JPH0577022B2 - - Google Patents

Info

Publication number
JPH0577022B2
JPH0577022B2 JP9095686A JP9095686A JPH0577022B2 JP H0577022 B2 JPH0577022 B2 JP H0577022B2 JP 9095686 A JP9095686 A JP 9095686A JP 9095686 A JP9095686 A JP 9095686A JP H0577022 B2 JPH0577022 B2 JP H0577022B2
Authority
JP
Japan
Prior art keywords
optical sensor
measurement surface
output
light
height
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9095686A
Other languages
Japanese (ja)
Other versions
JPS62247229A (en
Inventor
Nobuhiko Ogura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP9095686A priority Critical patent/JPS62247229A/en
Priority to DE3750963T priority patent/DE3750963T2/en
Priority to EP87102732A priority patent/EP0234579B1/en
Priority to US07/019,402 priority patent/US4823169A/en
Publication of JPS62247229A publication Critical patent/JPS62247229A/en
Publication of JPH0577022B2 publication Critical patent/JPH0577022B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4776Miscellaneous in diffuse reflection devices
    • G01N2021/478Application in testing analytical test strips

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 (発明の分野) 本発明は、試料の測定面に照射光を照射し、該
測定面から反射された反射光を光センサを有する
受光器で受光して該測定面の反射濃度の測定を行
なう反射濃度測定装置に関する。
Detailed Description of the Invention (Field of the Invention) The present invention is directed to irradiating a measurement surface of a sample with irradiation light, receiving the reflected light from the measurement surface with a light receiver having an optical sensor, and detecting the measurement surface. The present invention relates to a reflection density measuring device for measuring the reflection density of.

(従来技術および発明の技術的背景) 近年、例えば血液や尿等の試料液の小滴を点着
供給するだけで該試料液中に含まれている特定の
化学成分または有形成分を定量分析することので
きるドライタイプの化学分析スライドが開発され
(特公昭53−21677号、特開昭55−164356号等)、
実用化されている。
(Prior Art and Technical Background of the Invention) In recent years, it has become possible to quantitatively analyze specific chemical components or formed components contained in a sample liquid such as blood or urine by simply applying small droplets of the sample liquid. Dry-type chemical analysis slides that can be used for
It has been put into practical use.

このような化学分析スライドを用いる試料液中
の化学成分等の分析は、試料液を化学分析スライ
ドに点着供給した後、これをインキユベータ(恒
温機)内で所定時間恒温保持(インキユベーシヨ
ン)して呈色反応(色素生成反応)させ、その呈
色光学濃度を光学的に測定し、即ち、試料液中の
被測定成分と化学分析スライドの試薬層に含まれ
る試薬との組み合わせにより予め選定された波長
を含む測定用照射光をこの化学分析スライドに照
射してその反射光学濃度を測定し、これにより主
として比色法の原理により被測定物質の含有量を
定量分析することにより行なわれる。
In order to analyze the chemical components in a sample liquid using such a chemical analysis slide, the sample liquid is dotted onto the chemical analysis slide, and then kept at a constant temperature for a predetermined period of time in an incubator (incubator). ) to cause a coloring reaction (dye-forming reaction), and optically measure the coloring optical density. This chemical analysis slide is irradiated with measuring irradiation light containing a selected wavelength and its reflected optical density is measured, thereby quantitatively analyzing the content of the substance to be measured mainly based on the principle of colorimetry. .

上記反射光学濃度の測定は反射濃度測定装置に
より行なわれる。かかる反射濃度測定装置におい
ては、該装置に試料即ち上記化学分析スライドを
装着し、この試料の測定面に上記測定用の照射光
を照射し、該測定面から反射された反射光を光セ
ンサを有する受光器で受光することにより該測定
面の反射濃度の測定が行なわれる。
The reflection optical density is measured using a reflection density measuring device. In such a reflection density measuring device, a sample, that is, the chemical analysis slide described above is mounted on the device, the measurement surface of the sample is irradiated with the measurement irradiation light, and the light reflected from the measurement surface is sent to the optical sensor. The reflection density of the measurement surface is measured by receiving the light with a light receiver.

しかしながら、かかる反射濃度測定装置により
反射濃度を測定する場合、上記試料の装着精度、
試料自体の寸法精度あるいは試料のたわみ変形等
により試料の測定面が各測定毎に基準位置からず
れる。即ち試料の測定面が基準位置から上下方向
(測定面に垂直な方向)に変動する恐れがあり、
もしその様に測定面の上下変動が生じると測定面
と光センサとの位置関係が変化し、その結果測定
濃度が変化するという問題がある。
However, when measuring reflection density using such a reflection density measuring device, the mounting accuracy of the sample,
The measurement surface of the sample deviates from the reference position for each measurement due to dimensional accuracy of the sample itself or flexural deformation of the sample. In other words, there is a risk that the measurement surface of the sample may move vertically (perpendicular to the measurement surface) from the reference position.
If such vertical fluctuations of the measurement surface occur, there is a problem in that the positional relationship between the measurement surface and the optical sensor changes, and as a result, the measured concentration changes.

(発明の目的) 本発明の目的は、上記事情に鑑み、試料の測定
面が多少上下変動してもそれによる測定濃度の変
動が極めて小さい反射濃度測定装置を提供するこ
とにある。
(Object of the Invention) In view of the above-mentioned circumstances, an object of the present invention is to provide a reflection density measuring device in which even if the measurement surface of a sample changes slightly up and down, the fluctuation in the measured density due to the change is extremely small.

(発明の構成) 本発明に係る反射濃度測定装置は、上記目的を
達成するため、試料測定面からの反射光を受光す
る光センサを有する複数の受光器を備えて成り、
該複数の受光器の少なくとも2個の受光器におけ
る各受光器の測定面側の光学素子の中心から試料
を照射する照射光の光軸までの距離rをr1、r2
上記各光学素子の中心から上記試料測定面の基準
位置までの高さhをh1、h2、上記各光学素子と上
記試料測定面とのなす角θをθ1、θ2、上記各受光
器の光センサの出力IをI1、I2とした場合におい
て、一方の受光器は、その上記高さh1が、上記r1
とθ1との組合せの下でhを変動させた場合の光セ
ンサの出力I1の変動を示す出力曲線、即ちrが
r1、θがθ1の場合のh1とI1との関係を示す出力曲
線における該出力I1がピーク値を取るときの高さ
h10よりも低くなるように配設され、他方の受光
器は、その高さh2が、上記r2とθ2との組合せの下
でhを変動させた場合の光センサの出力I2の変動
を示す出力曲線における該出力I2がピーク値を取
るときの高さh20よりも高くなるように配設され
ていることを特徴とする。
(Structure of the Invention) In order to achieve the above object, a reflection density measuring device according to the present invention includes a plurality of light receivers each having a light sensor that receives reflected light from a sample measurement surface.
In at least two of the plurality of light receivers, the distance r from the center of the optical element on the measurement surface side of each light receiver to the optical axis of the irradiation light that irradiates the sample is r 1 , r 2 ,
The height h from the center of each optical element to the reference position of the sample measurement surface is h 1 , h 2 , the angle θ between each optical element and the sample measurement surface is θ 1 , θ 2 , each of the above light receiving When the outputs I of the optical sensors of the receivers are I 1 and I 2 , the height h 1 of one of the receivers is equal to the height r 1
The output curve showing the variation of the output I 1 of the optical sensor when h is varied under the combination of and θ 1 , i.e., r is
The height when the output I 1 takes the peak value in the output curve showing the relationship between h 1 and I 1 when r 1 and θ are θ 1
h 10 , and the other photoreceiver is arranged so that its height h 2 is the output I 2 of the optical sensor when h is varied under the above combination of r 2 and θ 2 It is characterized in that it is arranged so that the output I 2 in the output curve showing the fluctuation of is higher than the height h 20 when it takes a peak value.

そして、第1の本発明に係る反射濃度測定装置
は、上記複数の受光器の光センサ出力の加算値It
に基づいて反射濃度測定を行ない、第2の本発明
に係る反射濃度測定装置は、上記複数の受光器の
光センサ出力のうち一番大きい出力値Ihに基づい
て反射濃度測定を行なうものである。
In the reflection density measuring device according to the first aspect of the present invention, the sum value I t of the optical sensor outputs of the plurality of light receivers is
The reflection density measuring device according to the second aspect of the present invention performs reflection density measurement based on the largest output value I h of the optical sensor outputs of the plurality of light receivers. be.

本発明は、ある適当なrとθとを選定すればそ
のrとθとの下におけるhとIとの関係を示す出
力曲線は通常放物線状の曲線となり、所定のhの
ところでIはピーク値を取るという事実に着目
し、かかる事実から前述の如く少なくとも2個の
受光器を設け、該2個の受光器の一方はその高さ
h1が出力ピーク値を取るときの高さh10よりも低
くなるように配設すれば、測定面が基準位置より
も上側に変位したときにその出力ピーク値が得ら
れることとなり、また、他方の受光器はその高さ
h2が出力ピーク値を取るときの高さh20よりも高
くなるように配設すれば測定面が基準位置よりも
下側に変動したときにその出力ピーク値が得られ
ることとなるので、それらの各受光器の光センサ
の出力加算値もしくは最大出力値は試料測定面が
多少上下動してもあまり変動しないということに
想到し、これに基づいて上記の如く構成されたも
のである。
In the present invention, if a certain appropriate r and θ are selected, the output curve showing the relationship between h and I under the selected r and θ will normally be a parabolic curve, and at a predetermined h, I will be at a peak value. Based on this fact, at least two light receivers are provided as described above, and one of the two light receivers has a height of
If it is arranged so that h 1 is lower than the height h 10 when the output peak value is taken, the output peak value will be obtained when the measurement surface is displaced above the reference position, and, The other receiver is at that height.
If it is arranged so that h 2 is higher than the height h 20 when the output peak value is taken, the output peak value will be obtained when the measurement surface moves below the reference position. It was conceived that the output sum value or the maximum output value of the optical sensors of each of the light receivers does not change much even if the sample measurement surface moves up and down to some extent, and the above configuration is based on this idea.

なお、上記受光器は光センサのみから成る場合
のほか、光センサと該光センサの測定面側に配さ
れたレンズや光学絞りとから成る場合等があり、
前記した受光器の測定面側の光学素子とは、受光
器が上記光センサのみから成るときはその光セン
サを、上記光センサとレンズや光学絞りとから成
るときはそのレンズや光学絞りを意味する。
In addition to cases in which the above-mentioned light receiver consists of only a light sensor, there are cases in which it consists of a light sensor and a lens or optical diaphragm arranged on the measurement surface side of the light sensor.
The optical element on the measurement surface side of the light receiver described above means the light sensor when the light receiver consists only of the above-mentioned optical sensor, and the lens or optical diaphragm when it consists of the above-mentioned optical sensor and a lens or optical diaphragm. do.

(実施態様) 以下、図面を参照しながら本発明の実施態様に
ついて詳細に説明する。
(Embodiments) Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

第1図は本発明に係る反射濃度測定装置の一実
施態様を示す縦断面概念図である。
FIG. 1 is a conceptual longitudinal cross-sectional view showing one embodiment of the reflection density measuring device according to the present invention.

図示の装置は、試料10を保持する試料保持部
12と、該試料の測定面10aの反射濃度測定に
適した照射光を発する光源1414と、該光源1
4から発せられた照射光を導いて上記試料測定面
10aに垂直に入射せしめるようにする光フアイ
バ16と、該光フアイバ16から出射された照射
光を集光する集光レンズ18と、試料測定面10
aから反射された反射光を受光するシリコンフオ
トダイオード等の光センサ301a,301bか
ら成る2個の受光器、即ち第1受光器30aと第
2受光器30bとを備えて成る。
The illustrated apparatus includes a sample holder 12 that holds a sample 10, a light source 1414 that emits irradiation light suitable for measuring the reflection density of the measurement surface 10a of the sample, and
an optical fiber 16 that guides the irradiation light emitted from the sample measurement surface 10a and makes it perpendicularly enter the sample measurement surface 10a; a condenser lens 18 that collects the irradiation light emitted from the optical fiber 16; Face 10
The optical receiver includes two optical receivers, namely, a first optical receiver 30a and a second optical receiver 30b, which are optical sensors 301a and 301b such as silicon photodiodes that receive the reflected light reflected from the photodiode a.

また、図示装置においては、上記光フアイバ1
6、集光レンズ18、試料保持台12および両光
センサ301a,301bを、該試料保持台12
上に正規寸法の試料10を正規状態で保持せしめ
た場合、上記両光センサの中心302a,302
bから試料の測定面10aの基準位置までの高さ
hがh1、h2、上記試料の測定面10aと光センサ
301a,301bとのなす角θがθ1、θ2、上記
光センサの中心302a,302bから上記照射
光の光軸22までの距離rがr1、r2となる様な位
置関係にそれぞれ配設して成ると共に、さらに、
上記第1受光器30aにおけるh1は、上記r1とθ1
との組合せの下で上記hを変動させた場合の上記
光センサ301aの出力I1の変動を表わす出力曲
線における該出力I1がピーク値を取るときのh10
よりΔh1小であるように配設し、上記第2受光器
30bにおけるh2は、上記r2とθ2との組合せの下
で上記hを変動させた場合の上記光センサ301
bの出力I2の変動を表わす出力曲線における該出
力I2がピーク値を取るときのh20よりΔh2大である
ように配設して成る。
In addition, in the illustrated device, the optical fiber 1
6. The condensing lens 18, the sample holder 12 and both optical sensors 301a and 301b are attached to the sample holder 12.
When a sample 10 of regular size is held in a regular state on top, the centers 302a, 302 of both optical sensors are
The height h from b to the reference position of the measurement surface 10a of the sample is h 1 , h 2 , the angle θ between the measurement surface 10a of the sample and the optical sensors 301a, 301b is θ 1 , θ 2 , They are arranged in a positional relationship such that the distances r from the centers 302a and 302b to the optical axis 22 of the irradiation light are r 1 and r 2 , respectively, and further,
h 1 in the first light receiver 30a is equal to r 1 and θ 1
h 10 when the output I 1 of the optical sensor 301a takes a peak value in the output curve representing the fluctuation of the output I 1 of the optical sensor 301a when the h is varied under the combination of
h2 in the second light receiver 30b is the same as that of the optical sensor 301 when h is varied under the combination of r2 and θ2 .
The arrangement is such that Δh 2 is larger than h 20 when the output I 2 in the output curve representing the fluctuation of the output I 2 of b is at its peak value.

即ち、第1図に示す様な光学系装置において
は、適当なrとθとを選定すれば、そのrとθと
の組合せの下におけるhとIとの関係を示す出力
曲線が通常アーチ状の曲線となり、所定のhのと
ころで光センサの出力Iがピーク値を取るような
状態になる。上記装置におけるr1とθ1およびr2
θ2は、その様にhとIとの関係を示す出力曲線が
アーチ状の曲線となる様に適宜選定された値であ
り、かつh1はそのアーチ状出力曲線において出力
I1がピーク値を取るときのh10よりΔh1小であるよ
うにかつh2はそのアーチ状出力曲線において出力
I2がピーク値の取るときの値h20よりΔh2大である
ように設定されている。
That is, in the optical system shown in FIG. 1, if appropriate r and θ are selected, the output curve representing the relationship between h and I under the combination of r and θ will normally be arch-shaped. The curve becomes such that the output I of the optical sensor takes a peak value at a predetermined h. In the above device, r 1 and θ 1 and r 2 and θ 2 are values that are appropriately selected so that the output curve showing the relationship between h and I becomes an arch-shaped curve, and h 1 is Output in its arched output curve
such that Δh 1 is less than h 10 when I 1 takes its peak value, and h 2 is the output in its arched output curve.
I 2 is set to be Δh 2 larger than the value h 20 when the peak value is taken.

そして、第1の本発明に係る装置においては、
上記の如く配設された2つの受光器の光センサ3
01a,301bが第2図に示す様に加算出力器
40に接続され、該加算出力器40によつて両光
センサ301a,301bの出力が加算され、そ
の加算された出力値(加算値)Itに基づいて濃度
測定を行なう様に構成されている。
In the device according to the first invention,
Two light receiver optical sensors 3 arranged as described above
01a and 301b are connected to an addition output device 40 as shown in FIG. The device is configured to perform concentration measurements based on t .

また、第2の本発明に係る装置においては、上
記の如く配設された2つの受光器の光センサ30
1a,301bが第3図に示す様に比較選択出力
器50に接続され、該出力器50によつて両光セ
ンサ301a,301bの出力が比較されてその
うち大きい方の出力値が該出力器50から出力さ
れ、その大きい方の出力値Ihに基づいて濃度測定
を行なう様に構成されている。
Further, in the device according to the second invention, the optical sensor 30 of the two light receivers arranged as described above
1a and 301b are connected to a comparison selection output device 50 as shown in FIG. The configuration is such that the concentration is measured based on the larger output value I h .

第4図は上記第1の本発明に係る装置の一実施
態様における各光センサ301a,301bの出
力I1、I2およびその両出力I1、I2の加算値It(加算
出力器40の出力値)を示す図である。両受光器
30a,30bは前述の如く配設されているので
それらの光センサ301aの出力I1は破線で示す
様にそのピーク値は測定面10aの基準位置Sか
らΔh1上側にシフトすることとなり、また光セン
サ301bの出力I2は一点鎖線で示すようにその
ピーク値は測定面10aの基準位置SからΔh2
側にシフトすることになる。その結果これら両出
力I1、I2の加算値Itは、実線で示す様に、正規に
配設された試料の測定面10aの基準位置Sを中
心としておよそ下側に距離Δh2、上側にΔh1だけ
延びる略平坦部Fを有することとなる。従つて、
この様に加算値Itに基づいて反射濃度測定を行な
う第1の本発明によれば、実際に試料をセツトし
た場合その試料測定面10aの位置が多少上下動
しても、その上下動範囲が上記l内であればIt
殆んど変化しないので安定的な反射濃度測定を行
なうことができる。なお、Δh1とΔh2は等しくす
ることが好ましいが必ずしも等しくする必要はな
い。
FIG. 4 shows the outputs I 1 and I 2 of each optical sensor 301a and 301b and the sum value I t ( summing output device 40 FIG. Since both the light receivers 30a and 30b are arranged as described above, the peak value of the output I1 of the optical sensor 301a is shifted upward by Δh1 from the reference position S of the measurement surface 10a, as shown by the broken line. The peak value of the output I 2 of the optical sensor 301b is shifted downward by Δh 2 from the reference position S of the measurement surface 10a, as shown by the dashed line. As a result, the sum value I t of these two outputs I 1 and I 2 is approximately a distance Δh 2 below and above the reference position S of the measurement surface 10a of the normally arranged sample, as shown by the solid line. It has a substantially flat portion F that extends by Δh 1 . Therefore,
According to the first aspect of the present invention, which performs reflection density measurement based on the added value I t in this way, even if the position of the sample measurement surface 10a moves up and down a little when a sample is actually set, the range of the up-and-down movement can be adjusted. If it is within the above l, I t hardly changes, so stable reflection density measurement can be performed. Note that, although it is preferable that Δh 1 and Δh 2 be equal, they do not necessarily have to be equal.

第5図は上記第2の本発明に係る装置の一実施
態様の場合を示す図である。この場合も受光器3
0a,30bの配設態様は前述の如く第1の本発
明と同様であるのでそれらの光センサ301a,
301bの出力I1、I2の曲線も図示の如く第1の
本発明の場合(第4図)と同様であり、そのうち
大きい方の出力値Ihの曲線は、図中実線で示す様
に、正規に配設された試料の測定面10aの位置
Sを中心としてその両側に各出力I1、I2の曲線の
ピーク値部分を有する形状になつている。従つ
て、この様な大きい方の出力値Ih(比較選択出力
器50の出力値)に基づいて反射濃度を測定する
第2の本発明によれば、1つの光センサの出力値
に基づいて測定を行なう従来タイプのものよりも
より安定的な反射濃度測定を行なうことができ
る。なぜならば、例えば今一方の光センサの出力
I2のみに基づいて測定を行なう場合は、出力変動
の少ないピーク部分を使用した場合において出力
許容変動範囲がピーク値から両センサの出力の交
点の値までのΔIのとき試料測定面10aの上下
動許容範囲は2・Δh2となるが、本発明の如く構
成して大きい方の出力Iに基づいて測定を行なう
ときには同じ出力許容変動範囲ΔIに対する試料
測定面10aの上下動許容範囲は2・Δh1+2・
Δh2と約2倍になり、少々の測定面上下変動があ
つてもそれによる出力値Ihの変動を極めて少ない
範囲に維持可能だからである。なお、この場合に
おいてもΔh1=Δh2とすることが好ましいが、必
ずしもそうする必要のないことは前記第1の発明
の場合と同様である。
FIG. 5 is a diagram showing an embodiment of the apparatus according to the second aspect of the present invention. In this case as well, the receiver 3
Since the arrangement of the optical sensors 0a and 30b is the same as that of the first invention as described above, the optical sensors 301a and 30b are
The curves of the outputs I 1 and I 2 of 301b are also similar to those of the first invention (FIG. 4) as shown, and the curve of the larger output value I h is as shown by the solid line in the figure. , is shaped such that the peak value portions of the curves of the outputs I 1 and I 2 are located on both sides of the position S of the measurement surface 10a of the normally arranged sample. Therefore, according to the second invention in which the reflection density is measured based on such a larger output value I h (output value of the comparison selection output device 50), the reflection density is measured based on the output value of one optical sensor. It is possible to perform more stable reflection density measurements than conventional types of measurements. This is because, for example, the output of one optical sensor
When performing measurements based only on I 2 , when using the peak portion with little output fluctuation, and when the allowable output fluctuation range is ΔI from the peak value to the value at the intersection of the outputs of both sensors, the upper and lower portions of the sample measurement surface 10a The permissible range of vertical movement of the sample measurement surface 10a is 2·Δh 2 , but when the structure is configured as in the present invention and measurement is performed based on the larger output I, the permissible range of vertical movement of the sample measurement surface 10a for the same permissible output variation range ΔI is 2·Δh 2 . Δh 1 +2・
This is because the output value I h is approximately twice as large as Δh 2 , and even if there is a slight vertical fluctuation of the measurement surface, the resulting fluctuation in the output value I h can be maintained within an extremely small range. In this case as well, it is preferable to set Δh 1 =Δh 2 , but it is not necessary to do so, as in the case of the first invention.

なお、上記両実施態様におけるr1とθ1およびr2
とθ2は、それらの組合せの下におけるh1とI2およ
びh2とI2の関係を表わす出力曲線がアーチ状にな
るものであつたが、本発明におけるr1とθ1および
r2とθ2は、それらの組合せの下における上記出力
曲線がピーク値を有する、換言すれば変曲点を有
する曲線になるようになものであれば良く、必ず
しもアーチ状の曲線を形成する場合に限らない。
Note that r 1 and θ 1 and r 2 in both of the above embodiments
and θ 2 have an arch-like output curve representing the relationship between h 1 and I 2 and h 2 and I 2 under these combinations, but in the present invention, r 1 and θ 1 and
r 2 and θ 2 may be such that the above output curve under their combination has a peak value, in other words, a curve having an inflection point, and does not necessarily form an arch-shaped curve. Not limited to cases.

第6図、第7図は第1および第2の本発明に係
る反射濃度測定装置の他の実施態様を示す縦断面
概略図(第1図に対応する図)である。これらの
図面において、第1図に示した実施態様と同一の
機能を有する要素には同じ符号を付し説明は省略
する。第6図に示す実施態様は受光器30a,3
0bを光センサ301a,301bと該光センサ
の測定面側に配されたレンズ303a,303b
によつて構成している。この実施態様では、試料
の測定面10aとレンズ303a,303bとの
なす角θをθ1、θ2、レンズ303a,303bの
中心304a,304bから照射光の光軸22ま
での距離rをr1、r2となるように設定し、さらに
このr1とθ1およびr2とθ2の組合せの下で、レンズ
24の中心304a,304bから測定面10a
までの高さh1およびh2を、第1図に示す場合と同
様に、それぞれの光センサの出力I1、I2がピーク
値をとるときの高さh10より小さくおよびh2より
大きくなるように設定して成る。また、第7図に
示す実施態様は受光器30a,30bを光センサ
301a,301bと該光センサの測定面側に配
したアパーチヤ305a,305bが設けられた
光学絞り306a,306bによつて構成してい
る。この実施態様では、試料の測定面10aと絞
り306a,306bとのなす角θをθ1、θ2、絞
りの中心(アパーチヤの中心)307a,307
bから照射光の光軸22までの距離rをr1、r2
なるように設定し、さらにこのr1とθ1およびr2
θ2の組合せの下で、絞りの中心307a,307
bから測定面10aまでの高さh1およびh2を、第
1図に示す場合と同様に、それぞれの光センサの
出力I1、I2がピーク値をとる高さh10より小さくお
よびh20より大きくなるように設定してなる。
6 and 7 are schematic vertical cross-sectional views (corresponding to FIG. 1) showing other embodiments of the reflection density measuring apparatus according to the first and second aspects of the present invention. In these drawings, elements having the same functions as those in the embodiment shown in FIG. 1 are denoted by the same reference numerals, and explanations thereof will be omitted. The embodiment shown in FIG.
0b is the optical sensor 301a, 301b and the lenses 303a, 303b arranged on the measurement surface side of the optical sensor.
It is composed of: In this embodiment, the angles θ between the measurement surface 10a of the sample and the lenses 303a and 303b are θ 1 and θ 2 , and the distance r from the centers 304a and 304b of the lenses 303a and 303b to the optical axis 22 of the irradiation light is r 1 , r 2 , and further, under the combinations of r 1 and θ 1 and r 2 and θ 2 , from the centers 304a and 304b of the lens 24 to the measurement surface 10a
Similarly to the case shown in FIG . 1, the heights h 1 and h 2 up to the height of It is configured as follows. Further, in the embodiment shown in FIG. 7, the light receivers 30a and 30b are constituted by optical sensors 301a and 301b and optical diaphragms 306a and 306b provided with apertures 305a and 305b arranged on the measurement surface side of the optical sensors. ing. In this embodiment, the angles θ between the measurement surface 10a of the sample and the apertures 306a, 306b are θ 1 , θ 2 , and the centers of the apertures (aperture centers) 307a, 307
The distance r from b to the optical axis 22 of the irradiated light is set to be r 1 and r 2 , and further, under the combinations of r 1 and θ 1 and r 2 and θ 2 , the centers of the aperture 307 a and 307
As in the case shown in FIG . Set it to be greater than 20 .

これらの実施態様においてもレンズの中心ある
いは絞りの中心から測定面までの高さh1およびh2
を、センサの出力I1およびI2がピーク値をとる高
さh10より小さくおよびh20より大きく設定してい
るので、それぞれの光センサの出力I1、I2および
両出力I1、I2の加算値Itもしくは大きい方の出力
値Ihは前述した第4図および第5図と同様であ
る。
In these embodiments, the heights h 1 and h 2 from the center of the lens or the center of the diaphragm to the measurement surface are also
are set smaller than the height h 10 and larger than h 20 at which the sensor outputs I 1 and I 2 take their peak values, so the outputs I 1 , I 2 and both outputs I 1 , I The added value I t of 2 or the larger output value I h is the same as in FIGS. 4 and 5 described above.

なお、上記実施態様では受光器の数が2つであ
つたが、3個以上の受光器を有する場合であつて
も良く、その場合は少なくとも2つの受光器が上
記条件を満足するように位置決めされているもの
であれば良い。この場合、例えば3個の受光器を
有するものでは、他の1つは測定面の基準位置に
その出力のピーク値が位置するよう配されること
が望ましい。
In the above embodiment, the number of light receivers is two, but it is also possible to have three or more light receivers, in which case at least two light receivers must be positioned so as to satisfy the above conditions. It is fine as long as it has been done. In this case, for example, in a device having three light receivers, it is desirable that the other one is arranged so that its output peak value is located at the reference position on the measurement surface.

本発明に係る反射濃度測定位置は、その要旨を
越えない範囲で種々変更可能であり、上記実施態
様に限定されるものではない。
The reflection density measurement position according to the present invention can be changed in various ways without departing from the gist thereof, and is not limited to the above-mentioned embodiments.

(発明の効果) 本発明に係る反射濃度測定装置は、上述の如
く、少なくとも2個の受光器を備えて成り、それ
らの受光器は、それらの高さh1およびh2をそれら
の出力I1およびI2がピーク値を取るときの高さh10
より低くおよびh2より高くなるように配設して成
り、その様に配設された両受光器の出力I1、I2
加算値Itもしくは大きい方の出力値Ihに基づいて
反射濃度測定を行なう様に構成されているので、
例えば試料保持部による試料保持精度や試料自体
の寸法精度により各測定毎に上記hが変化した
り、あるいは長時間測定中に試料自体がたわんで
上記hが変化したりした場合においても、そのh
の変化によるItやIhの変化はごく僅かであり、従
つて極めて安定的な反射濃度測定が可能である。
(Effects of the Invention) As described above, the reflection density measuring device according to the present invention includes at least two light receivers, and these light receivers have heights h 1 and h 2 of their outputs I Height h 10 when 1 and I 2 take their peak values
The reflection is based on the sum I t of the outputs I 1 and I 2 of both receivers arranged in this way, or the larger output value I h . Since it is configured to perform concentration measurements,
For example, even if the above h changes for each measurement due to the sample holding accuracy of the sample holder or the dimensional accuracy of the sample itself, or if the above h changes due to the sample itself bending during long-term measurement, the h
The changes in I t and I h due to changes in is very small, and therefore extremely stable reflection density measurement is possible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は第1および第2の本発明に係る装置の
一実施態様を示す縦断面概念図、第2図は第1の
本発明に係る装置の一実施態様の一部を示すブロ
ツク図、第3図は第2の本発明に係る装置の一実
施態様の一部を示すブロツク図、第4図は第2図
における各出力の関係の一例を示す図、第5図は
第3図における各出力の関係の一例を示す図、第
6図及び第7図はそれぞれ第1図と同様に第1お
よび第2の本発明に係る装置の一実施態様を示す
縦断面概念図である。 10……試料、10a……試料測定面、14…
…光源、30a,30b……受光器、301a,
301b……光センサ、302a,302b,3
04a,304b,307a,307b……受光
器の測定面側の光学素子の中心。
FIG. 1 is a longitudinal cross-sectional conceptual diagram showing one embodiment of the apparatus according to the first and second inventions, FIG. 2 is a block diagram showing a part of one embodiment of the apparatus according to the first invention, FIG. 3 is a block diagram showing a part of an embodiment of the device according to the second invention, FIG. 4 is a diagram showing an example of the relationship between each output in FIG. 2, and FIG. FIGS. 6 and 7 are diagrams illustrating an example of the relationship between the respective outputs, and similarly to FIG. 1, they are longitudinal cross-sectional conceptual diagrams showing an embodiment of the apparatus according to the first and second aspects of the present invention, respectively. 10...Sample, 10a...Sample measurement surface, 14...
...Light source, 30a, 30b... Light receiver, 301a,
301b... optical sensor, 302a, 302b, 3
04a, 304b, 307a, 307b... Centers of optical elements on the measurement surface side of the light receiver.

Claims (1)

【特許請求の範囲】 1 試料の測定面に照射光を照射し、該測定面か
ら反射された反射光を光センサを有する複数受光
器で受光して該測定面の反射濃度の測定を行なう
反射濃度測定装置において、 上記複数の受光器の少なくとも2個の受光器に
おける各受光器の測定面側の光学素子の中心から
上記照射光の光軸までの距離rをr1、r2、上記各
高学素子の中心から上記測定面の基準位置までの
高さhをh1、h2、上記各光学素子と上記測定面と
のなす角度θをθ1、θ2、上記各受光器の光センサ
の出力IをI1、I2としたときに、 一方の受光器は、その上記高さh1が、上記距離
r1と角度θ1との組合せの下で上記高さhを変動さ
せた場合の光センサの出力I1の変動を表わす出力
曲線における該出力I1がピーク値を取るときの高
さh10よりも低くなるように配設され、他方の受
光器は、その上記高さh2が、上記距離r2と角度θ1
との組合せの下で上記高さhを変動させた場合の
光センサの出力I2の変動を表わす出力曲線におけ
る該出力I2がピーク値を取るときの高さh20より
も高くなるように配設され、 上記複数の受光器の光センサ出力の加算値It
基づいて上記反射濃度の測定が行なわれるように
構成されていることを特徴とする反射濃度測定装
置。 2 上記受光器が光センサのみから成る特許請求
の範囲第1項記載の反射濃度測定装置。 3 上記受光器が光センサと光センサの測定面側
に配されたレンズとから成ることを特徴とする特
許請求の範囲第1項記載の反射濃度測定装置。 4 上記受光器が光センサと光センサの測定面側
に配された光学絞りとから成ることを特徴とする
特許請求の範囲第1項記載の反射濃度測定装置。 5 試料の測定面に照射光を照射し、該測定面か
ら反射された反射光を光センサを有する複数の受
光器で受光して該測定面の反射濃度の測定を行な
う反射測定装置において、 上記複数の受光器の少なくとも2個の受光器に
おける各受光器の測定面側の光学素子の中心から
上記照射光の光軸までの距離rをr1、r2、上記各
光学素子の中心から上記測定面の基準位置までの
高さhをh1、h2、上記各光学素子と上記測定面と
のなす角度θをθ1、θ2、上記各受光器の光センサ
の出力IをI1、I2としたときに、 一方の受光器は、その上記高さh1が、上記距離
r1と角度θ1との組合せの下で上記高さhを変動さ
せた場合の光センサの出力I1の変動を表わす出力
曲線における該出力I1がピーク値を取るときの高
さh10よりも低くなるように配設され、 他方の受光器は、その上記高さh2が、上記距離
r2と角度θ1との組合せの下で上記高さhを変動さ
せた場合の光センサの出力I2の変動を表わす出力
曲線における該出力I2がピーク値を取るときの高
さh20よりも高くなるように配設され、 上記複数の受光器の光センサ出力のうち一番大
きい出力値Ihに基づいて上記反射濃度の測定が行
なわれるように構成されていることを特徴とする
反射濃度測定装置。 6 上記受光器が光センサのみから成る特許請求
の範囲第5項記載の反射濃度測定装置。 7 上記受光器が光センサと光センサの測定面側
に配されたレンズとから成ることを特徴とする特
許請求の範囲第5項、載の反射濃度測定装置。 8 上記受光器が光センサと光センサの測定面側
に配された光学絞りとから成ることを特徴とする
特許請求の範囲第5項記載の反射濃度測定装置。
[Claims] 1. Reflection in which a measurement surface of a sample is irradiated with irradiation light, and the reflected light reflected from the measurement surface is received by a plurality of light receivers having optical sensors to measure the reflection density of the measurement surface. In the concentration measuring device, the distance r from the center of the optical element on the measurement surface side of each light receiver in at least two of the plurality of light receivers to the optical axis of the irradiation light is r 1 , r 2 , and each of the above The height h from the center of the optical element to the reference position of the measurement surface is h 1 , h 2 , the angle θ between each optical element and the measurement surface is θ 1 , θ 2 , the light of each of the light receivers is When the output I of the sensor is I 1 and I 2 , the above height h 1 of one photoreceptor is equal to the above distance
The height h 10 when the output I 1 of the optical sensor reaches its peak value in the output curve representing the variation of the output I 1 of the optical sensor when the height h is varied under the combination of r 1 and angle θ 1 and the other receiver is arranged such that its height h 2 is equal to the distance r 2 and the angle θ 1
so that the height h 20 is higher than the height h 20 when the output I 2 takes a peak value in the output curve representing the variation of the output I 2 of the optical sensor when the height h is varied in combination with 1. A reflection density measuring device, characterized in that the reflection density measurement device is configured to measure the reflection density based on an added value I t of optical sensor outputs of the plurality of light receivers. 2. The reflection density measuring device according to claim 1, wherein the light receiver comprises only an optical sensor. 3. The reflection density measuring device according to claim 1, wherein the light receiver comprises an optical sensor and a lens disposed on the measurement surface side of the optical sensor. 4. The reflection density measuring device according to claim 1, wherein the light receiver comprises an optical sensor and an optical aperture disposed on the measurement surface side of the optical sensor. 5. In a reflection measurement device that measures the reflection density of the measurement surface by irradiating the measurement surface of the sample with irradiation light and receiving the reflected light reflected from the measurement surface with a plurality of light receivers each having an optical sensor, the above-mentioned In at least two of the plurality of light receivers, the distance r from the center of the optical element on the measurement surface side of each light receiver to the optical axis of the irradiated light is r 1 , r 2 , and the distance r from the center of each optical element to the above The height h of the measurement surface to the reference position is h 1 , h 2 , the angle θ between each optical element and the measurement surface is θ 1 , θ 2 , and the output I of the optical sensor of each light receiver is I 1 , I 2 , one receiver has the above height h 1 and the above distance
The height h 10 when the output I 1 of the optical sensor reaches its peak value in the output curve representing the variation of the output I 1 of the optical sensor when the height h is varied under the combination of r 1 and angle θ 1 The other receiver is placed so that its height h 2 is lower than the distance
The height h 20 when the output I 2 of the optical sensor takes a peak value in the output curve representing the fluctuation of the output I 2 of the optical sensor when the height h is varied under the combination of r 2 and angle θ 1 , and is configured such that the reflection density is measured based on the largest output value I h of the optical sensor outputs of the plurality of light receivers. Reflection density measuring device. 6. The reflection density measuring device according to claim 5, wherein the light receiver comprises only an optical sensor. 7. The reflection density measuring device according to claim 5, wherein the light receiver comprises an optical sensor and a lens disposed on the measurement surface side of the optical sensor. 8. The reflection density measuring device according to claim 5, wherein the light receiver comprises an optical sensor and an optical aperture disposed on the measurement surface side of the optical sensor.
JP9095686A 1986-02-26 1986-04-19 Reflection density measuring apparatus Granted JPS62247229A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP9095686A JPS62247229A (en) 1986-04-19 1986-04-19 Reflection density measuring apparatus
DE3750963T DE3750963T2 (en) 1986-02-26 1987-02-26 Reflectometer.
EP87102732A EP0234579B1 (en) 1986-02-26 1987-02-26 Reflection density measuring system
US07/019,402 US4823169A (en) 1986-02-26 1987-02-26 Reflection density measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9095686A JPS62247229A (en) 1986-04-19 1986-04-19 Reflection density measuring apparatus

Publications (2)

Publication Number Publication Date
JPS62247229A JPS62247229A (en) 1987-10-28
JPH0577022B2 true JPH0577022B2 (en) 1993-10-25

Family

ID=14012938

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9095686A Granted JPS62247229A (en) 1986-02-26 1986-04-19 Reflection density measuring apparatus

Country Status (1)

Country Link
JP (1) JPS62247229A (en)

Also Published As

Publication number Publication date
JPS62247229A (en) 1987-10-28

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