JPH0473884U - - Google Patents
Info
- Publication number
- JPH0473884U JPH0473884U JP11700590U JP11700590U JPH0473884U JP H0473884 U JPH0473884 U JP H0473884U JP 11700590 U JP11700590 U JP 11700590U JP 11700590 U JP11700590 U JP 11700590U JP H0473884 U JPH0473884 U JP H0473884U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- current
- instrument rack
- testing
- bistables
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
第１図はこの考案の一実施例を示す試験中入力
電圧、電流値をグラフ表示化した画面を示す図、
第２図はこの考案の動作（画面表示）を示すフロ
ーチヤート、第３図は従来の計器ラツク自動試験
装置の装置構成図、第４図は従来のトリツプ、リ
セツト信号発信試験時の画面表示図である。
図において、１……計器ラツク、２……直流電
圧、電流発生器、３……電圧計、４及び５……ス
イツチであるマルチプログラマ、６……計算機を
示す。なお、図中、同一符号は同一又は相当部分
を示す。
FIG. 1 is a diagram showing a screen on which input voltage and current values are graphically displayed during a test, showing an embodiment of this invention.
Fig. 2 is a flowchart showing the operation (screen display) of this invention, Fig. 3 is a device configuration diagram of a conventional instrument rack automatic test equipment, and Fig. 4 is a screen display diagram during a conventional trip and reset signal generation test. It is. In the figure, 1...instrument rack, 2...DC voltage, current generator, 3...voltmeter, 4 and 5...multi-programmer which is a switch, and 6...calculator are shown. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.
Claims (1)
トリツプ、リセツト信号を発信するバイステーブ
ルの試験において、試験用の入力電圧、電流値を
グラフ表示化したことを特徴とする計器ラツク自
動試験装置。 Electrical signals (voltage, current) from the detector cause
An automatic instrument rack testing device characterized by graphically displaying test input voltage and current values in testing bistables that transmit trip and reset signals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11700590U JPH0473884U (en) | 1990-11-06 | 1990-11-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11700590U JPH0473884U (en) | 1990-11-06 | 1990-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0473884U true JPH0473884U (en) | 1992-06-29 |
Family
ID=31864873
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11700590U Pending JPH0473884U (en) | 1990-11-06 | 1990-11-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0473884U (en) |
-
1990
- 1990-11-06 JP JP11700590U patent/JPH0473884U/ja active Pending
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