JPH0421329B2 - - Google Patents

Info

Publication number
JPH0421329B2
JPH0421329B2 JP59217891A JP21789184A JPH0421329B2 JP H0421329 B2 JPH0421329 B2 JP H0421329B2 JP 59217891 A JP59217891 A JP 59217891A JP 21789184 A JP21789184 A JP 21789184A JP H0421329 B2 JPH0421329 B2 JP H0421329B2
Authority
JP
Japan
Prior art keywords
voltage
capacitors
temperature
leakage current
ceramic capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59217891A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6196475A (ja
Inventor
Takashi Tomaru
Taiji Yoshino
Akira Tsukada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiyo Yuden Co Ltd
Original Assignee
Taiyo Yuden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiyo Yuden Co Ltd filed Critical Taiyo Yuden Co Ltd
Priority to JP59217891A priority Critical patent/JPS6196475A/ja
Publication of JPS6196475A publication Critical patent/JPS6196475A/ja
Publication of JPH0421329B2 publication Critical patent/JPH0421329B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP59217891A 1984-10-17 1984-10-17 セラミックコンデンサのスクリ−ニング方法 Granted JPS6196475A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59217891A JPS6196475A (ja) 1984-10-17 1984-10-17 セラミックコンデンサのスクリ−ニング方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59217891A JPS6196475A (ja) 1984-10-17 1984-10-17 セラミックコンデンサのスクリ−ニング方法

Publications (2)

Publication Number Publication Date
JPS6196475A JPS6196475A (ja) 1986-05-15
JPH0421329B2 true JPH0421329B2 (fr) 1992-04-09

Family

ID=16711381

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59217891A Granted JPS6196475A (ja) 1984-10-17 1984-10-17 セラミックコンデンサのスクリ−ニング方法

Country Status (1)

Country Link
JP (1) JPS6196475A (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63188777A (ja) * 1987-01-30 1988-08-04 Elna Co Ltd 電子部品のスクリ−ニング方法
JP2969666B2 (ja) * 1989-08-22 1999-11-02 松下電器産業株式会社 積層セラミックコンデンサの製造方法
US5677634A (en) * 1995-11-16 1997-10-14 Electro Scientific Industries, Inc. Apparatus for stress testing capacitive components
JP3620636B2 (ja) 1998-11-25 2005-02-16 株式会社村田製作所 積層セラミックコンデンサの選別方法
JP4779976B2 (ja) * 2007-01-10 2011-09-28 Ｔｄｋ株式会社 電子部品の製造方法
JP4836909B2 (ja) * 2007-09-26 2011-12-14 古河電池株式会社 計測用端子
US10571415B2 (en) * 2016-08-02 2020-02-25 Rolls-Royce Corporation Methods and apparatuses for evaluating ceramic matrix composite components
JP7415322B2 (ja) * 2019-01-28 2024-01-17 ニデックアドバンステクノロジー株式会社 キャパシタ検査装置、及びキャパシタ検査方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS562672A (en) * 1979-06-20 1981-01-12 Shindengen Electric Mfg Co Ltd Schottky barrier diode
JPS56105621A (en) * 1980-01-25 1981-08-22 Mitsubishi Electric Corp Method of screening laminated ceramic condenser

Also Published As

Publication number Publication date
JPS6196475A (ja) 1986-05-15

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