JPH0423722B2 - - Google Patents

Info

Publication number
JPH0423722B2
JPH0423722B2 JP59077215A JP7721584A JPH0423722B2 JP H0423722 B2 JPH0423722 B2 JP H0423722B2 JP 59077215 A JP59077215 A JP 59077215A JP 7721584 A JP7721584 A JP 7721584A JP H0423722 B2 JPH0423722 B2 JP H0423722B2
Authority
JP
Japan
Prior art keywords
voltage
scanning
light
metal lump
receiving element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59077215A
Other languages
Japanese (ja)
Other versions
JPS60220803A (en
Inventor
Heiji Kato
Hiroaki Kuwano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Original Assignee
Ishikawajima Harima Heavy Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishikawajima Harima Heavy Industries Co Ltd filed Critical Ishikawajima Harima Heavy Industries Co Ltd
Priority to JP59077215A priority Critical patent/JPS60220803A/en
Publication of JPS60220803A publication Critical patent/JPS60220803A/en
Publication of JPH0423722B2 publication Critical patent/JPH0423722B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、熱間圧延設備や連鋳設備等における
金属塊の幅方向位置検出方法及びその装置に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method and apparatus for detecting the position in the width direction of a metal ingot in hot rolling equipment, continuous casting equipment, etc.

〔従来の技術〕[Conventional technology]

圧延又は連鋳加工では、製品歩留りを向上する
うえで精密な板幅管理が望まれる。特に熱間圧延
の場合は、圧延機で水平圧下するために圧延材に
幅広がりが生じるが、これを放置したまま圧延を
繰返すと、製品板幅が設定値よりも極めて大きい
ものとなり、後工程のサイドトリミング等で切捨
てる部分が増大し、歩留りの低下を招来する。
In rolling or continuous casting processing, precise sheet width control is desired in order to improve product yield. In particular, in the case of hot rolling, the width of the rolled material widens due to the horizontal reduction in the rolling mill, but if rolling is repeated without this, the width of the product sheet will be much larger than the set value, and the later process The portion to be cut away due to side trimming, etc. increases, resulting in a decrease in yield.

一方、シングルスタンドにおけるリバース圧
延、連続スタンドにおける先後端部通過時等の無
張力圧延においては、蛇行が生じ易いため、圧延
材の蛇行量を検出して、左右のロールギヤツプの
調整を行う必要がある。ところが、従来の圧延荷
重差に基づいて蛇行を検出して制御する方式で
は、圧延材の端折れによる端部2枚噛みや先後端
の不規則形状部の圧延時に発生する圧延荷重差等
を蛇行現象と判断し、圧下レベル調整を狂わし、
かえつて圧延業を中断させる、等の致命的な欠陥
があつた。
On the other hand, meandering tends to occur in reverse rolling on a single stand and in tensionless rolling when passing the leading and trailing ends on a continuous stand, so it is necessary to detect the amount of meandering in the rolled material and adjust the left and right roll gaps. . However, with the conventional method of detecting and controlling meandering based on the difference in rolling load, it is possible to detect and control meandering based on the difference in rolling load that occurs when two pieces of the rolled material are bent due to end bending or when rolling irregularly shaped parts at the leading and trailing ends. It was determined that this was a phenomenon, and the reduction level adjustment was disrupted.
On the contrary, there were fatal flaws that caused the rolling industry to be disrupted.

そこで、最近では、熱間圧延材、連鋳材等の加
熱金属塊の板幅或いは蛇行等を高精度で制御する
ことが望まれ、その基になる板幅或いは蛇行等の
検出手段として光学的幅方向位置検出器が開発さ
れている。この装置は第1図に示す原理に基づい
ている。
Therefore, in recent years, it has become desirable to control the plate width or meandering of heated metal ingots such as hot-rolled materials and continuously cast materials with high precision, and optical methods are being used as a means of detecting the plate width or meandering, etc. A widthwise position detector has been developed. This device is based on the principle shown in FIG.

すなわち、圧延材1の下方から投光器2により
圧延材1を投光し、上方、つまり圧延材1の表面
方向部位に設けた受光器3によつて圧延材1に遮
蔽されない部分の受光量を測定し、板幅を検出す
るものである。受光器3には、光電素子(フオト
ダイオード)を利用したもの、テレビカメラ式撮
像管を利用したもの等があるが、以下、光電素子
を利用したものについて説明する。テレビカメラ
式撮像管を用いた場合も原理的には変らない。光
電素子5は投光器2と平行に、複数個、直線状に
配列し(個数単位として一般に「ビツト」を用い
る)、レンズ6を通して集光した像の受光量に比
例した電気的信号7を発する。この受光量を所定
の変換器により一定レベルでスレツシユホールド
することにより、電気信号をオン、オフ2種類の
同期信号8に変換する。1ビツト当りの集光距離
はレンズ6の集光角度2α(又は集光範囲L)及び
被測定物としての圧延材1とレンズ6との間の距
離Hによつて定まるので、全光電素子数をNビツ
トとすると、板幅Wは次式で求めることができ
る。
That is, the rolled material 1 is illuminated by a light emitter 2 from below the rolled material 1, and the amount of light received in the portion not shielded by the rolled material 1 is measured by the light receiver 3 provided above, that is, in the surface direction of the rolled material 1. This is to detect the board width. The light receiver 3 includes one using a photoelectric element (photodiode), one using a television camera type image pickup tube, etc., and the one using a photoelectric element will be explained below. The principle remains the same even when a television camera type image pickup tube is used. A plurality of photoelectric elements 5 are arranged in a straight line in parallel with the light projector 2 (a "bit" is generally used as a unit of number), and emit an electric signal 7 proportional to the amount of light received from an image focused through a lens 6. By thresholding the amount of received light at a constant level using a predetermined converter, the electric signal is converted into two types of synchronization signals 8: on and off. Since the focusing distance per 1 bit is determined by the focusing angle 2α (or focusing range L) of the lens 6 and the distance H between the rolled material 1 as the object to be measured and the lens 6, the total number of photoelectric elements is Assuming that W is N bits, the plate width W can be determined by the following formula.

W=L×{N−(N1+N2)}/N =2Htanα×{N−(N1+N2)}/N
……() 而して、このような板幅検出手段を圧延材等の
蛇行検出に適用することも考えられ、既に一部で
は実施されているが、特に熱間圧延では圧延材自
体が800℃前後の高温であるため、第1図に示す
投光器2を廃して圧延材自体の光を検知する方式
が有効である。この場合の原理を第2図により説
明すると、圧延材1の左右両側、すなわち、ワー
クサイドとドライブサイドの夫々に受光器9,1
0を設け、該受光器9,10により圧延材1の光
を検知するようにする。検知時には、受光素子1
1,12の各ビツトごとに集光が行われ、各ビツ
トごとに集光された光の強さに比例する電圧が発
生する。例えば、受光素子11で検出された電圧
と受光素子11の各ビツトとの関係を図示すると
第3図に示すようになり、電圧差が発生し始めた
位置が圧延材1のワークサイド側端部として検知
される。なお、第3図を映像信号と称する。第3
図において、tsは夫々の受光素子11,12の全
ビツトの走査に要する走査周期、Vは圧延材幅端
光量差を表わす電圧である。
W=L×{N-(N 1 +N 2 )}/N = 2Htanα×{N-(N 1 +N 2 )}/N
...() Therefore, it is possible to apply such a strip width detection means to detect meandering in rolled materials, etc., and this has already been done in some cases, but especially in hot rolling, when the rolled material itself Since the temperature is around .degree. C., it is effective to eliminate the light projector 2 shown in FIG. 1 and detect the light from the rolled material itself. The principle in this case will be explained with reference to FIG.
0 is provided, and the light from the rolled material 1 is detected by the light receivers 9 and 10. At the time of detection, the light receiving element 1
Light is focused for each of the 1st and 12th bits, and a voltage proportional to the intensity of the focused light is generated for each bit. For example, the relationship between the voltage detected by the light receiving element 11 and each bit of the light receiving element 11 is shown in FIG. Detected as . Note that FIG. 3 is referred to as a video signal. Third
In the figure, ts is the scanning period required to scan all the bits of the respective light receiving elements 11 and 12, and V is the voltage representing the difference in light amount at the width end of the rolled material.

ところで、一般的には圧延材の種類によつて温
度が異なるため、第2図に示す受光器9,10へ
入る光量に温度による差が生じる。すなわち、温
度の高い圧延材で走査周期tsを大きくすると、受
光素子11,12への入光時間が長くなり、圧延
材から発せられるローラーテーブル等に反射した
弱い光も多量に受光素子11,12に受光される
結果、第4図のイに示すように、電圧Vが圧延材
1から離れた位置で急激に立上り、幅端部の検出
精度が悪化する。又逆に走査周期tsが短かすぎる
と、受光素子11,12の各ビツトへの入光時間
が短くなり、光が十分に受光素子11,12に受
光されない結果、第4図のロに示すように電圧V
のレベルが低下し、板幅端部検出の信号が基準と
なるスレツシユレベル電圧VLに達せず、検出が
不可能となる虞れがある。従つて、走査周期ts
自動的にコントロールし、受光素子11,12に
受光される光量を常に一定に保持し、電圧Vを第
4図のハに示すように調節することが必要とな
る。
Incidentally, since the temperature generally varies depending on the type of rolled material, a difference occurs in the amount of light entering the light receivers 9 and 10 shown in FIG. 2 depending on the temperature. That is, when the scanning period t s is increased for a hot rolled material, the time for light to enter the light receiving elements 11 and 12 becomes longer, and a large amount of weak light emitted from the rolled material and reflected on the roller table etc. is also transmitted to the light receiving elements 11 and 12. As a result, as shown in FIG. 4A, the voltage V suddenly rises at a position away from the rolled material 1, and the detection accuracy at the width end portion deteriorates. On the other hand, if the scanning period ts is too short, the time for light to enter each bit of the light receiving elements 11 and 12 will be shortened, and as a result, the light will not be sufficiently received by the light receiving elements 11 and 12, resulting in the problem shown in FIG. The voltage V as shown
There is a possibility that the level of the plate width end detection signal will not reach the reference threshold level voltage VL , and detection will become impossible. Therefore, it is necessary to automatically control the scanning period ts , to keep the amount of light received by the light receiving elements 11 and 12 constant, and to adjust the voltage V as shown in Fig. 4C. .

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は、高温の金属塊の幅方向位置を検出す
る際に、走査周期を金属塊の温度に対応した最適
な時間になるようにし、金属塊の幅方向位置を正
確に検出することにより上述の問題点を解決すべ
くなしたものである。
According to the present invention, when detecting the widthwise position of a hot metal lump, the scanning period is set to an optimal time corresponding to the temperature of the metal lump, and the widthwise position of the metal lump is accurately detected. This was done to solve the problem.

〔問題点を解決するための手段〕[Means for solving problems]

本発明においては加熱された金属塊の発する光
を受光する受光素子群とレンズより構成され、該
受光素子の金属塊の幅方向へ走査し得るようにし
た検出手段と、該検出手段で検出された金属塊の
映像信号電圧と予め設定されたレベルの電圧とを
比較し、映像信号電圧が設定されたレベルの電圧
以上になつたら信号を出力する比較手段と、該比
較手段よりの信号を受けたらそのときの前記検出
手段の受光素子の番地を記憶する記憶手段と、該
記憶手段から送られて来た番地と前記設定された
レベルの電圧の発生する受光素子の番地の近傍の
番地との差を求める減算手段と、該減算手段で求
められた受光素子の番地の差と走査開始によりカ
ウントされるクロツクパルスのカウント数とを比
較してクロツクパルスのカウント数が減算手段か
ら送られて来た受光素子の番地の差より大きくな
つたら所定のスイツチを閉じる指令を与える比較
手段と、該スイツチが閉じた際にホールドされた
映像信号電圧に対応した速度で金属塊を幅方向に
走査し映像信号の1ビツトごとに信号電圧の差を
演算する手段を設けている。
In the present invention, the light receiving element is composed of a group of light receiving elements that receive light emitted from a heated metal lump and a lens, and the light receiving element is configured to scan in the width direction of the metal lump, and the detection means detects the light emitted by the detection means. a comparison means for comparing the video signal voltage of the metal block and a voltage at a preset level and outputting a signal when the video signal voltage exceeds the voltage at the set level; and a comparison means for receiving the signal from the comparison means. storage means for storing the address of the light-receiving element of the detection means at that time, the address sent from the storage means and an address near the address of the light-receiving element where the voltage of the set level is generated; A subtraction means for calculating the difference compares the difference between the address of the light receiving element obtained by the subtraction means and the count number of clock pulses counted at the start of scanning, and the count number of clock pulses is determined by the received light sent from the subtraction means. Comparing means gives a command to close a predetermined switch when the difference in address of the element becomes larger than the difference, and when the switch is closed, the metal block is scanned in the width direction at a speed corresponding to the video signal voltage held. Means for calculating the difference in signal voltage for each bit is provided.

従つて前記検出器により金属塊を幅方向へ走査
し、該走査により得られた映像信号の略中間レベ
ルの電圧を発生する受光素子の近傍の受光素子が
受けている光量から走査周期を決定し、該決定さ
れた走査周期により金属塊を幅方向へ走査して映
像信号の1ビツトごとに電圧差を演算し、最大の
電圧差が得られた位置を求め、その位置の金属塊
の幅端位置とすることができる。
Therefore, the metal block is scanned in the width direction by the detector, and the scanning period is determined from the amount of light received by a light receiving element near the light receiving element that generates a voltage approximately at the intermediate level of the video signal obtained by the scanning. , the metal block is scanned in the width direction according to the determined scanning period, the voltage difference is calculated for each bit of the video signal, the position where the maximum voltage difference is obtained is found, and the width end of the metal block at that position is calculated. It can be the location.

〔実施例〕〔Example〕

以下、本発明の実施例を図面を参照しつつ説明
する。
Embodiments of the present invention will be described below with reference to the drawings.

先ず、走査時間(走査周期)の決め方について
第5図イ,ロ、第6図イ,ロにより説明すると、
素子数Nビツトの検出器で所定の走査時間により
圧延材の幅方向へ向けて走査を行い、圧延材の幅
方向位置を検出した場合に、スレツシユレベル電
圧VLの信号が得られた素子番地をNC番地とする
と、それよりもNT番地手前の電圧VTを検出し、
この電圧VTの大きさから走査時間を決定する。
例えば、第5図イのような光量の少ない映像信号
の場合板端での信号は減衰し、第5図ロに示すよ
うにNT番地手前の電圧VTは低くなるので、走査
時間を長くし、第6図イのような光量の多い映像
信号の場合、板端での信号の立ち上がりは急峻
で、第6図ロに示すようにNT番地手前の電圧VT
は高くなるので走査時間を短くする。
First, how to determine the scanning time (scanning period) will be explained with reference to Fig. 5 A and B and Fig. 6 A and B.
An element from which a signal of threshold level voltage V L is obtained when the widthwise position of the rolled material is detected by scanning in the width direction of the rolled material for a predetermined scanning time with a detector having N bits of elements. If the address is N C address, detect the voltage V T at N T address before it,
The scanning time is determined from the magnitude of this voltage V T .
For example, in the case of a video signal with a small amount of light as shown in Figure 5 (a), the signal at the edge of the plate is attenuated, and as shown in Figure 5 (b), the voltage V T before address N T becomes low, so the scanning time is lengthened. However, in the case of a video signal with a large amount of light as shown in Figure 6A, the rise of the signal at the edge of the board is steep, and as shown in Figure 6B, the voltage V T before the N T address increases.
is high, so shorten the scanning time.

次に、圧延材の幅方向位置の演算タイミングを
金属塊中央より幅端方向へ走査する場合について
第7図により説明する。検出開発点Aから最初の
1走査周期目においては、スレツシユレベル電圧
VLの得られたNC番地の検出を行ない、2走査周
期目においては、1走査周期目のNC番地よりNT
番地手前の電圧VTをサンプルホールドすると共
に2走査周期目のスレツシユレベル電圧VLの得
られたNC番地を再記憶し、3走査周期目は2走
査周期目で得られたNT番地の電圧VTに対応する
よう検出器がコントロールされ、圧延材の幅端位
置が演算されてその結果Bが出力され、4走査周
期目は、2走査周期目のNC番地よりNT番地手前
の電圧VTをサンプルホールドすると共に4走査
周期目のスレツシユレベル電圧VLの得られたNC
番地を再記憶し、5走査周期目は4走査周期目で
得られたNT番地の電圧VTに対応するよう検出器
がコントロールされ、圧延材の幅端位置が演算さ
れてその結果Bが出力され、以下同様に偶数番地
目では、その前の走査周期目のNC番地よりNT
地手前の電圧VTをサンプルホールドすると共に
当該走査周期目のスレツシユレベル電圧VLの得
られたNC番地を再記憶し、奇数走査周期目では
前の走査周期目で得られたNT番地の電圧VTに対
応するよう検出器がコントロールされ、圧延材の
幅端位置が演算されてその結果が出力される。金
属塊板端方向から中央へ走査する場合には、1走
査周期目でNC、VTを同時に求めることができる
ので、2走査周期目に演算結果Bが出力される。
Next, the case where the calculation timing of the width direction position of the rolled material is scanned from the center of the metal mass toward the width end direction will be explained with reference to FIG. In the first scanning cycle from detection development point A, the threshold level voltage
The obtained N C address of V L is detected, and in the second scanning period, from the N C address of the first scanning period, N T
At the same time as sampling and holding the voltage V T before the address, the N C address obtained from the threshold level voltage V L in the second scanning period is stored again, and in the third scanning period, the N T address obtained in the second scanning period is stored. The detector is controlled to correspond to the voltage V T of the rolled material, the width end position of the rolled material is calculated, and the result B is output. In the 4th scanning cycle, the position is N T before the N C address in the 2nd scanning cycle. At the same time, sample and hold the voltage V T of N C
The address is memorized again, and in the 5th scanning cycle, the detector is controlled to correspond to the voltage V T at address N T obtained in the 4th scanning cycle, and the width end position of the rolled material is calculated, and the result B is Similarly, at even-numbered addresses, the voltage V T at the N T address before the N C address in the previous scanning cycle is sampled and held, and the threshold level voltage V L in the corresponding scanning cycle is obtained. The N C address is memorized again, and in the odd scanning cycle, the detector is controlled so as to correspond to the voltage V T at the N T address obtained in the previous scanning cycle, and the width end position of the rolled material is calculated. The result will be output. When scanning from the end direction of the metal lump plate to the center, N C and V T can be obtained simultaneously in the first scanning period, so the calculation result B is output in the second scanning period.

次に、圧延材の幅端位置の演算の仕方について
第8図により説明すると、受光素子の1ビツトご
とに映像信号の電圧差を演算して行き、最大の電
圧差が得られたところの番地に圧延材の幅端部が
あるとする。すなわち、1番地手前の受光素子で
得られた映像信号の電圧をVi、現在の番地の受光
素子で得られた映像信号の電圧をVi+1とすると、
電圧差ΔVi+1=Vi+1−Viを順次演算し、この電圧
差ΔVi+1が最大の受光素子の番地NEを幅端とす
る。この場合の走査方向は圧延材の中央側から幅
端側へ行つても良いし、或いは幅端側から中央側
へ行つても良い。
Next, to explain how to calculate the width end position of the rolled material using Fig. 8, the voltage difference of the video signal is calculated for each bit of the light receiving element, and the address where the maximum voltage difference is obtained is calculated. Assume that there is a width end of the rolled material at . That is, if the voltage of the video signal obtained by the light-receiving element before address 1 is V i and the voltage of the video signal obtained by the light-receiving element at the current address is V i +1 , then
The voltage difference ΔV i+1 =V i+1 −V i is calculated in sequence, and the address N E of the light-receiving element with the largest voltage difference ΔV i+1 is set as the width end. The scanning direction in this case may be from the center side to the width end side of the rolled material, or may be from the width end side to the center side.

次に、本発明において圧延材幅端部の走査周期
を決定する具体例を第9図により説明する。
Next, a specific example of determining the scanning period of the width end portion of a rolled material in the present invention will be explained with reference to FIG.

図中21は図示してない検出器で検出された圧
延材映像信号電圧Vと設定されたスレツシユレベ
ル電圧VLとを比較し、V≧VLの場合に信号を出
力する比較器、22は比較器21からの信号によ
りその時のクロツクパルスのカウント数NC(NC
番地)を記憶する記憶回路、23は検出器からの
イネーブル信号VIにより記憶回路22に記憶さ
れているクロツクパルスのカウント数NCが移行
され記憶される記憶回路、24は記憶回路23か
らのクロツクパルスのカウント数NCと設定器2
5で設定されたカウント数NTを減算する減算回
路、26は減算回路24から送られて来たNC
地よりNT番地手前のカウント数NC−NTとカウン
タ27から送られて来たカウント数とを比較しカ
ウンタ27でのカウント数がカウント数NC−NT
より大きくなつたときに信号を出力し得るように
した比較器、28は比較器26よりの指令信号に
より閉じるスイツチ、29はスイツチ28が閉じ
たらそのときの圧延材映像信号の電圧VTをホー
ルドするサンプルホールド回路、30はゲイン、
31は電圧信号をそれに対応する周波数のパルス
に変換するV/F変換回路、32は31の出力パ
ルスをカウントするカウンタ、33はスタートパ
ルス発生回路である。
In the figure, 21 is a comparator that compares the rolled material video signal voltage V detected by a detector (not shown) with a set threshold level voltage V L and outputs a signal when V≧V L ; is the clock pulse count number N C (N C
23 is a memory circuit for storing the clock pulse count N C stored in the memory circuit 22 by the enable signal V I from the detector, and 24 is a memory circuit for storing the clock pulse count from the memory circuit 23. Count number N C and setting device 2
A subtraction circuit 26 subtracts the count number N T set in step 5, and a subtraction circuit 26 subtracts the count number N C −N T before the N T address from the N C address sent from the subtraction circuit 24 and the count number N C −NT sent from the counter 27. The count number at counter 27 is compared with the count number N C − N T
A comparator capable of outputting a signal when the signal becomes larger, 28 is a switch that closes in response to a command signal from the comparator 26, and 29 holds the voltage V T of the rolled material video signal at that time when the switch 28 is closed. sample hold circuit, 30 is gain,
31 is a V/F conversion circuit that converts a voltage signal into a pulse of a corresponding frequency; 32 is a counter that counts the output pulses of 31; and 33 is a start pulse generation circuit.

スタートパルスにより全てのカウンタ27,3
2はクリアされ、同時に初期電圧VOに対応する
周波数のクロツクパルスのカウントがカウンタ3
2により開始される。又、圧延材の発する光によ
つて検出器の受光素子に生ずる映像信号電圧Vを
各ビツトごとに比較器21に出力し、該比較器で
V′−VLが比較、演算される。而して、V≧VL
なつた時に、比較器21から記憶回路22に信号
が出力され、そのときのクロツクパルスのカウン
ト数NCが記憶回路22に記憶される。
All counters 27 and 3 are activated by the start pulse.
2 is cleared, and at the same time the count of clock pulses with a frequency corresponding to the initial voltage V O is counted by counter 3.
Started by 2. Further, the video signal voltage V generated in the light receiving element of the detector by the light emitted by the rolled material is outputted to the comparator 21 for each bit, and the comparator
V′−V L is compared and calculated. When V≧V L , a signal is output from the comparator 21 to the memory circuit 22, and the count number N C of clock pulses at that time is stored in the memory circuit 22.

検出器からイネーブル信号が発生すると、カウ
ント数NCは記憶回路23に移行されると共に減
算回路24でNC−NTが演算され、サンプルホー
ルド回路29が待機の状態になる。
When an enable signal is generated from the detector, the count number N C is transferred to the storage circuit 23, and at the same time, N C -N T is calculated in the subtraction circuit 24, and the sample and hold circuit 29 goes into a standby state.

クロツクパルスが検出器の受光素子の数だけ数
え終つたら再度スタートパルスが発生し、クロツ
クパルスのカウント数が比較器26でNC−NT
比較され、クロツクパルスのカウント数がNC
NTより大きくなると、比較器26からの出力信
号がスイツチ28を閉じ、そのときの映像信号の
電圧VTがスレツシユレベル電圧VLに対応する受
光素子のNC番地よりNT番地手前の映像信号とし
てサンプルホールド回路29に保持される。又同
時にこの走査周期におけるスレツシユレベル電圧
VLに対応するカウント数NCが前述と同様にして
求められ、記憶回路22に記憶される。
When the clock pulse has finished counting the number of light-receiving elements of the detector, a start pulse is generated again, and the comparator 26 compares the clock pulse count with N C -NT , and the clock pulse count becomes N C -.
When it becomes larger than N T , the output signal from the comparator 26 closes the switch 28, and the voltage V T of the video signal at that time is at the address N T before the address N C of the light receiving element corresponding to the threshold level voltage V L. It is held in the sample hold circuit 29 as a video signal. At the same time, the threshold level voltage in this scanning period
The count number N C corresponding to V L is obtained in the same manner as described above and stored in the storage circuit 22.

更に、検出器からイネーブル信号VIが発生し、
再度スサートパルスが発生し、切り替えスイツチ
40が切り替わつて電圧VTに対応する周波数の
クロツクパルスのカウントが開始される。
Furthermore, an enable signal V I is generated from the detector,
The assert pulse is generated again, the selector switch 40 is switched, and counting of clock pulses at a frequency corresponding to the voltage V T is started.

以下上記のシーケンスが繰返されて走査周期が
圧延材の明るさに対応して最適になるようコント
ロールされる。なお、VLの値は調整によつて適
宜変更できることは言うまでもない。
Thereafter, the above sequence is repeated and the scanning period is controlled to be optimal in accordance with the brightness of the rolled material. Note that it goes without saying that the value of V L can be changed as appropriate by adjustment.

次に、圧延材幅端部を検出する具体例について
第10図により説明する。
Next, a specific example of detecting the width end portion of a rolled material will be described with reference to FIG.

図中34は圧延材幅端部を求める場合に、クロ
ツクパルスCの1パルスごとに、現在の番地の受
光素子で得られた映像信号の電圧Vi+1とシフトレ
ジスタ35から送られて来た1番地手前の受光素
子で得られた映像信号の電圧Viとを比較、演算す
る比較器、39は比較器35から送られて来た電
圧差ΔVi+1=Vi-1−Viと、シフトレジスタ37か
ら送られて来た一時点前の電圧差ΔViとを比較、
演算する比較器、38はΔVi+1>ΔViの場合にそ
のときまでにカウンタ39でカウントされたクロ
ツクパルス数NE(受光素子の番地NE)を記憶す
る記憶回路である。
In the figure, 34 indicates the voltage V i+1 of the video signal obtained from the light receiving element at the current address and the signal sent from the shift register 35 for each pulse of the clock pulse C when determining the width end of the rolled material. A comparator 39 compares and calculates the voltage V i of the video signal obtained from the light-receiving element in front of address 1, the voltage difference ΔV i+1 = V i-1 − V i sent from the comparator 35. and the voltage difference ΔV i sent from the shift register 37 at a point before,
The comparator 38 for calculation is a storage circuit that stores the number of clock pulses N E (address N E of the light receiving element) counted by the counter 39 up to that time when ΔV i+1 >ΔV i .

圧延材映像信号の電圧Vi+1及びシフトレジスタ
35に記憶されていた1番地手前の映像信号の電
圧Viが比較器34に送られてクロツクパルスCの
1パルスごとに比較器34でVi+1とViとの差が比
較、演算され、電圧差ΔVi+1が比較器34から出
力される。又シフトレジスタ35にはクロツクパ
ルスCの1パルスごとに映像信号の値が更改され
る。
The voltage V i+1 of the rolled material video signal and the voltage V i of the video signal at the previous address stored in the shift register 35 are sent to the comparator 34, and the comparator 34 converts the voltage V i for each pulse of the clock pulse C. The difference between +1 and Vi is compared and calculated, and the voltage difference ΔV i+1 is output from the comparator 34. Further, the value of the video signal in the shift register 35 is updated every pulse of the clock pulse C.

比較器34から出力された電圧差ΔVi+1は1時
点前の電圧差ΔViと比較器38で比較、演算さ
れ、ΔVi+1>ΔViのとき、そのときまでにカウン
タ39でカウントされたクロツクパルス数NE
記憶回路38に記憶される。このクロツクパルス
数NEが圧延材幅端位置となる。又シフトレジス
タ37にはクロツクパルスCの1パルスごとに電
圧差の値が更改される。
The voltage difference ΔV i+1 outputted from the comparator 34 is compared and calculated with the voltage difference ΔV i one time before in the comparator 38, and when ΔV i+1 > ΔV i , the counter 39 counts by then. The number of clock pulses N E obtained is stored in the memory circuit 38. This clock pulse number N E becomes the width end position of the rolled material. Further, the value of the voltage difference in the shift register 37 is updated every pulse of the clock pulse C.

なお、本発明の実施例においては、圧延材幅端
部の位置を検出する場合について説明したが、圧
延材に限らず高温の金属塊ならいかなる金属塊に
対しても適用可能なこと、コンピユータによるソ
フトウエアにより構成することもできるし或いは
電子回路等のハードウエアで構成することもでき
ること、その他、本発明の要旨を逸脱しない範囲
内で種々変更を加え得ること、等は勿論である。
In the embodiments of the present invention, a case has been described in which the position of the width end of a rolled material is detected, but it is applicable not only to rolled materials but also to any high-temperature metal ingot. It goes without saying that it can be configured by software or by hardware such as an electronic circuit, and that various other changes can be made without departing from the gist of the present invention.

〔発明の効果〕〔Effect of the invention〕

本発明の金属塊の幅方向位置検出方法及びその
装置によれば、圧延材板端の適正な映像信号を得
ることが可能になると共に金属塊の幅端部位置を
精度良く検出することができる。
According to the method and device for detecting the widthwise position of a metal lump of the present invention, it is possible to obtain an appropriate video signal of the edge of a rolled material plate, and it is also possible to accurately detect the width end position of a metal lump. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は金属塊等の材料の幅方向位置を検出す
る原理の説明図、第2図は加熱された金属塊の幅
方向位置を検出する原理の説明図、第3図は第2
図で示す幅方向位置検出の場合に幅端部に生じる
光量差を表わす信号と走査時間との関係を示すグ
ラフ、第4図は加熱された金属塊の幅端部を検出
する場合に走査時間の変更による出力信号の変化
を示す説明図、第5図イは光量が少ない場合の本
発明における映像信号の説明図、第5図ロは第5
図イの映像信号の場合にサンプルホールドされる
所定の番地の信号電圧の説明図、第6図イは光量
が多い場合の本発明における映像信号の説明図、
第6図ロは第6図イの映像信号の場合にサンプル
ホールドされる所定の番地の信号電圧の説明図、
第7図は本発明において金属塊の走査を行う場合
の演算タイミングの一例の説明図、第8図は本発
明において金属塊の幅端位置を検出する原理の説
明図、第9図は本発明で走査周期を求める場合の
手段を具体化した一実施例の説明図、第10図は
本発明で金属塊の幅端位置を演算する際に信号電
圧差が最大になる番地を求める手段を具体化した
一実施例の説明図である。 図中21は比較器、22,23は記憶回路、2
4は減算回路、26は比較器、27はカウンタ、
28はスイツチ、29はサンプルホールド回路、
31はV/F変換回路、32はカウンタ、33は
スタートパルス発生回路、34は比較器、35は
シフトレジスタ、36は比較器、37はシフトレ
ジスタ、38は記憶回路、39はカウンタを示
す。
Fig. 1 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump, Fig. 2 is an explanatory diagram of the principle of detecting the widthwise position of a heated metal lump, and Fig. 3 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump.
The graph shown in the figure shows the relationship between the signal representing the difference in light amount that occurs at the width edge and the scanning time in the case of width direction position detection. 5A is an explanatory diagram showing the change in the output signal due to a change in the amount of light. FIG.
An explanatory diagram of the signal voltage at a predetermined address that is sampled and held in the case of the video signal in Figure A, Figure 6A is an explanatory diagram of the video signal in the present invention when the amount of light is large,
FIG. 6B is an explanatory diagram of the signal voltage at a predetermined address sampled and held in the case of the video signal of FIG. 6B,
Fig. 7 is an explanatory diagram of an example of calculation timing when scanning a metal lump according to the present invention, Fig. 8 is an explanatory diagram of the principle of detecting the width end position of a metal lump according to the present invention, and Fig. 9 is an explanatory diagram of the principle of detecting the width end position of a metal lump according to the present invention. FIG. 10 is an explanatory diagram of an embodiment embodying the means for determining the scanning period in the present invention, and FIG. FIG. In the figure, 21 is a comparator, 22 and 23 are storage circuits, and 2
4 is a subtraction circuit, 26 is a comparator, 27 is a counter,
28 is a switch, 29 is a sample hold circuit,
31 is a V/F conversion circuit, 32 is a counter, 33 is a start pulse generation circuit, 34 is a comparator, 35 is a shift register, 36 is a comparator, 37 is a shift register, 38 is a storage circuit, and 39 is a counter.

Claims (1)

【特許請求の範囲】 1 加熱された金属塊の発する光を受光する受光
素子群とレンズとより構成された検出器により金
属塊幅端位置を検出する際に、受光素子を金属塊
の幅方向へ走査し、該走査により得られた映像信
号中、予め設定されたレベルの電圧を発生する受
光素子近傍の受光素子が受けている光量から走査
周期を決定し、該決定された走査周期により金属
塊を幅方向へ走査して映像信号の1ビツトごとに
電圧差を演算し、最大の電圧差が得られた位置を
求めることを特徴とする金属塊の幅方向位置検出
方法。 2 加熱された金属塊の発する光を受光する受光
素子群とレンズとにより構成され金属塊を幅方向
へ走査し得るようにした検出手段と、該検出手段
で検出された金属塊の映像信号電圧と予め設定さ
れたレベルの電圧とを比較し、映像信号電圧が設
定されたレベルの電圧以上になつたら信号を出力
する比較手段と、該比較手段からの信号を受け、
そのときの前記検出手段の受光素子の番地を記憶
する記憶手段と、該記憶手段の出力と走査開始に
よりカウントされるクロツクパルスのカウント数
とを比較してクロツクパルスのカウント数が該記
憶手段の出力以上になつたら所定のスイツチを閉
じる指令を与える比較手段と、該スイツチが閉じ
た際にホールドされた映像信号電圧を基に走査周
期を変更する手段と、映像信号の1ビツトごとに
信号電圧の差を演算する手段を設けたことを特徴
とする金属塊の幅方向位置検出装置。
[Claims] 1. When detecting the width end position of a metal lump using a detector composed of a light receiving element group and a lens that receive light emitted from a heated metal lump, the light receiving element is moved in the width direction of the metal lump. The scanning period is determined from the amount of light received by a light receiving element near the light receiving element that generates a voltage at a preset level in the video signal obtained by the scanning, and the scanning period is determined by the determined scanning period. A method for detecting a position in the width direction of a metal lump, characterized by scanning the lump in the width direction, calculating a voltage difference for each bit of a video signal, and finding a position where the maximum voltage difference is obtained. 2. A detection means configured by a light-receiving element group and a lens that receive light emitted from a heated metal lump and capable of scanning the metal lump in the width direction, and a video signal voltage of the metal lump detected by the detection means. and a voltage at a preset level, comparing means for outputting a signal when the video signal voltage exceeds the voltage at the set level, and receiving a signal from the comparing means;
A storage means stores the address of the light receiving element of the detection means at that time, and the output of the storage means is compared with the count number of clock pulses counted at the start of scanning, and the count number of clock pulses is greater than the output of the storage means. a comparison means for giving a command to close a predetermined switch when the switch is closed; a means for changing the scanning period based on the video signal voltage held when the switch is closed; 1. A width direction position detection device for a metal lump, characterized in that it is provided with means for calculating the width direction position of a metal lump.
JP59077215A 1984-04-17 1984-04-17 Method and device for detecting breadthwise position of metallic lump Granted JPS60220803A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59077215A JPS60220803A (en) 1984-04-17 1984-04-17 Method and device for detecting breadthwise position of metallic lump

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59077215A JPS60220803A (en) 1984-04-17 1984-04-17 Method and device for detecting breadthwise position of metallic lump

Publications (2)

Publication Number Publication Date
JPS60220803A JPS60220803A (en) 1985-11-05
JPH0423722B2 true JPH0423722B2 (en) 1992-04-23

Family

ID=13627610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59077215A Granted JPS60220803A (en) 1984-04-17 1984-04-17 Method and device for detecting breadthwise position of metallic lump

Country Status (1)

Country Link
JP (1) JPS60220803A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010256020A (en) * 2009-04-21 2010-11-11 Kodenshi Corp Device for detecting end part of moving body
JP5654639B2 (en) * 2013-06-19 2015-01-14 コーデンシ株式会社 Moving body end detection device

Also Published As

Publication number Publication date
JPS60220803A (en) 1985-11-05

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