JPH0480723B2 - - Google Patents
Info
- Publication number
- JPH0480723B2 JPH0480723B2 JP61173783A JP17378386A JPH0480723B2 JP H0480723 B2 JPH0480723 B2 JP H0480723B2 JP 61173783 A JP61173783 A JP 61173783A JP 17378386 A JP17378386 A JP 17378386A JP H0480723 B2 JPH0480723 B2 JP H0480723B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- magnetic field
- discharge
- power source
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000007789 gas Substances 0.000 claims description 71
- 239000002912 waste gas Substances 0.000 claims description 30
- 238000011282 treatment Methods 0.000 claims description 26
- 238000012545 processing Methods 0.000 claims description 14
- 230000005684 electric field Effects 0.000 claims description 6
- 230000004907 flux Effects 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims description 2
- 238000000926 separation method Methods 0.000 claims description 2
- 239000011343 solid material Substances 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 10
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 8
- 229910000077 silane Inorganic materials 0.000 description 8
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 229920001296 polysiloxane Polymers 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 150000002431 hydrogen Chemical class 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 238000001020 plasma etching Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 239000012265 solid product Substances 0.000 description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 3
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- UORVGPXVDQYIDP-UHFFFAOYSA-N borane Chemical compound B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 229910052810 boron oxide Inorganic materials 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 2
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229910001392 phosphorus oxide Inorganic materials 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- VSAISIQCTGDGPU-UHFFFAOYSA-N tetraphosphorus hexaoxide Chemical compound O1P(O2)OP3OP1OP2O3 VSAISIQCTGDGPU-UHFFFAOYSA-N 0.000 description 2
- 231100000167 toxic agent Toxicity 0.000 description 2
- 239000003440 toxic substance Substances 0.000 description 2
- 229910001868 water Inorganic materials 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920006266 Vinyl film Polymers 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910000085 borane Inorganic materials 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- 238000012993 chemical processing Methods 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001784 detoxification Methods 0.000 description 1
- 206010012601 diabetes mellitus Diseases 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Treating Waste Gases (AREA)
Description
【発明の詳細な説明】
〔3−1 産業上の利用分野〕
本発明は廃ガス処理装置に関する。更に詳しく
は、本発明は半導体産業などで用いられるプラズ
マプロセシング例えばプラズマエツチング若しく
は化学気相成長法−CVD(Chemical Vapor
Deposition)法−において未処理のまま大気中に
放出すれば何等かの公害を生ずる可能性を持つ気
体または蒸気を無害化処理するため該気体又は蒸
気にプラズマ放電を行なう放電管を含む廃ガス処
理装置に関する。本発明に用いる放電管は約10-7
mmHgから約10mmHgまでの広い圧力範囲で作動し
上記無害化処理を高率良く達成することができ
る。DETAILED DESCRIPTION OF THE INVENTION [3-1 Field of Industrial Application] The present invention relates to a waste gas treatment device. More specifically, the present invention applies to plasma processing used in the semiconductor industry, such as plasma etching or chemical vapor deposition (CVD).
Waste gas treatment including discharge tubes that perform plasma discharge on gases or vapors in order to detoxify gases or vapors that may cause some kind of pollution if released untreated into the atmosphere in the Deposition method. Regarding equipment. The discharge tube used in the present invention is approximately 10 -7
It operates in a wide pressure range from mmHg to about 10 mmHg and can achieve the above detoxification treatment with high efficiency.
〔3−2 従来の技術〕
たとえば、アモルフアスシリコン太陽電池の製
造の場合、原料であるシラン又はジシランはその
まま又は適当なガスで希釈され反応槽の中でプラ
ズマCVD法により分解されてアモルフアスシリ
コンの薄膜となる。この際、未反応の原料ガスは
分解生成物の水素と共にポンプにより大気中に排
出される。プラズマCVDを開始する直前や終了
の直後では反応の調整や製品の一様性を確保する
ため、原料ガスが其のまま反応を行なうことなく
排出される事がある。またpn接合を作る為にフ
オスフイン又はジボランを前記原料ガスに混合す
ることがある。これらのガスはいずれも毒性を有
するため、ポンプからの排出ガスは従来化学的方
法で処理されていた。[3-2 Prior Art] For example, in the case of manufacturing amorphous silicon solar cells, the raw material silane or disilane is used as it is or diluted with an appropriate gas and decomposed by plasma CVD in a reaction tank to produce amorphous silicon. It becomes a thin film. At this time, the unreacted raw material gas is discharged into the atmosphere by a pump together with the decomposition product hydrogen. Immediately before plasma CVD starts or ends, raw material gas may be discharged without undergoing any reaction in order to adjust the reaction and ensure product uniformity. In addition, phosphine or diborane may be mixed with the raw material gas to form a pn junction. Since all of these gases are toxic, the exhaust gases from pumps have traditionally been treated using chemical methods.
化学的処理の他に電気的処理方法及び処理装置
も提案されている。たとえば、特開昭第51−
129868号には有毒物質を含有する廃ガス及び酸化
剤をプラズマが発生している空間で相互に接触せ
しめることにより前記有毒物質を安定な化合物に
変え、この化合物を前記廃ガスから除去すること
を特徴とする廃ガスの処理方法が開示されてい
る。また、特開昭第58−6231号には反応性の廃ガ
スを排出する反応槽と排出装置との間に配置さ
れ、前記反応性の廃ガスをプラズマ放電により分
解して前記排出装置により排出するようにしたこ
とを特徴とする廃ガス処理装置が提案されてい
る。 In addition to chemical treatments, electrical treatment methods and treatment devices have also been proposed. For example, JP-A No. 51-
No. 129868 discloses that by bringing a waste gas containing a toxic substance and an oxidizing agent into contact with each other in a space where plasma is generated, the toxic substance is converted into a stable compound, and this compound is removed from the waste gas. Disclosed is a method for treating characteristic waste gas. Furthermore, in Japanese Patent Application Laid-open No. 58-6231, a device is disposed between a reaction tank for discharging reactive waste gas and a discharge device, and the reactive waste gas is decomposed by plasma discharge and discharged by the discharge device. A waste gas treatment device has been proposed that is characterized by:
〔3−3 発明が解決しようとする問題点〕
化学的処理方法では、処理設備の方が製造設備
より大規模になる場合があり、更にプラズマ
CVDやプラズマエツチングなどの装置毎に処理
設備が必要になる場合もあり、小型簡便でしかも
有効な処理法が望まれている。一方、従来の電気
的処理方法についても、プラズマの反応槽に用い
たのと同じ電源を使用したのでは極めて高価なも
のとなつてしまう。一方、安価な直流や交流を用
いたのでは、10-2mmHg以下の気圧では全く放電
せず、電気的に廃ガス処理装置を行なう事は出来
ない。[3-3 Problems to be solved by the invention] In chemical processing methods, the processing equipment may be larger than the manufacturing equipment, and the plasma
Processing equipment may be required for each device such as CVD or plasma etching, so a small, simple, and effective processing method is desired. On the other hand, the conventional electrical processing method becomes extremely expensive if the same power source used for the plasma reaction tank is used. On the other hand, if cheap direct current or alternating current is used, there will be no discharge at all at pressures below 10 -2 mmHg, making it impossible to operate the waste gas treatment device electrically.
〔3−4 問題点を解決する手段及び作用〕
本発明者は電気的廃ガス処理方法の欠点を克服
するため鋭意研究した結果、放電管中電界と磁界
が約45゜乃至約135゜の角度で交わるように磁界印
加装置を設け電界と磁界の交わる空間に廃ガスを
流通させると微量濃度の廃ガスでもプラズマ反応
が効率良く進行し極めて効率良い廃ガス処理が可
能であることを知見した。この新規な知見に基づ
き本発明は成されたものである。[3-4 Means and operation for solving the problems] As a result of intensive research to overcome the drawbacks of electrical waste gas treatment methods, the present inventor found that the electric field and magnetic field in the discharge tube are at an angle of about 45° to about 135°. We have found that if a magnetic field application device is installed so that the electric and magnetic fields intersect, and the waste gas is passed through a space where the electric and magnetic fields intersect, the plasma reaction will proceed efficiently even at a trace concentration of waste gas, and extremely efficient waste gas treatment will be possible. The present invention has been made based on this new knowledge.
即ち、本発明によれば、ガス導入口とガス導出
口を有する管状容器内に少なくとも一対の電極を
設け、該ガス導入口と該ガス導出口はガス流通空
間により連結されている放電管及び該電極と接続
される直流又は交流電源を含む廃ガス処理装置に
おいて、該ガス導入口より流入したガスをプラズ
マ化させるため該ガス流通空間で該電極により形
成される電界の向きと約45゜乃至約135゜の角度で
交わる直流又は交流の磁界を印加する磁界印加装
置を該放電管に装着させ且つ該放電管容器の磁力
線と交わる器壁の少なくとも表面が絶縁物で構成
されていることを特徴とする廃ガス処理装置が提
供される。 That is, according to the present invention, at least one pair of electrodes is provided in a tubular container having a gas inlet and a gas outlet, and the gas inlet and the gas outlet are connected to the discharge tube and the gas outlet through a gas circulation space. In a waste gas treatment device that includes a DC or AC power supply connected to an electrode, the direction of the electric field formed by the electrode in the gas flow space is about 45° to about A magnetic field applying device for applying direct current or alternating current magnetic fields that intersect at an angle of 135° is attached to the discharge tube, and at least the surface of the vessel wall that intersects with the magnetic field lines of the discharge tube container is made of an insulator. A waste gas treatment device is provided.
本廃ガス処理装置の主要部を構成する放電管の
基本的構造の一例を第1図に示す。プラズマプロ
セシングたとえばプラズマエツチング若しくは
CVD法において未処理のまま大気中に放出すれ
ば何等かの公害を生ずる可能性を持つ気体または
蒸気、たとえばシラン系ガス(シラン、ジシラ
ン、トリシランなど)、ボラン系ガス(ジボラン
など)、ホスフイン系ガス、彎化シリコーン及び
その誘導体または有機金属など半導体デバイス製
造の際排出される気体又は蒸気はガス導入口4を
通じて放電管内に導入される。導入された気体又
は蒸気はガス流通空間10に至る。ガス流通空間
10では直流又は交流電源に接続された少なくと
も一対の電極1,2により形成さる電界の向きと
約45゜乃至約135゜の角度で交わる直流又は交流の
磁界6を印加する。この電界と磁界の交叉する空
間内に上記気体又は蒸気が導入されると放電が生
ずる。この放電は約10-7mmHgから約10mmHgまで
の広い圧力範囲で生じる。この放電により上記の
気体又は蒸気はプラズマ化され次の反応が行なわ
れる。シランはシリコーンと水素に、ジボランは
ホウ素と水素に、酸素共存下では、酸化ボロンと
水素に、ホスフインは酸素共存下で酸化燐と水
に、弗化シリコーンは下でシリコーンと弗化カル
シユームに、有機金属は酸素共存下で水と炭酸ガ
スと金属酸化物に変化する。発生した水素、水蒸
気、炭酸ガスなどは安全な気体又は蒸気としてガ
ス導出口5より排出される。シリコーン、ホウ
素、酸化ボロン、チツ化ボロン、酸化燐などの固
体生成物は放電管内、特に電極近辺若しくは内壁
に堆積する。気圧が低いときには陰極の両脇の器
壁3の内部上に堆積するが、気圧が高くて陽極の
外側にグローが出来るときには、そのグローの近
くの器壁にも堆積するようになる。又、ガスの流
量を増やすと、プラズマ領域より見てガス流の上
流側よりも下流側の方に遥かに多くの堆積が認め
られる。即ちプラズマ内で生じたラジカルが気流
の影響を受けて下流に運ばれて堆積している事を
示している。堆積した固体生成物は通常、公知の
手段を用いて管外に取り出すことができる。例え
ば、電極表面はアルミニユーム箔などの金属箔で
被覆しその他の部分を絶縁性フイルムで被覆して
おき、これらを適宜交換するのが最も容易な方法
である。また、放電管を容易に分解可能な構造と
しておき適当な時間毎に分解清掃することも可能
である。さらに放電管外壁及び電極に機械的振動
を付与し、固体生成物を下方に落下させ放電近辺
空間外に集積除去することもできる。管内の清掃
を容易にするため内壁表面をビニル系フイルムで
被覆しそのフイルムを適宜交換することもでき
る。上述の方法により未だ処理のまま大気中に放
出すれば何等かの公害を生ずる可能性を持つ気体
又は蒸気の無害化が達成される。 FIG. 1 shows an example of the basic structure of a discharge tube that constitutes the main part of this waste gas treatment device. Plasma processing such as plasma etching or
Gases or vapors that may cause some kind of pollution if released into the atmosphere untreated in the CVD method, such as silane gases (silane, disilane, trisilane, etc.), borane gases (diborane, etc.), phosphine gases Gases or vapors such as diabetic silicone and its derivatives or organic metals, which are discharged during the manufacture of semiconductor devices, are introduced into the discharge tube through the gas inlet 4. The introduced gas or vapor reaches the gas circulation space 10. In the gas flow space 10, a direct current or alternating current magnetic field 6 is applied which intersects the direction of the electric field formed by at least one pair of electrodes 1 and 2 connected to a direct current or alternating current power source at an angle of about 45 degrees to about 135 degrees. When the gas or vapor is introduced into the space where the electric and magnetic fields intersect, a discharge occurs. This discharge occurs over a wide pressure range from about 10 -7 mmHg to about 10 mmHg. Due to this discharge, the above gas or vapor is turned into plasma, and the next reaction takes place. Silane turns into silicone and hydrogen, diborane turns into boron and hydrogen, in the presence of oxygen it turns into boron oxide and hydrogen, phosphine turns into phosphorus oxide and water in the presence of oxygen, silicone fluoride turns into silicone and calcium fluoride, Organometallics change into water, carbon dioxide, and metal oxides in the presence of oxygen. Generated hydrogen, water vapor, carbon dioxide gas, etc. are discharged from the gas outlet 5 as safe gas or steam. Solid products such as silicone, boron, boron oxide, boron nitride, and phosphorus oxide are deposited within the discharge tube, particularly near the electrodes or on the inner walls. When the atmospheric pressure is low, it is deposited on the inside of the vessel wall 3 on both sides of the cathode, but when the atmospheric pressure is high and a glow is formed on the outside of the anode, it is also deposited on the vessel wall near the glow. Also, when the gas flow rate is increased, much more deposition is observed on the downstream side of the gas flow than on the upstream side of the plasma region. This indicates that radicals generated within the plasma are carried downstream and deposited under the influence of air currents. The deposited solid product can usually be removed from the tube using known means. For example, the easiest method is to cover the electrode surface with a metal foil such as aluminum foil and cover the other parts with an insulating film, and replace these as appropriate. It is also possible to construct the discharge tube so that it can be easily disassembled and to disassemble and clean it at appropriate intervals. Furthermore, it is also possible to apply mechanical vibration to the outer wall of the discharge tube and the electrodes to cause the solid products to fall downward and collect and remove them outside the space near the discharge. In order to facilitate cleaning inside the pipe, the inner wall surface may be covered with a vinyl film and the film may be replaced as appropriate. By the above-described method, gases or vapors which may cause some pollution if released into the atmosphere while still being treated are rendered harmless.
本発明で用いる管状容器は通常の放電管にみら
れる円筒状である必要は無く、任意形状の断面、
例えば三角形若しくは矩形断面の容器も用いるこ
とができる。電界の大きさは放電開始するもので
あればよい。この値は処理されるべきガスの種
類、ガスの圧力、電極間隔などで広範囲に変わ
る。プラズマを発生するに必要な大きさでありさ
えすればよい。好ましい電界の大きさを得るため
の電極間電位は通常、約10V以上である。直流電
源、単相交流電源、多相交流電源のいずれも用い
ることができるプラズマ反応を連続的に行なう見
地から、即ち未処理のままでガスが排出される可
能性を回避する見地から直流電源若しくは多相交
流電源を用いることが好ましい。電極の間隔は臨
界的でないが、磁束密度Bで次式より決まる電子
の旋回半径rよりも大きい値であることが一般的
に好ましい。 The tubular container used in the present invention does not need to be cylindrical as seen in ordinary discharge tubes, but can have an arbitrary cross section,
For example, containers of triangular or rectangular cross section can also be used. The electric field may be of any magnitude as long as it starts a discharge. This value varies widely depending on the type of gas to be treated, gas pressure, electrode spacing, etc. It only needs to be large enough to generate plasma. The potential between the electrodes to obtain the preferred electric field magnitude is typically about 10V or higher. Any DC power source, single-phase AC power source, or multi-phase AC power source can be used.From the standpoint of performing a plasma reaction continuously, that is, from the standpoint of avoiding the possibility of gas being discharged untreated, a DC power source or a multi-phase AC power source can be used. Preferably, a polyphase AC power source is used. Although the spacing between the electrodes is not critical, it is generally preferable that the spacing between the electrodes be larger than the radius of gyration r of electrons determined by the following equation using the magnetic flux density B.
但しV:電子の磁界に垂直な運動エネルギー
(電子ボルト)
m:電子の重量
e:電子の荷電
必要な磁界の大きさは電極間隔、印加電圧で変
わる。磁束密度Bは次式を満足するものであれば
良い。 However, V: kinetic energy of the electron perpendicular to the magnetic field (electron volt) m: weight of the electron e: charge of the electron The magnitude of the required magnetic field varies depending on the electrode spacing and applied voltage. The magnetic flux density B may be one that satisfies the following formula.
但しd:電極間隔 V,m,e:上述の通りとする。 However, d: electrode spacing V, m, e: as described above.
磁界の大きさは一般的には数ガウス以上である
ことが好ましく、実用上約100乃至約500ガウスの
範囲に有ることが更に好ましい。磁界印加装置は
電磁石でも永久磁石でも良い。直流磁界印加装
置、単相交流磁界印加装置、多相交流磁界印加装
置のいずれも用いることができるが、プラズマ反
応を連続的に行なう見地から、即ち、未処理のま
までガスが排出される可能性を回避する見地から
直流磁界印加装置若しくは多相交流磁界印加装置
を用いることが好ましい。本発明においては、放
電管の器壁の磁力線と交わる部分の少なくとも表
面は絶縁物で構成されている。器壁の磁力線と交
わる部分が導電性であれば電子の損失が増加する
ため廃ガス処理の能率が低下する。本発明におい
ては、放電管の器壁を導電性物質で構成し電極を
兼ねさせ磁力線と交わる部分は絶縁性フイルムで
被覆することも好ましい実施態様一つでである。
また、放電を安定化させ及び/又はガスのプラズ
マ化に伴い生成する固体物質の分離を容易にする
ガス、例えば酸素若しくはチツ素、を処理すべき
ガスに共存させることができる。このためには、
放電管に付加的なガス導入口を設けることが好ま
しい。 The magnitude of the magnetic field is generally preferably several Gauss or more, and more preferably in the practical range of about 100 to about 500 Gauss. The magnetic field applying device may be an electromagnet or a permanent magnet. Any of a DC magnetic field application device, a single-phase AC magnetic field application device, and a multi-phase AC magnetic field application device can be used, but from the standpoint of performing a plasma reaction continuously, in other words, it is possible for gas to be discharged untreated. It is preferable to use a direct current magnetic field applying device or a multiphase alternating current magnetic field applying device from the viewpoint of avoiding problems. In the present invention, at least the surface of the portion of the wall of the discharge tube that intersects with the lines of magnetic force is made of an insulator. If the part of the vessel wall that intersects with the magnetic field lines is conductive, the loss of electrons will increase and the efficiency of waste gas treatment will decrease. In one preferred embodiment of the present invention, the wall of the discharge tube is made of a conductive material and also serves as an electrode, and the portion that intersects with the lines of magnetic force is covered with an insulating film.
Further, a gas to be treated can be made to coexist with a gas to be treated, such as oxygen or nitrogen, which stabilizes the discharge and/or facilitates the separation of solid substances generated as the gas becomes plasma. For this purpose,
Preferably, the discharge vessel is provided with an additional gas inlet.
プラズマは放電によつて電離した状態を云う
が、プラズマの温度はガス圧、ガスの種類などに
よつて変わる。プラズマエネルギーは1eVから
10eVくらいの範囲にある。ガス導入口より導入
された気体又は蒸気が交叉する電界と磁界の作用
を受けてプラズマ反応を行なう時間はガスの流量
及び放電電力で変わる。即ち、放電電力を多くす
ればこの時間は少なくてすみ、放電電力を一定に
して流量を増すとこの時間を長くする必要があ
る。流量と放電電流の関係は第5図に示す。上記
時間は一般的には約0.01秒から約5分の範囲にあ
る。プラズマの気体密度は第5図に実例が示され
ている。これは装置の寸法によつて異なる。一般
に放電では比例則なるものがあり、気体圧pと電
極間距離dとの積pdが一定なれば放電の状態は
似てくる。従つてpを小さくするとdを大きくす
ればよい。 Plasma is a state of ionization caused by electrical discharge, and the temperature of plasma varies depending on the gas pressure, type of gas, etc. Plasma energy starts from 1eV
It is in the range of about 10eV. The time during which the gas or vapor introduced through the gas inlet undergoes a plasma reaction under the action of the intersecting electric and magnetic fields varies depending on the gas flow rate and discharge power. That is, if the discharge power is increased, this time can be shortened, and if the discharge power is kept constant and the flow rate is increased, this time needs to be lengthened. The relationship between flow rate and discharge current is shown in FIG. The time period typically ranges from about 0.01 seconds to about 5 minutes. An example of the gas density of plasma is shown in FIG. This depends on the size of the device. In general, there is a proportionality law in discharge, and if the product pd of gas pressure p and inter-electrode distance d is constant, the discharge state will be similar. Therefore, if p is made smaller, d can be made larger.
本廃ガス処理装置の使用法は多様である。その
具体例の一を第3図に示す。本廃ガス処理装置1
2,13はプラズマプロセシング(プラズマ
CVD若しくはプラズマエツチング)の反応槽1
1と排気ポンプ14の間に設置される。処理装置
の清掃を容易にするため切り替えバルブ16,1
7、また放電を安定化させ及び/又はガスのプラ
ズマ化により生成する固体物質の分割を容易にす
るガスを供給するボンベ15を配置することがで
きる。 The usage of this waste gas treatment device is diverse. One specific example is shown in FIG. This waste gas treatment equipment 1
2 and 13 are plasma processing (plasma
CVD or plasma etching) reaction tank 1
1 and the exhaust pump 14. A switching valve 16,1 is provided to facilitate cleaning of the processing equipment.
7. It is also possible to arrange a cylinder 15 for supplying a gas that stabilizes the discharge and/or facilitates the splitting of the solid material produced by turning the gas into plasma.
プラズマ反応が確実に行なわれるようにするた
め、本発明に用いる放電管は対向する電極の間に
ガスの導入口をもつてくるか、ガス輸送又は排出
管の外壁を一つの電極とし、その中にもう一極を
設けることでガスの流路が必ず対向する電極間を
通過する構造とするか、電極でない外壁と電極の
最外側との距離が1平均自由行程以下となるよう
な構造をもつように設計することが好ましい。本
廃ガス処理装置において必要な磁界を発生する方
法と電極の形状の具体例を第6図〜第10図に示
す。図中7は永久磁石、8は電磁石、9は絶縁性
フイルムを示す。絶縁性フイルムに固体生成物を
付着させこれを交換することにより放電管の清掃
を迅速に行なうことができる。放電に交流を用い
る場合には、第10図に例示するように、3相交
流を使用して、処理装置内で電流が零の時刻が全
く出来ないようにすることによつて処理が不十分
のガスを放出することが防止される。 In order to ensure that the plasma reaction takes place, the discharge tube used in the present invention has a gas inlet between opposing electrodes, or the outer wall of the gas transport or discharge tube is one electrode, and the inside Either provide a structure in which the gas flow path always passes between opposing electrodes by providing another pole, or have a structure in which the distance between the outer wall that is not an electrode and the outermost part of the electrode is one mean free path or less. It is preferable to design it as follows. Specific examples of the method of generating the necessary magnetic field and the shape of the electrodes in this waste gas treatment apparatus are shown in FIGS. 6 to 10. In the figure, 7 is a permanent magnet, 8 is an electromagnet, and 9 is an insulating film. The discharge tube can be quickly cleaned by depositing solid products on the insulating film and replacing it. When using alternating current for discharge, as illustrated in Figure 10, three-phase alternating current is used to ensure that there is no time when the current is zero in the processing equipment, thereby preventing insufficient processing. The release of gas is prevented.
〔3−5 発明の効果〕
本発明によれば小型簡便でしかも効率の良い経
済的な廃ガス処理装置が提供される。本発明で用
いる放電管は10-2mmHg以下の低気圧でも放電し
廃ガスのプラズマ化反応を励起することができ
る。従つて、本発明の廃ガス処理装置は微量濃度
の廃ガスも極めて効率良く無害化させることがで
きる。[3-5 Effects of the Invention] According to the present invention, a small, simple, efficient, and economical waste gas treatment device is provided. The discharge tube used in the present invention can discharge even at low pressures of 10 -2 mmHg or less and can stimulate the plasma reaction of waste gas. Therefore, the waste gas treatment apparatus of the present invention can render even trace amounts of waste gas harmless extremely efficiently.
〔3−6 実施例〕
第2図の放電管を用いて480ガウスの磁界を印
加して放電させたときの電圧・電流特性を第4図
に示す。シランガスの流量が十分に少ないときで
も放電することが確認された。この時、磁界を取
り去れば放電を維持することは出来ない。処理す
べきガスの流量と所要電流との関係は第5図の様
になる。シランガスのプラズマ処理により電極近
辺及び器壁内壁にアモルフアスシリコンが堆積す
るのが観祭された。尚、本処理が完全に行なわれ
ることの確認は、分光器(ニコンG−500)によ
るシランスペクトルの観測、ならびに放電特性の
変化点の測定および空気中に放出したガスから酸
化シリコンの白粉がもはや生じないかどうかによ
り行なつた。[3-6 Example] FIG. 4 shows the voltage/current characteristics when a magnetic field of 480 Gauss is applied to cause a discharge using the discharge tube shown in FIG. 2. It was confirmed that discharge occurred even when the flow rate of silane gas was sufficiently low. At this time, if the magnetic field is removed, the discharge cannot be maintained. The relationship between the flow rate of the gas to be treated and the required current is as shown in FIG. It was observed that amorphous silicon was deposited near the electrodes and on the inner wall of the vessel due to silane gas plasma treatment. In addition, confirmation that this treatment is complete can be made by observing the silane spectrum with a spectrometer (Nikon G-500), measuring the change point of the discharge characteristics, and checking whether the white powder of silicon oxide is no longer present in the gas released into the air. I decided to do it depending on whether or not it occurred.
第1図は本廃ガス処理装置に用いる放電管の基
本構造を示す斜視図、第2図は本発明の有効性を
試験したときの放電管の構造と寸法とを示す。第
3図は本発明の廃ガス処理装置の使用方法を示
す。第4図はチツ素とシランとの放電特性を示
す。第5図は処理量と所要電流との関係を示す。
第6図〜第10図は本廃ガス処理装置の具体例を
示す。第10図は放電に3相交流を用いる場合の
結線の方法を示す。各図において参照番号は次の
ものを表わしている。
1,2:電極、3:放電管器壁、4:ガス導入
口、5:ガス導出口、6:磁力線、7:永久磁
石、8:電磁石、9:絶縁性フイルム、10:ガ
ス流通空間、11:プラズマプロセシング反応
槽、12,13:本廃ガス処理装置、14:排気
ポンプ、15:ガス供給ボンベ、16,17:切
り替えバルブ。
FIG. 1 is a perspective view showing the basic structure of a discharge tube used in this waste gas treatment apparatus, and FIG. 2 shows the structure and dimensions of the discharge tube used when testing the effectiveness of the present invention. FIG. 3 shows a method of using the waste gas treatment apparatus of the present invention. FIG. 4 shows the discharge characteristics of nitrogen and silane. FIG. 5 shows the relationship between throughput and required current.
FIGS. 6 to 10 show specific examples of this waste gas treatment apparatus. FIG. 10 shows a wiring method when three-phase alternating current is used for discharge. In each figure, reference numbers represent the following: 1, 2: electrode, 3: discharge tube wall, 4: gas inlet, 5: gas outlet, 6: magnetic field lines, 7: permanent magnet, 8: electromagnet, 9: insulating film, 10: gas circulation space, 11: plasma processing reaction tank, 12, 13: main waste gas treatment device, 14: exhaust pump, 15: gas supply cylinder, 16, 17: switching valve.
Claims (1)
に少なくとも一対の電極を設け、該ガス導入口と
該ガス導出口はガス流通空間により連結されてい
る放電管及び該電極と接続される直流又は交流電
源を含む廃ガス処理装置において、該ガス導入口
より流入したガスをプラズマ化させるため該ガス
流通空間で該電極により形成される電界の向きと
約45゜乃至約135゜の角度で交わる直流又は交流の
磁界を印加する磁界印加装置を該放電管に装着さ
せ且つ該放電管容器の磁力線と交わる器壁の少な
くとも表面が絶縁物で構成されていることを特徴
とする廃ガス処理装置。 2 該電極が該印加磁界の磁束密度Bで決まる電
子の旋回半径rよりも大きい間隔をもつて配置さ
れていることを特徴とする特許請求の範囲第1項
記載の処理装置。 3 該電源が直流電源であり、該磁界印加装置が
直流磁界印加装置であることを特徴とする特許請
求の範囲第1項又は第2項記載の処理装置。 4 該電源が多相交流電源であり、該磁界印加装
置が直流又は多相交流磁界印加装置であることを
特徴とする特許請求の範囲第1項又は第2項記載
の処理装置。 5 該放電管の器壁が電極を兼ねるため導電性物
質で構成され、該器壁内表面が絶縁性フイルムで
被覆されていることを特徴とする特許請求の範囲
第1項〜第4項のいずれかに記載の処理装置。 6 該放電間の容器が付加的なガス導入口を有し
ていて、該導入口を通して放電を安定化させ及
び/又はガスのプラズマ化により生成する固体物
質の分離を容易にするガスを導入するように構成
されていることを特徴とする特許請求の範囲第1
項〜第5項のいずれかに記載の処理装置。[Scope of Claims] 1. A discharge tube and the electrode, in which at least one pair of electrodes is provided in a tubular container having a gas inlet and a gas outlet, the gas inlet and the gas outlet being connected by a gas circulation space. In a waste gas treatment device including a DC or AC power supply connected to the gas inlet, the direction of the electric field formed by the electrode in the gas flow space is approximately 45° to approximately 135 A magnetic field applying device for applying direct current or alternating current magnetic fields that intersect at an angle of . Waste gas treatment equipment. 2. The processing apparatus according to claim 1, wherein the electrodes are arranged at intervals larger than a radius of gyration r of electrons determined by the magnetic flux density B of the applied magnetic field. 3. The processing device according to claim 1 or 2, wherein the power source is a DC power source, and the magnetic field application device is a DC magnetic field application device. 4. The processing device according to claim 1 or 2, wherein the power source is a multiphase AC power source, and the magnetic field application device is a DC or multiphase AC magnetic field application device. 5. Claims 1 to 4, characterized in that the wall of the discharge tube also serves as an electrode and is made of a conductive material, and the inner surface of the wall is covered with an insulating film. The processing device according to any one of the above. 6. The vessel between the discharges has an additional gas inlet through which a gas is introduced which stabilizes the discharge and/or facilitates the separation of the solid material produced by the plasmaization of the gas. Claim 1 characterized in that it is configured as follows.
5. The processing device according to any one of items 5 to 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61173783A JPS6331523A (en) | 1986-07-25 | 1986-07-25 | Apparatus for treating waste gas |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61173783A JPS6331523A (en) | 1986-07-25 | 1986-07-25 | Apparatus for treating waste gas |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6331523A JPS6331523A (en) | 1988-02-10 |
| JPH0480723B2 true JPH0480723B2 (en) | 1992-12-21 |
Family
ID=15967069
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61173783A Granted JPS6331523A (en) | 1986-07-25 | 1986-07-25 | Apparatus for treating waste gas |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6331523A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2585257B2 (en) * | 1987-04-16 | 1997-02-26 | 三井東圧化学株式会社 | Gas treatment method |
| US4735633A (en) * | 1987-06-23 | 1988-04-05 | Chiu Kin Chung R | Method and system for vapor extraction from gases |
| US6576202B1 (en) | 2000-04-21 | 2003-06-10 | Kin-Chung Ray Chiu | Highly efficient compact capacitance coupled plasma reactor/generator and method |
| KR100596511B1 (en) | 2004-06-30 | 2006-07-03 | 플라즈마에너지자원 주식회사 | air cleaner |
| JP4955027B2 (en) * | 2009-04-02 | 2012-06-20 | クリーン・テクノロジー株式会社 | Control method of plasma by magnetic field in exhaust gas treatment device |
| CN111895547A (en) * | 2020-08-27 | 2020-11-06 | 长沙京鳞子科技有限公司 | A virus-killing air circulation system |
-
1986
- 1986-07-25 JP JP61173783A patent/JPS6331523A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6331523A (en) | 1988-02-10 |
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