JPH0436465U - - Google Patents
Info
- Publication number
- JPH0436465U JPH0436465U JP7850590U JP7850590U JPH0436465U JP H0436465 U JPH0436465 U JP H0436465U JP 7850590 U JP7850590 U JP 7850590U JP 7850590 U JP7850590 U JP 7850590U JP H0436465 U JPH0436465 U JP H0436465U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- guide
- contact
- contact probe
- probe pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 6
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案の一実施例を示す側断面図、第
２図は従来例を示す側断面図である。
１……コンタクトピン、１ａ……拡径部、１ｂ
……コンタクト部、１ｃ……誘導部、５……ピン
ガイド、５ａ……ガイド孔。
FIG. 1 is a side sectional view showing an embodiment of the present invention, and FIG. 2 is a side sectional view showing a conventional example. 1... Contact pin, 1a... Expanded diameter part, 1b
...Contact part, 1c...Guiding part, 5...Pin guide, 5a...Guide hole.
Claims (1)
ブピンであつて、 コンタクトピンは、ピンガイドのガイド孔を通
過するもので、実装基板の電極パツドに接触する
コンタクト部と、該コンタクトピンをピンガイド
のガイド孔に案内誘導する誘導部とを有するもの
であることを特徴とするコンタクトプローブピン
。 (2) 前記コンタクトピンは、ピンガイドのガイ
ド孔を通過する箇所に拡径部を有するものであり
、 前記コンタクト部は、拡径部の先端に形成され
たものであり、 前記誘導部は、拡径部の先端に形成されたもの
であることを特徴とする請求項第(1)項記載のコ
ンタクトプローブピン。 (3) 前記誘導部は、テーパ状に構成されたもの
であることを特徴とする請求項第(1)項、第(2)項
記載のコンタクトプローブピン。[Claims for Utility Model Registration] (1) A contact probe pin having a contact pin, which passes through a guide hole of a pin guide, and has a contact portion that contacts an electrode pad of a mounting board, and a contact probe pin that passes through a guide hole of a pin guide. 1. A contact probe pin comprising a guide portion for guiding the contact pin into a guide hole of a pin guide. (2) The contact pin has an enlarged diameter portion at a location where it passes through the guide hole of the pin guide, the contact portion is formed at the tip of the enlarged diameter portion, and the guide portion: The contact probe pin according to claim 1, wherein the contact probe pin is formed at the tip of the enlarged diameter portion. (3) The contact probe pin according to claims (1) and (2), wherein the guide portion has a tapered shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7850590U JPH0436465U (en) | 1990-07-24 | 1990-07-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7850590U JPH0436465U (en) | 1990-07-24 | 1990-07-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0436465U true JPH0436465U (en) | 1992-03-26 |
Family
ID=31621838
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7850590U Pending JPH0436465U (en) | 1990-07-24 | 1990-07-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0436465U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010085398A (en) * | 2008-09-05 | 2010-04-15 | Nidec-Read Corp | Inspection tool for substrate inspection |
-
1990
- 1990-07-24 JP JP7850590U patent/JPH0436465U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010085398A (en) * | 2008-09-05 | 2010-04-15 | Nidec-Read Corp | Inspection tool for substrate inspection |