JPH0514207Y2 - - Google Patents
Info
- Publication number
- JPH0514207Y2 JPH0514207Y2 JP1984147978U JP14797884U JPH0514207Y2 JP H0514207 Y2 JPH0514207 Y2 JP H0514207Y2 JP 1984147978 U JP1984147978 U JP 1984147978U JP 14797884 U JP14797884 U JP 14797884U JP H0514207 Y2 JPH0514207 Y2 JP H0514207Y2
- Authority
- JP
- Japan
- Prior art keywords
- collector electrode
- radiation source
- chamber
- source material
- column
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Measurement Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Description
【考案の詳細な説明】
(イ) 産業上の利用分野
この考案は、ガスクロマトグラフの検出器など
に使用される電子捕獲検出器に関する。[Detailed description of the invention] (a) Industrial application field This invention relates to an electron capture detector used in gas chromatograph detectors and the like.
(ロ) 従来技術
電子捕獲検出器は、線源物質が設けられた線源
室と、この線源室でパージガス（純粋なガス）に
放射線が照射されて発生する電子を補集するコレ
クタ電極とを備え、カラム端からの流出物を放射
線照射されたパージガスに混合させてコレクタ電
流を検出することにより、流出物中の親電子性物
質を測定するものである。(b) Prior art An electron capture detector consists of a radiation source chamber in which a radiation source substance is installed, and a collector electrode that collects electrons generated when purge gas (pure gas) is irradiated with radiation in this radiation source chamber. The electrophilic substance in the effluent is measured by mixing the effluent from the end of the column with the irradiated purge gas and detecting the collector current.
従来の電子捕獲検出器は第２図ａに示す如くカ
ラム１端からの流出物とパージガスがともに線源
物質２表面を通過するようにカラム１端と線源物
質２との相対位置が設定されたものと、第２図ｂ
に示す如く、線源室４をカラム１端からの流出物
の経路と離して別途形成し、線源室４の線源物質
２にはパージガスのみが接触するようにし、線源
室４で放射線照射を受けたパージガスをカラム１
端からの流出物の経路に導いて混合させるように
したものがある。 In a conventional electron capture detector, the relative position of the column 1 end and the radiation source material 2 is set so that the effluent from the column 1 end and the purge gas both pass through the surface of the radiation source material 2, as shown in Figure 2a. Figure 2b
As shown in FIG. 2, the radiation source chamber 4 is formed separately from the path of the effluent from the end of the column 1, and only the purge gas contacts the radiation source material 2 in the radiation source chamber 4. The irradiated purge gas is transferred to column 1.
Some are designed to route and mix the effluent from the end.
なお、第２図ａ，ｂとも３は、コレクタ電極を
示す。 In addition, 3 in both FIGS. 2a and 2b indicates the collector electrode.
(ハ) 発明が解決しようとする問題点
第２図ａのタイプの電子捕獲検出器は高感度の
測定を行なうことができる長所をもつ反面、カラ
ム１端からの流出物により線源物質２が汚染され
るため線源物質２を定期的に洗浄しなければなら
ないという欠点を、また、第２図ｂのタイプの電
子捕獲検出器では線源物質２は汚染されにくい長
所をもつ反面、感度が低いという欠点をもつてい
る。(c) Problems to be Solved by the Invention Although the electron capture detector of the type shown in Figure 2a has the advantage of being able to perform highly sensitive measurements, it also has the advantage that the radiation source material 2 is The electron capture detector of the type shown in Fig. 2b has the disadvantage that the source material 2 must be cleaned regularly because it is contaminated, and the source material 2 has the advantage of being less susceptible to contamination. It has the disadvantage of being low.
更には、第２図ａ，ｂのタイプとも、コレクタ
電極３は、カラム１端からの流出物と放射線照射
されたパージガスとの混合物により汚染され、定
期的に洗浄しなければならないという欠点をもつ
ている。そして、この洗浄の際には、第２図ａ，
ｂのタイプとも線源物質２とコレクタ電極３は同
じ室にあるため、線源物質２に触れないで洗浄す
ることができず、非常に危険であつた。 Furthermore, both types a and b of FIG. 2 have the disadvantage that the collector electrode 3 is contaminated by a mixture of the effluent from the end of the column 1 and the irradiated purge gas and must be cleaned periodically. ing. During this cleaning, the steps shown in Fig. 2a,
In both types b, the source material 2 and the collector electrode 3 are located in the same chamber, so it is impossible to clean the source material 2 without touching it, which is very dangerous.
この考案は、カラム端からの流出物により線源
物質が汚染されにくくするとともに、コレクタ電
極を洗浄する際には線源物質に触れずに安全に行
うことのできる電子捕獲検出器を提供することを
目的とする。 This invention provides an electron capture detector that makes it difficult for the radiation source material to be contaminated by spills from the end of the column, and also allows the collector electrode to be cleaned safely without touching the radiation source material. With the goal.
(ニ) 問題点を解決するための手段
この考案は、線源物質が設けられた線源室と、
コレクタ電極とカラム接続口が設けられたコレク
タ電極室とを着脱自在に設置するとともに、線源
室のコレクタ電極室との接続口に扉を設け、コレ
クタ電極室離脱時には該扉が閉まる構造とするこ
とより、上述の問題点を解決する。(d) Means for solving the problem This invention consists of a radiation source chamber in which radiation source material is installed,
A collector electrode chamber with a collector electrode and a column connection port is installed in a removable manner, and a door is provided at the connection port between the radiation source chamber and the collector electrode chamber, and the door is closed when the collector electrode chamber is removed. This solves the above-mentioned problems.
(ホ) 作用
この考案では、コレクタ電極室を取り付ける場
合には、線源室の扉が自動的に開き、取りはずし
た場合には、扉が自動的に閉まり、線源物質とコ
レクタ電極が全く別個の室内で洗浄できる。(E) Effect In this device, when the collector electrode chamber is installed, the door of the radiation source chamber opens automatically, and when it is removed, the door closes automatically, and the radiation source material and the collector electrode are completely separated. Can be washed indoors.
(ヘ) 実施例
この考案の実施例を第１図に示す。なお、従来
技術の説明の所で用いたものと同じものには、同
じ番号が付してある。(F) Example An example of this invention is shown in Fig. 1. Note that the same components as those used in the description of the prior art are given the same numbers.
線源室４は、外管６の内側に高電圧絶縁用セラ
ミツク７で支持された線源物質２を設けることに
より形成され、その室の上部にはパージガス導入
口８が、下部には扉９が設けられている。扉９に
はスプリング１０がついており、コレクタ電極室
１１を取り付けると電極室先端部１２の突き上げ
により自動的に開くようになつており、そのとき
の状態は図示の通りである。コレクタ電極室１１
と線源室４の接続はネジにより行つており、容易
に着脱できるようになつている。 The radiation source chamber 4 is formed by providing the radiation source material 2 supported by a high-voltage insulating ceramic 7 inside an outer tube 6, and has a purge gas inlet 8 in the upper part and a door 9 in the lower part. is provided. A spring 10 is attached to the door 9, and when the collector electrode chamber 11 is attached, it is automatically opened by pushing up the electrode chamber tip 12, and the state at that time is as shown in the figure. Collector electrode chamber 11
The connection between the source chamber 4 and the radiation source chamber 4 is made by screws, so that they can be easily attached and detached.
コレクタ電極室１１を離脱させると、扉９はス
プリング１０の作用によつて自動的に閉められ
る。なお、１２は気体排出口、１３はカラム接続
口、１４は高電圧端子を示す。 When the collector electrode chamber 11 is removed, the door 9 is automatically closed by the action of the spring 10. Note that 12 is a gas discharge port, 13 is a column connection port, and 14 is a high voltage terminal.
測定時には、カラム接続口１３に図示のように
カラム１を接続すればよい。 At the time of measurement, the column 1 may be connected to the column connection port 13 as shown in the figure.
次に測定の原理について説明する。 Next, the principle of measurement will be explained.
測定に当つては、まずパージガス（例えばN2
ガス）をパージガス導入口８より入れる。そうす
れば線源室４では、線源物質２からのベータ線照
射によりイオン化が行なわれ、N2〓→N2 +＋e-に
より電子が発生し、そしてこの電子は高圧端子１
４に負の電圧をかけることによつてコレクタ電極
室１１に放出それる。コレクタ電極室１１に入つ
た電子は、e-＋Ｍ→M-の反応により負イオンを
形成する。カラム１から流出したガスの中にこの
ように電子を捕獲しやすい物質が含有される時に
はこのような反応により負イオンが多く生成さ
れ、コレクタ電極３に流れる電流は減少する。 For measurement, first purge gas (e.g. N2
gas) is introduced from the purge gas inlet 8. Then, in the radiation source chamber 4, ionization is performed by beta ray irradiation from the radiation source material 2, and electrons are generated by N 2 〓→N 2 + +e - , and these electrons are transferred to the high voltage terminal 1.
By applying a negative voltage to the collector electrode chamber 11, a negative voltage is applied to the collector electrode chamber 11. The electrons entering the collector electrode chamber 11 form negative ions through a reaction of e - +M→M - . When the gas flowing out from the column 1 contains a substance that easily captures electrons, many negative ions are generated due to such a reaction, and the current flowing to the collector electrode 3 decreases.
この減少量を測定することによつてＭの濃度が
判ることになる。 By measuring this amount of decrease, the concentration of M can be determined.
測定終了後は、線源室４とコレクタ電極室１１
を離脱し、線源室４とコレクタ電極室１１を別個
の室内として洗浄する。 After the measurement is completed, the radiation source chamber 4 and the collector electrode chamber 11 are
The radiation source chamber 4 and the collector electrode chamber 11 are cleaned as separate chambers.
なお、線源室４から、コレクタ電極室１１を切
り離したときは、線源室４の扉９は自動的に閉ま
るので線源物質２は大気に触れることもない。 Note that when the collector electrode chamber 11 is separated from the radiation source chamber 4, the door 9 of the radiation source chamber 4 is automatically closed, so that the radiation source material 2 does not come into contact with the atmosphere.
(ト) 効果
この考案によれば、コレクタ電極の洗浄を行う
ときは、線源物質と全く切り離して行うことがで
きるので、非常に安全であるとともに、カラム接
続口は、コレクタ電極室側に設けられているの
で、カラム流出物により線源物質が汚染されると
いう弊害も生じない。(g) Effects According to this invention, when cleaning the collector electrode, it can be done completely separately from the radiation source material, so it is very safe, and the column connection port is located on the collector electrode chamber side. Therefore, there is no problem of contamination of the source material by column effluent.
第１図が、この考案に係る電子捕獲検出器の概
略図、第２図ａ，ｂが従来の電子捕獲検出器の概
略図である。
１……カラム、２……線源物質、３……コレク
タ電極、９……扉、１３……カラム接続口。
FIG. 1 is a schematic diagram of an electron capture detector according to this invention, and FIGS. 2a and 2b are schematic diagrams of a conventional electron capture detector. 1... Column, 2... Source material, 3... Collector electrode, 9... Door, 13... Column connection port.
Claims (1)
ージガスに放射線が照射されて発生する電子を補
集するコレクタ電極及びカラム接続口が設けられ
たコレクタ電極室とを着脱自在に設置するととも
に、該線源室のコレクタ電極室との接続口に扉を
設け、コレクタ電極室離脱時には該扉が閉まる構
造としたことを特徴とする電子捕獲検出器。 1. An electron capture detector comprising: a radiation source chamber containing a radiation source material; and a collector electrode chamber provided with a collector electrode and a column connection port for collecting electrons generated when a purge gas is irradiated with radiation in the radiation source chamber, the collector electrode chamber being provided with a door at the connection port between the radiation source chamber and the collector electrode chamber, the door being configured to close when the collector electrode chamber is removed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984147978U JPH0514207Y2 (en) | 1984-09-28 | 1984-09-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984147978U JPH0514207Y2 (en) | 1984-09-28 | 1984-09-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6161459U JPS6161459U (en) | 1986-04-25 |
| JPH0514207Y2 true JPH0514207Y2 (en) | 1993-04-15 |
Family
ID=30706199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984147978U Expired - Lifetime JPH0514207Y2 (en) | 1984-09-28 | 1984-09-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0514207Y2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2630152B2 (en) * | 1992-01-31 | 1997-07-16 | 株式会社島津製作所 | Electron capture detector for gas chromatograph |
| JPH11153579A (en) * | 1997-11-20 | 1999-06-08 | Shimadzu Corp | Electron capture detector |
| JP5946111B2 (en) * | 2011-01-07 | 2016-07-05 | 株式会社ジェイ・サイエンス・ラボ | Detection method and detection apparatus using plasma |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5567495U (en) * | 1978-10-27 | 1980-05-09 | ||
| JPS5961774A (en) * | 1982-09-30 | 1984-04-09 | Shimadzu Corp | Electron capture detector |
-
1984
- 1984-09-28 JP JP1984147978U patent/JPH0514207Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6161459U (en) | 1986-04-25 |
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