JPH0478576U - - Google Patents
Info
- Publication number
- JPH0478576U JPH0478576U JP12335890U JP12335890U JPH0478576U JP H0478576 U JPH0478576 U JP H0478576U JP 12335890 U JP12335890 U JP 12335890U JP 12335890 U JP12335890 U JP 12335890U JP H0478576 U JPH0478576 U JP H0478576U
- Authority
- JP
- Japan
- Prior art keywords
- layer
- shielding
- power cable
- outer semiconducting
- lightning impulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Relating To Insulation (AREA)
- Measuring Leads Or Probes (AREA)
Description
第1図A、第1図Bは本考案の電力ケーブル雷
インパルス試験用端末を示す説明図、第2図A、
第2図Bは従来のの電力ケーブル雷インパルス試
験用端末を示す説明図である。
10……導体、11……内部半導電層、12…
…絶縁層、13……外部半導電層、14……遮蔽
層、15……導電層、16a,16b……電極。
Figures 1A and 1B are explanatory diagrams showing the power cable lightning impulse test terminal of the present invention, Figure 2A,
FIG. 2B is an explanatory diagram showing a conventional power cable lightning impulse test terminal. 10... Conductor, 11... Internal semiconducting layer, 12...
... Insulating layer, 13 ... External semiconducting layer, 14 ... Shielding layer, 15 ... Conductive layer, 16a, 16b ... Electrode.
Claims (1)
外部半導電層と、該外部半導電層上に設けられた
遮蔽層とからなる電力ケーブルの雷インパルス試
験用端末であつて、該遮蔽層または該遮蔽層およ
び該外部半導体層が除去されることにより露出し
た該外部半導電層もしくは該中間層上に導電性形
状記憶樹脂からなる導電層を具備することを特徴
とする電力ケーブル雷インパルス試験用端末。 A terminal for lightning impulse testing of a power cable comprising a conductor, an outer semiconducting layer provided on the conductor via an intermediate layer, and a shielding layer provided on the outer semiconducting layer, the shielding A power cable lightning impulse comprising a conductive layer made of a conductive shape memory resin on the outer semiconducting layer or the intermediate layer exposed by removing the layer or the shielding layer and the outer semiconductor layer. Test terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12335890U JPH0478576U (en) | 1990-11-21 | 1990-11-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12335890U JPH0478576U (en) | 1990-11-21 | 1990-11-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0478576U true JPH0478576U (en) | 1992-07-08 |
Family
ID=31871071
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12335890U Pending JPH0478576U (en) | 1990-11-21 | 1990-11-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0478576U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016142668A (en) * | 2015-02-04 | 2016-08-08 | 住友電気工業株式会社 | Impulse test method for power cable and impulse test facility for power cable |
-
1990
- 1990-11-21 JP JP12335890U patent/JPH0478576U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016142668A (en) * | 2015-02-04 | 2016-08-08 | 住友電気工業株式会社 | Impulse test method for power cable and impulse test facility for power cable |
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