH05201047A (en) | Thermal head | |
| JPH0239955A (en) | Thermal head | |
| JP2000218840A (en) | Thermal head | |
| JPH0550626A (en) | Thermal head | |
| JPS61254358A (en) | thermal head | |
| JPS6292411A (en) | Manufacture of thick film thermal head | |
| JP5008415B2 (en) | Thermal head | |
| JP4035918B2 (en) | Thin film heater and manufacturing method thereof | |
| JPH01135659A (en) | Thick film thermal head |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |