JPH0457295A - Electrically writable/erasable memory circuit - Google Patents
Electrically writable/erasable memory circuitInfo
- Publication number
- JPH0457295A JPH0457295A JP2162835A JP16283590A JPH0457295A JP H0457295 A JPH0457295 A JP H0457295A JP 2162835 A JP2162835 A JP 2162835A JP 16283590 A JP16283590 A JP 16283590A JP H0457295 A JPH0457295 A JP H0457295A
- Authority
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- Prior art keywords
- data
- electrically programmable
- bytes
- erasable memory
- erasable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Techniques For Improving Reliability Of Storages (AREA)
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はメモリ回路に係わり、例えばディジタル通信や
データ伝送用の通信機での各種バックアップに用いられ
る電気的書込消去可能メモリ回路に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a memory circuit, and relates to an electrically writable and erasable memory circuit used for various types of backup in digital communication and data transmission communication devices, for example.
ユーザがプログラム可能なリードオンリメモリ(以下F
ROMという。)の1つとして電気的書込消去可能メモ
リ (以下EEPROMという。)が多く使用されるに
至っている。このEEPROMは、従来の消去可能FR
OM (EPROM)とは異なって消去に紫外線を必要
とせず簡単に消去可能なので、例えばディジタル通信を
行う通信機等における各種情報のバックアップに用いら
れるなど、今後その使用の増加が予想される。最近では
書き込みや消去に必要な制御回路や高電圧発生回路が素
子に内蔵され、5V単一電源で通常のスタティック・ラ
ンダムアクセスメモリ (SRAM)と同様のタイミン
グでの書き込みや消去が可能となっている。このEEP
ROMでは、素子内部での書き込み動作にはかなりの時
間を要するので、現在ではバイト単位での書き込みや消
去動作に加えて、複数バイト数連続したページ単位での
書き込み・消去ができるようにして高速化が図られてい
る。例えば、ある素子では1周期I Qmsの間にペー
ジ当たり64バイトの連続したデータの書き込み・消去
ができ、従来型に比べて数十倍の高速処理が可能となっ
ている。User-programmable read-only memory (F)
It's called ROM. ), electrically programmable and erasable memories (hereinafter referred to as EEPROMs) have come to be widely used. This EEPROM is a conventional erasable FR
Unlike OM (EPROM), it does not require ultraviolet light to erase and can be easily erased, so its use is expected to increase in the future, such as being used for backing up various information in communication devices that perform digital communication. Recently, control circuits and high voltage generation circuits necessary for writing and erasing are built into the device, making it possible to write and erase with the same timing as regular static random access memory (SRAM) using a single 5V power supply. There is. This EEP
In ROM, it takes a considerable amount of time to write inside the element, so in addition to writing and erasing in bytes, it is now possible to write and erase in consecutive pages of multiple bytes to achieve high speeds. The goal is to For example, a certain device is capable of writing and erasing 64 bytes of continuous data per page during one cycle IQms, making it possible to perform processing at several tens of times higher speed than conventional types.
このように、最近のEEFROMではページ単位の高速
処理が可能になってきてはいるが、素子の特性上、書き
込みの1周期の時間が経過するまでは次のページの書き
込みを行うことができなかった。In this way, recent EEFROMs have become capable of high-speed processing on a page-by-page basis, but due to the characteristics of the element, it is not possible to write the next page until one write cycle has elapsed. Ta.
第3図は、従来のEEFROMへの書込動作を表わした
ものである。例えば、データ書込周期t1が10m5.
バイトごとの書込周期t2が100μs、lページ当た
りのバイト数kが64バイトのEEPROMでメモリ回
路を構成したとすると、1ページのデータ書込に実際に
要する時MT、は次の(1)式のようになる。FIG. 3 shows a conventional writing operation to an EEFROM. For example, the data write period t1 is 10m5.
Assuming that the memory circuit is configured with an EEPROM in which the write cycle t2 for each byte is 100 μs and the number of bytes per page k is 64 bytes, the time MT actually required to write data for one page is as follows (1) It becomes like the expression.
Tr =tz xk
=100 (μSol X64 [バイト〕=6
.4 (msl・・・・・・(1)しかしながら、書き
込みの1周期1 Qmsが経過するまでは次のページの
書き込みをすることができないので、あるページの書き
込みから次のページの書き込みまでには、次の(2)式
のような待ち時間Twが存在することとなる。Tr = tz xk = 100 (μSol X64 [byte] = 6
.. 4 (msl...(1) However, the next page cannot be written until one write cycle 1 Qms has elapsed, so the time between writing one page and writing the next page is , there is a waiting time Tw as shown in equation (2) below.
T、 =tl −T。T, = tl - T.
=3.6 [msl・・・・・・(2)従って、例えば
256バイトのデータを書き込む場合の所要時間は、次
の(3)式に示すようにデータ書込周期t1 に制約さ
れる。=3.6 [msl (2) Therefore, the time required to write 256 bytes of data, for example, is constrained by the data write cycle t1 as shown in the following equation (3).
10 (ms) X (256/64)=40[ms)
・・・・・・(3)
この中には本来無駄な時間である待ち時間Twも含まれ
ることとなる。10 (ms) x (256/64) = 40 [ms]
(3) This includes the waiting time Tw, which is originally a wasted time.
このように、従来のEEFROMを用いたメモリ回路で
は、実際の書込時間の他にかなり長い待ち時間Twがあ
ったため、書き込みの効率が悪いという欠点があった。As described above, the conventional memory circuit using the EEFROM has a drawback that writing efficiency is low because there is a considerably long waiting time Tw in addition to the actual writing time.
そこで、本発明の目的は、待ち時間なく効率的なデータ
の書き込みを行うことのできる電気的書込消去可能メモ
リ回路を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide an electrically writable and erasable memory circuit that can efficiently write data without waiting time.
請求項1記載の発明では、(i)それぞれ所定バイト数
連続してデータの書き込みが可能な複数の電気的書込消
去可能メモリと、(ii )これら複数の電気的書込消
去可能メモリからデータ書き込みの対象となるものを1
つずつ巡回的に選択する電気的書込消去可能メモリ選択
手段と、(■1)この電気的書込消去可能メモリ選択手
段により選択された電気的書込消去可能メモリに対し、
データを所定バイト数ずつ連続的に書き込むデータ書込
手段とを電気的書込消去可能メモリ回路に具備させる。In the invention as claimed in claim 1, (i) a plurality of electrically programmable and erasable memories each capable of successively writing a predetermined number of bytes of data; and (ii) data from these electrically programmable and erasable memories. 1 item to be written
(1) electrically programmable and erasable memory selected by the electrically programmable and erasable memory selector;
The electrically writable and erasable memory circuit is provided with data writing means for continuously writing data by a predetermined number of bytes.
そして、請求項1記載の発明では、ページ書き込みが可
能な電気的書込消去可能メモリを複数用意し、これらの
メモリを1つずつ順次巡回的に選択して、所定バイト数
連続したそれぞれのデータブロックがさらに互いに連続
するように書き込みを行うこととする。In the invention as claimed in claim 1, a plurality of electrically programmable and erasable memories capable of page writing are prepared, and each of these memories is sequentially and cyclically selected one by one to store a predetermined number of consecutive bytes of data. It is assumed that writing is performed so that the blocks are further consecutive to each other.
請求項2記載の発明では、(i)一定のバイト書込周期
で所定バイト数連続的にデータの書き込みと消去が可能
なページ書込モードをそれぞれ有する複数の電気的書込
消去可能メモリチップと、(ii)与えられたアドレス
信号の一部をデコードして、前記複数の電気的書込消去
可能メモリチップを1つずつ順次巡回的に選択するため
のチップセレクト信号を作成し出力するアドレスデコー
ダと、(iii )このアドレスデコーダから出力され
るチップセレクト信号の指定するそれぞれの電気的書込
消去可能メモリチップに対し、所定バイト数のデータを
それぞれ1ブロックとして順次連続的に書き込むデータ
ブロック書込手段とを電気的書込消去可能メモリ回路に
具備させる。The invention according to claim 2 provides: (i) a plurality of electrically writable and erasable memory chips each having a page write mode in which data can be continuously written and erased for a predetermined number of bytes in a constant byte write cycle; , (ii) an address decoder that decodes a portion of a given address signal to create and output a chip select signal for sequentially and cyclically selecting the plurality of electrically programmable and erasable memory chips one by one. and (iii) data block writing in which data of a predetermined number of bytes is sequentially and continuously written as one block to each electrically programmable and erasable memory chip specified by the chip select signal output from this address decoder. an electrically programmable and erasable memory circuit.
そして、請求項2記載の発明では、アドレスデコーダで
アドレス信号の一部をデコードすることによりチップセ
レクト信号を作成して複数の電気的書込消去可能メモリ
チップを巡回的に選択し、その選択されたそれぞれのメ
モリチップに対し、連続した所定バイト数のデータブロ
ック同士がさらに連続するように書き込みを行うことと
する。In the invention as claimed in claim 2, a chip select signal is created by decoding a part of the address signal with an address decoder, and a plurality of electrically programmable and erasable memory chips are cyclically selected. Writing is performed on each memory chip so that consecutive data blocks of a predetermined number of bytes are further consecutive.
以下実施例につき本発明の詳細な説明する。 The present invention will be described in detail with reference to Examples below.
第1図は本発明の一実施例における電気的書込消去可能
メモリ回路を表わしたものである。この回路には64バ
イト単位のページ書込と消去動作が可能な4つのEEP
ROMl 1〜14が備えられ、それぞれのチップセレ
クト端子C8には、アドレスデコーダ15からチップセ
レクト信号16〜19が入力されるようになっている。FIG. 1 depicts an electrically programmable and erasable memory circuit in one embodiment of the present invention. This circuit has four EEPs that can write and erase pages in units of 64 bytes.
ROMs 1 to 14 are provided, and chip select signals 16 to 19 are inputted from the address decoder 15 to each chip select terminal C8.
このアドレスデコーダ15には、メインシステムの図示
しない中央処理装置(CPU)からアドレス線21.2
2を介してアドレス信号As 、At が入力され、こ
れを基にチップセレクト信号16〜19のうちのいずれ
か1つが作成し出力する。ここでは、チップセレクト信
号が“L−レベルになることにより、該当するチップが
アクティブになるものとする。This address decoder 15 is connected to an address line 21.2 from a central processing unit (CPU (not shown) of the main system).
Address signals As and At are inputted via the terminals 2 and 2, and one of the chip select signals 16 to 19 is generated and output based on the address signals As and At. Here, it is assumed that when the chip select signal becomes "L-level", the corresponding chip becomes active.
また、EEPROMl 1〜14には、それぞれ8ビッ
ト分のデータ端子群りと15ビット分のアドレス端子群
Aが備えられている。このうち、各EEPROMのデー
タ端子群りには、図示しないメインシステムからのデー
タバス24が4分岐されたうえでパラレルに接続され、
バックアップデータI Oo −IOlのやりとりが行
われる。一方、各EEPROMのアドレス端子群Aには
、CPUからのアドレスバス25が4分岐されたうえで
パラレルに接続され、アドレス信号A0〜A。Further, each of the EEPROMs 1 to 14 is provided with a data terminal group of 8 bits and an address terminal group A of 15 bits. Among these, the data bus 24 from the main system (not shown) is branched into four and connected in parallel to the data terminal group of each EEPROM.
Backup data IOo-IOl is exchanged. On the other hand, the address bus 25 from the CPU is branched into four branches and connected in parallel to the address terminal group A of each EEPROM, and receives address signals A0 to A.
A6〜AH,が入力されるようになっている。A6 to AH are inputted.
なお、本実施例では説明を簡略化するため、書き込み時
に用いられるいわゆるライトイネーブル(書き込み許可
)信号は省略しであるが、この信号によりデータバス2
4の方向性が切り換えられるようになっているのはもち
ろんである。In this embodiment, in order to simplify the explanation, the so-called write enable signal used during writing is omitted; however, this signal causes the data bus 2 to
Of course, the directionality of the four directions can be switched.
第2図と共に、以上のような構成の電気的書込消去可能
メモリ回路の動作を説明する。ここでは、従来例と同様
、書込周期1(1ms、バイト書込周期100μsのE
EPROMに対し、64バイト単位でのページ書込を行
うものとして説明する。The operation of the electrically programmable and erasable memory circuit configured as above will be explained with reference to FIG. Here, as in the conventional example, write cycle 1 (1 ms, byte write cycle 100 μs, E
The following description assumes that page writing is performed in units of 64 bytes to the EPROM.
CPUからアドレス制御線21.22を介してアドレス
信号A@、Aq が入力されると、アドレスデコーダ1
5はこれをデコードし、EEPROM11〜14のうち
の1つを指定するためのチップセレクト信号を作成する
。例えば、アドレス信号へ6、A1 が共に* L s
レベルのとき、アドレスデコーダ15はチップセレクト
信号16を“L″レベル変化させ、他を“H”レベルに
保持する。When address signals A@, Aq are input from the CPU via the address control lines 21 and 22, the address decoder 1
5 decodes this and creates a chip select signal for designating one of the EEPROMs 11-14. For example, both 6 and A1 to the address signal *L s
When the signal is at the "L" level, the address decoder 15 changes the chip select signal 16 to "L" level and holds the others at "H" level.
これにより第1のEEPROMI 1が選択され、バイ
ト書込周期100μsで64バイトのデータが連続して
書き込まれる(第2図a、期間A)。As a result, the first EEPROMI 1 is selected, and 64 bytes of data are continuously written at a byte write cycle of 100 μs (FIG. 2a, period A).
これに要する時間Trは(1)式に示したように6.4
msである。The time Tr required for this is 6.4 as shown in equation (1).
It is ms.
次に、CPUがアドレス信号As 、A、をそれぞれ“
L′″、#H11レベルにセットすると、アドレスデコ
ーダ15はチップセレクト信号17を“L”レベルに変
化させ、他を“H”レベルに保持する。これにより第2
のEEPROMI 2が選択され、前回同様バイト書込
周期100μSで64バイトのデータが連続して書き込
まれる(第2図b1期間B)。これに要する時間T、
もまた5、4msである。Next, the CPU sends the address signals As and A, respectively.
When set to L''', #H11 level, the address decoder 15 changes the chip select signal 17 to the "L" level and holds the others at the "H" level.
EEPROMI 2 is selected, and 64 bytes of data are continuously written at a byte write cycle of 100 μs as before (period B in FIG. 2). The time required for this, T,
is also 5.4 ms.
さらに、CPUはアドレス信号All5八1 を“H”
、“L”レベル、サラに”H”、“H″レベルと順次変
化させることにより第3、第4のEEPROMl3.1
4を選択し、それぞれに64バイトずつデータの連続書
き込みを行う(第2図c、d)。Furthermore, the CPU sets the address signal All581 to “H”.
, "L" level, "H" level, and "H" level in sequence, the third and fourth EEPROM13.1
4 is selected, and 64 bytes of data are continuously written to each of them (Fig. 2 c, d).
第4のEEFROM14への書き込みが終了すると、C
PUは再びアドレス信号A6、A1 を共に“L”レベ
ルにセットし、以下同様の書き込み動作を繰り返す。When writing to the fourth EEFROM 14 is completed, C
The PU sets both address signals A6 and A1 to the "L" level again, and repeats the same write operation.
このようにして、4つのEEFROMのうちの1つが巡
回的に選択され、選択されたEEFROMに対し、64
バイトのページ書込動作が待ち時間なく行われることと
なる。In this way, one of the four EEFROMs is selected cyclically, and for the selected EEFROM, 64
Byte page write operations are performed without waiting time.
例えば256バイトのデータを書き込む場合、これに要
する時間は次の(4)式に示すように25・6msとな
る。For example, when writing 256 bytes of data, the time required for this is 25.6 ms, as shown in equation (4) below.
6、 4 [:ms] X (256/64)=25.
6 [:=5)−−・(4)
従って、本実施例では(3)式に示した従来の所要時間
に比べて約4割短い時間で書き込みが可能となる。6, 4 [:ms] X (256/64) = 25.
6 [:=5) -- (4) Therefore, in this embodiment, writing is possible in about 40% shorter time than the conventional time required as shown in equation (3).
なお、本実施例ではバイト書込周期を100μsとした
が、この値がさらに小さいメモリチップを使用すれば、
時間短縮の効果が一層顕著となることはもちろんである
。Note that in this embodiment, the byte write cycle was set to 100 μs, but if a memory chip with a smaller value is used,
Of course, the effect of time reduction becomes even more remarkable.
また、本実施例では、4個のEEFROMを用いること
としたが、書込周期1. に比べてバイト書込周期t
2がはるかに短い場合には、より多くのメモリチップを
用いればよい。Further, in this embodiment, four EEFROMs are used, but the write cycle is 1. Byte write period t compared to
If 2 is much shorter, more memory chips can be used.
以上説明したように本発明によれば、ページ書き込みが
可能な電気的書込消去可能メモリを複数用意し、これら
のメモリを順次選択して所定バイト数連続したデータブ
ロックがさらに互いに連続するように書き込むこととし
たので、従来のように書込待ち時間の間待つことな(連
続的にデータを書き込むことができる。従って、効率的
なバックアップが可能となり、それに要する時間を短縮
することができるという効果がある。As explained above, according to the present invention, a plurality of electrically programmable and erasable memories capable of page writing are prepared, and these memories are sequentially selected so that consecutive data blocks of a predetermined number of bytes are further connected to each other. Since it is possible to write data continuously, there is no need to wait for the write waiting time as in the past (data can be written continuously. Therefore, efficient backup is possible and the time required for it can be shortened. effective.
第1図、第2図は本発明の一実施例を説明するためのも
ので、このうち第1図は電気的書込消去可能メモリ回路
を示すブロック図、第2図は第1図の電気的書込消去可
能メモリ回路の動作を説明するためのタイミング図、第
3図は従来の電気的書込消去可能メモリ回路の動作を説
明するためのタイミング図である。1 and 2 are for explaining one embodiment of the present invention, of which FIG. 1 is a block diagram showing an electrically programmable and erasable memory circuit, and FIG. 2 is an electrical FIG. 3 is a timing diagram for explaining the operation of a conventional electrically programmable and erasable memory circuit.
Claims (1)
可能な複数の電気的書込消去可能メモリと、 これら複数の電気的書込消去可能メモリからデータ書き
込みの対象となるものを1つずつ巡回的に選択する電気
的書込消去可能メモリ選択手段と、この電気的書込消去
可能メモリ選択手段により選択された電気的書込消去可
能メモリに対し、データを所定バイト数ずつ連続的に書
き込むデータ書込手段 とを具備することを特徴とする電気的書込消去可能メモ
リ回路。 2)一定のバイト書込周期で所定バイト数連続的にデー
タの書き込みと消去が可能なページ書込モードをそれぞ
れ有する複数の電気的書込消去可能メモリチップと、 与えられたアドレス信号の一部をデコードして、前記複
数の電気的書込消去可能メモリチップを1つずつ順次巡
回的に選択するためのチップセレクト信号を作成し出力
するアドレスデコーダと、このアドレスデコーダから出
力されるチップセレクト信号の指定するそれぞれの電気
的書込消去可能メモリチップに対し、所定バイト数のデ
ータをそれぞれ1ブロックとして順次連続的に書き込む
データブロック書込手段 とを具備することを特徴とする電気的書込消去可能メモ
リ回路。[Scope of Claims] 1) A plurality of electrically programmable and erasable memories each capable of continuously writing data for a predetermined number of bytes, and an object to which data is written from these electrically programmable and erasable memories. electrically programmable and erasable memory selection means that cyclically selects data one by one, and a predetermined number of bytes of data for each electrically programmable and erasable memory selected by the electrically programmable and erasable memory selection means. 1. An electrically programmable and erasable memory circuit, comprising: data writing means for continuously writing data. 2) A plurality of electrically programmable and erasable memory chips, each having a page write mode that allows data to be continuously written and erased for a predetermined number of bytes in a fixed byte write cycle, and a portion of a given address signal. an address decoder that generates and outputs a chip select signal for sequentially and cyclically selecting the plurality of electrically programmable and erasable memory chips one by one; and a chip select signal output from the address decoder. and a data block writing means for sequentially and continuously writing a predetermined number of bytes of data into each electrically programmable and erasable memory chip as one block. Possible memory circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2162835A JPH0457295A (en) | 1990-06-22 | 1990-06-22 | Electrically writable/erasable memory circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2162835A JPH0457295A (en) | 1990-06-22 | 1990-06-22 | Electrically writable/erasable memory circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0457295A true JPH0457295A (en) | 1992-02-25 |
Family
ID=15762152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2162835A Pending JPH0457295A (en) | 1990-06-22 | 1990-06-22 | Electrically writable/erasable memory circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0457295A (en) |
Cited By (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH064399A (en) * | 1992-06-22 | 1994-01-14 | Hitachi Ltd | Semiconductor memory device |
| US5572466A (en) * | 1992-10-06 | 1996-11-05 | Kabushiki Kaisha Toshiba | Flash memory chips |
| JP2000148583A (en) * | 1992-06-22 | 2000-05-30 | Hitachi Ltd | Semiconductor storage device |
| JP2000163314A (en) * | 1992-06-22 | 2000-06-16 | Hitachi Ltd | Semiconductor storage device |
| JP2002236612A (en) * | 2002-01-21 | 2002-08-23 | Hitachi Ltd | Semiconductor storage device |
| US6549974B2 (en) | 1992-06-22 | 2003-04-15 | Hitachi, Ltd. | Semiconductor storage apparatus including a controller for sending first and second write commands to different nonvolatile memories in a parallel or time overlapped manner |
| US6662264B2 (en) | 1993-03-11 | 2003-12-09 | Hitachi, Ltd. | File memory device and information processing apparatus using the same |
| JP2004240993A (en) * | 2004-04-12 | 2004-08-26 | Hitachi Ltd | Semiconductor storage device |
| US6834322B2 (en) * | 1999-12-08 | 2004-12-21 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device having plural memory circuits selectively controlled by a master chip enable terminal or an input command and outputting a pass/fail result |
| JP2005100470A (en) * | 2004-12-28 | 2005-04-14 | Hitachi Ltd | Semiconductor memory device |
| US6925012B2 (en) | 1991-11-26 | 2005-08-02 | Renesas Technology Corp. | Storage device employing a flash memory |
| JP2005339581A (en) * | 2005-08-08 | 2005-12-08 | Hitachi Ltd | Semiconductor memory device |
| US7167944B1 (en) | 2000-07-21 | 2007-01-23 | Lexar Media, Inc. | Block management for mass storage |
| US7185208B2 (en) | 2001-09-28 | 2007-02-27 | Lexar Media, Inc. | Data processing |
| US7215580B2 (en) | 2001-09-28 | 2007-05-08 | Lexar Media, Inc. | Non-volatile memory control |
| EP1134662A4 (en) * | 1999-07-28 | 2007-05-09 | Sony Corp | RECORDING SYSTEM, DATA RECORDING DEVICE, MEMORY DEVICE, AND DATA RECORDING METHOD |
| US7275686B2 (en) | 2003-12-17 | 2007-10-02 | Lexar Media, Inc. | Electronic equipment point-of-sale activation to avoid theft |
| US7370166B1 (en) | 2004-04-30 | 2008-05-06 | Lexar Media, Inc. | Secure portable storage device |
| JP2008108281A (en) * | 2008-01-10 | 2008-05-08 | Renesas Technology Corp | Semiconductor disk device |
| US7424593B2 (en) | 1995-07-31 | 2008-09-09 | Micron Technology, Inc. | Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| US7594063B1 (en) | 2004-08-27 | 2009-09-22 | Lexar Media, Inc. | Storage capacity status |
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1990
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| US7002851B2 (en) | 1991-11-26 | 2006-02-21 | Renesas Technology Corp. | Storage device employing a flash memory |
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| US8001319B2 (en) | 1992-06-22 | 2011-08-16 | Solid State Storage Solutions, Inc. | Semiconductor storage device |
| US6728826B2 (en) | 1992-06-22 | 2004-04-27 | Renesas Technology Corp. | Semiconductor storage device in which commands are sequentially fed to a plurality of flash memories to continuously write data |
| JPH064399A (en) * | 1992-06-22 | 1994-01-14 | Hitachi Ltd | Semiconductor memory device |
| US6598115B2 (en) | 1992-06-22 | 2003-07-22 | Hitachi, Ltd. | Semiconductor storage apparatus including a plurality of nonvolatile flash memories and utilizing logical to physical sector conversion |
| US6549974B2 (en) | 1992-06-22 | 2003-04-15 | Hitachi, Ltd. | Semiconductor storage apparatus including a controller for sending first and second write commands to different nonvolatile memories in a parallel or time overlapped manner |
| US6457092B1 (en) | 1992-06-22 | 2002-09-24 | Hitachi, Ltd. | Semiconductor disk storage apparatus including a plurality of flash memories and a buffer memory to continuously write data responsive to first and second write commands |
| JP2000163314A (en) * | 1992-06-22 | 2000-06-16 | Hitachi Ltd | Semiconductor storage device |
| JP2000148583A (en) * | 1992-06-22 | 2000-05-30 | Hitachi Ltd | Semiconductor storage device |
| US5572466A (en) * | 1992-10-06 | 1996-11-05 | Kabushiki Kaisha Toshiba | Flash memory chips |
| US6662264B2 (en) | 1993-03-11 | 2003-12-09 | Hitachi, Ltd. | File memory device and information processing apparatus using the same |
| US6952752B2 (en) | 1993-03-11 | 2005-10-04 | Hitachi, Ltd. | File memory device and information processing apparatus using the same |
| US7424593B2 (en) | 1995-07-31 | 2008-09-09 | Micron Technology, Inc. | Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| US7549013B2 (en) | 1995-07-31 | 2009-06-16 | Lexar Media, Inc. | Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| EP1134662A4 (en) * | 1999-07-28 | 2007-05-09 | Sony Corp | RECORDING SYSTEM, DATA RECORDING DEVICE, MEMORY DEVICE, AND DATA RECORDING METHOD |
| US6834322B2 (en) * | 1999-12-08 | 2004-12-21 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device having plural memory circuits selectively controlled by a master chip enable terminal or an input command and outputting a pass/fail result |
| US7167944B1 (en) | 2000-07-21 | 2007-01-23 | Lexar Media, Inc. | Block management for mass storage |
| US7185208B2 (en) | 2001-09-28 | 2007-02-27 | Lexar Media, Inc. | Data processing |
| US7215580B2 (en) | 2001-09-28 | 2007-05-08 | Lexar Media, Inc. | Non-volatile memory control |
| JP2002236612A (en) * | 2002-01-21 | 2002-08-23 | Hitachi Ltd | Semiconductor storage device |
| US7275686B2 (en) | 2003-12-17 | 2007-10-02 | Lexar Media, Inc. | Electronic equipment point-of-sale activation to avoid theft |
| JP2004240993A (en) * | 2004-04-12 | 2004-08-26 | Hitachi Ltd | Semiconductor storage device |
| US7370166B1 (en) | 2004-04-30 | 2008-05-06 | Lexar Media, Inc. | Secure portable storage device |
| US10049207B2 (en) | 2004-04-30 | 2018-08-14 | Micron Technology, Inc. | Methods of operating storage systems including encrypting a key salt |
| US7594063B1 (en) | 2004-08-27 | 2009-09-22 | Lexar Media, Inc. | Storage capacity status |
| JP2005100470A (en) * | 2004-12-28 | 2005-04-14 | Hitachi Ltd | Semiconductor memory device |
| JP2005339581A (en) * | 2005-08-08 | 2005-12-08 | Hitachi Ltd | Semiconductor memory device |
| JP2008108281A (en) * | 2008-01-10 | 2008-05-08 | Renesas Technology Corp | Semiconductor disk device |
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