JPH0434653U - - Google Patents

Info

Publication number
JPH0434653U
JPH0434653U JP7572490U JP7572490U JPH0434653U JP H0434653 U JPH0434653 U JP H0434653U JP 7572490 U JP7572490 U JP 7572490U JP 7572490 U JP7572490 U JP 7572490U JP H0434653 U JPH0434653 U JP H0434653U
Authority
JP
Japan
Prior art keywords
filter
results
flaw
horizontal
horizontal filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7572490U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7572490U priority Critical patent/JPH0434653U/ja
Publication of JPH0434653U publication Critical patent/JPH0434653U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案による疵検出装置の実施例の構
成図、第２図は本考案による実施例の動作の説明
図、第３図は従来の装置の構成図、第４図は従来
の装置の動作の説明図である。 図において、１は入力部、２は画像メモリ、３
は横方向フイルタ、４は縦方向フイルタ、５は判
定部、６は出力部、７は検出すべき疵、８は背景
中の縦線、９，１０は横方向フイルタで検出され
た疵候補、１１は２値化部、１２は検出部である
。なお、各図中同一符号は同一または相当部分を
示す。 Fig. 1 is a block diagram of an embodiment of the flaw detection device according to the present invention, Fig. 2 is an explanatory diagram of the operation of the embodiment according to the present invention, Fig. 3 is a block diagram of a conventional device, and Fig. 4 is a block diagram of a conventional device. It is an explanatory diagram of the operation. In the figure, 1 is an input unit, 2 is an image memory, and 3
is a horizontal filter, 4 is a vertical filter, 5 is a determination unit, 6 is an output unit, 7 is a flaw to be detected, 8 is a vertical line in the background, 9 and 10 are flaw candidates detected by the horizontal filter, 11 is a binarization section, and 12 is a detection section. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 画像を入力する入力装置と、入力された画像デ
ータの走査線方向にフイルタリングする横方向フ
イルタと、横方向フイルタに並行して入力データ
に対して縦方向にフイルタリングする縦方向フイ
ルタと、横方向フイルタと縦方向フイルタの両方
の結果から疵の有無を判定する疵判定部と、結果
を出力する出力部を備えたことを特徴とする疵検
出装置。 an input device that inputs an image; a horizontal filter that filters input image data in the scanning line direction; a vertical filter that filters input data vertically in parallel with the horizontal filter; A flaw detection device comprising: a flaw determination unit that determines the presence or absence of flaws based on the results of both a directional filter and a longitudinal filter; and an output unit that outputs the results.
JP7572490U 1990-07-17 1990-07-17 Pending JPH0434653U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7572490U JPH0434653U (en) 1990-07-17 1990-07-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7572490U JPH0434653U (en) 1990-07-17 1990-07-17

Publications (1)

Publication Number Publication Date
JPH0434653U true JPH0434653U (en) 1992-03-23

Family

ID=31616553

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7572490U Pending JPH0434653U (en) 1990-07-17 1990-07-17

Country Status (1)

Country Link
JP (1) JPH0434653U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015004538A (en) * 2013-06-19 2015-01-08 株式会社 東京ウエルズ Defect inspection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015004538A (en) * 2013-06-19 2015-01-08 株式会社 東京ウエルズ Defect inspection method

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