JPH0465306A - Oxide superconductor thin film - Google Patents

Oxide superconductor thin film

Info

Publication number
JPH0465306A
JPH0465306A JP2174582A JP17458290A JPH0465306A JP H0465306 A JPH0465306 A JP H0465306A JP 2174582 A JP2174582 A JP 2174582A JP 17458290 A JP17458290 A JP 17458290A JP H0465306 A JPH0465306 A JP H0465306A
Authority
JP
Japan
Prior art keywords
thin film
oxide
oxide superconductor
group
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2174582A
Other languages
Japanese (ja)
Inventor
Shinichi Ohashi
大橋 信一
Toshiya Matsubara
俊哉 松原
Junichi Shimoyama
淳一 下山
Takeshi Morimoto
剛 森本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP2174582A priority Critical patent/JPH0465306A/en
Publication of JPH0465306A publication Critical patent/JPH0465306A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E40/00Technologies for an efficient electrical power generation, transmission or distribution
    • Y02E40/60Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment

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  • Inorganic Compounds Of Heavy Metals (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Oxygen, Ozone, And Oxides In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)

Abstract

PURPOSE:To provide many centers capable of effectively pinning a magnetic flux and a high critical current density even in a strong magnetic field by forming the thin film having a structure in which the particulates of a multiple oxide consisting of specified metals are dispersed in an oxide superconductor crystal. CONSTITUTION:The oxide superconductor thin film has a structure in which the granular particulates of the multiple oxide of at least one kind selected from group IA elements and at least one kind selected from groups VIA and IVB elements and rare-earth elements are dispersed in an oxide superconductor crystal. The oxide expressed by the composition formula ABO3 (A is >=1 kind selected from Mg, Ca, Sr and Ba, and B is >=1 kind selected from Zr, Sn, Ce and Ti) is preferably used as the multiple oxide. The superconducting thin film can be produced by vapor deposition, sputtering, CVD or laser vapor deposition.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、新規な組織を有する酸化物超電導体薄膜に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an oxide superconductor thin film having a novel structure.

[従来の技術] 従来、RE−Ba−C:u−0(REはY、 La、 
Nd、 Sm、 Eu、 GdDy、 Ho、 Er、
Tm、 Yb、 Luからなる群から選ばれた1種以上
)系超電導体(以下希土類系超電導体ともいう) 、 
B1−3r−Ca−Cu−0系超電導体(以下ビスマス
系超電導体ともいう)、 Tl−Ba−Ca−Cu−0
系超電導体(以下タリウム系超電導体ともいう)などの
酸化物超電導体が知られている。
[Prior art] Conventionally, RE-Ba-C:u-0 (RE is Y, La,
Nd, Sm, Eu, GdDy, Ho, Er,
one or more selected from the group consisting of Tm, Yb, and Lu) based superconductor (hereinafter also referred to as rare earth superconductor),
B1-3r-Ca-Cu-0-based superconductor (hereinafter also referred to as bismuth-based superconductor), Tl-Ba-Ca-Cu-0
Oxide superconductors such as thallium-based superconductors (hereinafter also referred to as thallium-based superconductors) are known.

酸化物超電導体の薄膜の製造方法としては、蒸着法、ス
パッタリング法、CVD法、レーザー蒸着法を用いて基
板上に、超電導体を構成する各元素を堆積させる方法が
知られている。これらの方法では、配向性の多結晶体あ
るいは単結晶が得られて、高い臨界電流密度を有する超
電導体薄膜が得られることが報告されている。
As a method for manufacturing a thin film of an oxide superconductor, a method is known in which each element constituting the superconductor is deposited on a substrate using a vapor deposition method, a sputtering method, a CVD method, or a laser deposition method. It has been reported that by these methods, oriented polycrystals or single crystals can be obtained and superconductor thin films having high critical current density can be obtained.

U発明が解決しようとする問題点】 しかしながら、従来の方法で得られた酸化物超電導体薄
膜では、磁場下においては強い電流を流すことができな
いという問題点を有していた。これは、超電導体中に、
貫通した量子化された磁束を固定するピン止め中心が十
分ないためと考えられていた。本発明の目的は、有効な
ピン止め中心を多数有する酸化物超電導体薄膜を提供す
ることである。
[Problems to be Solved by the Invention] However, the oxide superconductor thin film obtained by the conventional method has a problem in that a strong current cannot flow under a magnetic field. This means that in superconductors,
It was thought that this was because there were not enough pinning centers to fix the penetrating quantized magnetic flux. It is an object of the present invention to provide an oxide superconductor thin film having a large number of effective pinning centers.

[課題を解決するための手段] 本発明は、酸化物超電導体結晶中に、2A族元素から選
ばれた少なくとも]種の金属と4A族、4B族および希
土類元素から選ばtた少なくとも1種の金属との複合酸
化物の粒状の微粒子が分散した組織を有する酸化物超電
導体薄膜を提供するものである。
[Means for Solving the Problems] The present invention provides an oxide superconductor crystal containing at least one metal selected from Group 2A elements and at least one metal selected from Group 4A, Group 4B, and rare earth elements. The present invention provides an oxide superconductor thin film having a structure in which granular fine particles of a composite oxide with a metal are dispersed.

本発明において、2A族元素から選ばれた少なくとも1
種の金属と4A族、4B族および希土類元素から選ばれ
た少なくとも1種の金属との複合酸化物は、ABO,(
AはMg、 Ca、 Br、 Baから選ばれた1種以
上、BはZr、Sn、Ce、 Tiから選ばれた1種以
上)の組成式で表わされるものであることが好ましい。
In the present invention, at least one selected from group 2A elements
The composite oxide of a seed metal and at least one metal selected from group 4A, group 4B and rare earth elements is ABO, (
It is preferable that A is one or more selected from Mg, Ca, Br, and Ba, and B is one or more selected from Zr, Sn, Ce, and Ti.

ABO3は、非常に安定なペロブスカイト型構造の結晶
となる。この結晶は、いずれも大気中では1200°C
付近まで組成的に安定な物質で、薄膜の堆積過程におい
て酸化物超電導体と反応しない。
ABO3 becomes a crystal with a very stable perovskite structure. Both of these crystals have a temperature of 1200°C in the atmosphere.
It is a substance that is compositionally stable up to close range, and does not react with oxide superconductors during the thin film deposition process.

ABO3を用いる場合は、その添加量は、超電導体に対
して05〜20wt%が好ましい。添加量が0.5wt
%に満だない場合は、添加の効果が表われないので好ま
しくない。添加量が20wt%を超える場合は、材料中
の一部にAXBOy相が偏析してしまい超電導体の不連
続を生じるので好ましくない。さらに好ましいA、BO
,の添加量は2〜10wt%である。
When ABO3 is used, the amount added is preferably 05 to 20 wt% based on the superconductor. Added amount is 0.5wt
If it is less than %, the effect of the addition will not be apparent, which is not preferable. If the amount added exceeds 20 wt%, the AXBOy phase will segregate in a part of the material, causing discontinuity in the superconductor, which is not preferable. More preferable A, BO
, is added in an amount of 2 to 10 wt%.

上記の複合酸化物粒子の粒径としては、500Å以下の
場合は、ピン止め効果が増大するので好ましい。200
Å以下の場合は、さらに好ましい。
The particle size of the composite oxide particles is preferably 500 Å or less, since this increases the pinning effect. 200
It is even more preferable if it is less than Å.

本発明の酸化物超電導体薄膜は、薄膜の堆積過程におい
て、上記複合酸化物の原料を同時に気化させて上記複合
酸化物の微粒子を同時に堆積させることにより製造する
ことができる。
The oxide superconductor thin film of the present invention can be manufactured by simultaneously vaporizing the composite oxide raw material and simultaneously depositing the composite oxide fine particles during the thin film deposition process.

本発明の超電導薄膜は、蒸@法、スパッタリング法、C
VD法、レーザー蒸着法いずれにおいての製造可能であ
る。いずれの方法においても、基板を400〜900℃
に加熱して堆積させるのが好ましい。この結果、配向し
た超電導体中に非超電導体の微粒子が分散した組織の薄
膜が得られる。製膜後、必要に応じてさらに熱処理を行
うこともできる。
The superconducting thin film of the present invention can be produced by vaporization method, sputtering method, C
It can be manufactured using either the VD method or the laser deposition method. In either method, the substrate is heated to 400 to 900°C.
It is preferable to deposit the material by heating it to . As a result, a thin film having a structure in which fine particles of a non-superconductor are dispersed in an oriented superconductor is obtained. After film formation, further heat treatment can be performed as necessary.

基体の材質としては、各種の耐熱合金、セラミックス等
種々のものを好適に使用することができる。
Various materials such as various heat-resistant alloys and ceramics can be suitably used as the material for the base body.

本発明の酸化物超電導体としては、特に限定されず希土
類系、ビスマス系、タリウム系等種々のものが、好適に
適用できる。
The oxide superconductor of the present invention is not particularly limited, and various materials such as rare earth-based, bismuth-based, thallium-based, etc. can be suitably applied.

酸化物超電導体として、希土類系超電導体を採用する場
合は、Ba5nO,、BaZr0.、BaTi0a、B
aCeO3、BazSiOaなどBaを含むものが、超
電導体の構成元素の一つであるので元素の置換反応が生
じても実質的に超電導体内に他のアルカリ土類元素が混
入しないので超電導特性に悪影響を与えないので好まし
い。
When a rare earth superconductor is used as the oxide superconductor, Ba5nO, BaZr0. , BaTi0a,B
Since Ba-containing elements such as aCeO3 and BazSiOa are one of the constituent elements of superconductors, even if an element substitution reaction occurs, other alkaline earth elements do not substantially mix into the superconductor, so there is no adverse effect on superconducting properties. It is preferable because it does not give

[実施例] 実施例1 真空容器内にI X 10−’Torrの酸素ガスを導
入する。基板の近傍にはノズルを設置して、局所的に酸
素の圧力がI X 1O−2Torrになるようにした
。Y、Ba、 Cuをクヌーセンセルでそれぞれの原子
比が、12:3または12:4で蒸発させた。さらに表
1に示したB成分を電子ビームクヌーセンセルで蒸発さ
せた。このため、BaとこのB成分が反応してABO3
の微粒子が生成した。ABO3の含有量が酸化物超電導
体に対して2wt%になるように、それぞれの成分の蒸
発量を制御した。基板には、MgOの(1,OO)単結
晶を使用し、650℃に加熱した。
[Examples] Example 1 Oxygen gas at I x 10-'Torr is introduced into a vacuum container. A nozzle was installed near the substrate so that the local oxygen pressure was I x 10-2 Torr. Y, Ba, and Cu were evaporated in a Knudsen cell at an atomic ratio of 12:3 or 12:4. Furthermore, the B component shown in Table 1 was evaporated using an electron beam Knudsen cell. Therefore, Ba and this B component react and ABO3
of fine particles were generated. The amount of evaporation of each component was controlled so that the content of ABO3 was 2 wt% with respect to the oxide superconductor. A (1,OO) single crystal of MgO was used as the substrate and heated to 650°C.

この結果REBazCuJyまたはREJa4CusO
,結晶中にABo 3粒子が分散した薄膜が得られた。
As a result, REBazCuJy or REJa4CusO
, a thin film in which 3 ABo particles were dispersed in the crystal was obtained.

得られた薄膜は、500LLmの幅にパターニングした
後、直流4端子法により臨界温度、磁場下における臨界
電流密度(77K、5丁)を測定した。
The obtained thin film was patterned to a width of 500 LLm, and then the critical current density (77 K, 5 probes) at critical temperature and under a magnetic field was measured by a DC 4-terminal method.

結果を表1に示す。The results are shown in Table 1.

表  1 比較例I B成分を蒸発させないこと以外はすべて実施例1と同様
にして、基板上にYBa2Cu30yまたはYJa4C
ugOyの薄膜を作成した。実施例1と同様に測定した
ところ、YBa2Cu30yでは臨界温度86K、臨界
電流密度(77K、5 T ) 1.000OA/cm
2Y2Ba4CusOyでは臨界温度80K、臨界電流
密度(77K、5 T )  34.00OA/cm2
であった。
Table 1 Comparative Example I YBa2Cu30y or YJa4C was deposited on the substrate in the same manner as in Example 1 except that the B component was not evaporated.
A thin film of ugOy was created. When measured in the same manner as in Example 1, YBa2Cu30y had a critical temperature of 86K and a critical current density (77K, 5T) of 1.000OA/cm.
For 2Y2Ba4CusOy, the critical temperature is 80K and the critical current density (77K, 5T) is 34.00OA/cm2.
Met.

実施例2 真空容器内にアルゴンと酸素の1=1の混合ガスを2 
X 1O−2Torr導入する。ABO3およびYBa
2Cu30.の焼結体をターゲットとしてスパッタリン
グ法により薄膜を作成した。ここでABO3のA成分は
すべてBaで、B成分は表2に示したものを使用した。
Example 2 Two mixed gases of argon and oxygen (1=1) were placed in a vacuum container.
Introduce X 1O-2Torr. ABO3 and YBa
2Cu30. A thin film was created using the sputtering method using the sintered body as a target. Here, the A component of ABO3 was all Ba, and the B component shown in Table 2 was used.

ABO3の含有量が超電導体に対して4wt%になるよ
うに、高周波をABO,およびYBazCuxOyター
ゲットにそれぞれ200W、50W印加した。基板には
、MgOの(100)単結晶を使用し650℃に加熱し
た。
A high frequency of 200 W and 50 W was applied to the ABO and YBazCuxOy targets, respectively, so that the content of ABO3 was 4 wt% with respect to the superconductor. A (100) single crystal of MgO was used as the substrate and heated to 650°C.

この結果YBa2CusOy結晶中にABO3粒子が分
散した超電導体薄膜が得られた。この薄膜について、5
00μmの幅にパターニングして後、直流4端子法によ
り臨界温度、磁場下にあける臨界電流密度(77K、5
T)を1lll定した。結果を表2に示す。
As a result, a superconductor thin film in which ABO3 particles were dispersed in YBa2CusOy crystals was obtained. Regarding this thin film, 5
After patterning to a width of 00 μm, the critical current density (77 K, 5
T) was determined. The results are shown in Table 2.

表  2 比較例2 AB[)3ターゲツトを用いないこと以外はすべて実施
例1と同様にして、基板上にYBa2Cu30yまの薄
膜を作成した。実施例1と同様に測定したところ、臨界
温度83K、臨界電流密度(77K、5 T ) 90
00 A/cm2であった。
Table 2 Comparative Example 2 A thin film of YBa2Cu30y was formed on a substrate in the same manner as in Example 1 except that the AB[)3 target was not used. When measured in the same manner as in Example 1, the critical temperature was 83 K, and the critical current density (77 K, 5 T) was 90
00 A/cm2.

実施例3 真空容器内にアルゴンと酸素の1:1の混合気体を、2
.5 X 10−@Torrの圧力で導入した。
Example 3 A 1:1 mixture of argon and oxygen was placed in a vacuum container at 2
.. It was introduced at a pressure of 5×10−@Torr.

Bt□5raCaCu20.焼結体と表2に示したAと
BからなるABO,焼結体をターゲットとして、スパッ
タリング法による製膜を行なった。高周波をBizSr
2CaCuzOyターゲットとABO,ターゲットにそ
れぞれ250Wと70 Vv’印加して、膜中のABO
,が2wt%になるよう制御した。基板は、Mg0fl
OO)単結晶を使用し、600℃に加熱した。得られた
膜は、さらに空気中850℃で2時間処理した。
Bt□5raCaCu20. A film was formed by sputtering using the sintered body, ABO consisting of A and B shown in Table 2, and the sintered body as targets. High frequency BizSr
250 W and 70 Vv' were applied to the 2CaCuzOy target and ABO target, respectively, to remove ABO in the film.
, was controlled to be 2 wt%. The substrate is Mg0fl
OO) A single crystal was used and heated to 600°C. The obtained membrane was further treated in air at 850° C. for 2 hours.

この薄膜について、500μmの幅にパターニングして
、直流四端子法により、臨界温度および77に5テスラ
における臨界電流密度を測定した。結果を表3に示す。
This thin film was patterned to a width of 500 μm, and the critical temperature and critical current density at 77°C and 5 Tesla were measured by the DC four-terminal method. The results are shown in Table 3.

表  3 比較例3 ABO,を用いないこと以外は実施例3と同様にして、
Bi25rzCaCuaOy薄膜を得た。実施例1と同
様にして測定したところ、この薄膜の臨界温度は80に
で、臨界電流密度は100OA/cm” (77K、5
T)であった。
Table 3 Comparative Example 3 Same as Example 3 except that ABO was not used.
A Bi25rzCaCuaOy thin film was obtained. When measured in the same manner as in Example 1, the critical temperature of this thin film was 80°C, and the critical current density was 100OA/cm" (77K, 5
T).

実施例4 真空容器内にアルゴンと酸素の1・1の混合気体を、2
.5 X 10−’ Torrの圧力で導入した。
Example 4 A 1:1 mixed gas of argon and oxygen was placed in a vacuum container, and 2
.. It was introduced at a pressure of 5 x 10-' Torr.

TIJazCa2Cu30y焼結体と表4に示したAと
BからなるABO3焼結体をターゲットとして、スパッ
タリング法による製膜を行なった。高周波をTIJaz
CaiCu30yターゲットとAB○3ターゲットにそ
れぞれ250Wと50W印加して、膜中のABO,が2
wt%になるよう制御した。基板は、Mg0(100)
単結晶を使用し、600℃に加熱した。得られた膜は、
さらにT12Ba、zCuOyおよびT ]、 20 
s とともにルツボに入れ空気中900℃で2時間処理
した。
Film formation was performed by sputtering using the TIJazCa2Cu30y sintered body and the ABO3 sintered body consisting of A and B shown in Table 4 as targets. TIJaz high frequency
By applying 250 W and 50 W to the CaiCu30y target and AB○3 target, respectively, the ABO in the film was 2.
It was controlled to be wt%. The substrate is Mg0 (100)
A single crystal was used and heated to 600°C. The obtained membrane is
Furthermore T12Ba, zCuOy and T ], 20
The sample was placed in a crucible with S and treated in air at 900°C for 2 hours.

この薄膜について、500μmの幅にパターニングして
、直流四端子法により、臨界温度および77に5テスラ
における臨界電流密度を測定した。結果を表4に示す。
This thin film was patterned to a width of 500 μm, and the critical temperature and critical current density at 77°C and 5 Tesla were measured by the DC four-terminal method. The results are shown in Table 4.

表  4 比較例4 ABO3を用いないこと以外は実施例3と同様にして、
T1□BazCa2Cu30y薄膜を得た。実施例1と
同様にして測定したところ、この薄膜の臨界温度は11
8 Kで、臨界電流密度は4000A/c++12(7
7K、5T)であった。
Table 4 Comparative Example 4 Same as Example 3 except that ABO3 was not used.
A T1□BazCa2Cu30y thin film was obtained. When measured in the same manner as in Example 1, the critical temperature of this thin film was 11
At 8 K, the critical current density is 4000 A/c++12 (7
7K, 5T).

[発明の効果] 本発明の超電導体薄膜は、超電導体中に非超電導体が分
散しており、これが磁束の良好なビン止め中心として作
用するため、強磁場中でも臨界電流密度が高い。
[Effects of the Invention] In the superconductor thin film of the present invention, non-superconductors are dispersed in the superconductor, and this acts as a center for good binding of magnetic flux, so that the critical current density is high even in a strong magnetic field.

Claims (1)

【特許請求の範囲】 1、酸化物超電導体結晶中に、2A族元素から選ばれた
少なくとも1種の金属と4A族、 4B族および希土類元素から選ばれた少なくとも1種の
金属との複合酸化物の粒状の微粒子が分散した組織を有
する酸化物超電導体薄膜。 2、2A族元素から選ばれた少なくとも1種の金属と4
A族、4B族および希土類元素から選ばれた少なくとも
1種の金属との複合酸化物が、ABO_3、(AはMg
、Ca、Br、Baから選ばれた1種以上、BはZr、
Sn、Ce、Tiから選ばれた1種以上)の組成式で表
される酸化物である請求項1の酸化物超電導体薄膜。 3、薄膜の作製方法が、蒸着法、スパッタリング法、C
VD法、レーザー蒸着法である請求項1または2の酸化
物超電導体薄膜。
[Claims] 1. Composite oxidation of at least one metal selected from Group 2A elements and at least one metal selected from Group 4A, Group 4B, and rare earth elements in an oxide superconductor crystal. An oxide superconductor thin film with a structure in which granular particles are dispersed. 2. At least one metal selected from group 2A elements and 4
A composite oxide with at least one metal selected from group A, group 4B and rare earth elements is ABO_3, (A is Mg
, one or more selected from Ca, Br, and Ba, B is Zr,
2. The oxide superconductor thin film according to claim 1, wherein the oxide superconductor thin film is an oxide represented by a composition formula of one or more selected from Sn, Ce, and Ti. 3. The thin film production method is vapor deposition method, sputtering method, C
The oxide superconductor thin film according to claim 1 or 2, which is produced by a VD method or a laser evaporation method.
JP2174582A 1990-07-03 1990-07-03 Oxide superconductor thin film Pending JPH0465306A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005191538A (en) * 2003-12-02 2005-07-14 Nippon Steel Corp Oxide superconductor processing method, oxide superconducting energization element and superconducting magnet
JP2007526865A (en) * 2003-06-25 2007-09-20 イーテーエン ナノヴェイション アクチェンゲゼルシャフト Mixed metal oxides and their use in CO2 sensors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007526865A (en) * 2003-06-25 2007-09-20 イーテーエン ナノヴェイション アクチェンゲゼルシャフト Mixed metal oxides and their use in CO2 sensors
JP2005191538A (en) * 2003-12-02 2005-07-14 Nippon Steel Corp Oxide superconductor processing method, oxide superconducting energization element and superconducting magnet

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