JPH0456773A - Plasma CVD equipment - Google Patents
Plasma CVD equipmentInfo
- Publication number
- JPH0456773A JPH0456773A JP16507290A JP16507290A JPH0456773A JP H0456773 A JPH0456773 A JP H0456773A JP 16507290 A JP16507290 A JP 16507290A JP 16507290 A JP16507290 A JP 16507290A JP H0456773 A JPH0456773 A JP H0456773A
- Authority
- JP
- Japan
- Prior art keywords
- nozzle
- substrate
- holder
- thin film
- raw material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005268 plasma chemical vapour deposition Methods 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims abstract description 14
- 239000002994 raw material Substances 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 19
- 239000007789 gas Substances 0.000 abstract description 31
- 239000010409 thin film Substances 0.000 abstract description 13
- 239000010408 film Substances 0.000 abstract description 9
- 150000002500 ions Chemical class 0.000 abstract description 7
- 229910003074 TiCl4 Inorganic materials 0.000 abstract description 2
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 abstract description 2
- 239000011248 coating agent Substances 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 238000000354 decomposition reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000011148 porous material Substances 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- GBECUEIQVRDUKB-UHFFFAOYSA-M thallium monochloride Chemical compound [Tl]Cl GBECUEIQVRDUKB-UHFFFAOYSA-M 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は低温で密着性に優れた金属、ファインセラミッ
クス等の薄膜をコーティングすることができるプラズマ
CVD装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a plasma CVD apparatus capable of coating thin films of metals, fine ceramics, etc. with excellent adhesion at low temperatures.
鋼などの基材に、金属やセラミック等をコーティングし
て耐摩耗性を向上させ、基材の信頼性を高めることが近
年盛んに行なわれているが、従来よりこのコーティング
は第2図に示すようなプラズマCVDN1によって行な
われている。In recent years, it has become common practice to coat base materials such as steel with metals, ceramics, etc. to improve wear resistance and increase the reliability of the base material. This is carried out by a plasma CVDN1 such as the above.
図示のように真空槽11内にはその中心部より原料ガス
供給パイプ+2、内側円筒電極13、外側円筒電極I4
が各々同軸状に配置されている((0)図参照)。まず
、原料ガス供給パイプ12は同軸二重管構造で、各管の
外周方向及び長手方向にわたって多数の細孔12aを備
え、かつ原料ガス供給系18とつながっている。次に前
記パイプ12の外周に位置する内側円筒電極13は、メ
ツシュ構造で高周波電源15に接続されている。さらに
、内側円筒電極13の外周に位置する外側円筒電極14
は、基材ホルダーの役割りも備えその内周に基材17を
装着でき、又直流電源I6の負の端子に接続されている
。As shown in the figure, from the center of the vacuum chamber 11 there is a raw material gas supply pipe +2, an inner cylindrical electrode 13, and an outer cylindrical electrode I4.
are arranged coaxially (see figure (0)). First, the raw material gas supply pipe 12 has a coaxial double pipe structure, has a large number of pores 12a along the outer circumferential direction and the longitudinal direction of each pipe, and is connected to the raw material gas supply system 18. Next, an inner cylindrical electrode 13 located on the outer periphery of the pipe 12 is connected to a high frequency power source 15 with a mesh structure. Furthermore, an outer cylindrical electrode 14 located on the outer periphery of the inner cylindrical electrode 13
also has the role of a substrate holder, on the inner periphery of which the substrate 17 can be attached, and is connected to the negative terminal of the DC power source I6.
そして真空槽Il内を所定の圧力にし、基材を所定温度
まで加熱して、細孔12aより原料ガスを供給しつつ、
両軍源1B及び17より所定の電力を印加する。すると
、原料ガスはプラズマ放電領域で励起、分解され、基材
表面に薄膜を形成するのである。Then, the inside of the vacuum chamber Il is set to a predetermined pressure, the base material is heated to a predetermined temperature, and the raw material gas is supplied from the pores 12a,
A predetermined power is applied from both sources 1B and 17. Then, the source gas is excited and decomposed in the plasma discharge region, forming a thin film on the surface of the base material.
ところで上記従来装置ではコーティングに必要な全ての
原料ガスを単一の供給系18につながるパイプ2より供
給し、又印加される高周波電力も単一の電源16より供
給されている。By the way, in the conventional apparatus described above, all the raw material gases necessary for coating are supplied from the pipe 2 connected to a single supply system 18, and the high frequency power to be applied is also supplied from a single power supply 16.
しかし、原料ガスの分子はその種類ごとに固有のイオン
化ポテンシャルを持ち、同一のプラズマ密度では各々励
起、分解の度合いが異なっている場合が非常に多い。例
えばTINとTicの複合膜あるいはTlCNの薄膜を
コーティングする場合、原料ガスとしてTiCl4 +
NH3、CH4を用いるが、各々の第1イオン化ポテ
ンシヤルは、+1.78.10.15.12.75eV
と異なり、プラズマ放電によりIIH3は分解され易い
が逆にCH14は分解されにくい。However, each type of raw material gas molecule has its own ionization potential, and the degree of excitation and decomposition of each type is very often different at the same plasma density. For example, when coating a composite film of TIN and Tic or a thin film of TlCN, TiCl4 + is used as the raw material gas.
NH3 and CH4 are used, and the first ionization potential of each is +1.78.10.15.12.75eV
Unlike, IIH3 is easily decomposed by plasma discharge, whereas CH14 is difficult to decompose.
このため、化学量論的な膜を得にくいばかりか、未反応
の炭化物を膜中に取り込んでしまい、膜の性能低下を引
き起こしていた。For this reason, it is not only difficult to obtain a stoichiometric film, but also unreacted carbides are incorporated into the film, causing a decrease in the performance of the film.
又、CH4を完全に分解させるために、高周波電力を増
加させ、プラズマ密度を上げると、N[13,TlCl
4から生じるラジカル及びラジカル同士で反応すること
により生じる高次ラジカルが発生し、異常放電の原因と
なっていた。In addition, in order to completely decompose CH4, by increasing the radio frequency power and increasing the plasma density, N[13, TlCl
Radicals generated from No. 4 and higher-order radicals generated by reactions between radicals were generated, causing abnormal discharge.
従って本発明の目的は、上記の欠点を解決すべく、各原
料ガスごと、これを励起分解するのに最適な密度のプラ
ズマ放電領域を発生せしめ、高品質のコーティングがで
きるプラズマCVD装置を提供することにある。Therefore, an object of the present invention is to provide a plasma CVD apparatus that can generate a plasma discharge region with an optimal density to excite and decompose each raw material gas, and can perform high-quality coating, in order to solve the above-mentioned drawbacks. There is a particular thing.
上記の目的を達成するため、本発明のプラズマCVD装
置は、真空槽内に、各々独立した原料ガス供給系につな
がり、かつその吹出口を基材方向に向けて配置された複
数のノズルを備え、基材ヲ装着しうるホルダーと前記各
ノズルの間に前記ノズルと同数のメツシュ電極を前記各
ノズルと対向して配置させ、前記各ノズルを接地し、前
記各メツシュ電極を各々独立の高周波電源に接続し、前
記基材に負の電位を印加しうるよう前記ホルダーを直流
電源の負の端子に接続して、前記真空槽の外部又は内部
にヒータを設けたものである。In order to achieve the above object, the plasma CVD apparatus of the present invention includes a plurality of nozzles arranged in a vacuum chamber, each connected to an independent raw material gas supply system, and with its outlet facing toward the substrate. , Mesh electrodes of the same number as the nozzles are arranged between the holder to which the base material can be attached and each of the nozzles, facing each of the nozzles, each of the nozzles is grounded, and each of the mesh electrodes is connected to an independent high-frequency power source. The holder is connected to the negative terminal of a DC power source so that a negative potential can be applied to the base material, and a heater is provided outside or inside the vacuum chamber.
上記のように原料ガスの種類ごとに、供給系、ノズル、
メツシュ電極を独立させることで、各原料ガスを励起、
分解するのに最適な高周波電力を供給することができる
。これにより従来装置にあった原料ガスの種類によって
はその励起、分解に必要な高周波電力に過不足が生じる
という問題が解消されるのである。As mentioned above, for each type of raw material gas, the supply system, nozzle,
By making mesh electrodes independent, each source gas is excited,
It can supply the optimal high frequency power for decomposition. This solves the problem that existed in conventional devices, where depending on the type of raw material gas, there would be an excess or deficiency in the high-frequency power required for excitation and decomposition.
又、ノズルから吹き出した原料ガスはプラズマ放電領域
で励起、分解され、正の電荷を帯びたイオンと負の電荷
を帯びた電子にかわるが、薄膜形成に必要な成分は正の
イオンである。基材表面に密着性に優れた薄膜を形成す
るには、このイオンを基材に引きよせ、基材への衝撃の
度合いを大きくする必要がある。そのため、基材に負の
電位を与えることで正のイオンを強く引きよせ、基材上
でイオン同士の結合により密着性に優れた薄膜を形成さ
せるのである。Further, the raw material gas blown out from the nozzle is excited and decomposed in the plasma discharge region and turns into positively charged ions and negatively charged electrons, but the components necessary for forming a thin film are positive ions. In order to form a thin film with excellent adhesion on the surface of a substrate, it is necessary to attract these ions to the substrate and increase the degree of impact on the substrate. Therefore, by applying a negative potential to the base material, positive ions are strongly attracted to each other, and a thin film with excellent adhesion is formed on the base material due to the bonds between the ions.
以下、第1図に示す実施例装置に基づいて本発明を説明
する。The present invention will be explained below based on the embodiment shown in FIG.
まず装置の機械的構成からのべる。First, let's start with the mechanical configuration of the device.
■真空槽1
これは形状が立方体のもので排気系(図示していない)
とつながり内部を所定の圧力に調整することができる。■Vacuum chamber 1 This is cubic in shape and has an exhaust system (not shown)
The internal pressure can be adjusted to a predetermined level.
■ホルダー2
真空槽1内のほぼ中心部に位置する円筒台状のもので基
材6を装着するものである。尚、基板を回転することが
できるよう構成してもよい。■Holder 2 This is a cylindrical pedestal located approximately in the center of the vacuum chamber 1, and is used to mount the base material 6. Note that the substrate may be configured to be rotatable.
■ノズル3
先端部分で末広がりの形状をしており、最先端部に多数
の吹出口4を備え、真空槽1内で前記ホルダーをとりか
こむように吹出口4を基板方向に向け、複数(本実施例
では8つ)配置されている。これらノズル3は各々独立
した原料ガス供給系7につながり、各供給系7に異った
種類の原料ガスをセットすれば、各ノズルごと異なった
原料ガスが吹き出せるよう構成されている。■Nozzle 3 It has a shape that widens at the tip, and is equipped with a large number of air outlets 4 at the tip. In the example, 8) are arranged. Each of these nozzles 3 is connected to an independent raw material gas supply system 7, and by setting different types of raw material gas in each supply system 7, a different raw material gas can be blown out from each nozzle.
■メツシュ電極5
網目構造をした電極で、前記ノズル3と同数あり、各々
ホルダー2とノズル3の間で、ノズル3に対向して配置
されている。この網目の寸法は原料ガスの流れを妨げな
い程度のものとし、又各メツシュ電極はノズル3との間
隔(あるいは基材との間隔)を独立して調整しうる構成
としているので、薄膜形成に最適な前記間隔を選択する
ことができる(例えばメツシュ電極が基材に近すきすぎ
ると、薄膜上に網目模様が形成されることがある)。(2) Mesh electrodes 5 Mesh electrodes 5 have the same number of mesh electrodes as the nozzles 3, and are arranged between the holder 2 and the nozzle 3, facing the nozzle 3. The dimensions of this mesh are such that they do not impede the flow of the raw material gas, and each mesh electrode has a configuration in which the distance from the nozzle 3 (or the distance from the base material) can be adjusted independently, making it easy to form a thin film. The optimum spacing can be selected (for example, if the mesh electrode is too close to the substrate, a mesh pattern may be formed on the thin film).
■ヒータ(図示していない)
基板を所定の温度に加熱、調整するもので、真空槽内部
(真空槽内壁、ホルダー2の底部など)又は外部に設け
られている。■Heater (not shown) Heats and adjusts the substrate to a predetermined temperature, and is provided inside the vacuum chamber (inner wall of the vacuum chamber, bottom of the holder 2, etc.) or outside.
次に電気的構成についてのべる。Next, let's talk about the electrical configuration.
■ホルダー2
直流電源8の負の端子に接続されている。ホルダー2の
基材装着面は導電性であるため、前記電源8より基材に
負の電位を与えることができる。■Holder 2 Connected to the negative terminal of the DC power supply 8. Since the base material mounting surface of the holder 2 is conductive, a negative potential can be applied to the base material from the power source 8.
尚、同電源8の正の端子は接地されている。Note that the positive terminal of the power source 8 is grounded.
■ノズル3 各々が接地されている(図示していない)。■Nozzle 3 Each is grounded (not shown).
■メツシュ電極5
各々独立した高周波電源9の一方端子に接続されている
。これにより各メツシュ電極ごと独立に高周波電力を制
御することができる。■Mesh electrodes 5 Each is connected to one terminal of an independent high frequency power source 9. This allows the high frequency power to be controlled independently for each mesh electrode.
尚同電源9の他方端子は接地されている。The other terminal of the power source 9 is grounded.
■高周波電源 各電源9は全て異相信号発生器10に接続されている。■High frequency power supply All power supplies 9 are connected to an out-of-phase signal generator 10.
このため各電源9の高周波信号は互いに干渉することな
くプラズマを発生させることができる。Therefore, the high frequency signals of each power source 9 can generate plasma without interfering with each other.
上記の装置内に基材を装着し、真空槽内の圧力、基材温
度を所定の状態に保つ。そして各原料ガスを供給しつつ
、これを励起、分解するのに最適な高周波電力をメツ7
ユ電極に印加し、さらに基材に負の電位を与えることで
薄膜形成を行なう。The base material is installed in the above-mentioned apparatus, and the pressure in the vacuum chamber and the temperature of the base material are maintained at predetermined conditions. Then, while supplying each raw material gas, the optimal high-frequency power to excite and decompose it is supplied to Metsu7.
A thin film is formed by applying a negative potential to the Y electrode and further applying a negative potential to the base material.
上記の装置を用いてTlCN膜のコーティングを行った
。A TlCN film was coated using the above apparatus.
1辺60cmの立方体の真空槽を用い、20CIlφの
ホルダー上に基材として2hmX20mm、厚さ3mm
のSK■9板を装着した。又、TlCNの原料ガスとし
て、TlCl4. NH,、CH2を用いるが、TlC
l4は常温で液体であるためキャリアガスとしてH2、
プラズマの安定化としてArを用いた。これら各原料ガ
スを吹出すノズルは、TlC14と■2の混合ガス用、
Ar用、Ni13用、CH2用の4つを用い、各ノズル
に対向するメツ7ユ電極には各々I Kv。Using a cubic vacuum chamber with sides of 60 cm, a base material of 2 hm x 20 mm and 3 mm thick was placed on a holder of 20 CIlφ.
I installed the SK■9 board. In addition, as a raw material gas for TlCN, TlCl4. NH,,CH2 are used, but TlC
Since l4 is a liquid at room temperature, H2 is used as a carrier gas,
Ar was used to stabilize the plasma. The nozzles that blow out each of these raw material gases are for mixed gas of TLC14 and ■2,
Four electrodes, one for Ar, one for Ni13, and one for CH2, are used, and the electrodes facing each nozzle are each IKv.
1.5Kv 、 1.5Kw 、 3 Kvの高周波電
力を印加する。High-frequency power of 1.5 Kv, 1.5 Kw, and 3 Kv is applied.
ここで用いたメツシュ電極は網目の寸法が5io+のち
ので、又、基材に印加する直流バイアスは一200Vと
した。そして、真空槽内を0.2Torrに排気し、抵
抗加熱型のヒータで基材温度を500℃まで加熱して2
時間のコーティングを行った。The mesh electrode used here had a mesh size of 5 io+, and the DC bias applied to the base material was -200V. Then, the inside of the vacuum chamber was evacuated to 0.2 Torr, and the substrate temperature was heated to 500°C using a resistance heating type heater.
Time coating was done.
その結果、膜厚2.山の光沢のある紫色を呈したTlC
N膜を形成することができた。このTl0N膜の密着度
をA、Eスクラッチテスターを用いて測定したところ3
0から35Nの高い値であり、優れた密着性を有するこ
とが確認された。As a result, the film thickness was 2. TlC with a mountain glossy purple color
A N film could be formed. The adhesion of this Tl0N film was measured using A and E scratch testers.
The value was as high as 0 to 35N, and it was confirmed that the adhesive had excellent adhesion.
以上説明したように、各原料ガスが励起、分解されるの
に最適な密度をもつプラズマ放電領域を発生させ、未反
応ガスの残留、高次ラジカルによる異常放電等の悪影響
を排除することによって、密着性に優れた萬品質の薄膜
を形成することができる。As explained above, by generating a plasma discharge region with the optimum density for each source gas to be excited and decomposed, and eliminating negative effects such as residual unreacted gas and abnormal discharge due to higher-order radicals, A thin film with excellent adhesion and high quality can be formed.
第1図は本発明実施例装置の平面図、第2図は従来装置
を示すもので(イ)はその縦断図、(ロ)はその横断図
である。
1、ll・・・真空槽、2・・・ホルダー 3・・・ノ
ズル、4・・・吹出口、5・・・メツシュ電極、6.1
7・・・基材、7.18・・・原料ガス供給系、8.1
6・・・直流電源、9.15・・・高周波電源、IO・
・・異相信号発生器、12・・・原料ガス供給パイプ、
12a・・・細孔、13・・・内側円筒電極、14・・
・外側円筒電極。FIG. 1 is a plan view of an apparatus according to an embodiment of the present invention, and FIG. 2 shows a conventional apparatus, in which (a) is a longitudinal sectional view and (b) is a cross-sectional view. 1, ll... Vacuum chamber, 2... Holder 3... Nozzle, 4... Air outlet, 5... Mesh electrode, 6.1
7... Base material, 7.18... Raw material gas supply system, 8.1
6...DC power supply, 9.15...High frequency power supply, IO/
...Different phase signal generator, 12... Raw material gas supply pipe,
12a... Pore, 13... Inner cylindrical electrode, 14...
・Outer cylindrical electrode.
Claims (1)
がり、かつその吹出口を基材方向に向けて配置された複
数のノズルを備え、基材を装着しうるホルダーと前記各
ノズルの間に前記ノズルと同数のメッシュ電極を前記各
ノズルと対向して配置させ、前記各ノズルを接地し、前
記各メッシュ電極を各々独立の高周波電源に接続し、前
記基材に負の電位を印加しうるよう前記ホルダーを直流
電源の負の端子に接続して、前記真空槽の外部又は内部
にヒータを設けたことを特徴とするプラズマCVD装置
。(1) A vacuum chamber is equipped with a plurality of nozzles each connected to an independent raw material gas supply system and arranged with their blow-off ports facing the direction of the substrate, and a holder on which the substrate can be attached and a holder for each of the nozzles. In between, the same number of mesh electrodes as the nozzles are arranged facing each nozzle, each nozzle is grounded, each mesh electrode is connected to an independent high frequency power source, and a negative potential is applied to the base material. A plasma CVD apparatus characterized in that the holder is connected to a negative terminal of a DC power supply to enable the plasma CVD to be carried out, and a heater is provided outside or inside the vacuum chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16507290A JP2881976B2 (en) | 1990-06-22 | 1990-06-22 | Plasma CVD equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16507290A JP2881976B2 (en) | 1990-06-22 | 1990-06-22 | Plasma CVD equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0456773A true JPH0456773A (en) | 1992-02-24 |
| JP2881976B2 JP2881976B2 (en) | 1999-04-12 |
Family
ID=15805340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16507290A Expired - Fee Related JP2881976B2 (en) | 1990-06-22 | 1990-06-22 | Plasma CVD equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2881976B2 (en) |
-
1990
- 1990-06-22 JP JP16507290A patent/JP2881976B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2881976B2 (en) | 1999-04-12 |
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