JPH04349194A - Production of zinc selenide - Google Patents

Production of zinc selenide

Info

Publication number
JPH04349194A
JPH04349194A JP3118578A JP11857891A JPH04349194A JP H04349194 A JPH04349194 A JP H04349194A JP 3118578 A JP3118578 A JP 3118578A JP 11857891 A JP11857891 A JP 11857891A JP H04349194 A JPH04349194 A JP H04349194A
Authority
JP
Japan
Prior art keywords
zinc selenide
electron beam
group
selenium
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3118578A
Other languages
Japanese (ja)
Inventor
Akira Ueno
明 上野
Kazuhiro Okawa
和宏 大川
Tsuneo Mitsuyu
常男 三露
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP3118578A priority Critical patent/JPH04349194A/en
Publication of JPH04349194A publication Critical patent/JPH04349194A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To produce a low-resistance p-type zinc selenide by irradiating a substrate with an electron beam while doping by a radical to move a group atom not accurately positioned into an accurate selenium site by the energy of the electron beam. CONSTITUTION:The surface of a substrate 3 is irradiated with the radical 9b contg. a group V element and an electron beam 12b, when zinc and selenium are simultaneously vapor-deposited by molecular beam epitaxy. Since the radical 9b is electrically neutral and high in reactivity, zinc selenide 4 being produced is not damaged, and a sufficient amt. of a group V atom 10 is doped. Meanwhile, the atom 10, which is placed in zinc selenide but not accurately positioned in the selenium site, is moved into the accurate selenium site by the energy of the electron beam 12b because the substrate is simultaneously irradiated with the electron beam 12b, and high-quality low-resistance p-type zinc selenide 4 is obtained.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は青色発光素子を構成する
材料として有望であるセレン化亜鉛の製造方法に関し、
特にp型セレン化亜鉛の製造方法に関する。
[Industrial Application Field] The present invention relates to a method for producing zinc selenide, which is a promising material for blue light emitting devices.
In particular, it relates to a method for producing p-type zinc selenide.

【0002】0002

【従来の技術】II−VI族化合物は広い禁制帯幅をも
つ半導体であり緑色から紫外にわたる発光素子として期
待されている。特にセレン化亜鉛(ZnSe)は室温で
約2.7eVの禁制帯幅を有するため、青色領域におけ
る高効率発光素子として有望である。しかし、高効率発
光素子を構成するうえで必要な高品質の低抵抗p型セレ
ン化亜鉛は得られていない。従来、p型セレン化亜鉛を
得る試みとして分子ビームエピタキシー(MBE)法を
用いて亜鉛(Zn)とセレン(Se)の同時蒸着時にV
族元素例えば窒素を不純物としてイオン化ドーピングす
る方法があり、この方法によりセレン化亜鉛中にアクセ
プタ準位が形成されることが確認されている。
2. Description of the Related Art Group II-VI compounds are semiconductors with a wide forbidden band width and are expected to be used as light-emitting devices ranging from green to ultraviolet. In particular, zinc selenide (ZnSe) has a forbidden band width of about 2.7 eV at room temperature and is therefore promising as a highly efficient light-emitting element in the blue region. However, high-quality, low-resistance p-type zinc selenide necessary for constructing high-efficiency light-emitting devices has not been obtained. Conventionally, in an attempt to obtain p-type zinc selenide, molecular beam epitaxy (MBE) was used to simultaneously deposit zinc (Zn) and selenium (Se).
There is a method of ionizing doping using a group element such as nitrogen as an impurity, and it has been confirmed that an acceptor level is formed in zinc selenide by this method.

【0003】0003

【発明が解決しようとする課題】しかし,低抵抗のp型
セレン化亜鉛を得るために充分な量の窒素をイオン化ド
ーピングしようとするとイオンダメージのために膜が多
結晶化してしまうという問題があった。
[Problems to be Solved by the Invention] However, when attempting to ionize and dope a sufficient amount of nitrogen to obtain a low-resistance p-type zinc selenide, there is a problem in that the film becomes polycrystalline due to ion damage. Ta.

【0004】本発明は上記の問題を解消し、高品質な低
抵抗のp型セレン化亜鉛を製造する方法を提供すること
を目的とする。
The object of the present invention is to solve the above problems and provide a method for producing high quality, low resistance p-type zinc selenide.

【0005】[0005]

【課題を解決するための手段】この目的を達成するため
本発明は、真空中においてセレン分子線及び亜鉛分子線
を基板表面に照射するとともに、V族元素を含むラジカ
ル及び電子線を前記基板表面に照射してセレン化亜鉛を
製造するものである。
[Means for Solving the Problems] In order to achieve this object, the present invention irradiates the surface of a substrate with a selenium molecular beam and a zinc molecular beam in a vacuum, and also irradiates the surface of the substrate with radicals containing group V elements and an electron beam. zinc selenide is produced by irradiating the

【0006】[0006]

【作用】本発明では、従来法のV族元素のイオン化ドー
ピングの代わりにV族元素を含むラジカルによるドーピ
ングを用いている。V族元素を含むラジカルは電気的に
中性であるのでセレン化亜鉛にダメージを与えず、また
非常に反応性に富んでいるので充分な量のV族原子をド
ーピングできる。しかし、セレン化亜鉛中にドーピング
されたV族原子はセレンサイトに正確に位置して初めて
p型不純物として働くが、セレンサイトからずれてセレ
ン化亜鉛中にはいることが多く、低抵抗のp型セレン化
亜鉛にはならない。これに対して本発明方法によれば、
ラジカルによるドーピングをしながら電子線を照射する
ことにより、電子線のエネルギーにより正確に位置して
いないV族原子を動かして正確なセレンサイトに入れる
ことができ、低抵抗のp型セレン化亜鉛が製造できる。
[Operation] In the present invention, doping with radicals containing a group V element is used instead of ionization doping of a group V element in the conventional method. Since radicals containing group V elements are electrically neutral, they do not damage zinc selenide, and since they are extremely reactive, they can be doped with a sufficient amount of group V atoms. However, group V atoms doped into zinc selenide act as p-type impurities only when they are precisely located on selenium sites, but they often shift from selenium sites and enter zinc selenide, resulting in low resistance p-type impurities. It does not become type zinc selenide. On the other hand, according to the method of the present invention,
By irradiating electron beams while doping with radicals, the energy of the electron beams can move group V atoms that are not located precisely and place them in the correct selenium sites, resulting in low-resistance p-type zinc selenide. Can be manufactured.

【0007】[0007]

【実施例】以下、具体例について詳細に述べる。図1は
本発明の一実施例で使用した分子ビームエピタキシー装
置の概略図を示す。
[Example] Specific examples will be described in detail below. FIG. 1 shows a schematic diagram of a molecular beam epitaxy apparatus used in an embodiment of the present invention.

【0008】まず、表面を清浄にした基板3を基板ホル
ダ5に装着する。基板材料としてはセレン化亜鉛そのも
のの単結晶やセレン化亜鉛に近い格子定数をもつ砒化ガ
リウム(GaAs)単結晶などが好適である。この場合
、砒化ガリウム単結晶を用いた。次に真空槽1を真空ポ
ンプ2を用いて10−9Torr以下程度の超高真空ま
で排気する。その後、シャッター13が閉じた状態でル
ツボ7a、8aをヒーター7b、8bにより加熱し、シ
ャッター7c、8cを開き亜鉛とセレンの分子線7d、
8dの強度比が1となるようにする。
First, the substrate 3 whose surface has been cleaned is mounted on the substrate holder 5. Suitable substrate materials include single crystals of zinc selenide itself and single crystals of gallium arsenide (GaAs) having a lattice constant close to that of zinc selenide. In this case, gallium arsenide single crystal was used. Next, the vacuum chamber 1 is evacuated to an ultra-high vacuum of about 10 -9 Torr or less using the vacuum pump 2 . Thereafter, with the shutter 13 closed, the crucibles 7a and 8a are heated by the heaters 7b and 8b, and the shutters 7c and 8c are opened, and the zinc and selenium molecular beams 7d,
The intensity ratio of 8d is set to 1.

【0009】次に基板3を約600℃に加熱して表面を
さらに清浄化する。その後、基板3をセレン化亜鉛成長
に適切な温度まで下げる。この場合例えば325℃とす
る。次に流量調節弁11を開いてV族原料10この場合
例えば窒素(N2 )をラジカル生成装置9a内に流す
。 この場合、例えば真空槽1内の圧力が1×10−6To
rr程度となるように窒素を流し、また、ラジカル発生
手段として例えば13.56MHzの高周波放電を用い
た。次に例えば高周波電力100Wを印加してラジカル
生成装置9a内に窒素の原子または分子ラジカル9bを
生成させる。ラジカル生成装置9a内に生成されたラジ
カル9bはラジカル生成装置9a内の圧力と真空槽1内
の圧力差により、ラジカル生成装置9a内から真空槽1
内に放出される。さらに、電子線源12aから電子線1
2bを発生させる。この場合、例えば電子線12bの加
速電圧5kV、エミッション電流10μAとした。次に
シャッター13を開いて分子線7d,8dとラジカル9
bさらに電子線12bが基板3表面に照射されるように
する。
Next, the substrate 3 is heated to about 600° C. to further clean the surface. Thereafter, the substrate 3 is lowered to a temperature suitable for zinc selenide growth. In this case, the temperature is, for example, 325°C. Next, the flow control valve 11 is opened to allow the group V raw material 10, in this case, nitrogen (N2), for example, to flow into the radical generator 9a. In this case, for example, the pressure inside the vacuum chamber 1 is 1×10-6To
Nitrogen was flowed so that the temperature was about rr, and a high frequency discharge of, for example, 13.56 MHz was used as a radical generating means. Next, for example, high frequency power of 100 W is applied to generate nitrogen atoms or molecular radicals 9b in the radical generator 9a. The radicals 9b generated in the radical generator 9a are transferred from the radical generator 9a to the vacuum chamber 1 due to the pressure difference between the radical generator 9a and the vacuum chamber 1.
released within. Further, the electron beam 1 from the electron beam source 12a is
Generate 2b. In this case, for example, the acceleration voltage of the electron beam 12b was set to 5 kV, and the emission current was set to 10 μA. Next, open the shutter 13 and combine the molecular beams 7d and 8d with the radical 9.
b Furthermore, the surface of the substrate 3 is irradiated with the electron beam 12b.

【0010】以上のような方法で製造したセレン化亜鉛
は良質な単結晶であった。また、窒素の流量や高周波電
力を調節することによりキャリヤ密度1016〜101
9cm−3のp型セレン化亜鉛を製造できた。
The zinc selenide produced by the method described above was a single crystal of good quality. In addition, by adjusting the nitrogen flow rate and high frequency power, the carrier density can be increased from 1016 to 101.
9cm-3 of p-type zinc selenide could be produced.

【0011】上述の実施例ではV族元素として窒素(N
)を選び、V族原料として窒素を用いたがアンモニア(
NH3 )等の他のガスを用いても同様の効果がある。 同様にV族元素として隣(P)、や砒素(As)を選び
、ホスフィン(PH3 )やアルシン(AsH3 )等
を用いても同様の効果がある。
In the above embodiment, nitrogen (N
) was selected and nitrogen was used as the group V raw material, but ammonia (
A similar effect can be obtained by using other gases such as NH3). Similarly, the same effect can be obtained by selecting phosphorus (P) or arsenic (As) as the V group element and using phosphine (PH3), arsine (AsH3), or the like.

【0012】上述の実施例ではラジカル発生手段として
高周波放電を用いたが、V族原料の光分解によるラジカ
ル発生等の他の手段を用いてもよく、光分解によるラジ
カル発生手段を用いた場合、用いる原料の吸収帯に合わ
せて光源を選択すればよい。
Although high frequency discharge was used as the radical generating means in the above embodiment, other means such as generating radicals by photodecomposition of group V raw materials may also be used. The light source may be selected according to the absorption band of the raw material used.

【0013】また、電子線の加速電圧は1kV以上50
kV以下が適当であり、エミッション電流は1μA以上
500μA以下が適当である。加速電圧、エミッション
電流が小さすぎるとセレンサイトに位置していないV族
原子を動かして正確なセレンサイトに入れることができ
ず、大きすぎると製造したセレン化亜鉛に欠陥が生じる
[0013] Furthermore, the accelerating voltage of the electron beam is 1 kV or more.
A suitable value is kV or less, and an appropriate emission current is 1 μA or more and 500 μA or less. If the accelerating voltage and emission current are too small, group V atoms that are not located in selenium sites cannot be moved and placed in the correct selenium sites, and if they are too large, defects will occur in the produced zinc selenide.

【0014】また、セレン化亜鉛製造中の基板温度は2
00℃以上500℃以下が好適である。200℃以下で
は各原子が正確な格子位置に安定せず、また、500℃
以上では原子の再蒸発が過剰になり原子の空孔が生じる
ので、何れの場合も完全な結晶が得られなくなるためで
ある。
[0014] Also, the substrate temperature during zinc selenide production is 2
The temperature is preferably 00°C or higher and 500°C or lower. At temperatures below 200°C, each atom is not stabilized in its correct lattice position, and at temperatures below 500°C,
This is because in the above case, the re-evaporation of atoms becomes excessive and vacancies of atoms are generated, so that a perfect crystal cannot be obtained in any case.

【0015】以上説明した通り本実施例によれば、分子
ビームエピタキシー法を用いた亜鉛とセレンの同時蒸着
時に、V族元素を含むラジカル9b及び電子線12bを
前記基板3表面に照射すると、ラジカル9bは電気的に
中性であるため製造するセレン化亜鉛4にダメージを与
えず、反応性に富んでいるため充分な量のV族原子10
をドーピングすることができる。また電子線12bを同
時に照射することによりセレン化亜鉛中には存在するが
正確なセレンサイトに位置していないV族原子10を電
子線12bのエネルギーにより動かして正確なセレンサ
イトに入れることができる。この結果高品質な低抵抗p
型セレン化亜鉛4を得ることができる。
As explained above, according to this embodiment, when the surface of the substrate 3 is irradiated with the radicals 9b containing group V elements and the electron beam 12b during simultaneous vapor deposition of zinc and selenium using the molecular beam epitaxy method, the radicals are Since 9b is electrically neutral, it does not damage the zinc selenide 4 produced, and because it is highly reactive, a sufficient amount of group V atoms 10
can be doped. Furthermore, by simultaneously irradiating the electron beam 12b, group V atoms 10 that exist in zinc selenide but are not located in the correct selenium site can be moved by the energy of the electron beam 12b and placed in the correct selenium site. . As a result, high quality low resistance p
Type zinc selenide 4 can be obtained.

【0016】[0016]

【発明の効果】以上のように本発明方法は、真空中にお
いてセレン分子線及び亜鉛分子線を基板表面に照射する
とともに、V族元素を含むラジカル及び電子線を前記基
板表面に照射することにより、高効率青色発光素子を構
成するうえで非常に重要な高品質の低抵抗p型セレン化
亜鉛を効率良く合理的に製造することができる。
As described above, the method of the present invention irradiates the substrate surface with selenium molecular beams and zinc molecular beams in vacuum, and irradiates the substrate surface with radicals containing group V elements and electron beams. , it is possible to efficiently and rationally produce high-quality, low-resistance p-type zinc selenide, which is very important in constructing a high-efficiency blue light-emitting device.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例で使用した分子ビームエピタ
キシー装置の概略図である。
FIG. 1 is a schematic diagram of a molecular beam epitaxy apparatus used in one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1  真空槽 2  真空ポンプ 3  基板 4  セレン化亜鉛 5  基板ホルダ 6  ヒーター 7a  ルツボ 7b  ヒーター 7c  シャッター 7d  亜鉛の分子線 8a  ルツボ 8b  ヒーター 8c  シャッター 8d  セレンの分子線 9a  ラジカル生成装置 9b  ラジカル 10  V族原料 11  流量調節弁 12a  電子線源 12b  電子線 13    シャッター 1 Vacuum chamber 2 Vacuum pump 3 Board 4 Zinc selenide 5 Substrate holder 6 Heater 7a Crucible 7b Heater 7c Shutter 7d Molecular beam of zinc 8a Crucible 8b Heater 8c Shutter 8d Molecular beam of selenium 9a Radical generator 9b Radical 10 Group V raw materials 11 Flow control valve 12a Electron beam source 12b Electron beam 13 Shutter

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  p型セレン化亜鉛を製造する方法であ
って、真空中においてセレン分子線及び亜鉛分子線を基
板表面に照射するとともに、V族元素を含むラジカル及
び電子線を前記基板表面に照射することを特徴とするセ
レン化亜鉛の製造方法。
1. A method for producing p-type zinc selenide, comprising: irradiating a substrate surface with a selenium molecular beam and a zinc molecular beam in a vacuum; and irradiating a radical containing a Group V element and an electron beam onto the substrate surface. A method for producing zinc selenide, comprising irradiation.
JP3118578A 1991-05-23 1991-05-23 Production of zinc selenide Pending JPH04349194A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3118578A JPH04349194A (en) 1991-05-23 1991-05-23 Production of zinc selenide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3118578A JPH04349194A (en) 1991-05-23 1991-05-23 Production of zinc selenide

Publications (1)

Publication Number Publication Date
JPH04349194A true JPH04349194A (en) 1992-12-03

Family

ID=14740060

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3118578A Pending JPH04349194A (en) 1991-05-23 1991-05-23 Production of zinc selenide

Country Status (1)

Country Link
JP (1) JPH04349194A (en)

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