JPH04198744A - Surface state inspecting device - Google Patents
Surface state inspecting deviceInfo
- Publication number
- JPH04198744A JPH04198744A JP2331181A JP33118190A JPH04198744A JP H04198744 A JPH04198744 A JP H04198744A JP 2331181 A JP2331181 A JP 2331181A JP 33118190 A JP33118190 A JP 33118190A JP H04198744 A JPH04198744 A JP H04198744A
- Authority
- JP
- Japan
- Prior art keywords
- defect
- concentration
- value
- density
- digital image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Closed-Circuit Television Systems (AREA)
- Image Analysis (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野コ
本発明は、フィルム等の表面に存在するスジ状の欠陥等
を検査するに好適な表面状態検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a surface condition inspection device suitable for inspecting streak-like defects etc. existing on the surface of a film or the like.
[従来の技術]
フィルム等の表面に存在する異常を検査する装置として
は、He−Neレーザー光を表面に照射し、これがゴミ
等によって任意方向に散乱せしめられることを利用する
ものがある。[Prior Art] As an apparatus for inspecting abnormalities existing on the surface of a film or the like, there is one that utilizes the fact that the surface is irradiated with He-Ne laser light and the light is scattered in arbitrary directions by dust or the like.
[発明が解決しようとする課題]
然しながら、従来技術には、下記■〜■の問題点がある
。[Problems to be Solved by the Invention] However, the prior art has the following problems (1) to (3).
■光学系が複雑であり、装置が大がかりとなる。■The optical system is complicated and the equipment is large-scale.
■ライン方向に流れるスジ状の欠陥の検出能か低い。■Poor detection ability for streak-like defects flowing in the line direction.
■検出結果と、人間の目でとらえた感覚が必ずしも一致
しない。■Detection results do not necessarily match the sense perceived by the human eye.
本発明は、コンパクトな装置構成により、スジ状の欠陥
等の表面状態を、人間の目に近い状態て確実に検出する
ことを目的とする。An object of the present invention is to use a compact device configuration to reliably detect surface conditions such as streak-like defects in conditions similar to those seen by the human eye.
[課題を解決するための手段]
本発明は、被検査体の表面を撮像する撮像装置と、撮像
装置の撮像結果に基づいて被検査体の表面状態を判定す
る判定装置と、判定装置の判定結果を出力する出力装置
とを有して構成される表面状態検査装置であって、判定
装置は、撮像装置からの映像入力信号をA/D変換して
2次元のデジタル画像を作り、上記デジタル画像データ
に対して濃度勾配処理を行なって欠陥を強調し、上記欠
陥発生方向に各画素の濃度値を積分し、欠陥発生方向に
直交する一次元の濃度積分値信号とし、上記濃度積分値
の平均を求め、上記平均濃度積分値に一定のオフセット
値を加えたしきい値を定め、各濃度積分値を上記しきい
値と比較して被検査体の表面状態の良/不良を判定する
ようにしたものである。[Means for Solving the Problems] The present invention provides an imaging device that images the surface of an object to be inspected, a determination device that determines the surface state of the object to be inspected based on the imaging result of the imaging device, and a determination method of the determination device. The surface condition inspection device is configured to include an output device that outputs a result, and the determination device A/D converts the video input signal from the imaging device to create a two-dimensional digital image, and the determination device generates a two-dimensional digital image. The image data is subjected to density gradient processing to emphasize defects, and the density value of each pixel is integrated in the direction of defect occurrence to produce a one-dimensional density integral value signal orthogonal to the direction of defect occurrence. The average is determined, a threshold value is determined by adding a certain offset value to the average integrated density value, and each integrated density value is compared with the threshold value to determine whether the surface condition of the object to be inspected is good or bad. This is what I did.
[作用〕 本発明によれば、下記■〜■の作用がある。[Effect] According to the present invention, the following effects (1) to (4) are achieved.
■テレビカメラ等の汎用性のある撮像装置を用いて表面
状態を検出でき、装置構成をコンパクトにてきる。■The surface condition can be detected using a versatile imaging device such as a television camera, making the device configuration compact.
■表面の濃度を欠陥発生方向に積分して表面状態を判定
するものであり、照明むら等の雑音の影響を消すことが
でき、スジ状の欠陥等の表面状態を確実に検出できる。(2) The surface condition is determined by integrating the surface concentration in the direction of defect occurrence, which can eliminate the effects of noise such as uneven illumination, and can reliably detect surface conditions such as streak-like defects.
■表面の濃度により、表面状態を検出するものであるた
め、表面状態を人間の目に近い状態て検出てきる。■Since the surface condition is detected based on the surface concentration, the surface condition can be detected in conditions similar to those seen by the human eye.
[実施例コ
第1図は本発明の検査装置の一例を示すブロック図、第
2図は検査手順をを示す流れ図、第3図は表面に存在す
るスジ状の欠陥を示す模式図、第4図は濃度勾配のマト
リクス図、第5図は濃度値信号を示す分布図、第6図は
濃度積分値信号を示す分布図である。[Example] Fig. 1 is a block diagram showing an example of the inspection apparatus of the present invention, Fig. 2 is a flow chart showing the inspection procedure, Fig. 3 is a schematic diagram showing a streak-like defect existing on the surface, Fig. 4 This figure is a matrix diagram of concentration gradients, FIG. 5 is a distribution diagram showing density value signals, and FIG. 6 is a distribution diagram showing density integral value signals.
表面状態検査装置1は、テレビカメラ10(撮像装置)
と、判定装置20と、出力装置3oとを有し、被検査体
である例えばフィルム11の表面の異常の有無を検査す
る。The surface condition inspection device 1 includes a television camera 10 (imaging device)
It has a determination device 20, and an output device 3o, and inspects the surface of the object to be inspected, such as the film 11, for abnormalities.
表面状態検査装置1の基本的動作は下記(1)〜(4)
である。The basic operations of the surface condition inspection device 1 are as follows (1) to (4)
It is.
(1)テレビカメラ10により、フィルム11の表面を
撮像する。(1) The surface of the film 11 is imaged by the television camera 10.
テレビカメラ10は、画素単位でサンプリングした多値
画像を判定装置20に転送する。The television camera 10 transfers a multivalued image sampled pixel by pixel to the determination device 20.
(2)判定装置20は、テレビカメラ1oの撮像データ
をA/D変換器21で例えば8ビツト(256階調)に
て量子化し、MXN画素のデジタル画像を作り、これを
画像メモリ22に入力する。(2) The determination device 20 quantizes the image data of the television camera 1o with an A/D converter 21, for example, at 8 bits (256 gradations), creates a digital image of MXN pixels, and inputs this into the image memory 22. do.
(3)判定装置20は、画像メモリ22に入力された画
像に蟇づいて、CPU23により表面におけるスジ状の
欠陥の有無を判定する。(3) The determining device 20 uses the CPU 23 to determine the presence or absence of a streak-like defect on the surface based on the image input to the image memory 22.
(4)出力装置30は、判定装置2oの判定結果を表示
し、必要により警報を発生せしめる。(4) The output device 30 displays the determination result of the determination device 2o and generates an alarm if necessary.
尚、撮像装置(10)としては、テレビカメラの代わり
に、M個の空間分解能を持つラインセンサを用いても良
く、この場合には、ラインセンサと被検査体とを相対移
動させ、得られるN側群のデータを画像メモリに蓄える
。Note that as the imaging device (10), a line sensor having M spatial resolution may be used instead of the television camera. In this case, the line sensor and the object to be inspected are moved relative to each other, Store the data of the N side group in the image memory.
判定装置20は、必ずしも画像メモリ22を用いず、A
/D変換器21の出力データを直接的にCPU23に入
力しても良い。The determination device 20 does not necessarily use the image memory 22;
The output data of the /D converter 21 may be input directly to the CPU 23.
然るに、上記判定装220による判定動作は下記■〜■
の如くなされる(第2図参照)。However, the determination operation by the determination device 220 is as follows.
This is done as follows (see Figure 2).
■MXN画素のデジタル画像データに対して、例えば第
4図に示すオペレータを作用させ濃度勾配処理を行ない
、欠陥を強調する。(2) For example, an operator shown in FIG. 4 is applied to digital image data of MXN pixels to perform density gradient processing to emphasize defects.
即ち、MXN画素のデジタル画像データに対して、例え
ば第4図に示すような重みをもった空間フィルタにより
積和演算し、濃度勾配処理を行ない、欠陥と背景の濃度
差を拡げ、欠陥信号を強調する。That is, for digital image data of MXN pixels, for example, a weighted spatial filter as shown in FIG. Emphasize.
■照明むら等の雑音の影響を消すために、上記欠陥発生
方向(例えばN方向)に各画素の濃度値を積分する(f
(M、N)は各画素の濃度値)、これにより、欠陥発生
方向に直交する1次元の濃度積分値信号を得る。■In order to eliminate the influence of noise such as uneven illumination, the density value of each pixel is integrated in the defect occurrence direction (for example, N direction) (f
(M, N) is the density value of each pixel), thereby obtaining a one-dimensional density integral value signal orthogonal to the direction of defect occurrence.
S (M) = f (M、1) + f (M、
2) +−−−−−−+ f (M、N−1) +
f (M、N) ・・・(1)■上記濃度
積分値S (M)の平均値AVEを求める。S (M) = f (M, 1) + f (M,
2) +−−−−−−+ f (M, N−1) +
f (M, N) ... (1) ■ Find the average value AVE of the above density integral value S (M).
A V E = (S (1) + S (2)
+、、、、、。A V E = (S (1) + S (2)
+,,,,,.
+ S (M−1) + S (M−1) + S (
Ml)/ M・・・(2)
■上記平均濃度積分値AVEに、予め求めておいたオフ
セット値2を加えたしきい値を定める。+ S (M-1) + S (M-1) + S (
Ml)/M...(2) (2) Determine a threshold value by adding the offset value 2 determined in advance to the average density integral value AVE.
■各濃度積分値(S(I) )、r : 1.2、・・
・M−1、M)を、上記しきい値(AVE+Z)と比較
し、被検査体の表面状態の良/不良を判定し、結果を出
力する。■Each concentration integral value (S(I)), r: 1.2,...
- Compare M-1, M) with the above threshold value (AVE+Z), determine whether the surface condition of the object to be inspected is good or bad, and output the result.
5(I)>AVE+Z埠不良
(1≦工≦M) ・・・(3)
第5図は各画素の濃度値の積分を行なわない場合の、M
方向のあるラインでの濃度プロファイルである。雑音の
影響か大きく、表面状態の良/不良を判別できないこと
が認められる。5 (I) > AVE + Z bar defect (1 ≦ engineering ≦ M) ... (3) Figure 5 shows M when the density value of each pixel is not integrated.
This is a concentration profile along a directional line. It is recognized that it is not possible to determine whether the surface condition is good or bad, probably due to the influence of noise.
第6図は本発明の表面状態検査装置1を用いて被検査体
の表面状態の良/不良を判定したものであり、各画素の
濃度値の積分によって、表面状態の良/不良を確実に判
別できることか認められる。FIG. 6 shows how the surface condition inspection device 1 of the present invention is used to determine whether the surface condition of the object to be inspected is good or bad. By integrating the density value of each pixel, it is possible to reliably determine whether the surface condition is good or bad. It is recognized that it can be distinguished.
上記実施例によれば、下記■〜■の作用かある。According to the above embodiment, the following effects (1) to (4) are achieved.
■テレビカメラ10等の汎用性のある撮像装置を用いて
表面状態を検出でき、装置構成をコンパクトにできる。- Surface conditions can be detected using a versatile imaging device such as the television camera 10, and the device configuration can be made compact.
■表面の濃度を欠陥発生方向に積分して表面状態を判定
するものてあり、照明むら等の雑音の影響を消すことが
てき、スジ状の欠陥等の表面状態を確実に検出できる。(2) There is a device that determines the surface condition by integrating the surface concentration in the direction of defect occurrence, which can eliminate the effects of noise such as uneven illumination, and can reliably detect surface conditions such as streak-like defects.
■表面の濃度により表面状態を検出するものであるため
、表面状態を人間の目に近い状態て検出できる。■Since the surface condition is detected based on the surface concentration, the surface condition can be detected in conditions similar to those seen by the human eye.
尚、本発明は、表面の異常検査のみてなく、表面状態の
等級分類等のために広く利用できる。Note that the present invention can be widely used not only for inspecting surface abnormalities but also for classifying surface conditions.
[発明の効果コ
以上のように本発明によれば、コンパクトな装置構成に
より、スジ状の欠陥等の表面状態を、人間の目に近い状
態で確実に検出することかできる。[Effects of the Invention] As described above, according to the present invention, surface conditions such as streak-like defects can be reliably detected in a state similar to that seen by the human eye, using a compact device configuration.
第1図は本発明の検査装置の一例を示すブロック図、第
2図は検査手順をを示す流れ図、第3図は表面に存在す
るスジ状の欠陥を示す模式図、第4図は濃度勾配のマト
リクス図、第5図は濃度値信号を示す分布図、第6図は
濃度積分値信号を示す分布図である。
10・・・撮像装置、
20−・・判定装置、
30・・・出力装置。
特許出願人 積水化学工業株式会社
代表者 廣 1) 馨
第1図
フィルム 第3図
第4図Fig. 1 is a block diagram showing an example of the inspection device of the present invention, Fig. 2 is a flowchart showing the inspection procedure, Fig. 3 is a schematic diagram showing streak-like defects existing on the surface, and Fig. 4 is a concentration gradient. FIG. 5 is a distribution diagram showing density value signals, and FIG. 6 is a distribution diagram showing density integral value signals. 10... Imaging device, 20-... Determination device, 30... Output device. Patent applicant: Sekisui Chemical Co., Ltd. Representative Hiroshi 1) Kaoru Figure 1 Film Figure 3 Figure 4
Claims (1)
の撮像結果に基づいて被検査体の表面状態を判定する判
定装置と、判定装置の判定結果を出力する出力装置とを
有して構成される表面状態検査装置であって、判定装置
は、撮像装置からの映像入力信号をA/D変換して2次
元のデジタル画像を作り、上記デジタル画像データに対
して濃度勾配処理を行なって欠陥を強調し、上記欠陥発
生方向に各画素の濃度値を積分し、欠陥発生方向に直交
する一次元の濃度積分値信号とし、上記濃度積分値の平
均を求め、上記平均濃度積分値に一定のオフセット値を
加えたしきい値を定め、各濃度積分値を上記しきい値と
比較して被検査体の表面状態の良/不良を判定するもの
である表面状態検査装置。(1) It has an imaging device that images the surface of the object to be inspected, a determination device that determines the surface state of the object to be inspected based on the imaging result of the imaging device, and an output device that outputs the determination result of the determination device. The determination device A/D converts a video input signal from an imaging device to create a two-dimensional digital image, and performs density gradient processing on the digital image data. to emphasize the defect, integrate the density value of each pixel in the direction of defect occurrence, obtain a one-dimensional density integral value signal perpendicular to the direction of defect occurrence, calculate the average of the density integral values, and calculate the average density integral value. A surface condition inspection apparatus that determines whether a surface condition of an object to be inspected is good or bad by determining a threshold value to which a certain offset value is added and comparing each density integral value with the threshold value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2331181A JPH04198744A (en) | 1990-11-28 | 1990-11-28 | Surface state inspecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2331181A JPH04198744A (en) | 1990-11-28 | 1990-11-28 | Surface state inspecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04198744A true JPH04198744A (en) | 1992-07-20 |
Family
ID=18240798
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2331181A Pending JPH04198744A (en) | 1990-11-28 | 1990-11-28 | Surface state inspecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04198744A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010102319A1 (en) * | 2009-03-10 | 2010-09-16 | Polymer Competence Center Leoben Gmbh | Method for automatically detecting a defect on a surface of a molded part |
| CN102680472A (en) * | 2012-05-02 | 2012-09-19 | 明基材料有限公司 | Method and device for detecting film |
-
1990
- 1990-11-28 JP JP2331181A patent/JPH04198744A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010102319A1 (en) * | 2009-03-10 | 2010-09-16 | Polymer Competence Center Leoben Gmbh | Method for automatically detecting a defect on a surface of a molded part |
| CN102680472A (en) * | 2012-05-02 | 2012-09-19 | 明基材料有限公司 | Method and device for detecting film |
| CN102680472B (en) * | 2012-05-02 | 2014-04-02 | 明基材料有限公司 | Method and device for detecting film |
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