JPH0436687A - Radiation detector - Google Patents

Radiation detector

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Publication number
JPH0436687A
JPH0436687A JP14141690A JP14141690A JPH0436687A JP H0436687 A JPH0436687 A JP H0436687A JP 14141690 A JP14141690 A JP 14141690A JP 14141690 A JP14141690 A JP 14141690A JP H0436687 A JPH0436687 A JP H0436687A
Authority
JP
Japan
Prior art keywords
array
width
substrate
photoelectric conversion
conversion element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14141690A
Other languages
Japanese (ja)
Inventor
Tetsuhiko Takahashi
哲彦 高橋
Manabu Nakagawa
中河 学
Hideji Fujii
秀司 藤井
Minoru Yoshida
稔 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Healthcare Manufacturing Ltd
Original Assignee
Hitachi Medical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Medical Corp filed Critical Hitachi Medical Corp
Priority to JP14141690A priority Critical patent/JPH0436687A/en
Publication of JPH0436687A publication Critical patent/JPH0436687A/en
Pending legal-status Critical Current

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  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To reduce the image ring artifact of an X-ray CT device by specifying the width of a substrate supporting a photoelectric conversion element array, and setting the width of the array less than that of the substrate. CONSTITUTION:A scintillator array 1 which converts X-rays to light, the photoe lectric conversion element array 2, and the substrate 3 are laminated on a radiation detection block 4. A detector is comprised by arranging plural blocks 4 in polyhedral shape along a circular arc. At this time, assuming the pitch of the array 2 as (a), the number of channels of the array in the block 4 as (c), the radius of the circular arc as (r), and the sum of width of the arrays 1, 2 as (d), and assuming the substrate (b) as a X c X (r+d)/r>b, no contact of neighboring substrates (b) occurs, and no pitch deviation at a terminal part occurs. also, when it is b<aXc, the deterioration of the array 2 due to handling in a packaging process can be remarkable reduced. Therefore, the ring arcthifact generating uniquely in a terminal channel can be reduced by setting the width (b) of the substrate within such range.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明はX線断層撮影装置に関して、特に医療用Xl1
CT装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an X-ray tomography apparatus, and particularly to medical
Regarding CT equipment.

[従来の技術] X#CT装置の検出器として、近年X線を光に変換する
シンチレータと、この光を電気信号に変換するための光
電変換素子としてのフォトダイオードからなる固体検出
器が提案されている。これは本質的に画像のS/Nが良
いため、現在注目されている技術の1つである。この構
造の検出器では組立工程の簡略化や高精度な素子配列を
達成するため複数個の素子をまとめて形成するブロック
化構造が取られている。そして該放射線検出素子ブロッ
クを、放射線発生部を中心とする円弧上に沿って多面体
状に複数個配置し被検体のX線透過像(1次元像)を検
出する。この場合ブロック端部の素子の特性が他の素子
とわずかに異なる場合が多い。
[Prior Art] As a detector for an X#CT device, a solid-state detector consisting of a scintillator that converts X-rays into light and a photodiode as a photoelectric conversion element that converts this light into an electrical signal has been proposed in recent years. ing. This is one of the technologies that is currently attracting attention because it inherently has a good S/N ratio of images. A detector with this structure has a block structure in which a plurality of elements are formed together in order to simplify the assembly process and achieve highly accurate element arrangement. A plurality of the radiation detection element blocks are arranged in a polyhedral shape along an arc centered on the radiation generating part to detect an X-ray transmission image (one-dimensional image) of the subject. In this case, the characteristics of the elements at the end of the block are often slightly different from those of other elements.

一方、第3世代方式のX1iCT装置では、CT用検出
器の感度の素子間のバラツキはCT画像上にリングアー
チファクトを生じる原因となる。そのため上記ブロック
化構造の検出器を用いた場合、ブロック継目に相当する
画像上の場所にしばしばリングアーチファクトが現われ
る。これを低減するための検出器の実装方法として、ブ
ロック状検出器の固定方法やブロック間の継目を工夫す
る等の例がある。しかし、昨今の医療診断の高性能化、
高機能化に伴い、ユーザーからの要求は厳しくなってき
ており、従来の実装方法ではリングアーチファクトの低
減が不十分であった。
On the other hand, in the third-generation X1iCT apparatus, variations in the sensitivity of the CT detector between elements cause ring artifacts to occur on CT images. Therefore, when a detector having the above-mentioned block structure is used, ring artifacts often appear at locations on the image corresponding to block joints. Examples of detector mounting methods to reduce this include fixing a block-shaped detector and devising joints between blocks. However, with the recent advances in the performance of medical diagnosis,
With the increasing functionality, demands from users have become stricter, and conventional mounting methods have not been sufficient to reduce ring artifacts.

一方、検出素子の特性とリングアーチファクトの関係に
関して、例えばパーカーらの考察がある(メディカルフ
ィジックス第9巻、7,8月号。
On the other hand, regarding the relationship between the characteristics of the detection element and the ring artifact, for example, there is a study by Parker et al. (Medical Physics Vol. 9, July/August issue).

1982年、531−539頁)。しかし従来、多面体
状ブロック構造の素子と画像の関係についての検討はほ
とんどされていない。
(1982, pp. 531-539). However, until now, little consideration has been given to the relationship between elements having a polyhedral block structure and images.

その理由としては、従来広く用いられている検出器であ
る電離箱では、その構造から多面体状構造にする必要が
なく、本質的に素子特性がばらつかなかったためである
。即ち、シンチレータと光電変換素子からなるようなブ
ロック状素子を多面体状に配置した場合においてのみ、
リングアーチファクトの除去が重要な重要な課題となっ
ている。
The reason for this is that the structure of the ionization chamber, which is a conventionally widely used detector, does not require a polyhedral structure, and there is essentially no variation in element characteristics. That is, only when block-shaped elements such as scintillators and photoelectric conversion elements are arranged in a polyhedral shape,
Removal of ring artifacts has become an important issue.

そこで、多面体状に配置されたブロック状検出器の基礎
的特性を検討し、検出器感度のバラツキが起きにくい検
出素子ブロックの構造を考案し本発明に至った。
Therefore, we studied the basic characteristics of block-shaped detectors arranged in a polyhedral shape, devised a structure of a detection element block that is less likely to cause variations in detector sensitivity, and arrived at the present invention.

なお、本発明に関連する従来技術として、「特開昭64
−88078J  r特開昭63−151886Jなど
を挙げることができる。
In addition, as a prior art related to the present invention, "Unexamined Japanese Patent Publication No. 1983
-88078J r JP-A-63-151886J, etc. can be mentioned.

[発明が解決しようとする課題] 本発明はXICT装置の画像リングアーチファクトを低
減することを目的とする6 [課題を解決するための手段] 上記課題を解決する手段として、放射線を光に変換する
シンチレータアレイと眩光をそれぞれ電気信号に変換す
るための光電変換素子アレイ、光電変換素子アレイを支
持する基板が積層してなる放射線検出ブロックを、円弧
上に沿って多面体状に複数個配置して成る放射線検出器
において、光電変換素子アレイのピッチをa、ブロック
内アレイのチャンネル数人01円弧の半径をr、シンチ
レータと光電変換素子の厚さの和をd、としたとき、基
板幅すが、 a * c *(r+d)/ r>b>a * cであ
りかつ、光電変換素子アレイ幅eが、基板幅すより小さ
いことを特徴とした放射線検出器を提案する。
[Problems to be Solved by the Invention] The present invention aims to reduce image ring artifacts in an XICT device.6 [Means for Solving the Problems] As a means for solving the above problems, radiation is converted into light. A plurality of radiation detection blocks each consisting of a scintillator array, a photoelectric conversion element array for converting glare into electrical signals, and a substrate supporting the photoelectric conversion element array are arranged in a polyhedral shape along an arc. In a radiation detector, when the pitch of the photoelectric conversion element array is a, the radius of the arc of the number of channels in the array in a block is r, and the sum of the thicknesses of the scintillator and the photoelectric conversion element is d, the substrate width is We propose a radiation detector characterized in that a*c*(r+d)/r>b>a*c and the photoelectric conversion element array width e is smaller than the substrate width.

[作用] 本発明では、光電変換素子アレイ幅が基板幅よりも小さ
いので検出器実装工程でのハンドリングにより端部チャ
ンネルの暗電流増加を防ぐことができる。また基板幅は
a木C木(r+d)/rよりも小さいので複数ブロック
を多面体状に配置した際端部素子のピッチずれがおきな
い。従って端部チャンネルに特異的に生じていたリング
アーチファクトを低減することができる。
[Function] In the present invention, since the photoelectric conversion element array width is smaller than the substrate width, an increase in dark current in the end channel can be prevented by handling in the detector mounting process. In addition, since the substrate width is smaller than a tree C tree (r+d)/r, pitch deviation of end elements does not occur when a plurality of blocks are arranged in a polyhedral shape. Therefore, it is possible to reduce ring artifacts that have specifically occurred in the end channels.

[実施例コ まず第2図に本発明が適用されるX線CT装置のブロッ
ク図を示す。X線管11から放出されたX線束12は被
写体13を透過し、検出部14により検出される。即ち
、ここでX線強度信号は電流信号に変換される。この部
分は、本実施例では図示されていない、温度制御部によ
り恒温化されていても良い。検出部14からの電流信号
は検出回路部15で電圧信号に変換される。この電圧信
号はA/D変換部16でアナログ信号からデジタル信号
に変換され、信号処理部17に送られる。
[Embodiment] First, FIG. 2 shows a block diagram of an X-ray CT apparatus to which the present invention is applied. X-ray flux 12 emitted from X-ray tube 11 passes through object 13 and is detected by detection section 14 . That is, here the X-ray intensity signal is converted into a current signal. This portion may be kept at a constant temperature by a temperature control section, which is not shown in this embodiment. The current signal from the detection section 14 is converted into a voltage signal by the detection circuit section 15. This voltage signal is converted from an analog signal to a digital signal by the A/D converter 16 and sent to the signal processor 17.

信号処理部17では信号補正、例えば、検出部、検出回
路部の各チャンネルごとの感度補正やオフセット補正を
行う。こうして補正されたデータ群により1次元投影デ
ータが得られる。
The signal processing section 17 performs signal correction, for example, sensitivity correction and offset correction for each channel of the detection section and detection circuit section. One-dimensional projection data is obtained from the data group corrected in this way.

第3世枚方式のX@CTではX線管11と検出部14を
同時に回転しながら多数の投影データを取得し、これら
をもとに断層像を計算する。この演算を行うのが画像処
理部18である。演算により得られた断層像は、画像表
示部19で表示される。上記CT装置の各構成部分は制
御部20により制御されている。
In the third generation X@CT, a large amount of projection data is acquired while simultaneously rotating the X-ray tube 11 and the detection unit 14, and a tomographic image is calculated based on this data. The image processing section 18 performs this calculation. The tomographic image obtained by the calculation is displayed on the image display section 19. Each component of the CT apparatus is controlled by a control section 20.

次に第3図を使って本発明に用いる検出素子ブロック4
について説明する。
Next, using FIG. 3, detecting element block 4 used in the present invention.
I will explain about it.

放射線検出素子30はシンチレータと光電変換素子から
なる。X線はシンチレータにより光に変換され、この光
はシンチレータと光学的に密着した光電変換素子、例え
ばSiフォトダイオードより電流信号に変換される。こ
のフォトダイオードの出力は基板3上の導線(図には示
していない)、コネクタ32を介して検出回路部、例え
ばOPアンプを用いた電流電圧変換回路(図には示して
いない)に送られ電圧変換される。このようなブロック
ではフォトダイオードを単一ウェハから作成するので素
子を円弧上に配置することは困難である。
The radiation detection element 30 consists of a scintillator and a photoelectric conversion element. The X-rays are converted into light by a scintillator, and this light is converted into a current signal by a photoelectric conversion element, such as a Si photodiode, which is optically in close contact with the scintillator. The output of this photodiode is sent to a detection circuit section, for example, a current-voltage conversion circuit (not shown) using an OP amplifier, via a conductor (not shown) on the board 3 and a connector 32. The voltage is converted. In such a block, since the photodiodes are fabricated from a single wafer, it is difficult to arrange the elements on a circular arc.

そこで、このような平面ブロックを複数個並べて多面体
状に配置する。その場合端部素子(図では1チヤンネル
と18チヤンネル)が他の素子と異なる特性を示すこと
がわかった。即ち検出器実装工程で端部チャンネルの光
電変換素子の暗電流が第4図に示したように増加してい
た。従ってこの端部チャンネルの大きな暗電流により端
部素子に非直線的応答が生じCT両画像リングアーチフ
ァクトが生じていた。このような場合、通常は基板幅を
光電変換素子幅より大きくし、検出器実装工程のハンド
リング時に素子特性の劣化が起きないようにする。
Therefore, a plurality of such planar blocks are arranged in a polyhedral shape. In this case, it was found that the end elements (1 channel and 18 channel in the figure) exhibit characteristics different from other elements. That is, during the detector mounting process, the dark current of the photoelectric conversion element in the end channel increased as shown in FIG. Therefore, this large dark current in the end channel caused a non-linear response in the end element, causing ring artifacts in both CT images. In such cases, the substrate width is usually made larger than the photoelectric conversion element width to prevent deterioration of element characteristics during handling during the detector mounting process.

しかしこのような検出器では多数ブロックを多面体状に
配置するために基板幅が検出素子ピッチから計算される
ブロック幅にたいして極端に大きいと素子ピッチのずれ
が生じ、CT両画像質が低下することがわかった。そこ
で基板幅の最適値を検討した。
However, in such a detector, many blocks are arranged in a polyhedral shape, so if the substrate width is extremely large compared to the block width calculated from the detection element pitch, a shift in the element pitch will occur, and the quality of both CT images may deteriorate. Understood. Therefore, we investigated the optimal value for the board width.

第1図を用いて以下これを説明する。This will be explained below using FIG.

放射線検出ブロック4はシンチレータアレイ1と光電変
換素子アレイ2、基板3が積層されてなる。このブロッ
クを円弧上に沿って多面体状に複数個配置してXAiC
T用放射線検出器とする。光電変換素子アレイ2のピッ
チをa、ブロック内アレイのチャンネル数をc、円弧の
半径をr、シンチレータと光電変換素子の厚さの和をd
、とするとき、基板幅すを、 ate本(r+d)/r>b とすれば、隣接する基板同志が接触することが無く、従
ってブロック端部におけるピッチずれが起こらず、CT
用検出器として好適である。また基板*bを、 b ) a * c る検出素子劣化が大幅に減少した。従って基板幅の最適
範囲は、 a*c本(r+d)/r>b>a * cである。
The radiation detection block 4 is formed by laminating a scintillator array 1, a photoelectric conversion element array 2, and a substrate 3. XAiC by arranging a plurality of these blocks in a polyhedral shape along an arc
This is a radiation detector for T. The pitch of the photoelectric conversion element array 2 is a, the number of channels in the array in a block is c, the radius of the circular arc is r, and the sum of the thicknesses of the scintillator and photoelectric conversion element is d.
, and if the substrate width is set as (r+d)/r>b, then adjacent substrates will not come into contact with each other, so no pitch deviation will occur at the end of the block, and the CT
It is suitable as a detector for Furthermore, the deterioration of the detection element caused by the substrate *b was significantly reduced. Therefore, the optimum range of substrate width is a*c lines (r+d)/r>b>a*c.

以上のように基板幅を設定すれば、光電変換素子幅を基
板幅より小さくすることができ、かつブロック端部にお
ける素子ピッチのずれが生じずCT両画像質が低下しな
いことがわがった。
It has been found that by setting the substrate width as described above, the photoelectric conversion element width can be made smaller than the substrate width, and there is no deviation in the element pitch at the end of the block and the quality of both CT images does not deteriorate.

以下では具体的検出器構造の一例を述べる。An example of a specific detector structure will be described below.

全身用第3世代XICT装置を考えた場合1例えば検出
素子の厚みとブロック配列の半径それぞれ、 d=1.50mm r=1200.oomm とすれば基板幅すは、 a * c * 1.0013>b>a>* cとする
ことにより実装工程でのハンドリングによが適当である
。さらに、検出ピッチとブロック内素子数を例えば、 a”1.00mm c=24.o。
When considering a 3rd generation XICT device for the whole body, 1. For example, the thickness of the detection element and the radius of the block arrangement, respectively, d = 1.50 mm r = 1200. oomm, the board width is a*c*1.0013>b>a>*c, which is suitable for handling in the mounting process. Furthermore, the detection pitch and the number of elements in the block are, for example, a"1.00mm c=24.o.

として設定すれば基板幅すは、 24.03>b>2.00 となる。そこで基板幅を24.02mm、光電変換素子
幅を24.00mmとすれば基板幅は光電変換素子に対
して両端部においてそれぞれ0.010mm広くなり、
ブロック端部のハンドリングによる素子劣化を防ぐこと
が出来る。
If the width is set as 24.03>b>2.00. Therefore, if the substrate width is 24.02 mm and the photoelectric conversion element width is 24.00 mm, the substrate width will be 0.010 mm wider at both ends than the photoelectric conversion element.
It is possible to prevent element deterioration due to handling of the end of the block.

[発明の効果] 本発明では、光電変換素子アレイ幅が基板幅よりも小さ
いので検出器実装工程でのハンドリングによる端部チャ
ンネルの暗電流増加を防ぐことができる。また基板幅を
B 本c*(r+d)/rよりも小さくしたので複数ブ
ロックを多面体状に配置した際端部素子のピッチずれが
おきない。従って端部チャンネルに特異的に生じていた
リングアーチファクトを低減することができる。
[Effects of the Invention] In the present invention, since the photoelectric conversion element array width is smaller than the substrate width, an increase in dark current in the end channel due to handling in the detector mounting process can be prevented. Further, since the substrate width is made smaller than B lines c*(r+d)/r, pitch deviation of the end elements does not occur when a plurality of blocks are arranged in a polyhedral shape. Therefore, it is possible to reduce ring artifacts that have specifically occurred in the end channels.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の放射線検出器の要部の模式
図、第2図は、本発明を適用するX線CT装置のブロッ
ク図、第3図は、本発明に用いる検出部を説明する模式
図、第4図は本発明の詳細な説明するためのX線検出素
子の暗電流特性図である。 第 Z図 讐w補儂駄づ)
FIG. 1 is a schematic diagram of the main parts of a radiation detector according to an embodiment of the present invention, FIG. 2 is a block diagram of an X-ray CT apparatus to which the present invention is applied, and FIG. 3 is a detection section used in the present invention. FIG. 4 is a dark current characteristic diagram of an X-ray detection element for explaining the present invention in detail. Figure Z (enemy w supplement)

Claims (1)

【特許請求の範囲】 1、放射線を光に変換するシンチレータアレイと該光を
それぞれ電気信号に変換するための光電変換素子アレイ
、光電変換素子アレイを支持する基板が積層してなる放
射線検出ブロックを、円弧上に沿って多面体状に複数個
配置して成る放射線検出器において、光電変換素子アレ
イのピッチをa、ブロック内アレイのチャンネル数をc
、円弧の半径をr、シンチレータと光電変換素子の厚さ
の和をd、としたとき、基板幅bが、 a*c*(r+d)/r>b>a*c でありかつ、光電変換素子アレイ幅eが、基板幅bより
小さいことを特徴とした放射線検出器。 2、放射線を光に変換するシンチレータアレイと該光を
それぞれ電気信号に変換するための光電変換素子アレイ
、光電変換素子アレイを支持する基板が積層してなる放
射線検出器において基板の幅は光電変換素子アレイのピ
ッチをa、ブロック内アレイのチャンネル数をc、シン
チレータと光電変換素子の厚さの和をd、としたとき、
基板幅bが、 a*c*1.0013>b>a*c を満たすことを特徴とした放射線検出器。
[Claims] 1. A radiation detection block comprising a scintillator array that converts radiation into light, a photoelectric conversion element array that converts each of the lights into electrical signals, and a substrate that supports the photoelectric conversion element array. , in a radiation detector consisting of a plurality of photoelectric conversion element arrays arranged in a polyhedral shape along an arc, the pitch of the photoelectric conversion element array is a, and the number of channels of the array in a block is c.
, the radius of the arc is r, and the sum of the thicknesses of the scintillator and the photoelectric conversion element is d, then the substrate width b is a*c*(r+d)/r>b>a*c, and the photoelectric conversion A radiation detector characterized in that an element array width e is smaller than a substrate width b. 2. In a radiation detector consisting of a laminated scintillator array that converts radiation into light, a photoelectric conversion element array that converts each light into an electrical signal, and a substrate that supports the photoelectric conversion element array, the width of the substrate is determined by the width of the photoelectric conversion element array. When the pitch of the element array is a, the number of channels in the array in a block is c, and the sum of the thicknesses of the scintillator and photoelectric conversion element is d,
A radiation detector characterized in that a substrate width b satisfies a*c*1.0013>b>a*c.
JP14141690A 1990-06-01 1990-06-01 Radiation detector Pending JPH0436687A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14141690A JPH0436687A (en) 1990-06-01 1990-06-01 Radiation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14141690A JPH0436687A (en) 1990-06-01 1990-06-01 Radiation detector

Publications (1)

Publication Number Publication Date
JPH0436687A true JPH0436687A (en) 1992-02-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP14141690A Pending JPH0436687A (en) 1990-06-01 1990-06-01 Radiation detector

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JP (1) JPH0436687A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009038651A (en) * 2007-08-02 2009-02-19 Panasonic Corp Antenna device and portable radio
DE102011080201A1 (en) * 2011-08-01 2013-02-07 Siemens Aktiengesellschaft Flat image detector for X-ray unit for conversion of radiation into image signal that represents patient, has pixel elements partly arranging tiles on common point such that bisector part is inclined on surfaces of tiles to each other
JP2015137882A (en) * 2014-01-21 2015-07-30 株式会社日立メディコ Radiation detector and X-ray CT apparatus using the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009038651A (en) * 2007-08-02 2009-02-19 Panasonic Corp Antenna device and portable radio
DE102011080201A1 (en) * 2011-08-01 2013-02-07 Siemens Aktiengesellschaft Flat image detector for X-ray unit for conversion of radiation into image signal that represents patient, has pixel elements partly arranging tiles on common point such that bisector part is inclined on surfaces of tiles to each other
JP2015137882A (en) * 2014-01-21 2015-07-30 株式会社日立メディコ Radiation detector and X-ray CT apparatus using the same

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