JPH0465887A - Semiconductor laser - Google Patents
Semiconductor laserInfo
- Publication number
- JPH0465887A JPH0465887A JP17987090A JP17987090A JPH0465887A JP H0465887 A JPH0465887 A JP H0465887A JP 17987090 A JP17987090 A JP 17987090A JP 17987090 A JP17987090 A JP 17987090A JP H0465887 A JPH0465887 A JP H0465887A
- Authority
- JP
- Japan
- Prior art keywords
- mode
- layer
- type
- double refraction
- semiconductor laser
- Prior art date
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体レーザに関し、特に特定モードの発
振を抑えることのできる半導体レーザに関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor laser, and particularly to a semiconductor laser that can suppress oscillation in a specific mode.
ダブルへテロ接合レーザは、通常TE波に偏光している
。これは定性的に次のように説明される。Double heterojunction lasers are typically polarized to TE waves. This can be qualitatively explained as follows.
TE波は活性層面内に電界成分をもち、TM波は活性層
面内に垂直に電界成分もつ。導波路を進行する光波につ
いては、概念的には導波路境界をジグザグに進行する平
面波の集合と考えることができる。反射面での反射率を
考えるとき、反射面に垂直方向に電界成分があるTM波
では、ブリュースタ角が存在することでもわかるように
、反射面内に電界成分があるTE波に比べて反射率は低
い。従って、TE波の方がTM波に比べて反射率が大き
いため、次式で示されるしきい値利得係数gthにおい
て、
gtb:Lきい値利得係数
α、:内部損失
R;端面反射率
L :共振器長
反射損失が小さくなるため、小さな利得すなわち小さな
電流でTE波のレーザ発振が生じることがわかる。TE
波とTM波の強度比はしきい値電流より十分小さい電流
領域では1:1であるが、しきい値電流以下でも誘導放
出が増加してくると、TE波の強度が強くなる。しきい
値電流以上では通常光出力が3mW以上になれば、TE
波とTM波の成分比は100:1以上になる例が多い。The TE wave has an electric field component within the plane of the active layer, and the TM wave has an electric field component perpendicular to the plane of the active layer. A light wave traveling through a waveguide can be conceptually considered as a collection of plane waves traveling in a zigzag pattern along the waveguide boundary. When considering the reflectance at a reflective surface, TM waves that have an electric field component perpendicular to the reflective surface have a higher reflection than TE waves that have an electric field component within the reflective surface, as can be seen from the existence of the Brewster angle. rate is low. Therefore, since the reflectance of the TE wave is higher than that of the TM wave, in the threshold gain coefficient gth shown by the following formula, gtb:L threshold gain coefficient α, : internal loss R; end face reflectance L : It can be seen that TE wave laser oscillation occurs with a small gain, that is, with a small current, because the resonator length reflection loss becomes small. T.E.
The intensity ratio of the TE wave and the TM wave is 1:1 in a current range sufficiently smaller than the threshold current, but as stimulated emission increases even below the threshold current, the intensity of the TE wave increases. Above the threshold current, if the optical output is 3mW or more, the TE
In many cases, the component ratio between waves and TM waves is 100:1 or more.
このようにレーザ光は通常TE波に偏光しており、TM
酸成分少ないが、さらにTMモード成分を抑える必要が
ある際には、LD外部に偏光子やモードスプリッタ等の
偏光素子を置き、モジュール化していた。In this way, laser light is normally polarized into TE waves, and TM waves.
Although the acid component is small, when it is necessary to further suppress the TM mode component, a polarizing element such as a polarizer or a mode splitter is placed outside the LD to form a module.
〔発明が解決しようとする課題)
以上の説明で明らかなように、従来の半導体レーザにお
いては、TMモード成分を抑えるためには、レーザ外部
に偏光素子を置きモジール化する必要があり、軸合わせ
等の微調整が必要であるという問題点があった。また、
モジュール化によるモード選択信号(TEモード/TM
モード)も偏光素子の性能に依存しており、本質的に7
Mモードを抑えることができないという問題点があった
。[Problems to be Solved by the Invention] As is clear from the above explanation, in conventional semiconductor lasers, in order to suppress the TM mode component, it is necessary to place a polarizing element outside the laser and make it modular. There was a problem in that fine adjustments such as these were required. Also,
Mode selection signal (TE mode/TM
mode) also depends on the performance of the polarizing element, and is essentially 7
There was a problem that the M mode could not be suppressed.
この発明は上記のような問題点を解消するためになされ
たもので、偏光素子を用いることな(半導体レーザ素子
内で本質的にTMモード成分を抑えることのできる半導
体レーザを得ることを目的とする。This invention was made in order to solve the above-mentioned problems, and the purpose is to obtain a semiconductor laser that can essentially suppress the TM mode component within the semiconductor laser element (without using a polarizing element). do.
この発明に係る半導体レーザ装置は、レーザ構造をS
CH(Separate Confinement H
eterostructure)構造とし、SCH構造
の光ガイド層を多重量子井戸構造としたものである。The semiconductor laser device according to the present invention has a laser structure of S
CH(Separate Confinement H
The optical guide layer of the SCH structure has a multi-quantum well structure.
この発明においては、SCH構造の光ガイド層を複屈折
性を示す多重量子井戸構造の導波路としたので、従来T
Eモードと7Mモードが近接しているために困難であっ
たモード分離が容易となり、7Mモードのみをカットオ
フすることができるためにレーザ光のTM酸成分抑える
ことができる。In this invention, since the optical guide layer with the SCH structure is a waveguide with a multiple quantum well structure exhibiting birefringence, the conventional T
Since the E mode and the 7M mode are close to each other, mode separation, which was difficult, becomes easier, and since only the 7M mode can be cut off, the TM acid component of the laser beam can be suppressed.
以下、この発明の一実施例を図について説明する。 An embodiment of the present invention will be described below with reference to the drawings.
第1図(a)は本発明の一実施例による半導体レーザの
SCH構造部のバンド構造を示す図、第1図ら)は該S
CH構造部の屈折率分布を示す図である。FIG. 1(a) is a diagram showing the band structure of the SCH structure of a semiconductor laser according to an embodiment of the present invention, and FIG.
It is a figure showing the refractive index distribution of a CH structure part.
図において、21はp型A 12 G a +−2A
Sクラッド層、22はp型A j! y Cr a t
−y A sウェル層、23はp型A I X G a
I−X A sバリア層、24はGaAs活性層、2
5はn型Al、Gap−、Asウェル層、26はn型A
l2.Cat−g Asバリア層、27はn型A !!
、z G a r−z A sクラッド層である。また
り、はバリア層膜厚、L、はウェル層膜厚である。各層
のA!組成比x、y、zの関係はz > x > yで
ある。In the figure, 21 is p-type A 12 Ga +-2A
S cladding layer, 22 is p-type A j! yCr a t
-y As s-well layer, 23 is p-type A I
I-X As barrier layer, 24 is GaAs active layer, 2
5 is n-type Al, Gap-, As well layer, 26 is n-type A
l2. Cat-g As barrier layer, 27 is n-type A! !
, zG a r-z A s cladding layer. Also, L is the barrier layer thickness, and L is the well layer thickness. A for each layer! The relationship among the composition ratios x, y, and z is z > x > y.
また、第2図は本実施例による半導体レーザの断面模式
図である。図において、1はp側電極、2はp型A1G
aAsキャップ層、3はp型AfGaAsクラッド層、
4はn型AlGaAs電流フロック層、5はp型Aj!
GaAsクラッド層、6はp型A I G a A s
多重量子井戸光ガイド層、7はGaAs活性層、8はn
型AffiGaAs多重量子井戸光ガイド層、9はn型
AlGaAsクラッド層、10はn型GaAs基板、1
1はn側電極である。Further, FIG. 2 is a schematic cross-sectional view of the semiconductor laser according to this embodiment. In the figure, 1 is a p-side electrode, 2 is a p-type A1G
aAs cap layer, 3 is a p-type AfGaAs cladding layer,
4 is an n-type AlGaAs current flock layer, 5 is a p-type Aj!
GaAs cladding layer, 6 is p-type AI Ga As
Multi-quantum well light guide layer, 7 is GaAs active layer, 8 is n
type AffiGaAs multi-quantum well light guide layer, 9 is an n-type AlGaAs cladding layer, 10 is an n-type GaAs substrate, 1
1 is an n-side electrode.
次に作用について説明する。Next, the effect will be explained.
本実施例の光ガイド層にみられるように、屈折率の異な
る2種類の媒質が交互に層状に積み重ねられているとき
は、複屈折性を示すことが知られている。この複屈折性
は多重量子井戸数、バリア層膜厚Lb、ウェル層膜厚L
2等により制御可能である。複屈折性の制御により、該
ガイド層をTEモードは閉じ込めるが、7Mモードは閉
じ込めないような光ガイド層を実現することができ、こ
れにより7Mモードのレーザ素子内でのカットオフが可
能となる。It is known that birefringence is exhibited when two types of media with different refractive indexes are stacked alternately in layers, as seen in the light guide layer of this example. This birefringence is determined by the number of multiple quantum wells, the barrier layer thickness Lb, and the well layer thickness L.
It can be controlled by 2 etc. By controlling the birefringence, it is possible to create an optical guide layer that confines the TE mode but does not confine the 7M mode, thereby making it possible to cut off the 7M mode within the laser element. .
このように本実施例によれば、従来、TEモードと7M
モードが近接しているために困難であったモード分離が
、複屈折性を示す光ガイド層を導入することにより容易
となり、7Mモードのみをカットオフすることが可能と
なる。As described above, according to this embodiment, conventionally, the TE mode and 7M
Mode separation, which was difficult due to the proximity of the modes, becomes easier by introducing a light guide layer exhibiting birefringence, and it becomes possible to cut off only the 7M mode.
なお、上記実施例ではG a A s系半導体を用いた
が、その他の半導体を用いても本発明は有効である。Note that although a GaAs-based semiconductor was used in the above embodiment, the present invention is also effective even if other semiconductors are used.
また、上記実施例では、電流ブロック層を用いて電流狭
窄を行なうものを示したが、活性領域の狭ストライプ化
はこの方法にかぎるものではないことはいうまでもない
。Further, in the above embodiments, current confinement is performed using a current blocking layer, but it goes without saying that this method is not the only method for forming narrow stripes in the active region.
以上のように、この発明によれば、SCH構造の光ガイ
ド層を多重量子井戸構造としたから、適切な導波路構造
設計によりTMモードのみをカットオフすることができ
、レーザ光のTMモード成分を抑えることが可能となる
効果がある。As described above, according to the present invention, since the light guide layer of the SCH structure has a multiple quantum well structure, only the TM mode can be cut off by appropriate waveguide structure design, and the TM mode component of the laser light can be cut off. This has the effect of suppressing the
第1図はこの発明の一実施例による半導体レーザのSC
H構造部のバンド構造、屈折率分布を示す図、第2図は
本発明の一実施例による半導体レーザを示す断面図であ
る。
lはp側電極、2はp型AfGaAsキャンプ層、3は
p型Aj2GaAsクラッド層、4はn型Aj2GaA
sブ07り層、5はp型AlGaAsクラッド層、6は
p型Aj2GaAs多重量子井戸光ガイド層、7はGa
As活性層、8はn型A!G a A s多重量子井戸
光ガイド層、9はn型AffiGaAsクラッド層、1
0はn型GaAs基板、11はn側電極、21はP型A
lz Ga1−z Asクラッド層、22はp型A l
y G a +−y A sウェル層、23はp型A
f、Ga、−、Asバリア層、24はGaAs活性層、
25はn型Aj2yGa+、Asウェル層、26はn型
AlXGa、−8Asバリア層、27はn型Aff□G
a、−z Asクラッド層、L、はバリア層膜厚、+2
はウェル層膜厚である。
なお図中同一符号は同−又は相当部分を示す。FIG. 1 shows an SC of a semiconductor laser according to an embodiment of the present invention.
FIG. 2 is a cross-sectional view showing a semiconductor laser according to an embodiment of the present invention. 1 is a p-side electrode, 2 is a p-type AfGaAs camp layer, 3 is a p-type Aj2GaAs cladding layer, and 4 is an n-type Aj2GaA
s barrier layer, 5 is a p-type AlGaAs cladding layer, 6 is a p-type Aj2GaAs multiple quantum well light guide layer, 7 is Ga
As active layer, 8 is n-type A! GaAs multiple quantum well light guide layer, 9 is n-type AffiGaAs cladding layer, 1
0 is an n-type GaAs substrate, 11 is an n-side electrode, 21 is a P-type A
lz Ga1-z As cladding layer, 22 is p-type Al
y Ga + - y A s well layer, 23 is p-type A
f, Ga, -, As barrier layer, 24 is GaAs active layer,
25 is n-type Aj2yGa+, As well layer, 26 is n-type AlXGa, -8As barrier layer, 27 is n-type Aff□G
a, -z As cladding layer, L, barrier layer thickness, +2
is the well layer thickness. Note that the same reference numerals in the figures indicate the same or equivalent parts.
Claims (1)
tHetero−structure)構造を有する半
導体レーザにおいて、上記SCH構造の光ガイド層は多
重量子井戸層からなり、 該多重量子井戸層が示す複屈折性により特定モードの発
振を抑えることを特徴とした半導体レーザ。(1) SCH (Separate configuration)
tHetero-structure) structure, wherein the light guide layer of the SCH structure is composed of a multiple quantum well layer, and the oscillation of a specific mode is suppressed by the birefringence exhibited by the multiple quantum well layer. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17987090A JPH0465887A (en) | 1990-07-06 | 1990-07-06 | Semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17987090A JPH0465887A (en) | 1990-07-06 | 1990-07-06 | Semiconductor laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0465887A true JPH0465887A (en) | 1992-03-02 |
Family
ID=16073349
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17987090A Pending JPH0465887A (en) | 1990-07-06 | 1990-07-06 | Semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0465887A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06248358A (en) * | 1993-02-25 | 1994-09-06 | Showa Alum Corp | Frame processing apparatus and processing method for metal strip |
| US5528614A (en) * | 1993-05-19 | 1996-06-18 | Mitsubishi Denki Kabushiki Kaisha | Quantum well semiconductor laser device structure |
-
1990
- 1990-07-06 JP JP17987090A patent/JPH0465887A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06248358A (en) * | 1993-02-25 | 1994-09-06 | Showa Alum Corp | Frame processing apparatus and processing method for metal strip |
| US5528614A (en) * | 1993-05-19 | 1996-06-18 | Mitsubishi Denki Kabushiki Kaisha | Quantum well semiconductor laser device structure |
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