JPH04314400A - Continuous inspection device - Google Patents

Abstract

PURPOSE:To provide a continuous inspection device in which the inspection progress is not interrupted caused by the teaching function for teaching the inspection specification. CONSTITUTION:A continuous inspection device 1 is provided with the information measurement means 5 and 6 which measure the information necessary for inspecting objects 2 to be inspected, and an transfer means 8 which transfer successively the objects 2 so as to pass through the fixed positions of the means 5 and 6, and at the same time it analyzes the information of the objects 2 obtained from the means 5 and 6 based on the inspection specification which has been taught in advance according to the reference inspection object 15. Thus, the inspection processing means to inspect respective objects 2 as well as the transfer means to transfer the objects 2 is provided and furthermore a holding means 16 are placed to hold the object 15 at the position where the transfer operation is not interrupted. Thereby, the means 5 can measure the information of the object 15 held by the means 16.

Description

[Detailed description of the invention]

0001

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a continuous inspection apparatus, for example, an apparatus capable of continuously inspecting printed wiring boards one after another.

0002

2. Description of the Related Art FIG. 8 schematically shows the main parts of a conventional printed wiring board continuous inspection apparatus. This continuous inspection device 50 includes a camera (image information measuring means) 52 that measures an image of a printed wiring board (tested object) 51;
It is provided with a conveyor (transfer means) 53 that sequentially transfers printed wiring boards 51 through the installation and storage. This continuous inspection device 50 has been previously taught the inspection specifications before starting continuous inspection. In other words, the reference inspection object [usually a printed wiring board that has been confirmed to be ideal (from which information very close to the design standard values can be obtained)] is placed directly below the camera 52 on the stopped conveyor 53. (not limited to directly below) to obtain an image, and based on this image, input (teach) the inspection specifications in advance.

After the inspection specifications have been taught, the conveyor 53 is operated and the uninspected printed wiring boards 51 are transferred to the camera 5 one after another.
Transfer under 2. The camera 52 measures an image of the printed wiring board 51 that has arrived directly below. Continuous inspection device 50
An inspection processing unit (not shown) inside the unit analyzes successive images of the printed wiring board 51 to be inspected according to pre-taught inspection specifications to judge whether each object to be inspected is pass or fail, and the inspection is carried out continuously. proceed as planned. The continuous inspection device 50 may mark defective locations on the inspected printed wiring board 51 depending on the inspection results.

[0004] By using the continuous testing device 50, it becomes possible to quickly test a large number of printed wiring boards in this manner.

[0005]

However, the continuous inspection device 50 described above cannot be expected to perform rapid inspection when there are many types of printed wiring boards. This is because the line must be stopped for teaching when changing the product type, and during teaching, the continuous inspection device essentially does not perform any inspection and stops. Printed wiring boards are becoming more densely packaged and smaller, and the time required for each piece of teaching tends to be longer. In addition to changing the type of object to be inspected, when changing the inspection specification midway through, the line is temporarily stopped and teaching is performed, which interrupts the inspection and prevents rapid inspection.

SUMMARY OF THE INVENTION In view of the above-mentioned circumstances, it is an object of the present invention to provide a continuous inspection device in which teaching of inspection specifications does not interfere with the progress of inspection.

[0007]

[Means for Solving the Problems] In order to solve the above problems, a continuous inspection device according to the present invention includes an information measuring means for measuring information necessary for inspecting an object to be inspected, and an installation position of the information measuring means. and a transfer means for transporting the inspected object one after another as if passing through the inspection object, and analyzing information on the inspected object obtained by the information measuring means according to inspection specifications taught in advance based on information on the reference inspected object. In addition to the inspection processing means for inspecting each object to be inspected by the above-described method, the apparatus also includes a holding means capable of holding the reference inspection object at a position that does not interfere with the transportation of the object to be inspected, and the information measuring means , is configured to measure information on a reference test object held by the holding means.

[0008] In addition to the above, the continuous inspection apparatus according to claim 2 is provided with a plurality of information measuring means, and while one of the information measuring means measures the information of the reference specimen, the other information measuring means do not measure the information of the reference specimen. The structure is such that information about the object to be inspected is measured and inspections are performed in parallel.

The continuous inspection device of the present invention can be arranged in a serial line as well as in a stand-alone configuration. In other words, as shown in Fig. 7, there is a coating device (processing device) for applying cream solder, adhesive, etc. - a continuous inspection device - a component mounting machine (processing device) - a continuous inspection device - a solder heat curing device (processing device). In some cases, a serial line is formed in which a processing device for the inspection device and/or for processing the object to be inspected is disposed in front of the inspection device.

The continuous inspection device of the present invention will be explained in more detail below. A specific example of the continuous inspection apparatus according to the present invention is, for example, an apparatus that continuously inspects electronic component mounting on a printed wiring board, but it goes without saying that the present invention is not limited to this.

[0011] As the information measuring means, for example, there is an image measuring means composed of one or more cameras. The image measuring means may be, for example, a video camera equipped with a CCD sensor that detects laser light that is irradiated light, but is not limited thereto, and may also be an X-ray video camera that detects irradiated X-rays. It goes without saying that in the former case, a laser beam irradiation means is provided, and in the latter case, an X-ray irradiation means is provided in the continuous inspection apparatus, and the object to be inspected is irradiated with laser light or X-rays. In the case of an image measurement means composed of a plurality of cameras, a multi-camera system is often used in which five to six cameras are used simultaneously to enable three-dimensional measurement. In addition to those that measure images, the information measurement means may also output detection signals such as infrared rays, X-rays, ultrasonic waves, and magnetism as information.

[0012] Various types of means for transferring the object to be inspected are used, including a belt conveyor type and a moving table type.

[0013] The inspection processing section is mainly composed of a memory that stores inspection programs, etc., and a CPU that executes the inspection programs.

[0014] This type of continuous inspection apparatus is usually equipped with a plurality of information measuring means, and some devices are usually designed so that each means can inspect a plurality of objects to be inspected at the same time. In this case, while teaching is performed by measuring the information of the reference test object using one information measuring means, the test object passes only through that information measuring means, and the test object passes through the other information measuring means. It is possible to have the body examinations performed in parallel. In other words, teaching of the inspection specifications can be carried out simultaneously with the inspection processing in the inspection processing section.

The continuous inspection device of the present invention may also include marking means for marking defective locations on the printed wiring board with colored ink or the like.

[0016] During the teaching, the inspection items to be carried out,
Teach inspection specifications such as pass/fail criteria. For example, in the case of inspection related to electronic component mounting on a printed wiring board, the quality of solder printing, the quality of adhesive application, the quality of mounting accuracy after component assembly and mounting, short circuits after solder hardening after reflow, etc. Inspection items such as these are specified and pass/fail judgment criteria are set. Of course, the number of inspection items is not limited to the case where there are a plurality of inspection items, and the number of inspection items may be one.

[0017]

[Operation] The continuous inspection device of the present invention is provided with a holding means capable of holding a reference inspection object at a position that does not interfere with the transfer of the inspection object, and performs reference inspection without interrupting the transfer of uninspected inspection objects. Since body information can be measured and taught using the information measuring means, teaching of test specifications does not interfere with test line operation.

[0018]

Embodiments Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(Example 1) FIGS. 1 and 2 show Example 1.
FIG. 1 shows a state in which teaching is being performed, and FIG. 2 shows a state in which an untested printed wiring board is being tested.

This continuous inspection device 1 includes a camera (image measuring means) 5 for measuring an image of a printed wiring board (object to be inspected) 2, and a camera (image measuring means) 5 for measuring the image of a printed wiring board (object to be inspected) 2,
Conveyor (installation position)
transport means) 8. Before continuous inspection is performed, the continuous inspection device 1 is taught the inspection specifications in advance, and the printed wiring board 2 is inspected according to the inspection specifications.
The inspection process progresses.

During the continuous inspection, as shown in FIG. 2, uninspected printed wiring boards 2 are conveyed one after another by the conveyor 8 directly below the camera 5. The cameras 5 each measure an image of the printed wiring board 2 that has arrived directly below. Then, an inspection processing section (not shown) in the continuous inspection device 1 analyzes the images obtained one after another from the uninspected printed wiring boards 2 according to the inspection specifications taught in advance, and performs the inspection by determining pass/fail. Depending on the size of the printed wiring board 2, the camera 5 may scan the inspection surface moving in the transport direction (Y direction) or in the direction perpendicular to the transport direction (X direction).

Next, a case will be described in which teaching for switching to another product type is performed during continuous inspection in the continuous inspection apparatus of the present invention.

First, as shown in FIG. 1, while the inspection before switching is in progress, while the conveyor 8 is being driven without being stopped, only the camera 5 is pulled up vertically, and the reference inspection object [ Usually, a printed wiring board 15 which has already been confirmed to be an (ideal) printed wiring board from which information very close to design standard values can be obtained is held on the conveyor 8. In this way, the camera 5 is installed so as to be movable in the vertical direction.

The lifting distance ΔZ of the camera 5 is equal to the distance ΔZ between the printed wiring board 2 to be inspected and the reference inspection object 15 held. In other words, the distance between the camera 5 and the non-defective printed wiring board serving as the reference inspection object 15 during teaching is the same as the distance between the camera 5 and the uninspected printed wiring board 2 during actual inspection.

The structure surrounding the holding of the reference test object 15 is as follows. In the continuous inspection device 1, there is a position on the side of the conveyor 8 that does not interfere with the transfer of the printed wiring board 2.
There are four holding columns (holding means) 16 (only the front two in the figure), and the two on the left in the figure have locking pins 17 at their tips. 3, by inserting each of the locking pins 17 into the reference holes (not shown) of the reference test object 15, the reference test object 15 can be placed and held on the holding column 16 in a positioned state. Note that, as shown in FIG. 3, the reference hole is normally drilled at a position such that the side edge 2a of the printed wiring board 2 being transferred and the side edge 15a of the reference inspection object 15 in the held state coincide with each other.

[0026] Then, an image of the reference inspection object 15 is obtained by the camera 5, and teaching is performed based on this image. Actual inspection cannot be performed during teaching, but by the time the product type is changed over, the line has stabilized and there is no need to perform a 100% inspection, so there is no problem.

After switching the product type, inspection processing is performed according to the inspection specifications taught by the reference inspection body 15. If there is no need to hold the reference test object 15 after teaching, it is useful to tilt it outward to prevent the camera 5 from colliding with the holding column 16, as shown in FIG. .

(Example 2) FIGS. 5 and 6 show Example 2.
FIG. 5 shows a state in which teaching and testing are performed in parallel, and FIG. 6 shows a state in which only untested printed wiring boards are tested. It shows the condition.

This continuous inspection device 1 includes two cameras (image measuring means) 5 and 6 for measuring the image of a printed wiring board (object to be inspected) 2, and a position where the printed wiring board 2 is placed under the cameras 5 and 6 ( A conveyor (transfer means) 8 is provided to transport the paper one after another so as to pass through the installation position. Prior to execution of the continuous test, the continuous test device 1 is taught the test specifications in advance, and the test process of the printed wiring board 2 proceeds according to the test specifications.

During the continuous inspection, as shown in FIG. 6, the uninspected printed wiring boards 2 are transferred one after another by the conveyor 8 directly below the cameras 5 and 6, respectively. Each of the cameras 5 and 6 measures an image of the printed wiring board 2 that has arrived directly below. Then, an inspection processing section (not shown) in the continuous inspection device 1 analyzes the images obtained one after another from the uninspected printed wiring boards 2 according to the inspection specifications taught in advance, and performs the inspection by determining pass/fail. This continuous inspection device 1
In this case, there are two cameras 5 and 6, and inspection of two printed wiring boards 2 is carried out simultaneously and in parallel. Depending on the size of the printed wiring board 2, each camera 5, 6 may be moved in the transport direction (Y
In some cases, the inspection surface is scanned moving in a direction (X direction) or in a direction (X direction) perpendicular to the transport direction.

Next, a case will be described in which teaching for switching to another product type is performed during continuous inspection in the continuous inspection apparatus of the present invention.

First, as shown in FIG. 5, while the inspection before switching is in progress, while the conveyor 8 is being driven without being stopped, only the camera 5 is pulled up vertically, and the reference inspection object [ Usually, a printed wiring board 15 which has already been confirmed to be an (ideal) printed wiring board from which information very close to design standard values can be obtained is held on the conveyor 8. In this way, the camera 5 is installed so as to be movable in the vertical direction.

The lifting distance ΔZ of the camera 5 is equal to the distance ΔZ between the printed wiring board 2 to be inspected and the reference inspection object 15 held. In other words, the distance between the camera 5 and the non-defective printed wiring board serving as the reference inspection object 15 during teaching is the same as the distance between the camera 5 and the uninspected printed wiring board 2 during actual inspection.

[0034] Regarding the holding of the reference test object 15, it is the same as in the first embodiment, so a description thereof will be omitted.

[0035] Then, an image of the reference inspection object 15 is obtained with the camera 5, and teaching is performed based on this image. Of course, it goes without saying that the inspection of the printed wiring board 2 can be continued in parallel using the other camera 6 without any hindrance.

After switching the product type, inspection processing is performed according to the inspection specifications taught by the reference inspection body 15. If there is no need to hold the reference test object 15 after teaching, it is useful to tilt it outward to prevent the camera 5 from colliding with the holding column 16, as shown in FIG. .

The continuous inspection device of the present invention is not limited to the above embodiment. For example, the apparatus may include three or more cameras for measuring images of the object to be inspected. Further, the holding means for the reference inspection object may be configured such that a table is placed between the camera and the conveyor so that it can go in and out, and the table advances onto the conveyor during teaching, and is retracted to a position removed from the conveyor in other cases. . The holding means may be provided on the side of the conveyor instead of above it. However, if the holding means is located on the side of the conveyor, the camera must be moved a long distance beyond the conveyor, and the camera moving mechanism becomes large-scale, so it is better to provide it above the conveyor.

[0038]

As described above, the continuous inspection apparatus of the present invention is also equipped with a holding means that can hold the reference inspection object at a position where it does not interfere with the transportation of the inspection object. Since the information on the reference test object can be measured and taught by the information measuring means without interrupting the transfer of the test object, no time is lost in teaching when changing the product type.

[Brief explanation of drawings]

FIG. 1 is a schematic front view showing the main parts of a continuous inspection device according to a first embodiment in a teaching state.

FIG. 2 is a schematic front view showing the main parts of the continuous inspection device of Example 1 in an inspection state.

FIG. 3 is a partial side view showing an example of the configuration around the holding means in the continuous inspection apparatus of Examples 1 and 2;

FIG. 4 is a partial side view showing another example of the structure around the holding means in the continuous inspection apparatus of Examples 1 and 2;

FIG. 5 is a schematic front view showing the main parts of the continuous testing device of the second embodiment in both teaching and testing states.

FIG. 6 is a schematic front view showing the main parts of the continuous inspection device of Example 2, which is only in an inspection state.

FIG. 7 is a block diagram showing a serial line in which the continuous inspection device of the present invention is arranged.

FIG. 8 is a schematic front view showing the main parts of a conventional continuous inspection device.

[Explanation of sign]

1 Continuous inspection device 2 Printed wiring board (tested object) 3 Camera (image measurement means) 6 Camera (image measurement means) 8 Conveyor (transfer means) 16 Holding column (holding means)

Claims (3)

[Claims] 1. Information measuring means for measuring information necessary for testing an object to be inspected; transport means for successively transporting the objects to be inspected through the installation position of the information measuring means; In a continuous inspection apparatus equipped with an inspection processing means for inspecting each object to be inspected by analyzing information on the object to be inspected obtained by the measurement means according to inspection specifications taught in advance based on information on a reference object to be inspected, It also includes a holding means capable of holding the reference test object in a position that does not interfere with the transfer of the test object, and the information measuring means measures information on the reference test object held by the holding means. A continuous inspection device characterized by: Claim 2: A plurality of information measuring means are provided, and while one of the information measuring means measures the information of the reference object to be inspected, other information measuring means measure the information of the object to be inspected and perform the inspection in parallel. 2. The continuous inspection device according to claim 1, wherein the continuous inspection device is carried out by: 3. The continuous inspection device according to claim 1, wherein a serial line is provided in front of the inspection device and/or a processing device for the object to be inspected.