JPH0459457U - - Google Patents

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Publication number
JPH0459457U
JPH0459457U JP10240090U JP10240090U JPH0459457U JP H0459457 U JPH0459457 U JP H0459457U JP 10240090 U JP10240090 U JP 10240090U JP 10240090 U JP10240090 U JP 10240090U JP H0459457 U JPH0459457 U JP H0459457U
Authority
JP
Japan
Prior art keywords
light
wavelength
curse
analyzer
spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10240090U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10240090U priority Critical patent/JPH0459457U/ja
Publication of JPH0459457U publication Critical patent/JPH0459457U/ja
Pending legal-status Critical Current

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第7図は本考案の実施例に係り、第
1図は紫外カース測定装置の構成図、第2A図及
び第2B図は第1図に示す検光子71,78の透
過軸の配置と出力信号との関係を示すベクトル図
、第3図は、非線形光学素子50について、入射
波長に対し第2高調波出射光が最大となる回転角
の測定結果を示す図、第4A図は、第3図の測定
値を直線で回帰近似し色素レーザの波長走査に同
期してこの直線に基づき非線形光学素子50を回
転させた場合の、非線形光学素子50から出射さ
れる第2高調波の光強度の測定結果を示す図、第
4B図は、第3図の測定値を波長に関する3次曲
線で回帰近似し色素レーザの波長走査に同期して
この曲線に基づき非線形光学素子50を回転させ
た場合の、非線形光学素子50から出射される第
2高調波の光強度測定結果を示す図、第5図は、
ポンプ光波長を266nmとし可動全反射プリズ
ム62を固定しカース光強度を最大にした場合の
、プローブ光波長に対するカース光相対強度の測
定結果を示す図、第6図は、検光子71を第2B
図に示す配置にしポンプ光波長を266nmとし
ミラーを最適位置に移動させカース光強度を最大
にした場合の、プローブ光波長に対する位相整合
角の測定結果を示す図、第7図は、トリプトフア
ン50μmo1水溶液に対して紫外カース光スペ
クトルを測定した結果を示す図である。第8図は
従来の紫外カース測定装置の検光子の透過軸の配
置と出力信号との関係を示すベクトル図である。 図中、12,50は非線形光学素子、14は波
長分離器、20,22,36,37,62は全反
射プリズム、24,26,44,55,56,6
4,73は平面鏡、28,38は1/2波長板、3
0,60は偏光子、32,48,59,74はア
パーチヤ、35は試料セル、39,57,70は
半透鏡、40,46はシリンドリカルレンズ、4
2は色素レーザ、53はバンドパスフイルタ、6
6は遮光板、71,78は検光子、75,80は
光結合レンズ、76は二股光フアイバ、84はポ
リ・モノクロメータ。
1 to 7 relate to an embodiment of the present invention, FIG. 1 is a configuration diagram of an ultraviolet curse measuring device, and FIGS. 2A and 2B are transmission axes of the analyzers 71 and 78 shown in FIG. 1. FIG. 3 is a vector diagram showing the relationship between the arrangement and the output signal. FIG. 3 is a diagram showing the measurement results of the rotation angle at which the second harmonic output light is maximized with respect to the incident wavelength for the nonlinear optical element 50. FIG. 4A is a vector diagram showing the relationship between the arrangement and the output signal. , the second harmonic emitted from the nonlinear optical element 50 when the measured values in FIG. FIG. 4B, a diagram showing the measurement results of the light intensity, is obtained by regressively approximating the measured values in FIG. 3 using a cubic curve related to wavelength, and rotating the nonlinear optical element 50 based on this curve in synchronization with the wavelength scanning of the dye laser. FIG. 5 is a diagram showing the measurement results of the light intensity of the second harmonic emitted from the nonlinear optical element 50 when
FIG. 6 is a diagram showing the measurement results of the relative intensity of the curse light with respect to the probe light wavelength when the pump light wavelength is 266 nm, the movable total reflection prism 62 is fixed, and the curse light intensity is maximized.
Figure 7 shows the measurement results of the phase matching angle with respect to the probe light wavelength when the pump light wavelength is 266 nm and the mirror is moved to the optimum position to maximize the curse light intensity in the arrangement shown in the figure. FIG. 3 is a diagram showing the results of measuring the ultraviolet curse light spectrum for FIG. 8 is a vector diagram showing the relationship between the arrangement of the transmission axis of the analyzer and the output signal of a conventional ultraviolet curse measuring device. In the figure, 12, 50 are nonlinear optical elements, 14 is a wavelength separator, 20, 22, 36, 37, 62 are total reflection prisms, 24, 26, 44, 55, 56, 6
4, 73 are plane mirrors, 28, 38 are 1/2 wavelength plates, 3
0, 60 are polarizers, 32, 48, 59, 74 are apertures, 35 are sample cells, 39, 57, 70 are semi-transparent mirrors, 40, 46 are cylindrical lenses, 4
2 is a dye laser, 53 is a bandpass filter, 6
6 is a light shielding plate, 71 and 78 are analyzers, 75 and 80 are optical coupling lenses, 76 is a bifurcated optical fiber, and 84 is a poly monochromator.

Claims (1)

【実用新案登録請求の範囲】 1 パルスレーザから放出される単一の光パルス
を2分割し、その一方で紫外波長のポンプ光を生
成し、その他方で波長可変の色素レーザを励起し
て単色光を生成しこれを非線形光学素子に通して
紫外波長のプローブ光を生成し、該ポンプ光及び
該プローブ光を試料に対し同一位置に同一時点で
照射してカース光を生成させ、該色素レーザの出
射波長を走査し、該走査に同期して該ポンプ光と
該プローブ光との間の位相整合角を変化させるカ
ース光生成光学系10〜64と、 該カース光が入射され、該カース光を2分割す
るビームスプリツタ70と、 透過軸A1が該試料の3次の非線形電気感受率
x3の非共鳴バツクグラウンド成分ベクトルxN
Rに直角に設定され、分割された該カース光の一
方が入射される第1検光子71と、 透過軸A2が該試料の3次の非線形電気感受率
x3の共鳴成分ベクトルxRに直角に設定され、
分割された該カース光の他方が入射される第2検
光子78と、 分光器84と、 該第1及び第2の検光子から出射される第1及
び第2の光束を該分光器の入射スリツトに導く光
案内手段75,76,80と、 該第1及び第2の光束に対する該分光器からの
信号のピーク値A1及びA2について、A1をA
2で除することにより規格化したスペクトルを得
る信号処理手段86,88と、 を有することを特徴とする紫外カース測定装置。 2 パルスレーザから放出される単一の光パルス
を2分割し、その一方で紫外波長のポンプ光を生
成し、その他方で波長可変の色素レーザを励起し
て単色光を生成しこれを非線形光学素子に通して
紫外波長のプローブ光を生成し、該ポンプ光及び
該プローブ光を試料に対し同一位置に同一時点で
照射してカース光を生成させ、該色素レーザの出
射波長を走査し、該走査に同期して該ポンプ光と
該プローブ光との間の位相整合角を変化させるカ
ース光生成光学系10〜64と、 透過軸A1が該試料の3次の非線形電気感受率
x3の該共鳴成分ベルトルXRに平行に設定され
、分割された該カース光の一方が入射される第一
検光子71と、 透過軸A2が該試料の3次の非線形電気感受率
x3の該共鳴成分ベクトルxRに直角に設定され
、分割された該カース光の他方が入射される第2
検光子78と、 分光器84と、 該第1及び第2の検光子から出射される第1及
び第2の光束を該分光器の入射スリツトに導く光
案内手段73,75,76,80と、 該第1及び第2の光束に対する該分光器からの
信号のピーク値A1及びA2について、ラマン振
動モードから離れた波数域でαA1−βA2=0
となるように定数α及びβを選定したときに、(
αA1−βA2)/(βA2)1/2に比例した
値のスペクトルを得る信号処理手段86,88と
、 を有することを特徴とする紫外カース測定装置。 3 前記光案内手段は、 アパーチヤ74と、 前記第2検光子を透過した第2の光束を折曲げ
るミラー73と、 前記試料から射出されるカース光の進行方向に
応じて、曲げられた該第2の光束の中心線が該ア
パーチヤの孔の中心近傍を通るように該ミラーを
移動させる手段と、 該アパーチヤの孔を通過したカース光を前記分
光器に導く光学手段75,76と、 前記第1の検光子を透過した第1の光束を該分
光器の入射スリツトに導く光学手段76,78と
、 を有することを特徴とする請求項1又は2に記載
の装置。 4 前記非線形光学素子は、これに入射される前
記色素レーザからの単色光の波長の3次関数で表
わされた回転角に基づき、該波長に応答して回転
されることにより、紫外第2高調波を出射するこ
とを特徴とする請求項1乃至3のいずれかに記載
の装置。
[Claims for Utility Model Registration] 1. A single light pulse emitted from a pulsed laser is divided into two parts, one of which generates ultraviolet wavelength pump light, and the other part of which excites a wavelength-tunable dye laser to produce monochromatic light. Generate light, pass it through a nonlinear optical element to generate a probe light of ultraviolet wavelength, irradiate the sample with the pump light and the probe light at the same position at the same time to generate a curse light, and generate the dye laser. Cursed light generation optical systems 10 to 64 scan the emission wavelength of the laser beam and change the phase matching angle between the pump light and the probe light in synchronization with the scanning; a beam splitter 70 that divides the beam into two, and a transmission axis A1 of which is the third-order nonlinear electric susceptibility x of the sample, and a non-resonant background component vector xN of 3 .
a first analyzer 71 that is set perpendicular to R and into which one of the divided cursed lights is incident; and a transmission axis A2 that is set perpendicular to the resonance component vector set,
a second analyzer 78 into which the other of the divided curse lights is incident; a spectrometer 84; and a first and second light beams emitted from the first and second analyzers are incident on the spectrometer. light guiding means 75, 76, 80 for guiding the light to the slit; and peak values A1 and A2 of the signals from the spectrometer for the first and second beams ;
An ultraviolet curse measuring device comprising: signal processing means 86 and 88 for obtaining a normalized spectrum by dividing by 2 . 2 A single light pulse emitted from a pulsed laser is split into two, one of which generates ultraviolet wavelength pump light, and the other of which excites a wavelength-tunable dye laser to generate monochromatic light, which is then processed using nonlinear optics. Probe light with an ultraviolet wavelength is generated through the element, the pump light and the probe light are irradiated onto the sample at the same position at the same time to generate a curse light, the emission wavelength of the dye laser is scanned, and the wavelength of the dye laser is scanned. Cursed light generating optical systems 10 to 64 that change the phase matching angle between the pump light and the probe light in synchronization with scanning ; a first analyzer 71 that is set parallel to the resonance component belt XR and into which one of the divided curse lights is incident; A second beam is set perpendicular to xR, and the other of the divided curse lights is incident.
an analyzer 78; a spectrometer 84; and light guide means 73, 75, 76, 80 for guiding first and second light beams emitted from the first and second analyzers to an entrance slit of the spectrometer. , for the peak values A 1 and A 2 of the signals from the spectrometer for the first and second beams, αA 1 −βA 2 = 0 in a wavenumber range away from the Raman vibration mode.
When constants α and β are selected so that (
An ultraviolet curse measuring device comprising: signal processing means 86 and 88 for obtaining a spectrum with a value proportional to αA 1 −βA 2 )/(βA 2 ) 1/2 . 3. The light guide means includes an aperture 74, a mirror 73 that bends the second light beam that has passed through the second analyzer, and a mirror 73 that bends the second light beam that has passed through the second analyzer. means for moving the mirror so that the center line of the light beam of No. 2 passes near the center of the hole of the aperture; optical means 75 and 76 for guiding the cursed light that has passed through the hole of the aperture to the spectroscope; 3. The device according to claim 1, further comprising optical means (76, 78) for guiding the first beam of light transmitted through one analyzer to the entrance slit of the spectrometer. 4. The nonlinear optical element is rotated in response to the wavelength of the monochromatic light from the dye laser incident thereon based on a rotation angle expressed as a cubic function of the wavelength of the monochromatic light, thereby producing ultraviolet second wavelength light. 4. The device according to claim 1, wherein the device emits harmonics.
JP10240090U 1990-09-29 1990-09-29 Pending JPH0459457U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10240090U JPH0459457U (en) 1990-09-29 1990-09-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10240090U JPH0459457U (en) 1990-09-29 1990-09-29

Publications (1)

Publication Number Publication Date
JPH0459457U true JPH0459457U (en) 1992-05-21

Family

ID=31846626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10240090U Pending JPH0459457U (en) 1990-09-29 1990-09-29

Country Status (1)

Country Link
JP (1) JPH0459457U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004534232A (en) * 2001-07-03 2004-11-11 プレジデント アンド フェローズ オブ ハーバード カレッジ System and method using polarization coherent anti-Stokes Raman scattering microscope
JP2005338268A (en) * 2004-05-25 2005-12-08 Olympus Corp Scanning type laser microscope
JP2018084467A (en) * 2016-11-22 2018-05-31 キヤノン株式会社 Sample observation device
JP2021181909A (en) * 2020-05-18 2021-11-25 株式会社エーティーエー Difference detection conjugate compensation cars measurement apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004534232A (en) * 2001-07-03 2004-11-11 プレジデント アンド フェローズ オブ ハーバード カレッジ System and method using polarization coherent anti-Stokes Raman scattering microscope
JP2005338268A (en) * 2004-05-25 2005-12-08 Olympus Corp Scanning type laser microscope
JP2018084467A (en) * 2016-11-22 2018-05-31 キヤノン株式会社 Sample observation device
JP2021181909A (en) * 2020-05-18 2021-11-25 株式会社エーティーエー Difference detection conjugate compensation cars measurement apparatus

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