JPH0534559U - Liquid particle analyzer - Google Patents
Liquid particle analyzerInfo
- Publication number
- JPH0534559U JPH0534559U JP9224391U JP9224391U JPH0534559U JP H0534559 U JPH0534559 U JP H0534559U JP 9224391 U JP9224391 U JP 9224391U JP 9224391 U JP9224391 U JP 9224391U JP H0534559 U JPH0534559 U JP H0534559U
- Authority
- JP
- Japan
- Prior art keywords
- base plate
- housing
- particle
- heat
- detecting means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
- Optical Measuring Cells (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】
【目的】この考案は、粒子検出のために高温の液体試料
を導入したときに生じる装置各部の温度上昇を抑制すべ
く、放熱効果を向上することを目的とする。
【構成】筐体3の上面をアルミ製のベース板2で形成
し、光学系および流体系からなる子検出部1がベース板
2に取着されている。かかる構成により、ベース板2が
直接外気に触れているので、粒子検出部1の放熱が有効
に行われる。
(57) [Summary] [Object] The present invention aims to improve the heat dissipation effect in order to suppress the temperature rise of each part of the apparatus that occurs when a high temperature liquid sample is introduced for particle detection. [Structure] An upper surface of a housing 3 is formed of a base plate 2 made of aluminum, and a child detection unit 1 including an optical system and a fluid system is attached to the base plate 2. With this configuration, since the base plate 2 is in direct contact with the outside air, the particle detector 1 can effectively dissipate heat.
Description
【0001】[0001]
この考案は、液中微粒子計に関し、特に高温の液体試料を導入しても、装置内 部の温度上昇を緩和することができる放熱対策を施した液中微粒子計に関するも のである。 The present invention relates to an in-liquid particle meter, and more particularly to an in-liquid particle meter with a heat dissipation measure that can mitigate the temperature rise inside the device even when a high-temperature liquid sample is introduced.
【0002】[0002]
半導体や電子工業などの産業分野では、洗浄用として高温の洗浄水や洗浄用薬 品が用いられている。これは、温度を高くすることにより媒質液体の溶解度が高 まり、洗浄効果を増すことがその利点である。また、最近オゾン層破壊の問題か らフレオンが規制され、代替品として温純水に対する関心が高まっている。以上 のような背景から、高温の液体試料を測定することができる液中微粒子計の潜在 市場は高いと予想される。しかし、従来、高温の液体試料の測定を保証した液中 微粒子計は市販されていないのが実情である。 In industrial fields such as the semiconductor and electronics industries, high-temperature cleaning water and cleaning chemicals are used for cleaning. This is because the solubility of the medium liquid is increased by increasing the temperature and the cleaning effect is increased. Freon has recently been regulated due to the problem of ozone depletion, and interest in hot pure water as an alternative is increasing. From the above background, the potential market for fine particle analyzers in liquids capable of measuring high-temperature liquid samples is expected to be high. However, in the past, no microparticle analyzer in liquid has been commercially available that guarantees the measurement of a high-temperature liquid sample.
【0003】 図3は従来の常温液体試料に対応した液中微粒子計を示し、発光素子、受光素 子、レンズ、ミラー、セル等からなる光学系と、継手およびセルからなる流体系 とからなる粒子検出手段1は、アルミ製のベース板2に取着されて筐体3に収納 されている。ここでは、筐体3のゆがみや、外部の振動が光学系の位置精度に与 える影響を抑制することに重点が置かれており、ベース板2は樹脂製の緩衝部材 4を介して筐体3の底部に固定されている。また、筐体3の下面にはゴム足5が 設けられている。FIG. 3 shows a conventional submerged particle counter for a room temperature liquid sample, which includes an optical system including a light emitting element, a light receiving element, a lens, a mirror, a cell, and a fluid system including a joint and a cell. The particle detecting means 1 is attached to an aluminum base plate 2 and housed in a housing 3. Here, the emphasis is placed on suppressing the distortion of the housing 3 and the influence of external vibrations on the positional accuracy of the optical system, and the base plate 2 is mounted on the housing via a buffer member 4 made of resin. It is fixed to the bottom of 3. Further, rubber feet 5 are provided on the lower surface of the housing 3.
【0004】 以上の構成により、液体試料は、イン継手6を通って粒子検出手段1に導入さ れ、粒子検出手段1を通過後、アウト継手7から外部へ排出される。この場合、 高温の液体試料を導入すると、熱は流体系からベース板2に伝達するが、固体間 の熱伝達で外部へ放熱するのに、断面積が小さく、かつ、熱伝達率の低い樹脂製 の緩衝部材4を最終的に介さざるをえないことになる。このため固体間の熱伝達 で放熱しきれない熱は、べース板2などに蓄積されていき、ついには対流により 筐体内空間を介して筐体表面へ伝わるようになる。このため、装置各部の温度が 相当高くなるという結果を招くことになる。With the above configuration, the liquid sample is introduced into the particle detecting means 1 through the in-joint 6, and after passing through the particle detecting means 1, is discharged from the out-joint 7 to the outside. In this case, when a high-temperature liquid sample is introduced, heat is transferred from the fluid system to the base plate 2, but heat is transferred between solids to be released to the outside, but the resin has a small cross-sectional area and a low heat transfer coefficient. Finally, the manufactured cushioning member 4 will have to be interposed. For this reason, the heat that cannot be dissipated by the heat transfer between the solids is accumulated in the base plate 2 and the like, and finally reaches the surface of the housing through the inner space of the housing by convection. As a result, the temperature of each part of the device is considerably increased.
【0005】[0005]
以上のような従来の液中微粒子計では、高温の液体試料の導入による装置各部 の高温化に伴う問題点として、次の3つを挙げることができる。 (1)熱膨張や温度サイクルおよび温度こう配のストレスにより、光学系部品の 位置精度に悪影響を及ぼす。 (2)筐体内部空間に発生する対流性のゆらぎが、光学系に影響してノイズを増 大させる。 (3)発光素子にレーザダイオードを用いている場合には、レーザダイオードの 温度を一定に制御することが安定な動作のために必要であるが、筐体温度が過 度に高まるとレーザダイオードの温度制御が困難になる。 In the conventional fine particle analyzer in liquid as described above, the following three problems can be cited as problems associated with the rise in temperature of each part of the apparatus due to the introduction of a high temperature liquid sample. (1) Thermal expansion, temperature cycle and temperature gradient stress adversely affect the positional accuracy of optical system components. (2) Fluctuations of convection generated in the space inside the housing affect the optical system and increase noise. (3) When a laser diode is used as the light emitting element, it is necessary to control the temperature of the laser diode at a constant level for stable operation, but if the housing temperature rises excessively, Temperature control becomes difficult.
【0006】 一方、従来の液中微粒子計に採用された放熱対策として、筐体にフアンを取付 け、内部にたまった熱を外部にはき出すようにしたものがある。しかし、この方 法は周囲空気の湿度と光学系部品の温度とのかねあいにより、光学系部品の表面 に結露することがあった。液中微粒子計は使用される周囲環境が厳しいことが多 いので、特に塩酸のような腐食性蒸気が装置内部に流入する場合には、上記の結 露により装置の寿命を縮めるという問題点があった。On the other hand, as a heat radiation measure adopted in the conventional liquid particle meter, there is one in which a fan is attached to the housing so that the heat accumulated inside is discharged to the outside. However, this method sometimes caused dew condensation on the surface of the optical system component due to the balance between the humidity of the ambient air and the temperature of the optical system component. Since the particle environment in a liquid is often used in a severe environment, there is a problem that the above condensation shortens the life of the device especially when corrosive vapor such as hydrochloric acid flows into the device. there were.
【0007】 この考案は上記の問題点を解消するために成されたもので、高温の液体試料を 導入した場合の装置各部の温度上昇を緩和し、かつ、光学系部品への結露を防止 することができる液中微粒子計を得ることを目的とする。The present invention was made in order to solve the above problems, and alleviates the temperature rise in each part of the apparatus when a high temperature liquid sample is introduced, and prevents dew condensation on optical system parts. The purpose is to obtain a fine particle analyzer in liquid.
【0008】[0008]
この考案に係る液中微粒子計は、粒子検出手段が取着されるベース板が、筐体 の一部をなしている。 In the in-liquid particle meter according to the present invention, the base plate to which the particle detecting means is attached forms a part of the housing.
【0009】 また、前記ベース板と他の筐体部材間に、柔軟性を有する熱絶縁部材が介在し ている。Further, a flexible heat insulating member is interposed between the base plate and another housing member.
【0010】 また、前記ベース板の外面に、放熱フィン、ファン、水冷用冷却管およびペル チェ素子の少なくとも1つが配置されている。At least one of a radiation fin, a fan, a cooling pipe for water cooling, and a Peltier element is arranged on the outer surface of the base plate.
【0011】[0011]
この発明においては、金属製のベース板が直接外気に触れるので、放熱効果が 増大する。また、ベース板表面に放熱フィン、冷却管などを配置すれば、放熱効 果はさらに増大する。 In the present invention, the metal base plate directly contacts the outside air, so that the heat radiation effect is increased. If heat radiation fins, cooling pipes, etc. are arranged on the surface of the base plate, the heat radiation effect will be further increased.
【0012】 また、ベース板と筐体の他の部分との間に柔軟な熱絶縁体を介在したことによ り、ベース板から他の部分への熱伝達が抑制され、かつ、筐体のひずみや外部の 振動がベース板に与える影響を緩和する。Further, since the flexible thermal insulator is interposed between the base plate and the other part of the housing, the heat transfer from the base plate to the other part is suppressed, and the housing Mitigates the effects of strain and external vibrations on the base plate.
【0013】[0013]
実施例1 図1は1実施例を示し、粒子検出手段1が取着されているアルミ製のベース板 2が、筐体3の上面を形成している。その他、図3におけると同一符号は同一部 分を示している。 Embodiment 1 FIG. 1 shows an embodiment, in which an aluminum base plate 2 to which a particle detecting means 1 is attached forms an upper surface of a housing 3. In addition, the same symbols as in FIG. 3 indicate the same parts.
【0014】 以上の構成により、ベ−ス板2が直接外気に接しているので、放熱効果が増大 する。ここで、ベ−ス板2を筐体3の一部とする場合、その位置を筐体の上面、 側面および底面の3通りが考えられるが、この実施例は、その中で最も放熱効果 の大きい上面にベ−ス板2を配置した。というのも、筐体3から外気への放熱は 、対流により下部から上方へと行われるが、ベ−ス板2を側面あるいは底面に配 置すると、ベ−ス板の上方に筐体3の他の部分が位置して放熱の妨害となる。こ の点、ベ−ス板2を上面とすると、ベ−ス板2の上方には自由な空間以外の何も なく、放熱が最も有効に行われる。With the above structure, since the base plate 2 is in direct contact with the outside air, the heat radiation effect is increased. Here, when the base plate 2 is used as a part of the housing 3, there are three possible positions, namely, the top surface, the side surface, and the bottom surface of the housing. In this embodiment, the heat dissipation effect is the highest. The base plate 2 was placed on the large upper surface. This is because heat is radiated from the housing 3 to the outside air by convection from the bottom to the top, but if the base plate 2 is placed on the side surface or the bottom surface, the housing 3 is placed above the base plate. The other parts are located and interfere with heat dissipation. At this point, when the base plate 2 is the upper surface, there is nothing other than a free space above the base plate 2, and heat is radiated most effectively.
【0015】 また、筐体3の上面をベ−ス板2とした場合の他の利点は、筐体内部空間の温 度分布が上方ほど高温になることから、対流性のゆらぎが発生しにくくなり、光 学系の安定性が保たれる。Another advantage of using the base plate 2 on the upper surface of the housing 3 is that convective fluctuations are less likely to occur because the temperature distribution in the internal space of the housing becomes higher toward the top. And the stability of the optical system is maintained.
【0016】 しかしながら、ベ−ス板2を筐体3の側面あるいは底面とした場合でも、ベ− ス板2が直接外気に触れることにより、放熱効果は従来装置に比べて格段と向上 することは明らかであり、これらもこの考案に含まれる。However, even when the base plate 2 is used as the side surface or the bottom surface of the housing 3, the heat dissipation effect is remarkably improved as compared with the conventional device by the direct contact of the base plate 2 with the outside air. Obviously, these are also included in this invention.
【0017】 実施例2 図2は他の実施例を示し、ベ−ス板2の上面に放熱フィン8とファン9を配置 し、より積極的に放熱を行わせるようにした。ベ−ス板2上に配置するものとし ては、さらに、水冷用の冷却管やペルチェ素子、あるいはこれらの組合せが考え られる。Embodiment 2 FIG. 2 shows another embodiment, in which heat radiating fins 8 and fans 9 are arranged on the upper surface of the base plate 2 so as to radiate heat more positively. Further, as the arrangement on the base plate 2, a cooling pipe for water cooling, a Peltier element, or a combination thereof can be considered.
【0018】 また、ベ−ス板2と筐体3の他の部分との間に熱絶縁部材10を介在させ、ベ −ス板2から上方の空間以外の装置の他の箇所への熱伝達を抑制した。この熱絶 縁部材10を配置したことの他の効果は、柔軟性のある例えばゴムのような熱絶 縁部材10を用いることにより、図3における緩衝部材4と同様に、筐体3のひ ずみや外部の振動がベ−ス板2に与える影響を緩和することにある。Further, a heat insulating member 10 is interposed between the base plate 2 and other portions of the housing 3 to transfer heat from the base plate 2 to other parts of the apparatus other than the upper space. Suppressed. Another effect of arranging the heat insulating member 10 is that, by using the heat insulating member 10 having flexibility, such as rubber, as in the cushioning member 4 in FIG. The purpose is to mitigate the influence of the strain and external vibrations on the base plate 2.
【0019】[0019]
以上のように、この考案によれば、ベ−ス板を筐体の一部としたことにより、 高温の液体試料を導入した場合の放熱効果を増大することができ、また、ベ−ス 板に放熱フィンや冷却管などを配置して放熱効果をさらに向上することができる 。さらに、光学部品への結露も防止することができる。 As described above, according to the present invention, the heat dissipation effect when a high temperature liquid sample is introduced can be increased by forming the base plate as a part of the housing. The heat radiation effect can be further improved by arranging heat radiation fins and cooling pipes on the. Further, it is possible to prevent dew condensation on the optical components.
【0020】 また、ベ−ス板と筐体の他の部分との間に柔軟性を有する熱絶縁部材を介在さ せることにより、装置部分への熱伝達を防ぎ、かつ、振動などの影響を緩和する ことができる。Further, by interposing a flexible heat insulating member between the base plate and the other part of the housing, heat transfer to the device part is prevented, and the influence of vibration etc. is prevented. Can be mitigated.
【図1】この考案の実施例1を示す断面図である。FIG. 1 is a sectional view showing a first embodiment of the present invention.
【図2】この考案の実施例2を示す断面図である。FIG. 2 is a sectional view showing a second embodiment of the present invention.
【図3】従来の液中微粒子計を示す断面図である。FIG. 3 is a cross-sectional view showing a conventional submerged particle meter.
(1)……粒子検出手段、(2)……ベ−ス板、(3)
……筐体、(8)……放熱フィン、(9)……ファン、
(10)……熱絶縁部材(1) ... Particle detection means, (2) ... Base plate, (3)
…… Case, (8) …… Radiation fin, (9) …… Fan,
(10) …… Heat insulation member
Claims (3)
段と、この粒子検出手段を収納する筐体と、この筐体の
一部をなし前記粒子検出手段が取着されている金属製の
ベース板とを備えてなる液中微粒子計。1. A particle detecting means comprising an optical system and a fluid system, a housing for accommodating the particle detecting means, and a metal part which is a part of the housing and to which the particle detecting means is attached. An in-liquid particle meter comprising a base plate.
な熱絶縁部材を備えた請求項1記載の液中微粒子計。2. The submerged fine particle meter according to claim 1, further comprising a flexible heat insulating member disposed between the base plate and another casing.
ペルチェ素子の少なくとも1つがベース板の外面に配置
されている請求項1記載の液中微粒子計。3. The submerged fine particle meter according to claim 1, wherein at least one of the radiation fin, the fan, the cooling pipe for water cooling, and the Peltier element is arranged on the outer surface of the base plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9224391U JPH0534559U (en) | 1991-10-15 | 1991-10-15 | Liquid particle analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9224391U JPH0534559U (en) | 1991-10-15 | 1991-10-15 | Liquid particle analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0534559U true JPH0534559U (en) | 1993-05-07 |
Family
ID=14048995
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9224391U Pending JPH0534559U (en) | 1991-10-15 | 1991-10-15 | Liquid particle analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0534559U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220099954A (en) * | 2019-11-22 | 2022-07-14 | 파티클 머슈어링 시스템즈, 인크. | Advanced Systems and Methods for Interfering Particle Detection and Small Size Particle Detection |
-
1991
- 1991-10-15 JP JP9224391U patent/JPH0534559U/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220099954A (en) * | 2019-11-22 | 2022-07-14 | 파티클 머슈어링 시스템즈, 인크. | Advanced Systems and Methods for Interfering Particle Detection and Small Size Particle Detection |
| JP2023501769A (en) * | 2019-11-22 | 2023-01-19 | パーティクル・メージャーリング・システムズ・インコーポレーテッド | Advanced systems and methods for interfering particle detection and detection of particles with small size dimensions |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7597134B2 (en) | Heat dissipation device with a heat pipe | |
| ES2488094T3 (en) | Sampling unit of a position measurement facility | |
| US6867974B2 (en) | Heat-dissipating device | |
| US20050117305A1 (en) | Integrated heat sink assembly | |
| US7537049B2 (en) | Heat dissipation apparatus | |
| JPH07142886A (en) | Electronic device cooling device | |
| JP2001110967A (en) | Heat dissipation structure of electronic element | |
| US20090153805A1 (en) | Portable projector with a heat dissipation system | |
| JP2006292269A (en) | Cooling system | |
| JP7724640B2 (en) | Light source device, method for manufacturing light source device, and projector | |
| US7129501B2 (en) | Radiation detector system having heat pipe based cooling | |
| KR20080012329A (en) | Heated pressure transducer | |
| US7447025B2 (en) | Heat dissipation device | |
| US10165708B2 (en) | Cooling mechanism used inside gimbal | |
| US20040109301A1 (en) | Cooling device for an integrated circuit | |
| JPH0534559U (en) | Liquid particle analyzer | |
| CN110867425A (en) | A chip radiator and electronic equipment equipped with chips | |
| JP2000196269A (en) | Circuit module | |
| US3269185A (en) | Dewpoint sensing structure | |
| JP7659168B2 (en) | X-ray diffraction measurement equipment | |
| US20120273168A1 (en) | Heat dissipation device with heat pipe | |
| US20070097625A1 (en) | Printed circuit board with a heat dissipation device | |
| JP2011007600A (en) | Measuring instrument | |
| JP2007274569A (en) | Imaging device | |
| CN219609495U (en) | Constant temperature device of refrigeration type infrared light conduction sensor |