JPH0555861B2 - - Google Patents

Info

Publication number
JPH0555861B2
JPH0555861B2 JP7381683A JP7381683A JPH0555861B2 JP H0555861 B2 JPH0555861 B2 JP H0555861B2 JP 7381683 A JP7381683 A JP 7381683A JP 7381683 A JP7381683 A JP 7381683A JP H0555861 B2 JPH0555861 B2 JP H0555861B2
Authority
JP
Japan
Prior art keywords
layer
electrophotographic photoreceptor
type
type semiconductor
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7381683A
Other languages
Japanese (ja)
Other versions
JPS59200245A (en
Inventor
Masao Obara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP7381683A priority Critical patent/JPS59200245A/en
Publication of JPS59200245A publication Critical patent/JPS59200245A/en
Publication of JPH0555861B2 publication Critical patent/JPH0555861B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Description

【発明の詳細な説明】 〔発明の属する技術〕 この発明は耐久性に秀れ、高い光感度を有する
電子写真感光体に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technology to which the invention pertains] The present invention relates to an electrophotographic photoreceptor having excellent durability and high photosensitivity.

〔従来技術とその問題点〕[Prior art and its problems]

現在電子写真感光体としては、Se,CdS,
OPC等が実用されているが、これらは機械的強
度、感度等に難点があり、又Se,CdS等は有毒で
もあるので、硬く機械的強度に秀れ、感度も優秀
でかつ無害なa−Siを電子写真感光体に用いるべ
く鋭意研究がなされている。しかしa−Siは比抵
抗が10″Ω−cm程であるのでSeの様に単にAl基板
の上に蒸着するだけでは充分なる誘電緩和時間を
稼げないので通常はAl基板とa−Siとの間にp
もしくはn型のa−Si層を形成してAl基板から
のcarrierの注入を阻止して誘電緩和時間を長く
する。こうするとa−Siでも電子写真感光体が出
来るが、例えば通常用いられる正帯電用の感光体
を形成する場合、a−Siの正孔のμγ積は高々10-7
cm2/Vであるので膜厚はせいぜい30μ、程度にし
か出来ない。一方表面電位は通常500V以上要求
されるので感光体中の電界は〜2×105V/cmと
いう非常に大きなものになる。このため上記の感
光体では基板からのcerrierの注入を阻止してい
る層がbreak downを起こし易く、画像に傷がは
いる。又blocking層に用いるp層は例えばBをSi
に対して10-3程度dopingするが、Bを10-4以上
dopeしたa−Siは比較的もろくcrackがはいり易
く機械的強度が充分でない。そのためblocking層
に細いcrackがはいつて画像の傷となりはなはだ
しい場合には感光体が基板から剥離してしまう場
合もある。
Currently, electrophotographic photoreceptors include Se, CdS,
OPC etc. are in practical use, but these have disadvantages in mechanical strength and sensitivity, and Se, CdS, etc. are also toxic, so a- Intensive research is being conducted to use Si in electrophotographic photoreceptors. However, since a-Si has a resistivity of about 10''Ω-cm, it is not possible to obtain sufficient dielectric relaxation time by simply depositing it on an Al substrate like Se, so usually the bond between the Al substrate and a-Si is between p
Alternatively, an n-type a-Si layer is formed to prevent carrier injection from the Al substrate and lengthen the dielectric relaxation time. In this way, an electrophotographic photoreceptor can be made using a-Si, but for example, when forming a normally used photoreceptor for positive charging, the μγ product of holes in a-Si is at most 10 -7
cm 2 /V, the film thickness can only be about 30μ at most. On the other hand, since the surface potential is normally required to be 500 V or more, the electric field in the photoreceptor becomes very large, about 2×10 5 V/cm. For this reason, in the photoreceptor described above, the layer that prevents the injection of cerrier from the substrate is likely to break down, causing scratches on the image. In addition, the p layer used for the blocking layer is made of Si, for example, B.
Doping about 10 -3 to B, but doping B to 10 -4 or more
Doped a-Si is relatively brittle and easily cracks, and does not have sufficient mechanical strength. As a result, thin cracks form in the blocking layer, causing damage to the image and, in severe cases, causing the photoreceptor to separate from the substrate.

〔発明の目的〕[Purpose of the invention]

この発明は上記の従来技術の欠点を改良したも
ので充分長い誘電緩和時間と充分な耐圧を有し、
基板から感光体が剥離することがなく、良好な画
像が安定して得ることの出来るa−Si電子写真感
光体を提供することにある。
This invention improves the drawbacks of the above-mentioned prior art and has a sufficiently long dielectric relaxation time and sufficient breakdown voltage.
It is an object of the present invention to provide an a-Si electrophotographic photoreceptor that can stably obtain good images without causing the photoreceptor to peel off from the substrate.

〔発明の概要〕[Summary of the invention]

本発明においては、基板と感光体層の間に設け
る基板からのcarrierの注入を阻止するblocking
層を例えば正帯電の場合には、基板側からSiとC
とを母体とするB等の第族a亜族の元素をSiに
対して10-3程度dopingしたp型a−Si層、続いて
i層、SiもしくはSiとCとを母体とするP等の第
族a亜族の元素をSiに対して10-4程度dopingし
たn型のa−Siもしくはa−SiC層の順に積層し
て形成することによりblocking層の耐圧を向上さ
せるとともにblocking層のひずみを緩和して
micro crackの発生を防いで良好な画像を安定し
て得られる様にした。
In the present invention, blocking is provided between the substrate and the photoreceptor layer to prevent carrier injection from the substrate.
For example, if the layer is positively charged, Si and C are charged from the substrate side.
A p-type a-Si layer in which Si is doped with an element of group a subgroup such as B having a matrix of about 10 -3 , followed by an i layer, and a P etc. having a matrix of Si or Si and C. By stacking n-type a-Si or a-SiC layers in which Si is doped with an element of Group A subgroup of about 10 -4 in order, the withstand voltage of the blocking layer can be improved and the blocking layer can be improved. Alleviate the strain
This prevents the occurrence of micro cracks and allows stable images to be obtained.

〔発明の効果〕〔Effect of the invention〕

本発明では、blocking層を例えば正帯電の場合
基板からa−SiCxに例えばBをdopeしたp型半
導体層、i層、続いてa−Siもしくはa−SiCx
に例えばPをdopeしたn型半導体層を積層して
構成し、基本的にp−n接合を形成してblocking
層の耐圧を向上させ、更に基板に接触するp型半
導体層をa−SiCxにしてこの層の内部歪みを緩
和して膜のハガレ等を防いでいるので常に安定し
て良好な画像が得られる。なおn型半導体層にa
−SiCxを用いるとblocking layerの歪みの緩和
には一層効果的である。
In the present invention, the blocking layer is, for example, a p-type semiconductor layer doped with B to a-SiCx from the substrate in the case of positive charging, an i-layer, and then a-Si or a-SiCx.
For example, an n-type semiconductor layer doped with P is stacked on top of the layer to form a p-n junction and blocking
In addition to improving the withstand voltage of the layer, the p-type semiconductor layer in contact with the substrate is made of a-SiCx to alleviate the internal strain of this layer and prevent film peeling, so you can always obtain stable and good images. . Note that a is added to the n-type semiconductor layer.
-Using SiCx is more effective in alleviating strain in the blocking layer.

〔発明の実施例〕[Embodiments of the invention]

正帯電用感光体の場合を例に挙げる。(第1図
参照)基板としては、Alドラムを用いこれを脱
脂処理した後、通常に良く知られたグロー放電分
解によりSiH4ガス等の原料を分解してa−Siを
堆積する。すなわちAlドラム101)を200℃に昇温し
た後SiH4とB2H6とCH4の混合ガスを0.5torr,
25Wでグロー放電分解してBを対Si比10-3dopeし
たp型a−SiCx:H層102)を0.1μ堆積し、続いて
Bを対Si比-6dopeしたi型a−Si:H層103)を1μ、
更にSiH4とPH3とCH4の混合ガス0.5torr、25W
でグロー放電分解してPを対Si比10-4dopeしたn
型a−SiCx:H層104)を0.1μ形成してblocking層
とした。そしてこの上にBを対Si比10-6dopeした
i型a−Si:H層105)を0.5torr,100Wのグロー放
電で20μ堆積して感光層とし、この上にSiH4
CH4の混合ガスのグロー放電によりa−SiCx:
H106)を0.1μ形成して保護層とした。こうして得
られた感光体ドラム107)は表面電位+600V、現像
バイアス100Vで画像をcopyしてもblocking
layerはbreakdownせず又blocking層の内部歪み
を十分緩和してあるのでblocking層中にmicro
crackが発生せずこれに起因する画像の傷がなく
Alドラムから感光体が剥離することがないので
常に安定して良好な画像が得られる。
Let us take as an example the case of a positively charging photoreceptor. (See FIG. 1) As the substrate, an Al drum is used, and after degreasing the drum, a-Si is deposited by decomposing raw materials such as SiH 4 gas by well-known glow discharge decomposition. That is, after raising the temperature of the Al drum 101) to 200℃, a mixed gas of SiH 4 , B 2 H 6 and CH 4 was heated at 0.5 torr.
P-type a-SiCx doped with B at a ratio of 10 -3 to Si by glow discharge decomposition at 25 W: 0.1μ of H layer 102) was deposited, followed by i-type a-Si doped with B at a ratio of -6 to Si: H layer 103) 1μ,
Furthermore, mixed gas of SiH 4 , PH 3 and CH 4 0.5torr, 25W
P was doped with a ratio of 10 -4 to Si by glow discharge decomposition.
A 0.1 μm type a-SiCx:H layer 104) was formed to serve as a blocking layer. Then, 20μ of an i-type a-Si:H layer 105) doped with B at a ratio of 10 -6 to Si is deposited on top of this by glow discharge at 0.5 torr and 100W to form a photosensitive layer, and on top of this, SiH 4 and
a-SiCx by glow discharge of mixed gas of CH4 :
A protective layer was formed by forming 0.1 μm of H 106) . The photoreceptor drum 107) obtained in this way does not block even if an image is copied with a surface potential of +600V and a developing bias of 100V.
The layer does not break down, and the internal strain of the blocking layer is sufficiently relaxed, so micro
No cracks occur and there are no scratches on the image caused by this.
Since the photoreceptor does not peel off from the Al drum, stable and good images can be obtained at all times.

上の例ではblocking層がp−i−n構造となつ
ているが、これはp−n接合としても良い。ただ
しこの場合p層を十分厚くするとともにゆつくり
成膜してgap内のstateを充分低いレベルに抑える
ことが必要となる。
In the above example, the blocking layer has a p-i-n structure, but it may also be a p-n junction. However, in this case, it is necessary to make the p layer sufficiently thick and slowly form the film to suppress the state within the gap to a sufficiently low level.

以下にその実施例を示す。(第2図参照) 前例同様に200℃に昇温したAlドラム上にSiH4
等の原料ガスのグロー放電分解でa−Siを堆積し
た。すなわちまずAlドラム201)上にSiH4とCH4
B2H6の混合ガス0.5torr5Wでグロー放電分解して
Bを対Si比10-3dopeしたp型a−SiCx:Hを
0.8μ202)、続いてSiH4とCH4とPH3の混合ガスの
0.5torr、5Wのグロー放電でPを対Si比10-4dope
したn型a−SiCx:Hを0.2μ203)堆積して
blocking層とする。この上にBを対Si比10-6dope
したi型のa−Si:H層204)を20μ堆積して感光層
とした。最後に保護層としてSiH4とCH4の混合
ガスのグロー放電でa−SiCx:H205)を0.1μ形成
した。こうして得られた感光体ドラムは表面電位
+550V、現像バイアス80Vでの画像出しでも先
に挙げた実施例同様良好な画像を安定して得るこ
とが出来た。
Examples are shown below. (See Figure 2) SiH 4 was placed on an Al drum heated to 200℃ as in the previous example.
a-Si was deposited by glow discharge decomposition of raw material gases such as That is, first, SiH 4 and CH 4 are placed on the Al drum 201).
P-type a-SiCx:H doped with B at a ratio of 10 -3 to Si by glow discharge decomposition with a mixed gas of B 2 H 6 at 0.5 torr 5 W.
0.8μ 202) , followed by a mixed gas of SiH 4 , CH 4 and PH 3.
P to Si ratio of 10 -4 dope with 0.5torr, 5W glow discharge
203) Deposit 0.2μ of n-type a-SiCx:H.
Use as a blocking layer. On top of this, add B to Si ratio 10 -6 dope
A 20 μm i-type a-Si:H layer 204) was deposited to form a photosensitive layer. Finally, 0.1 μm of a-SiCx:H 205) was formed as a protective layer by glow discharge of a mixed gas of SiH 4 and CH 4 . The thus obtained photoreceptor drum was able to stably obtain good images as in the above-mentioned examples even when images were produced at a surface potential of +550 V and a developing bias of 80 V.

なお上記の実施例では、正帯電用ドラムについ
てのみ例示したが、負帯電用ドラムでもblocking
層とn−type a−SiCx:H/i type a−
Si:H/p−type a−SiCx:Hないしはn−
type a−SiCx:H/p−type a−SiCx:Hと
すれば同様の効果が得られる。
In the above example, only the positive charging drum was illustrated, but blocking can also be applied to the negative charging drum.
Layer and n-type a-SiCx: H/i type a-
Si:H/p-type a-SiCx:H or n-
Similar effects can be obtained by setting type a-SiCx:H/p-type a-SiCx:H.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は本発明の実施例を説明する
為の断面図である。
FIGS. 1 and 2 are cross-sectional views for explaining an embodiment of the present invention.

Claims (1)

【特許請求の範囲】 1 所定の導電性基板上に形成される、基板と感
光層との間に電荷注入阻止層を有する電子写真感
光体において、前記感光層が非晶質Siで、前記電
荷注入阻止層が基板側から正孔を多数キヤリアー
とするSiとCとを母体とするp型半導体の第1
層、真性なSiを母体とする半導体のi層の第2
層、電子を多数キヤリアーとするn型半導体の第
3層からなるか又は基板側から電子を多数キヤリ
アーとするSiとCとを母体とするn型半導体の第
1層、i層の第2層、正孔を多数キヤリアーとす
るp型半導体の第3層からなることを特徴とする
電子写真感光体。 2 電荷注入阻止層の第3層がSiとCとを母体と
するn型又はp型半導体である前記特許請求の範
囲第1項記載の電子写真感光体。 3 電荷注入阻止層が第2層のi層をはぶいた構
造である前記特許請求の範囲第1項記載の電子写
真感光体。 4 感光層が微量のBを含む非晶質Siである前記
特許請求の範囲第1項又は第2項記載の電子写真
感光体。 5 感光層が水素と微量のBを含む非晶質Siであ
る前記特許請求の範囲第1項又は第2項記載の電
子写真感光体。 6 電荷注入阻止層を構成するp型もしくはn型
の半導体層がSiもしくはSiとCとを母体とする半
導体に周期律第族a亜族又は第族a亜族の元
素を添加したものである前記特許請求の範囲第1
項、第2項又は第3項記載の電子写真感光体。
[Scope of Claims] 1. An electrophotographic photoreceptor formed on a predetermined conductive substrate and having a charge injection blocking layer between the substrate and a photosensitive layer, wherein the photosensitive layer is made of amorphous Si, and the photosensitive layer is formed on a predetermined conductive substrate. A first p-type semiconductor whose matrix is Si and C, in which the injection blocking layer carries a large number of holes from the substrate side.
layer, the second i-layer of a semiconductor based on intrinsic Si
layer, a third layer of an n-type semiconductor with majority carriers of electrons, or a first layer of an n-type semiconductor with Si and C as a matrix, with majority carriers of electrons from the substrate side, a second layer of an i-layer An electrophotographic photoreceptor comprising a third layer of a p-type semiconductor having a large number of holes as carriers. 2. The electrophotographic photoreceptor according to claim 1, wherein the third layer of the charge injection blocking layer is an n-type or p-type semiconductor containing Si and C as base materials. 3. The electrophotographic photoreceptor according to claim 1, wherein the charge injection blocking layer has a structure in which the second i-layer is covered. 4. The electrophotographic photoreceptor according to claim 1 or 2, wherein the photosensitive layer is made of amorphous Si containing a trace amount of B. 5. The electrophotographic photoreceptor according to claim 1 or 2, wherein the photosensitive layer is amorphous Si containing hydrogen and a trace amount of B. 6. The p-type or n-type semiconductor layer constituting the charge injection blocking layer is a semiconductor containing Si or Si and C as a matrix to which an element of Group A or Group A of the Periodic Law is added. Said claim 1
The electrophotographic photoreceptor according to item 2, item 2, or item 3.
JP7381683A 1983-04-28 1983-04-28 Electrophotographic sensitive body Granted JPS59200245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7381683A JPS59200245A (en) 1983-04-28 1983-04-28 Electrophotographic sensitive body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7381683A JPS59200245A (en) 1983-04-28 1983-04-28 Electrophotographic sensitive body

Publications (2)

Publication Number Publication Date
JPS59200245A JPS59200245A (en) 1984-11-13
JPH0555861B2 true JPH0555861B2 (en) 1993-08-18

Family

ID=13529056

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7381683A Granted JPS59200245A (en) 1983-04-28 1983-04-28 Electrophotographic sensitive body

Country Status (1)

Country Link
JP (1) JPS59200245A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61223848A (en) * 1985-03-29 1986-10-04 Shindengen Electric Mfg Co Ltd Electrohpotographic sensitive body

Also Published As

Publication number Publication date
JPS59200245A (en) 1984-11-13

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