JPH04220509A - 物体表面を無接触で測定する方法および装置 - Google Patents

物体表面を無接触で測定する方法および装置

Info

Publication number
JPH04220509A
JPH04220509A JP3043365A JP4336591A JPH04220509A JP H04220509 A JPH04220509 A JP H04220509A JP 3043365 A JP3043365 A JP 3043365A JP 4336591 A JP4336591 A JP 4336591A JP H04220509 A JPH04220509 A JP H04220509A
Authority
JP
Japan
Prior art keywords
camera
projectors
stripe
grating
stripe pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3043365A
Other languages
English (en)
Japanese (ja)
Inventor
Michael Kuchel
ミヒャエル　キューヒェル
Albrecht Hof
アルブレヒト　ホーフ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Carl Zeiss AG
Original Assignee
Carl Zeiss SMT GmbH
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH, Carl Zeiss AG filed Critical Carl Zeiss SMT GmbH
Publication of JPH04220509A publication Critical patent/JPH04220509A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP3043365A 1990-03-09 1991-03-08 物体表面を無接触で測定する方法および装置 Pending JPH04220509A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4007500.1 1990-03-09
DE4007500A DE4007500A1 (de) 1990-03-09 1990-03-09 Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen

Publications (1)

Publication Number Publication Date
JPH04220509A true JPH04220509A (ja) 1992-08-11

Family

ID=6401802

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3043365A Pending JPH04220509A (ja) 1990-03-09 1991-03-08 物体表面を無接触で測定する方法および装置

Country Status (4)

Country Link
US (1) US5135309A (de)
EP (1) EP0445618B1 (de)
JP (1) JPH04220509A (de)
DE (2) DE4007500A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002213931A (ja) * 2001-01-17 2002-07-31 Fuji Xerox Co Ltd ３次元形状計測装置および３次元形状計測方法
JP2006149871A (ja) * 2004-11-30 2006-06-15 Nidek Co Ltd 眼科測定装置

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US5343294A (en) * 1990-03-09 1994-08-30 Carl-Zeiss-Stiftung Method for analyzing periodic brightness patterns
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DE4217768A1 (de) * 1992-05-29 1993-12-02 Zeiss Carl Fa Verfahren und Vorrichtung zur Vermessung von Objekttopographien mittels projizierter Streifenmuster
DE4416108C2 (de) * 1994-05-06 2000-05-11 Fraunhofer Ges Forschung Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche
JP2919267B2 (ja) * 1994-05-26 1999-07-12 松下電工株式会社 形状検出方法およびその装置
US6028672A (en) * 1996-09-30 2000-02-22 Zheng J. Geng High speed three dimensional imaging method
DE19637682B4 (de) * 1996-09-05 2004-04-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Bestimmung der räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung und Vorrichtung zur Anwendung dieses Verfahrens
US5838428A (en) * 1997-02-28 1998-11-17 United States Of America As Represented By The Secretary Of The Navy System and method for high resolution range imaging with split light source and pattern mask
DE19749435B4 (de) * 1997-11-09 2005-06-02 Mähner, Bernward Verfahren und Vorrichtung zur dreidimensionalen, flächenhaften, optischen Vermessung von Objekten
DE19846145A1 (de) * 1998-10-01 2000-04-20 Klaus Koerner Verfahren und Anordung zur 3D-Aufnahme
GB9824986D0 (en) * 1998-11-13 1999-01-06 Isis Innovation Non-contact topographical analysis apparatus and method thereof
US6763133B1 (en) * 1999-05-29 2004-07-13 Sun Moon University Moire image capturing apparatus and method therefor
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
US6100990A (en) * 1999-06-14 2000-08-08 Ford Motor Company Method and apparatus for determining reflective optical quality using gray-scale patterns
US6856407B2 (en) 2000-09-13 2005-02-15 Nextengine, Inc. Method for depth detection in 3D imaging providing a depth measurement for each unitary group of pixels
US7358986B1 (en) 2000-09-13 2008-04-15 Nextengine, Inc. Digital imaging system having distribution controlled over a distributed network
US6639684B1 (en) 2000-09-13 2003-10-28 Nextengine, Inc. Digitizer using intensity gradient to image features of three-dimensional objects
AU9081001A (en) * 2000-09-13 2002-03-26 Nextengine Inc Imaging system monitored or controlled to ensure fidelity of file captured
US7233351B1 (en) 2001-02-23 2007-06-19 Nextengine, Inc. Method for high resolution incremental imaging
JP3519698B2 (ja) * 2001-04-20 2004-04-19 照明 與語 ３次元形状測定方法
DE10125971A1 (de) 2001-05-29 2002-12-05 Leica Mikroskopie Systeme Ag H Verfahren zur Entfernungsmessung ausgedehnter Objekte in Verbindung mit einer optischen Betrachtungseinrichtung und Mikroskop zur Durchführung desselben
DE10130902A1 (de) * 2001-06-27 2003-01-16 Zeiss Carl Interferometersystem, Verfahren zum Aufnehmen eines Interferogramms und Verfahren zum Bereitstellen und Herstellen eines Objekts mit einer Soll-Oberfläche
US6634552B2 (en) * 2001-09-26 2003-10-21 Nec Laboratories America, Inc. Three dimensional vision device and method, and structured light bar-code patterns for use in the same
WO2004083778A1 (en) * 2003-03-18 2004-09-30 Hermary Alexander Thomas Coded-light dual-view profile scanner
US7711179B2 (en) 2004-04-21 2010-05-04 Nextengine, Inc. Hand held portable three dimensional scanner
US20060045174A1 (en) * 2004-08-31 2006-03-02 Ittiam Systems (P) Ltd. Method and apparatus for synchronizing a transmitter clock of an analog modem to a remote clock
DE102004044695A1 (de) * 2004-09-15 2006-03-30 Sick Ag Verfahren und Vorrichtung zur Abstandsmessung
KR100612932B1 (ko) * 2005-12-14 2006-08-14 주식회사 고영테크놀러지 3차원 형상 측정장치 및 방법
US7830528B2 (en) 2005-12-14 2010-11-09 Koh Young Technology, Inc. 3D image measuring apparatus and method thereof
US7995834B1 (en) 2006-01-20 2011-08-09 Nextengine, Inc. Multiple laser scanner
US20080117438A1 (en) * 2006-11-16 2008-05-22 Solvision Inc. System and method for object inspection using relief determination
US20080156619A1 (en) 2006-12-01 2008-07-03 Mehul Patel Range finder
FR2910123B1 (fr) * 2006-12-19 2009-01-23 Phosylab Sarl Procede optico-informatique de mesure 3d de la surface exterieure d'un objet en relief par projection de franges et utilisation d'une methode a decalage de phase, systeme correspondant
EP2183546B1 (de) 2007-08-17 2015-10-21 Renishaw PLC Kontaktlose sonde
CN100455987C (zh) * 2007-08-23 2009-01-28 北京交通大学 利用合成波干涉全场纳米表面三维在线测量方法和系统
US7768656B2 (en) * 2007-08-28 2010-08-03 Artec Group, Inc. System and method for three-dimensional measurement of the shape of material objects
US8064068B2 (en) * 2008-01-25 2011-11-22 Cyberoptics Corporation Multi-source sensor for three-dimensional imaging using phased structured light
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
US7969583B2 (en) * 2008-03-05 2011-06-28 General Electric Company System and method to determine an object distance from a reference point to a point on the object surface
DE102008015499C5 (de) * 2008-03-25 2013-01-10 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Bestimmung der 3D-Koordinaten eines Objekts
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
EP2314200B1 (de) * 2009-10-21 2016-01-13 SIS AG, Surgical Instrument Systems Vorrichtung und Verfahren zum Vermessen einer Cornea
US8414124B2 (en) 2009-10-21 2013-04-09 Sis Ag, Surgical Instrument Systems Device and method for measuring a cornea
JP2014182028A (ja) * 2013-03-19 2014-09-29 Omron Corp 限定領域反射型光電センサ
EP2799810A1 (de) * 2013-04-30 2014-11-05 Aimess Services GmbH Vorrichtung und Verfahren zum simultanen dreidimensionalen Vermessen von Oberflächen mit mehreren Wellenlängen
WO2015105360A1 (ko) * 2014-01-10 2015-07-16 주식회사 고영테크놀러지 3차원 형상측정장치 및 방법
US10643343B2 (en) 2014-02-05 2020-05-05 Creaform Inc. Structured light matching of a set of curves from three cameras
EP3064893B1 (de) * 2015-03-05 2019-04-24 Leuze electronic GmbH + Co KG Optischer Sensor
EP3688407B1 (de) * 2017-09-27 2024-07-31 AMS Sensors Singapore Pte. Ltd. Lichtprojektionssysteme
CN110230994B (zh) * 2019-04-30 2020-08-14 浙江大学 像点溯源的物体光栅图像相移法相位测量误差校正方法

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002213931A (ja) * 2001-01-17 2002-07-31 Fuji Xerox Co Ltd ３次元形状計測装置および３次元形状計測方法
JP2006149871A (ja) * 2004-11-30 2006-06-15 Nidek Co Ltd 眼科測定装置

Also Published As

Publication number Publication date
EP0445618A2 (de) 1991-09-11
DE59104107D1 (de) 1995-02-16
EP0445618B1 (de) 1995-01-04
DE4007500A1 (de) 1991-09-12
EP0445618A3 (en) 1992-03-11
US5135309A (en) 1992-08-04

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