JPH0418197Y2 - - Google Patents

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Publication number
JPH0418197Y2
JPH0418197Y2 JP7926185U JP7926185U JPH0418197Y2 JP H0418197 Y2 JPH0418197 Y2 JP H0418197Y2 JP 7926185 U JP7926185 U JP 7926185U JP 7926185 U JP7926185 U JP 7926185U JP H0418197 Y2 JPH0418197 Y2 JP H0418197Y2
Authority
JP
Japan
Prior art keywords
substrate
pad
cooling
cooling plate
vacuum chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7926185U
Other languages
Japanese (ja)
Other versions
JPS61196526U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7926185U priority Critical patent/JPH0418197Y2/ja
Publication of JPS61196526U publication Critical patent/JPS61196526U/ja
Application granted granted Critical
Publication of JPH0418197Y2 publication Critical patent/JPH0418197Y2/ja
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 (産業上の利用分野) 本考案は半導体製造に使用されるシリコンウエ
ハ等の基板の冷却装置に設けられる基板冷却用パ
ツドに関する。
[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a substrate cooling pad provided in a cooling device for substrates such as silicon wafers used in semiconductor manufacturing.

(従来の技術) 従来、真空室内に於いて、この種の基板にイオ
ンを注入し、その表面の物性を変えることがIC
等の製造工程で行なわれているが、該基板もしく
は該基板に塗布したレジストが熱入射に伴なう温
度上昇により損傷する危険があるので、該基板を
冷却水を循環させた冷却板の平坦な或はレンズ状
に隆起した前面に当接させて冷却している。この
場合該基板の背面に存在する凹凸のために冷却板
との接触面積が少なくなるので、該冷却板の前面
にシリコンゴム等の弾力性に富む熱伝導性ゴムを
設け、該ゴムを介して基板を冷却板にクランプに
より圧接させている。
(Prior art) Conventionally, in a vacuum chamber, ions were implanted into this type of substrate to change the physical properties of its surface.
However, since there is a risk that the substrate or the resist coated on the substrate may be damaged due to temperature rise due to heat incidence, the flatness of the cooling plate that circulates cooling water over the substrate is Alternatively, it is cooled by being brought into contact with a lens-shaped raised front surface. In this case, the contact area with the cooling plate is reduced due to the unevenness on the back surface of the substrate, so a highly elastic thermally conductive rubber such as silicone rubber is provided on the front surface of the cooling plate, and the The board is pressed against the cooling plate using a clamp.

(考案が解決しようとする問題点) 冷却板に熱伝導性ゴムを設けると、真空室内に
於いて基板の処理中に該ゴムからガスが大量に発
生するので、真空室内が汚れ真空度が悪くなる欠
点があり、しかも該ゴムは熱伝導率が1〜8×
10-3w/cm・K程度と悪く、基板との接触面積が
以外に小さいので冷却効率が低く、近時のように
基板の処理に大電力の使用が要求されると、基板
温度が上昇してレジストを劣化させたり基板を破
損する事故を生ずるので熱伝導性ゴムの使用は適
しない。
(Problem to be solved by the invention) When a thermally conductive rubber is provided on the cooling plate, a large amount of gas is generated from the rubber during processing of the substrate in the vacuum chamber, causing the vacuum chamber to become dirty and the vacuum to be poor. Moreover, the thermal conductivity of the rubber is 1 to 8×.
10 -3 w/cm・K, and the contact area with the substrate is extremely small, so the cooling efficiency is low, and when a large amount of power is required to process the substrate, as is the case in recent years, the substrate temperature will rise. Thermal conductive rubber is not suitable for use because it may cause damage to the resist or damage the substrate.

本考案は真空中に於けるガスの放出が少なく冷
却性の良いパツドを提供することを目的とするも
のにである。
The object of the present invention is to provide a pad that releases less gas in a vacuum and has good cooling performance.

(問題点を解決するための手段) 本考案では、真空室内でイオン注入その他の処
理が施される基板を、冷却水の循環等により冷却
された冷却板の前面にパツドを介して当接させ、
該処理に伴い温度上昇する基板を冷却するように
したものに於いて、該パツドを、Alその他の金
属薄膜の積層体で構成するようにした。
(Means for solving the problem) In the present invention, a substrate to be subjected to ion implantation or other processing in a vacuum chamber is brought into contact with the front surface of a cooling plate cooled by circulation of cooling water etc. via a pad. ,
In order to cool the substrate whose temperature increases with the processing, the pad is made of a laminate of Al or other metal thin films.

(作用) シリコンウエハ等の基板は冷却板の前面にパツ
ドを介して当接され、真空室内に於いて該基板に
例えばイオン注入が施させて発熱するとその熱は
該パツドから冷却板へと流れる。
(Function) A substrate such as a silicon wafer is brought into contact with the front surface of a cooling plate through a pad, and when the substrate is subjected to, for example, ion implantation in a vacuum chamber and generates heat, the heat flows from the pad to the cooling plate. .

この熱の流れが悪いと基板の温度が上昇し、破
損もしくはレジストの劣化の事故を生ずるが、本
考案のものでは、該パツドをAl,Cu等金属薄膜
の積層体で構成したので、熱伝導率がゴムに比べ
て著しく大きく、またパツド面の平滑度が高く且
つ積層体であるので基板に荷重を掛けたときの基
板のそりに対しての追従性が優れており、基板と
の接触面積が大きくなる。その結果冷却効率が高
まり、しかもパツドから発生するガスも少なく、
基板の汚染がない。
If this heat flow is poor, the temperature of the substrate will rise, causing damage or resist deterioration, but in the present invention, the pad is made of a laminate of thin metal films such as Al and Cu, so it is heat conductive. The pad surface has a significantly higher smoothness than rubber, and since it is a laminate, it has excellent ability to follow the warpage of the board when a load is applied to it, and the contact area with the board is also small. becomes larger. As a result, cooling efficiency is increased, and less gas is generated from the pads.
No substrate contamination.

(実施例) 本考案の実施例を図面につき説明すると、第1
図に於いて、1は真空室2内に設けた冷却板3の
前面にパツド4を介して当接されたシリコンウエ
ハ等の基板で、該基板1には例えばイオン注入の
処理が施される。この処理に伴い該基板1の温度
が上昇し、該基板1が熱により破損したり、これ
に塗布したレジストを劣化させるので、該冷却板
3を冷却水を循環させた冷却管5により冷却し、
基板1をパツド4を介して冷却する。
(Example) To explain the example of the present invention with reference to the drawings, the first example is as follows.
In the figure, 1 is a substrate such as a silicon wafer that is brought into contact with the front surface of a cooling plate 3 provided in a vacuum chamber 2 via a pad 4, and the substrate 1 is subjected to, for example, ion implantation processing. . This process increases the temperature of the substrate 1, which may damage the substrate 1 or deteriorate the resist applied to it. Therefore, the cooling plate 3 is cooled by a cooling pipe 5 through which cooling water is circulated. ,
The substrate 1 is cooled via the pad 4.

該基板1は平坦或はレンズ状に突出した冷却板
3の前面のパツド4にクランプ6により当接され
るので比較的凹凸の多い基板1の背面に多きな接
触面積で接触するが、該パツド4はAl或はCuの
ような金属薄膜の積層体で構成されているので熱
伝導性が良く、真空室2内にパツド4から放出さ
れるガスも少ないので真空室2内の汚れも少な
い。
Since the substrate 1 is brought into contact with the pad 4 on the front surface of the cooling plate 3 which is flat or protruded into a lens shape by the clamp 6, it comes into contact with the relatively uneven back surface of the substrate 1 with a large contact area. Since the pad 4 is made of a laminate of metal thin films such as Al or Cu, it has good thermal conductivity, and since there is little gas released from the pad 4 into the vacuum chamber 2, there is little dirt inside the vacuum chamber 2.

該パツド4はAlの金属薄膜で形成した場合そ
の熱伝導率は2.0w/cm・Kであり、厚さ15μmの
Alの薄膜を8層重ねてパツドに構成した場合、
第2図の曲線Aで示すようにイオン注入のための
電力を大きくしても曲線B,C,Dのシリコンゴ
ムのパツドを使用した場合よりも基板1の温度上
昇は少なくなり、良好な冷却効果が得られた。
Cu製のパツド4は熱伝導率が3.9w/cm・Kとな
りより一層良好な冷却効果が得られる。
When the pad 4 is formed of a metal thin film of Al, its thermal conductivity is 2.0w/cm・K, and the pad is made of a 15μm thick film.
When 8 layers of Al thin films are stacked to form a pad,
As shown by curve A in Figure 2, even if the power for ion implantation is increased, the temperature rise of the substrate 1 is smaller than when silicone rubber pads shown in curves B, C, and D are used, resulting in good cooling. It worked.
The pad 4 made of Cu has a thermal conductivity of 3.9w/cm·K, which provides an even better cooling effect.

(考案の効果) このように本考案によるときは、基板と冷却板
との間に介在されるパツドを金属薄膜の積層体で
構成したので、基板との大きな接触面積を保持す
ると共に冷却効率を大幅に向上させ得、真空室内
への放出ガスも少ないので、該室内及び基板の汚
染も少なくなり、高電流密度イオン注入装置の冷
却パツドとして特に有効である等の効果がある。
(Effects of the invention) As described above, according to the invention, the pad interposed between the substrate and the cooling plate is composed of a laminate of metal thin films, which maintains a large contact area with the substrate and improves cooling efficiency. Since there is little gas released into the vacuum chamber, there is less contamination of the chamber and the substrate, and the device is particularly effective as a cooling pad for high current density ion implanters.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例の截断側面図、第2図
は基板の温度の線図である。 1……基板、2……真空室、3……冷却板、4
……パツド。
FIG. 1 is a cutaway side view of an embodiment of the present invention, and FIG. 2 is a temperature diagram of the substrate. 1...Substrate, 2...Vacuum chamber, 3...Cooling plate, 4
... Patsudo.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 真空室内でイオン注入その他の処理が施される
基板を、冷却水の循環等により冷却された冷却板
の前面にパツドを介して当接させ、該処理に伴い
温度上昇する基板を冷却するようにしたものに於
いて、該パツドを、Alその他の金属薄膜の積層
体で構成して成る基板冷却用パツド。
A substrate to be subjected to ion implantation or other processing in a vacuum chamber is brought into contact with the front surface of a cooling plate, which is cooled by circulation of cooling water, through a pad, to cool the substrate whose temperature increases due to the processing. A substrate cooling pad comprising a laminate of Al or other metal thin film.
JP7926185U 1985-05-29 1985-05-29 Expired JPH0418197Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7926185U JPH0418197Y2 (en) 1985-05-29 1985-05-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7926185U JPH0418197Y2 (en) 1985-05-29 1985-05-29

Publications (2)

Publication Number Publication Date
JPS61196526U JPS61196526U (en) 1986-12-08
JPH0418197Y2 true JPH0418197Y2 (en) 1992-04-23

Family

ID=30624009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7926185U Expired JPH0418197Y2 (en) 1985-05-29 1985-05-29

Country Status (1)

Country Link
JP (1) JPH0418197Y2 (en)

Also Published As

Publication number Publication date
JPS61196526U (en) 1986-12-08

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