JPH05150840A - Pressure controller - Google Patents
Pressure controllerInfo
- Publication number
- JPH05150840A JPH05150840A JP31231691A JP31231691A JPH05150840A JP H05150840 A JPH05150840 A JP H05150840A JP 31231691 A JP31231691 A JP 31231691A JP 31231691 A JP31231691 A JP 31231691A JP H05150840 A JPH05150840 A JP H05150840A
- Authority
- JP
- Japan
- Prior art keywords
- adjustment valve
- pressure control
- vacuum
- fine adjustment
- control device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Drying Of Semiconductors (AREA)
- Control Of Fluid Pressure (AREA)
Abstract
(57)【要約】
【目的】 圧力制御装置において、処理室内の圧力を広
範囲にわたって制御し、配管工数を減少させ、装置の小
型化を図り、継手点数を減少させ、リークの発生を防止
する。
【構成】 ドライエッチング装置1の圧力制御装置5に
おいて、一端にエッチング室2が接続され、他端に真空
排気装置3が接続される1系統の圧力制御流路7と、こ
の1系統の圧力制御流路7内に互いに隣接して設けられ
る粗調整弁8および微調整弁9と、この粗調整弁8およ
び微調整弁9を駆動する粗調整弁駆動用ステップモータ
11および微調整弁駆動用ステップモータ12とを備え
た構造とした。
(57) [Abstract] [Purpose] In a pressure control device, the pressure in the processing chamber is controlled over a wide range, the piping man-hours are reduced, the device is downsized, the number of joint points is reduced, and leakage is prevented. In a pressure control device 5 of a dry etching device 1, a pressure control flow path 7 is connected to an etching chamber 2 at one end and a vacuum exhaust device 3 is connected to the other end, and pressure control of this one system. A coarse adjustment valve 8 and a fine adjustment valve 9 provided adjacent to each other in the flow path 7, a coarse adjustment valve driving step motor 11 and a fine adjustment valve driving step for driving the coarse adjustment valve 8 and the fine adjustment valve 9. The structure including the motor 12 is used.
Description
【0001】[0001]
【産業上の利用分野】本発明は、圧力制御装置に関し、
特に、たとえばドライエッチング装置の真空処理室内の
真空度を制御する圧力制御装置に適用して有効な技術に
関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a pressure control device,
In particular, the present invention relates to a technique effectively applied to, for example, a pressure control device that controls the degree of vacuum in a vacuum processing chamber of a dry etching device.
【0002】[0002]
【従来の技術】半導体装置の製造プロセスでは、低圧化
学気相成長による薄膜形成、プラズマによるドライエッ
チングおよびイオン打込み、電子線によるパターン描画
などの処理は、真空雰囲気の下で行われ、真空度の制御
は重要なパラメータとなっている。2. Description of the Related Art In a semiconductor device manufacturing process, processes such as thin film formation by low pressure chemical vapor deposition, dry etching and ion implantation with plasma, and pattern drawing with an electron beam are performed under a vacuum atmosphere. Control is an important parameter.
【0003】このような真空度の制御を行う圧力制御装
置としては、たとえば、株式会社工業調査会、昭和59
年11月20日発行の「電子材料」1984年11月号
別刷P45〜P51の文献に記載されているように、次
のような第1および第2の従来例の圧力制御装置があ
る。As a pressure control device for controlling such a vacuum degree, for example, Industrial Research Institute Co., Ltd., Showa 59
As described in the literature of "Electronic Materials" November 1984, reprints, P45 to P51, issued on November 20, there are the following first and second conventional pressure control devices.
【0004】すなわち、第1の従来例の圧力制御装置
は、真空配管の途中に調整弁を1個のみ設け、この調整
弁1個のみで真空度を制御する構造となっている。That is, the pressure control device of the first conventional example has a structure in which only one adjusting valve is provided in the middle of the vacuum pipe and the degree of vacuum is controlled only by this one adjusting valve.
【0005】第2の従来例の圧力制御装置は、1次側バ
イパスブロックと2次側バイパスブロックとの間に真空
配管とバイパス管とを並列に接続し、真空配管の途中に
粗調整弁を設け、バイパス管に微調整弁を設けた構造と
なっている。In the pressure control device of the second conventional example, a vacuum pipe and a bypass pipe are connected in parallel between the primary side bypass block and the secondary side bypass block, and a coarse adjustment valve is provided in the middle of the vacuum pipe. A bypass valve is provided with a fine adjustment valve.
【0006】[0006]
【発明が解決しようとする課題】しかし、前記第1の従
来例の圧力制御装置の構造では、真空配管の途中に調整
弁を1個のみ設け、調整弁1個のみで真空度を制御する
構造となっているので、高い真空度を必要とするとき
は、真空配管の径を大きくし、低い真空度を必要とする
ときは、真空配管の径を小さくしなければならず、この
ため真空配管の径により制御する真空度の範囲が限定さ
れてしまうという問題があった。However, in the structure of the pressure control device of the first conventional example, only one adjusting valve is provided in the middle of the vacuum pipe, and the vacuum degree is controlled by only one adjusting valve. Therefore, when a high degree of vacuum is required, the diameter of the vacuum piping must be increased, and when a low degree of vacuum is required, the diameter of the vacuum piping must be reduced. There was a problem that the range of the degree of vacuum controlled by the diameter of was limited.
【0007】また、前記第2の従来例の圧力制御装置の
構造では、1次側バイパスブロックと2次側バイパスブ
ロックとの間に真空配管とバイパス管とを並列に接続
し、真空配管の途中に粗調整弁を設け、バイパス管に微
調整弁を設けた構造となっているので、配管工数が増大
し、装置が大型化するという問題があった。Further, in the structure of the pressure control device of the second conventional example, a vacuum pipe and a bypass pipe are connected in parallel between the primary side bypass block and the secondary side bypass block, and the vacuum pipe is in the middle thereof. Since the coarse adjustment valve is provided in the above and the fine adjustment valve is provided in the bypass pipe, there is a problem that the number of piping steps is increased and the device is enlarged.
【0008】また、前記第2の従来例の圧力制御装置の
構造では、1次側および2次側バイパスブロックにそれ
ぞれ3個の継手を設け、粗調整弁および微調整弁にそれ
ぞれ2個の継手を設けた構造となっているので、継手点
数が増大し、このためリークが発生するという問題があ
った。Further, in the structure of the second conventional pressure control device, three couplings are provided in each of the primary side and secondary side bypass blocks, and two couplings are provided in each of the coarse adjustment valve and the fine adjustment valve. Since the structure has been provided, there is a problem in that the number of joint points increases, which causes leakage.
【0009】本発明の目的は、処理室内の圧力を広範囲
にわたって制御することのできる圧力制御装置を提供す
ることにある。An object of the present invention is to provide a pressure control device capable of controlling the pressure in the processing chamber over a wide range.
【0010】本発明の他の目的は、配管工数を減少さ
せ、装置の小型化を図ることのできる圧力制御装置を提
供することにある。Another object of the present invention is to provide a pressure control device capable of reducing the number of piping steps and downsizing the device.
【0011】また、本発明の他の目的は、継手点数を減
少させ、リークの発生を防止することのできる圧力制御
装置を提供することにある。Another object of the present invention is to provide a pressure control device capable of reducing the number of joints and preventing the occurrence of leaks.
【0012】本発明の前記ならびにその他の目的と新規
な特徴は、本明細書の記述および添付図面から明らかに
なるであろう。The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.
【0013】[0013]
【課題を解決するための手段】本願において開示される
発明のうち、代表的なものの概要を簡単に説明すれば、
下記のとおりである。Among the inventions disclosed in the present application, a brief description will be given to the outline of typical ones.
It is as follows.
【0014】すなわち、本発明の圧力制御装置は、一端
に処理室が接続され、他端にガス給排装置が接続される
1系統の圧力制御流路と、この1系統の圧力制御流路内
に互いに隣接して設けられる粗調整弁および微調整弁
と、この粗調整弁および微調整弁を駆動する粗調整弁駆
動部および微調整弁駆動部とを備えた構造としたもので
ある。That is, in the pressure control device of the present invention, one system of pressure control flow path is connected to the processing chamber at one end and the gas supply / discharge device is connected to the other end, and the pressure control flow path of this one system is provided. And a coarse adjustment valve and a fine adjustment valve that are provided adjacent to each other, and a coarse adjustment valve drive unit and a fine adjustment valve drive unit that drive the coarse adjustment valve and the fine adjustment valve.
【0015】[0015]
【作用】前記構成の圧力制御装置において、低圧領域の
大排気量における圧力制御を行う場合、まず、開口面積
の大きい粗調整弁を開放方向に動作させることで排気量
を上げ、必要な圧力の設定値に近づける様に粗調整を行
い、次に開口面積の小さい微調整弁で設定圧力値を得る
よう微調整を行う。In the pressure control device having the above structure, when performing pressure control in a large exhaust amount in the low pressure region, first, the exhaust gas amount is increased by operating the coarse adjustment valve having a large opening area in the opening direction to increase the required pressure. Coarse adjustment is performed to bring it closer to the set value, and then fine adjustment is performed to obtain the set pressure value with the fine adjustment valve having a small opening area.
【0016】また、高圧領域の小排気量における圧力制
御を行う場合、開口面積の大きい粗調整弁を閉じること
で排気量をしぼり込み、開口面積の小さい微調整弁で圧
力調整を行う。Further, when pressure control is performed in a small exhaust amount in the high pressure region, the exhaust amount is narrowed down by closing the coarse adjustment valve having a large opening area, and the pressure is adjusted by the fine adjustment valve having a small opening area.
【0017】[0017]
【実施例】図1は本発明の一実施例である圧力制御装置
を示す断面図、図2は図1のII−II線断面図である。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a sectional view showing a pressure control device according to an embodiment of the present invention, and FIG. 2 is a sectional view taken along line II-II of FIG.
【0018】本実施例はドライエッチング装置1に適用
したもので、このドライエッチング装置1は活性プラズ
マを利用してエッチング処理を行うもので、エッチング
室2を有している。The present embodiment is applied to a dry etching apparatus 1, and this dry etching apparatus 1 carries out an etching process by using active plasma and has an etching chamber 2.
【0019】このエッチング室2はエッチング処理する
真空室で、所定の真空度に設定される構造となってい
る。このようなエッチング室2と真空ポンプなどの真空
排気装置3とは真空配管4で接続され、この真空配管4
の途中に圧力制御装置5が設けられている。The etching chamber 2 is a vacuum chamber for performing an etching process, and has a structure in which a predetermined degree of vacuum is set. The etching chamber 2 and the vacuum exhaust device 3 such as a vacuum pump are connected by a vacuum pipe 4.
A pressure control device 5 is provided midway.
【0020】本実施例の要旨は、前記圧力制御装置5に
よりエッチング室2内の真空度を広範囲にわたって制御
できるようにした点にある。The gist of the present embodiment is that the degree of vacuum in the etching chamber 2 can be controlled over a wide range by the pressure control device 5.
【0021】すなわち、この圧力制御装置5は、装置本
体6を有している。この装置本体6内に1系統の圧力制
御流路7内が貫通して形成され、この1系統の圧力制御
流路7内に粗調整弁8および微調整弁9が互いに隣接し
て設けられている。That is, the pressure control device 5 has a device body 6. A pressure control flow passage 7 of one system is formed so as to penetrate through the apparatus main body 6, and a coarse adjustment valve 8 and a fine adjustment valve 9 are provided adjacent to each other in the pressure control flow passage 7 of one system. There is.
【0022】この粗調整弁8および微調整弁9は大小の
矩形形状を有し、全閉状態(開度0%位置)では、圧力
制御流路7の開口面積に対して粗調整弁8は60〜70
%、微調整弁9は30〜40%程の割合で占有してい
る。The coarse adjustment valve 8 and the fine adjustment valve 9 have large and small rectangular shapes, and in the fully closed state (0% position of the opening), the coarse adjustment valve 8 corresponds to the opening area of the pressure control passage 7. 60-70
%, The fine adjustment valve 9 occupies at a rate of about 30 to 40%.
【0023】また、前記粗調整弁8および微調整弁9の
回転軸10には、粗調整弁駆動用ステップモータ11お
よび微調整弁駆動用ステップモータ12が直結され、パ
ルス数に応じて粗調整弁8および微調整弁9の開度が互
いに独立して制御される構造となっている。A coarse adjustment valve driving step motor 11 and a fine adjustment valve driving step motor 12 are directly connected to the rotary shafts 10 of the coarse adjustment valve 8 and the fine adjustment valve 9, and the coarse adjustment is performed according to the number of pulses. The valve 8 and the fine adjustment valve 9 are controlled in their opening degrees independently of each other.
【0024】次に、本実施例の作用について説明する。Next, the operation of this embodiment will be described.
【0025】常圧に近い低真空度領域の大排気量におけ
る真空度制御を行う場合、まず、開口面積の大きい粗調
整弁8を開放方向に動作させることで排気量を上げ、設
定真空度に近づける様に粗調整を行う。When performing the vacuum control in the large displacement in the low vacuum region close to the normal pressure, first, the coarse adjustment valve 8 having a large opening area is operated in the opening direction to increase the displacement to reach the set vacuum. Make a rough adjustment so that they are closer together.
【0026】次いで、開口面積の小さい微調整弁9で微
調整を行い、設定真空度を得る。Then, the fine adjustment valve 9 having a small opening area is used for fine adjustment to obtain the set vacuum degree.
【0027】また、高真空度の領域の小排気量における
真空度制御を行う場合、まず、開口面積の大きい粗調整
弁8を閉じることにより、排気量をしぼり込む。Further, when performing the vacuum degree control in the small exhaust amount in the high vacuum region, first, the coarse amount adjusting valve 8 having a large opening area is closed to narrow the exhaust amount.
【0028】次いで、開口面積の小さい微調整弁9で設
定真空度に近づける様に微調整を行う。Next, the fine adjustment valve 9 having a small opening area is used for fine adjustment so as to approach the set vacuum degree.
【0029】したがって、低真空領域から高真空領域に
わたってエッチング室2内の真空度を高精度で制御する
ことができる。Therefore, the degree of vacuum in the etching chamber 2 can be controlled with high accuracy from the low vacuum region to the high vacuum region.
【0030】また、1系統の圧力制御流路7内に粗調整
弁8および微調整弁9を互いに隣接して設けた構造とし
たので、配管工数を減少させ、装置の小型化を図ること
ができる。Further, since the structure is such that the coarse adjustment valve 8 and the fine adjustment valve 9 are provided adjacent to each other in the pressure control flow path 7 of one system, the number of piping steps can be reduced and the apparatus can be miniaturized. it can.
【0031】また、1系統の圧力制御流路7内に粗調整
弁8および微調整弁9を互いに隣接して設けた構造とし
たので、継手点数を減少させ、リークの発生を防止する
ことができる。Further, since the structure is such that the coarse adjustment valve 8 and the fine adjustment valve 9 are provided adjacent to each other in the pressure control flow path 7 of one system, it is possible to reduce the number of joints and prevent the occurrence of leakage. it can.
【0032】以上本発明者によってなされた発明を実施
例に基づき具体的に説明したが、本発明は前記実施例に
限定されるものではなく、その要旨を逸脱しない範囲で
種々変更可能であることはいうまでもない。Although the invention made by the present inventor has been specifically described based on the embodiments, the present invention is not limited to the embodiments and various modifications can be made without departing from the scope of the invention. Needless to say.
【0033】たとえば、前記実施例では、断面矩形状の
圧力制御流路内に、大小の矩形形状を有する粗調整弁お
よび微調整弁を互いに隣接させて設けた場合について説
明したが、これに限らず、断面円形状の圧力制御流路内
に、半円状の粗調整弁および微調整弁を中空軸および中
実軸からなる二重回転軸を介して設けることができる。For example, in the above-described embodiment, the case where the coarse control valve and the fine control valve having large and small rectangular shapes are provided adjacent to each other in the pressure control passage having a rectangular cross section has been described, but the present invention is not limited to this. Alternatively, a semi-circular coarse adjustment valve and a fine adjustment valve can be provided in the pressure control flow path having a circular cross section through a double rotary shaft including a hollow shaft and a solid shaft.
【0034】以上の説明では、主として本発明者によっ
てなされた発明をその背景となった利用分野であるドラ
イエッチング装置に使用される圧力制御装置で説明した
が、これに限らず、 以上の説明では、主として本発明
者によってなされた発明をその背景となった利用分野で
あるドライエッチング装置に使用される圧力制御装置で
説明したが、これに限らず、電子線描画装置など他の半
導体製造装置に使用される圧力制御装置は勿論、処理室
内の正圧のガス圧を制御する圧力制御装置にも適用でき
る。In the above description, the invention mainly made by the present inventor has been described with reference to the pressure control device used in the dry etching apparatus which is the field of application which is the background of the invention. Although the invention mainly made by the present inventor has been described with reference to a pressure control device used in a dry etching device which is a field of application of the background, the invention is not limited to this, and other semiconductor manufacturing devices such as an electron beam drawing device can be used. It can be applied not only to the pressure control device used, but also to a pressure control device controlling the positive gas pressure in the processing chamber.
【0035】[0035]
【発明の効果】本願において開示される発明のうち、代
表的なものによって得られる効果を簡単に説明すれば、
以下のとおりである。The effects obtained by the typical ones of the inventions disclosed in the present application will be briefly described as follows.
It is as follows.
【0036】(1).一端に処理室が接続され、他端にガス
給排装置が接続される1系統の圧力制御流路と、この1
系統の圧力制御流路内に互いに隣接して設けられる粗調
整弁および微調整弁と、この粗調整弁および微調整弁を
駆動する粗調整弁駆動部および微調整弁駆動部とを備え
た構造としたので、処理室内の圧力を広範囲にわたって
制御することができる。(1). One system of pressure control flow path, one end of which is connected to the processing chamber and the other end of which is connected to a gas supply / discharge device, and
Structure including a coarse adjustment valve and a fine adjustment valve provided adjacent to each other in the pressure control flow path of the system, and a coarse adjustment valve drive unit and a fine adjustment valve drive unit that drive the coarse adjustment valve and the fine adjustment valve Therefore, the pressure in the processing chamber can be controlled over a wide range.
【0037】(2).1系統の圧力制御流路内に粗調整弁お
よび微調整弁を互いに隣接して設けた構造としたので、
配管工数を減少させ、装置の小型化を図ることができ
る。(2). Since the coarse control valve and the fine control valve are provided adjacent to each other in the pressure control flow path of one system,
The number of piping steps can be reduced and the device can be downsized.
【0038】(3).1系統の圧力制御流路内に粗調整弁お
よび微調整弁を互いに隣接して設けた構造としたので、
継手点数を減少させ、リークの発生を防止することがで
きる。(3). Since the coarse control valve and the fine control valve are provided adjacent to each other in the pressure control flow path of one system,
It is possible to reduce the number of joints and prevent leakage.
【0039】[0039]
【図1】本発明の一実施例である圧力制御装置を示す断
面図である。FIG. 1 is a cross-sectional view showing a pressure control device according to an embodiment of the present invention.
【図2】図1のII−II線断面図である。FIG. 2 is a sectional view taken along line II-II in FIG.
1 ドライエッチング装置 2 エッチング室 3 真空排気装置 4 真空配管 5 圧力制御装置 6 装置本体 7 圧力制御流路 8 粗調整弁 9 微調整弁 10 回転軸 11 粗調整弁駆動用ステップモータ 12 微調整弁駆動用ステップモータ 1 Dry Etching Device 2 Etching Chamber 3 Vacuum Evacuation Device 4 Vacuum Piping 5 Pressure Control Device 6 Device Main Body 7 Pressure Control Flow Path 8 Coarse Adjustment Valve 9 Fine Adjustment Valve 10 Rotation Shaft 11 Step Motor for Coarse Adjustment Valve 12 Fine Adjustment Valve Drive For step motor
Claims (2)
排装置が接続される1系統の圧力制御流路と、この1系
統の圧力制御流路内に互いに隣接して設けられる粗調整
弁および微調整弁と、この粗調整弁および微調整弁を駆
動する粗調整弁駆動部および微調整弁駆動部とを備えた
ことを特徴とする圧力制御装置。1. A pressure control flow path of one system having a processing chamber connected to one end thereof and a gas supply / discharge device connected to the other end thereof, and a rough passage provided adjacent to each other in the pressure control flow path of this one system. A pressure control device comprising: a regulating valve and a fine regulating valve; and a coarse regulating valve driving unit and a fine regulating valve driving unit that drive the coarse regulating valve and the fine regulating valve.
ス給排装置はガス排気装置であることを特徴とする請求
項1記載の圧力制御装置。2. The pressure control device according to claim 1, wherein the processing chamber is a vacuum processing chamber, and the gas supply / discharge device is a gas exhaust device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31231691A JPH05150840A (en) | 1991-11-27 | 1991-11-27 | Pressure controller |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31231691A JPH05150840A (en) | 1991-11-27 | 1991-11-27 | Pressure controller |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05150840A true JPH05150840A (en) | 1993-06-18 |
Family
ID=18027783
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31231691A Pending JPH05150840A (en) | 1991-11-27 | 1991-11-27 | Pressure controller |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH05150840A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110873662A (en) * | 2018-08-31 | 2020-03-10 | 深圳市帝迈生物技术有限公司 | Liquid circuit system, mixing method and sample analysis device |
| CN115077914A (en) * | 2022-06-23 | 2022-09-20 | 洛阳拖拉机研究所有限公司 | Air inlet vacuum degree adjusting valve for engine bench test |
-
1991
- 1991-11-27 JP JP31231691A patent/JPH05150840A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110873662A (en) * | 2018-08-31 | 2020-03-10 | 深圳市帝迈生物技术有限公司 | Liquid circuit system, mixing method and sample analysis device |
| CN115077914A (en) * | 2022-06-23 | 2022-09-20 | 洛阳拖拉机研究所有限公司 | Air inlet vacuum degree adjusting valve for engine bench test |
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