JPH0416379U - - Google Patents

Info

Publication number
JPH0416379U
JPH0416379U JP5709790U JP5709790U JPH0416379U JP H0416379 U JPH0416379 U JP H0416379U JP 5709790 U JP5709790 U JP 5709790U JP 5709790 U JP5709790 U JP 5709790U JP H0416379 U JPH0416379 U JP H0416379U
Authority
JP
Japan
Prior art keywords
delay circuit
trigger signal
circuit
original
delays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5709790U
Other languages
English (en)
Other versions
JP2552185Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990057097U priority Critical patent/JP2552185Y2/ja
Publication of JPH0416379U publication Critical patent/JPH0416379U/ja
Application granted granted Critical
Publication of JP2552185Y2 publication Critical patent/JP2552185Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第１図は、この考案のＩＣ試験装置の一例を示
すブロツク図、第２図は、その動作の説明に供す
るタイムチヤート、第３図は、従来のＩＣ試験装
置の一例を示すブロツク図、第４図は、その動作
の説明に供するタイムチヤートである。

Claims (1)

  1. 【実用新案登録請求の範囲】 ＩＣ試験回路部のタイミング発生器から得られ
    た原クロツクを上記ＩＣ試験回路部から得られた
    原トリガ信号に対して所定の位相関係になるよう
    に遅延させる可変遅延回路と、 上記原トリガ信号を上記可変遅延回路からのク
    ロツクにもとづいて遅延させる前段遅延回路と、 この前段遅延回路からのトリガ信号をこの前段
    遅延回路における遅延時間より短い時間遅延させ
    る微調用遅延回路と、 この微調用遅延回路からのトリガ信号によつて
    駆動されて電子ビームをＩＣの配線形成面に照射
    するか否かを制御するパルスを出力するパルス発
    生器と、 を備えるＩＣ試験装置。
JP1990057097U 1990-05-30 1990-05-30 Ｉｃ試験装置 Expired - Fee Related JP2552185Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990057097U JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990057097U JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0416379U true JPH0416379U (ja) 1992-02-10
JP2552185Y2 JP2552185Y2 (ja) 1997-10-27

Family

ID=31581502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990057097U Expired - Fee Related JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2552185Y2 (ja)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219447A (ja) * 1986-03-20 1987-09-26 Fujitsu Ltd ストロボ電子ビ−ム装置
JPH01179290U (ja) * 1988-06-08 1989-12-22

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219447A (ja) * 1986-03-20 1987-09-26 Fujitsu Ltd ストロボ電子ビ−ム装置
JPH01179290U (ja) * 1988-06-08 1989-12-22

Also Published As

Publication number Publication date
JP2552185Y2 (ja) 1997-10-27

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees