JPH05312877A - Aging substrate inspecting device and inspecting method using it - Google Patents

Abstract

PURPOSE:To simplify inspection of abnormality in an aging substrate and inspect with a high accuracy by providing a switching mechanism capable of measuring output voltage through connecting only a test terminal of a circuit selected as an inspection target. CONSTITUTION:A power source terminal 3 and a terminal to be inspected 7 are connected to one specimen socket and only a power source switch 4 to which a specimen terminal (hereinfater referered to as the terminal) selected as the inspection target is put ON. Then, e.g. a switch 8 for inspection of B10 is put ON while e.g. the switch 8 of B8, B9 connected to another terminal belonging to the same circuit as the selected terminal is put OFF, and the switches of B1 to B7 connected to the terminal belonging to another circuit are put ON. Further, e.g. the switch 9 for inspection of C10 connected to the selected terminal is put ON while other switches 9 are all put OFF and voltage between the output terminal of the switch 9 and the ground is detected (11), thereby enabling judgement of abnormality in the circuit according to the intensity of the voltage.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for inspecting whether or not an aging board used for initial failure inspection of electronic parts such as IC has been broken or short-circuited by repeated use. Relates to an inspection method using.

[0002]

2. Description of the Related Art In general, electronic parts such as ICs have a high probability of failure within a few hundred hours after the start of use, and after the initial failure period, they can withstand long-term use up to their durability limit. Mostly. For this reason, electronic components are driven at a high temperature for a certain period of time before being shipped.
The thing which caused the initial failure is removed.

In the above-mentioned initial defect inspection, an aging board is used for mounting a large number of electronic parts and driving them at once.

Further explaining the aging substrate,
Generally, an aging board has a plurality of input terminals for receiving a power source for driving the mounted electronic parts and a plurality of sample sockets for mounting the electronic parts. Each sample socket corresponds to each connection terminal of the electronic parts. Then, a plurality of sample terminals are provided.

Each sample terminal is connected to a circuit having electric characteristics suitable for driving an electronic component, and an input terminal is provided according to the electric characteristics of this circuit.

By the way, this aging substrate is repeatedly used and is exposed to high temperature. Aging substrate deteriorates due to repeated use under high temperature,
When a disconnection or a short circuit occurs, normal electronic components cannot be driven and the meaning of the initial defect inspection is lost, so management of this aging board is required.

Conventionally, the management of the aging board is performed by a worker inspecting a main part for each terminal with a tester or the like capable of conducting a continuity test at regular intervals, or without performing such inspection. Regardless of the presence or absence, the aging substrate used for a certain period is replaced with a new one.

[0008]

However, it is extremely time-consuming to inspect each with a tester, and
It is almost impossible to inspect all the wiring of the aging board, and there is a problem in inspection accuracy.

Further, unconditionally exchanging the aging substrate after a certain period of time results in waste of discarding the aging substrate that can be used sufficiently.

The present invention has been made in view of the above problems, and an object of the present invention is to enable easy and highly accurate inspection of the presence or absence of abnormality in an aging substrate.

[0011]

For this reason, in the invention of claim 1, a power supply terminal 3 for connecting a constant current source 2 to each input terminal 1 of the aging board, each power supply terminal 3 and a constant current source 2 are provided. , A plurality of inspection terminals 7 respectively connected to each sample terminal 6 of at least one sample socket 5 of the aging board, and sequentially connected to each inspection terminal 7. The first inspection switch 8 and the second inspection switch 9, and the respective first inspection switch 8 and the second inspection switch 9.
This is a device for inspecting an aging board, which is composed of a ground resistance 10 interposed between the inspection switches 9 and a voltage detector 11 to which each second inspection switch 9 is connected.

Further, according to the invention of claim 2, the power source terminal 3 of the aging board inspection device is connected to each input terminal 1 of the aging board, and each sample terminal of at least one sample socket 5 of the aging board is connected. 6 is connected to the inspection terminal 7, and the inspection terminal 7 is connected to the sample terminal 6
Among these, while turning on one power switch 4 to which one sample terminal 6 selected as an inspection target is connected,
All the other power switches 4 are turned off, and the first inspection switch is connected to the sample terminals 6 other than the selected sample terminal 6 and having the same circuit attribute as the selected sample terminal 6. While all 8 are turned off, all the first inspection switches 8 connected to the selected sample terminal 6 and the sample terminal 6 having a circuit attribute different from the selected sample terminal 6 are turned on to select the selected sample terminal. The second inspection switch 9 connected to 6 is turned on, while the other second inspection switches 9 are all turned off, and the voltage detector 11 outputs the output voltage between the output terminal of the second inspection switch 9 and the ground. Is to be measured.

Further, in the invention of claim 3, the power switch 4, the first inspection switch 8 and the second inspection switch 9 are provided.
ON / OFF of the storage device 12 and the controller 13 are automatically performed.

In this specification, the circuit attribute is an electrical characteristic of the circuit and is classified according to the type of signal supplied to the circuit. This circuit attribute is a so-called "clock type", in which a clock of a certain frequency is applied,
The clock type is roughly classified into a so-called "ground type" connected to the ground and a so-called "power source type" to which a power supply voltage is supplied, and the clock type is classified as a circuit attribute that differs for each frequency of the clock. In this specification, the clock types having different frequencies are referred to as “clock 1 type” and “clock 2”.
Type ", ... Also, clock 1
Type, clock 2 type, ... Signal circuits connected to the signal via a resistor are included in clock 1 type, clock 2 type, .. The signal circuit connected to the ground via a resistor is the ground type. A so-called pull-up signal circuit that is included and to which a power supply voltage is applied via a resistor is included in the power supply type.

[0015]

In the invention of claim 1, the power switch 4 is
This is for connecting the inspection constant current source 2 to any one of the input terminals 1 of the aging board, and can be switched depending on which sample terminal 6 is inspected.

The first inspection switch 8 adversely affects the sample terminal 6 to be inspected due to leakage from the sample terminal 6 to be inspected and the circuit to which the sample terminal 6 to be inspected is connected. For selecting another sample terminal 6 connected to the circuit for applying

The second inspection switch 9 is for selecting only the sample terminal 6 to be inspected.

Further, the ground resistance 1 according to the invention of claim 1
0 is for allowing the voltage detector 11 to measure the output voltage between the output terminal of the second inspection switch 9 and the ground.

In the second aspect of the present invention, only one power switch 4 to which the sample terminal 6 selected as the inspection target is connected is turned on because the state of the circuit to which the selected sample terminal 6 is connected. Is to be accurately inspected without being affected by other circuits.

All the first inspection switches connected to the sample terminal 6 having a circuit attribute different from that of the selected sample terminal 6 are turned on.
N is set so that when a leak occurs between circuits having different circuit attributes, a leak current flows to the ground through the ground resistance 10 and causes a change in the output voltage between the output terminal of the second inspection switch 9 and the ground. This is because. In addition, the sample terminals 6 other than the selected sample terminals 6 having the same circuit attributes as the selected sample terminals 6
The reason why all the first inspection switches 8 connected to are turned off is that the circuits having the same circuit attribute are not electrically insulated from each other, so that no leak occurs.

Further, in the invention of claim 2, only the second inspection switch 9 connected to the selected sample terminal 6 is turned on.
N is for connecting the constant current source 2 to the voltage detector 11 only through the circuit of the selected sample terminal 6 so that the presence or absence of disconnection in this circuit can be inspected.

By measuring the output voltage between the output terminal of the second inspection switch 9 and the ground with the voltage detector 11, it is possible to detect a leak as a decrease in the output voltage and a disconnection as a non-detection of the output voltage. ..

In particular, the invention of claim 3 automates many parts of the inspection operation.

[0024]

1 shows an example of an aging board inspection apparatus according to the present invention, and FIG. 2 shows an example of a circuit of an aging board to be inspected by the inspection apparatus.

This inspection apparatus has a constant current source 2 on the input side,
It has a power supply terminal 3 for connecting the constant current source 2 to the input terminal 1 of the aging board, and a power supply switch 4 interposed between the constant current source 2 and the power supply terminal 3.

The aging substrate in this embodiment is D1.
It has seven input terminals 1 to D7, and seven constant current sources 2 and three power supply terminals 3 of the present inspection apparatus are prepared in accordance with this. Further, seven power supply switches A1 to A7 are respectively interposed between each constant current source 2 and the power supply terminal 3.

On the other hand, the output side of the present inspection apparatus is connected to all of the sample terminals 6 (10 terminals E1 to E10 in this embodiment) provided in one socket 5 of the aging board. Of the inspection terminals 7, 10 first inspection switches 8 of B1 to B10 and 10 second inspection switches 9 of C1 to C10, which are sequentially connected to the inspection terminals 7, respectively, and each of the first inspection switches 7. It has ten ground resistances 10 interposed between the inspection switch 8 and the second inspection switch 9. The output terminal of each second inspection switch 9 is connected to the voltage detector 11.

In this embodiment, one sample socket 5 is used.
Although the inspection terminals 7 are provided corresponding to the above, the inspection terminals 7 can be prepared corresponding to the plurality of sample sockets 5. That is, it is possible to further prepare one set or two or more sets of ten inspection terminals 7 as shown in the drawing and simultaneously inspect a plurality of sample sockets 5. In this case, the output voltage may be measured for each set of the inspection terminals 7 group.

Next, an inspection method using this inspection apparatus will be described.

First, the power supply terminals 3 of the inspection apparatus are connected to the input terminals 1 of the aging board, and the inspection terminals 7 of the inspection apparatus are respectively connected to one sample socket 5 of the aging board.
Connect to the sample terminal of.

For convenience of description, the power supply terminals 3 connected to the power supply switches 4 of A1 to A7 are sequentially connected to the input terminals 1 of D1 to D7, and the first inspection switch 8 of B1 to B10 is connected for inspection. The description will be made assuming that the terminal 7 is sequentially connected to the sample terminals 6 of E1 to E10. The circuit attributes of the lines L1 to L10 of the aging board shown in FIG. 2 are as shown in the following table as an example.

[0032]

[Table 1]

After the connection between the power supply terminal 3 and the inspection terminal 7, the power supply switch 4, the first inspection switch 8 and the second inspection switch 9 are appropriately turned ON / OFF to perform the inspection.

Only one of the power switches 4 is turned on.
Let N. Which power switch 4 to turn on,
It is selected depending on which sample terminal 6 is selected as the inspection target.

For example, when the sample terminal 6 of E10 is selected as an inspection target, the sample terminal 6 of E10 is connected to the line of L6, and the input terminal 1 of the line of L6 is D5. The power switch 4 of A5 connected to is turned on. Further, for example, when the E6 sample terminal 6 is selected, the E5 sample terminal 6 is connected to the L2 line, and the L2 line input terminal 1
Are D2 and D3, therefore, there are A2 and A3 as the power switch 4 connected to them. In this case, either one may be selected, but only one of them is turned on.

ON / OFF of the first inspection switch 8 is
It is performed under the following three conditions.

(1) The first inspection switch 8 connected to the sample terminal 7 selected as the inspection target is turned on.

(2) All the first inspection switches 8 connected to the other sample terminals 7 having the same circuit attributes as the selected sample terminal 7 are turned off.

(3) First inspection switch 8 connected to the sample terminal 7 having a circuit attribute different from that of the selected sample terminal 7
Turn all on.

More specifically, since the line L6 to which the sample terminal 6 of E10 is connected is "power supply type" from the above table, the circuit attribute of the sample terminal of E10 is "power supply type". Will be Further, since the line L2 to which the sample terminal 6 of E5 is connected is also “ground type” from the above table, the circuit attribute of the sample terminal 6 of E5 is “ground type”. Similarly, if the circuit attributes of the other sample terminals 6 are arranged, E1 is the clock 1
Type, E2 is ground type, E3 is ground type, E4 is ground type, E6 is clock 2 type, E7 is clock 2
Type, E8 is a power source type, and E9 is a power source type.

For example, when the sample terminal 6 of E10 is selected as the inspection target, the first inspection switch 8 of B10 connected to this E10 is turned on. By the way, this E1
Since the circuit attribute of 0 is "power supply type" as described above, the first inspection switch 8 connected to the other sample terminal 6 of this "power supply type", that is, the sample terminals 6 of E8 and E9 All of the connected first inspection switches 8 of B8 and B9 are OF
Set to F. Further, the sample terminals 6 having circuit attributes other than "power supply type", that is, E1, E2, E3, E4, E5, E6 and E.
All of the first inspection switches 8 of B1, B2, B3, B4, B5, B6 and B7 connected to 7 are turned on.

For example, when the sample terminal 6 of E5 is selected as the inspection target, the first inspection switch 8 of B5 is turned on, while E5 is the "ground type", so that other than the "ground type" is selected. All of the first inspection switches 8 of B2, B3 and B4 connected to the sample terminal 6 of
Set to F. Further, B1, B6, B7, B8, B9 connected to the sample terminals 6 having circuit attributes other than "ground type"
And all the first inspection switches 8 of B10 are turned on.

Further, the second inspection switch 9 is turned on / off.
F is performed by turning on only the second inspection switch 9 connected to the sample terminal 6 selected as the inspection target and turning off all the other second inspection switches 9.

For example, when the sample terminal 6 of E10 is selected, only the second inspection switch 9 of C10 is turned on and all the other second inspection switches 9 are turned off. Further, for example, when the sample terminal 6 of E5 is selected, only the second inspection switch 9 of C5 is turned on and all the other second inspection switches 9 are turned off.

After the above operation, the voltage detector 11
The output voltage between the output terminal of the second inspection switch 9 and the ground is measured. Then, the abnormality of the circuit to which the selected sample terminal 6 is connected can be determined from the measured magnitude of the output voltage. That is, if the measured output voltage is smaller than the reference value, it is recognized that there is a leak, and when almost no output voltage is measured, it is recognized that a wire breakage has occurred. The reference value of the output voltage is
It is determined based on the current value of the constant current power supply 2, the circuit characteristics of the aging board, the resistance value of the grounding resistance 10, etc., and may be set to a slightly lower value or a slightly higher value depending on how strict the inspection is. it can.

In the inspection method using the present inspection apparatus, it is possible to carry out all ON / OFF operations of the power switch 4, the first inspection switch 8 and the second inspection switch 9 manually. When the storage device 12 and the controller 13 are used as shown in FIG. 3, these ON / OFF operations can be automated, and the operation becomes extremely easy.
Operation mistakes can be prevented.

This will be further described.

Each power switch 4, each first inspection switch 8 and each second inspection switch 9 are connected to a controller 13 and turned on by a signal from the controller 13.
It is turned off. Each second inspection switch 9 is connected to a controller 13 via a voltage detector 11, and the controller 13 further includes an input device 14 and a storage device 12.
And the display 15 is connected.

First, the storage device 12 stores which power supply switch 4 is turned on when which sample terminal 6 is selected as an inspection target. At the same time, the circuit attribute of each sample terminal 6 and which inspection terminal 7 is connected to which sample terminal 6, in other words, which sample terminal 6 is connected to which first inspection switch 8 and second inspection The storage device 12 stores whether or not the switch 9 for connection is connected. This storage is performed by the input device 14, and when each power supply terminal 3 and the inspection terminal 7 are always connected to the same position of the same aging board, this storage can be repeatedly used after it is stored once. is there.

When any one of the sample terminals 6 is selected as an inspection target, only one power switch 4 stored in correspondence with the selected sample terminal 6 is turned on and the selection is made. Based on the circuit attributes stored for the sample terminals 6 and the circuit attributes stored for the other sample terminals 6, the first inspection switch 8 automatically operates in accordance with the above-mentioned three conditions. ON / OF
Only the second inspection switch 9 which is stored in F and is connected to the selected sample terminal 6 is turned on.
To be done.

For the ON / OFF control, for example, a CPU is used as the controller 13, and each power switch 4, the first inspection switch 8 and the second inspection switch 8 are stored based on the storage of the storage device 12.
The inspection switch 9 is selectively turned on by the controller 13.
This is done by sending an OFF signal. And this ON
After the OFF control, the signal from the voltage detector 11 is changed to the controller 1
3, the output voltage value indicated by this signal is compared with the reference value stored in the storage device 12 in advance, and the result is displayed on the display unit 15.

In this inspection method, which sample terminal 6 to be selected as an inspection target may be manually input from the input device 14, but the selection order is stored in the storage device 12 in advance. Alternatively, the inspection may be performed by automatically switching the sample terminals 6 to be inspected in that order.

[0053]

The present invention is as described above, and when inspecting one circuit of the aging board, the inspection can be performed in consideration of the relationship between the circuit and other circuits, so that it is strict. The inspection can be performed without waste, and the failure of the initial defect inspection due to the continuous use of the abnormal aging board and the wasteful disposal of the usable aging board can be prevented.

[Brief description of drawings]

FIG. 1 is a circuit diagram showing an embodiment of an inspection apparatus for an aging board according to the present invention.

FIG. 2 is a circuit diagram showing an example of an aging board which is an inspection target of the inspection apparatus of FIG.

FIG. 3 is a circuit diagram showing an aging board inspection apparatus according to another embodiment of the present invention.

[Explanation of symbols] 1 input terminal 2 constant current source 3 power supply terminal 4 power supply switch 5 sample socket 6 sample terminal 7 inspection terminal 8 first inspection switch 9 second inspection switch 10 ground resistance 11 voltage detector 12 Storage device 13 Control device 14 Input device 15 Display device

Claims (3)

[Claims] 1. A power supply terminal for connecting a constant current source to each input terminal of the aging board, a power supply switch interposed between each power supply terminal and the constant current source, and at least one sample of the aging board. A plurality of inspection terminals each connected to each sample terminal of the socket, a first inspection switch and a second inspection switch sequentially connected to each inspection terminal, each of the first inspection switch and the second inspection switch An aging board inspection apparatus comprising a ground resistance interposed between inspection switches and a voltage detector to which each second inspection switch is connected. 2. The power supply terminal of the aging board inspection device according to claim 1 is connected to each input terminal of the aging board, and the inspection terminal is connected to each sample terminal of at least one sample socket of the aging board. , Of the sample terminals to which the inspection terminals are connected, one of the sample terminals selected for inspection is connected to one power switch, while all other power switches are turned off. All the first inspection switches connected to the sample terminals other than the sample terminals, which have the same circuit attributes as the selected sample terminal, are turned off, while the selected sample terminal and the selected sample terminal Turns on all the first inspection switches connected to the sample terminals that have circuit attributes different from those of the test terminals
And turn on the second inspection switch connected to the selected sample terminal, while turning off all other second inspection switches.
The method for inspecting an aging board is characterized in that the voltage detector measures the output voltage between the output terminal of the second inspection switch and the ground. 3. The circuit attribute of each sample terminal and one power switch corresponding to each sample terminal are stored in a memory device, and when one sample terminal is selected as an inspection target, the memory of this memory device is stored. Based on the controller,
The aging board inspection method according to claim 2, wherein the power switch, the first inspection switch, and the second inspection switch are automatically turned on and off.