JPH0449063B2 - - Google Patents
Info
- Publication number
- JPH0449063B2 JPH0449063B2 JP57029686A JP2968682A JPH0449063B2 JP H0449063 B2 JPH0449063 B2 JP H0449063B2 JP 57029686 A JP57029686 A JP 57029686A JP 2968682 A JP2968682 A JP 2968682A JP H0449063 B2 JPH0449063 B2 JP H0449063B2
- Authority
- JP
- Japan
- Prior art keywords
- screw
- incident light
- reflected light
- central axis
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Machine Tool Sensing Apparatuses (AREA)
Description
【発明の詳細な説明】
この発明はネジの加工工程におけるネジ部表面
の欠陥を光学的に検査する装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for optically inspecting defects on the surface of a threaded portion during a thread processing process.
ネジの検査としては、従来「ネジ山高さ」「ネ
ジのピツチ」等のネジ要素の検査を行なう装置が
開発されてきたが、加工中にネジ部に発生する各
種表面欠陥の検査に関しては、ネジ特有の問題と
して正常面のプロフイールが非常に複雑でしかも
曲面が小さな曲率半径で変化するため、表面検査
の代表的な手法である光学方式では困難とされて
きた。 Conventionally, devices have been developed to inspect screw elements such as "thread height" and "thread pitch." A particular problem is that the profile of a normal surface is extremely complex, and the curved surface changes with a small radius of curvature, making it difficult to use optical methods, which are the typical method for surface inspection.
この発明はかかる現状に対処すべくなされたも
ので、入射光をネジの谷部の外周円と交差しネジ
の中心軸と平行でかつこのネジの中心軸をは含ま
ない平面上を走査しネジの表面でスポツト状に集
光するように照射することによつて、ネジの表面
からの反射光を山部、谷部および山部と谷部をつ
なぐ斜面のいわゆるネジ面(以下このネジ面を稜
線部と呼ぶ)からのものについてそれぞれ空間的
に分離して反射させ、この反射光をそれぞれ独立
の光電変換素子で受光して得た信号波形の変化を
検出することにより、ネジの山部、谷部および稜
線部のそれぞれの部位の以上を独立に検出するこ
とができるネジの表面欠陥検査装置を提供するこ
とを目的としたものである。 This invention was made to deal with the current situation, and the present invention scans the incident light on a plane that intersects the outer circumferential circle of the trough of the screw, is parallel to the central axis of the screw, and does not include the central axis of the screw. By irradiating the light in a spot-like manner on the surface of the screw, the reflected light from the surface of the screw is reflected on the so-called screw surface (hereinafter referred to as the screw surface) of the crests, troughs, and slopes connecting the crests and troughs. By spatially separating and reflecting light from the ridges (referred to as ridges), and detecting changes in the signal waveforms obtained by receiving the reflected light with independent photoelectric conversion elements, The object of the present invention is to provide a screw surface defect inspection device that can independently detect defects in each of the troughs and ridges.
以下、図に基づいてこの発明の一実施例を説明
する。 Hereinafter, one embodiment of the present invention will be described based on the drawings.
第1図はこの発明にかかわる検査装置の光学系
を示す概念図、第2図は第1図の光学系を上方か
ら見たネジ部における反射光の経路を示す平面
図、第3図イ、ロ、ハ、は各光電変換素子の出力
信号波形をそれぞれ示す波形図である。 Fig. 1 is a conceptual diagram showing the optical system of the inspection device according to the present invention, Fig. 2 is a plan view showing the path of reflected light at the threaded portion of the optical system shown in Fig. 1 viewed from above, and Fig. 3 A. B, C are waveform diagrams showing output signal waveforms of each photoelectric conversion element, respectively.
図において、1はネジ、2はネジ1の表面を走
査する入射光、3はネジ1の山部から反射される
反射光、4はネジ1の稜線部から反射される反射
光、5はネジ1の谷部から反射される反射光、
6,7,8は各反射光3,4,5を受光して光電
変換して得た信号を出力する光電変換素子、9は
ネジ1の山部の外周円、10はネジ1の谷部の外
周円、20は光電変換素子6の出力信号波形、2
1は光電変換素子8の出力信号波形、22は光電
変換素子7の出力信号波形である。なお、第3図
の図中に付したa,b,cの記号はそれぞれ同一
時点を示しており、aとcはネジの谷部を、bは
ネジの山部をそれぞれ入射光2は照射している時
点を示している。 In the figure, 1 is the screw, 2 is the incident light scanning the surface of the screw 1, 3 is the reflected light reflected from the crest of the screw 1, 4 is the reflected light reflected from the ridgeline of the screw 1, and 5 is the screw The reflected light reflected from the valley of 1,
6, 7, and 8 are photoelectric conversion elements that receive each reflected light beam 3, 4, and 5 and output a signal obtained by photoelectric conversion; 9 is the outer circumference of the peak of the screw 1; and 10 is the valley of the screw 1. 20 is the output signal waveform of the photoelectric conversion element 6, 2
1 is the output signal waveform of the photoelectric conversion element 8, and 22 is the output signal waveform of the photoelectric conversion element 7. Note that the symbols a, b, and c in Fig. 3 indicate the same points in time, and a and c are the troughs of the screw, and b is the crest of the screw, respectively, with the incident light 2. It shows the point in time.
第1図において、入射光2はネジ1の谷部の外
周円10と交差しネジの中心軸と平行でかつこの
ネジの中心軸をは含まない平面上を走査しネジの
表面でスポツト状に集光するように照射されてい
る。 In Fig. 1, the incident light 2 intersects the outer circumferential circle 10 of the valley of the screw 1, scans a plane parallel to the central axis of the screw, and does not include the central axis of the screw, and forms a spot on the surface of the screw. It is irradiated in a condensing manner.
この時、第2図で示されるように、入射光2の
ネジ1の山部の照射点から入射光2とは異なる方
向に反射光3が発生する。同様にネジ1の入射光
2のネジ1の谷部の照射点から入射光2とは異な
る方向に反射光5が発生する。 At this time, as shown in FIG. 2, reflected light 3 is generated from the irradiation point of the ridge of the screw 1 of the incident light 2 in a direction different from that of the incident light 2. Similarly, reflected light 5 is generated from the irradiation point of the trough of the screw 1 of the incident light 2 on the screw 1 in a direction different from that of the incident light 2.
ここで入射光2のネジ1の山部での照射点と谷
部での照射点ではネジの表面と入射光2のなす角
度が異なるため、図に示されるように反射光3と
反射光5とはその経路が空間的に大きく分離され
る。そして、この2つの反射光の経路の中間にネ
ジ1の稜線部からの反射光4が発生する。 Here, since the angle between the surface of the screw and the incident light 2 is different between the irradiation point at the peak of the screw 1 and the irradiation point at the trough of the screw 1, as shown in the figure, the reflected light 3 and the reflected light 5 and their routes are largely separated spatially. Then, reflected light 4 from the ridgeline portion of the screw 1 is generated between the paths of these two reflected lights.
一方、入射光2はネジ1の中心軸と平行に走査
されているため、ネジ1上の各ネジ山、ネジ谷、
ネジ稜線からの各反射光は各々一直線上、すなわ
ち第2図において各々3,5,4の各反射光の方
向に生じる。したがつて、ネジ1の中心軸と平行
な方向に細長く伸びた形状を有する各光電変換素
子6,8,7で上記各反射光3,5,4を受光し
光電変換することによりネジ1の各部位に対応す
る電気信号を得ることができる。 On the other hand, since the incident light 2 is scanned parallel to the central axis of the screw 1, each thread, thread valley, etc. on the screw 1,
Each of the reflected lights from the thread ridgeline occurs on a straight line, that is, in the directions of the reflected lights 3, 5, and 4 in FIG. 2, respectively. Therefore, each of the reflected lights 3, 5, 4 is received and photoelectrically converted by each of the photoelectric conversion elements 6, 8, 7, which have a shape elongated in a direction parallel to the central axis of the screw 1, thereby converting the reflected light of the screw 1. Electrical signals corresponding to each region can be obtained.
第3図はこのようにして得られた電気信号の一
例を示すものであり、20はネジ山に対応する出
力信号波形、21はネジ谷に対応する出力信号波
形、22はネジの稜線部に対応する出力信号波形
である。 FIG. 3 shows an example of the electric signal obtained in this way, where 20 is the output signal waveform corresponding to the thread, 21 is the output signal waveform corresponding to the screw root, and 22 is the output signal waveform corresponding to the ridge of the screw. The corresponding output signal waveform.
同図に示すように、光の走査すなわち時間の経
過に伴つて、まず出力信号波形20のパルス状の
出力信号が発生し、以後、出力信号波形22、出
力信号波形21の順に発生する。この時、各信号
波形は光電変化素子6,7,8で受光されてる各
反射光3,4,5が空間的に大きく分離されてい
るため、他の部分からの反射光の影響を受けず安
定した出力信号波形を得ることができる。また、
ネジ1の各部に欠陥が発生した場合、第3図に示
すようにそれぞれに対応する部分の反射光が乱れ
て、対応する各出力信号波形20,21,22も
乱れるので、これを検出することによりネジ1の
各部の欠陥をそれぞれ独立に抽出することができ
る。 As shown in the figure, as the light scans, that is, with the passage of time, first a pulse-like output signal of an output signal waveform 20 is generated, and then an output signal waveform 22 and an output signal waveform 21 are generated in this order. At this time, each signal waveform is not affected by the reflected light from other parts because the reflected lights 3, 4, and 5 received by the photoelectric change elements 6, 7, and 8 are largely separated spatially. A stable output signal waveform can be obtained. Also,
If a defect occurs in each part of the screw 1, the reflected light of the corresponding part will be disturbed as shown in FIG. 3, and the corresponding output signal waveforms 20, 21, and 22 will also be disturbed, so it is necessary to detect this. Defects in each part of the screw 1 can be extracted independently.
したがつて、この発明によればネジ1の全表面
の欠陥検査を安定して実施することができるだけ
でなく、ネジ1の表面のどの部分に欠陥が発生し
ているかという情報まで得ることができる。な
お、特に例示はしていないが第3図に示したよう
なパルス波形よりその異常を検知し、欠陥を抽出
する回路的手段は既に欠陥検査用として周知のも
のがあり、信号処理回路の具体例において本特許
請求の範囲を越えることはできない。 Therefore, according to the present invention, it is not only possible to stably perform a defect inspection on the entire surface of the screw 1, but also to obtain information on which part of the surface of the screw 1 has a defect. . Although not specifically illustrated, circuit means for detecting abnormalities and extracting defects from pulse waveforms as shown in Fig. 3 are already well-known for defect inspection, and the specifics of the signal processing circuit are known. Examples may not go beyond the scope of the claims.
以上の実施例においては、入射光の走査におい
てネジ1の中心軸に沿つた方向に走査する場合に
ついて説明したが、ネジ1の外形プロフイールが
円筒以外の形状例えば円錐状の形状をしている場
合には、このプロフイールに沿つた方向に光を走
査すれば上記したと同じ効果が得られる。 In the above embodiment, the case where the incident light is scanned in the direction along the central axis of the screw 1 has been described, but when the external profile of the screw 1 has a shape other than a cylinder, for example, a conical shape, The same effect as described above can be obtained by scanning the light in the direction along this profile.
さらに走査角すなわち入射光を走査する角度は
ネジ1の山部の影にネジ1の谷がはいらないよう
に設定することが必要である。すなわち、入射光
の走査する平面におけるネジ面全面が入射光によ
つて照射されるように走査角を設定しなければな
らない。この走査角の設定可能範囲はネジの直
径、ネジ山の角度さらには入射光の走査する平面
とネジの中心との距離によつて変化するため表面
欠陥の検査を行うネジの全種類について上記した
条件を満たす必要がある。 Further, the scanning angle, that is, the angle at which the incident light is scanned, must be set so that the valley of the screw 1 does not fall into the shadow of the crest of the screw 1. That is, the scanning angle must be set so that the entire screw surface in the plane scanned by the incident light is irradiated with the incident light. The range in which this scanning angle can be set varies depending on the diameter of the screw, the angle of the screw thread, and the distance between the plane scanned by the incident light and the center of the screw. Conditions must be met.
以上のようにこの発明によれば入射光をネジの
谷部の外周円と交差しネジの中心軸と平行でかつ
このネジの中心軸をは含まない平面上を走査しネ
ジの表面でスポツト状に集光するように照射する
ようして、上記ネジの各部位に対応して分離され
た各反射光を受光して光電変換した信号波形の変
化を検出することにより、従来困難であつたネジ
の表面欠陥検査が可能となるばかりでなく、欠陥
発生部位までを特定できるなど、実用上の効果は
多大なものである。 As described above, according to the present invention, incident light is scanned on a plane that intersects the outer circumference of the trough of the screw, is parallel to the central axis of the screw, and does not include the central axis of the screw, and is scanned in the form of a spot on the surface of the screw. By irradiating the light so as to focus it on the screw, and detecting the change in the photoelectrically converted signal waveform by receiving the reflected light separated from each part of the screw, the screw This method not only makes it possible to inspect surface defects on surfaces, but also makes it possible to identify the defect occurrence site, which has great practical effects.
第1図はこの発明にかかわる検査装置の光学系
を示す概念図、第2図はネジ部における反射光の
経路を示す平面図、第3図イ,ロ,ハは各光電変
換素子の出力信号波形をそれぞれ示す波形図であ
る。
図中、1はネジ、2は入射光、3,4,5は反
射光、6,7,8は光電変換素子、20,21,
22は出力信号波形である。尚、各図中同一符号
は同一又は相当部を示す。
Fig. 1 is a conceptual diagram showing the optical system of the inspection device according to the present invention, Fig. 2 is a plan view showing the path of reflected light at the screw portion, and Fig. 3 A, B, and C are output signals of each photoelectric conversion element. FIG. 3 is a waveform diagram showing waveforms. In the figure, 1 is a screw, 2 is incident light, 3, 4, 5 is reflected light, 6, 7, 8 are photoelectric conversion elements, 20, 21,
22 is an output signal waveform. Note that the same reference numerals in each figure indicate the same or equivalent parts.
Claims (1)
照射して反射光によつて上記ネジの表面の欠陥を
検査するネジの表面欠陥検査装置において、上記
入射光を上記ネジの谷部の外周円と交差し上記ネ
ジの中心軸と平行でかつ上記ネジの中心軸をは含
まない平面上を走査して上記ネジの上記入射光の
照射領域内の全表面を照射し、上記ネジの山部、
谷部および稜線部それぞれから空間的に分離して
生じる上記反射光をそれぞれ独立の光電変換素子
で受光するようにしたことを特徴とするネジの表
面欠陥検査装置。 2 入射光の走査方向を上記ネジのプロフイール
に沿つて設定したことを特徴とする特許請求の範
囲第1項記載のネジの表面欠陥検査装置。[Scope of Claims] 1. A screw surface defect inspection device for inspecting defects on the surface of the screw using reflected light by irradiating incident light condensed into a spot on the surface of the screw. Scan a plane that intersects the outer circumferential circle of the screw root, is parallel to the central axis of the screw, and does not include the central axis of the screw, and irradiates the entire surface of the screw within the irradiation area of the incident light. , the crest of the above screw,
A surface defect inspection device for a screw, characterized in that the reflected light generated spatially separately from each of the troughs and the ridges is received by independent photoelectric conversion elements. 2. The screw surface defect inspection device according to claim 1, wherein the scanning direction of the incident light is set along the profile of the screw.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2968682A JPS58146843A (en) | 1982-02-25 | 1982-02-25 | Device for inspecting surface defect of screw |
| DE19833306194 DE3306194A1 (en) | 1982-02-25 | 1983-02-23 | METHOD FOR TESTING SCREW SURFACES FOR FAULTS AND DEVICE FOR IMPLEMENTING THEM |
| US06/469,234 US4598998A (en) | 1982-02-25 | 1983-02-24 | Screw surface flaw inspection method and an apparatus therefor |
| GB08305360A GB2115924B (en) | 1982-02-25 | 1983-02-25 | A method of and apparatus for inspecting the surface of a screw to detect flaws |
| FR8303088A FR2522149B1 (en) | 1982-02-25 | 1983-02-25 | METHOD AND APPARATUS FOR CHECKING SURFACE DEFECTS OF A SCREW |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2968682A JPS58146843A (en) | 1982-02-25 | 1982-02-25 | Device for inspecting surface defect of screw |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58146843A JPS58146843A (en) | 1983-09-01 |
| JPH0449063B2 true JPH0449063B2 (en) | 1992-08-10 |
Family
ID=12282987
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2968682A Granted JPS58146843A (en) | 1982-02-25 | 1982-02-25 | Device for inspecting surface defect of screw |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58146843A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6058536A (en) * | 1983-09-12 | 1985-04-04 | Kawasaki Steel Corp | Method and apparatus for checking property of cut and machined surface |
| JPS60190841A (en) * | 1984-03-12 | 1985-09-28 | Inatetsuku:Kk | Device for detecting blowhole in surface of cast product |
| JPS6219705A (en) * | 1985-07-18 | 1987-01-28 | Sumitomo Metal Ind Ltd | Surface detector for screw |
| DE10359837A1 (en) * | 2003-12-19 | 2005-07-21 | Kamax-Werke Rudolf Kellermann Gmbh & Co. Kg | Method and device for checking a thread of a connecting element for damage |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5483885A (en) * | 1977-12-17 | 1979-07-04 | Mitsubishi Electric Corp | Surface inspector |
| JPS54150163A (en) * | 1978-05-17 | 1979-11-26 | Nippon Kokan Tsugite Kk | Automatic tester for screw member |
-
1982
- 1982-02-25 JP JP2968682A patent/JPS58146843A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58146843A (en) | 1983-09-01 |
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