JPH0478567U - - Google Patents
Info
- Publication number
- JPH0478567U JPH0478567U JP12052090U JP12052090U JPH0478567U JP H0478567 U JPH0478567 U JP H0478567U JP 12052090 U JP12052090 U JP 12052090U JP 12052090 U JP12052090 U JP 12052090U JP H0478567 U JPH0478567 U JP H0478567U
- Authority
- JP
- Japan
- Prior art keywords
- socket
- type semiconductor
- semiconductor device
- dip type
- guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図ａ，ｂは本考案の一実施例の平面図及び
一部切欠き断面図、第２図は従来のソケツトの一
部切欠き断面図である。
１……ソケツト本体、２……測定子、３……切
欠き、４……ＤＩＰタイプ半導体装置、５……測
定子ガイド、６……リード。
1A and 1B are a plan view and a partially cutaway sectional view of an embodiment of the present invention, and FIG. 2 is a partially cutaway sectional view of a conventional socket. 1... socket body, 2... probe, 3... notch, 4... DIP type semiconductor device, 5... probe guide, 6... lead.
Claims (1)
イプ半導体装置のリードと対応する位置に形成さ
れた凹状の測定子ガイドと、該測定子ガイド内に
植立され前記リードと接触する測定子を有するＤ
ＩＰタイプ半導体装置の特性検査装置用ソケツト
において、前記ソケツト本体の前記測定子ガイド
の配列方向に該測定子ガイドを連結する切欠きを
設けたことを特徴とするＤＩＰタイプ半導体装置
の特性検査装置用ソケツト。 ２ 前記切欠きが角型の溝であることを特徴とす
る請求項１記載のＤＩＰタイプ半導体装置の特性
検査装置用ソケツト。[Claims for Utility Model Registration] 1. A socket body, a concave probe guide formed in the socket body at a position corresponding to the lead of a DIP type semiconductor device, and a concave probe guide installed in the probe guide and connected to the lead of the DIP type semiconductor device. D with contact probe
A socket for a characteristic testing device of a DIP type semiconductor device, characterized in that a notch is provided in the socket body in the arrangement direction of the measuring point guide to connect the measuring point guide. socket. 2. The socket for a characteristic testing device for a DIP type semiconductor device according to claim 1, wherein the notch is a square groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12052090U JPH0478567U (en) | 1990-11-16 | 1990-11-16 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12052090U JPH0478567U (en) | 1990-11-16 | 1990-11-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0478567U true JPH0478567U (en) | 1992-07-08 |
Family
ID=31868422
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12052090U Pending JPH0478567U (en) | 1990-11-16 | 1990-11-16 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0478567U (en) |
-
1990
- 1990-11-16 JP JP12052090U patent/JPH0478567U/ja active Pending