JPH04202098A - Method for producing cubic cadmium zinc sulfide mixed crystal thin film - Google Patents
Method for producing cubic cadmium zinc sulfide mixed crystal thin filmInfo
- Publication number
- JPH04202098A JPH04202098A JP2335904A JP33590490A JPH04202098A JP H04202098 A JPH04202098 A JP H04202098A JP 2335904 A JP2335904 A JP 2335904A JP 33590490 A JP33590490 A JP 33590490A JP H04202098 A JPH04202098 A JP H04202098A
- Authority
- JP
- Japan
- Prior art keywords
- cadmium
- molecular beam
- thin film
- zinc
- mixed crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は発光ダイオード等の発光素子に用いられる半導
体薄膜材料の製造方法に関し、とくに青色発光素子用材
料として良好な特性を示す立方晶系硫化カドミウム亜鉛
混晶薄膜の製造方法に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for producing semiconductor thin film materials used in light emitting devices such as light emitting diodes, and in particular, cubic sulfide which exhibits good properties as a material for blue light emitting devices. The present invention relates to a method for producing a cadmium-zinc mixed crystal thin film.
[従来の技術]
従来の立方晶系硫化カドミウム亜鉛混晶薄膜を製造する
方法として、第2図に示すような分子線エピタキシー装
置を用い、超高真空容器21内でルツボ26内に装填し
た硫化カドミウム原料26aとルツボ27内に装填した
硫化亜鉛原料27aを加熱蒸発させ、基板24の表面に
立方晶系硫化カドミウム亜鉛混晶薄膜25を形成するも
のが知られている。[Prior Art] As a conventional method for manufacturing a cubic cadmium zinc sulfide mixed crystal thin film, a molecular beam epitaxy apparatus as shown in FIG. A method is known in which a cadmium raw material 26a and a zinc sulfide raw material 27a loaded in a crucible 27 are heated and evaporated to form a cubic cadmium zinc sulfide mixed crystal thin film 25 on the surface of the substrate 24.
[発明が解決しようとする課題」
しかしながら上述のような従来の方法では、基板表面に
飛来してきた硫化カドミウムの付着係数が低いため、基
板表面に物理吸着した状態から硫化カドミウムが脱離し
、混晶中のカドミウム組成比の多い領域の混晶薄膜を形
成するのが困難であった。また、基板温度を下げて硫化
カドミウムの脱離を抑えることが考えられるが、基板温
度が低(なりすぎて、物理吸着した分子がマイグレーシ
ョンするのに十分なエネルギーが得られないために構造
的欠陥が発生するなどの課題を有していた。[Problem to be solved by the invention] However, in the conventional method as described above, the adhesion coefficient of cadmium sulfide flying onto the substrate surface is low, so cadmium sulfide is desorbed from the state of physical adsorption on the substrate surface, and mixed crystals are formed. It was difficult to form a mixed crystal thin film in a region with a high cadmium composition ratio. Another possibility is to lower the substrate temperature to suppress the desorption of cadmium sulfide, but if the substrate temperature is too low (too low), the physically adsorbed molecules will not have enough energy to migrate, resulting in structural defects. There were problems such as the occurrence of
本発明は、前記従来技術の課題を解決するため、構造的
に欠陥のない立方晶系硫化カドミウム亜鉛混晶薄膜の製
造方法を提供することを目的きする。SUMMARY OF THE INVENTION In order to solve the problems of the prior art, it is an object of the present invention to provide a method for manufacturing a cubic cadmium zinc sulfide mixed crystal thin film that is structurally free from defects.
[課題を解決するための手段]
前記目的を達成するため、本発明の立方晶系硫化カドミ
ウム亜鉛混晶薄膜の製造方法は、真空中で、基板表面に
硫黄分子線とカドミウム分子線と亜鉛分子線とを照射し
て薄膜を製造する方法において、前記硫黄分子線として
硫化水素を熱分解させて得たラジカル硫黄分子線を用い
、前記カドミウム分子線として金属カドミウムを加熱蒸
発させるか有機カドミウム化合物の気体を熱分解させる
かして得た分子線を用い、前記亜鉛分子線として金属亜
鉛を加熱蒸発させるか有機亜鉛化合物の気体を熱分解さ
せるかして得た分子線を用いたことを特徴とする。[Means for Solving the Problems] In order to achieve the above object, the method for manufacturing a cubic cadmium zinc sulfide mixed crystal thin film of the present invention includes a method for producing a cubic cadmium zinc sulfide mixed crystal thin film, in which sulfur molecular beams, cadmium molecular beams, and zinc molecules are formed on the surface of a substrate in vacuum. In the method of manufacturing a thin film by irradiating a sulfur molecular beam with a radical sulfur molecular beam obtained by thermally decomposing hydrogen sulfide, the cadmium molecular beam is a radical sulfur molecular beam obtained by thermally decomposing hydrogen sulfide, and the cadmium molecular beam is a radical sulfur molecular beam obtained by thermally evaporating metallic cadmium or an organic cadmium compound. A molecular beam obtained by thermally decomposing a gas is used, and a molecular beam obtained by thermally evaporating metallic zinc or thermally decomposing a gas of an organic zinc compound is used as the zinc molecular beam. do.
前記構成においては、基板としてガリウム砒素、ガリウ
ム燐、インジウム燐のうちいずれかの単結晶を用いるこ
とが好ましい。In the above configuration, it is preferable to use a single crystal of gallium arsenide, gallium phosphide, or indium phosphide as the substrate.
また、前記構成においては、基板温度を200℃以上5
00℃以下とすることが好ましい。In addition, in the above configuration, the substrate temperature is set at 200°C or more.
The temperature is preferably 00°C or lower.
[作用コ
前記本発明の構成によれば、反応性の高いラジカル硫黄
分子線を用いることにより硫黄を有効に薄膜中に取り入
れることができ、また、構成元素(硫黄、カドミウム、
亜鉛)を個別に供給することにより硫化カドミウム分子
の脱離が抑えることができる。その結果、構造欠陥が少
なく、高効率の青色発光素子を得ることができる。[Function] According to the configuration of the present invention, sulfur can be effectively incorporated into the thin film by using a highly reactive radical sulfur molecular beam, and the constituent elements (sulfur, cadmium,
Desorption of cadmium sulfide molecules can be suppressed by individually supplying cadmium sulfide (zinc). As a result, a highly efficient blue light emitting element with few structural defects can be obtained.
そして、ラジカルを用いることにより成長時の圧力を低
減できるために不純物の取り込まれが少なくなるという
作用と、成長時の基板温度を表面分子がマイグレーショ
ンを行なうのに十分な温度エネルギー領域で行なえるの
で構造的欠陥の発生が低減できるという作用がある。By using radicals, it is possible to reduce the pressure during growth, which reduces the incorporation of impurities, and because the substrate temperature during growth can be kept in a temperature energy range sufficient for surface molecules to migrate. This has the effect of reducing the occurrence of structural defects.
また前記した、基板としてガリウム砒素、ガリウム燐、
インジウム燐のうちいずれかの単結晶を用いるという本
発明の好ましい構成によれば、立方晶系硫化カドミウム
亜鉛のとり得る格子定数に近い格子定数をもっことがで
き、さらに構造欠陥を低くすることができる。In addition, as described above, gallium arsenide, gallium phosphorus,
According to the preferred configuration of the present invention in which a single crystal of indium phosphorous is used, it is possible to have a lattice constant close to that possible for cubic cadmium zinc sulfide, and furthermore, it is possible to reduce structural defects. can.
また前記した、基板温度を200℃以上500℃以下に
するという本発明の好ましい構成によれば、薄膜形成を
良好に行なうこ七ができる。Further, according to the above-described preferred configuration of the present invention in which the substrate temperature is set to 200° C. or more and 500° C. or less, it is possible to form a thin film favorably.
「実施例コ 以下、本発明を実施例によりさらに具体的に説明する。"Example code" EXAMPLES Hereinafter, the present invention will be explained in more detail with reference to Examples.
第1図は本発明の製造方法の一実施例で用いられる分子
線エピタキシー装置の構造を示す概略図である。同図に
おいて16および17は通常の蒸発用ルツボで、それぞ
れ原料となる金属カドミラム16aおよび金属亜鉛17
aを装填しておき、加熱蒸発させてカドミウム分子線1
6cおよび亜鉛分子線17cを得る。FIG. 1 is a schematic diagram showing the structure of a molecular beam epitaxy apparatus used in an embodiment of the manufacturing method of the present invention. In the same figure, 16 and 17 are ordinary evaporation crucibles, and metal cadmium 16a and metal zinc 17 are raw materials, respectively.
A is loaded and heated to evaporate to form a cadmium molecular beam 1.
6c and zinc molecular beam 17c are obtained.
また18はガス分解セルで硫化水素ガス容器18aから
導入されたガスを熱エネルギーを利用したラジカル発生
装置によりラジカル化させて、ラジカル硫黄分子線18
cを得る。Further, 18 is a gas decomposition cell in which the gas introduced from the hydrogen sulfide gas container 18a is converted into radicals by a radical generator using thermal energy, resulting in radical sulfur molecular beams 18.
get c.
ここで、硫黄分子線の原料に硫化水素ガスを用いる理由
は、単体の硫黄(固体)は室温でもかなり高い蒸気圧を
有するため、高真空を得るのに不可欠な真空容器11の
加熱脱ガス処理の過程で蒸発してしまうので実用的でな
いからである。Here, the reason why hydrogen sulfide gas is used as the raw material for the sulfur molecular beam is that elemental sulfur (solid) has a fairly high vapor pressure even at room temperature, so the heating and degassing treatment of the vacuum vessel 11 is essential for obtaining a high vacuum. This is because it evaporates during the process, making it impractical.
実際の薄膜成長は次のような手順で行なう。まず表面を
清浄にした基板14を基板ホルダー13に装着する。基
板材料としては立方晶系硫化カドミウム亜鉛のとり得る
格子定数に近い格子定数をもつガリウム砒素、ガリウム
燐、インジウム燐などの単結晶が好適であった。次に真
空容器11を10’Tott以下程度の以下具空まで排
気する。その後ルツボ16および17を例えば400℃
程度に加熱し、適切な強度のカドミウム分子線16cお
よび亜鉛分子線17cが得られるようにする。Actual thin film growth is performed in the following steps. First, the substrate 14 whose surface has been cleaned is mounted on the substrate holder 13. As the substrate material, single crystals such as gallium arsenide, gallium phosphide, and indium phosphide, which have lattice constants close to those of cubic cadmium zinc sulfide, have been preferred. Next, the vacuum container 11 is evacuated to about 10'Tott or less. Thereafter, the crucibles 16 and 17 are heated to, for example, 400°C.
The cadmium molecular beam 16c and the zinc molecular beam 17c are heated to a certain degree so as to obtain a cadmium molecular beam 16c and a zinc molecular beam 17c of appropriate strength.
また流量調節弁18dを開いてラジカル発生装置に硫化
水素ガスを流し、適切な強度のラジカル硫黄分子線18
cが得られるようにする。ラジカル発生装置の温度は、
700℃以上であれば硫化水素ガスをほぼ完全にラジカ
ル化することができた。In addition, the flow rate control valve 18d is opened to allow hydrogen sulfide gas to flow into the radical generator, and the radical sulfur molecular beam 18 has an appropriate strength.
so that c can be obtained. The temperature of the radical generator is
At 700°C or higher, hydrogen sulfide gas could be almost completely radicalized.
次に基板14を約600℃に加熱して表面を更に清浄化
する。その後基板を結晶成長に適切な温度まで下げる。Next, the substrate 14 is heated to about 600° C. to further clean the surface. The substrate is then lowered to a temperature suitable for crystal growth.
この場合には例えば300℃とする。In this case, the temperature is, for example, 300°C.
この後シャッター16b、17b、18bを同時に開き
、結晶成長を行なう。After this, the shutters 16b, 17b, and 18b are opened simultaneously to perform crystal growth.
以上のような方法で形成した立方晶系硫化カドミウム亜
鉛混晶薄膜は、ラジカルを用いたこ七により硫黄分子線
の反応性が高くなり、硫黄の取り込まれ率が高くなった
。その結果供給する硫化水素のガス量が少なくて済むた
め、膜中に取り込まれる不純物の量が抑えられ、アンド
ープ試料のキャリア密度が減少した。また、基板表面か
らの硫化カドミウム分子の脱離が抑えられるので、成長
時の基板温度を上昇させて、基板表面の原子のマイグレ
ーションが十分に行なわれる温度領域での結晶成長が可
能となり、格子欠陥が少なくなり、光学的特性において
は深い準位からの発光が減少し発光ピークの半値幅も狭
くなった。In the cubic cadmium zinc sulfide mixed crystal thin film formed by the method described above, the reactivity of sulfur molecular beams was increased due to the use of radicals, and the rate of sulfur incorporation was increased. As a result, the amount of hydrogen sulfide gas to be supplied was small, which suppressed the amount of impurities incorporated into the film and reduced the carrier density of the undoped sample. In addition, since the desorption of cadmium sulfide molecules from the substrate surface is suppressed, the substrate temperature during growth can be raised to allow crystal growth in a temperature range where sufficient migration of atoms on the substrate surface occurs, resulting in lattice defects. As for the optical properties, the emission from deep levels decreased and the half-value width of the emission peak became narrower.
なお、前記実施例ではカドミウム分子線の原料として金
属カドミウムを、亜鉛分子線の原料として金属亜鉛を用
いたが、この他ジメチルカドミウムやジエチルカドミウ
ム、ジメチル亜鉛やジエチル亜鉛などの、構成元素を含
む有機化合物ガスを用いても同様の効果が得られた。In the above example, metal cadmium was used as the raw material for the cadmium molecular beam, and metal zinc was used as the raw material for the zinc molecular beam. Similar effects were obtained using compound gas.
また、薄膜形成中の基板温度は200’C以上5oo’
c以下が好適であった。200 ’C未満では基板表面
原子のマイグレーションが十分に行われないので各原子
が正確な格子位置に安定せず、また500℃をこえる温
度では原子の再蒸発が過剰になり原子の空孔が生じるの
で、何れの場合も完全な結晶が得られなくなるためであ
る。Also, the substrate temperature during thin film formation is 200'C or more and 50'C.
C or less was suitable. At temperatures below 200'C, the migration of atoms on the substrate surface is not sufficient, so each atom is not stabilized at a precise lattice position, and at temperatures above 500'C, there is excessive re-evaporation of atoms, creating atomic vacancies. Therefore, perfect crystals cannot be obtained in either case.
以上説明した通り、本実施例は、硫化カドミウム亜鉛混
晶を構成する元素(硫黄、カドミウム、亜鉛)を個別に
供給し、また硫黄源として反応性の高いラジカル硫黄分
子線を用いることにより、硫黄の取り込まれ率を向上さ
せ、硫化カドミウムの脱離を抑えることにより、結晶の
純度的にも構造的にも品質の優れた立方晶系硫化カドミ
ウム亜鉛混晶薄膜を形成することができる。その結果、
高効率の青色発光素子の実現へとつながり、その実用的
効果は大きい。As explained above, in this example, the elements constituting the cadmium-zinc sulfide mixed crystal (sulfur, cadmium, zinc) are individually supplied, and a highly reactive radical sulfur molecular beam is used as the sulfur source. By improving the incorporation rate of cadmium sulfide and suppressing the desorption of cadmium sulfide, it is possible to form a cubic cadmium zinc sulfide mixed crystal thin film with excellent quality in terms of crystal purity and structure. the result,
This will lead to the realization of highly efficient blue light emitting devices, and its practical effects will be significant.
[発明の効果]
以上説明したように、真空中でラジカル硫黄分子線とカ
ドミウム分子線と亜鉛分子線を基板表面に照射して立方
晶系硫化カドミウム亜鉛混晶薄膜を得るという発明によ
れば、硫黄の取り込まれ率を向上させ、硫化カドミウム
の脱離を抑えることにより、結晶の純度的にも構造的に
も品質の優れた立方晶系硫化カドミウム亜鉛混晶薄膜を
形成することができる。[Effects of the Invention] As explained above, according to the invention in which a cubic cadmium zinc sulfide mixed crystal thin film is obtained by irradiating a substrate surface with a radical sulfur molecular beam, a cadmium molecular beam, and a zinc molecular beam in a vacuum, By improving the sulfur incorporation rate and suppressing the desorption of cadmium sulfide, it is possible to form a cubic cadmium zinc sulfide mixed crystal thin film with excellent quality in terms of crystal purity and structure.
第1図は本発明の第1の実施例における立方晶系硫化カ
ドミウム亜鉛混晶薄膜を作製する分子線エピタキシー装
置の構造を示す概略図、第2図は従来例で用いられる分
子線エピタキシー装置の構造を示す概略図である。
11・・・真空容器、12・・・超高真空排気装置、1
3・・・基板ホルダー、14・・・基板、15・・・硫
化カドミウム亜鉛混晶薄膜、16・・・カドミウム用ル
ツボ、16a・・・金属カドミウム、16b・・・シャ
ッター、16c・・・カドミウム分子線、17・・・亜
鉛用ルツボ、17a・・・金属亜鉛、17b・・・シャ
ッター、17c・・・亜鉛分子線、18・・・ラジカル
発生装置、1−8a・・・硫化水素ガス容器、18b・
・・シャッター、18C・・・ラジカル硫黄分子線、1
8d・・・ガス流量調節弁、21・・・真空容器、22
・・・超高真空排気装置、23・・・基板ホルダー、2
4・・・基板、25・・・硫化カドミウム亜鉛混晶薄膜
、26・・・硫化カドミウム用ルツボ、26a・・・硫
化カドミウム、26b・・・シャッター、26c・・・
硫化カドミウム分子線、27・・・硫化亜鉛用ルツボ、
27a・・・硫化亜鉛、27b・・・シャッター、27
c・・・硫化亜鉛分子線。
代理人の氏名 弁理士 池内寛幸 はか1名11・・・
真空容器
12・・・超高真空排気装置FIG. 1 is a schematic diagram showing the structure of a molecular beam epitaxy apparatus for producing a cubic cadmium zinc sulfide mixed crystal thin film in the first embodiment of the present invention, and FIG. 2 is a schematic diagram showing the structure of a molecular beam epitaxy apparatus used in a conventional example. It is a schematic diagram showing a structure. 11... Vacuum container, 12... Ultra-high vacuum exhaust device, 1
3... Substrate holder, 14... Substrate, 15... Cadmium zinc sulfide mixed crystal thin film, 16... Crucible for cadmium, 16a... Metal cadmium, 16b... Shutter, 16c... Cadmium Molecular beam, 17... Zinc crucible, 17a... Metal zinc, 17b... Shutter, 17c... Zinc molecular beam, 18... Radical generator, 1-8a... Hydrogen sulfide gas container , 18b・
...Shutter, 18C...Radical sulfur molecular beam, 1
8d... Gas flow rate control valve, 21... Vacuum container, 22
...Ultra-high vacuum exhaust system, 23...Substrate holder, 2
4... Substrate, 25... Cadmium zinc sulfide mixed crystal thin film, 26... Crucible for cadmium sulfide, 26a... Cadmium sulfide, 26b... Shutter, 26c...
Cadmium sulfide molecular beam, 27... crucible for zinc sulfide,
27a...Zinc sulfide, 27b...Shutter, 27
c...Zinc sulfide molecular beam. Name of agent: Patent attorney Hiroyuki Ikeuchi Haka 1 person 11...
Vacuum container 12...ultra-high vacuum exhaust device
Claims (3)
子線と亜鉛分子線とを照射して薄膜を製造する方法にお
いて、前記硫黄分子線として硫化水素を熱分解させて得
たラジカル硫黄分子線を用い、前記カドミウム分子線と
して金属カドミウムを加熱蒸発させるか有機カドミウム
化合物の気体を熱分解させるかして得た分子線を用い、
前記亜鉛分子線として金属亜鉛を加熱蒸発させるか有機
亜鉛化合物の気体を熱分解させるかして得た分子線を用
いたことを特徴とする立方晶系硫化カドミウム亜鉛混晶
薄膜の製造方法。(1) In a method of manufacturing a thin film by irradiating a substrate surface with a sulfur molecular beam, a cadmium molecular beam, and a zinc molecular beam in a vacuum, the sulfur molecular beam is a radical sulfur molecule obtained by thermally decomposing hydrogen sulfide. using a molecular beam obtained by heating and evaporating metal cadmium or thermally decomposing a gas of an organic cadmium compound as the cadmium molecular beam,
A method for producing a cubic cadmium zinc sulfide mixed crystal thin film, characterized in that the zinc molecular beam is a molecular beam obtained by heating and evaporating metallic zinc or thermally decomposing a gas of an organic zinc compound.
ム燐のうちいずれかの単結晶を用いた請求項1記載の立
方晶系硫化カドミウム亜鉛混晶薄膜の製造方法。(2) The method for producing a cubic cadmium zinc sulfide mixed crystal thin film according to claim 1, wherein a single crystal of gallium arsenide, gallium phosphorus, or indium phosphorus is used as the substrate.
項1または2記載の立方晶系硫化カドミウム亜鉛混晶薄
膜の製造方法。(3) The method for producing a cubic cadmium zinc sulfide mixed crystal thin film according to claim 1 or 2, wherein the substrate temperature is 200°C or more and 500°C or less.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2335904A JPH04202098A (en) | 1990-11-29 | 1990-11-29 | Method for producing cubic cadmium zinc sulfide mixed crystal thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2335904A JPH04202098A (en) | 1990-11-29 | 1990-11-29 | Method for producing cubic cadmium zinc sulfide mixed crystal thin film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04202098A true JPH04202098A (en) | 1992-07-22 |
Family
ID=18293672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2335904A Pending JPH04202098A (en) | 1990-11-29 | 1990-11-29 | Method for producing cubic cadmium zinc sulfide mixed crystal thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04202098A (en) |
-
1990
- 1990-11-29 JP JP2335904A patent/JPH04202098A/en active Pending
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