JPH044654B2 - - Google Patents

Description

[Detailed description of the invention]

Field of Application This invention relates to the improvement of magnetic recording media used in magnetic disks, etc., in which a magnetic thin film is provided on a non-magnetic substrate via a base film to be formed, and in particular the base film does not have a BCC structure. Formed from a non-magnetic or weakly magnetic Fe-Cr alloy film with a crystalline structure, it is highly economical, does not cause cracks or peeling even with a thick base film, and has a short deposition interval between the base film and magnetic film. The present invention relates to a magnetic recording medium that can be set for a long time and that can optimize the film forming conditions for each film. BACKGROUND ART Magnetic disk devices are frequently used as storage devices in information processing systems such as computers. Nowadays, in order to increase information processing ability, it is desired that magnetic disk devices have higher density and larger capacity, and metal thin films formed by sputtering, ion plating, etc. are being put into practical use as magnetic recording layers of magnetic disks. As such a magnetic recording medium, on a non-magnetic substrate,
A configuration is known in which a Cr film is formed and then a Co film is formed on the Cr film by a sputtering method or a vapor deposition method. This magnetic recording medium has a high coercive force in the in-plane direction and is used in in-plane recording type magnetic disks. Furthermore, instead of the above-mentioned Co film, Co-
Magnetic recording media using Ni films and Co-Ni-Cr films are known. On the other hand, a Cr film is used as the base film, regardless of the magnetic film composition described above, and is used to promote in-plane orientation of the Co-based magnetic film and increase coercive force. However, in order to increase the coercive force, such a Cr underlayer needs to be deposited to a thickness of 2000 Å to 6000 Å, which is much thicker than the magnetic film thickness of 500 Å to 800 Å. Therefore, a large amount of expensive Cr is consumed, increasing the cost. Also, Cr is inherently prone to embrittlement, and if the film is relatively thick, there may be a difference in thermal expansion coefficient with the substrate or during film formation. Since it tends to cause minute cracks due to internal stress, etc., it has the problem of lacking toughness and strength as a base film for magnetic recording media. Furthermore, in the sputtering method, there was a problem in that it was difficult to obtain a large coercive force if the interval (interval time) between depositing Cr on the substrate and depositing the magnetic film was long. The reason for this is that Cr easily combines with oxygen,
Residual oxygen in argon gas is adsorbed by Cr,
It is thought that this is because it inhibits the epitaxial growth of the magnetic film. Therefore, conventionally, when forming a film on a substrate, the film forming interval between the Cr base film and the magnetic film thereon was set as follows:
The deposition time needs to be within 1 minute, preferably within 10 seconds. For example, manufacturing equipment is also subject to significant restrictions due to this requirement, making it difficult to find optimal conditions for forming each film. Purpose of the Invention The present invention solves the problems of conventional Cr underlayers in magnetic recording media used in magnetic disks, etc., in which a magnetic film is provided on a non-magnetic substrate via an underlayer, and is similar to the Cr underlayer. It has the effect of increasing the coercive force of the magnetic film, and is more economical than the Cr underlayer.
The film deposition interval can be relatively long,
The object of the present invention is to provide a magnetic recording medium having a new underlayer film that is free from cracking and peeling problems. Structure and Effects of the Invention As a result of various studies aimed at creating a magnetic recording medium having a novel underlayer that can solve the problems of conventional Cr underlayers, the present invention has revealed that at least the surface of the non-magnetic substrate on which the underlayer is formed is made of glass. By using a nonmagnetic or weakly magnetic Fe-Cr alloy film, which is thought to have a crystal structure different from the so-called equilibrium phase, which does not have a bcc structure, in place of the conventional pure Cr underlayer, It is more economical than the base film and allows for longer film deposition intervals.
The present invention was completed based on the finding that a magnetic recording medium with fewer problems of cracking and peeling can be obtained. That is, the present invention provides a magnetic recording medium in which a base film and a magnetic film are layered on a non-magnetic substrate, wherein at least the surface of the non-magnetic substrate on which the base film is formed is made of glass, and the base film is made of 30wt% Cr. This magnetic recording medium is characterized in that it is a nonmagnetic or weakly magnetic alloy film consisting of ~70wt%, the balance being Fe, and having a crystal structure that does not have a bcc structure. Furthermore, in detail, since the base film of a magnetic recording medium is provided for the purpose of promoting in-plane orientation of the magnetic film and imparting a large coercive force to the magnetic film, if the base film is ferromagnetic, the magnetic Due to the interaction between
It is known that it becomes as small as about 200 Oe and also deteriorates the characteristics of the magnetic film. By the way, the known Fe-Cr alloy film contains Cr.
It is known that up to about 70 wt%, it exhibits ferromagnetism at room temperature, and as is clear from the above explanation, it was conventionally thought that it could not be used as an underlayer for magnetic recording media. However, as a result of various experiments, the inventors found that at least the surface of the base film of the nonmagnetic substrate was made of glass, and an Fe-Cr alloy film made of 30wt% to 70wt% Cr and the balance Fe was deposited on a flat plate RF magnetron sputtering method. When a film is formed on a substrate using the RF sputtering method under the conditions described below, it has superior properties compared to a Cr film as an underlayer film for magnetic recording media, and becomes a substantially non-magnetic film. This is what I found out. In this invention, non-magnetic or weakly magnetic means substantially non-magnetic, that is, practically non-magnetic to the extent that it does not significantly impair the magnetic properties of the magnetic film or affect the reproduction signal of the magnetic head. It also means magnetic or weakly magnetic. Therefore, even if the base film is composed of a mixed phase of a non-magnetic phase and some ferromagnetic phase, the overall
It is considered that there is no practical problem as long as the magnetization is on the order of emu/g. The reason why the Fe-Cr alloy of the underlayer film according to the present invention exhibits substantial non-magnetism is not clear, but as shown in Example 1 below, Fe-40Cr alloy film (Sample No. in Table 2) 1) and Fe-50Cr alloy film (second
Sample No. 2) in the table shows a magnetization value of 1.2 emu/g or less. In addition, Fig. 1a shows Fe-
As shown in the X-ray diffraction results of the 40Cr alloy base film (sample No. 1 in Table 2), the diffraction results of the known Fe-40Cr alloy (target sample No. 3 of the thin film) (Fig. 1 b) In comparison, the angles (2θ) of the diffraction peaks are significantly different, and it is thought that some particles have a special crystal structure or a crystal structure different from that of the known equilibrium phase. That is, as shown in Table 1, the target material having almost the same composition as the alloy film of the present invention is shown in Figure 1b.
The interplanar spacing calculated from the diffraction peaks obtained in the figure is
This almost matches the literature values for Cr and Fe, and it can be seen that this crystal structure has a bcc (body-centered cubic) structure. On the other hand, the interplanar spacing of the alloy film of this invention is
As is clear from Table 1, which shows the results calculated from the diffraction peaks obtained in Figure 1a, the literature values of Cr and
Does not match that of Fe, and has a similar composition
Since it does not match that of Fe-46.5%Cr (σ phase), it is completely different from the known equilibrium phase crystal structure.
It can be seen that the crystal structure does not have a bcc structure.

【table】

[Table] Preferred Embodiments of the Invention The substrate of the magnetic recording medium in this invention may be made of any material as long as it has a structure in which glass is formed at least on the surface of the base film. For example, in addition to an aluminum substrate coated with glass, alumina , substrates made of various ceramics such as silicon carbide, titanium carbide, zirconia, silicon nitride, alumina and silicon monoxide, and glass crazing.
Tempered glass, crystallized glass, etc. can be used. Furthermore, the magnetic recording medium of the present invention is characterized by
The Cr content of the Fe-Cr underlayer can be selected as appropriate depending on the material of the substrate and the composition of the magnetic layer deposited on the underlayer.
If it is less than %, the formed film becomes ferromagnetic,
If Cr exceeds 70 wt%, it is not preferable because the toughness and strength of the film decrease. Preferably, Cr is
35wt%~60wt%, more preferably 38wt%~
50wt% is good. In addition, as elements added to the Fe-Cr alloy of the base film, for the purpose of making the base film more completely non-magnetic,
Cu, Mn, Ru, Mo, W, V, Nb, Ta, Ti,
Zr, Hf, Al, Si, etc. may be added singly or in combination to improve the magnetic properties of the magnetic film, or to improve the toughness, corrosion resistance, and strength of the underlying film.
Co, Cu, Ni, Mn, Ru, Mo, W, V, Nb,
It is possible to add Ta, Ti, Zr, Hf, Al, Si, etc. singly or in combination, but if the total amount of these additive elements exceeds 30wt%, the toughness and strength of the base film will deteriorate. It is necessary to keep it below 30wt%, since the coercive force increasing effect of the magnetic film may be lost. In addition, non-magnetic or weakly magnetic
Generally speaking, the thicker the Fe-Cr alloy base film is, the greater the coercive force of the magnetic film is.
500Å or more and 10000Å or less, more preferably 2000Å
Approximately Å to 5000 Å is good. Next, the magnetic film is Co, Co-Ni, Co-Ni-Cr,
Any alloy can be formed as long as it is a hard magnetic film that has a hop structure such as a Co--Pt alloy and has in-plane magnetic anisotropy. Further, in order to improve the epitaxial properties of the magnetic film with respect to the underlying film, adding various additive elements is an effective means for improving the magnetic properties. The thickness of the magnetic film may also be appropriately selected to be approximately several hundred to 2000 Å, similar to conventionally used thin film media. In addition, if necessary, various known protective films may be appropriately selected on the magnetic film (for example, carbon film, SiO ₂
film, other ceramic films, etc.) is effective for extending the life of the medium.
A lubricating film may be applied. In particular, the method for forming the base film of this invention includes:
RF sputtering methods such as flat plate RF magnetron sputtering method are effective. Further, as the conditions for the sputtering method for forming the base film, it is desirable that the sputtering gas pressure be 1 to 100 mTorr, and the substrate temperature be from room temperature to 400°C or less. Further, the magnetic film and the protective film can be manufactured by appropriately selecting a known film forming method such as a vapor deposition method, an ion plating method, a plasma CVD method, etc. in addition to the sputtering method. Furthermore, it is said that it is desirable that the interval (interval time) between the formation of the base film and the magnetic film be as short as possible from the viewpoint of improving magnetic properties. ,
The activity is lower than that of Cr film, and as shown in the examples,
Because you can take intervals of several minutes,
For example, in the sputtering method, the film-forming baths for the base film and the magnetic film are separated by a valve, so that the film-forming conditions for the base film and the film-forming conditions for the magnetic film can be set to optimal conditions, respectively. Examples Example 1 An Al ₂ O ₃ substrate with an outer diameter of 130 mm, an inner diameter of 40 mm, and a thickness of 1.2 mm was coated with a 20 μm thick glass glaze, and the surface was polished, using a flat plate RF magnetron sputtering device under the following conditions. Using two types of targets having the compositions shown in Table 1, an Fe--Cr alloy base film was coated on the glass glaze surface of the substrate. Ultimate vacuum level: 1 to 2 x 10 ^-6 Torr Atmosphere during sputtering: 99.99%Ar 6mTorr Input power: 300W Pole spacing: 70mm Substrate temperature: 100°C For comparison, a flat DC magnetron sputtering device was used under the above conditions. A Fe-Cr alloy base film was coated. Table 2 shows the composition, magnetization value, and film thickness of each Fe-Cr alloy base film coated on the substrate. In the analysis, an X-ray microanalyzer was used for the alloy film, and a plasma emission spectrometer and a gas analyzer were used for the target. In the table, for the alloy film, elements other than Fe and Cr were below the detection limit. Further, the other elements of the target were Ni, Mg, Al, P, etc., all of which were 0.04 wt% or less. In addition, a vibrating sample magnetometer was used to measure the magnetic properties. As is clear from the results in Table 2, the Fe-Cr alloy base film (sample Nos. 1 and 2) according to the present invention
It shows a magnetization value of 1.2 emu/g or less, indicating that it is a substantially nonmagnetic film that is essential as an underlayer. Furthermore, it can be seen that the composition ratio of the base film and the composition ratio of the target are substantially the same. In addition, 1.2emu/g
The following is indicated because of the measurement limit. On the other hand, the alloy base films of Comparative Examples (Samples No. 5 and 6) prepared using a flat plate DC magnetron sputtering device have almost the same composition ratio as the alloy film of the present invention, but the magnetization is 80 to 93 emu. /g, indicating that it is a ferromagnetic material almost the same as the target material.

[Table] Example 2 An Al ₂ O ₃ substrate with an outer diameter of 130 mm, an inner diameter of 40 mm, and a thickness of 1.2 mm was coated with a glass glaze of 20 μm in thickness, and the surface was polished using a flat plate RF magnetron sputtering device. Under the same conditions as above, two types of targets having the compositions shown in Table 2, namely, samples were prepared.
Using Sample No. 3 and Sample No. 4, an Fe-Cr alloy base film was coated to a thickness of 2000 Å on the glass glaze surface of the substrate. Furthermore, a magnetic film was coated with a thickness of 800 Å using a Co-30Ni-7.5Cr alloy target. Using the obtained magnetic recording medium, cut out a 5 mm x 5.8 mm sample, measure it with a VSM, and select it as the target sample.
The measurement results using target sample No. 3 are shown in Fig. 2 (a), and the measurement results using target sample No. 4 are shown in Fig. 2 (b). In addition, a sample of the same size was cut out from a conventional magnetic recording medium manufactured under the same conditions except that it was coated with Cr to a thickness of 2000 Å as an underlayer, and similarly measured using VSM. The results are shown in Figure 2c. As is clear from Fig. 2, according to this invention
A magnetic recording medium having a Fe-Cr alloy underlayer is Cr
Although the coercive force squareness ratio (S ^* ) is slightly lower than that of conventional magnetic recording media with an underlayer, the coercive force is increased by about 10% to 20%, indicating that the magnetic properties are equivalent or better. . Example 3 An Al ₂ O ₃ substrate with an outer diameter of 130 mm, an inner diameter of 40 mm, and a thickness of 1.2 mm was coated with a 20 μm thick glass glaze, and the surface was polished. Using a flat plate RF magnetron sputtering surface, the following conditions and targets were applied. A Fe-Cr alloy base film is applied to the glass glaze surface of the substrate using
A film was applied to a thickness of 2500 Å, a magnetic film was further applied to a thickness of 800 Å, and then a carbon film was applied to a thickness of 300 Å. Ultimate vacuum: 1 to 2 x 10 ^-6 Torr Atmosphere during sputtering: 99.99%Ar 10mTorr Input power: 300W Pole spacing: 70mm Substrate temperature: 150℃ Base film target: Fe-40Cr (Table 2, sample No.
3) Target for magnetic film: Cu-30Ni-7.5Cr Protective film: High-density carbon The electromagnetic conversion characteristics of the obtained magnetic recording medium according to the present invention were measured under the following conditions. Head used: Mn-Zn ferrite mini winch Ester track width 16μm, gap length 1.0μm,
Gap depth 20μm, number of turns 16T x 2 Flying height: 0.3μm 1F: 1.25MHz 2F: 2.5MHz Take rotation speed: 3600rpm Measurement location: Measured at R = 62mm from the center of the disk The measured playback output characteristics are as follows That's right. Reproduction output (2.5MHz, Iw = 80mA) = 1.5mV Reproduction output (5MHz, Iw = 80mA) = 1.3mV Resolution (Iw = 80mA) = 87% Overwrite = -30dB As is clear from the measurement results, the present invention It can be seen that the magnetic recording medium has characteristics as a high-density recording medium. Example 4 An Al ₂ O ₃ substrate with an outer diameter of 130 mm, an inner diameter of 40 mm, and a thickness of 1.2 mm was coated with a 20 μm thick glass glaze, and the surface was polished using a flat plate RF magnetron sputtering device under the same conditions as Example 1. Using two types of targets consisting of Fe-40Cr alloy (Table 2, sample No. 3) and Cr, a Fe-Cr alloy base film and a Cr base film were respectively applied to the glass glaze surfaces of two types of substrates. The film was coated to a thickness of 2000 Å. Furthermore, a magnetic film was coated with a thickness of 800 Å using a Co-30Ni-7.5Cr alloy target. When coating the magnetic film, two conditions were set for the film formation interval from the base film to the magnetic film coating: 30 seconds and 4 minutes, and the magnetic film was deposited. From the four types of magnetic recording media obtained, 5 mm x 5.8
As a result of cutting out a mm sample and measuring it with VSM, the third
The properties of the base film shown in the table were obtained. As is clear from the results in Table 3, in the case of the Fe-Cr alloy base film according to the present invention, even if the film formation interval is set to a length unimaginable in the past,
It can be seen that the deterioration of Hc in the base film is much less.

[Table] Example 5 The three types of magnetic recording media obtained in Example 2 were subjected to a scratch test, and the results are shown in Table 4. In the table, Invention 1 is the target sample No. 3 shown in Table 2.
The second invention is a magnetic recording medium using the second invention.
This is a magnetic recording medium using target sample No. 4 shown in the table. In the test, adhesion strength was evaluated by peeling off the film by moving the disk while applying various loads to a diamond needle with a tip diameter of 10 μm.

【table】 [Brief explanation of drawings]

Figure 1a is a graph showing the X-ray diffraction results of the components of the Fe-Cr alloy base film according to the present invention, and Figure b is a graph showing the X-ray diffraction results of the target used in forming the Fe-Cr alloy base film according to the present invention. This is a graph showing the results. In FIG. 2, figures a and b are graphs showing the magnetization curve of the magnetic recording medium according to the present invention, and figure c is a graph showing the magnetization curve of the conventional magnetic recording medium.

Claims (1)

[Claims] 1. In a magnetic recording medium in which a base film and a magnetic film are laminated and coated on a non-magnetic substrate, at least the surface on which the base film is formed on the non-magnetic substrate is made of glass, and the base film contains 30 wt% to 70 wt% Cr, and the remainder A magnetic recording medium characterized in that it is a nonmagnetic or weakly magnetic alloy film made of Fe and having a crystal structure that does not have a bcc structure.