JPH0480351B2 - - Google Patents
Info
- Publication number
- JPH0480351B2 JPH0480351B2 JP14615481A JP14615481A JPH0480351B2 JP H0480351 B2 JPH0480351 B2 JP H0480351B2 JP 14615481 A JP14615481 A JP 14615481A JP 14615481 A JP14615481 A JP 14615481A JP H0480351 B2 JPH0480351 B2 JP H0480351B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- disconnector
- terminal
- voltage source
- capacitors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 66
- 238000012360 testing method Methods 0.000 claims description 46
- 239000002131 composite material Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 13
- 230000000694 effects Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
- G01R31/3333—Apparatus, systems or circuits therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Description
【発明の詳細な説明】
本発明は、しや断器の合成等価試験回路に係り
特に、電力用しや断器の大電流しや断性能を検証
するための合成等価試験回路、とくに4パラメー
タ再起電圧を発生するに最適なしや断器の合成等
価試験回路に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a composite equivalent test circuit for a shield breaker, and more particularly, to a composite equivalent test circuit for verifying the high current shield breaker performance of a power shield breaker. This paper relates to a synthetic equivalent test circuit for disconnectors and breakers that are ideal for generating re-EMF voltages.
大容量電力用しや断器の進歩はめざましく、最
近では300KV1点切り、550VK2点切りしや断切
を目標に研究開発が進められている。 The progress of large-capacity power disconnectors is remarkable, and research and development is currently underway with the goal of 300KV single-point disconnection, 550VK double-point disconnection, and disconnection.
一方、しや断器規格では系統に発生す再起電圧
波形に即して4パラメータ再起電圧波形が採用さ
れ、4パラメータ再起電圧発生回路に関して多数
の発表が成されている。第1図は4パラメータ再
起電圧波形説明図である。ここでt1、t2、u1、uc、
はそれぞれ、初期波高時間、波高時間、初期波高
値および波高値と呼ばれる。一般に波高時間t2の
大きい再起電圧を経済的に発生することが困難
で、しや断試験に実用されている回路は比較的少
ない。第2図は原理的には4パラメータ再起電圧
を発生回路と思われる従来公知の回路の一例であ
つて、図示の如く3つの電源より成つているもの
で、特公昭52−9832号に見られる例である。 On the other hand, the breaker standard adopts a 4-parameter re-electromotive voltage waveform in accordance with the re-electromotive voltage waveform generated in the grid, and many publications have been made regarding 4-parameter re-electromotive voltage generation circuits. FIG. 1 is an explanatory diagram of a four-parameter restart voltage waveform. Here t 1 , t 2 , u 1 , u c ,
are called initial wave height time, wave height time, initial wave height value, and wave height value, respectively. Generally, it is difficult to economically generate a re-electromotive voltage with a large pulse height time t2 , and there are relatively few circuits that have been put to practical use in shear tests. Figure 2 is an example of a conventionally known circuit that is thought to be a four-parameter re-electromotive voltage generating circuit in principle, and is composed of three power supplies as shown in the figure, as seen in Japanese Patent Publication No. 52-9832. This is an example.
第1電源は低電圧大電流回路であつて、交流電
源1から電流調整用リアクトル2、第1の補助し
や断器3、供試しや断器4を通して所定の短絡電
流を供給する。5は抵抗、6はコンデンサであつ
てリアクトル2の出力端に接続されてサージアブ
ソーバを形成する。第2電源(HV1)は通常ワ
イル合成等価試験装置の電圧源と呼ぶものとほと
んど同じであるが、ただ第2の補助しや断器7が
第1電源と第2電源の間に接続される点が異な
る。電圧源コンデンサ8、制御ギヤツプ9、電圧
源リアクトル10の各々は直列接続されて補助し
や断器7の第2電源側に接続されると共に、再起
電圧調整用抵抗11、再起電圧調整用コンデンサ
12の各々が直列接続されて同様に補助しや断器
7の二次電源側端に接続されている。さらに第3
電源(HV2)の出力端にはコンデンサ13が接
続される。リアクトル14と抵抗15の並列回路
とを制御ギヤツプ16を直列接続した回路を一方
の出力端に接続しながら第3電源の出力端は補助
しや断器7の両端に接続される。また、補助しや
断器7の両端にはコンデンサ17が接続される。
以上の構成による動作を次に説明する。但し、第
1電源と第2電源は従来のワイル合成等価試験回
路と同様であり周知のことであるので詳細説明を
省略する。 The first power supply is a low-voltage, high-current circuit, and supplies a predetermined short-circuit current from an AC power supply 1 through a current adjustment reactor 2, a first auxiliary shield breaker 3, and a test circuit breaker 4. 5 is a resistor, and 6 is a capacitor, which are connected to the output end of the reactor 2 to form a surge absorber. The second power supply (HV1) is almost the same as what is usually called the voltage source of a Weyl synthesis equivalence tester, except that a second auxiliary disconnector 7 is connected between the first and second power supplies. The points are different. The voltage source capacitor 8, the control gap 9, and the voltage source reactor 10 are each connected in series to the second power supply side of the auxiliary disconnector 7, as well as a restart voltage adjustment resistor 11 and a restart voltage adjustment capacitor 12. are connected in series and similarly connected to the secondary power supply side end of the auxiliary switch breaker 7. Furthermore, the third
A capacitor 13 is connected to the output end of the power supply (HV2). The output ends of the third power source are connected to both ends of the auxiliary breaker 7, while a circuit in which a parallel circuit of a reactor 14 and a resistor 15 is connected in series with a control gap 16 is connected to one output end. Further, a capacitor 17 is connected to both ends of the auxiliary shunt breaker 7.
The operation of the above configuration will be explained next. However, since the first power supply and the second power supply are the same as those of the conventional Weyl synthesis equivalent test circuit and are well known, detailed explanation will be omitted.
第1電源の最終電流零点直前で制御ギヤツプ9
へ指令を発し、あらかじめ直流高電圧装置HV1
より充電されたコンデンサ8からリアクトル1
0、第2の補助しや断器7を通して供試しや断器
4へ電圧源電流を供給し、供試しや断器4がその
しや断に成功すると、供試しや断器4の端子には
第1図V1の如き電圧が印加される。 Control gap 9 immediately before the final current zero point of the first power supply
A command is issued to the DC high voltage device HV1 in advance.
More charged capacitor 8 to reactor 1
0, the voltage source current is supplied to the test sample or disconnector 4 through the second auxiliary shield disconnector 7, and when the test sample or disconnector 4 succeeds in disconnecting, the terminal of the test sample or disconnector 4 is connected. A voltage as shown in FIG. 1 is applied.
電圧V1の初期部分発生後、第2の補助しや断
器7を開極時間のばらつきが少なく急速に開き、
流れていた比較的小さな電流を裁断する。その
後、制御ギヤツプ16にトリガーを与えて第3電
源である第2の直流高電圧電源HV2から、あら
かじめ充電されていたコンデンサ13から、リア
クトル14、抵抗15、制御ギヤツプ16を経由
してコンデンサ17を充電する。これにより第2
補助しや断器7の両端に第1図V2に示す如く、
V1に対して微小時間Δtだけ遅れた電圧が現われ
る。電圧V1、V2は加算されて第1図にVTRとし
て示す波高値が遅れてあらわれる4パラメータ再
起電圧が供試しや断器4に印加される。 After the initial portion of the voltage V 1 is generated, the second auxiliary disconnector 7 opens rapidly with little variation in opening time.
Cuts the relatively small current that was flowing. Thereafter, a trigger is given to the control gap 16 to supply the capacitor 17 from the second DC high voltage power supply HV2, which is the third power supply, from the previously charged capacitor 13 via the reactor 14, the resistor 15, and the control gap 16. Charge. This allows the second
As shown in FIG .
A voltage appears delayed by a minute time Δt with respect to V 1 . The voltages V 1 and V 2 are added, and a four-parameter re-electromotive voltage whose peak value, shown as VTR in FIG.
しかし、一般の短絡試験場では、開極時間のば
らつきが少なく、急速に開くしや断器は高価で、
入手困難であること、従来のワイルエ合成等価試
験回路に対して第3電源を追加することは試験場
の敷地面積や建設費、取扱い手数等の点で問題に
なることがあり、さらに簡単な回路の提案が強く
望まれていた。 However, in general short-circuit test sites, there is little variation in opening time, and rapid opening and disconnecting circuits are expensive.
It is difficult to obtain, and adding a third power supply to the conventional Weilhe synthetic equivalent test circuit may cause problems in terms of test site area, construction cost, handling time, etc. Suggestions were strongly requested.
本発明の目的は、簡単な回路構成により波高時
間の長いパラメータ再起電圧を発生しうるしや断
器の合成等価試験回路を提供するにある。 SUMMARY OF THE INVENTION An object of the present invention is to provide a synthetic equivalent test circuit for a circuit breaker that can generate a parameter restart voltage with a long peak time using a simple circuit configuration.
本発明は、第3電源の設置を省略するととも
に、再起電圧の初期部分発生後、再起電圧調整回
路を電圧源コンデンサから一旦切り離し、次に同
じ電圧源コンデンサの全部または一部に残留する
電荷を利用して、再び再起電圧を高められる様に
2組の再起電圧調整回路を設けたものである。 The present invention omits the installation of a third power supply, and after the initial portion of the restart voltage is generated, the restart voltage adjustment circuit is once disconnected from the voltage source capacitor, and then the electric charge remaining in all or part of the same voltage source capacitor is removed. Two sets of restart voltage adjustment circuits are provided so that the restart voltage can be raised again by utilizing the above.
第3図は本発明の実施例を示す回路図である。 FIG. 3 is a circuit diagram showing an embodiment of the present invention.
なお、本実施例においては第2図に示したと同
一部材であるものには同一符号を府すと共に、そ
の説明を省略する。 In this embodiment, the same members as shown in FIG. 2 are given the same reference numerals, and their explanations are omitted.
第2図に示した補助しや断器7の代りに制御ギ
ヤツプ18を置き、該制御ギヤツプ18とリアク
トル10の接続点と大地間に抵抗19、コンデン
サ20の直列回路を接続する。さらに供試しや断
器4と並列に、抵抗21、コンデンサ22,23
よりなる直列回路を接続すると共に、抵抗24お
よびコンデンサ25よりなる直列回路を接続す
る。また、コンデンサ8を8aと8に分割し、こ
の分割点とコンデンサ22と23の接続点との間
に制御ギヤツプ26、抵抗27よりなる直列回路
を挿入する。 A control gap 18 is placed in place of the auxiliary shunt breaker 7 shown in FIG. 2, and a series circuit of a resistor 19 and a capacitor 20 is connected between the connection point of the control gap 18 and the reactor 10 and the ground. Furthermore, a resistor 21 and capacitors 22 and 23 are connected in parallel with the test sample and disconnector 4.
A series circuit consisting of a resistor 24 and a capacitor 25 is also connected. Further, the capacitor 8 is divided into 8a and 8, and a series circuit consisting of a control gap 26 and a resistor 27 is inserted between the dividing point and the connection point of the capacitors 22 and 23.
以上の構成による本発明の実施例を第4図の動
作説明図に基づいて説明する。 An embodiment of the present invention having the above configuration will be described based on the operation diagram of FIG. 4.
供試しや断器4を通る電流源電流icの最終電流
零点t0の直前taで、わずかなしや断性能のある制
御ギヤツプ18を放電するとコンデンサ8a,8
bからリアクトル10を通して供試しや断器4へ
電圧電流ivを流す。わずかなしや断性能を有した
制御ギヤツプとしては、例えばSF6ガス中の制御
ギヤツプ、吹付ガス中の制御ギヤツプ等が利用で
きる。またコンデンサ8a,8bは図示を省略し
た直流高電圧発生装置から同極性に直列に充電さ
れたコンデンサである。この期間でコンデンサ8
bとリアクトル10の接続点の対地電圧Vcは第
4図の様に変化する。tb時点で供試しや断器4が
電圧源電流ivのしや断に成功して、制御ギヤツプ
18ではその電流をしや断できない場合には、コ
ンデンサ8a,8bの電荷はリアクトル10を通
して再起電圧調整用の抵抗19、再起電圧調整用
のコンデンサ20へ、またすでに閃絡している制
御ギヤツプ18を通して、再起電圧調整用の抵抗
21、再起電圧調整用のコンデンサ22,23、
同じ目的の抵抗24、コンデンサ25へ流入し、
供試しや断器4の端子には第4図の電圧V1が印
加される。再起電圧発生後、制御ギヤツプ18を
通る電流波形は第4図のtb〜tc間に点線で示す様
に振動周波数はta〜tb間に実線で示したivより高
く、その値はivより小さい。本発明ではtc時点で
制御ギヤツプ18を通る電流をしや断したいた
め、制御ギヤツプ18のしや断性能を考慮して抵
抗19、コンデンサ20の値を選定する。それに
より振動電流の一部を分流し、制御ギヤツプ18
を通る電流を調節する。コンデンサ22にくらべ
てコンデンサ23の静電容量を十分大きく選定し
ておけば、この時点のコンデンサ23から対地電
圧は微少であるから、時刻tc付近で制御ギヤツプ
26を放電させ、適当な抵抗27を通してコンデ
ンサ23を適当な時定数で充電することが可能で
ある。制御ギヤツプ26の放電はtcの前でも後で
もかまわない。制御ギヤツプ26の放電後、コン
デンサ23の対地電位は例えば第4図V2の様に
なる。コンデンサ25の静電容量を22くらべて
十分小さく、抵抗24を21にくらべて十分大に
選定しておけば、供試しや断器4の端子電圧は第
4図TRVとして示す如く、4パラメータ表示に
適した再起電圧にすることが可能である。 When the control gap 18, which has a slight disconnection or disconnection ability, is discharged at t a just before the final current zero point t 0 of the current source current i c passing through the test sample or disconnector 4, the capacitors 8a and 8
A voltage current i v is passed from b through the reactor 10 to the test sample and the disconnector 4. As a control gap with a slight breakage performance, for example, a control gap in SF 6 gas, a control gap in spray gas, etc. can be used. The capacitors 8a and 8b are capacitors that are charged in series with the same polarity from a DC high voltage generator (not shown). During this period, capacitor 8
The ground voltage Vc at the connection point between b and the reactor 10 changes as shown in FIG. If the test sample or disconnector 4 succeeds in cutting off the voltage source current i v at time t b , and the control gap 18 cannot cut off the current, the charges in the capacitors 8 a and 8 b are transferred through the reactor 10 . A resistor 19 for adjusting the restart voltage, a capacitor 20 for adjusting the restart voltage, and a resistor 21 for adjusting the restart voltage, capacitors 22, 23 for adjusting the restart voltage, and a resistor 21 for adjusting the restart voltage, capacitors 22, 23,
Flows into the resistor 24 and capacitor 25 for the same purpose,
A voltage V 1 as shown in FIG. 4 is applied to the terminals of the test sample and disconnector 4. After the re-electromotive voltage is generated, the current waveform passing through the control gap 18 has a vibration frequency as shown by the dotted line between t b and t c in Fig. 4, which is higher than iv shown by the solid line between t a and t b , is smaller than iv . In the present invention, since it is desired to cut off the current passing through the control gap 18 at time tc , the values of the resistor 19 and capacitor 20 are selected in consideration of the cutting performance of the control gap 18. Thereby, part of the oscillating current is shunted and the control gap 18
adjust the current passing through. If the capacitance of the capacitor 23 is selected to be sufficiently large compared to the capacitor 22, the voltage to ground from the capacitor 23 at this point is very small, so the control gap 26 is discharged around time tc , and an appropriate resistor 27 is selected. It is possible to charge the capacitor 23 with a suitable time constant. The control gap 26 may be discharged before or after t c . After the control gap 26 is discharged, the ground potential of the capacitor 23 becomes, for example, as shown in FIG. 4, V2 . If the capacitance of the capacitor 25 is selected to be sufficiently small compared to 22, and the resistor 24 is selected to be sufficiently large compared to 21, the terminal voltage of the test sample and disconnector 4 can be expressed in 4 parameters as shown as TRV in Figure 4. It is possible to set the restart voltage suitable for
第3図に示した実施例によれば、第2電源を有
効に利用することにより、第3電源を設けること
なく、簡単な構成の4パラメータ再起電圧発生回
路を提供することができる。 According to the embodiment shown in FIG. 3, by effectively utilizing the second power source, it is possible to provide a four-parameter restart voltage generating circuit with a simple configuration without providing a third power source.
第5図は本発明の第2の実施例を示す要部回路
図である。本実施例は第4図に示したTRVの如
き実際のしや断器で考える有限の時間範囲内にお
いては、上昇を続ける波形として観察され、最大
値を定めにくいという問題に対処するものであ
る。第5図に示く如く、コンデンサ8aの一部8
a1に抵抗28と放電制御ギヤツプ29を設けて、
第4図の波形TRVが要求値に達した時点tdで制
御ギヤツプ29を閃絡させる。これにより第4図
の時刻td以後は一点鎖線で図示す如くTRVを減
少させることが可能になる。これによりTRVの
波高値及び波高時間が明確になるという効果があ
る。 FIG. 5 is a main circuit diagram showing a second embodiment of the present invention. This embodiment deals with the problem that within a finite time range considered in an actual breaker such as the TRV shown in Fig. 4, a waveform that continues to rise is observed and it is difficult to determine the maximum value. . As shown in FIG. 5, a portion 8 of the capacitor 8a
A 1 is provided with a resistor 28 and a discharge control gap 29,
The control gap 29 is flashed at the time td when the waveform TRV shown in FIG. 4 reaches the required value. As a result, after time td in FIG. 4, it becomes possible to reduce TRV as shown by the dashed line. This has the effect of making the TRV peak value and peak time clear.
第6図は本発明の第3の実施例を示す要部回路
図である。本実施例は第3図に示した実施例の一
部を変更したものであり、第3図の実施例におけ
る制御ギヤツプ18の代りに、起電圧発生後にば
らつき少なく高速度に開くしや断器30を設ける
と共に、コンデンサ8bと直列に放電制御ギヤツ
プ31を設ける。また第3図で抵抗27を使用し
た位置にリアクトル32を設けるようにしたもの
である。この回路では、コンデンサ20が、最初
の状態ではギヤツプ31で切り離されているため
に電圧源電流初期部分のサージ性電流がなくな
り、測定や制御系への誘導等に悪影響がなくなる
という効果があり、また、第3図の抵抗27をリ
アクトル32に置換した効果としては、コンデン
サ23との振動現象により、供試しや断器に印加
する再起電圧に最大値が明確にあらわれるという
効果も有している。 FIG. 6 is a main circuit diagram showing a third embodiment of the present invention. This embodiment is a partial modification of the embodiment shown in FIG. 3, and instead of the control gap 18 in the embodiment shown in FIG. 30 is provided, and a discharge control gap 31 is also provided in series with the capacitor 8b. Further, a reactor 32 is provided at the position where the resistor 27 is used in FIG. 3. In this circuit, since the capacitor 20 is initially separated by the gap 31, there is no surge current in the initial part of the voltage source current, and there is an effect that there is no adverse effect on measurement, induction to the control system, etc. Furthermore, the effect of replacing the resistor 27 in Fig. 3 with the reactor 32 is that due to the vibration phenomenon with the capacitor 23, the maximum value clearly appears in the re-electromotive voltage applied to the test sample or disconnector. .
第7図は本発明の変形例を示す回路図であり、
第3図の抵抗24、コンデンサ25をのぞき、こ
れらの作用を点線図示の如く、回路の分布静電容
量のみに期待するとともに、放電制御ギヤツプ1
8の一方の電極を接地電位側に置いたものであ
る。すでに合成投入等価試験というものが実用さ
れ、それに用いるためにSF6ガス中に制御ギヤツ
プを置いた場合には、ある程度、しや断性能を有
することが知られている。この場合の制御ギヤツ
プの一端子は、接地電位に対し、低電位の電流源
電圧に耐えれば十分という構造になつていること
が多い。第7図では、前記投入用制御ギヤツプを
流入することができ、また、第3図の抵抗24や
コンデンサ25に相当するものを省略しているの
で、現有設備の状況によつては、経済的に試験回
路を構成できるという効果がある。 FIG. 7 is a circuit diagram showing a modification of the present invention,
Except for the resistor 24 and capacitor 25 in Fig. 3, these effects are expected only from the distributed capacitance of the circuit as shown by the dotted line, and the discharge control gap 1
One electrode of No. 8 is placed on the ground potential side. A synthetic injection equivalent test has already been put into practice, and it is known that when a control gap is placed in SF 6 gas for this purpose, it has some shearing performance. In this case, one terminal of the control gap is often constructed so that it is sufficient to withstand a current source voltage at a low potential with respect to ground potential. In FIG. 7, the input control gap can be inputted, and the components corresponding to the resistor 24 and capacitor 25 in FIG. 3 are omitted. This has the advantage that the test circuit can be configured in a number of ways.
第8図は本発明のさらに他の変形例を示す回路
図であり、電圧源コンデンサ8の全電圧を制御ギ
ヤツプ26放電後、コンデンサ23の充電に利用
するので、波高値の高い4パラメータ再起電圧を
発生し得るという効果がある。 FIG. 8 is a circuit diagram showing still another modification of the present invention, in which the entire voltage of the voltage source capacitor 8 is used to charge the capacitor 23 after discharging the control gap 26, so the four-parameter restart voltage with a high peak value This has the effect of causing
以上詳述したように、本発明では2組の再起電
圧回路を直列に使用し、しかも一方の静電容量を
他方にくらべて大きく選ぶことにより、同一の電
圧源から、電圧源電流と再起電圧初期部分および
4パラメータ再起電圧の波高値を経済的に与える
ことができる。 As described in detail above, in the present invention, two sets of re-EMF circuits are used in series, and the capacitance of one is selected to be larger than that of the other, so that the voltage source current and the re-EMF voltage are The peak values of the initial part and the four-parameter re-emf voltage can be provided economically.
以上より明らかな如く本発明によれば、小数の
電源を用いた構成によつて波高値の高いパラメー
タ再起電圧を発生することができる。 As is clear from the above, according to the present invention, a parameter restart voltage with a high peak value can be generated with a configuration using a small number of power supplies.
第1図は従来のしや断器の合成等価試験回路の
動作説明図、第2図は従来のしや断器の合成等価
試験回路図、第3図は本発明の第1の実施例を示
す回路図、第4図は本発明の動作説明図、第5図
は本発明の第2の実施例を示す要部回路図、第6
図は本発明の第3の実施例を示す要部回路図、第
7図は本発明の変形例を示す回路図、第8図は本
発明の他の変形例を示す回路図である。
1……交流電流、2……電流調整用リアクト
ル、3……補助しや断器、4……供試しや断器、
5,19,21,24,27,28……抵抗、
6,8,8a,8a1,8b,20,22,25…
…コンデンサ、10……電圧源リアクトル、1
8,26,29,31……制御ギヤツプ、30…
…しや断器、32……リアクトル。
Fig. 1 is an operational explanatory diagram of a conventional synthetic equivalent test circuit for a shredded breaker, Fig. 2 is a diagram of a conventional synthetic equivalent test circuit for a shredded breaker, and Fig. 3 shows the first embodiment of the present invention. FIG. 4 is an explanatory diagram of the operation of the present invention, FIG. 5 is a circuit diagram of a main part showing the second embodiment of the present invention, and FIG.
7 is a circuit diagram showing a modification of the invention, and FIG. 8 is a circuit diagram showing another modification of the invention. 1... Alternating current, 2... Reactor for current adjustment, 3... Auxiliary disconnector, 4... Test or disconnector,
5, 19, 21, 24, 27, 28...resistance,
6, 8, 8a, 8a 1 , 8b, 20, 22, 25...
... Capacitor, 10 ... Voltage source reactor, 1
8, 26, 29, 31...control gap, 30...
...Shiya disconnector, 32...Reactor.
Claims (1)
供試しや断器の他端子と大地間に設けられた補助
しや断器3と第1の電源1から構成された直列回
路であつて、前記供試しや断器に短絡大電流を供
給する電流源回路と、 前記供試しや断器の他端子と大地間に該他端子
側から順次設けられた第1の放電制御ギヤツプ1
8と第1のリアクトル10と複数の電圧源コンデ
ンサ8a,8bから構成された直列回路であつ
て、前記供試しや断器に電圧源電流を供給する電
圧源回路と、 前記第1の放電制御ギヤツプと前記第1のリア
クトルとの接続点と大地間に該接続点側から順次
設けられた第1の抵抗19と第1のコンデンサ2
0とから構成され、前記第1のリアクトルと前記
複数の電圧源コンデンサとともに閉回路を構成す
る第1の直列回路(第1の再起電圧調整回路)
と、 前記供試しや断器の他端子と大地間に該他端子
側から順次設けられた第2の抵抗21と第2、第
3のコンデンサ22,23とから構成され、該第
3のコンデンサの静電容量を該第2のコンデンサ
の静電容量よりも大きく選定した第2の直列回路
(第2の再起電圧調整回路)と、 前記電圧源回路の複数の電圧源コンデンサ間の
接続点と前記第2の直列回路の第2、第3のコン
デンサの接続点との間に設けられた第2の放電制
御ギヤツプ26と第3の抵抗27とから構成され
た第3の直列回路とを有することを特徴とするし
や断器の合成等価試験回路。 2 特許請求の範囲第1項において、第4の抵抗
28と第3の放電制御ギヤツプ29とから構成さ
れた直列回路を、前記複数の電圧源コンデンサの
一部8a′に並列に接続したことを特徴とするしや
断器の合成等価試験回路。 3 一端子を大地に接地した供試しや断器4と、
該供試しや断器の他端子と大地間に設けられた補
助しや断器3と第1の電源1から構成された直列
回路であつて、前記供試しや断器に短絡大電流を
供給する電流源回路と、前記供試しや断器の他端
子と大地間に設けられた第1の放電制御ギヤツプ
31と第1のリアクトル10と複数の電圧源コン
デンサ8a,8bから構成された直列回路であつ
て、前記供試しや断器に電圧源電流を供給する電
圧源回路を有するしや断器の合成等価試験回路に
おいて、 前記供試しや断器の他端子と前記電圧源回路の
非接地側端子との間に設けられた第3のしや断器
30と、 前記第3のしや断器と前記電圧源回路の非接地
側端子との接続点と大地間に該接続点側から順次
設けられた第1の抵抗19と第1のコンデンサ2
0とから構成され、前記第1の放電制御ギヤツプ
と前記第1のリアクトルと前記複数の電圧源コン
デンサとともに閉回路を構成する第1の直列回路
(第1の再起電圧調整回路)と、 前記供試しや断器の他端子と大地間に該他端子
側から順次設けられた第2の抵抗21と第2、第
3のコンデンサ22,23とから構成され、該第
3のコンデンサの静電気容量を該第2のコンデン
サの静電容量よりも大きく選定した第2の直列回
路(第2の再起電圧調整回路)と、 前記電圧源回路の複数の電圧源コンデンサ間の
接続点と前記第2の直列回路の第2、第3のコン
デンサの接続点との間に設けられた第2の放電制
御ギヤツプ26と第2のリアクトル32とから構
成された第3の直列回路とを有することを特徴と
するしや断器の合成等価試験回路。 4 一端子を大地に接地した供試しや断器4と、
該供試しや断器の他端子と大地間に設けられた補
助しや断器3と第1の電源1から構成された直列
回路であつて、前記供試しや断器に短絡大電流を
供給する電流源回路と、 前記供試しや断器の他端子と大地間に該他端子
側から順次設けられた複数の電圧源コンデンサ8
a,8bと第1のリアクトル10と第1の放電制
御ギヤツプ18とから構成された直列回路であつ
て、前記供試しや断器に電圧源電流を供給する電
圧源回路と、 前記第1の放電制御ギヤツプと前記第1のリア
クトルとの接続点と前記供試しや断器の他端子間
に設けられた第1の抵抗19と第1のコンデンサ
20とから構成され、前記第1のリアクトルと前
記複数の電圧源コンデンサとともに閉回路を構成
する第1の直列回路(第1の再起電圧調整回路)
と、 前記供試しや断器の他端子と大地間に設けられ
た第2の抵抗21と第2、第3のコンデンサ2
2,23とから構成され、該第3のコンデンサを
静電容量を該第2のコンデンサの静電容量よりも
大きく選定するとともに、該第3のコンデンサの
一方の端子を前記供試しや断器の他端子に接続し
た第2の直列回路(第2の再起電圧調整回路)
と、 前記電圧源回路の複数の電圧源コンデンサ間の
接続点と前記第2の直列回路の第2、第3のコン
デンサの接続点との間に設けられた第2の放電制
御ギヤツプ26と第3の抵抗27とから構成され
た第3の直列回路とを有することを特徴とするし
や断器の合成等価試験回路。[Claims] 1. A test sample or disconnector 4 whose terminal is grounded to the earth, an auxiliary shield or disconnector 3 provided between the other terminal of the test sample or disconnector and the earth, and a first power source 1. It is a series circuit consisting of a current source circuit that supplies a short-circuit large current to the test sample or disconnector, and a current source circuit that is sequentially provided between the other terminal of the test sample or disconnector and the ground from the other terminal side. 1 discharge control gap 1
8, a first reactor 10, and a plurality of voltage source capacitors 8a and 8b, the voltage source circuit supplies a voltage source current to the sample under test and the disconnector; and the first discharge control circuit. A first resistor 19 and a first capacitor 2 are provided between the connection point between the gap and the first reactor and the ground in order from the connection point side.
0, and constitutes a closed circuit together with the first reactor and the plurality of voltage source capacitors (first re-electromotive voltage adjustment circuit).
and a second resistor 21 and second and third capacitors 22 and 23 provided between the other terminal of the test sample or disconnector and the ground in order from the other terminal side, and the third capacitor a second series circuit (second restart voltage adjustment circuit) whose capacitance is selected to be larger than the capacitance of the second capacitor; and a connection point between the plurality of voltage source capacitors of the voltage source circuit; and a third series circuit including a second discharge control gap 26 and a third resistor 27 provided between the connection point of the second and third capacitors of the second series circuit. A synthetic equivalent test circuit for a shiya breaker characterized by the following. 2. Claim 1 provides that a series circuit composed of a fourth resistor 28 and a third discharge control gap 29 is connected in parallel to a portion 8a' of the plurality of voltage source capacitors. This is a synthetic equivalent test circuit for shiya circuit breakers. 3 A test sample or disconnector 4 with one terminal grounded to the earth,
A series circuit consisting of an auxiliary disconnector 3 installed between the other terminal of the test sample or disconnector and the ground, and a first power supply 1, which supplies a short circuit large current to the test sample or disconnector. A series circuit consisting of a current source circuit, a first discharge control gap 31, a first reactor 10, and a plurality of voltage source capacitors 8a and 8b, which are provided between the other terminals of the sample or disconnector and the ground. In a composite equivalent test circuit for a shield circuit breaker having a voltage source circuit that supplies a voltage source current to the specimen or disconnector, the other terminal of the specimen or disconnector is ungrounded from the voltage source circuit. a third cable breaker 30 provided between the third cable breaker 30 and the non-ground terminal of the voltage source circuit, and a connection point between the third cable breaker and the non-ground terminal of the voltage source circuit and the ground from the connection point side. A first resistor 19 and a first capacitor 2 provided in sequence
0, and constitutes a closed circuit together with the first discharge control gap, the first reactor, and the plurality of voltage source capacitors (first re-EMF adjustment circuit); It is composed of a second resistor 21 and second and third capacitors 22 and 23, which are sequentially provided between the other terminal of the trial disconnector and the ground, from the other terminal side, and the electrostatic capacitance of the third capacitor is a second series circuit (second re-electromotive voltage adjustment circuit) selected to be larger than the capacitance of the second capacitor; and a connection point between the plurality of voltage source capacitors of the voltage source circuit and the second series circuit. It is characterized by having a third series circuit composed of a second discharge control gap 26 and a second reactor 32 provided between the connection point of the second and third capacitors of the circuit. Synthetic equivalent test circuit for breaker. 4 A test sample or disconnector 4 with one terminal grounded to the earth,
A series circuit consisting of an auxiliary disconnector 3 installed between the other terminal of the test sample or disconnector and the ground, and a first power supply 1, which supplies a short circuit large current to the test sample or disconnector. a current source circuit, and a plurality of voltage source capacitors 8 sequentially provided between the other terminal of the test sample or disconnector and the ground from the other terminal side.
a, 8b, a first reactor 10, and a first discharge control gap 18; It is composed of a first resistor 19 and a first capacitor 20, which are provided between a connection point between the discharge control gap and the first reactor and the other terminal of the test sample or disconnector, and a first series circuit (first re-electromotive voltage adjustment circuit) constituting a closed circuit together with the plurality of voltage source capacitors;
and a second resistor 21 and second and third capacitors 2 provided between the other terminal of the test sample or disconnector and the ground.
2 and 23, the capacitance of the third capacitor is selected to be larger than the capacitance of the second capacitor, and one terminal of the third capacitor is connected to the test sample or disconnector. Second series circuit connected to other terminal (second restart voltage adjustment circuit)
and a second discharge control gap 26 provided between the connection point between the plurality of voltage source capacitors of the voltage source circuit and the connection point of the second and third capacitors of the second series circuit. 3. A composite equivalent test circuit for a shield breaker, characterized in that it has a third series circuit composed of a resistor 27 of 3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56146154A JPS5848876A (en) | 1981-09-18 | 1981-09-18 | Composition and equalization testing circuit for breaker |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56146154A JPS5848876A (en) | 1981-09-18 | 1981-09-18 | Composition and equalization testing circuit for breaker |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5848876A JPS5848876A (en) | 1983-03-22 |
| JPH0480351B2 true JPH0480351B2 (en) | 1992-12-18 |
Family
ID=15401347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56146154A Granted JPS5848876A (en) | 1981-09-18 | 1981-09-18 | Composition and equalization testing circuit for breaker |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5848876A (en) |
-
1981
- 1981-09-18 JP JP56146154A patent/JPS5848876A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5848876A (en) | 1983-03-22 |
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