JPH056544Y2 - - Google Patents

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Publication number
JPH056544Y2
JPH056544Y2 JP1987087613U JP8761387U JPH056544Y2 JP H056544 Y2 JPH056544 Y2 JP H056544Y2 JP 1987087613 U JP1987087613 U JP 1987087613U JP 8761387 U JP8761387 U JP 8761387U JP H056544 Y2 JPH056544 Y2 JP H056544Y2
Authority
JP
Japan
Prior art keywords
capacitance
inverting amplifier
output
measured
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987087613U
Other languages
Japanese (ja)
Other versions
JPS62201074U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS62201074U publication Critical patent/JPS62201074U/ja
Application granted granted Critical
Publication of JPH056544Y2 publication Critical patent/JPH056544Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605Measuring capacitance

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Amplifiers (AREA)

Description

【考案の詳細な説明】 [産業上の利用分野] この考案は、出力周波数が好ましくは被測定容
量に逆比例するRC発振回路を使用して、標遊容
量の影響をなくして低容量を測定する回路に関す
るものである。
[Detailed description of the invention] [Industrial application field] This invention uses an RC oscillator circuit whose output frequency is preferably inversely proportional to the capacitance under test to measure low capacitance by eliminating the influence of stray capacitance. This relates to circuits that perform

[従来の技術] 従来、容量を測定する回路としては、容量ブリ
ツジを利用する方式および漏れ方式等が知られて
おり、種々の形態で実施されている。
[Prior Art] Conventionally, as a circuit for measuring capacitance, a method using a capacitance bridge, a leakage method, etc. are known, and these have been implemented in various forms.

[考案が解決しようとする問題点] ところで、周知の方法を用いた場合、測定線の
容量および標遊容量が測定すべき低容量と同程度
の大きさであり、測定結果に影響を及ぼすので、
低容量を測定することは特に困難であつた。
[Problem to be solved by the invention] By the way, when using the well-known method, the capacitance of the measurement line and the stray capacitance are about the same size as the low capacitance to be measured, and this will affect the measurement results. ,
Measuring low volumes has been particularly difficult.

そこで、この考案の目的は、これらの欠点を解
決して、標遊容量のいかなる影響もなしに低容量
を測定する回路を提供することにある。また、こ
の考案の別の目的は、測定回路に供給される電圧
の僅かな変動も測定精度に全く影響を及ぼさない
低容量の測定回路を提供することにある。さら
に、この考案の別の目的は、例えばラジオゾンデ
に遠隔的に用いるのに適した低容量の測定回路を
提供することにある。
The object of this invention is therefore to overcome these drawbacks and provide a circuit for measuring low capacitances without any influence of stray capacitances. Another object of this invention is to provide a low-capacity measuring circuit in which even slight fluctuations in the voltage supplied to the measuring circuit do not affect measurement accuracy at all. Furthermore, another object of the invention is to provide a low capacitance measurement circuit suitable for use remotely, for example in radiosondes.

[問題点を解決するための手段] 上記の目的を達成するために、この考案による
低容量を測定する回路は、入力および出力を備え
た反転増幅器と、この反転増幅器の入力および出
力間に接続された被測定容量と、反転増幅器の出
力に入力を接続し、出力周波数が被測定容量に逆
比例する二安定発振回路とを有し、この二安定発
振回路の出力が反転増幅器の入力に抵抗を介して
フイードバツクされるように接続されていること
を特徴としている。
[Means for solving the problem] In order to achieve the above object, the circuit for measuring low capacitance according to the invention includes an inverting amplifier having an input and an output, and a connection between the input and output of the inverting amplifier. and a bistable oscillator circuit whose input is connected to the output of an inverting amplifier and whose output frequency is inversely proportional to the capacitance to be measured, and the output of this bistable oscillator circuit is connected to the input of the inverting amplifier. It is characterized by being connected so that feedback can be received via.

[実施例] 以下、単に例として添付図面を参照してこの考
案の実施例について説明する。
Embodiments In the following, embodiments of the invention will be described, by way of example only, with reference to the accompanying drawings.

第1図,第2図および第3図に示すように、こ
の考案の測定回路は接続点すなわち入力Aと出力
Bとを備えた反転増幅器1を有している。反転増
幅器1は抵抗R1を介して二安定発振回路4の入
力Cに接続されている。図示したように、二安定
発振回路4は二つの反転増幅器2,3を備え、そ
の出力Dは抵抗R3を介してその入力にフイード
バツクされている。上記二安定発振回路4は例え
ば、典型的特徴として二つの電圧レベルを有し、
これらの電圧レベル間にヒステリシスを有するシ
ユミツトトリガ回路で構成することができる。
As shown in FIGS. 1, 2 and 3, the measuring circuit of the present invention has an inverting amplifier 1 with a connection point, an input A and an output B. The inverting amplifier 1 is connected to the input C of the bistable oscillator circuit 4 via a resistor R 1 . As shown, the bistable oscillator circuit 4 comprises two inverting amplifiers 2, 3, the output D of which is fed back to its input via a resistor R3 . The bistable oscillator circuit 4 has, for example, two voltage levels as a typical feature,
It can be constructed with a Schmitt trigger circuit having hysteresis between these voltage levels.

被測定容量CMは反転増幅器1の入力Aと出力
Bとの間に接続される。二安定発振回路4の出力
Dから周波数f=1/Tが得られる。この二安定
発振回路4の出力周波数は被測定容量CMに逆比
例する好ましい関係を有するので、この出力周波
数を用いて被測定容量が測定される。この考案に
よる測定回路の本質的特徴として、二安定発振回
路4の出力Dは抵抗R2を介して反転増幅器1の
入力Aにフイードバツクされる。また、重要な点
として、反転増幅器1の入力Aは出力Bから(小
容量で)容量的に分離されている。また接続点A
における抵抗性入力インピーダンスが十分に高い
ことも重量である。
The capacitance to be measured C M is connected between the input A and the output B of the inverting amplifier 1 . A frequency f=1/T is obtained from the output D of the bistable oscillation circuit 4. Since the output frequency of this bistable oscillation circuit 4 has a preferable relationship of being inversely proportional to the capacitance to be measured C M , the capacitance to be measured is measured using this output frequency. The essential feature of the measuring circuit according to this invention is that the output D of the bistable oscillator circuit 4 is fed back to the input A of the inverting amplifier 1 via a resistor R2. It is also important to note that the input A of the inverting amplifier 1 is capacitively separated (by a small capacitance) from the output B. Also, connection point A
It is also important that the resistive input impedance in the

上述の回路の動作は次の通りである。はじめに
出力Dは入力電圧の正側であると仮定する。従つ
て抵抗R2を流れる電流により入力Aにおける電
圧は上昇する。増幅器1が反転型のものであるの
で、入力Aにおける電圧の上昇につれて出力Bに
おける電圧は降下し、そして被測定容量CMを介
して入力Aにおける電圧も降下する。その結果、
理想状態では入力Aにおける電圧は全く変化しな
いことになる。被測定容量CMは出力Dと入力A
間の電圧および抵抗R2によつて決まる一定電流
で充電される。出力Bにおける電圧が二安定発振
回路すなわち図面のシユミツトトリガ回路4の低
トリガレベルまで下がると、二安定発振回路の状
態は変化し、出力Dにおける電圧は急激に給電電
圧の負側に落ち、その時点から回路は上述のよう
に作動し始め、すなわち電流は単に反対方向へ流
れる。
The operation of the circuit described above is as follows. First, it is assumed that the output D is on the positive side of the input voltage. The current flowing through resistor R 2 therefore causes the voltage at input A to rise. Since the amplifier 1 is of the inverting type, as the voltage at the input A rises, the voltage at the output B falls and, via the capacitance to be measured C M , the voltage at the input A also falls. the result,
In an ideal situation, the voltage at input A would not change at all. The capacitance to be measured C M is output D and input A
charged with a constant current determined by the voltage between and the resistor R2 . When the voltage at output B falls to the low trigger level of the bistable oscillator circuit, i.e. the Schmitt trigger circuit 4 of the drawing, the state of the bistable oscillator circuit changes and the voltage at output D suddenly drops to the negative side of the supply voltage, at which point From then on the circuit begins to operate as described above, i.e. the current simply flows in the opposite direction.

上述の説明において重要なことは、入力Aにお
ける電圧が周期中の全ての相において全く変化し
ないことである。その結果入力Aにおいて接地さ
れた第1図に点線で示す標遊容量CH1は出力周波
数fに何も変化しない。その理由は、入力Aにお
ける電圧が変化せず、その結果標遊容量CH2が充
電も放電もしないからである。標遊容量CH2を出
力Bに接続した場合も反転増幅器1においてその
ような標遊容量CH2を充電および放電させるに十
分な高い電流が得られるので、上述の場合と同じ
になる。
What is important in the above description is that the voltage at input A does not change at all in all phases during the period. As a result, the stray capacitance C H1 shown by the dotted line in FIG. 1, which is grounded at the input A, has no change in the output frequency f. The reason is that the voltage at input A does not change, so that the free capacitance C H2 neither charges nor discharges. The case where the free capacitance C H2 is connected to the output B is also the same as the above case because a high enough current is obtained in the inverting amplifier 1 to charge and discharge such free capacitance C H2 .

従つて、第2図に示すように被測定容量CM
例えば実際の測定回路から相対的に離れた一対の
同軸ケーブル5a,5bを介して測定できること
が認められる。実際にこれは、例えばラジオゾン
デの場合のように被測定容量が互いに離れている
際に有利であり、この考案の回路を用いることに
よつて例えば同軸ケーブルを介して測定精度のい
かなる損失もなしに測定回路に種々の容量を接続
することができる。低容量を測定する従来の回路
ではこの種の構成は全く不可能であつた。
Therefore, as shown in FIG. 2, it is recognized that the capacitance to be measured C M can be measured, for example, via a pair of coaxial cables 5a and 5b that are relatively distant from the actual measurement circuit. In fact, this is advantageous when the capacitances to be measured are far from each other, for example in the case of radiosondes, and by using the circuit of this invention there is no loss of measurement accuracy, for example via coaxial cables. Various capacitances can be connected to the measurement circuit. This type of configuration was simply not possible with conventional circuits for measuring low capacitances.

この考案の別の重要な効果は、測定回路におけ
る標遊容量の影響のいかなる危険もなしに機械的
かまたは電子的スイツチであるセレクタスイツチ
によつて測定すべき容量を他の容量に変えること
ができることにあり、これらの他の容量は例えば
基準とすることができる。
Another important advantage of this invention is that it is possible to change the capacitance to be measured to another capacitance by means of a selector switch, which may be a mechanical or electronic switch, without any risk of stray capacitance effects in the measuring circuit. Possibly, these other capacities can be referenced, for example.

第3図および第4図には上記の目的に使用する
好ましい電子セレクタスイツチを示す。第3図に
示すようにセレクタスイツチにはCMOS差動増
幅器装置が設けられ、この装置は六つの増幅器ユ
ニツト7〓〜7〓を備えている。各増幅器ユニツト
7〓〜7〓の出力b1〜b7は被測定容量CM1〜CM6に接
続され、入力a1〜a6はステツピング回路8に接続
され、このステツピング回路8は矢印9で示す回
路を介して増幅器装置6の各入力端子a1〜a6に交
互にインパルスP1を提供する。
3 and 4 illustrate a preferred electronic selector switch for use for the above purpose. As shown in FIG. 3, the selector switch is provided with a CMOS differential amplifier device, and this device includes six amplifier units 7-7. The outputs b 1 to b 7 of each amplifier unit 7 to 7 are connected to the capacitances to be measured C M1 to C M6 , and the inputs a 1 to a 6 are connected to a stepping circuit 8, which is connected by arrow 9. An impulse P 1 is provided alternately to each input terminal a 1 -a 6 of the amplifier arrangement 6 via the circuit shown.

第4図には最も簡単な形式のCMOS差動増幅
器装置の構成の一例を示し、この場合この増幅器
装置は二つのトランジスタTP,TNを有し、トラ
ンジスタTPはP形MOSトランジスタであり、ト
ランジスタTNはN形MOSトランジスタである。
トランジスタTP,TNを導通させる抵抗は500Ω程
度であり、またトランジスタTP,TNを被導通に
させる抵抗はそれより数十倍高い。第3図に示す
ように、一つの増幅器装置6内には上記型の六つ
の増幅器ユニツトがあり、これらの増幅器ユニツ
トの全てのVDDは相互接続され、VSSも相互接
続されている。
Figure 4 shows an example of the configuration of the simplest type of CMOS differential amplifier device, in which case the amplifier device has two transistors T P and T N , where the transistor T P is a P-type MOS transistor. , transistor T N is an N-type MOS transistor.
The resistance that makes the transistors T P and TN conductive is about 500Ω, and the resistance that makes the transistors T P and TN conductive is several tens of times higher. As shown in FIG. 3, there are six amplifier units of the type described above in one amplifier arrangement 6, the VDDs of all these amplifier units being interconnected and the VSSs also being interconnected.

上述のセレクタスイツチにおいては、第3図に
示すように、駆動電圧+Uは抵抗R4を介してセ
レクタスイツチに供給され、この駆動電圧は本考
案によるRC発振回路の容量C1にも供給される。
抵抗R4は好ましくは150kΩ程度であり、また容
量C1は好ましくは10nF程度であり、当然測定す
べき周波数に影響しないように十分に高くなけれ
ばならない。被測定容量CMが数pF〜数十pN程度
である場合、容量C1の値は適当にはほぼ10nFで
ある。上記の電子セレクタスイツチは、容量CM1
〜CM6の一つを第3図に示すような測定回路に接
続し、他の容量を接地するように動作する。
In the above selector switch, as shown in Fig. 3, the drive voltage +U is supplied to the selector switch via the resistor R4 , and this drive voltage is also supplied to the capacitor C1 of the RC oscillation circuit according to the present invention. .
The resistance R 4 is preferably on the order of 150 kΩ, and the capacitance C 1 is preferably on the order of 10 nF, which of course must be sufficiently high so as not to affect the frequency to be measured. When the capacitance C M to be measured is approximately several pF to several tens of pN, the value of the capacitance C 1 is suitably approximately 10 nF. The above electronic selector switch has a capacity of C M1
~C M6 is connected to a measuring circuit as shown in Fig. 3, and operates to ground the other capacitance.

この考案は、単に例として説明してきた上述の
細部に限定されるものではなく、実用新案登録請
求の範囲に記載した考案の概念の範囲内で種々変
更することができる。
This invention is not limited to the details described above, which have been explained merely by way of example, but can be modified in various ways within the scope of the concept of the invention as set forth in the claims of the utility model registration.

[考案の効果] 以上説明してきたように、この考案によれば、
出力周波数が被測定容量に逆比例するRC発振回
路を使用し、被測定容量を、低インピーダンス発
生器と電流だけを測定する回路との間、すなわち
反転増幅器の入力と出力との間に接続して測定を
行うので、標遊容量のいかなる影響もなくしかも
測定回路に供給される電圧の僅かな変動も測定精
度に全く影響を及ぼすことなしに低容量を測定す
ることができる。
[Effects of the invention] As explained above, according to this invention,
An RC oscillator circuit whose output frequency is inversely proportional to the capacitance to be measured is used, and the capacitance to be measured is connected between the low impedance generator and the circuit that measures only the current, i.e. between the input and output of the inverting amplifier. Since the measurement is carried out in the same manner, low capacitances can be measured without any influence of stray capacitance and without any small fluctuations in the voltage supplied to the measuring circuit having any effect on the measurement accuracy.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案による回路の1実施例を示
し、第2図は被測定容量を二つの同軸ケーブルを
介して測定回路に遠隔的に接続したこの考案の応
用例を示し、第3図は幾つかの被測定容量をこの
考案に従つて特殊なセレクタスイツチを介して測
定回路に一つづつ接続したこの考案の応用例を示
し、第4図は第3図に示すCMOS差動増幅器の
基本構成を詳細に示す。 図中、1は反転増幅器、4は二安定発振回路、
R1,R2は抵抗、CMは被測定容量、CH1は標遊容量
である。
Fig. 1 shows an embodiment of the circuit according to this invention, Fig. 2 shows an application example of this invention in which the capacitance to be measured is remotely connected to the measurement circuit via two coaxial cables, and Fig. An application example of this invention is shown in which several capacitances to be measured are connected one by one to a measurement circuit via a special selector switch according to this invention. Figure 4 shows the basics of the CMOS differential amplifier shown in Figure 3. The configuration is shown in detail. In the figure, 1 is an inverting amplifier, 4 is a bistable oscillation circuit,
R 1 and R 2 are resistances, CM is the capacitance to be measured, and C H1 is the standard capacitance.

Claims (1)

【実用新案登録請求の範囲】 1 標遊容量CH1,CH2の影響をなくして低容量を
測定する回路において、 入力Aおよび出力Bを備えた反転増幅器1
と、 この反転増幅器1の入力Aおよび出力B間に
接続された被測定容量CMと、 反転増幅器1の出力Bに入力を接続し、出力
周波数が被測定容量CMに逆比例する二安定発
振回路4とを有し、 二安定発振回路4の出力が反転増幅器1の入
力Aに抵抗R2を介してフイードバツクされる
ように接続されていることを特徴とする低容量
を測定する回路。 2 反転増幅器1の入力Aが低内部抵抗を有する
低インピーダンスとして機能し、反転増幅器1
の出力Bが電流だけを測定する回路として機能
するよう構成されている実用新案登録請求の範
囲第1項に記載の測定回路。 3 二安定発振回路4がシユミツトトリガ回路
2,3,R3で構成されている実用新案登録請
求の範囲第1項に記載の測定回路。 4 被測定容量CMが反転増幅器1および二安定
発振回路4から遠隔場所にあり、被測定容量
CMが反転増幅器1の入力Aおよび出力Bに一
対の同軸ケーブル5a,5bによつて接続され
ている実用新案登録請求の範囲第1項に記載の
測定回路。 5 被測定容量CMが一対の離間した端子を有し、
同軸ケーブル5a,5bのそれぞれが内側導体
および外側導体を有し、各同軸ケーブルの外側
導体が接地され、各同軸ケーブルの一方の内側
導体が被測定容量CMの一方の端子を反転増幅
器1の入力に接続し、他方の同軸ケーブルの内
側導体が被測定容量CMの他方の端子を反転増
幅器1の出力に接続している実用新案登録請求
の範囲第4項に記載の測定回路。
[Claims for Utility Model Registration] 1. In a circuit for measuring low capacitance by eliminating the influence of stray capacitances C H1 and C H2 , an inverting amplifier 1 having an input A and an output B
and a capacitance to be measured C M connected between the input A and output B of this inverting amplifier 1, and a bistable whose input is connected to the output B of the inverting amplifier 1 and whose output frequency is inversely proportional to the capacitance to be measured C M. 1. An oscillation circuit 4, and an output of the bistable oscillation circuit 4 is connected to an input A of an inverting amplifier 1 so as to be fed back via a resistor R2 . 2 The input A of the inverting amplifier 1 functions as a low impedance with low internal resistance, and the input A of the inverting amplifier 1
The measuring circuit according to claim 1, wherein the measuring circuit is configured such that the output B of the circuit functions as a circuit that measures only current. 3. The measuring circuit according to claim 1, wherein the bistable oscillation circuit 4 is composed of Schmitt trigger circuits 2, 3, and R3 . 4 The capacitance to be measured C M is located at a remote location from the inverting amplifier 1 and the bistable oscillator circuit 4, and the capacitance to be measured is
The measuring circuit according to claim 1, wherein C M is connected to input A and output B of inverting amplifier 1 by a pair of coaxial cables 5a and 5b. 5 The capacitance to be measured C M has a pair of spaced apart terminals,
Each of the coaxial cables 5a, 5b has an inner conductor and an outer conductor, the outer conductor of each coaxial cable is grounded, and one inner conductor of each coaxial cable connects one terminal of the capacitance to be measured C M to the inverting amplifier 1. The measuring circuit according to claim 4, wherein the inner conductor of the other coaxial cable connects the other terminal of the capacitance to be measured C M to the output of the inverting amplifier 1.
JP1987087613U 1977-10-14 1987-06-08 Expired - Lifetime JPH056544Y2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI773063A FI57319C (en) 1977-10-14 1977-10-14 ADJUSTMENT OF CAPACITY IN CAPACITY

Publications (2)

Publication Number Publication Date
JPS62201074U JPS62201074U (en) 1987-12-22
JPH056544Y2 true JPH056544Y2 (en) 1993-02-19

Family

ID=8511140

Family Applications (2)

Application Number Title Priority Date Filing Date
JP12521278A Pending JPS5498696A (en) 1977-10-14 1978-10-13 Method of measuring low capacity
JP1987087613U Expired - Lifetime JPH056544Y2 (en) 1977-10-14 1987-06-08

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP12521278A Pending JPS5498696A (en) 1977-10-14 1978-10-13 Method of measuring low capacity

Country Status (10)

Country Link
JP (2) JPS5498696A (en)
AU (1) AU523345B2 (en)
BR (1) BR7806786A (en)
CA (1) CA1128129A (en)
DE (1) DE2844121C2 (en)
FI (1) FI57319C (en)
FR (1) FR2410280A1 (en)
GB (1) GB2006442B (en)
IT (1) IT1100121B (en)
ZA (1) ZA785694B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2475231A1 (en) * 1980-02-04 1981-08-07 Testut Aequitas CAPACITY MEASURING DEVICE, IN PARTICULAR FOR A WEIGHTING INSTRUMENT
JPS56166411A (en) * 1980-05-27 1981-12-21 Yokogawa Hokushin Electric Corp Capacity type displacement transducer
DE3117808A1 (en) * 1981-05-06 1982-11-25 Robert Bosch Gmbh, 7000 Stuttgart CIRCUIT ARRANGEMENT FOR MEASURING INDUCTIVE CHANGES
DK4383A (en) * 1983-01-07 1984-07-08 Nils Aage Juul Eilersen oscillator circuit
FI69932C (en) * 1984-05-31 1986-05-26 Vaisala Oy MAINTENANCE FOUNDATION CAPACITORS SPECIFIC FOR SMAR CAPACITORS VID VILKER MAN ANVAENDER TVAO REFERENSER
JPS6114578A (en) * 1984-06-30 1986-01-22 Suzuki Shigeo Capacity meter
FI74549C (en) * 1986-02-13 1988-02-08 Vaisala Oy MAETNINGSFOERFARANDE FOER IMPEDANSER, SAERSKILT SMAO KAPACITANSER.
DE4039006C1 (en) * 1990-12-06 1992-03-12 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De
JP2007187509A (en) 2006-01-12 2007-07-26 Denso Corp Capacitive physical quantity sensor
US8604809B2 (en) 2008-11-02 2013-12-10 Siemens Aktiengesellschaft Current sensor capacity measuring system
FR2977950B1 (en) * 2011-07-13 2014-11-07 Jean Noel Lefebvre CAPACITIVE DETECTION DEVICE

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3518537A (en) * 1967-11-28 1970-06-30 Richard Mcfee Apparatus and method for determining the capacitance and conductance of capacitors
US3626287A (en) * 1969-02-10 1971-12-07 C G I Corp System for responding to changes in capacitance of a sensing capacitor
FR2142732B1 (en) * 1971-06-24 1975-02-07 Commissariat Energie Atomique
FR2208121B1 (en) * 1972-11-29 1978-12-29 Commissariat Energie Atomique
US4083248A (en) * 1975-09-04 1978-04-11 Simmonds Precision Products, Inc. Digital liquid-level gauging systems

Also Published As

Publication number Publication date
BR7806786A (en) 1979-05-15
CA1128129A (en) 1982-07-20
FI57319C (en) 1980-07-10
DE2844121A1 (en) 1979-04-19
FI773063A7 (en) 1979-04-15
DE2844121C2 (en) 1981-09-24
IT1100121B (en) 1985-09-28
FR2410280A1 (en) 1979-06-22
JPS5498696A (en) 1979-08-03
FI57319B (en) 1980-03-31
AU4067578A (en) 1980-04-17
IT7828692A0 (en) 1978-10-12
AU523345B2 (en) 1982-07-22
GB2006442A (en) 1979-05-02
ZA785694B (en) 1979-09-26
JPS62201074U (en) 1987-12-22
FR2410280B1 (en) 1984-01-06
GB2006442B (en) 1982-04-28

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