JPH0441339Y2 - - Google Patents
Info
- Publication number
- JPH0441339Y2 JPH0441339Y2 JP1987081523U JP8152387U JPH0441339Y2 JP H0441339 Y2 JPH0441339 Y2 JP H0441339Y2 JP 1987081523 U JP1987081523 U JP 1987081523U JP 8152387 U JP8152387 U JP 8152387U JP H0441339 Y2 JPH0441339 Y2 JP H0441339Y2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- socket base
- board
- printed circuit
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案は、電子機器に使用するプリント基板の
検査等に使う機器に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to equipment used for inspecting printed circuit boards used in electronic equipment.
従来は、コンタクトプローブが配設された下台
に被検査プリント基板を載せ、コンタクトプロー
ブが配設された上台を閉じ、上下の台で被検査プ
リント基板を挟んで検査している。
Conventionally, the printed circuit board to be inspected is placed on a lower stand on which contact probes are disposed, the upper stand on which contact probes are disposed is closed, and the printed circuit board to be inspected is sandwiched between the upper and lower stands for inspection.
または、検査装置の内部に設けられたソケツト
に被検査プリント基板を装着して検査している。 Alternatively, the printed circuit board to be inspected is mounted in a socket provided inside the inspection device and inspected.
ところが前述のような検査装置では、小型のプ
リント基板は奥のほうにはいつてしまい、その脱
着が困難になるので、作業性が悪くなるという問
題点がある。
However, in the above-mentioned inspection apparatus, there is a problem in that the small printed circuit board is placed in the back, making it difficult to attach and detach it, resulting in poor workability.
本考案は上記問題点に鑑みてなされたものであ
つて、前後に往復動する駆動手段と、前記駆動手
段によつて往復動され且つ傾斜カム機構部を備え
た平カムと、前記傾斜カム機構部によつて上下動
され且つ前記駆動手段の往復動に連動して所定範
囲前後に往復駆動されるソケツト台と、該ソケツ
ト台上部にあつて被検査基板を装着するソケツト
と、前記ソケツト台が下がりきつたときの前記被
検査基板の高さで前記駆動手段にて往復駆動さる
所望数の移動コンタクトプローブ若しくは前記ソ
ケツト台が前進位置のときに被検査基板に当接す
る所望数の固定コンタクトプローブの少なくとも
何れか一方のコンタクトプローブとから構成し
て、前記駆動手段による一往復駆動で、前記ソケ
ツト台が上がり被検査基板を装着し、前記ソケツ
ト台が下がり前記のコンタクトプローブを前記被
検査基板面に接触させて検査し、そして検査終了
後再び前記ソケツト台が上がり被検査基板を取り
外すという一連の作業を行うようにした。
The present invention has been made in view of the above problems, and includes: a drive means that reciprocates back and forth; a flat cam that is reciprocated by the drive means and includes an inclined cam mechanism; and the inclined cam mechanism. a socket pedestal that is moved up and down by a part and reciprocated back and forth within a predetermined range in conjunction with the reciprocating movement of the driving means; a socket disposed above the socket pedestal for mounting a board to be inspected; A desired number of movable contact probes that are reciprocated by the driving means at the height of the board to be inspected when the socket base is in the forward position, or a desired number of fixed contact probes that come into contact with the board to be inspected when the socket base is in the forward position. At least one of the contact probes is configured, and by one reciprocating drive by the driving means, the socket base is raised to mount the board to be tested, and the socket base is lowered to place the contact probe on the surface of the board to be tested. A series of operations are performed in which the board is brought into contact and inspected, and after the inspection is completed, the socket base is raised again and the board to be inspected is removed.
本考案にかかるプリント基板検査用治具では、
駆動手段にて平カムが後退している時は、ソケツ
ト台は前記平カムの傾斜カム部で押し上げられて
いるので、このソケツト台に設けられたソケツト
も上昇する。
In the printed circuit board inspection jig according to the present invention,
When the flat cam is retracted by the drive means, the socket base is pushed up by the inclined cam portion of the flat cam, so the socket provided on the socket base also rises.
この時、被検査プリント基板を前記ソケツトに
装着する。 At this time, the printed circuit board to be inspected is attached to the socket.
次に、前記平カムを前進させると、前記ソケツ
ト台は前記傾斜カム部に沿つて下降する。 Next, when the flat cam is moved forward, the socket base is lowered along the inclined cam portion.
更に、前記平カムを前進させると、移動コンタ
クトプローブは前記被検査プリント基板の一面に
当接し、前記ソケツト台は前記駆動手段によつて
更に前進させられる。 Further, when the flat cam is advanced, the movable contact probe comes into contact with one surface of the printed circuit board to be inspected, and the socket base is further advanced by the driving means.
ここで、更に前記平カムを前進させると、前記
ソケツト台と前記移動コンタクトプローブとは接
触したまま前進し、固定コンタクトプローブが前
記被検査プリント基板の他面に当接する。 Here, when the flat cam is further advanced, the socket base and the movable contact probe move forward while being in contact with each other, and the fixed contact probe comes into contact with the other surface of the printed circuit board to be inspected.
即ちここで、被検査プリント基板の両面がコン
タクトプローブに当接するので、この被検査プリ
ント基板の検査を行う。 That is, since both surfaces of the printed circuit board to be inspected come into contact with the contact probes, the printed circuit board to be inspected is inspected.
検査が終了すると、前記駆動手段を後退させ前
記平カムと前記移動コンタクトプローブと前記ソ
ケツト台を後退させ、前記被検査プリント基板を
前記固定コンタクトプローブから離す。 When the inspection is completed, the driving means is retracted, the flat cam, the movable contact probe, and the socket base are retracted, and the printed circuit board to be inspected is separated from the fixed contact probe.
更に、後退させると、前記ソケツト台はその往
復動範囲の後端で止まる。 Furthermore, when retracted, the socket base stops at the rear end of its reciprocating range.
更に、後退させると、前記移動コンタクトプロ
ーブは、前記の被検査プリント基板面から離れ
る。 Further, when retracted, the moving contact probe separates from the surface of the printed circuit board to be inspected.
そこで、更に後退させると、前記平カムの傾斜
カム部が前記ソケツト台を押しあげるので、検査
終了した前記被検査プリント基板を取り外す。 Then, when the board is moved back further, the inclined cam part of the flat cam pushes up the socket base, and the printed circuit board to be inspected that has been inspected is removed.
そして、必要であれば、引き続き次の被検査プ
リント基板を装着して検査するのである。 Then, if necessary, the next printed circuit board to be inspected is subsequently mounted and inspected.
以下に、本考案にかかるプリント基板検査用治
具の一実施例を図面に基づいて詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the printed circuit board inspection jig according to the present invention will be described in detail below with reference to the drawings.
第1〜4図は、前記実施例の一連の動作を示す
図である。 1 to 4 are diagrams showing a series of operations of the embodiment.
第1〜4図において、平カム2と移動コンタク
トプローブ板9aは、トグルクランプ1によつて
直接左右に往復駆動される。固定コンタクトプロ
ーブ板9bとローラ板10は基台11に固設され
ている。 1 to 4, the flat cam 2 and the movable contact probe plate 9a are directly reciprocated left and right by the toggle clamp 1. As shown in FIGS. The fixed contact probe plate 9b and the roller plate 10 are fixedly mounted on a base 11.
前記平カム2はそのカム部として傾斜部2aと
平坦部2bとを持ち、ローラ3は前記ローラ板1
0のローラ穴に遊挿され、ソケツト台4はバネ8
により左方に弾性付勢され、ストツパー12と固
定コンタクトプローブ板9bの間を移動可能に設
けられている。 The flat cam 2 has an inclined part 2a and a flat part 2b as its cam part, and the roller 3 has a slope part 2a and a flat part 2b as its cam part.
The socket base 4 is loosely inserted into the roller hole 0, and the spring 8
The contact probe plate 9b is elastically biased to the left by the contact probe plate 9b, and is provided so as to be movable between the stopper 12 and the fixed contact probe plate 9b.
前記ソケツト台4の上部には被検査プリント基
板5をセツトするためのソケツト部4aを備えて
いる。前記ソケツト台4はバネ7により下方に弾
性付勢されている。移動コンタクトプローブ板9
aには移動コンタクトプローブ6aが配設されて
いる。 The upper part of the socket base 4 is provided with a socket part 4a for setting the printed circuit board 5 to be inspected. The socket base 4 is elastically biased downward by a spring 7. Moving contact probe plate 9
A movable contact probe 6a is disposed at a.
上記構成のプリント基板検査用治水において、
前記トグルクランプ1が最左端にあるときは、前
記平カム2と移動コンタクトプローブ板9aは左
端に引かれている。よつて、前記ローラ3は前記
傾斜部2aにて押上られ、前記ソケツト台4の上
部のソケツト4aが装置上面まで来る(第1図)。 In the flood control for printed circuit board inspection with the above configuration,
When the toggle clamp 1 is at the leftmost end, the flat cam 2 and the movable contact probe plate 9a are pulled to the left end. Therefore, the roller 3 is pushed up by the inclined portion 2a, and the socket 4a at the upper part of the socket base 4 comes to the upper surface of the device (FIG. 1).
ここで、前記ソケツト4aに被検査プリント基
板5を装着する。 Here, the printed circuit board 5 to be inspected is attached to the socket 4a.
次に、前記トグルクランプ1を右に前進させる
と、前記傾斜部2aが移動し、前記バネ7による
弾性付勢力により、前記ソケツト台4と前記ロー
ラ3は下降するので、前記被検査プリント基板5
の高さは左右のコンタクトプローブ6a,6bと
同じ高さになる(第2図)。 Next, when the toggle clamp 1 is moved forward to the right, the inclined portion 2a moves and the socket base 4 and the roller 3 are lowered by the elastic biasing force of the spring 7, so that the printed circuit board 5 to be inspected is moved downward.
is the same height as the left and right contact probes 6a, 6b (FIG. 2).
さらに、前記トグルクランプ1を前進させる
と、前記ローラ3は、前記平カム2の平坦部2b
を移動し、移動コンタクトプローブ6aは、前記
被検査プリント基板5の左面に当接する、と同時
に前記移動コンタクトプローブ板9aはソケツト
台4に当接する(第3図)。 Further, when the toggle clamp 1 is moved forward, the roller 3 is moved to the flat part 2b of the flat cam 2.
The movable contact probe 6a abuts the left side of the printed circuit board 5 to be inspected, and at the same time the movable contact probe plate 9a abuts the socket base 4 (FIG. 3).
そこでさらに、前記トグルクランプ1を前進さ
せると、前記ソケツト台4は、前記移動コンタク
トプローブ板9aを介して、前記トグルクランプ
1により右へ押され、前記被検査プリント基板5
の右面が前記固定コンタクトプローブ板9bの固
定コンタクトプローブ6bに当接する位置で前記
トグルクランプ1を止めて、左右のコンタクトプ
ローブ6a,6bにて前記被検査プリント基板5
を検査する。 Therefore, when the toggle clamp 1 is further advanced, the socket base 4 is pushed to the right by the toggle clamp 1 via the movable contact probe plate 9a, and the printed circuit board 5 to be inspected is pushed to the right by the toggle clamp 1.
The toggle clamp 1 is stopped at a position where the right side of the board contacts the fixed contact probe 6b of the fixed contact probe plate 9b.
Inspect.
そして、プリント基板の検査が終了した後、今
度は前記トグルクランプ1を左へ後退させる。 After the inspection of the printed circuit board is completed, the toggle clamp 1 is moved back to the left.
先ず、前記トグルクランプが後退することによ
り、移動コンタクトプローブ板9aが後退し、も
つて前記ソケツト台4はバネ8による弾性付勢力
により左側に移動し、被検査プリント基板5は固
定コンタクトプローブ6bから離脱する。 First, as the toggle clamp retreats, the movable contact probe plate 9a retreats, and the socket base 4 moves to the left due to the elastic biasing force of the spring 8, and the printed circuit board 5 to be inspected is removed from the fixed contact probe 6b. break away.
さらに、移動コンタクトプローブ板9aが後退
すると、前記ソケツト台4はストツパー12に当
接して止まる(第3図)。 Furthermore, when the movable contact probe plate 9a retreats, the socket base 4 comes into contact with the stopper 12 and stops (FIG. 3).
さらに、前記トグルクランプ1および前記移動
コンタクトプローブ板9aが後退すると、この移
動コンタクトプローブ6aも前記被検査プリント
基板5から離脱する(第2図)。 Further, when the toggle clamp 1 and the movable contact probe plate 9a retreat, the movable contact probe 6a also separates from the printed circuit board 5 to be inspected (FIG. 2).
さらに、前記トグルクランプ1が後退すると、
前記平カム2の前記傾斜部2aが、前記ローラ3
を押上げて、前記ソケツト台4を介して前記被検
査プリント基板5を装置上面より突出させる(第
1図)。 Furthermore, when the toggle clamp 1 retreats,
The inclined portion 2a of the flat cam 2 is connected to the roller 3.
is pushed up to make the printed circuit board 5 to be inspected protrude from the upper surface of the apparatus via the socket base 4 (FIG. 1).
そこで、この被検査プリント基板4を取り外し
て、一枚の基板の検査を終了するのである。 Therefore, the printed circuit board 4 to be inspected is removed to complete the inspection of one board.
上述の実施例では、ソケツト台4を後退させる
ためにバネ8を設けたが、前記移動コンタクトプ
ローブ板9aの右端に磁性片を固設するとともに
前記ソケツト台4の左端部分を鉄片等で形成し
て、前記移動コンタクトプローブ板9aに吸着さ
せたままストツパー12の位置まで後退するよう
にしても良い。または、前記移動コンタクトプロ
ーブ板9aの右端と前記ソケツト台4の左端部分
との間に弾性掛止片等による荷重解除型の相互掛
止手段を設けても良い。何れにしても、前記トグ
ルクランプ1の後退に連動して前記ソケツト台4
を前記ローラ3の上部まで後退させれば良いので
ある。 In the above-described embodiment, the spring 8 is provided to move the socket base 4 backward, but a magnetic piece is fixed to the right end of the movable contact probe plate 9a, and the left end portion of the socket base 4 is formed of an iron piece or the like. Then, the movable contact probe plate 9a may be moved back to the stopper 12 position while being attracted to the movable contact probe plate 9a. Alternatively, a load-releasing type mutual latching means such as an elastic latching piece may be provided between the right end of the movable contact probe plate 9a and the left end portion of the socket base 4. In any case, in conjunction with the retraction of the toggle clamp 1, the socket base 4
It is only necessary to retreat the roller 3 to the upper part of the roller 3.
このようにして、本考案にかかるプリント基板
検査用治具によれば、被検査プリント基板を検査
装置へ脱着するときは、ソケツト4aが上昇位置
にあるので、基板の脱着が容易にできるのであ
る。 In this manner, according to the printed circuit board inspection jig according to the present invention, when the printed circuit board to be inspected is to be attached to and detached from the inspection device, the socket 4a is in the raised position, so that the substrate can be easily attached and detached. .
しかも、前記平カム2、ソケツト4、左のコン
タクトプローブ6aを、一台のトグルクランプ1
で往復駆動させるので、簡単な構成で上記効果が
得られるのである。 Moreover, the flat cam 2, socket 4, and left contact probe 6a are connected to one toggle clamp 1.
Since it is driven back and forth, the above effects can be obtained with a simple configuration.
上述のように、本考案にかかるプリント基板検
査用治具によれば、駆動手段により往復駆動され
る平カムに設けられた傾斜部によつて、ソケツト
が昇降するので、被検査プリント基板の脱着が極
めて容易にできるという効果が得られるのであ
る。
As described above, according to the printed circuit board inspection jig according to the present invention, the socket is raised and lowered by the inclined portion provided on the flat cam that is reciprocated by the driving means, so that the printed circuit board to be inspected can be easily attached and detached. The effect is that it can be done extremely easily.
第1〜4図は、本考案にかかるプリント基板検
査用治具の一実施例の一連の動作を示す図であ
る。
1……トグルクランプ、2……平カム、3……
ローラ、4……ソケツト台、5……被検査プリン
ト基板、6a……移動コンタクトプローブ、6b
……固定コンタクトプローブ、9a……移動コン
タクトプローブ板、9b……固定コンタクトプロ
ーブ板、7,8……バネ。
1 to 4 are diagrams showing a series of operations of an embodiment of the printed circuit board inspection jig according to the present invention. 1...Toggle clamp, 2...Flat cam, 3...
Roller, 4... Socket stand, 5... Printed circuit board to be inspected, 6a... Moving contact probe, 6b
...Fixed contact probe, 9a...Moving contact probe plate, 9b...Fixed contact probe plate, 7, 8...Spring.
Claims (1)
よつて往復動され且つ傾斜カム機構部を備えた平
カムと、前記傾斜カム機構部によつて上下動され
且つ前記駆動手段の往復動に連動して所定範囲前
後に往復駆動されるソケツト台と、該ソケツト台
上部にあつて被検査基板を装着するソケツトと、
前記ソケツト台が下がりきつたときの前記被検査
基板の高さで前記駆動手段にて往復駆動さる所望
数の移動コンタクトプローブ若しくは前記ソケツ
ト台が前進位置のときに被検査基板に当接する所
望数の固定コンタクトプローブの少なくとも何れ
か一方のコンタクトプローブとから構成され、前
記駆動手段による一往復駆動で、前記ソケツト台
が上がり被検査基板を装着し、前記ソケツト台が
下がり前記のコンタクトプローブを前記被検査基
板面に接触させて検査し、そして検査終了後再び
前記ソケツト台が上がり被検査基板を取り外すと
いう一連の作業を行うことを特徴としたプリント
基板検査用治具。 a driving means that reciprocates back and forth; a flat cam that is reciprocated by the driving means and includes an inclined cam mechanism; and a flat cam that is moved up and down by the inclined cam mechanism and is linked to the reciprocating movement of the driving means. a socket base which is reciprocated back and forth within a predetermined range; a socket located above the socket base and into which a board to be inspected is mounted;
A desired number of movable contact probes are reciprocated by the driving means at the height of the board to be inspected when the socket base is fully lowered, or a desired number of movable contact probes are brought into contact with the board to be inspected when the socket base is in the forward position. At least one of the contact probes is a fixed contact probe, and by one reciprocating drive by the driving means, the socket base is raised to mount the board to be tested, and the socket base is lowered to move the contact probe to the board to be tested. A jig for inspecting a printed circuit board, characterized in that the jig performs a series of operations in which the socket base is brought into contact with the surface of the board for inspection, and after the inspection is completed, the socket base is raised again to remove the board to be inspected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987081523U JPH0441339Y2 (en) | 1987-05-27 | 1987-05-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987081523U JPH0441339Y2 (en) | 1987-05-27 | 1987-05-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63188575U JPS63188575U (en) | 1988-12-02 |
| JPH0441339Y2 true JPH0441339Y2 (en) | 1992-09-29 |
Family
ID=30933339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987081523U Expired JPH0441339Y2 (en) | 1987-05-27 | 1987-05-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0441339Y2 (en) |
-
1987
- 1987-05-27 JP JP1987081523U patent/JPH0441339Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63188575U (en) | 1988-12-02 |
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