JPH04355346A - Cold heat tester - Google Patents

Abstract

PURPOSE:To achieve smooth exposure at a normal temperature and moreover, a manufacture at a low cost with the simplification of the entire structure by reducing a heat loss in a test tank and making the amount of circulation air of the test tank in the normal-temperature exposure almost equal to that in the exposure at a high temperature. CONSTITUTION:A cold heat tester is equipped with a test tank 1, a heater 23 and a fan 24 and also with a high temperature tank 2 connected to the test tank 1 through a gas supply port 21 and a suction port 22, a cooler 33 and a fan 35. A low temperature tank 3 is connected to the test tank 1 through a gas supply port 31 and a suction port 32 and heat insulating dampers 27 and 28 and 38 and 39 are provided to open or close the gas supply port and the gas suction port. An outside air introduction port 41 is arranged to face an upstream area of the fan 24 and an downstream area of the heater 23 of the high temperature tank 2 and a heat insulating damper 42 is provided to open or close the port. An exhaust port 43 is provided on a side wall 40 on the lee side of the test tank 1 and a damper 44 is provided to open or close the port.

Description

[Detailed description of the invention]

0001

[Industrial Application Field] The present invention is designed to expose various precision equipment, electric and electronic equipment, their related parts, assemblies, units, various materials, etc. to predetermined high and low temperatures, as well as room temperature (usually ambient temperature). This invention relates to a thermal testing device used to examine the durability and strength of such materials against thermal shock and temperature cycles, and to perform thermal stress screening treatments.

0002

[Prior Art] Conventionally, a thermal atmosphere test device disclosed in Japanese Patent Publication No. 58-49817 is used as a device for exposing articles to be subjected to tests such as thermal shock tests or treatments such as screening to high temperatures, low temperatures, or room temperature. It has been known. This device includes a test chamber into which a sample can be taken in and taken out, a heating means and a fan for moving heated high-temperature gas, a high-temperature gas supply tank that supplies high-temperature gas to the test chamber with the fan, a cooling means, and a fan for moving heated high-temperature gas. A low-temperature gas supply tank that is equipped with a fan that moves cooled low-temperature gas and supplies the low-temperature gas to the test chamber with the fan, and an outside air supply that further includes an indoor air supply fan that supplies outside air to the test chamber. equipped with the means.

[0003] The high temperature and low temperature gas supply tanks and the outside air supply means are each equipped with an opening/closing insulating door, and by opening and closing the doors, they are brought into communication or isolation with the test tank.

0004

[Problem to be solved by the invention] Each temperature (high temperature, low temperature,
A total of six gas flow ports, two for each temperature, are provided to the test chamber for supplying and circulating gas (at room temperature), and these gas flow ports are closed by the heat insulating door when not in use. However, since there are many of them and they are installed directly to the test chamber, heat loss due to heat entering the test chamber and heat radiation from the test chamber has become a problem.

[0005] Furthermore, in order to increase the amount of circulating air in the test chamber during normal temperature exposure, as in the case of exposure to other temperatures (high and low temperatures), it is necessary to increase the size of the indoor air supply fan in the outside air supply means. However, there was a problem in that this made the device more expensive. Furthermore, according to the conventional apparatus, each temperature requires a fan for supplying gas at that temperature to the test chamber, which complicates the overall structure of the apparatus and increases manufacturing costs.

[0006] Therefore, the present invention has a method that reduces heat loss in the test chamber compared to the conventional apparatus, and makes it possible to smoothly perform normal temperature exposure by making the test chamber circulation air volume during room temperature exposure approximately the same as that during high temperature exposure. It is an object of the present invention to provide a thermal testing device that can be manufactured at low cost with a simplified overall structure.

[0007]

[Means for Solving the Problems] According to the above object, the present invention includes a test tank, a heating means, and a gas circulation means, and a high temperature tank, a cooling means, and a high temperature tank connected to the test tank via a gas supply port and a suction port. A low-temperature tank comprising a gas circulation means and connected to the test tank via a gas supply port and a suction port, a means for opening and closing the gas supply port and the gas suction port, an upstream region of the gas circulation means of the high-temperature tank, and heating. An outside air introduction port provided in the tank so as to face a downstream region of the means, a means for opening and closing the outside air introduction port, an exhaust port provided in the test tank on the leeward side, and a means for opening and closing the exhaust port. The present invention provides a thermal testing device characterized by the following.

[0008] In order to improve the start-up of the room temperature exposure operation and to make the subsequent room temperature exposure operation smooth, the outside air that passes through the high temperature chamber and is led to the test chamber is unaffected by the heating means in the high temperature chamber as much as possible. The means for opening and closing the outside air inlet of the high temperature tank may be configured to take a position in which the inlet is closed and the heating means is opened, or a position in which the inlet is opened and the heating means is closed. .

[0009]

[Operation] According to the apparatus of the present invention, each temperature exposure is performed as follows. ■ The outside air inlet in the high temperature exposure tank and the exhaust port in the test tank are closed by the opening/closing means, and the gas supply port and suction port related to the low temperature tank are closed by the opening/closing means, and the gas supply port and suction port related to the high temperature tank are closed by the opening/closing means. The mouth is opened, high temperature gas circulates between the high temperature tank and the test tank, and the inside of the test tank is exposed to a predetermined high temperature.

[0010] The cryostat is operated for pre-cooling as necessary. ■ The outside air inlet in the low temperature exposure high temperature tank and the exhaust port in the test tank are closed by the opening/closing means, and the gas supply port and suction port related to the high temperature tank are also closed by the opening/closing means. The suction port is opened, low temperature gas circulates between the cryostat and the test chamber, and the inside of the test chamber is exposed to a predetermined low temperature. The high temperature tank is operated for preheating as necessary. ■The outside air inlet in the high-temperature chamber exposed to room temperature and the exhaust port in the test chamber are opened, and the gas supply and suction ports for the high-temperature chamber are opened, while the gas supply and suction ports for the low-temperature chamber are opened and closed by the opening/closing means. Closed.

By operating the gas circulation means in the high-temperature chamber, outside air is introduced into the high-temperature chamber from the outside air inlet, further supplied into the test chamber from the gas supply port, and the gas inside the test chamber is introduced from the exhaust port of the test chamber. being pushed outside. Thus, the inside of the test chamber is exposed to room temperature. During the room temperature exposure, the cryostat is operated for pre-cooling, if necessary. When the opening/closing means for the outside air inlet is one that closes the heating means when the opening is opened, the heating means is thereby closed, and the flow of gas attempting to pass through the heating means in the high temperature tank is blocked to that extent; ,
The outside air that passes through the high temperature chamber and enters the test chamber is cut off from the heating means and is not or less susceptible to its effects.

When the heating means is closed by the opening/closing means in this way, depending on the degree of insulation of the opening/closing means,
If necessary, preheating operation of the heating means can also be considered.

[0013]

Embodiments Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 shows a schematic cross section of one embodiment. This thermal testing device is equipped with a test tank 1, a high temperature tank 2 provided through a heat insulating wall 11, and a low temperature tank 3 provided through a heat insulating wall 12. surrounded by 10.

The high temperature chamber 2 can be communicated with the test chamber 1 through a gas supply port 21 and a gas suction port 22 provided in the heat insulating wall 11, and the low temperature chamber 3 can communicate with the test chamber 1 through a gas supply port 31 and a gas suction port 22 provided in the heat insulating wall 12. Test tank 1 via gas inlet 32
It is now possible to communicate with The high temperature tank 2 is equipped with an electric heater 23, and the downstream side of the heater,
In addition, a gas circulation fan 2 is provided at a position facing the gas supply port 21.
It is equipped with 4. The fan 24 is rotationally driven by a motor 25 provided on the outer wall 10. Further, an auxiliary gas circulation passage 26 for preheating is provided in the high temperature tank 2.

On the other hand, the low temperature chamber 3 is equipped with a cooler 33 and an electric heater 34 for temperature adjustment downstream of the cooler 33, and a fan for gas circulation located downstream of the heater 34 and facing the gas supply port 31. It is equipped with 35. The fan 35 is rotationally driven by a motor 36 provided on the outer wall 10. The cryostat 3 further includes an auxiliary gas circulation passage 37 for precooling.

The gas supply port 21 and the suction port 22, which connect the high temperature chamber and the test chamber 1, are provided with adiabatic dampers 27 and 28, respectively, to open and close them. 31 and the suction port 32 are provided with heat insulating dampers 38 and 39 for opening and closing them, respectively. These dampers are rotatably provided and are driven to open and close by driving means (not shown).

An outside air inlet 41 is provided in the heat insulating ceiling wall 4 of the high temperature tank 2 at a position facing the upstream area of the fan 24 and the downstream area of the heater 23 in the high temperature tank 2.
1 is provided with a heat insulating damper 42 that opens and closes it. In addition, an outside air inlet 41 is provided on the leeward side wall 40 of the test tank 1.
A corresponding exhaust port 43 is provided, and this port 43 is provided with a heat insulating damper 44. These dampers are also driven to open and close by driving means (not shown).

In the test chamber 1, on both sides of the inner space of the area where the dampers 27, 28, 38, and 39 rotate, there is a high temperature chamber or a low temperature chamber for rectifying the circulating gas, or (and) articles in the test chamber. Members A and B in the form of wire mesh or grid are provided to prevent accidents such as being sucked into or falling off. Note that articles are taken in and out of the test chamber 1 through an opening/closing door (not shown) provided at least in front of the space sandwiched between members A and B.

According to the thermal testing apparatus shown in FIG. 1, each temperature exposure is performed as follows. The outside air inlet 41 in the high-temperature exposure tank 2 and the exhaust port 43 in the test tank 1 are connected to the heat insulating damper 42.
, 44, respectively, and the gas supply port 31 and suction port 32, which connect the low temperature chamber 3 and the test chamber 1, are closed by dampers 38, 39, respectively. On the other hand, a gas supply port 21 and a suction port 22 that communicate the high temperature tank 2 and the test tank 1 are opened to the test tank 1 by opening the dampers 27 and 28 . In the high-temperature chamber, the heater 23 is turned on and the fan 24 is operated, and the high-temperature gas generated by the heater 23 is supplied into the test chamber 1 from the opening 21 by the fan 24, and is also supplied from the test chamber 1 through the suction port 22. Then, it is circulated so that it is sucked into the high temperature bath 2 again. In this way, the inside of the test tank 1 is exposed to a predetermined high temperature, and the articles in the test tank are exposed to the high temperature.

During this high temperature exposure, in the low temperature chamber 3,
If necessary, the cooler 33, heater 34, and fan 35 are operated, and the auxiliary passage 37 is used to circulate gas in the direction a within the tank, thereby performing a precooling operation. The outside air inlet 41 in the low-temperature exposure high-temperature tank 2 and the exhaust port 43 in the test tank 1 are closed by dampers 42 and 44, respectively, and the ports 21 and 22 that communicate the high-temperature tank 2 and the test tank 1 are closed by dampers 27 and 28, respectively. It will be done. on the other hand,
Openings 31 and 32 that communicate the low temperature chamber 3 and the test chamber 1 are opened to the test chamber 1 by opening the dampers 38 and 39. Gas at a predetermined low temperature generated by the operation of the cooler 33 and the heater 34 in the cryostat 3 is supplied into the test chamber 1 from the gas supply port 31 by the operation of the fan 35, and is returned to the cryostat from the suction port 32. It circulates as if being sucked into 3. In this way, the inside of the test chamber 1 is exposed to a predetermined low temperature,
Articles within the tank are exposed to low temperatures.

During this low temperature exposure, in the high temperature bath 2,
If necessary, the heater 23 and fan 24 are operated to circulate gas in the direction a within the tank using the auxiliary passage 26, thereby performing a preheating operation. The outside air inlet 41 of the room temperature exposure high temperature tank and the exhaust port 43 of the test tank 1 are connected to the damper 42.
, 44 is opened to the outside, and the high temperature tank 2 is opened.
The air supply port 21 of the test chamber 1 is opened by opening the damper 27.
open to On the other hand, the gas supply port 31 and suction port 32 of the low temperature chamber 3 are closed by closing the dampers 38 and 39. Further, the heater 23 in the high temperature tank is stopped. The fan 24 is operated, and as a result of the operation of the fan 24, outside air is sucked into the high temperature chamber 2 through the outside air inlet 41, and further supplied to the test chamber 1 through the gas supply opening 21. Further, the gas in the test chamber 1 is exhausted to the outside from the exhaust port 43. In this way, outside air circulates in the test tank 1, and the articles in the test tank 1 are exposed to room temperature.

[0022] During this room temperature exposure, precooling operation can be performed in the low temperature bath 3 if necessary. According to the thermal testing device, the outside air inlet 41 is not provided directly to the test tank 1 but is provided to the ceiling wall 4 of the high temperature tank 2, so the number of openings to the test tank 1 is reduced accordingly. In both the high-temperature exposure operation and the low-temperature exposure operation, heat loss due to heat dissipation from the test chamber 1 or heat entering the test chamber 1 is reduced accordingly, and performance is improved. In addition, the fan 24 of the high-temperature tank is used for room-temperature exposure, and the room-temperature exposure can be performed with approximately the same amount of air as during high-temperature exposure operation, so that the room-temperature exposure starts up faster and can be performed more smoothly. . Furthermore, when moving from low-temperature exposure to room-temperature exposure, by preheating the high-temperature chamber 2 beforehand, the outside air that was heated at the beginning of the room-temperature exposure is sent into the test chamber 1, so that the start-up of the room-temperature exposure is also improved in this respect. early. Furthermore, the thermal testing device does not require a separate fan for introducing and discharging outside air, so the overall configuration is simplified accordingly.

[0023] Also, the outside air inlet 41 and the exhaust port 43
can also be used as follows: That is, in high temperature exposure operation, dampers 42, 4 that open and close these ports 41, 43
By opening 4 by adjusting the opening degree, high temperature exposure operation becomes possible over a wider temperature range. Furthermore, when it becomes necessary to lower the preheating temperature in order to lower the set temperature for the high temperature exposure operation, the preheating temperature can be quickly lowered by opening the port 41 at an appropriate opening degree during the preheating operation of the high temperature tank. These points also improve the performance of the device.

Next, another embodiment shown in FIG. 2 will be explained. This thermal testing apparatus is equipped with an adiabatic damper 45 in place of the damper for introducing outside air in the apparatus shown in FIG. The damper 45 is provided in the high temperature tank 2 so as to open and close the outside air inlet 41. The damper 45 is provided so that the outlet side of the heater 23 can be closed at the same time as the outside air inlet 41 is opened, and so that the outlet of the heater 23 can be opened at the same time as the opening 41 is closed.

According to this device, during normal temperature exposure, the damper 45 closes the outlet side of the heater 23, thereby blocking the gas flow through the heater 23 and preventing the outside air from passing through the high temperature chamber and flowing into the test chamber 1. is not affected by the heater 23,
Alternatively, the heater 23 is kept warm while making it difficult to receive heat. Therefore, in normal temperature exposure after high temperature exposure, the start of the normal temperature exposure can be made faster, and the start of the subsequent high temperature exposure can also be made faster.

[0026] Furthermore, according to this device, during room temperature exposure,
Since the damper 45 closes the heater 23, when exposing to a high temperature continuously after exposing to a room temperature, it is also possible to turn on the heater 23 in advance prior to the high temperature exposure. The rest of the structure and operation are the same as those of the device shown in FIG.

[0027]

[Effects of the Invention] As explained above, according to the present invention, there is less heat loss in the test chamber than in the conventional apparatus, and
It is possible to provide a thermal testing device that can smoothly carry out normal temperature exposure by making the test tank circulation air volume during room temperature exposure approximately the same as that during high temperature exposure, and further has a simplified overall structure and can be manufactured at low cost. .

[0028] When the means for opening and closing the outside air inlet of the high-temperature tank is configured to close the heating means when the opening is opened, the performance of the apparatus is further improved.

[Brief explanation of the drawing]

FIG. 1 is a schematic cross-sectional view showing one embodiment of the present invention.

FIG. 2 is a schematic cross-sectional view of another embodiment of the invention.

[Explanation of symbols]

1 Test chambers 11, 12, 10 Heat insulation wall 2 High temperature tank 21 Gas supply port 22 Gas suction port 23 Heater 24 Gas circulation fan 25 Motor 26 Preheating auxiliary passages 27, 28 Heat insulation damper 3 Low temperature tank 31 Gas supply port 32 Gas Suction port 33 Cooler 34 Temperature adjustment heater 35 Gas circulation fan 36 Motor 37 Pre-cooling auxiliary passages 38, 39 Insulating damper 4 High temperature chamber ceiling wall 40 Test chamber side wall 41 Gas inlet 43 Exhaust ports 42, 44 Insulating damper A, B Flow rectification and/or article passage blocking member 45
insulation damper

Claims (2)

[Claims] 1. A test chamber, a heating means, and a gas circulation means, comprising a high temperature bath, a cooling means, and a gas circulation means connected to the test chamber through a gas supply port and a suction port,
A low temperature chamber connected to the test chamber via a gas supply port and a suction port, means for opening and closing the gas supply port and gas suction port, and an upstream region of the gas circulation means of the high temperature chamber and a downstream region of the heating means. A cooling and cooling method characterized by comprising an outside air inlet provided in the test tank, a means for opening and closing the outside air inlet, an exhaust port provided on the leeward side of the test tank, and a means for opening and closing the exhaust port. Test equipment. 2. The means for opening and closing the outside air inlet of the high temperature tank is configured to take a position in which the inlet is closed and the heating means is opened, or a position in which the inlet is opened and the heating means is closed. The thermal testing device according to claim 1.