JPH0573720B2 - - Google Patents

Info

Publication number
JPH0573720B2
JPH0573720B2 JP17724285A JP17724285A JPH0573720B2 JP H0573720 B2 JPH0573720 B2 JP H0573720B2 JP 17724285 A JP17724285 A JP 17724285A JP 17724285 A JP17724285 A JP 17724285A JP H0573720 B2 JPH0573720 B2 JP H0573720B2
Authority
JP
Japan
Prior art keywords
crucible
silicon nitride
quartz crucible
silicon
cylinder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP17724285A
Other languages
Japanese (ja)
Other versions
JPS6241793A (en
Inventor
Mitsuhiro Yamato
Masayuki Tamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP17724285A priority Critical patent/JPS6241793A/en
Publication of JPS6241793A publication Critical patent/JPS6241793A/en
Publication of JPH0573720B2 publication Critical patent/JPH0573720B2/ja
Granted legal-status Critical Current

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  • Glass Melting And Manufacturing (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は低酸素濃度でシリコン単結晶を引上げ
るルツボに関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a crucible for pulling silicon single crystals at low oxygen concentrations.

〔従来の技術〕[Conventional technology]

一般に、CZ法において、シリコン単結晶は石
英ルツボ内でシリコンを溶融し、種結晶を用いて
引上げられている。この場合、一般に知られてい
るように石英ガラスの一部が溶融シリコンに溶解
し、酸素がシリコン単結晶中に混入し、シリコン
単結晶からなる半導体素子の電気的特性を著しく
悪くする。このシリコン単結晶中に混入する酸素
濃度は融液シリコンと石英ルツボとの接触面積、
温度、対流の大きさ等によつて決まり、これによ
る品質管理の改善が要望されていたが、これらの
条件のコントロールは極めて困難である。
Generally, in the CZ method, silicon single crystals are melted in a quartz crucible and pulled using a seed crystal. In this case, as is generally known, a portion of the quartz glass dissolves in the molten silicon, and oxygen mixes into the silicon single crystal, significantly deteriorating the electrical characteristics of the semiconductor element made of the silicon single crystal. The oxygen concentration mixed into this silicon single crystal is determined by the contact area between the molten silicon and the quartz crucible.
It is determined by temperature, the size of convection, etc., and there has been a desire to improve quality control based on this, but it is extremely difficult to control these conditions.

このために、最近、第2図に示すように石英ル
ツボ1の内面に化学的蒸着法(CVD法)によつ
て窒化珪素(Si3N4)膜7を被覆し、酸素混入を
防止する石英ルツボが開発されている。しかし、
このように窒化珪素膜7を石英ルツボ1の内面に
CVD法により一体化して設けたCVD(Si3N4)膜
石英ルツボでは、大きい単結晶を作るために大口
径のルツボとするとSi3N4蒸着膜(熱膨張係数2.8
×10-6〔deg-1〕(1000℃)と石英ルツボ(熱膨張
係数5.0×10-7〔deg-1〕(1000℃)との熱膨張の差
により、特にルツボ底部の湾曲部R、すなわち、
円筒部と平坦底部との連結部に亀裂や膜剥離が生
じ、単結晶の引上げを困難にする。
For this purpose, recently, as shown in Fig. 2, the inner surface of the quartz crucible 1 is coated with a silicon nitride (Si 3 N 4 ) film 7 by chemical vapor deposition (CVD) to prevent oxygen from entering the quartz crucible. A crucible is being developed. but,
In this way, the silicon nitride film 7 is coated on the inner surface of the quartz crucible 1.
In a quartz crucible with a CVD (Si 3 N 4 ) film integrated by the CVD method, if a crucible with a large diameter is used to make a large single crystal, the Si 3 N 4 evaporated film (thermal expansion coefficient 2.8)
Due to the difference in thermal expansion between ×10 -6 [deg -1 ] (1000℃) and the quartz crucible (thermal expansion coefficient 5.0 × 10 -7 [deg -1 ] (1000℃)), the curved part R at the bottom of the crucible That is,
Cracks and film peeling occur at the connection between the cylindrical part and the flat bottom part, making it difficult to pull the single crystal.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は上述する問題点に着目し、石英ルツボ
内壁に窒化珪素保護膜を一体化せずに設置したこ
とにより、一体化形成したCVD窒化珪素膜の機
械的強度の一番弱い底部湾曲部Rに亀裂や膜剥離
の起さない優れたシリコン単結晶引上げ用ルツボ
を提供するものである。
The present invention focuses on the above-mentioned problems, and by installing a silicon nitride protective film on the inner wall of a quartz crucible without integrating it, the bottom curved portion R where the mechanical strength of the integrally formed CVD silicon nitride film is the weakest. The present invention provides an excellent crucible for pulling silicon single crystals that does not cause cracks or film peeling.

〔問題点を解決するための手段〕[Means for solving problems]

本発明者らは前記目的を達成すべく幾多の研究
の結果、機械的に、かつ熱的に強いCVD窒化珪
素(Si3N4)円筒体および底板からなるCVD窒化
珪素保護壁を石英ルツボ内部に設置したことによ
り優れたシリコン単結晶引上げ用ルツボを開発
し、本発明に到達した。
In order to achieve the above object, the present inventors conducted numerous studies and found that a CVD silicon nitride protective wall consisting of a mechanically and thermally strong CVD silicon nitride (Si 3 N 4 ) cylindrical body and a bottom plate was installed inside a quartz crucible. The present invention was achieved by developing an excellent crucible for pulling silicon single crystals by installing the crucible in

本発明のシリコン単結晶引上げ用ルツボは、石
英ルツボ内の円筒部下端に窒化珪素底板を設置
し、かつ円筒部内壁に窒化珪素円筒体を設置した
ことを特徴とする。
The silicon single crystal pulling crucible of the present invention is characterized in that a silicon nitride bottom plate is installed at the lower end of the cylinder inside the quartz crucible, and a silicon nitride cylindrical body is installed on the inner wall of the cylinder part.

〔実施例〕〔Example〕

本発明に係るルツボは第1図に示すように石英
ルツボ1の円筒部1aの内壁面にCVD窒化珪素
(Si3N4)円筒体2を設置する。この円筒体2は
円筒部1aの内壁に密接に挿着できるように円筒
部1aの内径にほぼ等しい外径を有し、かつ円筒
体2の長さは円筒部1aの長さの±10%程度の増
減が認められる。
In the crucible according to the present invention, as shown in FIG. 1, a CVD silicon nitride (Si 3 N 4 ) cylindrical body 2 is installed on the inner wall surface of a cylindrical portion 1a of a quartz crucible 1. This cylindrical body 2 has an outer diameter approximately equal to the inner diameter of the cylindrical part 1a so that it can be closely inserted into the inner wall of the cylindrical part 1a, and the length of the cylindrical body 2 is ±10% of the length of the cylindrical part 1a. Increases and decreases in degree are observed.

更に、円筒体2の下部端面4に接して平坦な
CVD窒化珪素(Si3N4)底板3を設置して円筒体
2の底を形成する。この底板3は円筒体2の下部
端面4とルツボ底部の湾曲内面とで緊締保持す
る。このようにして石英ルツボ1の内部に円筒体
2と底板3からなるCVD窒化珪素保護壁を石英
ルツボ1と非一体的に内設する。
Furthermore, a flat surface is formed in contact with the lower end surface 4 of the cylindrical body 2.
A CVD silicon nitride (Si 3 N 4 ) bottom plate 3 is installed to form the bottom of the cylinder 2 . This bottom plate 3 is tightly held by the lower end surface 4 of the cylindrical body 2 and the curved inner surface of the bottom of the crucible. In this way, the CVD silicon nitride protective wall consisting of the cylindrical body 2 and the bottom plate 3 is installed inside the quartz crucible 1 non-integrally with the quartz crucible 1.

操作中、底板3とルツボ底部との空間6には円
筒体2と底板3との接触部から融液が若干漏れて
空間6内に流入することがあつても、この空間6
から融液がルツボ内部に逆流することが殆んどな
いので悪影響をもたらすことがない。
During operation, even if some melt leaks into the space 6 between the bottom plate 3 and the bottom of the crucible from the contact area between the cylindrical body 2 and the bottom plate 3 and flows into the space 6, this space 6
Since the melt rarely flows back into the crucible, it does not cause any adverse effects.

上記CVD窒化珪素円筒体2および底板3は
CVD法によりカーボンの円筒又は円板の表面に
窒化珪素膜を形成した後、カーボンを加熱酸化処
理して除去し、窒化珪素膜の裏面にCVD法によ
り再度窒化珪素膜を形成して製作したもの、ある
いは窒化珪素(Si3N4)焼結体の円筒又は円板の
表面にCVD法により窒化珪素被膜を形成して製
作したものである。
The above CVD silicon nitride cylinder 2 and bottom plate 3 are
Manufactured by forming a silicon nitride film on the surface of a carbon cylinder or disk using the CVD method, removing the carbon by heating and oxidizing it, and forming a silicon nitride film again on the back side of the silicon nitride film using the CVD method. Alternatively, it is manufactured by forming a silicon nitride film on the surface of a cylinder or disk of a silicon nitride (Si 3 N 4 ) sintered body by a CVD method.

なお、ルツボの用途、すなわちシリコン単結晶
中に混入する酸素濃度によつては、円板3のみを
用いてもよい。
Note that, depending on the use of the crucible, that is, the concentration of oxygen mixed in the silicon single crystal, only the disk 3 may be used.

〔発明の効果〕〔Effect of the invention〕

上述するように、本発明は石英ルツボ内壁に窒
化珪素円筒体および底板からなる窒化珪素保護壁
を非一体的に設置したことによつて、従来の
CVD法で石英ルツボに一体化して蒸着形成した
窒化珪素膜において生じた亀裂や膜剥離を殆んど
完全に防止でき、結晶中への酸素の混入を防止す
ることができた。
As described above, the present invention has a silicon nitride protection wall made of a silicon nitride cylinder and a bottom plate installed non-integrally on the inner wall of a quartz crucible, thereby improving the conventional method.
It was possible to almost completely prevent cracks and film peeling that occurred in the silicon nitride film that was integrally deposited in a quartz crucible using the CVD method, and it was also possible to prevent oxygen from entering the crystal.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係るシリコン単結晶引上げ用
ルツボの断面図、第2図は従来の石英ルツボの断
面図である。 1……石英ルツボ、1a……石英ルツボの円筒
部、2……窒化珪素円筒体、3……窒化珪素底
板、4……円筒体の下部端面、5……融液シリコ
ン、6……空間。
FIG. 1 is a sectional view of a crucible for pulling a silicon single crystal according to the present invention, and FIG. 2 is a sectional view of a conventional quartz crucible. DESCRIPTION OF SYMBOLS 1... Quartz crucible, 1a... Cylindrical part of quartz crucible, 2... Silicon nitride cylinder, 3... Silicon nitride bottom plate, 4... Lower end surface of cylinder, 5... Molten silicon, 6... Space .

Claims (1)

【特許請求の範囲】[Claims] 1 石英ルツボ内の円筒部下端に窒化珪素底板を
設置し、かつ円筒部の内壁に窒素珪素円筒体を設
置したことを特徴とするシリコン単結晶引上げ用
ルツボ。
1. A crucible for pulling silicon single crystals, characterized in that a silicon nitride bottom plate is installed at the lower end of the cylinder inside the quartz crucible, and a nitrogen silicon cylinder is installed on the inner wall of the cylinder part.
JP17724285A 1985-08-12 1985-08-12 Crucible for pulling up silicon single crystal Granted JPS6241793A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17724285A JPS6241793A (en) 1985-08-12 1985-08-12 Crucible for pulling up silicon single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17724285A JPS6241793A (en) 1985-08-12 1985-08-12 Crucible for pulling up silicon single crystal

Publications (2)

Publication Number Publication Date
JPS6241793A JPS6241793A (en) 1987-02-23
JPH0573720B2 true JPH0573720B2 (en) 1993-10-14

Family

ID=16027635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17724285A Granted JPS6241793A (en) 1985-08-12 1985-08-12 Crucible for pulling up silicon single crystal

Country Status (1)

Country Link
JP (1) JPS6241793A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4781232B2 (en) * 2006-11-07 2011-09-28 コバレントマテリアル株式会社 Silicon melting crucible used in the manufacture of polycrystalline silicon blocks
CN118109895B (en) * 2024-04-30 2024-08-13 安徽壹石通材料科技股份有限公司 Silicon nitride/fused quartz composite crucible and preparation method and application thereof

Also Published As

Publication number Publication date
JPS6241793A (en) 1987-02-23

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