JPH0477372B2 - - Google Patents

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Publication number
JPH0477372B2
JPH0477372B2 JP62054260A JP5426087A JPH0477372B2 JP H0477372 B2 JPH0477372 B2 JP H0477372B2 JP 62054260 A JP62054260 A JP 62054260A JP 5426087 A JP5426087 A JP 5426087A JP H0477372 B2 JPH0477372 B2 JP H0477372B2
Authority
JP
Japan
Prior art keywords
tic
magnetic
thin film
additive
film magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62054260A
Other languages
Japanese (ja)
Other versions
JPS63222317A (en
Inventor
Hiroshi Hagya
Yukio Nagayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokin Corp filed Critical Tokin Corp
Priority to JP62054260A priority Critical patent/JPS63222317A/en
Publication of JPS63222317A publication Critical patent/JPS63222317A/en
Publication of JPH0477372B2 publication Critical patent/JPH0477372B2/ja
Granted legal-status Critical Current

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  • Thin Magnetic Films (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Magnetic Heads (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

〔産業上の利用分野〕 本発明はコンピユータの周辺装置であるフロツ
ピーデイスク装置やハードデイスク装置に組み込
まれる磁気ヘツドの基板材料に関し、特に薄膜磁
気ヘツドの非磁性基板材料に関する。 〔従来の技術〕 一般に、コンピユータ、VTR、又はオーデイ
オ関係の磁気ヘツドは、磁性材料であるフエライ
トと非磁性材料のセラミクスをガラスボンデイン
グして構成されている。これに対し、薄膜磁気ヘ
ツドの場合には、磁性あるいは非磁性セラミクス
基板上へセンダスト、パーマロイなどの磁性薄膜
をメツキ、蒸着あるいはスパツタリングにより成
膜し作成される。 一般的には、薄膜磁気ヘツドの基板材料として
は、Al2O3(アルミナ)−TiC(炭化チタン)セラミ
クスが用いられている。その理由としては、他材
料に比較してビツカース硬度が2000以上と極めて
高硬度なため、磁気記録媒体との接触起動停止に
対して高い耐久性を示す事があげられる。 〔発明が解決しようとする問題点〕 一方、欠点としては、焼結性が悪いために、
緻密なものを得るためには焼結温度を1850〜1900
℃の高温としなければならない事、機械加工性
が悪いために小型化の要求に対応できない事、お
よび比抵抗が低いために磁性層を基板上に直接
形成する事ができず基板と磁性層との間にAl2O3
等の絶縁層を形成しなければならない事があげら
れる。これらのうち、特に、比抵抗の値を向上さ
せる事ができれば、基板上に形成する絶縁層の厚
さを薄くできるため、ヘツド製造工程の時間的短
縮が図れる。 〔問題点を解決するための手段〕 本発明は上記の様な問題点、着眼点にもとづい
て研究した結果、焼結促進効果を示す添加物、粒
成長整合効果を示す添加物、比抵抗改善のための
添加物とを同時に添加する事により良好な薄膜磁
性ヘツド用基板材料を得る事を可能としたもので
ある。 具体的に言えば、本発明は種々の実験を行なつ
た結果、TiC15〜60wt%、残部Al2O3より成る主
成分100wt%に対し、ランタノイドの酸化物を1
〜10wt%添加する事によりAl2O3とTiCとの間の
ぬれ性が向上するため焼結性が向上し、かつ
Cr2O3、TiO2、Y2O3、MgOの一種以上の粒成長
整合効果を示す添加物を1〜5wt%添加する事で
小粒径組織として加工性を改善し、さらにSi3N4
を添加する事により比抵抗の低い原因であるTiC
中の遊離炭素(free Carbon)をSi3N4に含まれ
るSiと、反応させ高抵抗のSiCとする事で比抵抗
を増加させ、もつて機械加工性に優れかつ比抵抗
の値を従来のレベルより1ケタ高い薄膜磁気ヘツ
ド用高密度Al2O3−TiCセラミクス基板材を製造
することができた。 〔実施例〕 以下、本発明を実施例に従つて詳細に説明す
る。 平均粒径0.1〜0.5μm、純度99%以上のAl2O3
TiC、La2O3、CeO2、Sm2O3、Cr2O3、TiO2
Y2O3、MgO、Si3N4の各粉末原料を第1表に示
す組成比となる様に秤量し、No.1〜20の各試料と
した。なお、主成分AはTiCとAl2O3とを合わせ
て100wt%とした時のTiCとAl2O3の各wt%を示
す。また。La2O3、CeO2、Sm2O3(添加物B)、
Cr2O3、TiO2、Y2O3、MgO(添加物C)、Si3N4
(添加物D)の各秤量値はすべてAl2O3とTiCとを
合せて100wt%とした主成分に対する割合であ
る。試料No.8〜20は比較のためのものである。
[Industrial Field of Application] The present invention relates to a substrate material for a magnetic head incorporated in a floppy disk device or a hard disk device which is a peripheral device of a computer, and particularly to a nonmagnetic substrate material for a thin film magnetic head. [Prior Art] Generally, magnetic heads for computers, VTRs, or audio devices are constructed by glass-bonding ferrite, which is a magnetic material, and ceramic, which is a non-magnetic material. On the other hand, in the case of a thin film magnetic head, a magnetic thin film such as sendust or permalloy is formed on a magnetic or non-magnetic ceramic substrate by plating, vapor deposition or sputtering. Generally, Al 2 O 3 (alumina)-TiC (titanium carbide) ceramics are used as the substrate material for thin film magnetic heads. The reason for this is that it has an extremely high Vickers hardness of 2000 or more compared to other materials, so it exhibits high durability against starting and stopping due to contact with magnetic recording media. [Problems to be solved by the invention] On the other hand, the disadvantages are that the sinterability is poor;
To obtain a dense product, set the sintering temperature to 1850-1900.
℃, it is difficult to meet the demand for miniaturization due to poor machinability, and the magnetic layer cannot be formed directly on the substrate due to its low resistivity, making it difficult to connect the substrate and the magnetic layer. between Al 2 O 3
For example, it is necessary to form an insulating layer such as Among these, in particular, if the value of specific resistance can be improved, the thickness of the insulating layer formed on the substrate can be reduced, and the time required for manufacturing the head can be shortened. [Means for Solving the Problems] As a result of research based on the above-mentioned problems and points of view, the present invention has developed an additive that promotes sintering, an additive that shows a grain growth matching effect, and an additive that improves resistivity. It is possible to obtain a good substrate material for a thin film magnetic head by simultaneously adding additives for the magnetic head. Specifically, as a result of various experiments, the present invention found that lanthanide oxide was added to 100 wt% of the main component consisting of 15 to 60 wt% TiC and the balance Al 2 O 3 .
Adding ~10wt% improves the wettability between Al 2 O 3 and TiC, improving sinterability, and
By adding 1 to 5 wt% of one or more additives that exhibit a grain growth matching effect such as Cr 2 O 3 , TiO 2 , Y 2 O 3 , and MgO, the processability is improved as a small grain size structure, and Si 3 N Four
TiC, which is the cause of low resistivity by adding
By reacting the free carbon inside with the Si contained in Si 3 N 4 to form high-resistance SiC, the resistivity is increased, and it has excellent machinability and the resistivity value is lower than that of conventional SiC. We were able to produce a high-density Al 2 O 3 --TiC ceramic substrate material for thin-film magnetic heads that is one order of magnitude higher than the standard. [Example] Hereinafter, the present invention will be described in detail according to Examples. Al 2 O 3 with an average particle size of 0.1 to 0.5 μm and a purity of 99% or more,
TiC, La 2 O 3 , CeO 2 , Sm 2 O 3 , Cr 2 O 3 , TiO 2 ,
Powder raw materials of Y 2 O 3 , MgO, and Si 3 N 4 were weighed so as to have the composition ratios shown in Table 1, and samples Nos. 1 to 20 were prepared. Note that the main component A indicates the respective wt% of TiC and Al 2 O 3 when the total of TiC and Al 2 O 3 is 100 wt%. Also. La 2 O 3 , CeO 2 , Sm 2 O 3 (additive B),
Cr 2 O 3 , TiO 2 , Y 2 O 3 , MgO (Additive C), Si 3 N 4
All of the weighed values of (additive D) are the proportions of Al 2 O 3 and TiC to the main component, which is 100 wt%. Samples No. 8 to 20 are for comparison.

【表】 各試料をそれぞれ上述の様に秤量後、エタノー
ルを溶媒としボールミルにて20〜40時間混合し
た。これを過、乾燥後、有機系バインダを添加
し30×30×10mmのブロツクに加圧成型した。次
に、1750℃の温度で2時間の焼結を行なつた。な
お、焼結時の雰囲気は添加したSi3N4の分解を防
ぐため9Kg/m2のN2雰囲気とした。さらに焼結
後、N2ガスを圧力媒体として用い、圧力1000
Kg/cm2、温度1650℃、保持時間2時間の条件で
HIP処理を行なつた。 以上の工程により得られた試料の材料特性の評
価として、相対密度、ビツカース硬度Hv、抗折
強度F、比抵抗の測定を行なつた。また、各試料
より5×5×20mmの角柱を切り出した後、該角柱
の隣接する5×20mmの2面を鏡面に加工し陵部に
生じた2×2μm以上のチツピング数を1000倍の
倍率を有する光学顕微鏡を用いてカウントして1
cm当りの発生率に換算し、加工性の評価項目とし
た。なお、チツピングの大きさはその長さ別に2
〜10μm、11〜50μm、51μm以上に分類した。 以上の結果を第2表に示す。
[Table] After each sample was weighed as described above, it was mixed in a ball mill for 20 to 40 hours using ethanol as a solvent. After filtering and drying this, an organic binder was added and pressure molded into a block of 30 x 30 x 10 mm. Next, sintering was carried out at a temperature of 1750°C for 2 hours. The atmosphere during sintering was a 9 kg/m 2 N 2 atmosphere to prevent the added Si 3 N 4 from decomposing. Furthermore, after sintering, N2 gas was used as a pressure medium, and the pressure was increased to 1000.
Kg/cm 2 , temperature 1650℃, holding time 2 hours
Performed HIP processing. To evaluate the material properties of the sample obtained through the above steps, relative density, Vickers hardness Hv, bending strength F, and specific resistance were measured. In addition, after cutting out a 5 x 5 x 20 mm prism from each sample, the two adjacent 5 x 20 mm sides of the prism were mirror-finished, and the number of chips larger than 2 x 2 μm that occurred on the ridges was measured at a magnification of 1000x. 1 by counting using an optical microscope with
It was converted to the incidence rate per cm and was used as an evaluation item for processability. In addition, the size of chipping is 2 depending on its length.
It was classified into ~10 μm, 11-50 μm, and 51 μm or more. The above results are shown in Table 2.

〔発明の効果〕〔Effect of the invention〕

以上の結果から明らかな様に本発明によれば、
緻密で機械加工性に優れ、比抵抗の値が従来の
10-2Ω・cmのレベルから1ケタ高い10-1Ω・cmの
レベルを示す薄膜磁気ヘツド用高密度Al2O3
TiCセラミクス基板を容易に製造する事ができ
る。
As is clear from the above results, according to the present invention,
It is dense and has excellent machinability, and the resistivity value is lower than that of conventional
High-density Al 2 O 3 − for thin film magnetic heads exhibiting a level of 10 -1 Ω·cm, which is one order of magnitude higher than the level of 10 -2 Ω·cm.
TiC ceramic substrates can be easily manufactured.

Claims (1)

【特許請求の範囲】[Claims] 1 TiCを15〜60wt%含み残部Al2O3より成る主
成分100重量部に対し、La2O3、CeO2、Sm2O3
少なくとも一種を1〜10wt%、Cr2O3、TiO2
Y2O3、MgOの少なくとも一種を1〜5wt%、し
かもSi3N4を1〜10wt%、同時に添加する事を特
徴とする薄膜磁気ヘツド用基板材料。
1 For 100 parts by weight of the main component containing 15 to 60 wt% TiC and the balance Al 2 O 3 , 1 to 10 wt % of at least one of La 2 O 3 , CeO 2 , Sm 2 O 3 , Cr 2 O 3 , TiO 2 ,
A substrate material for a thin film magnetic head, characterized in that 1 to 5 wt% of at least one of Y 2 O 3 and MgO and 1 to 10 wt % of Si 3 N 4 are added simultaneously.
JP62054260A 1987-03-11 1987-03-11 Substrate material for thin film magnetic head Granted JPS63222317A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62054260A JPS63222317A (en) 1987-03-11 1987-03-11 Substrate material for thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62054260A JPS63222317A (en) 1987-03-11 1987-03-11 Substrate material for thin film magnetic head

Publications (2)

Publication Number Publication Date
JPS63222317A JPS63222317A (en) 1988-09-16
JPH0477372B2 true JPH0477372B2 (en) 1992-12-08

Family

ID=12965592

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62054260A Granted JPS63222317A (en) 1987-03-11 1987-03-11 Substrate material for thin film magnetic head

Country Status (1)

Country Link
JP (1) JPS63222317A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007153653A (en) 2005-12-02 2007-06-21 Tdk Corp Sintered compact for magnetic head slider, its producing method and magnetic head slider

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6039807A (en) * 1983-08-15 1985-03-01 Sumitomo Special Metals Co Ltd Substrate material for thin film magnetic head with insulating film
JPS6059717A (en) * 1983-09-13 1985-04-06 Hitachi Metals Ltd Ceramic substrate for thin film magnetic head
JPH062615B2 (en) * 1984-12-29 1994-01-12 ティーディーケイ株式会社 Magnetic head slider material
JPS61281059A (en) * 1985-06-05 1986-12-11 日立金属株式会社 Manufacture of electroconductive ceramic sintered body

Also Published As

Publication number Publication date
JPS63222317A (en) 1988-09-16

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