JPH0430484Y2 - - Google Patents
Info
- Publication number
- JPH0430484Y2 JPH0430484Y2 JP1986139820U JP13982086U JPH0430484Y2 JP H0430484 Y2 JPH0430484 Y2 JP H0430484Y2 JP 1986139820 U JP1986139820 U JP 1986139820U JP 13982086 U JP13982086 U JP 13982086U JP H0430484 Y2 JPH0430484 Y2 JP H0430484Y2
- Authority
- JP
- Japan
- Prior art keywords
- speed
- low
- measurement circuit
- resolution
- resolution measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
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- Instruments For Measurement Of Length By Optical Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Optical Transform (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Description
【考案の詳細な説明】
[産業上の利用分野]
本考案は、光学的干渉を利用した測定機構を持
つ移動量測定装置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a movement measuring device having a measuring mechanism using optical interference.
[従来の技術]
荷電ビーム描画装置等のステージの移動量を測
定する装置には、精密な測定が要求されるので、
光学的干渉を利用したレーザ干渉計等が備えられ
ている。[Prior Art] Precise measurement is required for devices that measure the amount of movement of a stage such as a charged beam lithography device.
It is equipped with a laser interferometer that uses optical interference.
第4図はこの様な装置の簡単な一例を示したも
のである。図中1はステージの如き移動体で、移
動駆動機構(図示せず)によつて適宜移動する。
2は該移動体に固定された反射鏡、3はレーザ光
源、4は入射光に対し鏡面が略45°の半透明鏡、
5は入射光に対して鏡面が垂直に固定された基準
反射鏡、6は拡大レンズ、7は受光器、8は計測
回路、9はレジスタ、10は表示器である。この
様な装置において、光源3からの光は半透明鏡4
で異なつた二つの光路に分れ、反射鏡2と5に当
たり反射される。該両反射光により前記半透明鏡
4の表面に干渉縞が現われ、該干渉縞はレンズ6
で拡大され、受光器7に投影され、受光器7より
の検出信号は計測回路8に入る。該計測回路は移
動体1は半波長の距離を移動する毎に干渉縞の明
暗に対応するパルス信号を発生し、それを計数す
る、該回路8よりの計数信号はレジスタ9に入力
され、該レジスタの内容が表示器10によつて表
示される。この表示された値が移動体の移動距離
である。 FIG. 4 shows a simple example of such a device. In the figure, reference numeral 1 denotes a moving body such as a stage, which is moved as appropriate by a moving drive mechanism (not shown).
2 is a reflecting mirror fixed to the moving body, 3 is a laser light source, 4 is a semi-transparent mirror whose mirror surface is approximately 45 degrees with respect to the incident light;
Reference numeral 5 designates a reference reflecting mirror whose mirror surface is fixed perpendicular to the incident light, 6 a magnifying lens, 7 a light receiver, 8 a measurement circuit, 9 a register, and 10 a display. In such a device, light from a light source 3 passes through a semi-transparent mirror 4.
The light is split into two different optical paths and is reflected by mirrors 2 and 5. The two reflected lights cause interference fringes to appear on the surface of the semi-transparent mirror 4, and the interference fringes appear on the lens 6.
The detected signal from the light receiver 7 enters the measurement circuit 8. The measuring circuit generates a pulse signal corresponding to the brightness and darkness of the interference fringes every time the moving object 1 moves a distance of half a wavelength, and counts it.The counting signal from the circuit 8 is input to the register 9, The contents of the register are displayed by the display 10. This displayed value is the moving distance of the moving object.
さて、上記計測回路としては、光学的な干渉信
号を適宜な速度で且つ適宜な分解能(精度)でパ
ルス信号に変換するものが選択されているが、こ
の様な計測回路は高分解能である程変換速度は遅
く、逆に変換速度が速い程低分解能である。従つ
て、もし、低速高分解能計測回路を使用すれば、
移動体が低速移動している時には移動量を高精度
に測定出来るが、移動体が高速移動している時に
は測定不可能となる。又、もし、高速低分解能量
計測回路を使用すれば、移動体が高速移動してい
る時には測定出来るが、移動量を高精度に測定出
来ない。 Now, as the measurement circuit mentioned above, one that converts the optical interference signal into a pulse signal at an appropriate speed and with an appropriate resolution (accuracy) is selected. The conversion speed is slow; conversely, the faster the conversion speed, the lower the resolution. Therefore, if you use a low-speed high-resolution measurement circuit,
When the moving body is moving at low speed, the amount of movement can be measured with high accuracy, but when the moving body is moving at high speed, it is impossible to measure the amount of movement. Furthermore, if a high-speed, low-resolution amount measuring circuit is used, it can be measured when the moving body is moving at high speed, but the amount of movement cannot be measured with high precision.
[考案が解決しようとする問題点]
所で、例えば、上記荷電ビーム描画装置等のス
テージ移動においては、ステージを長い距離移動
させる場合、移動開始から停止近く迄高速に移動
させ、終了近くから停止する迄低速に移動させ、
移動時間の短縮化と所定位置への停止の高精度化
を計つている。この様な場合に、低速高分解能計
測回路を使用していると、移動体が高速移動して
いる間測定不能なので、測定出来ない。[Problems to be solved by the invention] For example, when moving the stage of the above-mentioned charged beam lithography apparatus, etc., when moving the stage over a long distance, it is moved at high speed from the start of the movement until near the stop, and then stopped near the end. Move at low speed until
The aim is to shorten travel time and increase precision in stopping at a predetermined position. In such a case, if a low-speed, high-resolution measurement circuit is used, measurement cannot be performed while the moving object is moving at high speed, so measurement cannot be performed.
又、この様な場合に、高速低分解能量計測回路
を使用していると、移動体が高速移動している時
には測定出来るが、停止近くにおいて移動体が低
速移動に入つた時に移動量を高精度に測定出来な
いので、結果的に高速且つ高精度の描写が出来な
い。 In addition, in such cases, if a high-speed, low-resolution amount measurement circuit is used, it is possible to measure when the moving object is moving at high speed, but when the moving object starts moving at low speed near a stop, the amount of movement can be increased. Since it cannot be measured accurately, it is not possible to draw at high speed and with high precision as a result.
本考案はこの様な問題を解決する事を目的とし
たものである。 The present invention is aimed at solving such problems.
[問題点を解決するための手段]
そこで、本考案の移動量測定装置は、移動体の
移動により生じた光学的干渉信号に基づいたパル
ス信号を発生する計測回路として、高速低分解能
計測回路と低速高分解能計測回路を用意し、該高
速低分解能計測回路の出力パルスと低速高分解能
計測回路の出力パルスを夫々独立に動作する上位
ビツトレジスタ、前記高速低分解能計測回路の出
力パルスによりリセツト状態となる下位ビツトレ
ジスタに入れ、該両レジスタの加算内容を移動体
の移動量とする様に成した。[Means for Solving the Problems] Therefore, the movement measuring device of the present invention uses a high-speed low-resolution measuring circuit as a measuring circuit that generates a pulse signal based on an optical interference signal generated by the movement of a moving object. A low-speed high-resolution measurement circuit is prepared, an upper bit register that operates independently of the output pulse of the high-speed low-resolution measurement circuit and the output pulse of the low-speed high-resolution measurement circuit, and a reset state is established by the output pulse of the high-speed low-resolution measurement circuit. The amount of movement of the moving object is determined by adding the contents of both registers to the lower bit register.
[実施例]
第1図は本考案の一実施例を示した移動量測定
装置の概略図である。[Embodiment] FIG. 1 is a schematic diagram of a movement amount measuring device showing an embodiment of the present invention.
図中前記第4図にて使用した番号と同一番号の
付されたものは同一構成要素である。 Components in the figure denoted by the same numbers as those used in FIG. 4 are the same components.
8A,8Bは夫々高速低分解能計測回路、低速
高分解能計測回路である。該高速低分解能計測回
路は受光器7からの光学的干渉信号の、例えば
λ/4(λは該光学的干渉信号の波長)毎にパル
ス信号を発生する。又、低速高分解能計測回路8
Bは該高速低分解能計測回路8Aからの最初のパ
ルス信号によつて作動を開始し、該受光器7から
の光学的干渉信号の、例えばλ/64毎にパルス信
号を発生する。90は例えば8ビツトのレジスタ
で、1ビツトから4ビツト迄の下位ビーム部分9
0Bと5ビツトから8ビツト迄の上位ビツト部分
90Aから成り、各々の部分は夫々独立して作動
する。上位ビツト部分90Aには前記高速低分解
能計測回路8Aからのパルス信号が入力される。
下位ビツト部分90Bは該高速低分解能計測回路
8Aからの各パルス信号によつてリセツト状態と
なり、上記低速高分解能計測回路8Bからのパル
ス信号が入力される。10はこれらの上位ビツト
部分90Aと下位ビツト部分90Bの内容を1つ
のレジスタの内容として表示するものである。 8A and 8B are a high-speed low-resolution measurement circuit and a low-speed high-resolution measurement circuit, respectively. The high-speed low-resolution measurement circuit generates a pulse signal every λ/4 (λ is the wavelength of the optical interference signal) of the optical interference signal from the optical receiver 7, for example. In addition, low-speed high-resolution measurement circuit 8
B starts its operation by the first pulse signal from the high-speed low-resolution measurement circuit 8A, and generates a pulse signal every λ/64 of the optical interference signal from the light receiver 7, for example. For example, 90 is an 8-bit register, and the lower beam portion 9 from 1 bit to 4 bits.
It consists of 0B and upper bit part 90A from 5 bits to 8 bits, and each part operates independently. A pulse signal from the high-speed low-resolution measuring circuit 8A is input to the upper bit portion 90A.
The lower bit portion 90B is reset by each pulse signal from the high-speed low-resolution measuring circuit 8A, and receives the pulse signal from the low-speed high-resolution measuring circuit 8B. 10 displays the contents of the upper bit part 90A and lower bit part 90B as the contents of one register.
この様な装置において、例えば、移動体1を移
動開始から停止近く迄高速に移動させ、終了近く
から停止する迄低速に移動させる事によつて、移
動体1を高速に移動させる場合について、以下に
説明する。 In such a device, the case where the moving body 1 is moved at high speed by, for example, moving the moving body 1 at high speed from the start of the movement until almost stopping, and then moving at low speed from near the end until it stops, is as follows. Explain.
移動駆動機構(図示せず)により移動体1は移
動開始から停止近く迄高速に移動させられる。該
高速移動により、受光器7を通じて第2図aに示
す様な光学的干渉信号が、高速低分解能計測回路
8Aと低速高分解能計測回路8Bに入る。高速低
分解能計測回路8Aは第2図bに示す様に、該光
学的干渉信号のλ/4毎にパルス信号を発生す
る。又、低速高分解能計測回路8Bは該高速低分
解能計測回路8Aからの最初のパルス信号により
作動開始するが、上記光学的干渉信号の周波数が
高く、各サイクル中にパルス信号を発生出来な
い。上記高速低分解能計測回路8Aからのパルス
信号はレジスタ90の上位ビツト部分90Aに入
力される。 The movable body 1 is moved at high speed by a moving drive mechanism (not shown) from the start of movement until almost stopping. Due to the high-speed movement, an optical interference signal as shown in FIG. 2a passes through the light receiver 7 and enters the high-speed low-resolution measurement circuit 8A and the low-speed high-resolution measurement circuit 8B. The high-speed low-resolution measurement circuit 8A generates a pulse signal every λ/4 of the optical interference signal, as shown in FIG. 2b. Furthermore, although the low-speed high-resolution measurement circuit 8B starts operating with the first pulse signal from the high-speed low-resolution measurement circuit 8A, the frequency of the optical interference signal is high and it is not possible to generate a pulse signal during each cycle. The pulse signal from the high-speed low-resolution measuring circuit 8A is input to the upper bit portion 90A of the register 90.
次に、移動駆動機構(図示せず)により移動体
1は移動終了近くから停止する迄低速に移動させ
られる。該低速移動により、受光器7を通じて第
3図aに示す様な光学的干渉信号が、高速低分解
能計測回路8Aと低速高分解能計測回路8Bに入
る。該高速低分解能計測回路8Aは第3図bに示
す様に、該光学的干渉信号のλ/4毎にパルス信
号を発生する。又、低速高分解能計測回路8Bは
該高速低分解能計測回路8Aからの最初のパルス
信号により作動開始し、第3図cに示す様に、該
受光器7からの光学的干渉信号のλ/64毎にパル
ス信号を発生する。尚、該低速高分解能計測回路
8Bは該高速低分解能計測回路8Aからの最初の
パルス信号により作動開始するので、該高速低分
解能計測回路8Aがパル ス信号を発生する時に
は同時にパルスを発生せず、該パルスより遅れて
パルスを発生し出す。上記高速低分解能計測回路
8Aからのパルス信号はレジスタ90の上位ビツ
ト部分90Aに入力される。又、上記低速高分解
能計測回路8Bからのパルス信号はレジスタ90
の下位ビツト部分90Bに入力される。この際、
下位ビツト部分90Bは該高速低分解能計測回路
8Aからパルス信号が入力される度にリセツト状
態となるので、該高速低分解能計測回路8Aから
のパルス信号とパルス信号の間に低速高分解能計
測回路8Bから入力されるパルス信号丈を保持す
る。従つて、上記上位ビツト部分90Aには移動
体1が高速移動から低速移動に入つて停止近くに
なるまでに移動した距離に対応したパルス数が保
持されている。第3図bのPoが最後に入力され
たパルスである。又、上記下位ビツト部分90B
には、移動体1の停止直前の移動距離に対応した
パルス数(第3図cのPa)が保持される事にな
る。この結果、表示器10には上位ビツト部分9
0Aの内容と上記下位ビツト部分90Bの内容の
加算したものが表示されるので、移動体の移動距
離が低速高分解能計測回路8Bの分解能で測定さ
れる。そして、該測定は略高速低分解能計測回路
8Aの速度に近い高速にて測定された事になる。 Next, the movable body 1 is moved at a low speed by a moving drive mechanism (not shown) from near the end of its movement until it stops. Due to the low-speed movement, an optical interference signal as shown in FIG. 3a passes through the light receiver 7 and enters the high-speed, low-resolution measurement circuit 8A and the low-speed, high-resolution measurement circuit 8B. The high-speed low-resolution measurement circuit 8A generates a pulse signal every λ/4 of the optical interference signal, as shown in FIG. 3b. Further, the low-speed high-resolution measuring circuit 8B starts operating with the first pulse signal from the high-speed low-resolution measuring circuit 8A, and as shown in FIG. A pulse signal is generated every time. Note that the low-speed, high-resolution measurement circuit 8B starts operating with the first pulse signal from the high-speed, low-resolution measurement circuit 8A, so when the high-speed, low-resolution measurement circuit 8A generates a pulse signal, it does not generate a pulse at the same time. , a pulse is generated later than the above pulse. The pulse signal from the high-speed low-resolution measurement circuit 8A is input to the upper bit portion 90A of the register 90. Further, the pulse signal from the low-speed high-resolution measurement circuit 8B is sent to the register 90.
is input to the lower bit portion 90B of. On this occasion,
Since the lower bit portion 90B enters a reset state every time a pulse signal is input from the high-speed low-resolution measurement circuit 8A, the low-speed high-resolution measurement circuit 8B is reset between the pulse signal from the high-speed low-resolution measurement circuit 8A. Holds the pulse signal length input from Therefore, the upper bit portion 90A holds the number of pulses corresponding to the distance traveled by the moving body 1 from high-speed movement to low-speed movement until it approaches a stop. Po in FIG. 3b is the last input pulse. Also, the lower bit part 90B
, the number of pulses (Pa in FIG. 3c) corresponding to the distance traveled by the moving body 1 immediately before stopping is held. As a result, the display 10 shows the upper bit part 9.
Since the sum of the contents of 0A and the contents of the lower bit portion 90B is displayed, the moving distance of the moving object is measured with the resolution of the low-speed high-resolution measurement circuit 8B. This means that the measurement was performed at a high speed approximately equal to the speed of the high-speed low-resolution measurement circuit 8A.
尚、本実施例では1ビツトから4ビツト迄の下
位ビツト部分90Bと5ビツトから8ビツト迄の
上位ビツト部分90Aから成り、各々の部分は
夫々独立して作動する1つの8ビツトレジスタ9
0を用意したが、全く別々の、1ビツトから4ビ
ツト迄の下位ビツトレジスタと5ビツトから8ビ
ツト迄の上位ビツトレジスタを用意してもよい。 In this embodiment, it consists of a lower bit part 90B from 1 bit to 4 bits and an upper bit part 90A from 5 bits to 8 bits, and each part is one 8-bit register 9 that operates independently.
Although 0 is provided, completely separate lower bit registers from 1 bit to 4 bits and upper bit registers from 5 bits to 8 bits may be provided.
[考案の効果]
本考案は高速低分解能計測回路と低速高分解能
計測回路を用意し、該高速低分解能計測回路の出
力パルスを上位ビツトレジスタに、該低速高分解
能計測回路の出力パルスを高速低分解能計測回路
の出力パルスによりリセツト状態となる下位ビツ
トレジスタに入れ、該両レジスタの加算内容を移
動体の移動量としているので、移動開始から停止
近く迄高速に移動させ、終了近くから停止する迄
低速に移動させる場合、移動体の移動距離が低速
高分解能計測回路の高分解能で測定され、且つ略
高速低分解能計測回路の速度に近い高速にて測定
される。[Effect of the invention] The present invention provides a high-speed, low-resolution measurement circuit and a low-speed, high-resolution measurement circuit. The output pulse of the resolution measurement circuit is used to enter the lower bit register which is reset, and the sum of these two registers is used as the amount of movement of the moving object, so the moving object is moved at high speed from the start of movement until it nearly stops, and from near the end until it stops. When moving at a low speed, the moving distance of the moving object is measured at high resolution by the low speed, high resolution measurement circuit, and at a high speed approximately close to the speed of the high speed, low resolution measurement circuit.
第1図は本考案の一実施例を示した移動量測定
装置の概略図、第2図及び第3図は本考案の装置
の動作の説明を補足する為の信号波形図、第4図
は従来の移動量測定装置の概略図である。
1……移動体、2……反射鏡、3……レーザ光
源、4……半透明鏡、5……基準反射鏡、6……
拡大レンズ、7……受光器、8……計測回路、1
0……表示器、8A……高速低分解能計測回路、
8B……低速高分解能計測回路、90……レジス
タ、90A……上位ビツト部分、90B……下位
ビツト部分。
FIG. 1 is a schematic diagram of a movement measuring device showing an embodiment of the present invention, FIGS. 2 and 3 are signal waveform diagrams to supplement the explanation of the operation of the device of the present invention, and FIG. FIG. 2 is a schematic diagram of a conventional movement measuring device. 1... Moving object, 2... Reflecting mirror, 3... Laser light source, 4... Semi-transparent mirror, 5... Reference reflecting mirror, 6...
Magnifying lens, 7... Light receiver, 8... Measurement circuit, 1
0... Display, 8A... High speed low resolution measurement circuit,
8B...Low-speed high-resolution measurement circuit, 90...Register, 90A...Upper bit part, 90B...Lower bit part.
Claims (1)
構により測定する装置において、移動体の移動に
より生じた光学的干渉信号に基づいたパルス信号
を発生する計測回路として、高速低分解能計測回
路と低速高分解能計測回路を用意し、該高速低分
解能計測回路の出力パルスと低速高分解能計測回
路の出力パルスを夫々独立に動作する上位ビツト
レジスタ、前記高速低分解能計測回路の出力パル
スによりリセツト状態となる下位ビツトレジスタ
に入れ、該両レジスタの加算内容を移動体の移動
量とする様に成した事を特徴とする移動量測定装
置。 In a device that measures the amount of movement of a moving object using a measurement mechanism that uses optical interference, a high-speed, low-resolution measurement circuit and a low-speed measurement circuit are used as measurement circuits that generate pulse signals based on optical interference signals generated by the movement of the moving object. A high-resolution measurement circuit is prepared, and an upper bit register that operates independently of the output pulse of the high-speed low-resolution measurement circuit and the output pulse of the low-speed high-resolution measurement circuit, and is brought into a reset state by the output pulse of the high-speed low-resolution measurement circuit. A moving amount measuring device characterized in that the moving amount is stored in a lower bit register, and the sum of the contents of both registers is used as the moving amount of the moving object.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986139820U JPH0430484Y2 (en) | 1986-09-11 | 1986-09-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986139820U JPH0430484Y2 (en) | 1986-09-11 | 1986-09-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6347214U JPS6347214U (en) | 1988-03-30 |
| JPH0430484Y2 true JPH0430484Y2 (en) | 1992-07-23 |
Family
ID=31046086
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986139820U Expired JPH0430484Y2 (en) | 1986-09-11 | 1986-09-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0430484Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1647838B1 (en) * | 2004-10-13 | 2010-04-28 | Leica Geosystems AG | Method and apparatus for absolute distance measurement |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5927221A (en) * | 1982-08-09 | 1984-02-13 | Tokyo Seimitsu Co Ltd | Digital counting device |
-
1986
- 1986-09-11 JP JP1986139820U patent/JPH0430484Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6347214U (en) | 1988-03-30 |
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