JPH056822A - Soft magnetic film - Google Patents

Soft magnetic film

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Publication number
JPH056822A
JPH056822A JP18160691A JP18160691A JPH056822A JP H056822 A JPH056822 A JP H056822A JP 18160691 A JP18160691 A JP 18160691A JP 18160691 A JP18160691 A JP 18160691A JP H056822 A JPH056822 A JP H056822A
Authority
JP
Japan
Prior art keywords
film
scattering
soft magnetic
flux density
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18160691A
Other languages
Japanese (ja)
Other versions
JP3227724B2 (en
Inventor
Hiroyuki Omori
広之 大森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
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Filing date
Publication date
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Priority to JP18160691A priority Critical patent/JP3227724B2/en
Publication of JPH056822A publication Critical patent/JPH056822A/en
Application granted granted Critical
Publication of JP3227724B2 publication Critical patent/JP3227724B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To obtain a high-saturation magnetic flux density, satisfactory soft magnetic properties and heat resistance by constituting the title film from predetermined elements and by observing a scattering diffraction through X-ray diffractometry using Co-Kalpha radiation. CONSTITUTION:While alloys containing the components of Co85Zr15, Fe85Al15 and Fe90Si10 are used as targets and the mixed gas of Ar and N2 gas is introduced into a sputter, a film formation is conducted by RF mgnetron sputtering process. Then, while an alloy containing the components of Fe85Hf15 is used as target and the mixed gas of Ar and N2 gas is introduced into the sputter, the film formation is conducted by DC magntron sputtering process. Obtained films containing the components of Co90Zr9N1, Co80Zr8N12, Fe80Hf10, Fe79Al13N8 and Fe81Si8N11 are subjected to a heat treatment in a vacuum at 500 deg.C for 1 hour and to X-ray diffractometry using Co-Kalpha radiation and to measurements of coersive force and saturation magnetic flux density. The Co amorphous film and Fe-based alloy film are known to differ in scattering strength according to a film in a small angle scattering region where a scattering angle is 2-6 degrees.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、複合型磁気ヘッドある
いは薄膜型磁気ヘッドのコア材料等として好適な軟磁性
薄膜に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a soft magnetic thin film suitable as a core material for a composite type magnetic head or a thin film type magnetic head.

【0002】[0002]

【従来の技術】たとえばVTR(ビデオテープレコーダ
ー)等の磁気記録再生装置においては、画質等を向上さ
せるために記録信号の高密度化が進められており、これ
に対応して磁性粉にFe,Co,Ni等の強磁性金属の
粉末を用いた,いわゆるメタルテープや強磁性金属材料
を蒸着等の手法により直接ベースフィルム上に被着し
た,いわゆる蒸着テープ等の高保磁力媒体の開発が進め
られている。
2. Description of the Related Art For example, in a magnetic recording / reproducing apparatus such as a VTR (video tape recorder), the density of recording signals has been increased in order to improve the image quality and the like. Development of high coercive force media such as so-called vapor-deposited tape in which powder of ferromagnetic metal such as Co and Ni is used, so-called metal tape or ferromagnetic metal material is directly deposited on the base film by a method such as vapor deposition. ing.

【0003】ところで、このように磁気記録媒体の高保
磁力化が進むにつれ、記録再生に使用する磁気ヘッドと
しても高飽和磁束密度化が要求されるようになってきて
いる。しかしながら、従来より使用されているフェライ
ト材よりなる磁気ヘッドではこのような高飽和磁束密度
化の要求に十分に対応することは難しい。
By the way, as the coercive force of the magnetic recording medium is increased, the saturation magnetic flux density is also required to be increased as a magnetic head used for recording and reproduction. However, it is difficult for a magnetic head made of a ferrite material that has been conventionally used to sufficiently meet such a demand for high saturation magnetic flux density.

【0004】そこで、このような状況から、磁気ヘッド
を構成する磁気コアをフェライトやセラミックス等と高
飽和磁束密度を有する軟磁性膜との複合構造とし、軟磁
性膜同志を突合せて磁気ギャップを構成するようにした
複合型磁気ヘッドや、各磁気コアやコイル等を薄膜技術
により形成し、これらを絶縁膜を介して多層構造とした
薄膜磁気ヘッド等が開発されている。
Under such circumstances, therefore, the magnetic core constituting the magnetic head has a composite structure of ferrite, ceramics, etc. and a soft magnetic film having a high saturation magnetic flux density, and the soft magnetic films are butted to form a magnetic gap. There has been developed a composite type magnetic head configured as described above, a thin film magnetic head in which each magnetic core, a coil, and the like are formed by a thin film technique, and these are formed into a multilayer structure with an insulating film interposed therebetween.

【0005】上記複合型磁気ヘッドや薄膜磁気ヘッドに
使用される軟磁性材料としては、例えばFe−Al−S
i合金,いわゆるセンダスト合金やCo−Nb−Zr等
の非晶質軟磁性膜等が知られている。
As the soft magnetic material used for the above-mentioned composite magnetic head or thin film magnetic head, for example, Fe-Al-S is used.
Known are i alloys, so-called sendust alloys, amorphous soft magnetic films of Co—Nb—Zr, and the like.

【0006】しかしながら、Fe−Al−Si合金にお
いては最も軟磁気特性が得られる組成での飽和磁束密度
は10kガウスであり、高保磁力媒体に使用する磁気ヘ
ッドのコア材料としては十分満足のいくものとは言えな
い。また、非晶質合金では、10kガウス以上の飽和磁
束密度が得られる組成においては結晶化温度が低く、磁
気ヘッドの製造過程で行われるガラス融着において軟磁
気特性が損なわれてしまう。
However, in the Fe-Al-Si alloy, the saturation magnetic flux density is 10 kGauss in the composition that gives the most soft magnetic characteristics, which is sufficiently satisfactory as the core material of the magnetic head used for the high coercive force medium. It can not be said. Further, in the amorphous alloy, the crystallization temperature is low in the composition that can obtain the saturation magnetic flux density of 10 k Gauss or more, and the soft magnetic characteristics are impaired in the glass fusion performed in the manufacturing process of the magnetic head.

【0007】そこで、高飽和磁束密度,良好な軟磁気特
性,耐熱性を同時に達成する軟磁性薄膜としてCo系の
非晶質膜に、あるいはFe基合金膜に窒素を周期的に添
加した軟磁性薄膜が特開昭63−254708号公報,
特開平1−209707号公報に報告されている。
Therefore, as a soft magnetic thin film that simultaneously achieves a high saturation magnetic flux density, good soft magnetic characteristics, and heat resistance, a Co-based amorphous film or a Fe-based alloy film in which nitrogen is periodically added is soft magnetic. The thin film is disclosed in JP-A-63-254708,
It is reported in Japanese Patent Laid-Open No. 1-209707.

【0008】[0008]

【発明が解決しようとする課題】ところが、上述のよう
な窒素を含有する軟磁性薄膜においては、良好な軟磁気
特性を得るために窒素が100nm以下の周期で周期的
に含有されているが、このように窒素が周期的に添加さ
れた軟磁性薄膜を作成するには、反応性スパッタリング
法を用いて、スパッタ雰囲気中の窒素分圧を周期的に変
化させるといった煩雑な操作が必要となる。このため、
製造に時間や手間を要し、磁気ヘッドコア材として十分
な量産性が得られないといった問題がある。
However, in the soft magnetic thin film containing nitrogen as described above, nitrogen is periodically contained at a cycle of 100 nm or less in order to obtain good soft magnetic characteristics. In order to form a soft magnetic thin film to which nitrogen is added periodically as described above, a complicated operation of periodically changing the partial pressure of nitrogen in the sputtering atmosphere by using the reactive sputtering method is required. For this reason,
There is a problem that it takes time and labor to manufacture, and sufficient mass productivity cannot be obtained as a magnetic head core material.

【0009】そこで、本発明はかかる従来の実情に鑑み
て提案されたものであって、高飽和磁束密度を有し且つ
軟磁気特性,耐熱性に優れるとともに十分な量産性が得
られる軟磁性膜を提供することを目的とする。
Therefore, the present invention has been proposed in view of such conventional circumstances, and has a high saturation magnetic flux density, is excellent in soft magnetic characteristics and heat resistance, and is capable of obtaining sufficient mass productivity. The purpose is to provide.

【0010】[0010]

【課題を解決するための手段】Co系非晶質膜,Fe基
合金膜等についてX線回折測定を行うと、散乱角度が小
さい範囲の散乱強度が膜によって大きく異なることが見
いだされている。すなわち、このことは、散乱角度が小
さい範囲の散乱強度が膜の特性を判断する一つの指標と
なることを示唆している。このような観点から、本発明
者らが膜の磁気特性について検討を重ねた結果、特定の
元素により構成された磁性薄膜のうち、X線回折測定を
行った場合に散乱角度が2度から6度の小角散乱領域に
散乱回折が観測されるものに良好な軟磁気特性,優れた
耐熱性が得られることを見いだすに至った。
When an X-ray diffraction measurement is performed on a Co-based amorphous film, a Fe-based alloy film, etc., it has been found that the scattering intensity in the range where the scattering angle is small greatly differs depending on the film. That is, this suggests that the scattering intensity in the range where the scattering angle is small is one index for judging the characteristics of the film. From such a viewpoint, the inventors of the present invention have conducted extensive studies on the magnetic characteristics of the film, and as a result, among the magnetic thin films formed of a specific element, the scattering angle is 2 to 6 when the X-ray diffraction measurement is performed. We have found that good soft magnetic properties and excellent heat resistance can be obtained for those whose scattering diffraction is observed in the small angle scattering region.

【0011】かかる知見に基づいて、本発明の軟磁性膜
は、Co,Fe,Ni,Mnから選ばれる少なくとも1
種とZr,Hf,Ta,Nb,Y,W,Mo,Ti,C
r,V,Cu,La,Nd,Sm,Ce,Pr,Gd,
Dy,Al,Si,Ge,Ga,Pd,Ru,Re,S
nから選ばれる少なくとも1種とN,C,O,B,Pか
ら選ばれる少なくとも1種よりなり、且つCoKα放射
線を使用したX線回折測定において、散乱角度が2度か
ら6度の範囲に散乱回折が観測されることを特徴とする
ものである。
Based on such knowledge, the soft magnetic film of the present invention has at least one selected from Co, Fe, Ni and Mn.
Seed and Zr, Hf, Ta, Nb, Y, W, Mo, Ti, C
r, V, Cu, La, Nd, Sm, Ce, Pr, Gd,
Dy, Al, Si, Ge, Ga, Pd, Ru, Re, S
X-ray diffraction measurement using CoKα radiation, which consists of at least one selected from n and at least one selected from N, C, O, B and P, and has a scattering angle in the range of 2 to 6 degrees. It is characterized by the fact that diffraction is observed.

【0012】本発明において、良好な軟磁気特性,耐熱
性を得るためには所定元素により構成され、且つCoK
α放射線を使用するX線回折測定において、散乱角度が
2度から6度の範囲に散乱回折が観測されることが重要
である。すなわち、X線回折測定で観測される散乱角度
2θから、式1を使用して散乱格子面間隔dが求められ
る。
In the present invention, in order to obtain good soft magnetic characteristics and heat resistance, it is composed of a predetermined element and CoK
In X-ray diffraction measurement using α radiation, it is important that scattering diffraction is observed in the range of 2 to 6 degrees. That is, from the scattering angle 2θ observed by the X-ray diffraction measurement, the scattering grating plane spacing d can be obtained by using the equation 1.

【0013】[0013]

【式1】 CoKα放射線の波長λは1.79026Åであるの
で、散乱角度が2度から6度の範囲に散乱回折が観測さ
れる場合、散乱格子面間隔dは式1より1.7nm〜5
nmである。すなわち、所定元素がこのような散乱格子
面間隔の結晶構造をとることにより、良好な軟磁気特
性,耐熱性が達成されることとなる。
[Formula 1] Since the wavelength λ of CoKα radiation is 1.79026Å, when scattering diffraction is observed in the scattering angle range of 2 ° to 6 °, the scattering lattice plane spacing d is 1.7 nm to 5 nm according to Equation 1.
nm. That is, when the predetermined element has a crystal structure with such a scattering lattice plane spacing, good soft magnetic characteristics and heat resistance can be achieved.

【0014】上記軟磁性膜は、スパッタリング等のいわ
ゆる気相メッキ技術等を用いて、スパッタ条件、ターゲ
ット組成を調節することによって得られる。ここで、タ
ーゲットとしては、所望の組成を有する所定元素よりな
る合金ターゲットを用いてもよく、あるいは各所定元素
をそれぞれターゲットとして用い、その面積や印加出力
等を調整して成膜される軟磁性膜の組成をコントロール
するようにしてもよい。特に、合金ターゲットを使用す
れば、軟磁性膜の組成はターゲットの組成によってほぼ
一意に決まるので、スパッタリング毎に組成に誤差が生
ずることがなく、大量生産する上で有利である。また、
窒素、酸素を添加するには、スパッタ雰囲気中に窒素ガ
スまたは酸素ガスを導入し、炭素を添加する場合には、
メタン,アセチレン等の炭化水素ガスをスパッタ雰囲気
中に導入すればよい。
The soft magnetic film can be obtained by adjusting the sputtering conditions and the target composition by using a so-called vapor phase plating technique such as sputtering. Here, as the target, an alloy target made of a predetermined element having a desired composition may be used, or a soft magnetic film formed by adjusting the area and applied output of each predetermined element as a target. The composition of the film may be controlled. In particular, when an alloy target is used, the composition of the soft magnetic film is almost uniquely determined by the composition of the target, so that there is no error in the composition for each sputtering, which is advantageous for mass production. Also,
To add nitrogen and oxygen, introduce nitrogen gas or oxygen gas into the sputtering atmosphere, and to add carbon,
A hydrocarbon gas such as methane or acetylene may be introduced into the sputtering atmosphere.

【0015】[0015]

【作用】所定元素から構成され且つCoKα放射(波長
1.79026Å)を用いたX線回折測定で、散乱角度
が2度から6度の範囲に散乱回折が観測される軟磁性膜
は、高飽和磁束密度を有するとともに、軟磁気特性,耐
熱性に優れる。この理由は明らかではないが、CoKα
放射を用いたX線回折測定において、散乱角度が2度か
ら6度の範囲に散乱回折が観測される場合、散乱格子面
間隔dは、1.7nmから5nmであり、所定元素がこ
のような散乱格子面間隔の結晶構造をとることにより、
良好な磁気特性,耐熱性が達成されるものと考えられ
る。
[Function] The soft magnetic film, which is composed of a specified element and whose scattering angle is observed in the range of 2 to 6 degrees by X-ray diffraction measurement using CoKα radiation (wavelength 1.79026Å), has a high saturation. It has a magnetic flux density, as well as excellent soft magnetic properties and heat resistance. The reason for this is not clear, but CoKα
In X-ray diffraction measurement using radiation, when scattering diffraction is observed in the range of 2 to 6 degrees, the scattering lattice plane spacing d is 1.7 nm to 5 nm, and the predetermined element is By taking the crystal structure of the scattering lattice plane spacing,
It is considered that good magnetic properties and heat resistance can be achieved.

【0016】また、本発明の軟磁性膜では、このように
結晶構造が重要であり、組成については、たとえば窒素
変調膜程には厳密でなくてよい(たとえば所定元素以外
の元素が1原子量%以内含まれていても特性は劣化しな
い。)ので、特性の安定性が高く、コア材料として信頼
性が得られる。さらに、このような散乱格子面間隔を有
する軟磁性膜は、スパッタリング法によって成膜される
が、この場合、はじめにスパッタ条件,ターゲット組成
を調節し、その条件のまま所望の膜厚となるまで続けて
スパッタリングを行えばよく、窒素変調膜のように周期
的にスパッタ雰囲気を変える必要がない。したがって、
成膜に手間や時間を要さず、量産性にも優れる。
In the soft magnetic film of the present invention, the crystal structure is important as described above, and the composition does not have to be as strict as that of the nitrogen modulation film (for example, an element other than the predetermined element is 1 atomic% by weight). Even if it is contained within the range, the characteristics do not deteriorate.) Therefore, the stability of the characteristics is high and the reliability as a core material can be obtained. Further, a soft magnetic film having such a scattering lattice spacing is formed by a sputtering method. In this case, the sputtering conditions and the target composition are adjusted first, and the conditions are continued until the desired film thickness is obtained. It suffices to carry out sputtering by means of a sputtering method, and there is no need to periodically change the sputtering atmosphere as with the nitrogen modulation film. Therefore,
It does not require labor and time for film formation and is excellent in mass productivity.

【0017】[0017]

【実施例】本発明の好適な実施例について実験結果に基
づいて説明する。
EXAMPLES Preferred examples of the present invention will be described based on experimental results.

【0018】先ず、Co85Zr15,Fe85Al15,Fe
90Si10なる組成を有する合金(直径100mm)をタ
ーゲットとして用い、スパッタ中にArとN2 ガスの混
合ガスを導入しながらRFマグネトロンスパッタ法によ
り成膜を行った。下記にスパッタ条件を示す。 スパッタ条件 到達真空度 2×10-4Pa Arガス圧 0.1Pa 投入電力 300W このとき得られた膜は、厚さが3μm,窒素の組成比が
0.2原子量%から20原子量%であった。
First, Co 85 Zr 15 , Fe 85 Al 15 , Fe
Using an alloy having a composition of 90 Si 10 (diameter 100 mm) as a target, film formation was performed by the RF magnetron sputtering method while introducing a mixed gas of Ar and N 2 gas during sputtering. The sputtering conditions are shown below. Sputtering conditions Ultimate vacuum 2 × 10 −4 Pa Ar gas pressure 0.1 Pa Input power 300 W The film obtained at this time had a thickness of 3 μm and a nitrogen composition ratio of 0.2 atomic% to 20 atomic%. ..

【0019】次に、Fe85Hf15なる組成を有する合金
(直径100mm)をターゲットとして用いて、スパッ
タ中にArとN2 ガスの混合ガスを導入しながらDCマ
グネトロンスパッタ法により成膜を行った。下記にスパ
ッタ条件を示す。 スパッタ条件 到達真空度 2×10-4Pa Arガス圧 0.5Pa 投入電力 300W このとき得られた膜は、厚さが3μm,窒素の組成比が
0.2原子量%から20原子量%であった。
Next, using an alloy having a composition of Fe 85 Hf 15 (diameter 100 mm) as a target, a film was formed by the DC magnetron sputtering method while introducing a mixed gas of Ar and N 2 gas during sputtering. .. The sputtering conditions are shown below. Sputtering conditions Ultimate vacuum 2 × 10 −4 Pa Ar gas pressure 0.5 Pa Input power 300 W The film obtained at this time had a thickness of 3 μm and a nitrogen composition ratio of 0.2 atomic% to 20 atomic%. ..

【0020】以上のようにして得られたCo90Zr9
1 ,Co80Zr8 12,Fe80Hf1010,Fe79Al
138 ,Fe81Si8 11の組成を有する膜について、
真空中で500℃、1時間熱処理を行い、X線回折測定
および保磁力,飽和磁束密度の測定を行った。図1に各
膜のX線回折パターンを、また表1に各膜の小角散乱強
度,飽和磁束密度,保磁力を示す。
Co 90 Zr 9 N obtained as described above
1 , Co 80 Zr 8 N 12 , Fe 80 Hf 10 N 10 , Fe 79 Al
Regarding a film having a composition of 13 N 8 and Fe 81 Si 8 N 11 ,
Heat treatment was performed at 500 ° C. for 1 hour in vacuum, and X-ray diffraction measurement, coercive force, and saturation magnetic flux density were measured. FIG. 1 shows the X-ray diffraction pattern of each film, and Table 1 shows the small-angle scattering intensity, saturation magnetic flux density, and coercive force of each film.

【0021】なお、X線回折の測定は、波長1.790
26ÅのCoKα放射を用いてθ−2θ法により行っ
た。また、小角散乱強度は散乱角度が2度から6度の間
に観測される散乱ピークの強度をすべて足し合わせるこ
とによって評価した。保磁力Hcは、B−Hループトレ
ーサーによって測定し、飽和磁束密度は試料振動型磁力
計によって測定した。
The X-ray diffraction was measured at a wavelength of 1.790.
Performed by the θ-2θ method with 26 K of CoKα radiation. The small-angle scattering intensity was evaluated by summing the intensities of the scattering peaks observed when the scattering angle was 2 to 6 degrees. The coercive force Hc was measured by a BH loop tracer, and the saturation magnetic flux density was measured by a sample vibrating magnetometer.

【0022】[0022]

【表1】 [Table 1]

【0023】図1からわかるように、Co系非晶質膜,
Fe基合金膜においては、散乱角度が30度から80度
の高角散乱領域ではほとんど散乱強度に差はないが散乱
角度が2度から6度の小角散乱領域では膜によって散乱
強度が異なることがわかる。すなわち、このことは小角
散乱領域の散乱強度が膜の特性を判断する上での指標と
なることを示唆している。
As can be seen from FIG. 1, a Co type amorphous film,
In the Fe-based alloy film, there is almost no difference in the scattering intensity in the high-angle scattering region where the scattering angle is 30 ° to 80 °, but the scattering intensity differs depending on the film in the small-angle scattering region where the scattering angle is 2 ° to 6 °. .. That is, this suggests that the scattering intensity of the small-angle scattering region is an index for judging the characteristics of the film.

【0024】また、表1において、この小角散乱領域に
おける散乱強度を指標として磁気特性を見ると、小角散
乱強度が低い膜では、熱処理後の保磁力が高く、十分な
軟磁気特性が得られないが、小角散乱強度が大きい膜で
は、熱処理後においても高飽和磁束密度,低保磁力を有
している。このことから、所定元素よりなる膜におい
て、CoKα放射を使用して測定される小角散乱強度
は、その磁気特性と密接に関連しており、小角散乱強度
が高い組成の場合に、良好な軟磁気特性,耐熱性を示す
ことがわかった。
In Table 1, the magnetic properties are examined using the scattering intensity in the small angle scattering region as an index. A film having a low small angle scattering intensity has a high coercive force after heat treatment, and sufficient soft magnetic properties cannot be obtained. However, a film having a large small angle scattering intensity has a high saturation magnetic flux density and a low coercive force even after heat treatment. From this fact, the small-angle scattering intensity measured using CoKα radiation in a film made of a predetermined element is closely related to its magnetic properties, and a good soft magnetic property is obtained in a composition having a high small-angle scattering intensity. It was found that it exhibits properties and heat resistance.

【0025】次に、小角散乱領域における散乱強度と磁
気特性の関係をさらに確かなものとするために、CoZ
rN,CoNbN,CoHfN,CoTaNおよびCo
YNよりなる膜を各種組成で作成し、小角散乱強度およ
び500℃熱処理後の保磁力を測定した。その結果を図
2に示す。
Next, in order to further secure the relationship between the scattering intensity and the magnetic characteristics in the small angle scattering region, CoZ
rN, CoNbN, CoHfN, CoTaN and Co
Films made of YN were formed with various compositions, and the small angle scattering intensity and the coercive force after heat treatment at 500 ° C. were measured. The result is shown in FIG.

【0026】図2を見て明らかなように、小角散乱領域
におけるピーク強度が小さい膜では保磁力が高く、有効
な軟磁気特性が得られていないが、ピーク強度が大きい
膜では、保磁力が小さく、良好な軟磁気特性が得られ
る。したがって、このことからも、小角散乱強度が軟磁
気特性に優れた膜を得る上での指標となることがわか
り、良好な軟磁気特性を有する膜を得るには所定の元素
よりなる膜のうち、CoKα放射を使用するX線回折測
定において、小角散乱領域のピーク強度が大きいものを
選択すればよいことが示された。
As is apparent from FIG. 2, a film having a small peak intensity in the small angle scattering region has a high coercive force, and effective soft magnetic characteristics are not obtained, but a film having a large peak intensity has a coercive force. Small and good soft magnetic properties can be obtained. Therefore, also from this, it is found that the small-angle scattering intensity is an index for obtaining a film having excellent soft magnetic properties, and in order to obtain a film having good soft magnetic properties, among films made of a predetermined element, , X-ray diffraction measurement using CoKα radiation, it was shown that the one with large peak intensity in the small angle scattering region should be selected.

【0027】また、膜の小角散乱領域におけるピーク強
度は、膜作成時のスパッタ条件,ターゲット組成にほぼ
依存するので、小角散乱領域のピーク強度の大きい膜を
得るには、始めにスパッタ条件,ターゲット組成を調整
しておき、その条件で所望の膜厚となるまで続けてスパ
ッタリングを行えばよい。したがって、成膜条件を途中
で変える等の手間や時間を要さず、また特性の安定性に
も優れ、量産を行う上でも有利である。
The peak intensity in the small-angle scattering region of the film depends substantially on the sputtering conditions and target composition at the time of forming the film. Therefore, in order to obtain a film having a large peak intensity in the small-angle scattering region, the sputtering condition and the target are first obtained. The composition may be adjusted, and sputtering may be continuously performed under the conditions until the desired film thickness is obtained. Therefore, it does not require time and labor such as changing the film forming conditions on the way, has excellent stability of characteristics, and is advantageous in mass production.

【0028】[0028]

【発明の効果】以上の説明からも明らかなように、本発
明の軟磁性膜は、所定元素よりなり、且つCoKα放射
線を使用したX線回折測定において、散乱角度2θが2
度から6度の範囲に散乱回折が観測されるので、高飽和
磁束密度,良好な軟磁気特性,耐熱性を得ることが可能
である。しかも、上記軟磁性膜は、スパッタリング法に
よって成膜するに際し、途中でスパッタ雰囲気等を変化
させる必要がないので、成膜に手間や時間をそれほど要
さず、量産に適するとともに、特性の安定性にも優れ、
コア材料として高い信頼性が得られる。
As is clear from the above description, the soft magnetic film of the present invention is made of a predetermined element and has a scattering angle 2θ of 2 in X-ray diffraction measurement using CoKα radiation.
Since scattering diffraction is observed in the range of 6 to 6 degrees, it is possible to obtain high saturation magnetic flux density, good soft magnetic characteristics, and heat resistance. Moreover, since the soft magnetic film does not need to change the sputtering atmosphere or the like during the film formation by the sputtering method, it does not require much labor and time for film formation, and is suitable for mass production and has stable characteristics. Is also excellent
High reliability is obtained as a core material.

【0029】したがって、本発明によれば、メタルイン
ギャップヘッドの如き高保磁力媒体用のヘッドのコア材
料として十分対応でき、しかも生産性,特性の安定性の
上でも実用性の高い軟磁性膜を得ることが可能である。
Therefore, according to the present invention, a soft magnetic film which can be sufficiently applied as a core material of a head for a high coercive force medium such as a metal in-gap head and which is highly practical in terms of productivity and stability of characteristics. It is possible to obtain.

【図面の簡単な説明】[Brief description of drawings]

【図1】Co系非晶質膜およびFe基合金膜についてC
oKα放射線を使用してX線回折測定を行った場合の散
乱パターンを示すものである。
FIG. 1 is a diagram of C-based amorphous film and Fe-based alloy film.
It shows a scattering pattern when an X-ray diffraction measurement is performed using oKα radiation.

【図2】各組成系における小角散乱領域における散乱ピ
ーク強度と熱処理後の保磁力の関係を示す特性図であ
る。
FIG. 2 is a characteristic diagram showing a relationship between a scattering peak intensity in a small angle scattering region and a coercive force after heat treatment in each composition system.

Claims (1)

【特許請求の範囲】 【請求項1】 Co,Fe,Ni,Mnから選ばれる少
なくとも1種とZr,Hf,Ta,Nb,Y,W,M
o,Ti,Cr,V,Cu,La,Nd,Sm,Ce,
Pr,Gd,Dy,Al,Si,Ge,Ga,Pd,R
u,Re,Snから選ばれる少なくとも1種とN,C,
O,B,Pから選ばれる少なくとも1種よりなり、且つ
CoKα放射線を使用したX線回折測定において、散乱
角度が2度から6度の範囲に散乱回折が観測されること
を特徴とする軟磁性膜。
Claims: 1. At least one selected from Co, Fe, Ni, Mn and Zr, Hf, Ta, Nb, Y, W, M.
o, Ti, Cr, V, Cu, La, Nd, Sm, Ce,
Pr, Gd, Dy, Al, Si, Ge, Ga, Pd, R
at least one selected from u, Re, Sn and N, C,
A soft magnetic material comprising at least one selected from O, B, and P, and scattering diffraction is observed in the range of 2 to 6 degrees in X-ray diffraction measurement using CoKα radiation. film.
JP18160691A 1991-06-27 1991-06-27 Soft magnetic film Expired - Fee Related JP3227724B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18160691A JP3227724B2 (en) 1991-06-27 1991-06-27 Soft magnetic film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18160691A JP3227724B2 (en) 1991-06-27 1991-06-27 Soft magnetic film

Publications (2)

Publication Number Publication Date
JPH056822A true JPH056822A (en) 1993-01-14
JP3227724B2 JP3227724B2 (en) 2001-11-12

Family

ID=16103752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18160691A Expired - Fee Related JP3227724B2 (en) 1991-06-27 1991-06-27 Soft magnetic film

Country Status (1)

Country Link
JP (1) JP3227724B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6033536A (en) * 1995-03-10 2000-03-07 Kabushiki Kaisha Toshiba Magnetron sputtering method and sputtering target

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6033536A (en) * 1995-03-10 2000-03-07 Kabushiki Kaisha Toshiba Magnetron sputtering method and sputtering target

Also Published As

Publication number Publication date
JP3227724B2 (en) 2001-11-12

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