JPH04186823A - Vapor growth device - Google Patents

Vapor growth device

Info

Publication number
JPH04186823A
JPH04186823A JP31412290A JP31412290A JPH04186823A JP H04186823 A JPH04186823 A JP H04186823A JP 31412290 A JP31412290 A JP 31412290A JP 31412290 A JP31412290 A JP 31412290A JP H04186823 A JPH04186823 A JP H04186823A
Authority
JP
Japan
Prior art keywords
susceptor
receiver
substrate
detachably
reaction tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31412290A
Other languages
Japanese (ja)
Other versions
JP3056781B2 (en
Inventor
Keiichi Akagawa
赤川 慶一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2314122A priority Critical patent/JP3056781B2/en
Publication of JPH04186823A publication Critical patent/JPH04186823A/en
Application granted granted Critical
Publication of JP3056781B2 publication Critical patent/JP3056781B2/en
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Links

Abstract

PURPOSE:To reduce the dissipation of the heat of a susceptor to the side of a susceptor receiver, to make uniform a temperature distribution in the susceptor and to make it possible to vapor grow a good compound semiconductor thin film on a substrate by a method wherein the susceptor is supported attachably or detachably by the susceptor receiver in almost a linear contact or a point contact. CONSTITUTION:In a vapor growth device wherein a susceptor 4 for placing a substrate 3 and a susceptor receiver 5 for supporting attachably or detachably the susceptor 4 are arranged in a reaction tube 2, the substrate 3 placed on the susceptor 4 is heated by a heating means 6 and a thin film is vapor-phase grown on the substrate 3 with gas which is fed in the tube 2, the susceptor 4 is supported attachably or detachably by the receiver 5 in almost a linear contact or a point contact. For example, a groove part 5a is formed in the slant face-shaped inner peripheral surface of the upper part of a cylindrical susceptor receiver 5 consisting of molybdenum or the like and the outer peripheral surface of the susceptor 4 consisting of molybdenum or the like and the lower part of the outer peripheral surface are respectively supported attachably or detachably by protrusion parts 5b and 5c of the tips of the groove part 5a in a linear contact.

Description

【発明の詳細な説明】 [発明の目的コ (産業上の利用分野) 本発明は、化合物半導体等の製造に用いられる気相成長
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention (Field of Industrial Application) The present invention relates to a vapor phase growth apparatus used for manufacturing compound semiconductors and the like.

(従来の技術) 基板上に半導体等の結晶薄膜を気相成長させて半導体等
を製造する気相成長装置は、例えば第7図に示すように
構成されている。
(Prior Art) A vapor phase growth apparatus for manufacturing a semiconductor or the like by vapor phase growing a crystalline thin film of a semiconductor or the like on a substrate is configured as shown in FIG. 7, for example.

この図に示すように、この気相成長装置は、ベースプレ
ート1上に気密状態に固着された反応管2内に、基板3
を載置するサセプタ4と、サセプタ4を着脱自在に支持
する筒状のサセプタ受け5と、サセプタ4を介して基板
3を加熱するヒータ6と、ヒータ6を支持すると共にヒ
ータ6に通電する電極7が配設されている。
As shown in this figure, in this vapor phase growth apparatus, a substrate 3 is placed in a reaction tube 2 that is hermetically fixed on a base plate 1.
a susceptor 4 on which the susceptor 4 is placed, a cylindrical susceptor receiver 5 that removably supports the susceptor 4, a heater 6 that heats the substrate 3 via the susceptor 4, and an electrode that supports the heater 6 and energizes the heater 6. 7 are arranged.

反応管2の上部には、ガス(反応ガス、キャリアガス等
)を反応管2内に供給するための供給口2aが形成され
、反応管2の下部には、反応管2内の未反応ガスを排出
するための排気口2bが形成されている。
A supply port 2a for supplying gas (reactant gas, carrier gas, etc.) into the reaction tube 2 is formed in the upper part of the reaction tube 2, and a supply port 2a for supplying gas (reaction gas, carrier gas, etc.) into the reaction tube 2 is formed in the lower part of the reaction tube 2. An exhaust port 2b is formed for discharging the gas.

サセプタ受け5の上部の内周面には段部5fが形成され
ており、サセプタ4は、この段部5fにサセプタ4の外
周面および外周面下部の全面が接触するようにして着脱
自在にされている。また、ヒータ6は、サセプタ4を支
持するサセプタ受け5内に配設されている。
A step 5f is formed on the inner peripheral surface of the upper part of the susceptor receiver 5, and the susceptor 4 is detachably attached so that the entire outer peripheral surface and the lower part of the outer peripheral surface of the susceptor 4 are in contact with the step 5f. ing. Further, the heater 6 is disposed within a susceptor receiver 5 that supports the susceptor 4.

尚、図では省略したが、反応管2の外側には反応管2の
内壁面を水冷冷却するための冷却装置が配設されており
、サセプタ受け5の下部には、サセプタ4を回転させる
ための回転駆動装置か連結されている。
Although not shown in the figure, a cooling device for water-cooling the inner wall surface of the reaction tube 2 is provided on the outside of the reaction tube 2, and a cooling device for rotating the susceptor 4 is provided at the bottom of the susceptor receiver 5. Rotary drive device or connected.

従来の気相成長装置は上記のように構成されており、サ
セプタ4上に載置された基板3をヒータ6による加熱に
よって所定温度に上昇させて、供給口2aから反応管2
内に反応ガス(例えば、SiH4,5tH2Cl□、5
iHC1,,5iC14等)をキャリアガス(例えば、
H2等)と共に供給し、基板3上に化合物半導体の薄膜
を気相成長させる。
The conventional vapor phase growth apparatus is configured as described above, in which the substrate 3 placed on the susceptor 4 is heated to a predetermined temperature by the heater 6, and the reaction tube 2 is supplied from the supply port 2a.
reaction gas (e.g. SiH4,5tH2Cl□,5
iHC1,,5iC14, etc.) with a carrier gas (e.g.
H2, etc.), and a thin film of a compound semiconductor is grown on the substrate 3 in a vapor phase.

(発明が解決しようとする課題) ところで、上記した従来の気相成長装置では、サセプタ
4の外周面および外周面下部がサセプタ受け5の上部の
内周面に形成した段部5fに面接触で接している。
(Problem to be Solved by the Invention) By the way, in the conventional vapor phase growth apparatus described above, the outer circumferential surface and the lower portion of the outer circumferential surface of the susceptor 4 are in surface contact with the stepped portion 5f formed on the inner circumferential surface of the upper part of the susceptor receiver 5. are in contact with each other.

このため、ヒータ6によって加熱されるサセプタ4の熱
は、サセプタ4とサセプタ受け5の段部5fとの接触面
積か大きいので、サセプタ4の外周面からサセプタ受け
5側に伝導によってかなり逃げていく。よって、サセプ
タ4の外周側の温度か中心側に比べて下がることによっ
て温度分布か不均一になるので(第8図参照)、サセプ
タ4に載置されている基板3の温度も不均一になる。従
って、基板3に気相成長される化合物半導体の薄膜か不
均一なものとなり、特にこのような薄膜によって例えば
レーザダイオードを作製した時に発振周波数がばらつく
等の問題か生しる。
Therefore, since the contact area between the susceptor 4 and the stepped portion 5f of the susceptor receiver 5 is large, the heat of the susceptor 4 heated by the heater 6 is considerably lost by conduction from the outer peripheral surface of the susceptor 4 to the susceptor receiver 5 side. . Therefore, since the temperature on the outer circumferential side of the susceptor 4 is lower than that on the center side, the temperature distribution becomes uneven (see Fig. 8), and the temperature of the substrate 3 placed on the susceptor 4 also becomes uneven. . Therefore, the thin film of the compound semiconductor grown on the substrate 3 in vapor phase becomes non-uniform, which causes problems such as variations in oscillation frequency, especially when such a thin film is used to fabricate a laser diode, for example.

本発明は上記した課題を解決する目的でなされ、ヒータ
によって加熱されるサセプタの熱かサセプタ受は側に逃
げるのを低減し、サセプタの温度分布を均一にすること
によって基板上に良好な化合物半導体薄膜を気相成長さ
せることができる気相成長装置を提供しようとするもの
である。
The present invention was made for the purpose of solving the above-mentioned problems, and it reduces the heat of the susceptor heated by the heater escaping to the side of the susceptor receiver, and makes the temperature distribution of the susceptor uniform, thereby forming a good compound semiconductor on the substrate. The present invention aims to provide a vapor phase growth apparatus capable of vapor phase growth of thin films.

[発明の構成] (課題を解決するための手段) 前記した課題を解決するために本発明は、反応管内に基
板を載置するサセプタと、該サセプタを着脱自在に支持
するサセプタ受けが配設され、加熱手段により前記サセ
プタ上に載置された基板を加熱して、前記反応管内に供
給されるガスにより前記基板上に薄膜を気相成長させる
気相成長装置において、前記サセプタ受けに前記サセプ
タをほぼ線接触あるいは点接触で着脱自在に支持したこ
とを特徴としている。
[Structure of the Invention] (Means for Solving the Problems) In order to solve the above problems, the present invention provides a susceptor for placing a substrate in a reaction tube, and a susceptor receiver for detachably supporting the susceptor. In the vapor phase growth apparatus, the substrate mounted on the susceptor is heated by a heating means, and a thin film is vapor-phase grown on the substrate using gas supplied into the reaction tube. It is characterized by being removably supported by almost line contact or point contact.

(作用) 本発明によれば、サセプタ受けにサセプタを線接触ある
いは点接触で着脱自在に支持することにより、サセプタ
とサセプタ受けの接触面積が小さくなるので、サセプタ
の熱がサセプタ受は側に逃げるのを低減することができ
る。よって、サセプタの外周側の温度低下が少なくなる
ことにより、サセプタの温度分布を略均−にすることが
できるので、基板上に良好な化合物半導体の薄膜を気相
成長させることができる。
(Function) According to the present invention, by detachably supporting the susceptor on the susceptor receiver through line contact or point contact, the contact area between the susceptor and the susceptor receiver is reduced, so that the heat of the susceptor escapes to the side of the susceptor receiver. can be reduced. Therefore, since the temperature drop on the outer peripheral side of the susceptor is reduced, the temperature distribution of the susceptor can be made approximately uniform, and a good compound semiconductor thin film can be grown on the substrate by vapor phase growth.

(実施例) 以下、本発明を図示の実施例に基づいて詳細に説明する
。
(Example) Hereinafter, the present invention will be explained in detail based on the illustrated example.

第1図は、本発明に係る気相成長装置を示す断面図であ
る。尚、従来と同一部材には同一符号を付して説明する
。
FIG. 1 is a sectional view showing a vapor phase growth apparatus according to the present invention. In addition, the same reference numerals are attached to the same members as in the conventional case for explanation.

この図に示すように、ベースプレート1上に気密状態で
固着された反応管2内には、基板3を載置する円板状の
モリブデン等から成るサセプタ4と、サセプタ4を着脱
自在に支持する筒状のモリブデン等から成るサセプタ受
け5と、サセプタ4を介して基板3を加熱するヒータ6
と、ヒータ6を支持すると共にヒータ6に通電する電極
7が配設されている。
As shown in this figure, a reaction tube 2 that is airtightly fixed on a base plate 1 includes a disk-shaped susceptor 4 made of molybdenum or the like on which a substrate 3 is placed, and a susceptor 4 that is detachably supported. A susceptor receiver 5 made of cylindrical molybdenum or the like, and a heater 6 that heats the substrate 3 via the susceptor 4.
An electrode 7 is disposed to support the heater 6 and to supply electricity to the heater 6.

反応管2の上部には、ガス(反応ガス、キャリアガス等
)を反応管2内に供給するための供給口2aが形成され
、反応管2の下部には、反応管2内の未反応ガスを排出
するための排気口2bが形成されている。
A supply port 2a for supplying gas (reactant gas, carrier gas, etc.) into the reaction tube 2 is formed in the upper part of the reaction tube 2, and a supply port 2a for supplying gas (reaction gas, carrier gas, etc.) into the reaction tube 2 is formed in the lower part of the reaction tube 2. An exhaust port 2b is formed for discharging the gas.

サセプタ受け5の上部の斜面状の内周面には溝部5aが
形成されており、この溝部5aの先端の突起部5b、5
cて、それぞれサセプタ4の外周面と外周面下部が線接
触で着脱自在に支持されている。
A groove 5a is formed in the sloped inner peripheral surface of the upper part of the susceptor receiver 5, and protrusions 5b, 5 are formed at the tips of the groove 5a.
c, the outer circumferential surface and the lower portion of the outer circumferential surface of the susceptor 4 are removably supported in line contact.

ヒータ6は、サセプタ受け5内のサセプタ4の下方に配
設されており、ヒータ6を支持している電極7を通して
通電される。
The heater 6 is disposed below the susceptor 4 in the susceptor receiver 5, and is energized through an electrode 7 that supports the heater 6.

また、図では省略したが、反応管2の外側には反応管2
の内壁面を水冷冷却するための冷却装置か配設されてお
り、サセプタ受け5の下部には、サセプタ4を回転させ
るための回転駆動装置か連結されている。
Also, although omitted in the figure, there is a reaction tube 2 on the outside of the reaction tube 2.
A cooling device for cooling the inner wall surface of the susceptor 4 with water is provided, and a rotation drive device for rotating the susceptor 4 is connected to the lower part of the susceptor receiver 5.

本発明に係る気相成長装置は上記のように構成されてお
り、図示省略の回転駆動装置の駆動によってサセプタ受
け5を回転させてサセプタ4に載置した基板3を回転(
例えば10rpm以上の回転数)させると共に、基板3
を載置したサセプタ4をヒータ6て加熱して所定温度に
上昇させ、供給口2aから反応ガス(例えば、SiH4
,SiH2Cl 2 、  S I HCl 3 、 
 S ICl 4等)をキャリアガス(例えば、H2等
)と共に供給して基板3上に化合物半導体の薄膜を気相
成長させる。
The vapor phase growth apparatus according to the present invention is configured as described above, and rotates the susceptor receiver 5 by driving the rotation drive device (not shown) to rotate the substrate 3 placed on the susceptor 4 (
For example, at a rotation speed of 10 rpm or more), the substrate 3
The susceptor 4 on which the SiH4
, SiH2Cl 2 , SiHCl 3 ,
S ICl 4 etc.) is supplied together with a carrier gas (eg H2 etc.) to grow a compound semiconductor thin film on the substrate 3 in a vapor phase.

この時、サセプタ4はサセプタ受け5の突起部5b、5
cに線接触で支持されているので、ヒータ6によって加
熱されるサセプタ4の熱のサセプタ受け5側への熱伝導
か低減され、サセプタ4の熱かサセプタ受け5側に逃げ
るのを大幅に低減することかできる。よって、サセプタ
4の外周側の温度低下が少なくなることにより、ヒータ
6によって加熱されるサセプタ4の温度分布が略均−に
なるので(第8図参照)、基板3の温度も略均−になる
。従って、基板3の全面にわたって均一で良好な化合物
半導体の薄膜を気相成長させることができる。
At this time, the susceptor 4 is attached to the protrusions 5b and 5 of the susceptor receiver 5.
Since the susceptor 4 is supported in line contact with the susceptor 4, the conduction of the heat of the susceptor 4 heated by the heater 6 to the susceptor receiver 5 side is reduced, and the escape of the heat of the susceptor 4 to the susceptor receiver 5 side is significantly reduced. I can do something. Therefore, since the temperature drop on the outer peripheral side of the susceptor 4 is reduced, the temperature distribution of the susceptor 4 heated by the heater 6 becomes approximately uniform (see FIG. 8), and the temperature of the substrate 3 also becomes approximately uniform. Become. Therefore, a uniform and good compound semiconductor thin film can be grown in vapor phase over the entire surface of the substrate 3.

このように、サセプタ4の温度分布を略均−にすること
によって、良好な化合物半導体の薄膜を得ることができ
るので、例えばこの薄膜でレーザダイオードを作製する
ことにより、発振周波数のばらつき等のない良好なレー
ザダイオードを得ることができる。
In this way, by making the temperature distribution of the susceptor 4 approximately uniform, it is possible to obtain a good compound semiconductor thin film. For example, by manufacturing a laser diode using this thin film, it is possible to produce a laser diode with no variation in oscillation frequency. A good laser diode can be obtained.

第2図乃至第5図、および第6図は、それぞれ本発明の
他の実施例に係るサセプタとサセプタ受けの接触面を示
す断面図、および平面図である。
FIGS. 2 to 5 and 6 are a sectional view and a plan view, respectively, showing contact surfaces between a susceptor and a susceptor receiver according to other embodiments of the present invention.

第2図においては、サセプタ4の外周面の下部に段部4
aを形成すると共に、サセプタ受け5の上部を内側に傾
斜させて、サセプタ受け5の先端面でサセプタ4の外周
面に形成した段部4aを線接触で支持した構成である。
In FIG.
a, and the upper part of the susceptor receiver 5 is inclined inward, so that the tip surface of the susceptor receiver 5 supports the stepped portion 4a formed on the outer circumferential surface of the susceptor 4 in line contact.

第3図においては、第1図で示したサセプタ受け5に形
成した溝部5aの先端の突起部5b、5Cのサセプタ4
と線接触する面の面積を少し大きくし突起部5b、5c
の先端に平面部を形成した構成である。
In FIG. 3, the susceptor 4 of the protrusion 5b and 5C at the tip of the groove 5a formed in the susceptor receiver 5 shown in FIG.
The area of the surface in line contact with the projections 5b and 5c is slightly increased.
It has a configuration in which a flat part is formed at the tip.

第4図においては、サセプタ受け5の上部の内周面に溝
部5aを形成し、この溝部5aの先端の突起部5b、5
cて前記第1図で示した実施例同様サセプタ4を支持す
る構成であるが、突起部5bをサセプタ4の外周面にほ
ぼ全周にわたって線接触させ、突起部5cはサセプタ4
の外周面下部に全周にわたらずに複数箇所で点接触(突
起部5Cは少なくとも3つ以上形成されている)させて
サセプタ4を支持している。
In FIG. 4, a groove 5a is formed on the inner peripheral surface of the upper part of the susceptor receiver 5, and protrusions 5b, 5 at the tip of the groove 5a are formed.
c, the susceptor 4 is supported in the same way as in the embodiment shown in FIG.
The susceptor 4 is supported by making point contact (at least three or more protrusions 5C are formed) with the lower part of the outer circumferential surface of the susceptor 4 at a plurality of points without extending over the entire circumference.

また、これとは逆にサセプタ4の外周面にサセプタ受け
5の突起部5bを複数箇所で点接触させ、サセプタ4の
外周面下部にサセプタ受け5の突起部5cを線接触させ
てサセプタ4を支持してもよい。
In addition, on the contrary, the protrusions 5b of the susceptor receiver 5 are brought into point contact with the outer peripheral surface of the susceptor 4 at multiple points, and the protrusions 5c of the susceptor receiver 5 are brought into line contact with the lower part of the outer peripheral surface of the susceptor 4. May be supported.

第5図においては、第7図に示した従来のサセプタ受け
5の上部に別体の例えば熱伝導率の小さなセラミックや
ガラス等からなるサセプタ受け8を配設して、別体のサ
セプタ受け8の上部に形成した溝部8aの先端の突起部
8b、8cて、サセプタ4の外周面と外周面下部を線接
触で支持した構成であり、サセプタ4の熱が逃げるのを
さらに低減させることができる。
In FIG. 5, a separate susceptor receiver 8 made of, for example, ceramic or glass with low thermal conductivity is disposed above the conventional susceptor receiver 5 shown in FIG. The outer peripheral surface of the susceptor 4 and the lower part of the outer peripheral surface are supported in line contact by the projections 8b and 8c at the tip of the groove 8a formed in the upper part of the susceptor 4, and it is possible to further reduce the escape of heat from the susceptor 4. .

また、別体のサセプタ受け8をサセプタ4とサセプタ受
け5間に複数個介装してもよい。
Further, a plurality of separate susceptor receivers 8 may be interposed between the susceptor 4 and the susceptor receiver 5.

第6図においては、サセプタ受け5の内周面に形成した
サセプタ5を配置する段部5dに、先端に平面部を有す
る複数の突起部(図では3つ)5eを形成し、この突起
部5eでサセプタ5をほぼ点接触で支持した構成である
。
In FIG. 6, a plurality of protrusions (three in the figure) 5e having a flat portion at the tip are formed on a stepped portion 5d formed on the inner circumferential surface of the susceptor receiver 5 on which the susceptor 5 is disposed, and these protrusions 5e supports the susceptor 5 in almost point contact.

この場合、サセプタ4をサセプタ受け5に点接触だけで
支持することにより、サセプタ4の熱のサセプタ受け5
側への熱伝導を効果的に小さくすることができる。
In this case, by supporting the susceptor 4 with only point contact with the susceptor receiver 5, the heat of the susceptor 4 can be transferred to the susceptor receiver 5.
Heat conduction to the sides can be effectively reduced.

このように、第2図から第6図に示した各実施例におい
ても第1図に示した実施例同様、ヒータ6によって加熱
されるサセプタ4の熱のサセプタ受け5側への熱伝導が
低減されるので、サセプタ4の熱のサセプタ受け5側へ
の逃げが大幅に低減され、サセプタ4の温度分布の均一
化を図ることができる。
In this way, in each of the embodiments shown in FIGS. 2 to 6, as in the embodiment shown in FIG. 1, the conduction of heat from the susceptor 4 heated by the heater 6 to the susceptor receiver 5 side is reduced Therefore, the escape of heat from the susceptor 4 to the susceptor receiver 5 side is significantly reduced, and the temperature distribution of the susceptor 4 can be made uniform.

また、前記した各実施例において、サセプタ受け5を熱
伝導率の小さいセラミックスやガラス等で形成すること
によって、サセプタ4の熱のサセプタ受け5側への逃げ
をより低減することができる。
Furthermore, in each of the embodiments described above, by forming the susceptor receiver 5 from ceramics, glass, or the like having low thermal conductivity, it is possible to further reduce the escape of heat from the susceptor 4 to the susceptor receiver 5 side.

[発明の効果] 以上、実施例に基づいて具体的に説明したように本発明
によれば、ヒータによって加熱されるサセプタの温度分
布を略均−にすることができるので、基板上の全面に均
一で良好な化合物半導体の薄膜を気相成長させることが
できる。
[Effects of the Invention] As described above in detail based on the embodiments, according to the present invention, the temperature distribution of the susceptor heated by the heater can be made approximately uniform, so that the entire surface of the substrate can be heated. A uniform and good compound semiconductor thin film can be grown by vapor phase growth.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明に係る気相成長装置を示す断面図、第
2図乃至第5図、および第6図は、それぞれ本発明の他
の実施例に係るサセプタとサセプタ受けの接触面を示す
断面図、および平面図、第7図は、従来の気相成長装置
を示す断面図、第8図は、本発明と従来の気相成長装置
のサセプタの温度分布を示す図である。 1・・・ベースプレート 2・・・反応管   3・・・基板 4・・・サセプタ  5・・・サセプタ受け5a・・・
溝部   5b、5c・・・突起部6・・ヒータ   
7・・電極
FIG. 1 is a sectional view showing a vapor phase growth apparatus according to the present invention, and FIGS. 2 to 5 and 6 respectively show contact surfaces between a susceptor and a susceptor receiver according to other embodiments of the present invention. FIG. 7 is a cross-sectional view showing a conventional vapor phase growth apparatus, and FIG. 8 is a diagram showing the temperature distribution of the susceptor of the present invention and the conventional vapor phase growth apparatus. 1... Base plate 2... Reaction tube 3... Substrate 4... Susceptor 5... Susceptor receiver 5a...
Groove portions 5b, 5c...Protrusion portion 6...Heater
7. Electrode

Claims (1)

【特許請求の範囲】[Claims] 反応管内に基板を載置するサセプタと、該サセプタを着
脱自在に支持するサセプタ受けが配設され、加熱手段に
より前記サセプタ上に載置された基板を加熱して、前記
反応管内に供給されるガスにより前記基板上に薄膜を気
相成長させる気相成長装置において、前記サセプタ受け
に前記サセプタをほぼ線接触あるいは点接触で着脱自在
に支持したことを特徴とする気相成長装置。
A susceptor for placing a substrate in a reaction tube and a susceptor receiver for detachably supporting the susceptor are provided, and the substrate placed on the susceptor is heated by a heating means and supplied into the reaction tube. A vapor phase growth apparatus for growing a thin film on the substrate using gas in a vapor phase, characterized in that the susceptor is detachably supported on the susceptor holder in substantially line contact or point contact.
JP2314122A 1990-11-21 1990-11-21 Vapor phase growth equipment Expired - Fee Related JP3056781B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2314122A JP3056781B2 (en) 1990-11-21 1990-11-21 Vapor phase growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2314122A JP3056781B2 (en) 1990-11-21 1990-11-21 Vapor phase growth equipment

Publications (2)

Publication Number Publication Date
JPH04186823A true JPH04186823A (en) 1992-07-03
JP3056781B2 JP3056781B2 (en) 2000-06-26

Family

ID=18049511

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2314122A Expired - Fee Related JP3056781B2 (en) 1990-11-21 1990-11-21 Vapor phase growth equipment

Country Status (1)

Country Link
JP (1) JP3056781B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009016567A (en) * 2007-07-04 2009-01-22 Nuflare Technology Inc Vapor growth apparatus and vapor growth method
US8366830B2 (en) 2003-03-04 2013-02-05 Cree, Inc. Susceptor apparatus for inverted type MOCVD reactor
US8372204B2 (en) 2002-05-13 2013-02-12 Cree, Inc. Susceptor for MOCVD reactor
JP2013093461A (en) * 2011-10-26 2013-05-16 Ulvac Japan Ltd Deposition apparatus
JP2021082824A (en) * 2021-01-27 2021-05-27 株式会社ニューフレアテクノロジー Vapor phase growth apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8372204B2 (en) 2002-05-13 2013-02-12 Cree, Inc. Susceptor for MOCVD reactor
US8366830B2 (en) 2003-03-04 2013-02-05 Cree, Inc. Susceptor apparatus for inverted type MOCVD reactor
JP2009016567A (en) * 2007-07-04 2009-01-22 Nuflare Technology Inc Vapor growth apparatus and vapor growth method
JP2013093461A (en) * 2011-10-26 2013-05-16 Ulvac Japan Ltd Deposition apparatus
JP2021082824A (en) * 2021-01-27 2021-05-27 株式会社ニューフレアテクノロジー Vapor phase growth apparatus

Also Published As

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