JPH0463305A - Polarizing beam splitter and laser interferometer - Google Patents

Polarizing beam splitter and laser interferometer

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Publication number
JPH0463305A
JPH0463305A JP2174432A JP17443290A JPH0463305A JP H0463305 A JPH0463305 A JP H0463305A JP 2174432 A JP2174432 A JP 2174432A JP 17443290 A JP17443290 A JP 17443290A JP H0463305 A JPH0463305 A JP H0463305A
Authority
JP
Japan
Prior art keywords
light
polarizing beam
beam splitter
prism
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2174432A
Other languages
Japanese (ja)
Inventor
Hide Hosoe
秀 細江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP2174432A priority Critical patent/JPH0463305A/en
Priority to US07/722,109 priority patent/US5172186A/en
Priority to EP91305917A priority patent/EP0469718B1/en
Priority to DE69116464T priority patent/DE69116464T2/en
Publication of JPH0463305A publication Critical patent/JPH0463305A/en
Pending legal-status Critical Current

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  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Polarising Elements (AREA)

Abstract

PURPOSE:To offer a highly accurate parallel beam splitter and a laser interference measuring meter having high characteristics by projecting reflecting light and passing light on/through a polarizing beam split coat from the same end face of a triangular prism. CONSTITUTION:A polarizing beam splitter 1 is constituted of a parallel plate-like prism 2 and the triangular prism 3. The cross section of the prism 2 is trapezoidally formed and an approximately half face of an end face 2c is coated with the polarizing beam split coat 4. Since both the parallel end faces of the prism 2 can be comparatively easily and accurately worked and parallelism between a reflection face 3 and the coat 4 respectively formed on the parallel end faces of the prism 2 can be highly accurately formed, parallelism between incident light upon the coat 4 and reflected light from a reflection face 3 can be secured. When the polarizing beam splitter is used as the laser interference measuring meter to execute separation between reference light and measuring light and the synthesis of return light, parallelism between the reference light and the measuring light can be highly accurately obtained, so that the return light can be effectively synthesized and measurement based upon the parallel projection beams of incident beams from a light source can be executed.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は偏光ビームスプリッタ及びレーザ干渉測長計に
関し、詳しくは、偏光ビームスプリッタによって分離さ
れる2つの光を平行光として得るのに適した偏光ビーム
スプリッタ、及び、該偏光ビームスプリッタを用いたレ
ーザ干渉測長針に関する。
Detailed Description of the Invention <Industrial Application Field> The present invention relates to a polarizing beam splitter and a laser interferometer, and more specifically, to a polarizing beam splitter that is suitable for obtaining two lights separated by a polarizing beam splitter as parallel lights. The present invention relates to a beam splitter and a laser interferometric measuring needle using the polarizing beam splitter.

〈従来の技術〉 レーザ干渉測長計では、光源にガスレーザや半導体レー
ザ等を用い、そのビーム光を参照光と測長光とに分けた
後、測長物からの戻り光を再度参照光と合成させ、干渉
縞やビートを観測することによって測長(変位)情報を
得ている。
<Prior art> Laser interferometers use a gas laser, semiconductor laser, etc. as a light source, and after dividing the beam into reference light and measurement light, the light returned from the object to be measured is combined with the reference light again. , length measurement (displacement) information is obtained by observing interference fringes and beats.

かかるレーザ干渉測長計の構成は、第5図に示すような
マイケルソン型干渉計を基本としている。
The configuration of such a laser interferometric length measurement meter is based on a Michelson type interferometer as shown in FIG.

即ち、光源20からの光束は、偏光ビームスブリッ夕2
1で参照光と測長光とに分けられ、測長光は測長物に取
付けられた可動鏡22て反射し、偏光ビームスプリッタ
21で固定鏡23からの反射される参照光と合成され干
渉縞を生じる。ここで、測長情報の検出方法によって、
戻り光により発生した干渉縞の動きをカウントする干渉
縞計数方式と、コヒーレントな複数の波長を用いてビー
トを打たせ、測長物の速度によって測長光の周波数がド
ツプラーシフトすることを利用し、ビートの周波数変化
を検出するヘテロダイン方式とがある(PRECIs 
l0NENG4NEERING Vol、 1.Nol
 (1979) 85 、PRECISIONENGI
NEERING Vol、5.No3 (1983) 
111  等参照)。
That is, the luminous flux from the light source 20 is polarized beam splitter 2
1, it is divided into a reference light and a length measurement light, and the length measurement light is reflected by a movable mirror 22 attached to the object to be measured, and is combined with the reference light reflected from a fixed mirror 23 by a polarizing beam splitter 21 to form an interference pattern. occurs. Here, depending on the length measurement information detection method,
This method uses an interference fringe counting method that counts the movement of interference fringes generated by returned light, beats using multiple coherent wavelengths, and takes advantage of the Doppler shift in the frequency of the measuring light depending on the speed of the measuring object. There is a heterodyne method that detects beat frequency changes (PRECIs).
l0NENG4NEERING Vol, 1. Nol
(1979) 85, PRECISION ENGI
NEERING Vol.5. No.3 (1983)
111 etc.).

ところで、前述のようにビームスプリッタで参照光と測
長光とに分けるときに、最も簡便には第5図に示したよ
うに参照光と測長光とをビームスプリッタで相互に直交
する方向にそれぞれ分離させてそのまま固定鏡及び可動
鏡に照射させるようにしていたが、光路を略直線的に設
けたい場合には参照光と測長光とを相互に平行して出射
させるl要か生じ、この場合、例えば第6図に示すよう
にビームスプリッタと反射板とを組み合わせて、相互に
平行な参照光と測長光とを得るように構成していた。
By the way, when separating the reference light and length measurement light using a beam splitter as described above, the simplest method is to separate the reference light and length measurement light into mutually orthogonal directions using the beam splitter, as shown in Figure 5. Previously, they were separated and irradiated directly onto a fixed mirror and a movable mirror, but if it was desired to provide a substantially linear optical path, it would be necessary to emit the reference light and measurement light parallel to each other. In this case, for example, as shown in FIG. 6, a beam splitter and a reflector are combined to obtain mutually parallel reference light and length measurement light.

第6図において、偏光ビームスブリット面31は、三角
プリズム32.33の接合面に設けられており、反射面
(又は全反射面)34か設けられた三角プリズム35を
、前記反射面34と偏光ビームスブリット面31とが平
行になるように配置し、各プリズム32゜33、35の
透過面に対して光を直角に入出射させるようにしてあり
、前記偏光ビームスブリット面31に対して45°で入
射させた光源の光を、例えば通過光としての参照光と、
反射光として測長光とに分け、前記参照光と直交する方
向に進む前記測長光を、反射面34で前記参照光に対し
て同じ向きの平行方向に反射屈曲させるものである。
In FIG. 6, the polarized beam split surface 31 is provided at the joint surface of the triangular prisms 32 and 33, and the triangular prism 35 provided with the reflective surface (or total reflection surface) 34 is connected to the reflective surface 34 and the polarized light beam. The beam split surface 31 is arranged so as to be parallel to the beam split surface 31, and the light enters and exits the transmission surface of each prism 32, 33, and 35 at a right angle. For example, the light from the light source incident on the reference light as passing light,
The reflected light is divided into a length measuring light, and the length measuring light traveling in a direction perpendicular to the reference light is reflectively bent by the reflective surface 34 in a parallel direction in the same direction as the reference light.

尚、第6図中におけるφ印と◎印とは、互いに直交する
偏光方向を示している。
Note that the φ mark and the ◎ mark in FIG. 6 indicate polarization directions perpendicular to each other.

〈発明が解決しようとする課題〉 しかしながら、上記のようにして参照光と測長光とを平
行光線にする場合には、たとえ偏光ビームスブリット面
31と反射面34との平行度か精度良く得られても、各
三角プリズムの頂角精度が悪く三角プリズム32におけ
る出射面と三角プリズム35における出射面との平行が
高精度に得られないと、参照光と測長光とが精度良く平
行にならず、精度良く戻り光を合成することができなく
なってしまう。
<Problems to be Solved by the Invention> However, when the reference light and the length measurement light are made into parallel light beams as described above, even if the parallelism between the polarized beam splitting surface 31 and the reflecting surface 34 is not accurately obtained, However, if the apex angle accuracy of each triangular prism is poor and parallelism between the exit surface of the triangular prism 32 and the exit surface of the triangular prism 35 cannot be achieved with high precision, the reference light and the length measurement light will not be accurately parallel. Therefore, it becomes impossible to combine the returned light with high accuracy.

また、上記の構成では、三角プリズムの頂角精度が良く
ても、三角プリズム32.33からなる光学素子と三角
プリズム35からなる光学素子とをそれぞれを精度良く
位置決めする必要があり、かかる位置決めにバラツキが
あると、偏光ビームスブリット面31と反射面34との
平行が精度良く得られず、分離後の出射光の平行度を低
下させることになってしまう。
Furthermore, in the above configuration, even if the apex angle accuracy of the triangular prisms is good, it is necessary to position each of the optical elements consisting of the triangular prisms 32 and 33 and the optical element consisting of the triangular prisms 35 with high precision, and such positioning requires If there is any variation, the parallelism between the polarized beam splitting surface 31 and the reflecting surface 34 cannot be obtained with high precision, resulting in a decrease in the parallelism of the emitted light after separation.

この点、第7図に示すように、横断面が平行四辺形であ
るプリズム36と、三角プリズム37とを組み合わせて
用いれば、プリズム36の製作段階で端面の平行度が得
られていれば偏光ビームスプリッタ31と反射面34と
の平行度は安定するか、やはり偏光ビームスブリット面
における反射光(測長光)と通過光(参照光)とが異な
るプリズムの端面から出射されるから、両端面の平行度
が問題となり、接合面の平行度バラツキや三角プリズム
の頂角精度バラツキによって、相互に平行な分離光を安
定して得ることが困難であった。
In this regard, as shown in FIG. 7, if a prism 36 whose cross section is a parallelogram and a triangular prism 37 are used in combination, if the parallelism of the end faces is obtained at the manufacturing stage of the prism 36, polarized light will be generated. Is the parallelism between the beam splitter 31 and the reflecting surface 34 stable? Since the reflected light (measuring light) and the passing light (reference light) on the polarized beam splitting surface are emitted from different end faces of the prism, both end faces The parallelism of the prisms became a problem, and it was difficult to stably obtain separated beams that were parallel to each other due to variations in the parallelism of the joint surfaces and variations in the apex angle accuracy of the triangular prism.

本発明は上記問題点に鑑みなされたものであり、三角プ
リズムの頂角精度に比較して平行精度か比較的容易に得
られる平行板状のプリズムを用いることにより、偏光ビ
ームスプリッタで分けられた2つの光を、三角プリズム
の頂角精度や接合精度が高次元で要求されることなく、
精度の良い平行光とすることができる偏光ビームスプリ
ッタを提供すると共に、該偏光ビームスプリッタの特性
を生かしたレーザ干渉測長計を提供することを目的とす
る。
The present invention was made in view of the above-mentioned problems, and uses a parallel plate-like prism, which can achieve parallelism accuracy relatively easily compared to the apex angle accuracy of a triangular prism. Two lights can be transmitted without requiring high apex angle accuracy or joining accuracy of the triangular prism.
It is an object of the present invention to provide a polarizing beam splitter that can produce highly accurate parallel beams, and to provide a laser interferometric length measuring meter that takes advantage of the characteristics of the polarizing beam splitter.

〈課題を解決するための手段〉 そのため本発明にかかる偏光ビームスプリッタでは、平
行板状のプリズムの平行に対峙する両端面の一方面に反
射面を形成し、かつ、他方面の−部分に偏光ビームスプ
リットコートを施し、該偏光ビームスプリットコートが
施された端面に対して三角プリズムを接合してなり、前
記偏光ビームスプリッタにおける反射光が前記反射面で
反射して前記他方面の偏光ビームスプリットコートか施
されない透過部分を通過して前記三角プリズムに入射す
るよう構成すると共に、前記偏光ビームスプリットコー
トにおける反射光と通過光とが前記三角プリズムの同一
端面から出射するよう構成した。
<Means for Solving the Problems> Therefore, in the polarizing beam splitter according to the present invention, a reflective surface is formed on one side of both end faces facing each other in parallel of a parallel plate-like prism, and a polarizing surface is formed on the - portion of the other surface. A beam split coat is applied, and a triangular prism is bonded to the end face on which the polarizing beam split coat is applied, and the reflected light from the polarizing beam splitter is reflected by the reflective surface to form a polarizing beam split coat on the other side. The polarizing beam split coat is configured such that the light passes through an uncoated transparent portion and enters the triangular prism, and the reflected light and the transmitted light from the polarizing beam split coat are configured to exit from the same end face of the triangular prism.

また、本発明にかかるレーザ干渉測長計ては、前記偏光
ビームスプリッタを用い光源の光束を互いに平行な参照
光と測長光とに分けると共に、固定鏡で反射した参照光
と測長物に取付けられた可動鏡で反射した測長光とを前
記偏光ビームスプリッタに戻して合成し、前記光源の光
束と平行な出射光を得るよう構成した。
Further, the laser interferometric length measuring meter according to the present invention uses the polarizing beam splitter to separate the light beam from the light source into a mutually parallel reference beam and a length measuring beam, and also separates the reference beam reflected by a fixed mirror and the length measuring beam attached to the measuring object. The length measuring light reflected by the movable mirror is returned to the polarizing beam splitter and combined to obtain an emitted light parallel to the light beam of the light source.

〈作用〉 かかる構成の偏光ビームスプリッタによると、平行板状
のプリズムの平行に対峙する両端面の平行度は、比較的
容易に精度良く得られるから、両端面それぞれに設けら
れる偏光ビームスプリットコートと反射面との平行か得
られる。従って、偏光ビームスプリットコートにおける
通過光と反射光とが精度の良い平行状態で三角プリズム
に入射することになり、然も、三角プリズムを出射する
ときに同じ端面から出射するから、三角プリズムの頂角
精度が反射光と通過光との平行度に関与せず、精度の良
い平行状態を保ったまま偏光ビームスプリッタから出射
されることになる。
<Function> According to the polarizing beam splitter having such a configuration, since the parallelism of both end faces of the parallel plate-shaped prism facing each other can be achieved relatively easily and with high precision, the polarizing beam splitting coat provided on each of the both end faces Parallelism with the reflecting surface can be obtained. Therefore, the light passing through the polarizing beam split coat and the reflected light enter the triangular prism in a parallel state with high accuracy, and since they exit from the same end face when exiting the triangular prism, the apex of the triangular prism The angular accuracy does not affect the parallelism between the reflected light and the passing light, and the light is emitted from the polarizing beam splitter while maintaining a highly accurate parallel state.

このような偏光ビームスプリッタをレーザ干渉測長計に
用い、参照光と測長光との分離、及び、戻り光の合成を
行わせるようにすれば、参照光と測長光との平行度が精
度良く得られることがら、戻り光の合成が良好に行われ
て、光源の光束に対して平行な出射光に基づいて測長か
行える。
If such a polarizing beam splitter is used in a laser interferometric length measurement meter to separate the reference light and measurement light and combine the returned light, the parallelism of the reference light and measurement light can be adjusted with accuracy. Since the returned light is well-obtained, the returned light is well combined, and the length can be measured based on the emitted light that is parallel to the light beam from the light source.

〈実施例〉 以下に本発明の詳細な説明する。<Example> The present invention will be explained in detail below.

本発明にかかる偏光ビームスプリッタの一実施例を示す
第1図において、偏光ビームスプリッタ■は、平行板状
プリズム2と三角プリズム3とがら構成されている。
In FIG. 1 showing an embodiment of the polarizing beam splitter according to the present invention, the polarizing beam splitter (2) is composed of a parallel plate prism 2 and a triangular prism 3.

前記平行板状プリズム2は、横断面か台形に形成されて
おり、平行に対峙する両端面2a、2bの一方の端面2
aに対して挟角θかそれぞれ45゜になるように両側面
2c、2dが形成されている。
The parallel plate-like prism 2 has a trapezoidal cross section, and has one end surface 2 of both end surfaces 2a and 2b that face each other in parallel.
Both side surfaces 2c and 2d are formed so as to form an included angle θ of 45° with respect to a.

前記端面2bには、略全面に反射面(全反射面)3を形
成してあり、また、前記端面2aの端面2C側の略半面
に偏光ビームスプリットコート4を施しである。
A reflective surface (total reflection surface) 3 is formed on substantially the entire surface of the end surface 2b, and a polarizing beam split coat 4 is applied to approximately half of the end surface 2a on the end surface 2C side.

このように、反射面3及び偏光ビームスプリットコート
4が設けられた平行板状プリズム2に対して三角プリズ
ム5が接合されるが、該三角プリズム5は頂角を直角と
する二等辺直角三角形の横断面に形成されており、前記
直角の頂角に対峙する底面5aと、前記平行板状プリズ
ム2の端面2aとが接着剤によって接合されている。
In this way, the triangular prism 5 is joined to the parallel plate prism 2 provided with the reflective surface 3 and the polarizing beam split coat 4. The bottom surface 5a, which is formed in a cross section and faces the vertical apex angle, and the end surface 2a of the parallel plate-like prism 2 are joined with an adhesive.

かかる構成の偏光ビームスプリッタ1において、図示し
ない光源からの光束(例えばレーザ光)か、平行板状プ
リズム2の端面2cに対して略直角に入射するように配
置してあり、偏光ビームスプリットコート4に対して光
か45°の入射角で入射する。
In the polarizing beam splitter 1 having such a configuration, the polarizing beam splitter coat 4 is arranged so that a light beam (for example, a laser beam) from a light source (not shown) enters the end surface 2c of the parallel plate prism 2 at a substantially right angle. Light is incident at an angle of incidence of 45°.

偏光ビームスプリットコート4て反射される光(以下、
単に反射光という。)は、偏光ビームスプリットコート
4に対して平行な反射面3に対してやはり45°の入射
角で入射し反射するから、反射面3の反射光と光源から
の光束とは平行な光線となり、反射面3で反射した光は
、端面2aの偏光ビームスプリットコート4か施されて
いない透過部分を通過して三角プリズム5に入射される
The light reflected by the polarized beam split coat 4 (hereinafter referred to as
It is simply called reflected light. ) is incident on the reflective surface 3 parallel to the polarized beam split coat 4 at an incident angle of 45° and is reflected, so the reflected light from the reflective surface 3 and the luminous flux from the light source become parallel rays, The light reflected by the reflective surface 3 passes through a transparent portion of the end surface 2a that is not coated with the polarizing beam split coating 4, and enters the triangular prism 5.

ここで、前記平行板状プリズム2と三角プリズム5とは
屈折率の同じ材料で形成しであるので、偏光ビームスプ
リットコート4を通過した光(以下、単に通過光という
。)及び反射面3て反射した光は、三角プリズム5に対
する入射時に屈折することなく相互に平行な状態でその
まま直進し、三角プリズム5の頂角を挟む一方の端面5
bから出射されるようになっている。
Here, since the parallel plate prism 2 and the triangular prism 5 are made of materials with the same refractive index, the light passing through the polarizing beam split coat 4 (hereinafter simply referred to as passing light) and the reflecting surface 3 When the reflected light enters the triangular prism 5, it is not refracted and travels straight in a parallel state to one of the end surfaces 5 of the triangular prism 5, which sandwich the apex angle.
The light is emitted from b.

かかる構成において、平行板状プリズム2の平行両端面
は、比較的容易に精度良く加工することができ、かかる
平行板状プリズム2の平行端面にそれぞれ設けられる反
射面3と偏光ビームスプリットコート4との平行度が精
度良く得られるので、偏光ビームスプリットコート4の
入射光と、反射面3の反射光との平行か確保される。
In this configuration, both parallel end surfaces of the parallel plate prism 2 can be processed relatively easily and with high precision, and the reflecting surface 3 and the polarizing beam split coat 4 provided on the parallel end surfaces of the parallel plate prism 2, respectively, can be processed with high accuracy. Since the parallelism can be obtained with high precision, it is ensured that the incident light on the polarizing beam split coat 4 and the reflected light on the reflective surface 3 are parallel.

このような偏光ビームスプリットコート4の入射光と、
反射面3の反射光との平行は、光源からの入射光か端面
2cに対して斜めに入射して屈折しても、変わらずに得
られるものであるから、前記挟角θの精度及び光源の位
置精度にバラツキかあっても、平行板状プリズム2の平
行面の精度及び各端面の平面度が得られていれば、偏光
ビームスプリットコート4を通過して進む通過光と、偏
光ビームスプリットコート4及び反射面3で反射する反
射光との平行が維持できる。
The incident light of such a polarized beam split coat 4,
Parallelism with the reflected light of the reflecting surface 3 remains unchanged even if the incident light from the light source is incident obliquely to the end surface 2c and refracted, so the accuracy of the included angle θ and the light source Even if there is variation in the positional accuracy, as long as the accuracy of the parallel surfaces of the parallel plate prism 2 and the flatness of each end surface are obtained, the transmitted light that passes through the polarizing beam split coat 4 and the polarizing beam split Parallelism with the reflected light reflected by the coat 4 and the reflective surface 3 can be maintained.

更に、前記反射光と通過光とが偏光ビームスプリッタl
から出射されるときに、三角ブ、リズム5の同じ端面5
bから出射されるから、三角プリズム5の頂角精度や三
角プリズム5と平行板状プリズム2との接合精度か悪く
ても反射光と通過光との平行状態を崩すことなく出射さ
せることができる。即ち、反射光及び通過光に対して端
面5bか直交せず、端面5bで通過光及び反射光か屈折
しても、同じ端面5bから出射される2つの光は、端面
5bの平面度が得られていれば平行状態を保ったまま屈
折することになるからである。
Furthermore, the reflected light and the transmitted light are connected to a polarizing beam splitter l.
When the light is emitted from the triangular beam, the same end face 5 of the rhythm 5
Since the light is emitted from b, it is possible to emit the light without disturbing the parallel state between the reflected light and the passing light, even if the accuracy of the apex angle of the triangular prism 5 or the joining precision of the triangular prism 5 and the parallel plate prism 2 is poor. . In other words, even if the end surface 5b is not perpendicular to the reflected light and the passing light, and the passing light and the reflected light are refracted at the end surface 5b, the two lights emitted from the same end surface 5b will have the flatness of the end surface 5b. This is because if the beams were held parallel, the beams would be refracted while remaining parallel.

このように本実施例の偏光ビームスプリッタ1によると
、各端面(透過面)の平面度と、平行板状プリズム2に
おける両端面の平行度とが得られていれば、三角プリズ
ム3の頂角精度や光源と偏光ビームスプリッタ1との位
置精度、更に、接合精度などにバラツキがあっても、偏
光ビームスプリットコート4で分けられる通過光と反射
光とを精度の良い平行光として出射させることができる
ものである。
According to the polarizing beam splitter 1 of this embodiment, if the flatness of each end surface (transmission surface) and the parallelism of both end surfaces of the parallel plate prism 2 are obtained, the apex angle of the triangular prism 3 is Even if there are variations in accuracy, positional accuracy between the light source and polarizing beam splitter 1, bonding accuracy, etc., the transmitted light and reflected light separated by the polarizing beam split coat 4 can be emitted as highly accurate parallel light. It is possible.

上記実施例では、前記挟角θを45°としたか、この角
度以外であっても、通過光及び反射光の平行か得られる
ことは明らかであり、また、平行板状プリズム2の端面
2bを全て反射面3としないて、該端面2bの透過面か
ら光源の光を入射させて構成することも可能である。
In the above embodiment, it is clear that parallelism of the passing light and reflected light can be obtained even if the included angle θ is set to 45° or other than this angle. It is also possible to construct a structure in which the light from the light source is inputted from the transmitting surface of the end surface 2b instead of having all the reflecting surfaces 3.

尚、第1図中におけるφ印と◎印とは、互いに直交する
偏光方向を示している。
Note that the marks φ and ◎ in FIG. 1 indicate polarization directions perpendicular to each other.

第2図は、上記第1図示の偏光ビームスプリッタ1をレ
ーザ干渉測長計に用いた例である。
FIG. 2 shows an example in which the polarizing beam splitter 1 shown in FIG. 1 is used in a laser interferometer.

ここで、図示しない光源からのレーザ光か、互いに直角
な偏光面をもつ直線偏光として偏光ビームスプリッタ1
に入射され、該偏光ビームスプリッタ1で偏光ビームス
プリットコート4を通過する測長光P(偏光方向を第2
図中で仲としである)とミ偏光ビームスプリットコート
4及び反射面3て反射し前記測長光Pと平行な光線とし
て得られる参照光S(偏光方向を第2図中て◎としであ
る)とに分離される。
Here, the polarizing beam splitter 1 generates laser light from a light source (not shown) or linearly polarized light with polarization planes perpendicular to each other.
and passes through the polarization beam split coat 4 by the polarization beam splitter 1 (the polarization direction is set to the second polarization direction).
The reference beam S is reflected by the polarized beam split coat 4 and the reflective surface 3 and is obtained as a ray parallel to the length measurement light P (the polarization direction is indicated by ◎ in Figure 2). ) and are separated into

偏光ビームスプリットコート4及び反射面3で反射し、
平板状プリズム2の偏光ビームスプリットコート4が施
されていない透過部分を通過して出射される参照光Sは
、偏光ビームスプリッタlの三角プリズム5に接合され
ているλ/2位相板(900旋光板)IIによって偏光
方向か直交するように(第2図中の合方向に)変換され
た後、コーナキューブプリズム12に入射する。該コー
ナキューブプリズム12の偏光ビームスブリット面12
aは、第2図に曽て示す偏光方向と、これに直交する◎
の偏光方向とのうち、φで示される偏光方向の光のみを
通過させるようにしであるので、前記参照光Sはそのま
ま偏光ビームスブリット面12aを通過し、λ/4位相
板13を通過することで円偏光に変換される。
reflected by the polarized beam split coat 4 and the reflective surface 3,
The reference beam S that passes through the transparent portion of the flat prism 2 that is not coated with the polarization beam split coat 4 and is emitted is a λ/2 phase plate (900 optical rotation After the polarization direction is converted to be orthogonal (into the matching direction in FIG. 2) by the plate II, it enters the corner cube prism 12. Polarized beam splitting surface 12 of the corner cube prism 12
a is orthogonal to the polarization direction shown in Figure 2◎
Since only the light in the polarization direction indicated by φ is allowed to pass through the polarization direction, the reference light S passes through the polarized beam split surface 12a as it is and then passes through the λ/4 phase plate 13. is converted into circularly polarized light.

円偏光に変換された参照光Sは、固定鏡14で直角に反
射し、再びλ/4位相板13を通過することで、今度は
偏光ビームスブリット面12aで反射する偏光方向であ
る第2図に示す◎の偏光方向に変換される。従って、固
定鏡14から戻される参照光Sは、偏光ビームスブリッ
ト面12aで反射し、コーナキューブプリズムI2の反
射面(又は全反射面)によって再び固定鏡14方向に進
む。
The reference light S converted to circularly polarized light is reflected at a right angle by the fixed mirror 14, passes through the λ/4 phase plate 13 again, and is now reflected in the polarization direction by the polarized beam split surface 12a. It is converted to the polarization direction shown in ◎. Therefore, the reference light S returned from the fixed mirror 14 is reflected by the polarized beam splitting surface 12a and travels toward the fixed mirror 14 again by the reflecting surface (or total reflection surface) of the corner cube prism I2.

このとき、再びλ/4位相板13によって円偏光に変換
され、固定鏡14で反射し、円偏光である反射光かλ/
4位相板13を戻り通過するときに偏光ビームスブリッ
ト面12aの通過偏光方向であるQで示される偏光方向
に変換される。このため、固定鏡14で2回反射されて
コーナキューブプリズム12に戻された参照光Sは、偏
光ビームスプリ、ット面12aを偏光ビームスプリッタ
lの出射時と直交する方向にそのまま通過し、三角プリ
ズム15の反射面(又は全反射面)15aで偏光ビーム
スプ’J ツタlの出射時と平行する方向に屈曲反射さ
れて、再び偏光ビームスプリッタlに戻される。
At this time, it is again converted into circularly polarized light by the λ/4 phase plate 13, reflected by the fixed mirror 14, and the reflected light, which is circularly polarized light, is changed to λ/4.
When passing back through the four-phase phase plate 13, the polarization direction is converted to the polarization direction indicated by Q, which is the passing polarization direction of the polarization beam splitting surface 12a. Therefore, the reference light S reflected twice by the fixed mirror 14 and returned to the corner cube prism 12 passes through the polarization beam splitter 12a as it is in a direction perpendicular to the output direction of the polarization beam splitter l. It is bent and reflected by the reflective surface (or total reflection surface) 15a of the triangular prism 15 in a direction parallel to the emission of the polarized beam splitter 1, and is returned to the polarized beam splitter 1 again.

偏光ビームスプリッタlに戻された参照光Sは、偏光ビ
ームスプリットコート4を通過してそのまま直進し、光
源からの光束と平行な形で偏光ビームスプリッタ1から
出射される。
The reference light S returned to the polarizing beam splitter 1 passes through the polarizing beam splitter coat 4, continues straight, and is emitted from the polarizing beam splitter 1 in parallel to the light beam from the light source.

一方、偏光ビームスプリットコート4を通過する偏光方
向が仲で示される測長光Pは、前記三角プリズム15で
直角に方向を転じ、コーナキューブプリズム12の偏光
ビームスブリット面12aを通過し、コーナキューブプ
リズム12の反射面で反射される。
On the other hand, the length measuring light P whose polarization direction is indicated by the middle passing through the polarized beam split coat 4 changes its direction at right angles at the triangular prism 15, passes through the polarized beam split surface 12a of the corner cube prism 12, and passes through the corner cube prism 12. It is reflected by the reflective surface of the prism 12.

かかる測長光Pは、前記λ/4位相板13を通過して円
偏光に変換されて測長物に取付けられた可動鏡16で直
角に反射し、再びλ/4位相板13を通過することによ
って図中に◎て示される偏光方向に変換されるから、偏
光ビームスブリット面12aで反射されるようになり、
再び可動鏡16方向に進む。
The length measurement light P passes through the λ/4 phase plate 13, is converted into circularly polarized light, is reflected at right angles by a movable mirror 16 attached to the object to be measured, and passes through the λ/4 phase plate 13 again. Since it is converted to the polarization direction indicated by ◎ in the figure, it is reflected by the polarized beam split surface 12a,
Proceed again in the direction of the movable mirror 16.

このとき、λ/4位相板13を通過して円偏光に変換さ
れるか、可動鏡16から戻されるときに再びλ/4位相
板13を通過することにより、今度は図中に仲で示され
る偏光方向に変換されるから、コーナキューブプリズム
12の偏光ビームスブリット面12aを通過するように
なって、λ/2位相板(90°旋光板)llに入射され
、ここで図中に◎で示される偏光方向に変換される。
At this time, it passes through the λ/4 phase plate 13 and is converted into circularly polarized light, or when it is returned from the movable mirror 16, it passes through the λ/4 phase plate 13 again, this time as shown by the middle in the figure. The polarized light is converted to the polarization direction, so it passes through the polarized beam splitting surface 12a of the corner cube prism 12, and is incident on the λ/2 phase plate (90° optical rotation plate) ll, where it is marked with ◎ in the figure. converted to the polarization direction shown.

そして、偏光ビームスプリッタlの平行板状プリズム2
の偏光ビームスプリットコート4が施されない透過部分
を通過して反射面3で反射され、かかる反射光が偏光ビ
ームスプリットコート4に入射するか、偏光方向が反射
方向であるために反射され、前記戻り参照光Sと合成さ
れて偏光ビームスプリッタlから出射され図示しない検
出器に入射する。
Then, the parallel plate prism 2 of the polarizing beam splitter l
The reflected light passes through the transmitting part where the polarized beam split coat 4 is not applied and is reflected by the reflective surface 3, and the reflected light enters the polarized beam split coat 4, or it is reflected because the polarization direction is the reflective direction, and the reflected light is reflected by the reflective surface 3. It is combined with the reference light S and output from the polarizing beam splitter I, and enters a detector (not shown).

かかる構成によると、偏光ビームスプリッタlにより分
離される参照光Sと測長光Pとの平行か前述のように精
度良く得られるから、戻り光の平行度も維持でき、戻り
光を正確に合成することができると共に、光源からの光
と測長後の光とが平行であるから、測長針のセツティン
グの自由度か大きく使い易いという利点かある。また、
偏光ビームスプリッタ1.コーナキューブプリズム12
゜固定鏡14.可動鏡16等の構成光学素子を略−列に
配することができるので、図中の上下方向の高さを低く
することができ、以て、各光学素子を小さくすることが
できるので、軽量・小型化が可能になる。更に、上記の
ように小型化できることによって光路も短くなるために
、温度変化などの外乱の影響が小さくなり、測長の安定
度が向上する。
According to this configuration, since the parallelism of the reference light S and the length measurement light P separated by the polarizing beam splitter l can be obtained with high precision as described above, the parallelism of the returned light can also be maintained, and the returned light can be accurately combined. In addition, since the light from the light source and the light after length measurement are parallel, there is a large degree of freedom in setting the length measuring needle, which has the advantage of being easy to use. Also,
Polarizing beam splitter 1. corner cube prism 12
゜Fixed mirror 14. Since the constituent optical elements such as the movable mirror 16 can be arranged approximately in rows, the height in the vertical direction in the figure can be reduced, and each optical element can be made smaller, resulting in lighter weight.・Miniaturization becomes possible. Furthermore, since the optical path is shortened due to the miniaturization as described above, the influence of disturbances such as temperature changes is reduced, and the stability of length measurement is improved.

尚、第2図において、光源からの光を入射させる光路と
、測長後の光を出射させる光路とを入れ換えて構成する
こともてきる。また、上記の構成において、測長情報の
検出は、干渉縞計数方式及びヘテロダイン方式のいずれ
てあっても良い。
In addition, in FIG. 2, the optical path through which the light from the light source enters and the optical path through which the light after length measurement is emitted may be interchanged. Further, in the above configuration, the length measurement information may be detected by either an interference fringe counting method or a heterodyne method.

第3図は、第2図に示したレーザ干渉測長計における構
成光学要素が同じてその配置を変えたものであり、第2
図に示す例では偏光ビームスプリッタlにλ/2位相板
(90°旋光板)llのみを接合させていたが、第3図
に示す例では、更に三角プリズム15を接合させて一体
化しである。かかる構成において、参照光S及び測長光
Pの分離・戻りは前記と同様にして行われるが、偏光ビ
ームスプリッタl、λ/2位相板11.三角プリズム1
5が一体化された素子を、裏返しにして90°だけ向き
を変えると、第4図に示すように配設されて同様な作用
を行わせることができるので、第4図に示すように光路
を直角に構成したい場合と、第3図に示すように光路を
略真っ直ぐに構成したい場合とがあっても、偏光ビーム
スプリッタl、λ/2位相板11.三角プリズム15が
一体化された素子が、第3図に示す位置と第4図に示す
位置とに選択的に配設てきるようにしてあれば、反射板
などを追加することなく簡便に対応することができるも
のである。
Figure 3 shows the laser interferometric length measuring meter shown in Figure 2, which has the same optical elements but with a different arrangement.
In the example shown in the figure, only the λ/2 phase plate (90° optical rotation plate) 11 is joined to the polarizing beam splitter 1, but in the example shown in Figure 3, a triangular prism 15 is also joined and integrated. . In this configuration, the separation and return of the reference light S and the length measurement light P are performed in the same manner as described above, except that the polarization beam splitter l, the λ/2 phase plate 11. triangular prism 1
If the element in which 5 is integrated is turned upside down and its orientation is changed by 90 degrees, it can be arranged as shown in Fig. 4 and perform the same action, so the optical path is changed as shown in Fig. 4. The polarizing beam splitter l, the λ/2 phase plate 11. If the element in which the triangular prism 15 is integrated can be selectively arranged at the position shown in FIG. 3 and the position shown in FIG. 4, it can be easily handled without adding a reflector or the like. It is something that can be done.

尚、上記のように光学系を90’変換可能に偏光ビーム
スプリッタ1.λ/2位相板比三角プリズム15を一体
化する構成において、上記第3図及び第4図に示す接合
関係位置に限るものではなく、種々の組み合わせ位置で
同様に光学系を90’変換させることが可能である。
In addition, as mentioned above, the polarizing beam splitter 1. In the configuration in which the λ/2 phase plate ratio triangular prism 15 is integrated, the optical system is not limited to the joining positions shown in FIGS. 3 and 4, but the optical system can be similarly converted 90' at various combination positions. is possible.

〈発明の効果〉 以上説明したように、本発明にかかる偏光ビームスプリ
ッタによると、偏光ビームスプリットコートで反射され
る光と通過する光とを、三角プリズムの頂角精度や接合
精度に影響されることなく精度良く平行光として出射さ
せることができるので、レーザ干渉測長計に用いた場合
には、戻り光を正確に合成することができるようになる
と共に、光源の光束と測長後の合成された光とが平行光
として得られるので、測長針のセツティングの自由度が
向上し、また、光学素子を略直線的に配設することが可
能となり、小型化か図れる。
<Effects of the Invention> As explained above, according to the polarizing beam splitter according to the present invention, the light reflected by the polarizing beam split coat and the light passing through the polarizing beam splitter can be separated depending on the apex angle accuracy and bonding accuracy of the triangular prism. Since it can be emitted as parallel light with high precision without any interference, when used in a laser interferometric length measurement meter, it becomes possible to accurately combine the returned light, and also to combine the light flux of the light source and the combined light after length measurement. Since the light is obtained as parallel light, the degree of freedom in setting the length measuring needle is improved, and the optical elements can be arranged substantially linearly, allowing for miniaturization.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明にかかる偏光ビームスプリッタの一実施
例を示す平面図、第2図は第1図示の偏光ビームスプリ
ッタを用いた本発明にかかるレーザ干渉測長計の構成及
び偏光特性を示す構成概略図、第3図及び第4図はそれ
ぞれ第2図示のレーザ干渉測長計の光学素子配置を変え
た例を示す図、第5図はレーザ干渉測長計の基本図、第
6図及び第7図はそれぞれ従来の偏光ビームスプリッタ
の例を示す平面図である。 ■・・・偏光ビームスプリッタ  2・・・平行板状プ
リズム  3・・・反射面  4・・・偏光ビームスプ
リットコート  5・・・三角プリズム  11・・・
λ/2位相板  12・・・コーナキューブプリズム 
 13・・・λ/4位相板  14・・・固定鏡  1
5・・・三角プリズム  16・・・可動鏡
FIG. 1 is a plan view showing an embodiment of a polarizing beam splitter according to the present invention, and FIG. 2 is a configuration showing the configuration and polarization characteristics of a laser interferometer according to the present invention using the polarizing beam splitter shown in FIG. 1. The schematic diagrams, FIGS. 3 and 4, are diagrams showing examples in which the optical element arrangement of the laser interferometric length meter shown in FIG. 2 has been changed, respectively. FIG. Each figure is a plan view showing an example of a conventional polarizing beam splitter. ■...Polarizing beam splitter 2...Parallel plate prism 3...Reflecting surface 4...Polarizing beam split coat 5...Triangular prism 11...
λ/2 phase plate 12...corner cube prism
13...λ/4 phase plate 14... Fixed mirror 1
5...Triangular prism 16...Movable mirror

Claims (2)

【特許請求の範囲】[Claims] (1)平行板状のプリズムの平行に対峙する両端面の一
方面に反射面を形成し、かつ、他方面の一部分に偏光ビ
ームスプリットコートを施し、該偏光ビームスプリット
コートが施された端面に対して三角プリズムを接合して
なり、前記偏光ビームスプリッタにおける反射光が前記
反射面で反射して前記他方面の偏光ビームスプリットコ
ートが施されない透過部分を通過して前記三角プリズム
に入射するよう構成すると共に、前記偏光ビームスプリ
ットコートにおける反射光と通過光とが前記三角プリズ
ムの同一端面から出射するよう構成した偏光ビームスプ
リッタ。
(1) A reflective surface is formed on one of both parallel end faces of a parallel plate-like prism, and a portion of the other face is coated with a polarizing beam split coat, and the end face coated with the polarizing beam split coat is coated with a polarizing beam split coat. A triangular prism is joined to the polarizing beam splitter, and the reflected light from the polarizing beam splitter is reflected by the reflecting surface, passes through a transparent portion of the other surface that is not coated with a polarizing beam splitting coating, and enters the triangular prism. and a polarizing beam splitter configured such that reflected light and passing light on the polarizing beam split coat are emitted from the same end face of the triangular prism.
(2)請求項1記載の偏光ビームスプリッタを用い光源
の光束を互いに平行な参照光と測長光とに分けると共に
、固定鏡で反射した参照光と測長物に取付けられた可動
鏡で反射した測長光とを前記偏光ビームスプリッタに戻
して合成し、前記光源の光束と平行な出射光を得るよう
構成したことを特徴とするレーザ干渉測長計。
(2) Using the polarizing beam splitter according to claim 1, the light beam from the light source is divided into a mutually parallel reference light and a length measurement light, and the reference light reflected by a fixed mirror and reflected by a movable mirror attached to a length measurement object. 1. A laser interferometric length measuring meter, characterized in that the length measuring light is returned to the polarizing beam splitter and combined to obtain an emitted light parallel to the luminous flux of the light source.
JP2174432A 1990-07-03 1990-07-03 Polarizing beam splitter and laser interferometer Pending JPH0463305A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2174432A JPH0463305A (en) 1990-07-03 1990-07-03 Polarizing beam splitter and laser interferometer
US07/722,109 US5172186A (en) 1990-07-03 1991-06-27 Laser interferometry length measuring an apparatus employing a beam slitter
EP91305917A EP0469718B1 (en) 1990-07-03 1991-06-28 Laser interferometry length measuring apparatus
DE69116464T DE69116464T2 (en) 1990-07-03 1991-06-28 Length measuring device using laser interferometry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2174432A JPH0463305A (en) 1990-07-03 1990-07-03 Polarizing beam splitter and laser interferometer

Publications (1)

Publication Number Publication Date
JPH0463305A true JPH0463305A (en) 1992-02-28

Family

ID=15978432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2174432A Pending JPH0463305A (en) 1990-07-03 1990-07-03 Polarizing beam splitter and laser interferometer

Country Status (1)

Country Link
JP (1) JPH0463305A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000249513A (en) * 1999-02-26 2000-09-14 Dr Johannes Heidenhain Gmbh Beam splitter structure group and interferometer having beam splitter structure group
JP2007327819A (en) * 2006-06-07 2007-12-20 Ricoh Co Ltd Heterodyne laser interferometer and image forming apparatus
US9625745B2 (en) 2013-11-15 2017-04-18 Reald Inc. High dynamic range, high contrast projection systems
US9927691B2 (en) 2006-09-29 2018-03-27 Reald Inc. Polarization conversion systems for stereoscopic projection
US10203511B2 (en) 2007-05-09 2019-02-12 Reald Inc. Polarization conversion system and method for projecting polarization encoded imagery

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000249513A (en) * 1999-02-26 2000-09-14 Dr Johannes Heidenhain Gmbh Beam splitter structure group and interferometer having beam splitter structure group
JP2007327819A (en) * 2006-06-07 2007-12-20 Ricoh Co Ltd Heterodyne laser interferometer and image forming apparatus
US9927691B2 (en) 2006-09-29 2018-03-27 Reald Inc. Polarization conversion systems for stereoscopic projection
US11143948B2 (en) 2006-09-29 2021-10-12 Reald Inc. Polarization conversion systems for stereoscopic projection
US10203511B2 (en) 2007-05-09 2019-02-12 Reald Inc. Polarization conversion system and method for projecting polarization encoded imagery
US10739611B2 (en) 2007-05-09 2020-08-11 Reald Inc. 3D projection system
US9625745B2 (en) 2013-11-15 2017-04-18 Reald Inc. High dynamic range, high contrast projection systems

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