JPH04326027A - Spectrophotometer - Google Patents
SpectrophotometerInfo
- Publication number
- JPH04326027A JPH04326027A JP9681891A JP9681891A JPH04326027A JP H04326027 A JPH04326027 A JP H04326027A JP 9681891 A JP9681891 A JP 9681891A JP 9681891 A JP9681891 A JP 9681891A JP H04326027 A JPH04326027 A JP H04326027A
- Authority
- JP
- Japan
- Prior art keywords
- interference filter
- intensity distribution
- slit
- light
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009826 distribution Methods 0.000 claims abstract description 37
- 230000003595 spectral effect Effects 0.000 claims description 21
- 102100027340 Slit homolog 2 protein Human genes 0.000 abstract description 23
- 101710133576 Slit homolog 2 protein Proteins 0.000 abstract description 23
- 230000005540 biological transmission Effects 0.000 abstract description 6
- 230000004907 flux Effects 0.000 abstract description 3
- 238000005375 photometry Methods 0.000 abstract description 3
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 230000010287 polarization Effects 0.000 abstract 1
- 238000010183 spectrum analysis Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 description 10
- 238000004611 spectroscopical analysis Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000002798 spectrophotometry method Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 101700004678 SLIT3 Proteins 0.000 description 1
- 102100027339 Slit homolog 3 protein Human genes 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
Landscapes
- Control Of Exposure In Printing And Copying (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は分光測光装置に関し、例
えばカラー写真焼付け装置の測光系に適した分光測光装
置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spectrophotometric device, and more particularly, to a spectrophotometric device suitable for a photometric system of a color photographic printer.
【0002】0002
【従来の技術】例えば、従来の面露光プリンタにおいて
は、印画紙の分光感度にほぼ一致させた3色色分解フィ
ルタによりネガの分光分布を測光して、ネガの発色濃度
を検出している。しかしながら、この方法では、3色色
分解フィルタを印画紙の分光感度に正確に一致させるこ
とが困難であり、加えて、印画紙の分光感度のずれに対
応できない欠点がある。また、ネガの種類によって露光
条件を変えるには、現状ではパトローネに表示されたバ
ーコードに頼っており、間違える場合もある。2. Description of the Related Art For example, in a conventional surface exposure printer, the color density of the negative is detected by photometrically measuring the spectral distribution of the negative using a three-color separation filter whose spectral sensitivity almost matches the spectral sensitivity of photographic paper. However, this method has the drawback that it is difficult to match the three-color separation filter accurately to the spectral sensitivity of the photographic paper, and in addition, it cannot cope with deviations in the spectral sensitivity of the photographic paper. Furthermore, in order to change the exposure conditions depending on the type of negative, we currently rely on the barcode displayed on the cartridge, which can sometimes lead to mistakes.
【0003】そのため、ネガの発色濃度を印画紙の分光
感度に一致させるべく、重み付けした測定系で検出する
手段が特開平1−134353号、特開平1−1427
19号等において提案されている。これらにおいては、
ネガをライン走査してコマ領域ないしコマ間の非画像領
域の各分解画素の分光濃度分布を測定するための分光系
として、分光プリズムが用いられており、また、回折格
子や干渉フィルタ等も用いることが可能であるとしてい
る。しかし、プリズム、回折格子等の分光系は装置が大
型化し、また、耐久性が疑問視される。Therefore, in order to match the color density of the negative with the spectral sensitivity of the photographic paper, a means for detecting it using a weighted measurement system is disclosed in Japanese Patent Laid-Open No. 1-134353 and Japanese Patent Laid-Open No. 1-1427.
It has been proposed in No. 19, etc. In these,
A spectroscopic prism is used as a spectroscopic system to line-scan a negative and measure the spectral density distribution of each resolved pixel in the frame area or non-image area between frames, and also uses diffraction gratings, interference filters, etc. It is said that this is possible. However, spectroscopic systems such as prisms and diffraction gratings require large devices and are questionable in terms of durability.
【0004】また、干渉フィルタを用いる方式としては
、透過波長を場所毎に順次異ならせた干渉フィルタを用
いるものが特開昭64−57134号に提案され、実際
に測色計として商品化されているが、このような透過波
長が場所毎に異なる干渉フィルタを製造することには困
難が伴う。[0004] Furthermore, as a method using an interference filter, a method using an interference filter in which the transmission wavelength is sequentially different for each location was proposed in Japanese Patent Application Laid-Open No. 64-57134, and it was actually commercialized as a colorimeter. However, it is difficult to manufacture such interference filters whose transmission wavelengths differ from place to place.
【0005】[0005]
【発明が解決しようとする課題】本発明はこのような状
況に鑑みてなされたものであり、その目的は、上記従来
の方式と異なる分光方式により、装置の簡素化と耐久性
の向上を図った分光測光装置を提供することである。[Problems to be Solved by the Invention] The present invention was made in view of the above circumstances, and its purpose is to simplify the device and improve its durability by using a spectroscopic method different from the conventional method described above. It is an object of the present invention to provide a spectrophotometric device.
【0006】[0006]
【課題を解決するための手段】上記目的を達成する本発
明の分光測光装置は、少なくとも所定方向に広がりがあ
る被測定平行光束中に、その方向において位置毎に傾角
が異なり相互に同一特性の部分干渉フィルタの組み合せ
からなる干渉フィルタ装置を配置し、該干渉フィルタ装
置を透過した光束の前記方向における強度分布を測定す
る手段を設け、前記強度分布測定手段からの強度分布信
号と対応する位置の部分干渉フィルタの傾角とを関連付
けることにより被測定光の分光分布を測定することを特
徴とするものである。[Means for Solving the Problems] The spectrophotometer of the present invention achieves the above object, in which a parallel beam of light to be measured spreads in at least a predetermined direction, and the inclination angle differs depending on the position in that direction, and mutually the same characteristics are mutually different. An interference filter device consisting of a combination of partial interference filters is disposed, and means for measuring the intensity distribution of the light beam transmitted through the interference filter device in the direction is provided, and the intensity distribution signal from the intensity distribution measuring means and the corresponding position are provided. This method is characterized in that the spectral distribution of the light to be measured is measured by associating it with the inclination angle of the partial interference filter.
【0007】この場合、具体的な1例として、被測定光
が前記所定方向に直交する方向のスリットによって制限
された領域から出射し、コリメート手段によって平行光
束に変換され、ビーム径変換手段によって前記所定方向
に拡大された光束からなり、前記干渉フィルタ装置が軸
が前記スリットと平行な円筒状又は多角柱状に形成され
た均一膜厚の干渉フィルタからなり、また、前記強度分
布測定手段が前記所定方向及前記スリットに平行な方向
の2次元分布を測定する2次元強度分布測定手段からな
り、少なくともコリメート手段と前記強度分布測定手段
の間に配置された偏光手段とを備えたものとすることが
できる。In this case, as a specific example, the light to be measured is emitted from an area limited by a slit in a direction perpendicular to the predetermined direction, is converted into a parallel beam by a collimating means, and is converted into a parallel beam by a beam diameter converting means. The interference filter device consists of a light beam expanded in a predetermined direction. and a two-dimensional intensity distribution measuring means for measuring a two-dimensional distribution in a direction parallel to the slit, and at least a collimating means and a polarizing means disposed between the intensity distribution measuring means. can.
【0008】なお、本発明の分光測光装置は、カラー写
真焼付け装置のフィルム分光測光系に適したものである
。The spectrophotometric device of the present invention is suitable for a film spectrophotometric system of a color photographic printing device.
【0009】[0009]
【作用】本発明においては、少なくとも所定方向に広が
りがある被測定平行光束中に、その方向において位置毎
に傾角が異なり相互に同一特性の部分干渉フィルタの組
み合せからなる干渉フィルタ装置を配置し、該干渉フィ
ルタ装置を透過した光束の前記方向における強度分布を
測定する手段を設け、前記強度分布測定手段からの強度
分布信号と対応する位置の部分干渉フィルタの傾角とを
関連付けることにより被測定光の分光分布を測定するも
のであるので、プリズム、回折格子のような波長分散を
行わないため、測光系が簡単でコンパクトになり、また
、干渉フィルタとしては、特定の波長用のものを蒸着す
ればよく、干渉フィルタの設計、製造が容易である。
また、何ら可動部分がないので、分光の前後で光軸が変
化せず、安定して分光ができる。[Operation] In the present invention, an interference filter device consisting of a combination of partial interference filters having mutually identical characteristics is disposed in a parallel beam of light to be measured that spreads in at least a predetermined direction, and the inclination angle differs depending on the position in that direction. A means for measuring the intensity distribution in the direction of the light beam transmitted through the interference filter device is provided, and by associating the intensity distribution signal from the intensity distribution measuring means with the inclination angle of the partial interference filter at the corresponding position, it is possible to measure the intensity of the light to be measured. Because it measures spectral distribution, it does not perform wavelength dispersion like prisms and diffraction gratings, making the photometry system simple and compact.Also, as an interference filter, it is possible to evaporate a filter for a specific wavelength. Generally, interference filters are easy to design and manufacture. Furthermore, since there are no moving parts, the optical axis does not change before and after spectroscopy, allowing stable spectroscopy.
【0010】0010
【実施例】以下、本発明の分光測光装置をカラー写真焼
付け装置の測光系に適用した場合の実施例について説明
する。一定の膜厚の干渉フィルタであっても、入射光に
対して干渉フィルタを傾けて入射角i0 をゼロ度から
増加させると、図6(A)、(B)に示すように、干渉
フィルタを透過する波長が入射角i0 の増加に応じて
短波長側にシフトし、また、そのシフトした波長の透過
率も変化することが知られている。したがって、干渉フ
ィルタとして入射平行光束に対する入射角i0 が光束
断面内で場所によって異なるものを用意し、その場所と
対応させて被測定光強度を測定することにより、入射光
束の分光測光が可能になる。本発明の分光測光装置はこ
の原理を利用するものである。DESCRIPTION OF THE PREFERRED EMBODIMENTS An example in which the spectrophotometric device of the present invention is applied to a photometric system of a color photographic printer will be described below. Even if the interference filter has a constant film thickness, if the angle of incidence i0 is increased from zero degrees by tilting the interference filter with respect to the incident light, the interference filter will change as shown in FIGS. 6(A) and (B). It is known that the transmitted wavelength shifts to the shorter wavelength side as the incident angle i0 increases, and the transmittance of the shifted wavelength also changes. Therefore, by preparing an interference filter in which the angle of incidence i0 with respect to the incident parallel light beam differs depending on the location within the beam cross section, and measuring the measured light intensity in correspondence with the location, spectrophotometry of the incident light beam becomes possible. . The spectrophotometer of the present invention utilizes this principle.
【0011】図1に本発明の1実施例の分光測光装置の
側面図、図2にその斜視図を示す。ただし、図2におい
ては、偏光器は省いてある。装置は、被測定ネガフィル
ム1を照明する照明装置3と、被測定ネガフィルム1の
進行方向に交差するストライプ領域のみに被測定ネガフ
ィルム1の透過光を制限するスリット2と、スリット2
を通過した光を平行光束に変換するコリメータ光学系4
と、コリメータ光学系4により変換された細い平行光束
をネガフィルム1の進行方向に拡大するビームエッキス
パンダ5と、ビームエッキスパンダ5からの光束中のs
成分(図6(A))又はp成分(図6(B))のみを透
過する偏光フィルタ、偏光ビームスプリッタ等からなる
偏光器6と、中空透明円筒体8の表面に均一な膜厚の干
渉フィルタ膜9を蒸着して形成した円筒面干渉フィルタ
7と、エリアセンサ10とからなる。円筒面干渉フィル
タ7は、図示のように、円筒体の軸を通る平面で4等分
したものの1つからなる形状をしており、その母線はス
リット2と平行な方向に向いている。コリメータ光学系
4は、スリット2に前側焦点が配置されたマイクロレン
ズアレー等からなる。また、ビームエッキスパンダ5は
、例えば図示のように、母線がスリット2と平行な負と
正の2枚のシリンドリカルレンズを共焦点で組み合わせ
て構成したものである。エリアセンサ10は、図3の斜
視図に示すように、画素を構成する微小な光検出素子1
1が直交する2次元座標軸上に碁盤の目状に規則正しく
配置されているものであり、一方の座標軸がスリット2
と平行に、他方の座標軸がスリット2と直交する方向に
配置されており、CCD等が用いられる。FIG. 1 shows a side view of a spectrophotometer according to an embodiment of the present invention, and FIG. 2 shows a perspective view thereof. However, in FIG. 2, the polarizer is omitted. The apparatus includes an illumination device 3 that illuminates the negative film 1 to be measured, a slit 2 that restricts the transmitted light of the negative film 1 to only a stripe area that intersects the traveling direction of the negative film 1, and a slit 2.
collimator optical system 4 that converts the light that has passed through the
, a beam expander 5 that expands the narrow parallel beam converted by the collimator optical system 4 in the direction of travel of the negative film 1, and s in the beam from the beam expander 5.
A polarizer 6 consisting of a polarizing filter, a polarizing beam splitter, etc. that transmits only the p-component (FIG. 6(A)) or the p-component (FIG. 6(B)) and a uniform film thickness on the surface of the hollow transparent cylinder 8 It consists of a cylindrical interference filter 7 formed by depositing a filter film 9 and an area sensor 10. As shown, the cylindrical interference filter 7 has a shape that is divided into four equal parts by a plane passing through the axis of the cylindrical body, and its generatrix is oriented in a direction parallel to the slit 2. The collimator optical system 4 is composed of a microlens array or the like whose front focal point is arranged at the slit 2. In addition, the beam expander 5 is constructed by combining two negative and positive cylindrical lenses whose generatrix lines are parallel to the slit 2 in a confocal manner, for example, as shown in the figure. As shown in the perspective view of FIG.
1 are arranged regularly in a checkerboard pattern on two-dimensional coordinate axes that are perpendicular to each other, and one coordinate axis is the slit 2.
The other coordinate axis is arranged in a direction perpendicular to the slit 2, and a CCD or the like is used.
【0012】本発明の分光測光装置をこのように構成し
たので、スリット2によってライン状に制限された被測
定ネガフィルム1のスリット2長手方向の特定位置から
の透過光は、コリメータ光学系4により平行光束に変換
され、その光束はビームエッキスパンダ5によって図示
のようにスリット2に直交する方向に拡大されたシート
状の平行光束12に変換され、偏光器6によりs成分又
はp成分のみが取り出される。ところで、円筒面干渉フ
ィルタ7は、その表面に設けられた干渉フィルタ膜9が
均一な膜厚のものであるので、その表面に対する入射角
i0 が等しい限り透過波長は等しいが、入射角i0
が異なると、その透過波長及びその透過率は図6(A)
又は(B)のグラフに従って変化する。そして、シート
状平行光束12の断面長手方向において、干渉フィルタ
7は円筒面となっているので、シート状平行光束12は
その断面長手方向位置に応じて円筒面干渉フィルタ7に
対する入射角i0 が異なる。したがって、円筒面干渉
フィルタ7透過後、シート状平行光束12は、その断面
長手方向位置に応じて波長が異なる。すなわち、被測定
ネガフィルム1のスリット2の長手方向の特定位置を透
過した光は、スリット2に直交する方向に拡大され、円
筒面干渉フィルタ7によって、その拡大方向に分光され
たことになる。そのため、図3に示すように、エリアセ
ンサ10のスリット2と直交する方向での位置が分光方
向になり、その方向の光検出素子11からの信号が被測
定ネガフィルム1のスリット2長手方向特定位置の濃度
の分光分布を表すことになる。同様のことが、スリット
2長手方向の別の位置についても言えるので、エリアセ
ンサ10から得られる濃度分布信号は、スリット2と平
行な方向の情報が被測定ネガフィルム1のスリット2長
手方向の濃度分布を、スリット2と直交する方向の情報
がスリット2長手方向特定位置の濃度の分光分布を表す
ことになる。なお、図6(A)及び(B)のグラフから
明らかなように、円筒面干渉フィルタ7に対する入射角
i0 に応じてピーク透過率が異なるので、エリアセン
サ10から得られる分光方向(スリット2と直交する方
向)の信号をこれを補償するように補正しなければなら
ない。また、同様に、分光方向において、得られた信号
を照明光スペクトル分布に応じて補正しなけらばならな
い。さらに、分光方向において、コリメータ光学系4、
ビームエッキスパンダ5等の途中の光学系の測定光分配
の不均一性も補正しなけらばならない。Since the spectrophotometer of the present invention is constructed in this way, the transmitted light from a specific position in the longitudinal direction of the negative film 1 to be measured, which is limited in a line shape by the slit 2, is transmitted by the collimator optical system 4. The beam expander 5 converts the beam into a parallel beam 12 which is expanded in the direction orthogonal to the slit 2 as shown in the figure, and the polarizer 6 extracts only the s component or the p component. It will be done. By the way, since the interference filter film 9 provided on the surface of the cylindrical interference filter 7 has a uniform thickness, the transmission wavelengths are the same as long as the incident angles i0 with respect to the surface are the same.
If the wavelength is different, the transmitted wavelength and the transmittance are as shown in Fig. 6(A).
Or change according to the graph in (B). Since the interference filter 7 has a cylindrical surface in the cross-sectional longitudinal direction of the sheet-like parallel light beam 12, the incident angle i0 of the sheet-like parallel light beam 12 with respect to the cylindrical interference filter 7 differs depending on the position in the cross-sectional longitudinal direction. . Therefore, after passing through the cylindrical interference filter 7, the sheet-like parallel light beam 12 has a different wavelength depending on its cross-sectional longitudinal position. In other words, the light that has passed through a specific position in the longitudinal direction of the slit 2 of the negative film 1 to be measured is expanded in a direction perpendicular to the slit 2, and is separated by the cylindrical interference filter 7 in the expanded direction. Therefore, as shown in FIG. 3, the position of the area sensor 10 in the direction orthogonal to the slit 2 becomes the spectral direction, and the signal from the light detection element 11 in that direction specifies the longitudinal direction of the slit 2 of the negative film 1 to be measured. It represents the spectral distribution of the concentration at the position. The same thing can be said about other positions in the longitudinal direction of the slit 2. Therefore, in the density distribution signal obtained from the area sensor 10, the information in the direction parallel to the slit 2 is the density of the negative film 1 to be measured in the longitudinal direction of the slit 2. Regarding the distribution, information in the direction perpendicular to the slit 2 represents the spectral distribution of the concentration at a specific position in the longitudinal direction of the slit 2. As is clear from the graphs in FIGS. 6(A) and 6(B), the peak transmittance differs depending on the incident angle i0 with respect to the cylindrical interference filter 7, so the spectral direction obtained from the area sensor 10 (slit 2 and the signal in the orthogonal direction) must be corrected to compensate for this. Similarly, in the spectral direction, the obtained signal must be corrected according to the illumination light spectral distribution. Furthermore, in the spectral direction, a collimator optical system 4,
Non-uniformity in measurement light distribution in intermediate optical systems such as the beam expander 5 must also be corrected.
【0013】ところで、被測定ネガフィルム1の2次元
の各画素の分光濃度分布を求めるには、図1、図2に矢
印で示したように、被測定ネガフィルム1を連続的に又
は歩進的に移動させながら、上記のような測定を行えば
よい。By the way, in order to obtain the spectral density distribution of each two-dimensional pixel of the negative film 1 to be measured, the negative film 1 to be measured is continuously or stepwise as shown by the arrows in FIGS. The above measurements may be carried out while moving the object.
【0014】ところで、図6からも明らかなように、単
一の所定膜厚の干渉フィルタの入射角i0 が0°から
90°の範囲で変化しても、分光できる波長範囲は余り
広くはない。分光できる範囲を広げるためには、入射角
i0=0°における透過波長が異なる2以上の干渉フィ
ルタを用い、各干渉フィルタについて、上記と同様にし
て分光測光を行うことにより、分光できる波長範囲をよ
り広くすることができる。その1つの方法としては、図
1のような装置を被測定ネガフィルム1の進行方向に2
段以上設け、各装置の干渉フィルタ7の特性を異ならせ
ればよい。さらに、例えば、図4に示すように、コリメ
ータ光学系4又はビームエッキスパンダ5を通過した光
束をハーフミラーHMで2分し(図1の偏光器6として
偏光ビームスプリッタを用い、この偏光ビームスプリッ
タで分けてもよい。)、分岐された各光束に対して別々
に図1のような装置で分光測光するようにしてもよい。
この場合も、各装置の干渉フィルタ7の特性を異ならせ
るようにする。なお、図4においては、一方の装置の構
成要素の符号に「′」を付して他の装置の構成要素から
区別している。By the way, as is clear from FIG. 6, even if the angle of incidence i0 of a single interference filter with a predetermined film thickness changes in the range of 0° to 90°, the range of wavelengths that can be separated is not very wide. . In order to widen the range of spectroscopy, use two or more interference filters with different transmission wavelengths at the incident angle i0 = 0°, and perform spectrophotometry on each interference filter in the same way as above. It can be made wider. One method is to use a device like that shown in FIG.
It is sufficient to provide more than one stage and make the characteristics of the interference filter 7 of each device different. Furthermore, as shown in FIG. 4, for example, the light beam that has passed through the collimator optical system 4 or the beam expander 5 is divided into two by a half mirror HM (a polarizing beam splitter is used as the polarizer 6 in FIG. ), each branched light beam may be separately subjected to spectrophotometry using an apparatus such as that shown in FIG. In this case as well, the characteristics of the interference filters 7 of each device are made to be different. In FIG. 4, the reference numerals of the components of one device are marked with "'" to distinguish them from the components of the other device.
【0015】次に、干渉フィルタの変形例を図5に示す
。この場合は、上記の円筒面干渉フィルタ7の代わりに
、多角柱形状干渉フィルタ70を用いる。この干渉フィ
ルタ70は、図示のように、中空透明多角柱筒体80の
表面に均一な膜厚の干渉フィルタ膜90を蒸着して形成
したもので、各平面状干渉フィルタ71は、多角柱の中
心軸に対して等しい開き角度δθをなしている。したが
って、エリアセンサ10の分光方向では連続的に分光さ
れるのではなく、図示のように、不連続な波長λ1 〜
λi にサンプリングされて分光される。しかも、多角
柱形状干渉フィルタ70の一方の端部に到るにつれて受
光面積が少なくなるので、分光方向の検出信号をその分
補正しなければならない。Next, a modification of the interference filter is shown in FIG. In this case, a polygonal prism interference filter 70 is used instead of the cylindrical interference filter 7 described above. As shown in the figure, this interference filter 70 is formed by depositing an interference filter film 90 of uniform thickness on the surface of a hollow transparent polygonal cylinder 80, and each planar interference filter 71 is formed of a polygonal cylinder. They form an equal opening angle δθ with respect to the central axis. Therefore, in the spectral direction of the area sensor 10, the light is not dispersed continuously, but as shown in the figure, the wavelengths λ1 to λ1 are discontinuous.
The light is sampled at λi and spectrally analyzed. Furthermore, since the light receiving area decreases toward one end of the polygonal prism-shaped interference filter 70, the detection signal in the spectral direction must be corrected accordingly.
【0016】以上、本発明の分光測光装置をカラー写真
焼付け装置の測光系に適用した場合の実施例について説
明してきたが、本発明はその他種々の分野に適用できる
。例えば、測色計、簡便な分光計、レーザー分光器等。
また、本発明は上記実施例の構成に限定されず、種々の
変形が可能である。Although an embodiment in which the spectrophotometric device of the present invention is applied to a photometric system of a color photographic printer has been described above, the present invention can be applied to various other fields. For example, colorimeter, simple spectrometer, laser spectrometer, etc. Further, the present invention is not limited to the configuration of the above embodiment, and various modifications are possible.
【0017】[0017]
【発明の効果】以上説明したように、本発明の分光測光
装置によると、少なくとも所定方向に広がりがある被測
定平行光束中に、その方向において位置毎に傾角が異な
り相互に同一特性の部分干渉フィルタの組み合せからな
る干渉フィルタ装置を配置し、該干渉フィルタ装置を透
過した光束の前記方向における強度分布を測定する手段
を設け、前記強度分布測定手段からの強度分布信号と対
応する位置の部分干渉フィルタの傾角とを関連付けるこ
とにより被測定光の分光分布を測定するものであるので
、プリズム、回折格子のような波長分散を行わないため
、測光系が簡単でコンパクトになり、また、干渉フィル
タとしては、特定の波長用のものを蒸着すればよく、干
渉フィルタの設計、製造が容易である。また、何ら可動
部分がないので、分光の前後で光軸が変化せず、安定し
て分光ができる。As explained above, according to the spectrophotometer of the present invention, there is partial interference in the parallel light beam to be measured that spreads in at least a predetermined direction, the angle of inclination of which differs from position to position in that direction, and which mutually have the same characteristics. An interference filter device consisting of a combination of filters is disposed, and means for measuring the intensity distribution in the direction of the light beam transmitted through the interference filter device is provided, and partial interference at a position corresponding to the intensity distribution signal from the intensity distribution measuring device is provided. The spectral distribution of the measured light is measured by associating it with the inclination angle of the filter, so it does not cause wavelength dispersion like a prism or diffraction grating, making the photometry system simple and compact, and it can also be used as an interference filter. It is only necessary to deposit a filter for a specific wavelength, making it easy to design and manufacture an interference filter. Furthermore, since there are no moving parts, the optical axis does not change before and after spectroscopy, allowing stable spectroscopy.
【図1】本発明の1実施例の分光測光装置の構成を示す
側面図である。FIG. 1 is a side view showing the configuration of a spectrophotometer according to an embodiment of the present invention.
【図2】図1の装置の斜視図である。FIG. 2 is a perspective view of the device of FIG. 1;
【図3】図1の装置のエリアセンサの構成と作用を説明
するための斜視図である。FIG. 3 is a perspective view for explaining the configuration and operation of the area sensor of the device in FIG. 1;
【図4】別の実施例の構成を示す図である。FIG. 4 is a diagram showing the configuration of another embodiment.
【図5】干渉フィルタの変形例の構成を示す図である。FIG. 5 is a diagram showing the configuration of a modified example of an interference filter.
【図6】干渉フィルタの入射角に対する透過波長特性を
示す図である。FIG. 6 is a diagram showing transmission wavelength characteristics with respect to incident angle of an interference filter.
1…被測定ネガフィルム 2…スリット 3…照明装置 4…コリメータ光学系 5…ビームエッキスパンダ 6…偏光器 7…円筒面干渉フィルタ 8…中空透明円筒体 9…干渉フィルタ膜 10…エリアセンサ 11…光検出素子 12…シート状平行光束 1... Negative film to be measured 2...Slit 3...Lighting device 4...Collimator optical system 5...Beam Expander 6...Polarizer 7...Cylindrical surface interference filter 8...Hollow transparent cylindrical body 9...Interference filter membrane 10...Area sensor 11...Photodetection element 12...Sheet-like parallel light flux
Claims (3)
測定平行光束中に、その方向において位置毎に傾角が異
なり相互に同一特性の部分干渉フィルタの組み合せから
なる干渉フィルタ装置を配置し、該干渉フィルタ装置を
透過した光束の前記方向における強度分布を測定する手
段を設け、前記強度分布測定手段からの強度分布信号と
対応する位置の部分干渉フィルタの傾角とを関連付ける
ことにより被測定光の分光分布を測定することを特徴と
する分光測光装置。1. An interference filter device consisting of a combination of partial interference filters having different inclination angles for each position in that direction and having mutually identical characteristics is arranged in a parallel light beam to be measured that spreads in at least a predetermined direction, and the interference filter Means for measuring the intensity distribution in the direction of the light beam transmitted through the device is provided, and the spectral distribution of the light to be measured is determined by associating the intensity distribution signal from the intensity distribution measuring means with the inclination angle of the partial interference filter at the corresponding position. A spectrophotometric device characterized by measuring.
向のスリットによって制限された領域から出射し、コリ
メート手段によって平行光束に変換され、ビーム径変換
手段によって前記所定方向に拡大された光束からなり、
前記干渉フィルタ装置が軸が前記スリットと平行な円筒
状又は多角柱状に形成された均一膜厚の干渉フィルタか
らなり、また、前記強度分布測定手段が前記所定方向及
前記スリットに平行な方向の2次元分布を測定する2次
元強度分布測定手段からなり、少なくともコリメート手
段と前記強度分布測定手段の間に配置された偏光手段と
を備えたことを特徴とする請求項1記載の分光測光装置
。2. Light to be measured is emitted from a region limited by a slit in a direction perpendicular to the predetermined direction, is converted into a parallel beam by a collimator, and is expanded in the predetermined direction by a beam diameter converter. Become,
The interference filter device comprises an interference filter having a uniform film thickness and formed in a cylindrical or polygonal column shape with an axis parallel to the slit, and the intensity distribution measuring means is arranged in two directions, one in the predetermined direction and the other in a direction parallel to the slit. 2. The spectrophotometer according to claim 1, comprising two-dimensional intensity distribution measuring means for measuring dimensional distribution, and comprising at least collimating means and polarizing means disposed between said intensity distribution measuring means.
測光系に用いられたことを特徴とする請求項1又は2記
載の分光測光装置。3. The spectrophotometric device according to claim 1, wherein the spectrophotometric device is used in a film spectrophotometric system of a color photographic printer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9681891A JPH04326027A (en) | 1991-04-26 | 1991-04-26 | Spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9681891A JPH04326027A (en) | 1991-04-26 | 1991-04-26 | Spectrophotometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04326027A true JPH04326027A (en) | 1992-11-16 |
Family
ID=14175165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9681891A Pending JPH04326027A (en) | 1991-04-26 | 1991-04-26 | Spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04326027A (en) |
-
1991
- 1991-04-26 JP JP9681891A patent/JPH04326027A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8130380B2 (en) | Spectrometer and interferometric method | |
| US5828066A (en) | Multisource infrared spectrometer | |
| US7898656B2 (en) | Apparatus and method for cross axis parallel spectroscopy | |
| EP1144965B1 (en) | Spectrometer | |
| US7365842B2 (en) | Light scanning type confocal microscope | |
| CN111208067A (en) | Spectro-Polarization Imaging Measurement System | |
| US6208413B1 (en) | Hadamard spectrometer | |
| CN108344508A (en) | Wide-spectrum-range asymmetric spatial heterodyne spectrometer | |
| CA2554222A1 (en) | Method and apparatus for multi-mode spectral imaging | |
| EP0399036B1 (en) | Spectrometer apparatus for self-calibrating color imaging apparatus | |
| JPS634650B2 (en) | ||
| US12174069B2 (en) | Multichannel spectrophotometer using linear variable filter sensor | |
| JPS6038644B2 (en) | spectrophotometer | |
| KR101054017B1 (en) | Calibration method of the spectrometer | |
| CN1204382C (en) | Design of multiple grating spectrograph imaging device | |
| KR101803250B1 (en) | Technique and apparatus for spectrophotometry using broadband filters | |
| JPH04326027A (en) | Spectrophotometer | |
| EP1598647A1 (en) | Interferometer and fourier transform spectrometer | |
| JPH04326028A (en) | Spectrophotometer | |
| JPH0658817A (en) | Light wavelength meter | |
| JPH04326026A (en) | Spectrophotometer | |
| JPWO2022168467A5 (en) | ||
| US20250060309A1 (en) | An optical spectrometer and a method for spectrally resolved two-dimensional imaging of an object | |
| JPS6375523A (en) | Spectrophotometer | |
| JPH04138326A (en) | Photometric device |