JPH0454445A - Production of oxygen sensor - Google Patents
Production of oxygen sensorInfo
- Publication number
- JPH0454445A JPH0454445A JP2164387A JP16438790A JPH0454445A JP H0454445 A JPH0454445 A JP H0454445A JP 2164387 A JP2164387 A JP 2164387A JP 16438790 A JP16438790 A JP 16438790A JP H0454445 A JPH0454445 A JP H0454445A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- laf3
- electron beam
- oxygen sensor
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 title claims description 32
- 239000001301 oxygen Substances 0.000 title claims description 32
- 229910052760 oxygen Inorganic materials 0.000 title claims description 32
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000000034 method Methods 0.000 claims abstract description 18
- 238000010894 electron beam technology Methods 0.000 claims abstract description 12
- 239000002245 particle Substances 0.000 claims abstract description 6
- 239000007784 solid electrolyte Substances 0.000 claims description 10
- 238000000151 deposition Methods 0.000 claims description 4
- 230000008021 deposition Effects 0.000 claims description 4
- 239000007789 gas Substances 0.000 claims description 4
- 239000010409 thin film Substances 0.000 abstract description 30
- BYMUNNMMXKDFEZ-UHFFFAOYSA-K trifluorolanthanum Chemical compound F[La](F)F BYMUNNMMXKDFEZ-UHFFFAOYSA-K 0.000 abstract description 23
- 229910002319 LaF3 Inorganic materials 0.000 abstract description 21
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 abstract description 10
- 239000010408 film Substances 0.000 abstract description 10
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 abstract description 10
- 150000002500 ions Chemical class 0.000 abstract description 9
- 239000000758 substrate Substances 0.000 abstract description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 7
- 229910052710 silicon Inorganic materials 0.000 abstract description 7
- 239000010703 silicon Substances 0.000 abstract description 7
- 239000011261 inert gas Substances 0.000 abstract description 6
- 229910052786 argon Inorganic materials 0.000 abstract description 5
- 238000005336 cracking Methods 0.000 abstract description 5
- 229910052697 platinum Inorganic materials 0.000 abstract description 5
- 238000007740 vapor deposition Methods 0.000 abstract description 4
- 230000008020 evaporation Effects 0.000 abstract 1
- 238000001704 evaporation Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 238000005566 electron beam evaporation Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000004043 responsiveness Effects 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000002737 fuel gas Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 229910002076 stabilized zirconia Inorganic materials 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Landscapes
- Measuring Oxygen Concentration In Cells (AREA)
Abstract
Description
【発明の詳細な説明】
A、産業上の利用分野
本発明は、呼気中の酸素濃度測定、酸素吸入器等のモニ
タ及び自動車等に用いられる酸素センサに関する。DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to an oxygen sensor used for measuring oxygen concentration in exhaled breath, monitors of oxygen inhalers, etc., and automobiles.
B8発明の概要
本発明は、分子式LaF、、で表されるフッ化ランタン
を固体電解質とし、上記LaF3の薄膜を電子ビーム蒸
着法により形成する際にイオン化した不活性ガスの粒子
を上記薄膜に衝突させて薄膜表面を平滑化するイオンシ
ャワー法を利用することにより、LaF3薄膜型酸素セ
ンサの固体電解質の構造を緻密とし、耐久性を向上させ
た。B8 Summary of the Invention The present invention uses lanthanum fluoride represented by the molecular formula LaF as a solid electrolyte, and when forming the above-mentioned LaF3 thin film by electron beam evaporation, ionized inert gas particles collide with the above-mentioned thin film. By using the ion shower method to smooth the thin film surface, the solid electrolyte structure of the LaF3 thin film oxygen sensor was made denser and its durability was improved.
C9従来の技術
従来、燃料ガス等に含まれる酸素の測定には、固体電解
質として、化学式ZrO2の酸化ジルコニウムを安定化
剤で化学式Y2O3の酸化イツトリウムを用いて固溶体
にした安定化ジルコニア等が用いられており、これらの
固体電解質を用いた酸素センサの応答性の向上、及び小
型化のために薄膜の微細加工技術を用いた新型の薄膜型
酸素センサが開発されている。C9 Conventional technology Conventionally, stabilized zirconia, which is a solid solution of zirconium oxide with the chemical formula ZrO2 and yttrium oxide with the chemical formula Y2O3 as a stabilizer, has been used as a solid electrolyte to measure oxygen contained in fuel gas, etc. A new type of thin film oxygen sensor using thin film microfabrication technology has been developed to improve the responsiveness and miniaturize oxygen sensors using solid electrolytes.
しかし、固体電解質に用いられるZrO2は、動作条件
として700℃以上の高温が必要であるため現在低温動
作が可能な酸素センサが研究されており、固体電解質と
してZrO2に変えてLaF3単結晶型酸素センサが提
案されている。However, since ZrO2 used as a solid electrolyte requires a high temperature of 700°C or higher as an operating condition, oxygen sensors that can operate at low temperatures are currently being researched. is proposed.
ところが、LaF3単結晶型酸素センサは、従来に比し
て低温動作が可能である反面、非常に高価であり、商業
的には不向きである。However, although the LaF3 single crystal oxygen sensor can operate at a lower temperature than conventional sensors, it is very expensive and is not suitable for commercial use.
そこで、薄膜化したLaF3を固体電解質に用いた薄膜
型酸素センサが研究されており、従来技術では薄膜化の
方法としては抵抗加熱法が用いられている。Therefore, a thin film oxygen sensor using a thin film of LaF3 as a solid electrolyte is being researched, and in the prior art, a resistance heating method is used as a method for thinning the film.
D1発明が解決しようとする課題
従来、酸素濃度に対する応答速度が速く、小型でかつ低
温動作が可能な酸素センサの実現が望まれており、この
ため、LaF3を固体電解質に用いたLaF2薄膜型酸
素センサが研究されていた。D1 Problems to be Solved by the Invention Conventionally, it has been desired to realize an oxygen sensor that has a fast response speed to oxygen concentration, is small in size, and can operate at low temperatures. Sensors were being researched.
しかし、従来の抵抗加熱法で製造したLaF3薄膜型酸
素センサは、応答速度の向上、小型化、動作条件の低温
化という従来の要望を満たし、また、LaF3単結晶型
酸素センサに比して大幅にコストを低減できるという利
点もあるが、膜の構造が粗いため膜割れが起き易く、ま
た耐久性に欠けるという欠点があり、実用化には至って
いない。However, the LaF3 thin-film oxygen sensor manufactured using the conventional resistance heating method satisfies the conventional demands of improved response speed, miniaturization, and lower operating temperature, and is significantly more efficient than the LaF3 single-crystal oxygen sensor. Although it has the advantage of being able to reduce costs, it has the disadvantages of being prone to cracking due to the rough structure of the membrane and lack of durability, so it has not been put into practical use.
本発明はこのような背景の下になされたものであり、L
aF3薄膜型酸素センサにおいて、膜の構造を緻密にし
て、膜割れを防ぎ、かつ耐久性を向上し、コストを低減
したLaF3薄膜型酸素センサの製造方法を提供するこ
とを目的とする。The present invention was made against this background, and
An object of the present invention is to provide a method for manufacturing a LaF3 thin film oxygen sensor, which has a dense film structure, prevents film cracking, improves durability, and reduces costs.
80課題を解決するための手段
本発明は、上記の課題を達成するために、固体電解質層
の両面に夫々電極を形成して成る酸素センサの製造方法
において、LaFsよりなる蒸着源に電子ビームを照射
して電極上に蒸着分子を放射し、同時にイオン化された
不活性ガスの粒子を前記電極に衝突させて当該電極上に
固体電解質層であるLaF3層を形成することを特徴と
する。80 Means for Solving the Problems In order to achieve the above-mentioned problems, the present invention provides a method for manufacturing an oxygen sensor in which electrodes are formed on both sides of a solid electrolyte layer, in which an electron beam is applied to a deposition source made of LaFs. The method is characterized in that it emits vapor-deposited molecules onto the electrode by irradiation, and at the same time causes ionized inert gas particles to collide with the electrode to form a LaF3 layer, which is a solid electrolyte layer, on the electrode.
F3作用
本発明は、LaF3薄膜を形成する際に、不活性ガスの
粒子を薄膜表面に衝突させるイオンシャワー法を利用す
ることにより、形成されるLaF2薄膜を、緻密で平滑
にしている。F3 action In the present invention, when forming a LaF3 thin film, the formed LaF2 thin film is made dense and smooth by utilizing an ion shower method in which inert gas particles collide with the surface of the thin film.
G、実施例
以下、本実施例におけるLaF3薄膜型酸素センサの製
造法を第1図を参照して説明する。G. Example Hereinafter, a method for manufacturing a LaF3 thin film oxygen sensor in this example will be explained with reference to FIG.
シリコン基板1上に、好ましくはスパッタリング法にて
厚さ約5000λの白金膜を形成して第一電極2とし、
更にこの第一電極2上に、電子ビーム蒸着法によりLa
F3を蒸着して厚み2μmのLaF3薄膜3を形成する
。A platinum film having a thickness of about 5000λ is formed on a silicon substrate 1, preferably by a sputtering method, as a first electrode 2,
Further, on this first electrode 2, La is deposited by electron beam evaporation method.
F3 is deposited to form a LaF3 thin film 3 having a thickness of 2 μm.
ここで、電子ビーム蒸着を行う際に、電子ビーム装置内
に電極を設けてアルゴンガスを導入し、電極間でLaF
3の蒸着分子と共にイオン化されたアルゴンを加速して
基板に放射するイオンシャワー法を用いる。Here, when performing electron beam evaporation, electrodes are provided in the electron beam device, argon gas is introduced, and LaF
An ion shower method is used in which ionized argon is accelerated together with the vapor-deposited molecules of step 3 and radiated onto the substrate.
第3図に示されるように、本発明方法に用いられるイオ
ンシャワー装置は、蒸着物の入った容器12の上方にシ
ャッター13とサンプルホルダー14に取り付けられた
シリコン基板15とをこの順に一直線上に配置すると共
に、蒸着分子の放射領域を挟むように1対の電極16.
16を対設し、更に蒸着物に電子ビームを照射する電子
ビームガン11を設けた構成となっている。As shown in FIG. 3, the ion shower device used in the method of the present invention places a shutter 13 and a silicon substrate 15 attached to a sample holder 14 on a straight line in this order above a container 12 containing a deposit. At the same time, a pair of electrodes 16.
16 are arranged opposite to each other, and an electron beam gun 11 is further provided for irradiating the deposited material with an electron beam.
この装置を真空雰囲気として不活性ガスを導入し、電子
ビームガンIIから電子ビームの照射を行うと共に電極
16.16間に電圧を印加すると、蒸着分子がシリコン
基板15へ放射されると同時に不活性ガスがイオン化さ
れ、シリコン基板15上に形成される薄膜層に衝突する
構成となっている。When this apparatus is made into a vacuum atmosphere and an inert gas is introduced, and an electron beam is irradiated from the electron beam gun II and a voltage is applied between the electrodes 16 and 16, vapor deposition molecules are radiated onto the silicon substrate 15 and at the same time the inert gas is ionized and collides with the thin film layer formed on the silicon substrate 15.
本実施例では6.67XIO−5Paの真空中にアルゴ
ンガスを導入し、基板I7の温度を500℃としており
、また、イオンソース電圧を500v、電流量を500
mAに設定して6.0■の電子ビーム印加電圧をかけ、
蒸着物にはLaF3の1〜5mmベレットを用いている
。In this example, argon gas is introduced into a vacuum of 6.67
Set to mA and apply an electron beam applied voltage of 6.0■.
A 1-5 mm pellet of LaF3 is used for the deposition.
また、蒸着物に小粒径のLaFsを用いることにより、
形成される薄膜がより緻密で平滑、な構造となる。In addition, by using small particle size LaFs as the deposit,
The thin film formed has a denser, smoother structure.
このようにしてLaF3薄膜3を形成した後、この薄膜
上にスパッタリング法で厚み約500OAの白金膜を形
成して第二電極4とする。After forming the LaF3 thin film 3 in this manner, a platinum film having a thickness of about 500 OA is formed on this thin film by sputtering to form the second electrode 4.
また、上記第一電極、第二電極の生成法はスパッタリン
グ法に限定されず、抵抗加熱法や白金ペースト塗布法等
を実施しても良い。Furthermore, the method for producing the first electrode and the second electrode is not limited to the sputtering method, but may also be a resistance heating method, a platinum paste coating method, or the like.
また、第2図に測定温度を300℃として、本発明に係
る酸素センサの第一電極2側を標準空気側とし、第二電
極4側に酸素濃度の低い排気ガスを送り込んだ場合の両
電極間に発生する起電力の測定結果をグラフ(1)に示
し、比較例として直径10mm、厚さ0.5mmのLa
Fs単結晶型酸素センサによる測定結果をグラフ(2)
に示す。In addition, FIG. 2 shows both electrodes when the measurement temperature is 300°C, the first electrode 2 side of the oxygen sensor according to the present invention is the standard air side, and the exhaust gas with a low oxygen concentration is sent to the second electrode 4 side. Graph (1) shows the measurement results of the electromotive force generated between the
Graph (2) of measurement results using the Fs single crystal oxygen sensor
Shown below.
グラフ(1)、(2)は、共に平衡状態の値は大差ない
が、平衡に達するまでの時間はLaF3薄膜型酸素セン
サが明らかに速く、応答性が向上している。Graphs (1) and (2) show that the equilibrium state values are not much different, but the LaF3 thin film oxygen sensor clearly takes a faster time to reach equilibrium and has improved responsiveness.
H0効果
上記のようにイオンシャワーを利用した電子ビーム蒸着
法でLaF3@膜型酸素上型酸素センサたことによりL
aF3薄膜が緻密な構造となって膜割れが非常に起こり
難くなり、耐久性が向上する。H0 effect As mentioned above, the L
The aF3 thin film has a dense structure, making it extremely difficult for film cracking to occur and improving durability.
この結果、従来の酸素センサに比して応答性が高く、小
型で、低温で動作し、かつコストが低いLaF3薄膜型
酸素センサが実用化される。As a result, a LaF3 thin film oxygen sensor that has higher responsiveness, is smaller, operates at lower temperatures, and is lower in cost than conventional oxygen sensors will be put into practical use.
第1図は本発明に係る酸素センサの構造図、第2図はL
aF3薄膜型酸素センサとLaF3単結晶型酸素センサ
の出力特性図、
第3図はイオンシャワー装置の概略説明図である。
1・・・シリコン基板、2・・・第一電極、3・・・フ
ッ化ランタン薄膜、4・・・第二電極、11・・・電子
ビーム、12・・・容器、13・・・シャッター 14
・・・サンプルホルダー15・・・シリコン基板、16
・・・電極第1図
本発明に係る酸素センサの構造図
第2図
酸素センサの出力特性図
時間(分)
第3図
イオ゛ンンヤワー装置の概略説明図
0=二二コ一一11Fig. 1 is a structural diagram of an oxygen sensor according to the present invention, and Fig. 2 is a structural diagram of an oxygen sensor according to the present invention.
Output characteristic diagrams of an aF3 thin film oxygen sensor and a LaF3 single crystal oxygen sensor, and FIG. 3 is a schematic explanatory diagram of an ion shower device. DESCRIPTION OF SYMBOLS 1... Silicon substrate, 2... First electrode, 3... Lanthanum fluoride thin film, 4... Second electrode, 11... Electron beam, 12... Container, 13... Shutter 14
... Sample holder 15 ... Silicon substrate, 16
... Electrode Figure 1 Structure diagram of the oxygen sensor according to the present invention Figure 2 Output characteristic diagram of the oxygen sensor Time (minutes) Figure 3 Schematic diagram of the ion power device 0 = 22 11 11
Claims (1)
素センサの製造方法において、 LaF_3よりなる蒸着源に電子ビームを照射して電極
上に蒸着分子を放射し、同時にイオン化された不活性ガ
スの粒子を前記電極に衝突させて当該電極上に固体電解
質層であるLaF_3層を形成することを特徴とする酸
素センサの製造方法。(1) In a method for manufacturing an oxygen sensor in which electrodes are formed on both sides of a solid electrolyte layer, an electron beam is irradiated onto a deposition source made of LaF_3 to emit deposition molecules onto the electrodes, and at the same time an ionized inert A method for manufacturing an oxygen sensor, characterized in that a LaF_3 layer, which is a solid electrolyte layer, is formed on the electrode by colliding gas particles with the electrode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2164387A JPH0454445A (en) | 1990-06-22 | 1990-06-22 | Production of oxygen sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2164387A JPH0454445A (en) | 1990-06-22 | 1990-06-22 | Production of oxygen sensor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0454445A true JPH0454445A (en) | 1992-02-21 |
Family
ID=15792159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2164387A Pending JPH0454445A (en) | 1990-06-22 | 1990-06-22 | Production of oxygen sensor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0454445A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2754901A1 (en) * | 1996-10-21 | 1998-04-24 | Sagem | Solid state chemical gas sensor with long term stability |
-
1990
- 1990-06-22 JP JP2164387A patent/JPH0454445A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2754901A1 (en) * | 1996-10-21 | 1998-04-24 | Sagem | Solid state chemical gas sensor with long term stability |
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