JPH0417384A - Distributed feedback type semiconductor laser - Google Patents
Distributed feedback type semiconductor laserInfo
- Publication number
- JPH0417384A JPH0417384A JP12002690A JP12002690A JPH0417384A JP H0417384 A JPH0417384 A JP H0417384A JP 12002690 A JP12002690 A JP 12002690A JP 12002690 A JP12002690 A JP 12002690A JP H0417384 A JPH0417384 A JP H0417384A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- region
- diffraction grating
- grating
- active layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、端面に誘電体多層膜を被覆することなく、半
導体レーザの特性悪化の大きな要因の一つである戻り光
誘起雑音を低減する分布帰還形半導体レーザ(以下、D
FBレーザという、)に関するものである。Detailed Description of the Invention (Field of Industrial Application) The present invention reduces return light induced noise, which is one of the major causes of deterioration of semiconductor laser characteristics, without coating the end face with a dielectric multilayer film. Distributed feedback semiconductor laser (hereinafter referred to as D
FB laser).
(従来の技術)
従来の戻り光誘起雑音低減のための構造の一例として、
InGaAsP/ InP系のDFBレーザの構造を第
2図に示す。(Prior art) As an example of a conventional structure for reducing return light induced noise,
Figure 2 shows the structure of an InGaAsP/InP-based DFB laser.
第2図において、1はn形1nP基板、2は基板1の上
のn形1nPクラッド層、3はInPクラッド層2の上
の活性層、4は活性層3の上の回折格子を有するInG
aAsP−ガイド層、5はガイド層4の上のp形1nP
クラッド層、6はクラッド層5を覆うP形1nGaAs
Pキャップ層、7は基板1の面に形成したn側電極、8
はキャップ層6に形成したp側電極、10は端面に5i
02とALO3を交互に重ねて被覆した誘電体多層膜で
ある。In FIG. 2, 1 is an n-type 1nP substrate, 2 is an n-type 1nP cladding layer on the substrate 1, 3 is an active layer on the InP cladding layer 2, and 4 is an InG layer having a diffraction grating on the active layer 3.
aAsP-guide layer, 5 is p-type 1nP on guide layer 4
The cladding layer 6 is P-type 1nGaAs that covers the cladding layer 5.
P cap layer, 7 is an n-side electrode formed on the surface of the substrate 1, 8
10 is a p-side electrode formed on the cap layer 6, and 5i is formed on the end surface.
This is a dielectric multilayer film in which 02 and ALO3 are alternately layered and coated.
このレーザの動作は、電極8に正の電圧、電極7に負の
電圧を印加し、活性層3に電流を流すことによって、電
子と正孔が注入され、それらの再結合によって光が発生
し、その光がガイド層4に形成された回折格子によって
、さらに波長選択性が高められるので、単一モードで発
振するものである。This laser operates by applying a positive voltage to the electrode 8 and a negative voltage to the electrode 7, and by passing a current through the active layer 3, electrons and holes are injected, and light is generated by their recombination. Since the wavelength selectivity of the light is further enhanced by the diffraction grating formed in the guide layer 4, the light oscillates in a single mode.
またこのレーザの端面に被覆した誘電体多層膜10は、
端面の反射率を変えるためのものであり、誘電体多層膜
10を端面に被覆することによって、端面の反射率を高
くし、反射戻り光が活性層内部に入射するのを抑制する
ことができる構造となっている。Moreover, the dielectric multilayer film 10 coated on the end face of this laser is
This is to change the reflectance of the end face, and by coating the end face with the dielectric multilayer film 10, it is possible to increase the reflectance of the end face and suppress reflected return light from entering the inside of the active layer. It has a structure.
しかしながら、第2図に示したような誘電体多層膜を、
厚さを制御しながら端面に被覆することは容易ではなく
、歩留りを下げる原因にもなっていた。However, when using a dielectric multilayer film as shown in Figure 2,
It is not easy to coat the end face while controlling the thickness, which also causes a decrease in yield.
さらに、誘電体多層膜の被覆のためには、レーザの端面
を上向きにして、膜を被着させる装置の中に入れなけれ
ばならず、モノリシック集積回路上のレーザに、この方
法を用いることは困難であった。Additionally, for dielectric multilayer coating, the laser must be placed face-up into the film deposition equipment, making it difficult to use this method for lasers on monolithic integrated circuits. It was difficult.
(発明が解決しようとする課題)
本発明は、前述の欠点に鑑みなされたもので、歩留りよ
く、できるだけ簡単な構造およびプロセスにより、戻り
光誘起雑音を低減することができるDFBレーザを提供
することにある。(Problems to be Solved by the Invention) The present invention has been made in view of the above-mentioned drawbacks, and an object of the present invention is to provide a DFB laser that can reduce return light induced noise with a high yield and a structure and process that are as simple as possible. It is in.
(課題を解決するための手段)
本発明では、従来どおりの構造をしたDFBレーザの端
面に誘電体多層膜を被覆せずに、回折格子を有した電流
を注入しない領域(以下、非励起領域という。)を設け
ることにより、戻り光誘起雑音の低減を図った。(Means for Solving the Problem) In the present invention, the end face of a DFB laser having a conventional structure is not coated with a dielectric multilayer film, and a region (hereinafter referred to as a non-excited region) in which no current is injected has a diffraction grating. ) to reduce the return light induced noise.
すなわち本発明の分布帰還形半導体レーザは、活性層と
ガイド層とから形成される光導波路に回折格子を有する
構造を持ったDFBレーザにおいて、光導波路中の片側
もしくは両側の端面に接する位置に、非励起領域があり
、その領域の共振器方向の長さしと回折格子の結合定数
にの積KLを、0.5以上とする。That is, the distributed feedback semiconductor laser of the present invention is a DFB laser having a structure in which an optical waveguide formed of an active layer and a guide layer has a diffraction grating. There is a non-excited region, and the product KL of the length of this region in the cavity direction and the coupling constant of the diffraction grating is set to be 0.5 or more.
ただし、結合定数には、回折格子によって、一方方向に
進行する光が反射され、反対方向に進行する光に変わる
、単位長さあたりの割合を表わし、回折格子の深さ、も
しくは回折格子の凹凸の幅の比で決定されるものである
。However, the coupling constant refers to the ratio per unit length at which light traveling in one direction is reflected by the diffraction grating and converted into light traveling in the opposite direction, and is determined by the depth of the diffraction grating or the unevenness of the diffraction grating. It is determined by the ratio of the widths of
(作 用)
本発明では、従来のDFBレーザの活性層を励起領域(
電流を注入する領域)と非励起領域とに分け、非励起領
域を端面に接する位置に設けることで、非励起領域の回
折格子を分布反射器として活用することによって、端面
に誘電体多層膜を被覆しなくても、反射戻り光が活性層
の励起領域に入射することを抑制することができる。(Function) In the present invention, the active layer of a conventional DFB laser is
By separating the non-excited region into a region (where current is injected) and a non-excited region, and by providing the non-excited region in a position in contact with the end face, the dielectric multilayer film can be applied to the end face by utilizing the diffraction grating in the non-excited region as a distributed reflector. Even without coating, it is possible to suppress reflected return light from entering the excitation region of the active layer.
(実施例)
以下に、図面を参照して本発明の実施例を詳細に説明す
る。(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings.
ここでは、本発明の一実施例としてInGaAsP活性
層P DFBレーザについて述べるが、本発明はこの例
にのみ限られるものではない。Here, an InGaAsP active layer PDFB laser will be described as an example of the present invention, but the present invention is not limited to this example.
第1図は、本発明の一実施例のレーザの活性層方向の断
面図であって、1はn形1nP基板、2は基板1の上の
一方の主面上に形成したn形1nPクラッド層、3はク
ラッド層2の上に形成したInGaAsP活性層、4は
活性層3の上に形成した回折格子を有するTnGaAs
Pガイド層、5はガイド層4の上に形成したp形1nP
クラッド層、6はクラッド層5を覆うp形InGaAs
Pキャップ層、7は基板1の他方の露出表面に形成した
n ([1,11電極、8はキャップ層6に形成したp
(!]、111i極である。9は電極8を形成しない領
域で、ここでは活性層へ電流は注入されず、非励起領域
となるので、この頭載内では、ガイド層上部の回折格子
は分布反射器となり、戻り光を反射する作用をもつ。FIG. 1 is a cross-sectional view in the active layer direction of a laser according to an embodiment of the present invention, in which 1 is an n-type 1nP substrate, and 2 is an n-type 1nP cladding formed on one main surface of the substrate 1. 3 is an InGaAsP active layer formed on the cladding layer 2; 4 is a TnGaAs layer with a diffraction grating formed on the active layer 3;
P guide layer 5 is a p-type 1nP formed on the guide layer 4
A cladding layer 6 is p-type InGaAs that covers the cladding layer 5.
P cap layer, 7 is formed on the other exposed surface of substrate 1 ([1, 11 electrode, 8 is p formed on cap layer 6
(!], 111i pole. 9 is a region where the electrode 8 is not formed, where no current is injected into the active layer and becomes a non-excited region, so within this head, the diffraction grating on the upper part of the guide layer It acts as a distributed reflector and has the effect of reflecting returning light.
この実施例のプロセスおよび基本動作は、従来のDFB
レーザと同様であって、電極8へ正の電圧、電極7へ負
の電圧を印加し、活性層3に電流を流すこと(電子と正
孔の注入)により発光を得るものである。The process and basic operation of this example is similar to that of a conventional DFB.
It is similar to a laser, and emits light by applying a positive voltage to the electrode 8 and a negative voltage to the electrode 7, and passing a current through the active layer 3 (injecting electrons and holes).
本発明では、キャップ層6の上部の一方の端面側に、電
極を形成しない領域9を設けているが、これは、レジス
ト液を塗布した後、マスクを用いて電極パターンを露光
する際に、マスクのパターンを変えることによって成し
遂げられる。In the present invention, a region 9 in which no electrode is formed is provided on one end surface side of the upper part of the cap layer 6. This is accomplished by changing the pattern of the mask.
実際に、この実施例のDFBレーザを用いた場合と、従
来のDFBレーザで誘電体多層膜を被覆していないもの
を用いた場合とで、反射戻り光があるときの、レーザの
相対雑音強度(RIN)を測定し比較したところ、回折
格子の結合定数と非励起領域の長さの積KLが大きくな
るほどRINは小さくなり、戻り光誘起雑音が低減され
でいることが確かめられた。そして、KLが0.5以上
あれば、従来の構造のDFBレーザに比べ、RINを少
なくとも5 dB/Hz以上低減することができた。Actually, the relative noise intensity of the laser when there is reflected return light when using the DFB laser of this example and when using a conventional DFB laser not coated with a dielectric multilayer film. When (RIN) was measured and compared, it was confirmed that the larger the product KL of the coupling constant of the diffraction grating and the length of the non-excited region becomes, the smaller RIN becomes, and the return light induced noise is reduced. If KL was 0.5 or more, RIN could be reduced by at least 5 dB/Hz or more compared to a DFB laser with a conventional structure.
ただし相対雑音強度とは、光出力強度のゆらぎと平均光
出力強度の比を測定周波数帯域で割ったものである。However, the relative noise intensity is the ratio of the fluctuation of the optical output intensity to the average optical output intensity divided by the measurement frequency band.
以上、InGaAsP/ InP DFBレーザの例に
ついて本発明を説明したが、本発明はこの例に限られる
ものではな(、GaAs等の他の材料系からなる場合で
も有効である。Although the present invention has been described above using an example of an InGaAsP/InP DFB laser, the present invention is not limited to this example (the present invention is also effective when the laser is made of other materials such as GaAs).
また本発明はp形およびn形の導電形の逆転した、いわ
ゆるp基板形素子でも有効である。The present invention is also effective in a so-called p-substrate type element in which the p-type and n-type conductivity types are reversed.
(発明の効果)
以上説明したように、本発明のDFBレーザは、作製工
程において、従来のDFBレーザと同じ方法で作製する
ことができ、しかも端面に誘電体多層膜を被覆せずに、
戻り光誘起雑音を低減することができる。(Effects of the Invention) As explained above, the DFB laser of the present invention can be manufactured in the same manufacturing process as the conventional DFB laser, and without coating the end face with a dielectric multilayer film.
Return light induced noise can be reduced.
さらに端面を誘電体多層膜で被覆することなく、反射戻
り光による戻り光誘起雑音を低減することができるので
、その分だけ作製工程を短くすることができ、また今ま
で誘電体多層膜を被覆することが困難であった、モノリ
シック集積回路上のレーザにも適応することができる利
点がある。Furthermore, since it is possible to reduce return light induced noise due to reflected return light without having to cover the end face with a dielectric multilayer film, the manufacturing process can be shortened accordingly. It has the advantage that it can also be applied to lasers on monolithic integrated circuits, which has been difficult to do.
第1図は本発明の一実施例の構造を示す断面図、第2図
は従来の戻り光誘起雑音を抑制するためのDFBレーザ
の一例の構造を示す断面図である。
1・・・n形?nP基板
2・・・n形1nPクランド層
3−1nGaAsP活性層
4−1nGaAsPガイド層
5・・・p形1nPクラッド層
6・・・p形1nGaAsPキャップ層7・・・n側電
極
8・・・n側電極
9・・・電極を被着しない領域
10・・・SiO□/Afz(h誘電体多層膜。
第1図FIG. 1 is a sectional view showing the structure of an embodiment of the present invention, and FIG. 2 is a sectional view showing the structure of an example of a conventional DFB laser for suppressing return light induced noise. 1...N-type? nP substrate 2...n-type 1nP ground layer 3-1nGaAsP active layer 4-1nGaAsP guide layer 5...p-type 1nP cladding layer 6...p-type 1nGaAsP cap layer 7...n-side electrode 8... N-side electrode 9...Region 10 where no electrode is deposited...SiO□/Afz (h dielectric multilayer film. Fig. 1
Claims (1)
格子を有する構造を持った分布帰還形半導体レーザにお
いて、光導波路中の片側もしくは両側の端面に接する位
置に、回折格子を有した電流を注入しない領域があり、
その領域の共振器方向の長さLと回折格子の結合定数K
との積KLが、0.5以上であることを特徴とする分布
帰還形半導体レーザ。 ただし、結合定数Kは、回折格子によって、一方方向に
進行する光が反射され、反射方向に進行する光に変わる
、単位長さあたりの割合を表わす。[Claims] 1. In a distributed feedback semiconductor laser having a structure in which an optical waveguide formed of an active layer and a guide layer has a diffraction grating, at a position in contact with one or both end faces of the optical waveguide, There is a region with a diffraction grating where no current is injected,
The length L of the region in the cavity direction and the coupling constant K of the diffraction grating
A distributed feedback semiconductor laser characterized in that a product KL of 0.5 or more is 0.5 or more. However, the coupling constant K represents the rate per unit length at which light traveling in one direction is reflected by the diffraction grating and converted into light traveling in the reflected direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12002690A JPH0417384A (en) | 1990-05-11 | 1990-05-11 | Distributed feedback type semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12002690A JPH0417384A (en) | 1990-05-11 | 1990-05-11 | Distributed feedback type semiconductor laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0417384A true JPH0417384A (en) | 1992-01-22 |
Family
ID=14776074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12002690A Pending JPH0417384A (en) | 1990-05-11 | 1990-05-11 | Distributed feedback type semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0417384A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6018541A (en) * | 1996-07-26 | 2000-01-25 | Nec Corporation | DFB laser waveguide having periodic distribution of gains and absorptions of energy |
| US6330268B1 (en) | 1998-08-27 | 2001-12-11 | Nec Corporation | Distributed feedback semiconductor laser |
| US6574261B2 (en) | 1998-08-27 | 2003-06-03 | Nec Corporation | Distributed feedback semiconductor laser |
| JP2017216353A (en) * | 2016-05-31 | 2017-12-07 | 日本電信電話株式会社 | Distributed feedback laser |
-
1990
- 1990-05-11 JP JP12002690A patent/JPH0417384A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6018541A (en) * | 1996-07-26 | 2000-01-25 | Nec Corporation | DFB laser waveguide having periodic distribution of gains and absorptions of energy |
| US6330268B1 (en) | 1998-08-27 | 2001-12-11 | Nec Corporation | Distributed feedback semiconductor laser |
| US6574261B2 (en) | 1998-08-27 | 2003-06-03 | Nec Corporation | Distributed feedback semiconductor laser |
| JP2017216353A (en) * | 2016-05-31 | 2017-12-07 | 日本電信電話株式会社 | Distributed feedback laser |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0546743A1 (en) | Distributed phase shift semiconductor laser | |
| US5274660A (en) | Semiconductor device and method of making it | |
| JPH08181383A (en) | Integrated semiconductor laser device | |
| US5684816A (en) | Light Interactive semiconductor device including wire connection at internal light distribution maximum | |
| US5321716A (en) | Distributed Feedback semiconductor laser with controlled phase shift | |
| US6084901A (en) | Semiconductor laser device | |
| US4633474A (en) | Distributed feedback semiconductor laser | |
| JPH0417384A (en) | Distributed feedback type semiconductor laser | |
| US4791647A (en) | Semiconductor laser | |
| JP2656248B2 (en) | Semiconductor laser | |
| JPH0724324B2 (en) | Semiconductor laser chip and manufacturing method thereof | |
| JPS63166281A (en) | Distributed feedback semiconductor laser | |
| JP2606838B2 (en) | Distributed feedback semiconductor laser | |
| JPH0770789B2 (en) | Distributed feedback semiconductor laser and manufacturing method thereof | |
| US5784398A (en) | Optoelectronic component having codirectional mode coupling | |
| JPH0470794B2 (en) | ||
| JP2669045B2 (en) | Manufacturing method of distributed feedback semiconductor laser | |
| JPS63137496A (en) | Semiconductor laser device | |
| KR960011480B1 (en) | Laser diode manufacturing method | |
| JPH0677583A (en) | Semiconductor laser / optical modulator integrated light source | |
| JPH1051066A (en) | Distributed feedback semiconductor laser device | |
| JPS6320888A (en) | Semoconductor light-emitting device | |
| JPH0638545B2 (en) | Semiconductor laser | |
| JPH07118568B2 (en) | Distributed feedback semiconductor laser | |
| JPS62183587A (en) | Semiconductor laser |